CN104280625A - Testing system of infrared emission device and testing method of infrared emission device - Google Patents
Testing system of infrared emission device and testing method of infrared emission device Download PDFInfo
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- CN104280625A CN104280625A CN201310288577.2A CN201310288577A CN104280625A CN 104280625 A CN104280625 A CN 104280625A CN 201310288577 A CN201310288577 A CN 201310288577A CN 104280625 A CN104280625 A CN 104280625A
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- infrared
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Abstract
The invention provides a testing system of an infrared emission device. The testing system is connected with the infrared emission device to be tested. The infrared emission device to be tested comprises a plurality of infrared emitting diodes, and the multiple infrared emitting diodes start working after receiving a pulse signal and return another pulse signal. The testing system comprises a test fixture, a pulse emission device and a testing device. The pulse emission device comprises an emission key and a pulse generating main board. The testing device comprises a judge module used for judging whether the infrared emitting diodes are normal by judging whether the pulse signal returned from the infrared emitting diodes is identical with the pulse signal received by the infrared emitting diodes. The testing device can accurately test each infrared emitting diode and save a large amount of testing time and testing expenses. The invention further provides a testing method of the infrared emission device.
Description
Technical field
The present invention relates to a kind of test macro and method thereof of infrared transmitting device, particularly relate to test macro and the method thereof of the ultrared emitter of a kind of intensive transmitting.
Background technology
Along with the development of remote control technology, use the electronic product of Long-distance Control, such as telepilot etc., have entered the life of people, have brought great facility.Infrared technology is that remote control technology is the most frequently used, and the overwhelming majority needs the electronic product of Long-distance Control to also using this technology.In the electronic product with infrared ray transmitting function is produced, need to test infrared ray transmitting function.Method of testing of the prior art has a lot, comprises and observes receiving trap with or without correct response, or judge with Decoder accepts signal.But some product has multiple infrared light-emitting diode, and distance between each diode is very near, if the method test using Decoder accepts signal to carry out judging, needs the infrared signal using signal shielding material shields diode emitter.Make the interference not only easily caused in this way between infrared signal, and increase testing cost.
To this situation, test macro of the prior art, as shown in Figure 1, comprises main frame 10, testing host 20, an infrared transmitting device 30 to be measured and a camera 40.This system controls by main frame 10 pulse signal that testing host 20 sends fixed frequency, start working after infrared transmitting device 30 to be measured receives this pulse signal, infrared transmitting device to be measured 30 in camera 40 shooting work, and observed during this infrared transmitting device 30 to be measured works by main frame 10 and whether glimmer.The shortcoming of this method is will use main frame and make a video recording first-class, and not only the test duration is long, and easily causes failing to judge of tester, is unfavorable for the yield ensureing product.
Summary of the invention
In view of this, be necessary to provide a kind of test macro that can test the ultrared infrared transmitting device of intensive transmitting and method thereof.
The invention provides a kind of infrared transmitting device test macro.Described test macro is connected with an infrared transmitting device to be measured, and this infrared transmitting device to be measured has multiple infrared-emitting diode, and the plurality of infrared-emitting diode is started working and returned another pulse signal after receiving a pulse signal.Described test macro, for testing the state of multiple infrared-emitting diode in this infrared transmitting device to be measured, comprising:
One measurement jig, for pressing the transmitting button of an impulse starter;
One impulse starter, comprising:
One launches button, when this transmitting button is pressed, sends a firing order;
One pulse generation mainboard, the firing order sent for receiving described transmitting button sends the multiple infrared-emitting diodes of a pulse signal to described infrared transmitting device to be measured, and
One proving installation, comprising:
Whether one judge module is identical for judging the pulse signal that pulse signal that described pulse generation mainboard sends and multiple infrared-emitting diode in described infrared transmitting device to be measured return.
Present invention also offers a kind of infrared transmitting device method of testing, can test the state of multiple infrared-emitting diode in an infrared transmitting device to be measured, the method comprises:
A), the transmitting button of an impulse starter is pressed;
B), a firing order is sent;
C), receive described firing order and send a pulse signal to described multiple infrared-emitting diode;
D), judge that whether described pulse signal is identical with the pulse signal that multiple infrared-emitting diode returns.
The proving installation of the infrared transmitting device of the present invention and method thereof are tested infrared transmitting device to be measured by proving installation, can test accurately each infrared-emitting diode, not only save a large amount of test durations and testing expense, and ensure that the qualification of product, commercial production has very large using value.
Accompanying drawing explanation
Fig. 1 is test macro schematic diagram of the prior art.
Fig. 2 is the system composition schematic diagram in infrared transmitting device test macro one embodiment of the present invention.
Fig. 3 is for utilizing the method flow diagram of the testing infrared ray emitter of system execution described in Fig. 2.
Main element symbol description
| Main frame | 10 |
| Testing host | 20 |
| Infrared transmitting device to be measured | 30 |
| An emitting diode | 31 |
| A pin | 311 |
| No. two pins | 312 |
| No. two emitting diodes | 32 |
| Camera | 40 |
| Test macro | 50 |
| Measurement jig | 51 |
| Impulse starter | 52 |
| Launch button | 521 |
| Pulse generation mainboard | 522 |
| Proving installation | 53 |
| Judge module | 531 |
| Indicating module | 532 |
| Step | S10~S15 |
Following embodiment will further illustrate the present invention in conjunction with above-mentioned accompanying drawing.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail.
Refer to Fig. 2, the invention provides a kind of test macro 50 of infrared transmitting device.This test macro 50 is connected with an infrared transmitting device 30 to be measured, and this infrared transmitting device 30 to be measured has multiple infrared-emitting diode, such as an emitting diode 31 and No. two emitting diodes 32 etc.Each emitting diode has again multiple pin, and such as an emitting diode 31 has a pin 311 and No. two pins 312 etc.For an emitting diode 31, in multiple pins of this emitting diode 31, one of them pin is for receiving a pulse signal, a such as pin 311, start working after this emitting diode 31 receives this pulse signal, and return another pulse signal from other pins, such as No. two pins 312.When this emitting diode 31 state is normal, the pulse signal received is identical with the pulse signal returned, otherwise these two pulse signals are not identical.Described test macro 50, for testing the state of multiple emitting diode in this infrared transmitting device 30 to be measured, comprises measurement jig 51, impulse starter 52 and a proving installation 53.This impulse starter 52 comprises transmitting button 521 and a pulse generation mainboard 522, and this proving installation 53 comprises judge module 531 and an indicating module 532.In the present embodiment, this proving installation 53 is a control device having that multifunction module comprises judge module 531 and indicating module 532, such as FPGA(field programmable gate array) chip and MCU(microcontroller) etc.
Described measurement jig 51 is for pressing the transmitting button 521 of described impulse starter 52.
Described impulse starter 52 is for launching the multiple infrared-emitting diodes in a pulse signal to described infrared transmitting device 30 to be measured.In the present embodiment, this impulse starter 52 is a telepilot, this telepilot has multiple button and a mainboard, multiple infrared-emitting diode of described infrared transmitting device to be measured 30 is connected with this mainboard, described transmitting button 521 is a button in the multiple button of this telepilot, and each button in the plurality of button is all corresponding to different pulse signals.For the ease of test, this transmitting button 521 is set to a button fixing in the plurality of button, sends a firing order to described mainboard after this transmitting button 521 is pressed.This mainboard is described pulse generation mainboard 522, and this mainboard 522 receives the multiple infrared-emitting diodes sending a pulse signal corresponding with this transmitting button 521 extremely described infrared transmitting device 30 to be measured after this firing order.
Whether the pulse signal that described judge module 531 returns for each infrared-emitting diode in pulse signal and described infrared transmitting device to be measured more than 30 infrared-emitting diode of judging described pulse generation mainboard 522 and sending is identical.If identical, illustrate that this infrared-emitting diode state is normal, otherwise it is abnormal to illustrate that the state of infrared-emitting diode exists.
Described indicating module 532 is used to indicate the judged result of described judge module 531.In the present embodiment, this indicating module 532 is a display screen, when described judge module 531 is identical to the judged result of an infrared-emitting diode, this indicating module 532 produces the normal information of this infrared-emitting diode state by word or figure, otherwise display one information warning, notifies that tester's on-call maintenance exists abnormal infrared-emitting diode.In other embodiments, this indicating module 532 can be multiple LED, the corresponding infrared-emitting diode of each LED, and the plurality of LED indicates the state of each infrared-emitting diode by normal bright or flashing lamp different conditions.This indicating module 532 can also be a hummer or voice device, is indicated the state of described infrared light emitting diode by different sound.
In other embodiments, described test macro 50 can not use measurement jig 51, by manually pressing the transmitting button 521 in described impulse starter 52.
Refer to Fig. 3, present invention also offers a kind of method of testing for testing infrared ray emitter, the method comprises:
Step S10, measurement jig 51 presses the transmitting button 521 in described impulse starter 52.In the present embodiment, this impulse starter 52 is an improved telepilot, this telepilot has multiple button and a mainboard, each button in the plurality of button is all corresponding to different pulse signals, and in the plurality of button, fixing button is as the transmitting button 521 of impulse starter 52.This mainboard, namely as the pulse generation mainboard 522 of impulse starter 52, is connected with multiple infrared-emitting diodes of described infrared transmitting device 30 to be measured.
Step S11, launches button 521 and sends a firing order to described pulse generation mainboard 522.
Step S12, pulse generation mainboard 522 responds the firing order that described transmitting button 521 sends, and sends each infrared-emitting diode in a pulse signal to described infrared transmitting device to be measured more than 30 infrared-emitting diode.The plurality of infrared-emitting diode is started working after receiving this pulse signal, and returns a pulse signal.In the present embodiment, the pulse signal of transmission be with as pulse signal corresponding to the described fixing button launching button 521.
Step S13, judge module 531 judges that in described multiple infrared-emitting diode, whether each pulse signal returned is identical with the pulse signal that described pulse generation mainboard 522 sends.If identical, enter step S14; Otherwise enter step S15.
In the present embodiment, the pulse signal returned when described infrared-emitting diode is identical with the pulse signal that pulse generation mainboard 522 sends, and illustrates that this infrared-emitting diode state is normal, otherwise description status exists abnormal.
Step S14, indicating module 532 produces the normal information of an infrared-emitting diode state, and this tests end.
In the present embodiment, this indicating module 532 is a display screen, produces the normal information of this infrared-emitting diode state by word.In other embodiments, this indicating module 532 can be multiple LED, the corresponding infrared-emitting diode of each LED, and the plurality of LED produces the normal information of this state by normal bright or flashing lamp different conditions.This indicating module 532 can also be a hummer or voice device, produces the normal information of this state by different sound.
Step S15, indicating module 532 produces an information warning, notifies that tester's on-call maintenance exists abnormal infrared-emitting diode.
In the present embodiment, this indicating module 532 is a display screen, produces this information warning by word.In other embodiments, this indicating module 532 can be multiple LED, the corresponding infrared-emitting diode of each LED, and the plurality of LED produces this information warning by normal bright or flashing lamp different conditions.This indicating module 532 can also be a hummer or voice device, produces this information warning by different sound.
The proving installation of the infrared transmitting device of the present invention and method thereof are tested infrared transmitting device to be measured by proving installation, can test accurately each infrared-emitting diode, not only save a large amount of test durations and testing expense, and ensure that the qualification of product, commercial production has very large using value.
Those skilled in the art will be appreciated that; above embodiment is only used to the present invention is described; and be not used as limitation of the invention; as long as within spirit of the present invention, the suitable change do above embodiment and change all drop within the scope of protection of present invention.
Claims (9)
1. an infrared transmitting device test macro, described test macro is connected with an infrared transmitting device to be measured, this infrared transmitting device to be measured has multiple infrared-emitting diode, the plurality of infrared-emitting diode is started working and is returned another pulse signal after receiving a pulse signal, described test macro is for testing the state of multiple infrared-emitting diode in this infrared transmitting device to be measured, it is characterized in that, comprising:
One measurement jig, for pressing the transmitting button of an impulse starter;
One impulse starter, comprising:
One launches button, when this transmitting button is pressed, sends a firing order;
One pulse generation mainboard, the firing order sent for receiving described transmitting button sends the multiple infrared-emitting diodes of a pulse signal to described infrared transmitting device to be measured, and
One proving installation, comprising:
Whether one judge module is identical for judging the pulse signal that pulse signal that described pulse generation mainboard sends and multiple infrared-emitting diode in described infrared transmitting device to be measured return.
2. test macro as claimed in claim 1, it is characterized in that, described proving installation also comprises:
One indicating module, is used to indicate the judged result of described judge module.
3. test macro as claimed in claim 1, it is characterized in that, described impulse starter is a telepilot, this telepilot has multiple button and a mainboard, described transmitting button is one in the plurality of button, each button in the plurality of button is all corresponding to different pulse signals, and described pulse generation mainboard is described mainboard, and multiple infrared-emitting diode of described infrared transmitting device to be measured is connected with this mainboard.
4. an infrared transmitting device test macro, described test macro is connected with an infrared transmitting device to be measured, this infrared transmitting device to be measured has multiple infrared-emitting diode, the plurality of infrared-emitting diode is started working and is returned another pulse signal after receiving a pulse signal, described test macro is for testing the state of multiple infrared-emitting diode in this infrared transmitting device to be measured, it is characterized in that, comprising:
One impulse starter, comprising:
One launches button, when this transmitting button is pressed, sends a firing order;
One pulse generation mainboard, the firing order sent for receiving described transmitting button sends the multiple infrared-emitting diodes of a pulse signal to described infrared transmitting device to be measured, and
One proving installation, comprising:
Whether one judge module is identical for judging the pulse signal that pulse signal that described pulse generation mainboard sends and multiple infrared-emitting diode in described infrared transmitting device to be measured return.
5. test macro as claimed in claim 4, it is characterized in that, described proving installation also comprises:
One indicating module, is used to indicate the judged result of described judge module.
6. test macro as claimed in claim 4, it is characterized in that, described impulse starter is a telepilot, this telepilot has multiple button and a mainboard, described transmitting button is one in the plurality of button, each button in the plurality of button is all corresponding to different pulse signals, and described pulse generation mainboard is described mainboard, and multiple infrared-emitting diode of described infrared transmitting device to be measured is connected with this mainboard.
7. a method of testing for infrared transmitting device, can test the state of multiple infrared-emitting diode in an infrared transmitting device to be measured, it is characterized in that, the method comprises:
A), the transmitting button operating an impulse starter sends a firing order;
B), receive described firing order and send a pulse signal to described multiple infrared-emitting diode; And
C), judge that whether described pulse signal is identical with the pulse signal that multiple infrared-emitting diode returns.
8. method of testing as claimed in claim 7, is characterized in that, entering steps d when judging that described pulse signal is identical with the pulse signal that multiple infrared-emitting diode returns);
D). produce the normal information of an infrared-emitting diode state.
9. method of testing as claimed in claim 7, is characterized in that, entering step e when judging that described pulse signal is different from the pulse signal that multiple infrared-emitting diode returns);
E). produce an information warning.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310288577.2A CN104280625A (en) | 2013-07-10 | 2013-07-10 | Testing system of infrared emission device and testing method of infrared emission device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201310288577.2A CN104280625A (en) | 2013-07-10 | 2013-07-10 | Testing system of infrared emission device and testing method of infrared emission device |
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| CN104280625A true CN104280625A (en) | 2015-01-14 |
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| CN201310288577.2A Pending CN104280625A (en) | 2013-07-10 | 2013-07-10 | Testing system of infrared emission device and testing method of infrared emission device |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104916120A (en) * | 2015-06-12 | 2015-09-16 | 深圳市共进电子股份有限公司 | Automatic production testing system and automatic production testing method of intelligent infrared emission equipment |
| CN105510791A (en) * | 2015-12-02 | 2016-04-20 | 江苏七维测试技术有限公司 | Test method for testing infrared receiving terminal of remote controller |
| CN105571832A (en) * | 2015-12-20 | 2016-05-11 | 合肥艾斯克光电科技有限责任公司 | LED reception tube test method |
| CN105606340A (en) * | 2015-12-20 | 2016-05-25 | 合肥艾斯克光电科技有限责任公司 | Method for testing LED transmitting tube |
| CN109507563A (en) * | 2018-11-12 | 2019-03-22 | 晶晨半导体(上海)股份有限公司 | Mainboard detection method and system |
| CN110706474A (en) * | 2019-10-17 | 2020-01-17 | 深圳创维－Rgb电子有限公司 | Detection system, method, device, equipment and storage medium for infrared emission function |
| CN111077594A (en) * | 2018-10-22 | 2020-04-28 | 杭州海康威视数字技术股份有限公司 | Gate installation testing method and system |
| CN111307420A (en) * | 2020-01-23 | 2020-06-19 | 珠海荣邦智能科技有限公司 | Infrared quality testing device and method for infrared transmitting tube product |
| CN111510711A (en) * | 2020-06-01 | 2020-08-07 | 厦门宏泰智能制造有限公司 | Automatic interface testing machine and automatic testing method for set top box |
| CN113311259A (en) * | 2021-04-29 | 2021-08-27 | 平顶山聚新网络科技有限公司 | Infrared test system based on electronic component |
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2013
- 2013-07-10 CN CN201310288577.2A patent/CN104280625A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104916120A (en) * | 2015-06-12 | 2015-09-16 | 深圳市共进电子股份有限公司 | Automatic production testing system and automatic production testing method of intelligent infrared emission equipment |
| CN104916120B (en) * | 2015-06-12 | 2018-11-06 | 深圳市共进电子股份有限公司 | A kind of automated production test system and method for intelligent infrared transmitting equipment |
| CN105510791A (en) * | 2015-12-02 | 2016-04-20 | 江苏七维测试技术有限公司 | Test method for testing infrared receiving terminal of remote controller |
| CN105571832A (en) * | 2015-12-20 | 2016-05-11 | 合肥艾斯克光电科技有限责任公司 | LED reception tube test method |
| CN105606340A (en) * | 2015-12-20 | 2016-05-25 | 合肥艾斯克光电科技有限责任公司 | Method for testing LED transmitting tube |
| CN111077594A (en) * | 2018-10-22 | 2020-04-28 | 杭州海康威视数字技术股份有限公司 | Gate installation testing method and system |
| CN109507563A (en) * | 2018-11-12 | 2019-03-22 | 晶晨半导体(上海)股份有限公司 | Mainboard detection method and system |
| CN110706474A (en) * | 2019-10-17 | 2020-01-17 | 深圳创维－Rgb电子有限公司 | Detection system, method, device, equipment and storage medium for infrared emission function |
| CN110706474B (en) * | 2019-10-17 | 2022-05-24 | 深圳创维－Rgb电子有限公司 | Detection system, method, device, equipment and storage medium for infrared emission function |
| CN111307420A (en) * | 2020-01-23 | 2020-06-19 | 珠海荣邦智能科技有限公司 | Infrared quality testing device and method for infrared transmitting tube product |
| CN111510711A (en) * | 2020-06-01 | 2020-08-07 | 厦门宏泰智能制造有限公司 | Automatic interface testing machine and automatic testing method for set top box |
| CN113311259A (en) * | 2021-04-29 | 2021-08-27 | 平顶山聚新网络科技有限公司 | Infrared test system based on electronic component |
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Application publication date: 20150114 |