CN104215341B - Accelerating lifetime testing overtemperature alarm circuit - Google Patents
Accelerating lifetime testing overtemperature alarm circuit Download PDFInfo
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- CN104215341B CN104215341B CN201310211040.6A CN201310211040A CN104215341B CN 104215341 B CN104215341 B CN 104215341B CN 201310211040 A CN201310211040 A CN 201310211040A CN 104215341 B CN104215341 B CN 104215341B
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Abstract
The present invention proposes a kind of accelerating lifetime testing overtemperature alarm circuit, and it includes：Detection unit, its temperature for being used to detect test incubator, it includes input and output end, detects that the input of detection unit connects the first power supply；Control unit, its connection for being used to control test light fixture and second source, it includes first input end, the second input and output end, and the first input end of control unit connects the first power supply, the output end of the second input connecting detection unit of control unit；Alarm unit, it is controlled by control unit, and alarm unit connects the output end of control unit；Wherein, when the temperature that detection unit detects test incubator exceedes the test temperature of setting, control unit control test light fixture is disconnected with second source, and controls alarm unit to alarm.The present invention can improve testing efficiency and precision, reduce the sample proportion of goods damageds.
Description
Technical field
The present invention relates to a kind of warning circuit, more particularly to a kind of accelerating lifetime testing overtemperature alarm circuit.
Background technology
Illuminating industry is widely and important in modern society's application, in all each not phase of illuminating product that all trades and professions are used
Together, purpose is provided to provide more high brightness to improve the safety between productivity ratio and direct labors, therefore, to lighting quality
It is required that also with regard to more and more higher, to the reliability requirement of light fixture product also with regard to more and more higher.Especially to electronic product, its life-span is received
Temperature stress and electric stress influence are especially big, therefore according to electronic product accelerating lifetime testing, drive and research and development light fixture is required for
Accelerating lifetime testing is carried out, due to wanting lighting inside test incubator during accelerating lifetime testing before, by test incubator door
Light fixture lights a large amount of heatings after closing, makes that test incubator can not box interior temperature will be higher in the case of constant temperature, causes
Burn out sample and the inaccurate phenomenon of test data, sample of drawing a design again again is tested, waste of manpower, material, and is increased
The R＆D cycle of product, the invisible cost for also increasing research and development of products.
And be all now, by being manually frequently monitored, to need hand-guided at any time to test during monitoring in test process
Incubator door, just incubator Men Kai great will be tested some when Temperature of Warm Case is too high, temperature is lowered.Then, then will test
Incubator door is closed to certain position to carry out ensureing that temperature maintains required test temperature, and so operation can increase the work of staff
Intensity, inefficiency, measuring accuracy is not high, so as to increased the spoilage of sample.
The content of the invention
The technical problem to be solved in the present invention is to overcome the shortcomings of that above-mentioned prior art is present, and proposes a kind of acceleration longevity
Life test overtemperature alarm circuit, can solve the problem that life test of the prior art needs tester's moment to monitor so as to reduce survey
Examination efficiency and measuring accuracy and specimen breakdown rate problem high.
In order to solve the above technical problems, the present invention proposes a kind of accelerating lifetime testing overtemperature alarm circuit, it includes：Detection
Unit, its temperature for being used to detect test incubator, it includes input and output end, detects the input connection of detection unit
First power supply；Control unit, its connection for being used to control test light fixture and second source, it includes first input end, second defeated
Enter end and output end, the first input end of control unit connects the first power supply, the second input connecting detection of control unit
The output end of unit；Alarm unit, it is controlled by control unit, and alarm unit connects the output end of control unit；Wherein, inspection is worked as
When the temperature that survey unit detects test incubator exceedes the test temperature of setting, light fixture and second source are tested in control unit control
Disconnect, and control alarm unit to alarm.
Preferably, detection unit includes regulation resistance, thermistor and divider resistance, regulation resistance, thermistor with
And divider resistance is sequentially connected in series between the input and ground of detection unit, thermistor is connected inspection with the junction of divider resistance
Survey the output end of unit.
Preferably, regulation resistance and the resistance sum of thermistor are the twice of divider resistance resistance.
Preferably, alarm unit includes a buzzer, and the input of buzzer connects the output end of control unit, buzzer
Output head grounding.
Preferably, control unit include controller, first resistor, second resistance, the first electric capacity, the second electric capacity, phase inverter,
Switching tube and relay, controller include first input end, the second input, the 3rd input, the 4th input, the 5th defeated
Enter end, the first output end, the second output end and the 3rd output end, relay includes normal open switch and normally closed switch, switch
Pipe includes input, output end and control end；First input of first input end and the second input connection control unit
End, first resistor and the first electric capacity is connected in parallel between the first input end of controller and ground, the 3rd input of controller and
4th input connects the junction of first resistor and the first electric capacity, the second of the 5th input connection control unit of controller
Input, first output end and the second output head grounding of controller, after the 3rd output end connection second resistance of controller
Connection phase inverter, the control end of the output end connecting valve pipe of phase inverter, the output head grounding of switching tube, normal open switch is connected to
Between the first input end and output end of control unit, normally closed switch is connected between second source and test light fixture.
Preferably, switching tube is metal-oxide-semiconductor, and the control end of the grid connecting valve pipe of metal-oxide-semiconductor, the source electrode connection of metal-oxide-semiconductor is opened
Close the input of pipe, the output end of the drain electrode connecting valve pipe of metal-oxide-semiconductor.
Preferably, accelerating lifetime testing overtemperature alarm circuit also includes the transformer, rectifier, the first filtering that are sequentially connected
Electric capacity, voltage-stabiliser tube, the second filter capacitor, the first power supply by transformer transformation, rectifier rectification, the first filter capacitor filtering,
After voltage-stabiliser tube voltage stabilizing, the filtering of the second filter capacitor, output end second source.
Preferably, accelerating lifetime testing overtemperature alarm circuit also includes two fuses, and fuse is connected to the first power supply
And between test light fixture.
Preferably, accelerating lifetime testing overtemperature alarm circuit also includes line bank, and test light fixture is by line bank connection the
Two power supplys.
Preferably, the model NE555 of controller.
Compared with prior art, accelerating lifetime testing overtemperature alarm circuit of the invention, by detection unit, control unit
And alarm unit is controlled in test process, test process is enabled to not need tester to be monitored constantly,
Power supply can be disconnected with test light fixture during more than design temperature, and be alarmed by alarm unit, so as to protect sample, also improved
The testing efficiency and the accuracy of test data of tester, reduce the spoilage of sample.
Brief description of the drawings
Fig. 1 is the circuit structure diagram of accelerating lifetime testing overtemperature alarm circuit of the invention.
Description of reference numerals is as follows：The regulation resistance RP thermistor Rt divider resistance R3 of detection unit 1 control units 2
First resistor R1 second resistances R2 the first electric capacity C1 the second electric capacity C2 phase inverter U2 switching tube Q1 relays of controller IC 1
Buzzer SP transformer T rectifiers the first filter capacitors of the BD C3 of device K normal open switch K1 normally closed switch K2 alarm units 3
Voltage-stabiliser tube U1 the second filter capacitor C4 fuse FU line banks JXP tests light fixture Lamp1, Lamp2, Lamp3, Lamp4,
Lamp5。
Specific embodiment
In order to further illustrate principle of the invention and structure, the preferred embodiments of the present invention are carried out in detail in conjunction with accompanying drawing
Describe in detail bright.
Refer to Fig. 1, accelerating lifetime testing overtemperature alarm circuit of the invention, it includes：Detection unit 1, control unit 2
And alarm unit 3.
Detection unit 1 is used to detect the temperature of test incubator, and control unit 2 is used to control test light fixture with second source
Connection, alarm unit 3 is controlled by control unit 2.Detection unit 1 includes input and output end, detects the defeated of detection unit 1
Enter the first power supply of end connection, control unit 2 includes first input end, the second input and output end, the first of control unit 2
Input connects the first power supply, the output end of the second input connecting detection unit 1 of control unit 2, the connection control of alarm unit 3
The output end of unit processed 2.Wherein, when the temperature that detection unit 1 detects test incubator exceedes the test temperature of setting, control
The control test light fixture of unit 2 is disconnected with second source, and controls alarm unit 3 to alarm.
Accelerating lifetime testing overtemperature alarm circuit also include two fuse FU, fuse FU be connected to the first power supply and
Between test light fixture.If occurring short circuit phenomenon in circuit, fuse FU can also fuse and be protected, and directly disconnect power supply,
So as to reach the purpose of protection.
Detection unit 1 includes regulation resistance RP, thermistor Rt and divider resistance R3.Regulation resistance RP, thermistor
Rt and divider resistance R3 are sequentially connected in series between the input and ground of detection unit 1, thermistor Rt and divider resistance R3's
The output end of junction connecting detection unit 1.In the present embodiment, the resistance sum of regulation resistance RP and thermistor Rt is partial pressure
The twice of resistance R3 resistances.Wherein, thermistor Rt is used for sensing the temperature of test incubator, and regulation resistance RP can adjust itself
Resistance make the resistance sum of regulation resistance RP and thermistor Rt for the twice of divider resistance R3 resistances.
Control unit 2 includes controller IC 1, first resistor R1, second resistance R2, the first electric capacity C1, the second electric capacity C2, anti-
Phase device U2, switching tube Q1 and relay K.Controller IC 1 includes first input end, the second input, the 3rd input, the 4th
Input, the 5th input, the first output end, the second output end and the 3rd output end.Relay K include normal open switch K1 with
And normally closed switch K2.Switching tube Q1 includes input, output end and control end.
First input end and the second input connect the first input end of control unit 2, the electricity of first resistor R1 and first
Hold C1 to be connected in parallel between the first input end of controller IC 1 and ground, the 3rd input of controller IC 1 and the 4th input connect
Connect the junction of first resistor R1 and the first electric capacity C1, the second input of the 5th input connection control unit 2 of controller IC 1
End, first output end and the second output head grounding of controller IC 1, the 3rd output end connection second resistance of controller IC 1
Phase inverter U2 is connected after R2.The control end of the output end connecting valve pipe Q1 of phase inverter U2, the output head grounding of switching tube Q1, often
Switch K1 be connected between the first input end of control unit 2 and output end, normally closed switch K2 be connected to second source and
Between test light fixture.
In the present embodiment, the model NE555 of controller IC 1.Please continue to refer to Fig. 1, controller IC 1 includes the first input
End, the second input, the 3rd input, the 4th input, the 5th input, the first output end, the second output end and the 3rd
Output end corresponds to the pin 4,8,6,7,2,5,1,4 of chip NE555 respectively.
Alarm unit 3 includes a buzzer SP, and the input of buzzer SP connects the output end of control unit 2, buzzer
The output head grounding of SP.
In the present embodiment, the model CD4069 of phase inverter U2.In the present embodiment, switching tube Q1 is metal-oxide-semiconductor, metal-oxide-semiconductor
The control end of grid connecting valve pipe Q1, the input of the source electrode connecting valve pipe Q1 of metal-oxide-semiconductor, the drain electrode connecting valve of metal-oxide-semiconductor
The output end of pipe Q1.In other embodiments, switching tube Q1 is triode, the control of the base stage connecting valve pipe Q1 of triode
End, the input of the colelctor electrode connecting valve pipe Q1 of triode, the output end of the emitter stage connecting valve pipe Q1 of triode.
Accelerating lifetime testing overtemperature alarm circuit also includes the transformer T, rectifier BD, the first filter capacitor that are sequentially connected
C3, voltage-stabiliser tube U1 and the second filter capacitor C4.First power supply is by transformer T transformations, rectifier BD rectifications, the first filtered electrical
After holding C3 filtering, voltage-stabiliser tube U1 voltage stabilizings, the second filter capacitor C4 filtering, output end second source.In the present embodiment, the first power supply
It is AC220V, second source is DC12V.The power supply of the first power supply is changed into AC24V by transformer T, and rectifier BD is AC24V rectifications
It is DC24V, the DC24V voltages of voltage-stabiliser tube U1 output stabilizations, the first filter capacitor C3 and the second filter capacitor C4 filtering and suction
Receive crest voltage.In the present embodiment, the model 7812 of voltage-stabiliser tube U1.
Accelerating lifetime testing overtemperature alarm circuit also includes line bank JXP.Test light fixture connects second by line bank JXP
Power supply.In the present embodiment, line bank JXP is the binding post for playing switching test light fixture, and test light fixture is carried out being connected in parallel on end
On son.
In the present embodiment, the present invention according to the size of test lamp current can increase the experiment number of test light fixture
Amount, general I takes charge of the test light fixture experiment quantity for carrying out accelerating lifetime testing for 20 sets.
The present invention also proposes a kind of accelerating lifetime testing overtemperature alarm device, and it includes accelerating lifetime testing as described above
Overtemperature alarm circuit.
Describe operation principle of the invention in detail with reference to Fig. 1.
Test light fixture is placed in test incubator first, test light fixture is connected to wiring according to the mode of normal work
Row JXP on, then the temperature inductor of thermistor Rt is fixed in incubator, it is ready after, open test incubator
Power switch, Temperature of Warm Case is set as requested, such as I take charge of regulation electronic product it is minimum accelerate temperature be 70 degree, according to 70
Degree environment temperature regulates the resistance of slide rheostat regulation resistance RP, makes the resistance sum of regulation resistance RP and thermistor Rt
It is the twice of the resistance of divider resistance R3, energization work is carried out to test light fixture after being ready to.
Then civil power is input into, electric current is divided into two-way, step-down is carried out for AC12V by transformer T all the way, then again by whole
Stream device BD carries out rectification and obtains DC12V voltages, is filtered by the first filter capacitor C3, is stablized by voltage-stabiliser tube U1
DC voltage, by the second filter capacitor C4 absorption peak voltages.The resistance of resistance RP is now adjusted due to having regulated so that
It is the twice of the resistance of divider resistance R3 to adjust the resistance sum of resistance RP and thermistor Rt.If now temperature at 70 degree or
When lower than 70 degree, the 2 pin output low level of chip NE555,3 pin output high level, by phase inverter U2, due to phase inverter U2
It is not circuit, flows to the grid of metal-oxide-semiconductor for low level, therefore, metal-oxide-semiconductor is not turned on, and relay K control normal open switch K1 breaks
Open, buzzer SP does not send alarm, while testing light fixture Lamp1, Lamp2, Lamp3, Lamp4, Lamp5 is connected to relay
On the normally closed points of normally closed switch K2 of K, therefore now test light fixture conducting normal work.
Accelerating lifetime testing is carried out, when test light fixture is during accelerating lifetime testing, due to testing the point brighten the hair of light fixture
Heat, causes the test incubator can not be if constant temperature, and test Temperature of Warm Case rises.And thermistor Rt detects the temperature of test incubator
When degree has been increased beyond test temperature, the resistance of thermistor Rt is also reduced by, after thermistor Rt resistances reduce, chip
2 pin of NE555 export high level, then 3 pin output low level, when by phase inverter U2, phase inverter U2 input low levels, output
High level reaches the grid of metal-oxide-semiconductor, turns on metal-oxide-semiconductor, and relay K must be electric, the normal open switch K1 closures of relay K, while
Electric current flows to buzzer SP by normal open switch K1, buzzer SP is carried out alert notice tester.In addition, normally closed switch K2
Electric also must just be disconnected, because test light fixture is concatenated on the normally closed point of the normally closed switch K2 of relay K again, therefore test light fixture
Also just power off, will not float high by temperature and produce burnout phenomenon so as to just protect and test light fixture.
Compared with prior art, accelerating lifetime testing overtemperature alarm circuit of the invention, by detection unit, control unit
And alarm unit is controlled in test process, test process is enabled to not need tester to be monitored constantly,
Power supply can be disconnected with load during more than design temperature, and be alarmed by alarm unit, so as to protect sample, also improve survey
The testing efficiency of examination personnel and the accuracy of test data, reduce the spoilage of sample.
Preferable possible embodiments of the invention are the foregoing is only, is not limited the scope of the invention.It is all to use this
Equivalent structure change done by description of the invention and accompanying drawing content, is all contained in protection scope of the present invention.
Claims (7)
1. a kind of accelerating lifetime testing overtemperature alarm circuit, it is characterised in that it includes：
Detection unit, its temperature for being used to detect test incubator, it includes input and output end, the detection unit it is defeated
Enter the first power supply of end connection；
Control unit, its connection for being used to control test light fixture and second source, it include first input end, the second input with
And output end, first input end connection first power supply of described control unit, the second input company of described control unit
Connect the output end of the detection unit；
Alarm unit, it is controlled by described control unit, and the alarm unit connects the output end of described control unit；
Wherein, when the temperature that the detection unit detects the test incubator exceedes the test temperature of setting, the control
The unit control test light fixture is disconnected with the second source, and controls the alarm unit to alarm；
The detection unit includes regulation resistance, thermistor and divider resistance, the regulation resistance, thermistor and point
Piezoresistance is sequentially connected in series between the input and ground of the detection unit, and the thermistor connects with the junction of divider resistance
Connect the output end of the detection unit；
The regulation resistance and the twice that the resistance sum of thermistor is the divider resistance resistance；
Described control unit includes controller, first resistor, second resistance, the first electric capacity, the second electric capacity, phase inverter, switching tube
And relay, the controller include first input end, the second input, the 3rd input, the 4th input, the 5th input
End, the first output end, the second output end and the 3rd output end, the relay include normal open switch and normally closed switch, institute
Stating switching tube includes input, output end and control end；
The first input end of the controller and the second input connect the first input end of described control unit, described first
Resistance and the first electric capacity are connected in parallel between the first input end of the controller and ground, the 3rd input of the controller and
4th input connects the junction of the first resistor and the first electric capacity, and the 5th input of the controller connects the control
Second input of unit processed, first output end and the second output head grounding of the controller, the 3rd of the controller the
Output end connects the phase inverter after connecting the second resistance, and the output end of the phase inverter connects the control of the switching tube
End, the output head grounding of the switching tube, the normal open switch is connected to the first input end and output end of described control unit
Between, the normally closed switch is connected between the second source and test light fixture.
2. accelerating lifetime testing overtemperature alarm circuit as claimed in claim 1, it is characterised in that the alarm unit includes
Buzzer, the input of the buzzer connects the output end of described control unit, the output head grounding of the buzzer.
3. accelerating lifetime testing overtemperature alarm circuit as claimed in claim 1, it is characterised in that the switching tube is metal-oxide-semiconductor,
The grid of the metal-oxide-semiconductor is the control end of the switching tube, and the source electrode of the metal-oxide-semiconductor is the input of the switching tube, described
The drain electrode of metal-oxide-semiconductor is the output end of the switching tube.
4. accelerating lifetime testing overtemperature alarm circuit as claimed in claim 1, it is characterised in that the accelerating lifetime testing mistake
Warm warning circuit also includes the transformer, rectifier, the first filter capacitor, voltage-stabiliser tube, the second filter capacitor that are sequentially connected, described
First power supply is by the transformer transformation, rectifier rectification, the filtering of the first filter capacitor, voltage-stabiliser tube voltage stabilizing, the second filtered electrical
After capacitor filter, output to the second source.
5. accelerating lifetime testing overtemperature alarm circuit as claimed in claim 1, it is characterised in that the accelerating lifetime testing mistake
Warm warning circuit also includes two fuses, and the fuse is connected between first power supply and the test light fixture.
6. accelerating lifetime testing overtemperature alarm circuit as claimed in claim 1, it is characterised in that the accelerating lifetime testing mistake
Warm warning circuit also includes line bank, and the test light fixture connects the second source by the line bank.
7. accelerating lifetime testing overtemperature alarm circuit as claimed in claim 1, it is characterised in that the model of the controller
NE555。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310211040.6A CN104215341B (en) | 2013-05-30 | 2013-05-30 | Accelerating lifetime testing overtemperature alarm circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310211040.6A CN104215341B (en) | 2013-05-30 | 2013-05-30 | Accelerating lifetime testing overtemperature alarm circuit |
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| CN104215341A CN104215341A (en) | 2014-12-17 |
| CN104215341B true CN104215341B (en) | 2017-06-16 |
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| CN201310211040.6A Active CN104215341B (en) | 2013-05-30 | 2013-05-30 | Accelerating lifetime testing overtemperature alarm circuit |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110426617A (en) * | 2018-04-27 | 2019-11-08 | 株洲中车时代电气股份有限公司 | A kind of IGBT power module acceleration service life test method and device |
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|---|---|---|---|---|
| CN201508250U (en) * | 2009-09-27 | 2010-06-16 | 陈明泉 | Overheat detection and alarm device |
| CN201555670U (en) * | 2009-09-29 | 2010-08-18 | 上海第二工业大学 | Temperature measuring circuit |
| CN102042884A (en) * | 2010-10-22 | 2011-05-04 | 江苏省电力公司建湖县供电公司 | Abnormity alarm for connector of electric junction box |
| CN102413599A (en) * | 2010-09-20 | 2012-04-11 | 海洋王照明科技股份有限公司 | LED (light-emitting diode) constant-current driving circuit and LED lamp |
| CN202956219U (en) * | 2012-11-02 | 2013-05-29 | 成都卓程科技有限公司 | Emergency type temperature alarming circuit designed based on integrated circuit |
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2013
- 2013-05-30 CN CN201310211040.6A patent/CN104215341B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201508250U (en) * | 2009-09-27 | 2010-06-16 | 陈明泉 | Overheat detection and alarm device |
| CN201555670U (en) * | 2009-09-29 | 2010-08-18 | 上海第二工业大学 | Temperature measuring circuit |
| CN102413599A (en) * | 2010-09-20 | 2012-04-11 | 海洋王照明科技股份有限公司 | LED (light-emitting diode) constant-current driving circuit and LED lamp |
| CN102042884A (en) * | 2010-10-22 | 2011-05-04 | 江苏省电力公司建湖县供电公司 | Abnormity alarm for connector of electric junction box |
| CN202956219U (en) * | 2012-11-02 | 2013-05-29 | 成都卓程科技有限公司 | Emergency type temperature alarming circuit designed based on integrated circuit |
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