CN208239569U - A kind of dipulse test platform - Google Patents
A kind of dipulse test platform Download PDFInfo
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- CN208239569U CN208239569U CN201820461840.1U CN201820461840U CN208239569U CN 208239569 U CN208239569 U CN 208239569U CN 201820461840 U CN201820461840 U CN 201820461840U CN 208239569 U CN208239569 U CN 208239569U
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Abstract
The utility model discloses a kind of dipulse test platforms.The dipulse test platform of the utility model, comprising: detection module, detection module are connect with element to be tested, are detected for treating testing element；Drive module, drive module includes driving pulse circuit and driving resistance conversion circuit, driving pulse circuit is by driving resistance conversion circuit to connect with element to be tested, driving pulse circuit provides pulse signal for element to be tested, drives resistance conversion circuit for changing the driving resistance of element to be tested；And control module, the signal output end of control module are communicated to connect with detection module, driving pulse circuit and driving resistance conversion circuit respectively；The signal input part of control module is connect with element to be tested.The dipulse test platform of the utility model is able to solve the problem of prior art can not change driving current size on the basis of not destroying to equipment.
Description
Technical field
The utility model relates to double impulse test technical field more particularly to a kind of dipulse test platforms.
Background technique
With the rapid development of China's new energy technology, alternating current-direct current energy is converted into the most pass for photovoltaic and new energy vehicle
The sport technique segment of key, and receive the great attention of new energy industry, country.
IGBT power device is the core devices of alternating current-direct current energy conversion, and energy conversion is directly determined using parameter
Stability and efficiency.Various types of IGBT power devices can be used in the conversion of alternating current-direct current energy, due to many models
Therefore the non-volume production of IGBT power device before applying the IGBT power device of different model to be designed and use, generally needs
Will the IGBT power device first for different model test, to obtain the parameter of IGBT power device.
But traditional double impulse test equipment only can simply test IGBT.When the function of test different model
When rate device, since the driving current for opening shutdown of the power device to different voltages grade is different, to power device
Driving circuit and driving resistance demand it is also different, lead to the driving electricity for being frequently necessary to replace different resistance values when test manually
Resistance.And in the prior art, old driving resistance generally is dismantled to the replacing options of the driving resistance in double impulse test equipment,
New driving resistance is welded by electric iron again, is unable to satisfy conveniently testing requirement.Simultaneously as double impulse test is set
Standby element needs often disassembly and welding, also will affect the reliability and safety of double impulse test equipment.
Therefore, driving electricity can not be changed on the basis of not destroying to equipment for existing double impulse test equipment
The problem of flowing size, it is desirable to provide a kind of dipulse test that the driving current that can satisfy different IGBT power devices requires is flat
Platform.
Utility model content
To solve the above problems, the utility model provides a kind of dipulse test platform, driven since its drive module has
Dynamic resistance conversion circuit, can provide corresponding driving resistance for the element to be tested of different voltages grade, solve the prior art
The problem of driving current size can not be changed on the basis of not destroying to equipment.
To achieve the above object, the present invention provides a kind of dipulse test platforms, comprising:
Detection module, detection module are connect with element to be tested, are detected for treating testing element；
Drive module, drive module include driving pulse circuit and driving resistance conversion circuit, and driving pulse circuit passes through
Driving resistance conversion circuit is connect with element to be tested, and driving pulse circuit provides pulse signal, driving electricity for element to be tested
Conversion circuit is hindered for changing the driving resistance of element to be tested；With
Control module, the signal output end of control module turn with detection module, driving pulse circuit and driving resistance respectively
Change circuit communication connection；The signal input part of control module is connect with element to be tested.
Further, driving resistance conversion circuit includes a plurality of resistance converting branch parallel with one another, and control module passes through
Different resistance converting branch conductings is controlled, the driving resistance of element to be tested is changed.
Further, detection module includes element test circuit and pulse test circuit, and element test circuit and pulse are surveyed
Examination circuit is connect with element to be tested respectively, and element test circuit carries out failure testing, pulse test for treating testing element
Circuit carries out dipulse test for treating testing element；
The signal output end of control module is connect with element test circuit and pulse test circuit communication respectively, to control member
The working condition of part test circuit and pulse test circuit.
It further, further include power module, power module includes:
High voltage power supply, high voltage power supply are the power supply of pulse test circuit；
Low-tension supply, low-tension supply are respectively element test circuit, drive module and control module power supply.
It further, further include voltage regulator circuit, voltage regulator circuit is connected in parallel with high voltage power supply.
Further, control module is also connect with high voltage power supply, to adjust the output voltage of high voltage power supply.
Further, pulse test circuit includes unhurried current circuit, when pulse test circuit and element to be tested constitute circuit,
Flow slowly circuit and element to be tested series connection.
Further, control module includes host computer, controller and sample circuit；Controller and host computer communicate to connect；
The signal output end of controller is converted with element test circuit, pulse test circuit, driving pulse circuit and driving resistance respectively
Circuit communication connection；The signal input part of controller is connect by sample circuit with element to be tested.
Further, sample circuit is voltage sampling circuit, and controller acquires element to be tested by voltage sampling circuit
The voltage signal at both ends.
It further, further include protective module, protective module includes:
First protection circuit, the first protection circuit are connect with pulse test circuit in parallel；
Second protection circuit, the second protection circuit are connect with element to be tested.
The dipulse test platform of the utility model makes to drive arteries and veins since drive module is equipped with driving resistance conversion circuit
The pulse voltage signal for rushing circuit sending can be by driving resistance conversion circuit to adjust the driving resistance of element to be tested
Afterwards, it is conveyed to element to be tested, so as to change driving current size on the basis of not destroying to equipment, is improved
Testing efficiency, and make that the testing reliability of dipulse test platform is higher, damage risk is smaller.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the dipulse test platform of the utility model；
Fig. 2 is the circuit diagram of the dipulse test platform of the utility model one embodiment；
Fig. 3-6 is the dipulse test platform using embodiment illustrated in fig. 2 to the acquisition wave obtained after power device test
Shape schematic diagram.
Specific embodiment
In the following, structure and working principle to the utility model etc. are further described in conjunction with attached drawing.
As shown in Figure 1, a kind of dipulse test platform of the utility model embodiment, including detection module 10, driving mould
Block 20 and control module 30.Wherein, drive module 20 includes driving pulse circuit 21 and driving resistance conversion circuit 22.
Specifically, detection module 10 is connect with element to be tested, is detected for treating testing element.Driving pulse electricity
By driving resistance conversion circuit 22 to connect with element to be tested, driving pulse circuit 21 provides pulse for element to be tested on road 21
Signal drives resistance conversion circuit 22 for changing the driving resistance of element to be tested.The signal of control module 30 exports
End is communicated to connect with detection module 10, driving pulse circuit 21 and driving resistance conversion circuit 22 respectively, and control module 30 can
Whether control detection module 10 and driving pulse electric current 21 work, and control drives resistance conversion circuit 22 by pulse signal
Driving current change to size needed for element to be tested.The signal input part of control module 30 is connect with element to be tested, with
Obtain the test result of element to be tested.
In embodiments of the present invention, detection module 10 includes element test circuit 11 and pulse test circuit 12.Wherein, first
Part test circuit 11 and pulse test circuit 12 are connect with element in parallel to be tested respectively, and element test circuit 11 is used for to be measured
It tries element and carries out failure testing, pulse test circuit 12 carries out dipulse test for treating testing element.Control module 30
Signal output end is communicated to connect with element test circuit 11 and pulse test circuit 12 respectively, tests 11 He of circuit with control element
Whether pulse test circuit 12 works.
In the utility model embodiment, element to be tested can be the IGBT power device of different model, at this point, double arteries and veins
Rush the working principle of test platform are as follows:
Before carrying out dipulse test, 30 control element of control module tests circuit 11 and works, while controlling pulse test
Circuit 12 does not work, even if element test circuit 11 is connected to element to be tested and constitutes circuit, make pulse test circuit 12 with
Element to be tested is not connected to.Control module 30 controls drive module 20 and issues pulse signal to element to be tested, and acquires to be measured
The first test result for trying element, by compared with presupposed information, judging whether element to be tested is active component.If to be tested
Element is active component, then treats testing element and carry out dipulse test；If element to be tested is not active component, do not treat
Testing element carries out dipulse test, and sounds an alarm prompt to tester.
When carrying out dipulse test, control module 30 controls pulse test circuit 12 and works, while control element is tested
Circuit 11 does not work, even if pulse test circuit 12 is connected to element to be tested and constitutes circuit, make element test circuit 11 with
Element to be tested is not connected to.Control module 30 controls driving pulse circuit 21 and issues pulse signal to element to be tested, meanwhile, control
The control driving resistance conversion circuit 22 of molding block 30 is to be measured to drive by the drive current adjustment of pulse signal to required size
Try element conductive, to acquire the second test result of element to be tested, according to the analysis to second test result, determine to
The parameter of testing element.
Due to the dipulse test platform of the embodiment of the present invention, since drive module 20 is equipped with driving resistance conversion circuit
22, the pulse voltage signal for enabling driving pulse circuit 21 to issue adjusts size of current by driving resistance conversion circuit 22
Afterwards, it is conveyed to element to be tested, so as to change the driving electricity of element to be tested on the basis of not destroying to equipment
Resistance value is hindered, testing efficiency is improved, and makes that the testing reliability of dipulse test platform is higher, damage risk is smaller.
In addition, the dipulse test platform of the embodiment of the present invention can be first by pulse before carrying out dipulse test
Test circuit 12 is isolated with element to be tested, and detects whether element to be tested is active component, when element to be tested has been determined
After being active component, then element to be tested accessed into pulse test circuit 12, is able to solve in the prior art due to member to be tested
The problem of part fails, and dipulse test platform is caused to damage.
In embodiments of the present invention, driving resistance conversion circuit may include a plurality of resistance converting branch parallel with one another,
Every resistance converting branch is respectively provided with corresponding transfer resistance, since the resistance value of different transfer resistances is different, control
Module can be connected by controlling different resistance converting branch, change the transfer resistance connected in circuit, thus change to
The driving resistance of testing element.
The dipulse test platform of the embodiment of the present invention further includes power module 40, and power module 40 includes high voltage power supply
And low-tension supply.Wherein, when testing into dipulse, high voltage power supply is the power supply of pulse test circuit 12.Low-tension supply is respectively
Element test circuit 11, drive module 20 and control module 30 are powered.Specifically, when carrying out component failure test, low tension
Source is the power supply of element test circuit 11.In entire test process, low-tension supply is always drive module 20 and control module 30
Power supply.
In embodiments of the present invention, control module 30 can also be communicated to connect with high voltage power supply, right by control module 30
The parameter of high voltage power supply is configured, to adjust the output voltage of high voltage power supply, to change the detection environment of element to be tested.
As shown in Fig. 2, in an embodiment of the invention, dipulse test platform is for detecting element QD1's to be tested
Parameter, including detection module 10, drive module 20, control module 30 and power module 40.
In embodiments of the present invention, power module 40 includes high-voltage power module 40DC1 and low-tension supply module 40DC2.
It wherein, is the topological structure of rectifier bridge and single-ended reverse exciting Buck conversion circuit inside low-tension supply module 40DC2,
Its principle is that first pass through 230V AC rectification that rectifier bridge provides alternating current AC1 be 310V direct current, then passes through single-ended reverse exciting
310V direct current drop is depressured into the driving pulse circuit of element test circuit 11, drive module 20 by Buck conversion circuit respectively
21+the 15V ,+5V and+3.3V direct current needed with driving resistance conversion circuit 22 and the power supply of control module 30, give dipulse
Test platform provides light current power supply.
It is secondary circuit topology of the diode uncontrollable rectifier bridge plus Buck-Boost inside high-voltage power module 40DC1
Structure, principle are that first pass through 230V AC rectification that rectifier bridge provides alternating current AC1 be 310V direct current, then is passed through
The high tension voltage that the secondary circuit of Buck-Boost needs 310V direct current electric boost at pulse test circuit 12.Specifically, may be used
To adjust the corresponding output voltage of high voltage power supply according to the standard test voltage condition of the device to be detected of different voltages grade
Value.For example, the output voltage values that high voltage power supply can be set are 400V for the device to be detected of 600V voltage class；For
The device to be detected of 1200V voltage class, the output voltage values that high voltage power supply can be set are 600V.
In embodiments of the present invention, detection module 10 includes element test circuit 11 and pulse test circuit 12.
Wherein, element test circuit 11 include relay K4, resistance R2 and low-tension supply DC2, relay K4, resistance R2 and
After low-tension supply DC2 is sequentially connected in series, it is connected to the end C1 and the end E1 of element QD1 to be tested, makes relay K4, resistance R2, low pressure
Power supply DC2 and element QD1 to be tested constitutes circuit.
At this point, control module 30 can by control relay K4 on-off, control element test circuit 11 with it is to be tested
Whether element QD1 is connected to.After control module 30 controls relay K4 closure, control module 30 controls drive module 20 and sends
Pulse signal, and first test result of the element QD1 to be tested at conductive and nonconductive two kinds is detected, according to first
Test result determines whether element QD1 to be tested is active component.
After pulse test circuit 12 is including relay K3 and high voltage power supply DC1, relay K3 and high voltage power supply DC1 series connection,
It is connected to the end C1 and the end E1 of element QD1 to be tested, constitutes back relay K3, high voltage power supply DC1 and element QD1 to be tested
Road.
At this point, control module 30 can by control relay K3 on-off, control pulse test circuit 12 with it is to be tested
Whether element QD1 is connected to.After control module 30 controls relay K3 closure, control module 30 controls drive module 20 and sends
Pulse signal, and the second test result of element QD1 to be tested is detected, element to be tested is determined according to the second test result
The parameter of QD1.
Therefore, the embodiment of the present invention can realize that treating testing element QD1 carries out dipulse test by detection module 10
Function, and simultaneously realize treat testing element QD1 voltage protection and failure judgement protection.
In embodiments of the present invention, drive module 20 includes driving pulse circuit 21 and driving resistance conversion circuit 22, is driven
Moving pulse circuit 21 is by driving resistance conversion circuit 22 to connect with element to be tested.
Driving pulse circuit 21 includes drive control device and transformer, and drive control device passes through transformer and control module 30
Connection.Driving resistance conversion circuit 22 includes the first driving resistance conversion circuit and the second driving resistance conversion circuit.Driving control
The Vcc pin of device processed is connect with the end C1 of element QD1 to be tested, and GL pin, the GH pin of drive control device pass through first respectively
Driving resistance conversion circuit, the second driving resistance conversion circuit are connect with the end G1 of element QD1 to be tested, the Vc of drive control device
Pin is connect with the end E1 of element QD1 to be tested, to provide pulse signal for element QD1 to be tested.
Driving resistance conversion circuit 22 includes that the first driving resistance conversion circuit and second drive resistance conversion circuit, each
Driving resistance conversion circuit 22 respectively includes a plurality of resistance converting branch parallel with one another.Specifically, every resistance converting branch
A relay and a driving resistance can be respectively included, relay and driving resistance are connected in series.As shown in Fig. 2, first
Drive resistance conversion circuit to have five first resistor converting branch: relay Ka, driving resistance Rgon1 constitute first first
Resistance converting branch；Relay Kb, driving resistance Rgon2 constitute Article 2 first resistor converting branch；Relay Kc, driving electricity
It hinders Rgon3 and constitutes Article 3 first resistor converting branch；Relay Kd, driving resistance Rgon4 constitute Article 4 first resistor and turn
Change branch；Relay Ke, driving resistance Rgon5 constitute Article 5 first resistor converting branch.Second driving resistance conversion circuit
With five second resistance converting branch: relay Kf, driving resistance Rgoff1 constitute first second resistance converting branch；
Relay Kg, driving resistance Rgoff2 constitute Article 2 second resistance converting branch；Relay Kh, driving resistance Rgoff3 are constituted
Article 3 second resistance converting branch；Relay Ki, driving resistance Rgoff4 constitute Article 4 second resistance converting branch；Relay
Device Kj, driving resistance Rgoff5 constitute Article 5 second resistance converting branch.
Control module 30 can by control include and element QD1 to be tested it is matched driving resistance resistance converting branch
Conducting controls the relay closure on the resistance converting branch, which is accessed in circuit, in the test phase
Between use, be supplied to the matched driving current of element QD1 to be tested.
When control module 30 issues dipulse signal to drive control device, which arrives boost in voltage by transformer
The voltage range (0~15V) driven needed for element QD1 to be tested, then issues through drive control device, using corresponding resistance
Driving current size needed for converting branch is adjusted to element QD1 to be tested carries out switch control to treat testing element QD1,
Control module 30 is set to obtain the second test result according to switch control result.Specifically, to be measured when pulse signal is high level
Element QD1 conducting is tried, when pulse signal is low level, element QD1 cut-off to be tested.
The dipulse test platform of the embodiment of the present invention further includes voltage regulator circuit, and voltage regulator circuit is in parallel with high voltage power supply to be connected
It connects.Specifically, voltage regulator circuit includes accumulation of energy branch and releases energy branch, and accumulation of energy branch is connected with energy branch circuit parallel connection is released.
As shown in Fig. 2, accumulation of energy branch includes capacitor C1, release can branch include resistance R1 and identical as element QD1 to be tested
Power device QD3.Capacitor C1 is parallel to the both ends high voltage power supply DC1.One end of resistance R1 is connect with one end of capacitor C1, electricity
The other end of resistance R1 is connect with the end C3 of power device QD3, and the end E3 of power device QD3 is connect with the other end of capacitor C1.Its
In, setting resistance R1 is to make its discharge current value according to Ohm's law and by current limliting in capacitor C1 electric discharge.It needs to illustrate
, the cathode that power device QD3 may be replaced with diode connect with resistance R1, and anode and the capacitor C1 of diode connect
It connects.The model of diode can be similar and different with the diode model in element QD1 to be tested.
In order to guarantee the safety of dipulse test platform, before carrying out dipulse test, without being carried out to capacitor C1
Charging, in embodiments of the present invention, further respectively had between the both ends of capacitor C1 and the both ends of high voltage power supply DC1 relay K1 and
Relay K2, relay K3 are series between high voltage power supply DC1 and relay K3, relay K2 be series at high voltage power supply DC1 with
Between element QD1 to be tested.Control module 30 can control the on-off of relay K1 and relay K2, specifically, when carrying out
After failure detection, when testing element QD1 progress dipulse test is treated in preparation, control module 30 controls relay K1 and relay
Device K2 closure, makes high voltage power supply DC1 charge capacitor C1, when control module 30 has detected the voltage Ubus of capacitor C1
Through it is identical as the output voltage of high voltage power supply DC1 when, control module 30 controls relay K3 closure, and treats testing element QD1
Carry out dipulse test.It, can branch by releasing in order to guarantee the safety of dipulse test platform at the end of dipulse test
It discharges capacitor C1.
In embodiments of the present invention, pulse test circuit 12 may include unhurried current circuit, and pulse test circuit 12 is connected
And when constituting circuit with element to be tested, unhurried current circuit and element to be tested are connected in series.Specifically, unhurried current circuit includes slow
Diode and reactor are flowed, unhurried current diode and reactor are connected in parallel.Wherein, unhurried current diode can be and element to be tested
Diode in the identical power device QD2 of QD1, can moreover be only it is different from the diode model in element QD1 to be tested or
Identical diode.Power device QD2 can be connect with drive module 20, when drive module 20 sends arteries and veins to power device QD2
When rushing signal, power device QD2 can be made to be connected, realize the release to the electricity of capacitor C1.
As shown in Fig. 2, in embodiments of the present invention, unhurried current circuit includes reactor L1 and power device QD2.Power device
The end C2, the end E2 of QD2 is connect with the both ends of reactor L1 respectively, also, the end E2 of power device QD2 also with element to be tested
The end C1 of QD1 connects, and the end C2 of power device QD2 also connect with relay K3, make power device QD2 be series at relay K3 and
Between element QD1 to be tested.Due to being in series with power device QD2 in pulse test circuit 12, unhurried current can be played in circuit
Effect, to improve the measuring accuracy for treating testing element QD1.
In embodiments of the present invention, control module 30 includes host computer, controller and sample circuit.Wherein, controller with
Host computer communication connection, the signal output end of controller respectively with element test circuit 11, pulse test circuit 12, driving pulse
Circuit 21 and driving resistance conversion circuit 22 communicate to connect, and the signal input part of controller passes through sample circuit and member to be tested
Part connection.
As shown in Fig. 2, controller can be DSP control panel, the GPIO pin of DSP control panel is used to issue each relay
The signal of its on-off is controlled, the ADC pin of DSP control panel and the circuit output end of sample circuit connect, DSP control panel
RS485 pin is used to communicate to connect with host computer, and the GPIO10 pin of DSP control panel is used to communicate to connect with drive control device.
Wherein, DSP control panel receive host computer start test instruction after, can from GPIO10 pin as drive control device issue
Dipulse signal, and include the resistance converting branch pair with the matched driving resistance of element QD1 to be tested by GPIO control
The relay closure answered, by issuing voltage to element QD1 to be tested, the dipulse signal of currents match treats testing element
QD1 carries out switch control.
In addition to this, DSP control panel can also be communicated to connect with high voltage power supply DC1, and tester can be by host computer
The size of the output voltage of high voltage power supply DC1 and the pulse width of dipulse signal is arranged, thus to high-voltage electricity in the software set
Source DC1 is manually adjusted.
In embodiments of the present invention, sample circuit can be voltage sampling circuit, and controller is adopted by voltage sampling circuit
Collect the voltage signal at element both ends to be tested.Specifically, voltage sampling circuit include resistance RD1, RD2, RD3, RD4, RD5,
RD6, RD7 and differential operational amplifier UC1.Wherein, resistance RD1, RD2 is Chip-R, is parallel to element QD1 to be tested respectively
The end C1, the end E1.The high voltage of acquisition can be dwindled into 0~3V's by differential operational amplifier UC1 by voltage sampling circuit
After voltage signal, the ADC pin of DSP control panel is sent to, so that the voltage value Uce1 at the end C1 of element QD1 to be tested, the end E1
As test result.
When the end C1 of element QD1 to be tested, the end E1 voltage value Uce1 as test result when, carry out failure testing
When, after DSP control panel controls relay K4 conducting, control module 30 controls drive module 20 and sends pulse signal, makes to be tested
Element QD1 conducting, then, detect respectively element QD1 to be tested it is conductive and nonconductive when its both ends voltage Uce1.If when to be measured
When trying element QD1 conducting, voltage Uce1 ≈ 0V, when element QD1 to be tested is not turned on, voltage Uce1 ≈ Udc2 is then to be tested
Element QD1 be active component, otherwise element QD1 to be tested be not active component.
The dipulse test platform of the embodiment of the present invention further includes protective module, protective module include the first protection circuit and
Second protection circuit.Wherein, first protection circuit be connected in parallel with pulse test circuit 12, second protect circuit with it is to be tested
Element QD1 connection.
As shown in Fig. 2, the first protection circuit can be diode D1, and diode D1 is parallel to arteries and veins in the embodiment of the present invention
The both ends of punching test circuit 12.Second protection circuit includes zener diode D51, D31, D21 and capacitor Ca1.Specifically, pressure stabilizing
After diode D31, D21 series connection, it is connected between the end G1 and the end C1 of element QD1 to be tested.Zener diode D51 is connected to
Between the end G1 and the end E1 of element QD1 to be tested.Capacitor Ca1 is connected between the end C1 and the end E1 of element QD1 to be tested.If
In test process, element QD1 voltage to be tested reaches 1200V, then zener diode D31, D21 ON operation, and by the point
Peak voltage turn-on is connected on GND, to protect element QD1 to be tested.
In embodiments of the present invention, the purpose of dipulse test platform is the dynamic parameter for testing out different elements to be tested
(Eon, Eoff value etc.) when in use so as to client does loss calculation reference.It is surveyed using the dipulse of embodiment as shown in Figure 2
Examination platform treats testing element (using IKW40N120H3 device as element to be tested in this example) and carries out dipulse test
Concrete operation method are as follows:
1. element QD1 to be tested is put into trial zone (connecting in load circuit).
2. starting high voltage power supply DC1, test voltage Udc1=600V, Udc2=30V are set.
3. controlling relay K1, K2 closure, high voltage power supply DC1 is set to charge to capacitor C1, when capacitor C1 voltage reaches 600V
When, it is ready for testing.
4. controlling relay K4 closure, drive module is then controlled to element QD1 to be tested and sends driving pulse, acquisition is led
The voltage Vce1 of element QD1 to be tested when logical；Stop to element QD1 to be tested send driving pulse, acquisition shutdown when to
The voltage Vce1 of testing element QD1 controls relay K4 and disconnects after acquisition.
5. judge whether Vce1 ≈ 0V, Vce2 ≈ 30V, if it is, element QD1 to be tested is active component, continue into
The test of row dipulse；If it is not, then element QD1 to be tested is failed element, terminate test.
6. control relay K3 closure, closure comprising it is corresponding with the matched resistance converting branch of element QD1 to be tested after
Then electric appliance controls the dipulse driving signal that drive module sends setting to element QD1 to be tested.
7. acquiring dipulse drive waveforms, voltage Vce1 waveform and the electric current Ic waveform of element QD1 to be tested.
8. controlling relay K1, K2, K3 after acquisition to disconnect, driving pulse is sent to power device QD3, makes capacitor C1
Interior electricity discharges rapidly, and treats testing element QD1, DC power supply to reduce high voltage power supply DC1 to capacitor C1, capacitor C1
DC2 treats the voltge surge of testing element QD1, makes system reliability service.
In embodiments of the present invention, dipulse drive waveforms, the voltage of element QD1 to be tested can be obtained by oscillograph
Vce1 waveform and electric current Ic waveform.Specifically, oscillograph is by being clipped in the probes of three pins of element QD1 to be tested, crawl
To the dipulse drive waveforms of element QD1 to be tested, voltage Vce1 waveform and electric current Ic waveform.It is logical by three on oscillograph
The waveform in road, available this time test as a result, element QD1 i.e. to be tested dynamic parameter Eon at the standard conditions,
Eoff。
Specifically, the collected dipulse drive waveforms of oscillograph, voltage Vce1 waveform and Ic current waveform can be such as figures
Shown in 3-6.Wherein, Fig. 3 is the current waveform figure of element QD1 to be tested, and abscissa represents time T1(us), ordinate represents
Electric current I1(A), electric current I1Range be 0~100A.Fig. 4 is the voltage oscillogram of element QD1 to be tested, and abscissa represents the time
T2(us), ordinate represents voltage U2(V), voltage U2Range be 0~600V.Fig. 5 is dipulse signal waveforms, abscissa
Represent time T3(us), ordinate represents voltage U3(V), voltage U3Range be 0~50V.Fig. 6 is current waveform figure and voltage
The product of waveform diagram, abscissa represent time T4(us), ordinate represents ENERGY E4(mJ), ENERGY E4Range be 0~10mJ.
At this point it is possible at the time of first failing edge for reading dipulse signal waveform in Fig. 5 figure corresponds to, and when reading in Fig. 6 this
The energy value of corresponding point is carved as Eoff.Also, second rising edge of dipulse signal waveform in Fig. 5 figure can also be read
At the time of corresponding, and the energy value of the moment corresponding point is read as Eon in Fig. 6.This can be analyzed
The dynamic parameter Eon=3.2mJ, Eoff=1.2mJ of IKW40N120H3 device.
In conclusion the dipulse test platform of the embodiment of the present invention can satisfy the dipulse of mesohigh power device not
Interruption test, and can satisfy the test of maximum 2000V busbar voltage, existing routine 1200V power device is compared, more can
Meets the needs of high voltage appearance power device.Meanwhile the accuracy of the dipulse test platform of the measurement data embodiment of the present invention
It is higher, operation it is convenient, testing efficiency can be greatly improved, and increase multi-failure protection, overvoltage protection and driving protection, make
Dipulse test platform more secure and reliable.
More than, the only schematic description of the utility model, it will be recognized by those skilled in the art that practical without departing from this
On the basis of novel working principle, a variety of improvement can be made to the utility model, this belongs to the protection of the utility model
Range.
Claims (10)
1. a kind of dipulse test platform characterized by comprising
Detection module, the detection module are connect with element to be tested, for detecting to the element to be tested；
Drive module, the drive module include driving pulse circuit and driving resistance conversion circuit, the driving pulse circuit
It is connect by the driving resistance conversion circuit with the element to be tested, the driving pulse circuit is the element to be tested
Pulse signal, the driving resistance for driving resistance conversion circuit for changing the element to be tested are provided；With
Control module, the signal output end of the control module respectively with the detection module, the driving pulse circuit and institute
State driving resistance conversion circuit communication connection；The signal input part of the control module is connect with the element to be tested.
2. dipulse test platform as described in claim 1, which is characterized in that the driving resistance conversion circuit includes a plurality of
Resistance converting branch parallel with one another, the control module change institute by controlling different resistance converting branch conductings
State the driving resistance of element to be tested.
3. dipulse test platform as described in claim 1, which is characterized in that the detection module includes element test circuit
With pulse test circuit, the element test circuit and the pulse test circuit are connect with the element to be tested respectively, institute
Element test circuit is stated for carrying out failure testing to the element to be tested, the pulse test circuit is used for described to be measured
It tries element and carries out dipulse test；
The signal output end of the control module is connect with the element test circuit and the pulse test circuit communication respectively,
To control the working condition of the element test circuit and the pulse test circuit.
4. dipulse test platform as claimed in claim 3, which is characterized in that it further include power module, the power module
Include:
High voltage power supply, the high voltage power supply are pulse test circuit power supply；
Low-tension supply, the low-tension supply are respectively that the element test circuit, the drive module and the control module supply
Electricity.
5. dipulse test platform as claimed in claim 4, which is characterized in that it further include voltage regulator circuit, the voltage regulator circuit
It is connected in parallel with the high voltage power supply.
6. dipulse test platform as claimed in claim 4, which is characterized in that the control module also with the high voltage power supply
Connection, to adjust the output voltage of the high voltage power supply.
7. dipulse test platform as claimed in claim 3, which is characterized in that the pulse test circuit includes unhurried current electricity
When road, the pulse test circuit and the element to be tested constitute circuit, the unhurried current circuit and the element string to be tested
Connection connection.
8. dipulse test platform as claimed in claim 3, which is characterized in that the control module includes host computer, control
Device and sample circuit；The controller and the host computer communicate to connect；The signal output end of the controller respectively with it is described
Element test circuit, the pulse test circuit, the driving pulse circuit and driving resistance conversion circuit communication connection；
The signal input part of the controller is connect by the sample circuit with the element to be tested.
9. dipulse test platform as claimed in claim 8, which is characterized in that the sample circuit is voltage sampling circuit,
The controller acquires the voltage signal at the element both ends to be tested by the voltage sampling circuit.
10. dipulse test platform as claimed in claim 9, which is characterized in that it further include protective module, the protective module
Include:
First protection circuit, the first protection circuit are connect with the pulse test circuit in parallel；
Second protection circuit, the second protection circuit are connect with element to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820461840.1U CN208239569U (en) | 2018-03-30 | 2018-03-30 | A kind of dipulse test platform |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820461840.1U CN208239569U (en) | 2018-03-30 | 2018-03-30 | A kind of dipulse test platform |
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| CN208239569U true CN208239569U (en) | 2018-12-14 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110018406A (en) * | 2019-04-18 | 2019-07-16 | 中国科学院电工研究所 | A kind of dipulse test macro |
| CN112019197A (en) * | 2020-08-20 | 2020-12-01 | 中国海洋大学 | Pulse current generator and control method |
| CN112924839A (en) * | 2021-02-03 | 2021-06-08 | 菏泽天盈新能源有限公司 | Modular dipulse experiment platform |
| CN116223916A (en) * | 2023-05-08 | 2023-06-06 | 佛山市联动科技股份有限公司 | Dynamic on-resistance testing device and method |
-
2018
- 2018-03-30 CN CN201820461840.1U patent/CN208239569U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110018406A (en) * | 2019-04-18 | 2019-07-16 | 中国科学院电工研究所 | A kind of dipulse test macro |
| CN110018406B (en) * | 2019-04-18 | 2021-06-01 | 中国科学院电工研究所 | Double-pulse test system |
| CN112019197A (en) * | 2020-08-20 | 2020-12-01 | 中国海洋大学 | Pulse current generator and control method |
| CN112924839A (en) * | 2021-02-03 | 2021-06-08 | 菏泽天盈新能源有限公司 | Modular dipulse experiment platform |
| CN116223916A (en) * | 2023-05-08 | 2023-06-06 | 佛山市联动科技股份有限公司 | Dynamic on-resistance testing device and method |
| CN116223916B (en) * | 2023-05-08 | 2023-08-04 | 佛山市联动科技股份有限公司 | Dynamic on-resistance testing device and method |
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