CN104280690A - Lamp discharge time testing circuit - Google Patents

Lamp discharge time testing circuit Download PDF

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Publication number
CN104280690A
CN104280690A CN201310293426.6A CN201310293426A CN104280690A CN 104280690 A CN104280690 A CN 104280690A CN 201310293426 A CN201310293426 A CN 201310293426A CN 104280690 A CN104280690 A CN 104280690A
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CN
China
Prior art keywords
resistance
light fixture
circuit
discharge time
diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201310293426.6A
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Chinese (zh)
Inventor
周明杰
胡波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oceans King Lighting Science and Technology Co Ltd
Oceans King Dongguan Lighting Technology Co Ltd
Shenzhen Oceans King Lighting Engineering Co Ltd
Original Assignee
Oceans King Lighting Science and Technology Co Ltd
Oceans King Dongguan Lighting Technology Co Ltd
Shenzhen Oceans King Lighting Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oceans King Lighting Science and Technology Co Ltd, Oceans King Dongguan Lighting Technology Co Ltd, Shenzhen Oceans King Lighting Engineering Co Ltd filed Critical Oceans King Lighting Science and Technology Co Ltd
Priority to CN201310293426.6A priority Critical patent/CN104280690A/en
Publication of CN104280690A publication Critical patent/CN104280690A/en
Pending legal-status Critical Current

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Abstract

The embodiment of the invention discloses a lamp discharge time testing circuit which comprises a power circuit, a power supply circuit and a lamp testing circuit. The power circuit is connected with the power supply circuit. The power supply circuit is connected with the lamp testing circuit. The power circuit supplies power voltage to the power supply circuit. When the power voltage of the power supply circuit is lower than a preset voltage value, an alarm is given. After comparing the power voltage with reference voltage, the power supply circuit outputs stable voltage to the lamp testing circuit. After the lamp testing circuit resets, the discharge time of a lamp is recorded by collecting light emitted by the lamp. When the lamp is discharged completely and turned off, the lamp testing circuit displays the discharge time of the lamp. The lamp discharge time testing circuit automatically records and displays the discharge time of the lamp when the lamp is discharged completely and turned off, a tester does not need to observe the discharge situation of the lamp all the time, the lamp discharge time testing circuit is higher in lamp discharge testing efficiency and accuracy, and the user experience is better.

Description

A kind of light fixture test circuit discharge time
Technical field
The present invention relates to light fixture detection field, particularly relate to a kind of light fixture test circuit discharge time.
Background technology
The discharge time of light fixture is the important indicator of light fixture performance, the discharge time of light fixture and the discharge current of light fixture, the battery capacity of light fixture and the overall design parameters of light fixture relevant, therefore, manufacturer must carry out test discharge time to light fixture, existing light fixture test mode discharge time, observed by tester exactly and record light fixture discharge off extinguish time, determine the discharge time of light fixture, this test mode very easily causes the fatigue of tester, can not ensure under tester's fatigue state that the moment observes the time of light fixture extinguishing, once miss the light fixture fall time, then test crash, it can thus be appreciated that, existing light fixture discharge test method testing efficiency is lower, human resources consumption is large, the Test Reliability of this test mode and validity are also very low.
Summary of the invention
Embodiment of the present invention technical matters to be solved is, provides a kind of light fixture test circuit discharge time, and it can automatically record when light fixture discharge off extinguishes and show light fixture puts a time.
In order to solve the problems of the technologies described above, the embodiment of the present invention provides a kind of light fixture test circuit discharge time, comprising:
Power circuit, feed circuit and light fixture test circuit, wherein, described power circuit is connected with described feed circuit, and described feed circuit are connected with described light fixture test circuit;
Described power circuit provides supply voltage for described feed circuit, described feed circuit at described supply voltage lower than preset value alarm, simultaneously, after described supply voltage compares with reference voltage by described feed circuit, the voltage of stable output is to described light fixture test circuit, after described light fixture test circuit resets and resets, by gathering the discharge time of light fixture described in light record that described light fixture sends, when described light fixture discharge off extinguishes, described light fixture test circuit shows the discharge time of described light fixture.
The present invention has following beneficial effect:
Embodiment of the present invention light fixture test circuit discharge time automatically records when light fixture discharge off extinguishes and shows the discharge time of light fixture, tester need not observe the discharge scenario of light fixture at any time, this circuit the efficiency of discharge test is carried out to light fixture and accuracy higher, better user experience.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is embodiment of the present invention light fixture test circuit structure discharge time schematic diagram;
Fig. 2 is another embodiment of the present invention light fixture test circuit structure discharge time schematic diagram.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Refer to Fig. 1, be embodiment of the present invention light fixture test circuit structure discharge time schematic diagram, comprise:
Power circuit 10, feed circuit 20 and light fixture test circuit 30, wherein, described power circuit 10 is connected with described feed circuit 20, and described feed circuit 20 are connected with described light fixture test circuit 30;
Described power circuit 10 provides supply voltage for described feed circuit 20, described feed circuit 20 at described supply voltage lower than preset value alarm, simultaneously, after described supply voltage compares with reference voltage by electric 20 tunnels of described power supply, the voltage of stable output is to described light fixture test circuit 30, after described light fixture test circuit 30 resets and resets, by gathering the discharge time of light fixture described in light record that described light fixture sends, when described light fixture discharge off extinguishes, described light fixture test circuit 30 shows the discharge time of described light fixture.
Be to be understood that, embodiment of the present invention light fixture test circuit discharge time can not only record when tested light fixture discharge off extinguishes and show light fixture discharge time, can also at the supply voltage of this circuit lower than preset value alarm, be convenient to tester and test light fixture discharge test process, improve the accuracy of test.
Embodiment of the present invention light fixture test circuit discharge time automatically records when light fixture discharge off extinguishes and shows the discharge time of light fixture, tester need not observe the discharge scenario of light fixture at any time, this circuit the efficiency of discharge test is carried out to light fixture and accuracy higher, better user experience.
Refer to Fig. 2, be another embodiment of the present invention light fixture test circuit structure discharge time schematic diagram, comprise:
Power circuit 10, feed circuit 20 and light fixture test circuit 30, wherein, described power circuit 10 is connected with described feed circuit 20, and described feed circuit 20 are connected with described light fixture test circuit 30;
Described power circuit 10 provides supply voltage for described feed circuit 20, described feed circuit 20 at described supply voltage lower than preset value alarm, simultaneously, after described supply voltage compares with reference voltage by described feed circuit 20, the voltage of stable output is to described light fixture test circuit 30, described light fixture test circuit 30 is by gathering the discharge time of light fixture described in the ray-test that sends of described light fixture, and when described light fixture discharge off extinguishes, described light fixture test circuit 30 is reported to the police.
Power circuit 10 comprises: battery BT, the first interrupteur SW 1 and the first charging inlet AB, and the annexation of power circuit 10 is as follows:
The positive pole of described battery BT is connected with one end of described first interrupteur SW 1, the positive pole A of described first charging inlet simultaneously, and the minus earth of described battery BT is connected with the negative pole of described first charging inlet B simultaneously.
It is understood that, first charging inlet AB is the input end of embodiment of the present invention light fixture test circuit discharge time, battery BT can be rechargeable battery, such as: lithium battery, ickel-cadmium cell or Ni-MH battery, when the voltage of battery BT is lower than preset value, by AB end for battery BT charges, further, embodiment of the present invention light fixture test circuit discharge time is also directly powered by AB end.
Feed circuit 20 comprise: the first transport and placing device M1, the first diode D1, the second diode D2, the first resistance R1, the second resistance R2, the 3rd resistance R3, the 4th resistance R4, and the annexation of feed circuit 20 is as follows:
First pin of described first transport and placing device M1 is connected with one end of described 4th resistance R4,5th pin of described first transport and placing device M1 is connected with the other end of described first resistance R1, the negative pole of described first diode D1 simultaneously, and the 6th pin of described first transport and placing device M1 is connected with the other end of described second resistance R2, one end of described 3rd resistance R3 simultaneously;
The other end of described 4th resistance R4 is connected with the positive pole of described second diode D2;
The equal ground connection of the other end of the negative pole of described second diode D2, the positive pole of described first diode D1, described 3rd resistance R3.
Should be appreciated that described first diode D1 comprises voltage stabilizing diode, for providing reference voltage, i.e. predeterminated voltage.
Described second diode D2 comprises light emitting diode, and at the supply voltage of power circuit 10 lower than luminous alarm during preset value, prompting tester charge to power circuit 10.
First transport and placing device M1 can be LM358, and the first transport and placing device M1 is used for supply voltage to compare with reference voltage, the voltage of stable output.
Light fixture test circuit 30 comprises: the first test electronic circuit 31 and one or more with described first test electronic circuit 31 in parallel second test electronic circuit 32.
The timer Q that embodiment of the present invention light fixture test circuit discharge time is in parallel with described light fixture test circuit 30 and the 5th resistance R5, one end of described timer Q is connected with described 5th resistance R5, and described timer Q comprises reset clear circuit Q1 and one or more sub-timer Q2.
First test electronic circuit 31 comprises: the 6th resistance R6, the second transport and placing device M2, the 7th resistance R7, the 8th resistance R8, the 9th resistance R9, the 3rd diode D3, and its annexation is:
Described 6th resistance R6 is connected with one end of described sub-timer Q2, and the other end of described 6th resistance R6 is connected with first pin of described second transport and placing device M2;
5th pin of described second transport and placing device M2 is connected with one end of described 7th resistance R7 and the negative pole of described 3rd diode D3 simultaneously, and the 6th pin of described second transport and placing device M2 is connected with one end of described 8th resistance R8 and one end of described 9th resistance R9 simultaneously;
The positive pole of described 3rd diode D3 and the other end ground connection of described 9th resistance R9.
It is understood that described 8th resistance R8 is photoresistance, for gathering the light that light fixture to be measured sends.Described 3rd diode D3 is voltage stabilizing diode.
Second test electronic circuit 32 comprises: the tenth resistance R10, the 3rd transport and placing device M3, the 11 resistance R11 and the 12 resistance R12, and its annexation is:
One end of described tenth resistance R10 is connected with one end of described sub-timer Q2, and the other end of described tenth resistance R10 is connected with first pin of described 3rd transport and placing device M3;
5th pin of described 3rd transport and placing device M3 is connected with light fixture to be measured, and the 6th pin of described 3rd transport and placing device M3 is connected with described one end of 11 resistance R11, one end of the 12 resistance R12 simultaneously;
The other end ground connection of described 11 resistance R11, the other end of described 12 resistance R12 is connected with the other end of described 5th resistance R5;
It is understood that described 12 resistance R2 is photoresistance, for gathering the light that light fixture to be measured sends.Second transport and placing device M2 can be LM358, and the 3rd transport and placing device M3 can be LM324.
Should be appreciated that multiple test second electronic circuit 32 tests electronic circuit 31 with first respectively in parallel, they can not influence each other each other, and tester can need according to test the quantity determining the second test electronic circuit 32, easy to use.
Certainly, in other embodiments of the present invention, power circuit 10, feed circuit 20 and light fixture test circuit 30 can use multiple electronic devices and components to realize, and the present invention does not limit.
The principle of work of embodiment of the present invention light fixture test circuit discharge time is: the first interrupteur SW 1 connected, the light of light fixture to be measured is aimed at respectively each light fixture to be measured of photoresistance R8 and R12(and aim at a photoresistance), now photoresistance becomes very little owing to there being the irradiation resistance of light, the voltage that R9 and R11 gets raises, compare with the voltage D3 of the positive pole above the second transport and placing device M2, voltage on R6 and R10 increases, second transport and placing device M2 output LOW voltage 0V, now R6 and R10 do not have curent change, counter Q continues delay working, when light fixture to be measured extinguishes, the resistance of photoresistance R8 and R12 raises, the voltage that R9 and R11 gets reduces, when this voltage is lower than voltage on D3, second transport and placing device M2 output HIGH voltage, there is electric current on resistance R6 and R10 simultaneously, the transformation period of the electric current of R6 and R10 of correspondence is recorded by timer Q2, this transformation period is exactly the discharge time of light fixture to be measured.
In addition, at battery BT in embodiment of the present invention circuit power supply process, because the supply voltage of battery declines gradually along with circuit working, when reference voltage lower than D2 of the supply voltage of battery, the 6th pin input and output high level of the first transport and placing device M1 makes D2 luminous, and prompting tester charge to battery BT.
Embodiment of the present invention light fixture test circuit discharge time automatically records when light fixture discharge off extinguishes and shows the discharge time of light fixture, tester need not observe the discharge scenario of light fixture at any time, this circuit the efficiency of discharge test is carried out to light fixture and accuracy higher, better user experience.
One of ordinary skill in the art will appreciate that all or part of flow process realized in above-described embodiment method, that the hardware that can carry out instruction relevant by computer program has come, described program can be stored in a computer read/write memory medium, this program, when performing, can comprise the flow process of the embodiment as above-mentioned each side method.Wherein, described storage medium can be magnetic disc, CD, read-only store-memory body (Read-Only Memory, ROM) or random store-memory body (Random Access Memory, RAM) etc.
Above disclosedly be only present pre-ferred embodiments, certainly can not limit the interest field of the present invention with this, therefore according to the equivalent variations that the claims in the present invention are done, still belong to the scope that the present invention is contained.

Claims (10)

1. light fixture test circuit discharge time, is characterized in that, comprising:
Power circuit, feed circuit and light fixture test circuit, wherein, described power circuit is connected with described feed circuit, and described feed circuit are connected with described light fixture test circuit;
Described power circuit provides supply voltage for described feed circuit, described feed circuit at described supply voltage lower than preset value alarm, simultaneously, after described supply voltage compares with reference voltage by described feed circuit, the voltage of stable output is to described light fixture test circuit, after described light fixture test circuit resets and resets, by gathering the discharge time of light fixture described in light record that described light fixture sends, when described light fixture discharge off extinguishes, described light fixture test circuit shows the discharge time of described light fixture.
2. light fixture test circuit discharge time as claimed in claim 1, it is characterized in that, described power supply comprises: battery, the first switch and the first charging inlet;
The positive pole of described battery is connected with one end of described first switch, the positive pole of described first charging inlet simultaneously, and the minus earth of described battery is connected with the negative pole of described first charging inlet simultaneously.
3. light fixture test circuit discharge time as claimed in claim 2, is characterized in that, described battery: lithium battery or ickel-cadmium cell or Ni-MH battery.
4. light fixture test circuit discharge time as claimed in claim 1, it is characterized in that, described feed circuit comprise: the first transport and placing device, the first diode, the second diode, the first resistance, the second resistance, the 3rd resistance, the 4th resistance;
First pin of described first transport and placing device is connected with one end of described 4th resistance, 5th pin of described first transport and placing device is connected with the other end of described first resistance, the negative pole of described first diode simultaneously, and the 6th pin of described first transport and placing device is connected with the other end of described second resistance, one end of described 3rd resistance simultaneously;
The other end of described 4th resistance is connected with the positive pole of described second diode;
The equal ground connection of the other end of the negative pole of described second diode, the positive pole of described first diode, described 3rd resistance.
5. light fixture test circuit discharge time as claimed in claim 4, it is characterized in that, described first diode comprises voltage stabilizing diode, and described second diode comprises light emitting diode.
6. light fixture test circuit discharge time as claimed in claim 1, it is characterized in that, described light fixture test circuit comprises: the first test electronic circuit and one or more with described first test electronic circuit in parallel second test electronic circuit.
7. light fixture test circuit discharge time as claimed in claim 1, it is characterized in that, also comprise the timer in parallel with described light fixture test circuit and the 5th resistance, one end of described timer is connected with described 5th resistance, and described timer comprises reset clear circuit and one or more sub-timer.
8. light fixture test circuit discharge time as claimed in claims 6 or 7, is characterized in that, described first test electronic circuit comprises: the 6th resistance, the second transport and placing device, the 7th resistance, the 8th resistance, the 9th resistance, the 3rd diode;
Described 6th resistance is connected with one end of described sub-timer, and the other end of described 6th resistance is connected with the first pin of described second transport and placing device;
5th pin of described second transport and placing device is connected with one end of described 7th resistance and the negative pole of described 3rd diode simultaneously, and the 6th pin of described second transport and placing device is connected with one end of described 8th resistance and one end of described 9th resistance simultaneously;
The positive pole of described 3rd diode and the other end ground connection of described 9th resistance.
9. light fixture test circuit discharge time as claimed in claim 8, it is characterized in that, described 8th resistance comprises photoresistance, and described 3rd diode comprises voltage stabilizing diode.
10. light fixture test circuit discharge time as claimed in claims 6 or 7, is characterized in that, described second test electronic circuit comprises: the tenth resistance, the 3rd transport and placing device, the 11 resistance and the 12 resistance;
One end of described tenth resistance is connected with one end of described sub-timer, and the other end of described tenth resistance is connected with the first pin of described 3rd transport and placing device;
5th pin of described 3rd transport and placing device is connected with light fixture to be measured, and the 6th pin of described 3rd transport and placing device is connected with described one end of 11 resistance, one end of the 12 resistance simultaneously;
The other end ground connection of described 11 resistance, the other end of described 12 resistance is connected with the other end of described 5th resistance;
Described 12 resistance comprises photoresistance.
CN201310293426.6A 2013-07-12 2013-07-12 Lamp discharge time testing circuit Pending CN104280690A (en)

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Application Number Priority Date Filing Date Title
CN201310293426.6A CN104280690A (en) 2013-07-12 2013-07-12 Lamp discharge time testing circuit

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Application Number Priority Date Filing Date Title
CN201310293426.6A CN104280690A (en) 2013-07-12 2013-07-12 Lamp discharge time testing circuit

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CN104280690A true CN104280690A (en) 2015-01-14

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107229215A (en) * 2017-05-17 2017-10-03 福建省正毅工业计量站有限公司 A kind of time detection device and detection method
WO2018068407A1 (en) * 2016-10-13 2018-04-19 深圳Tcl数字技术有限公司 Light bar discharge testing method and device
CN113985311A (en) * 2021-10-22 2022-01-28 深圳市中孚能电气设备有限公司 Miner lamp aging test device, terminal and system
CN115356531A (en) * 2022-08-04 2022-11-18 广东中设智控科技股份有限公司 Light source power consumption calculation method, device and system based on light sensing device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018068407A1 (en) * 2016-10-13 2018-04-19 深圳Tcl数字技术有限公司 Light bar discharge testing method and device
CN107229215A (en) * 2017-05-17 2017-10-03 福建省正毅工业计量站有限公司 A kind of time detection device and detection method
CN113985311A (en) * 2021-10-22 2022-01-28 深圳市中孚能电气设备有限公司 Miner lamp aging test device, terminal and system
CN115356531A (en) * 2022-08-04 2022-11-18 广东中设智控科技股份有限公司 Light source power consumption calculation method, device and system based on light sensing device

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Application publication date: 20150114