CN104199754A - 生产故障分析系统 - Google Patents
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Abstract
本发明涉及生产故障分析系统。一种生产故障分析系统包括：工厂质量控制单元，其被配置为当检测到生产故障时发送触发信号；以及分析单元。该分析单元被配置为至少通过以下步骤确定生产故障的根本原因：从工厂质量控制单元接收触发信号；当接收到该触发信号时，从数据库提取生产数据，其中，生产数据包括过程输入变量；以及部分基于过程输入变量的分析而识别生产故障的一个或多个潜在根本原因。
Description
背景技术
在工厂生产装置期间，经常发生生产故障。例如，该装置或该装置的部件的产量可能会下降到低于可接受的水平。在这种情况下，尝试确定该生产故障的根本原因。为此，从发生生产故障的工厂收集数据。然而，当装置的制造涉及很多步骤或机器时，可能收集许多不同类别的数据，其中每个类别可能具有子类别的数据。这会导致许多不同可能的组合是生产故障的潜在根本原因。
在生产数据的常规分析期间，生产数据被置于电子表格中，使得用户可以手动分析该生产数据，以确定是否有生产故障的根本原因。然而，由于生产数据的绝对数量，这种方法通常是繁琐且不准确的。在某些情况下，生产故障的根本原因的确定可能花费几个星期。在此期间，在没有适当地纠正生产故障的根本原因的情况下，生产故障可能继续发生。
附图说明
当结合附图阅读下面阐述的具体实施方式时，本实施例的特征和优点将变得更加显而易见，其中：
图1描绘了根据一个实施例的存储装置生产故障分析系统；
图2描绘了根据一个实施例的过程输入变量；
图3描绘了根据一个实施例的过程；
图4描绘了根据一个实施例的决策树图；
图5描绘了根据一个实施例的叶报告；
图6描绘了根据一个实施例的相关图；
图7描绘了根据一个实施例的相关图；
图8描绘了根据一个实施例的相关表格；
图9描绘了根据一个实施例的过程；以及
图10描绘了根据一个实施例的过程。
具体实施方式
在图1所示的实施例中，生产故障分析系统100包括分析单元102、工厂质量控制单元104a-104c、工厂106a-106b和数据库108。在一个实施例中，生产故障分析系统100包括存储装置生产故障分析系统100。在下面的描述中，作为示例性实施例，生产故障分析系统100将被描述为存储装置生产故障分析系统。
在一个实施例中，工厂质量控制单元104a位于工厂106a中，工厂质量控制单元104b位于工厂106b中，而工厂质量控制单元104c位于工厂106c中。尽管在图1所示的实施例中有三个工厂质量控制单元和三个工厂，但可以使用任何数量的工厂质量控制单元和工厂。此外，工厂质量控制单元的数量不必与工厂的数量相同。例如，两个工厂质量控制单元可以位于单个工厂中。类似地，单个工厂质量控制单元可以覆盖两个工厂。
工厂106a-106c例如可以是生产存储装置的工厂。在一个实施例中，工厂106a-106c包括生产存储装置的部件的站。在一个实施例中，存储装置是包括磁性旋转磁盘的磁盘驱动器。在一个实施例中，存储装置是包括固态存储器的固态驱动器。在一个实施例中，存储装置是其他电子装置，例如计算机、便携式电脑、流媒体装置、平板电脑、机顶盒、手表、服务器、路由器或相机。
虽然本文的描述通常指的是固态存储器，但可以理解，固态存储器可以包括各种类型的固态非易失性存储装置中的一种或多种，例如闪存集成电路、硫族化物RAM(C-RAM)、相变存储器(PC-RAM或PRAM)、可编程金属化单元RAM(PMC-RAM或PMCm)、双向统一存储器(OUM)、电阻RAM(RRAM)、NAND存储器(例如，单级单元(SLC)存储器、多级单元(MLC)存储器或它们的任意组合)、NOR存储器、EEPROM、铁电存储器(FeRAM)、磁阻RAM(MRAM)、其他的离散NVM(非易失性存储器)芯片或者它们的任意组合。
在一个实施例中，工厂质量控制单元104a-104c生成存储装置生产数据。在一个实施例中，该生产数据包括过程输入变量(“PIV”)。每个过程输入变量包括一个或多个配置数据。例如，在图2所示的实施例中，示出了PIV1、PIV2和PIV3。PIV1例如包括单个配置数据A1。PIV2例如包括三个配置数据B1-B3。然而，PIV3包括数个配置数据C1-CN，其中N可以是所使用的配置数据的最大数量。
在一个实施例中，过程输入变量例如可以是一类配置数据。例如，过程输入变量可以是介质，而配置数据例如可以是介质的类型。除了介质之外，在一个实施例中，过程输入变量还可以包括关于磁盘驱动器的额外部件(例如，磁头堆叠组件、悬架、电动机或致动器)的数据。此外，在一个实施例中，过程输入变量还可以包括关于用来制造磁盘驱动器的过程(例如，驱动装配线、介质溅镀线)、用于磁盘驱动器的制造的工具或用于磁盘驱动器的制造的设备的数据。
在一个实施例中，存储装置生产数据还包括该存储装置的累积产量和该存储装置的站产量。累积产量例如可以表示针对特定工厂的存储装置的产量。站产量例如可以表示针对特定站的存储装置或存储装置的部件的产量。
再参照图1，在一个实施例中，工厂质量控制单元104a-104c将存储生产数据发送到分析单元102。分析单元102将存储生产数据存储在数据库108中。在一个实施例中，分析单元102使用存储装置生产数据，以确定存储装置生产故障的根本原因，这将在下面更详细地描述。
在一个实施例中，数据库108可由分析单元102访问。在一个实施例中，数据库108位于远离分析单元102的位置。然而，在一个实施例中，分析单元102包括数据库108。
在一个实施例中，在图3中公开了用于确定存储装置生产故障的根本原因的过程。在方框S302中，当已检测到存储装置生产数据故障时，工厂质量控制单元104a-104c中的一个或多个发送触发信号到分析单元102。
在一个实施例中，工厂质量控制单元104a-104c根据存储装置生产数据分析磁盘驱动器的累积产量，并基于该累积产量的分析确定已出现存储装置生产故障。例如，当累积产量下降到低于预定的累积产量阈值时，工厂质量控制单元104a-104c可以确定已出现存储装置生产故障。
在一个实施例中，工厂质量控制单元104a-104c根据存储装置生产数据分析磁盘驱动器的站产量，并基于该站产量的分析确定已出现存储装置生产故障。例如，当站产量下降到低于预定的站产量阈值时，工厂质量控制单元104a-104c可以确定已出现存储装置生产故障。
在方框S304中，当分析单元102接收到触发信号时，分析单元102从数据库108提取存储装置生产数据。在一个实施例中，分析单元102提取对应于发送了该触发信号的工厂质量控制单元的存储装置生产数据。
在方框S306中，分析单元102通过清除存储装置生产数据来识别并选择用于分析的过程输入变量。在一个实施例中，分析单元102通过基于配置数据的量分离用于分析的过程输入变量来清除存储装置生产数据。在一个实施例中，包括多于单个配置数据的过程输入变量可以被选择进行分析。在一个实施例中，所包括的过程输入变量的数目不大于配置数据的预定最大量的过程输入变量可以被选择进行分析。例如，如果配置数据的最大量被设置为三十个配置数据，则包括在两个配置数据和三十个配置数据之间的过程输入变量将被选择进行分析。在一个实施例中，基于配置数据的量选择过程输入变量可以减少所识别的存储装置生产故障的根本原因可能是太一般化或不够具体的可能性。
在一个实施例中，仅包括单个配置数据的过程输入变量不被选择进行分析，而是可以在已经分析了选定的过程输入变量之后进行分析，或者甚至从分析中消除。在一个实施例中，所包括的过程输入变量的数目大于配置数据的预定最大量的过程输入变量不被选择进行分析，而是可以在已经分析了选定的过程输入变量之后进行分析，或者甚至从分析中消除。例如，如果配置数据的最大量被设置为三十个配置数据，则包括单个配置数据或大于三十个配置数据的过程输入变量将不被选择进行分析，而是将在选定的过程输入变量之后进行分析，或者从分析中消除。
在方框S308中，分析单元102执行根识别过程来识别存储装置生产故障的根本原因。在一个实施例中，分析单元102分析选定的过程输入变量，以确定对应于存储装置生产故障的根本原因的过程输入变量。在一个实施例中，对应于存储装置生产故障的根本原因的过程输入变量被识别为存储装置生产故障的根本原因。在一个实施例中，该分析可以使用决策树。
在一个实施例中，分析单元102确定指示对应于存储装置生产故障的根本原因的过程输入变量和存储装置生产故障的根本原因的相关性的相关数据。在一个实施例中，相关数据包含日志值数据(logworth data)或G2数据中的至少一个。
在一个实施例中，分析单元102确定过程输入变量是存储装置生产故障的根本原因的概率。分析单元102例如部分基于所确定的概率而识别是存储装置生产故障的潜在根本原因的过程输入变量。
在一个实施例中，分析单元102确定过程输入变量是存储装置生产故障的根本原因的误差平方和。分析单元102例如部分基于误差平方和识别是存储装置生产故障的潜在根本原因的过程输入变量。
在一个实施例中，分析单元102可以使用额外的方法来确定是存储装置生产故障的根本原因或最可能是存储装置生产故障的根本原因的过程输入变量。
在方框S310中，分析单元102生成结果的报告。在一个实施例中，所生成的报告可以允许用户识别或验证存储装置生产故障的潜在根本原因。例如，所生成的报告可以允许用户直观地识别可能是存储装置生产故障的根本原因的过程输入变量和不太可能是存储装置生产故障的根本原因的过程输入变量。在如图4所示的一个实施例中，该报告包括决策树图。在标有“所有行”的汇总节点中，显示了可能是存储装置生产故障的潜在根本原因的一些或全部过程输入变量的数据。
此外，在图4所示的实施例中，过程输入变量4-20中的一个或多个被示为是存储装置生产故障的根本原因的可能的候选者。在图4所示的实施例中，一个或多个过程输入变量形成用于确定可能是作为存储装置生产故障的可能的根本原因的候选者的过程输入变量的节点。这些节点以图形方式表示为从汇总节点下行。
例如，用于PIV(4，5，6，7，8，9)的节点表示作为一组的过程输入变量4-9可能是存储装置生产故障的根本原因。类似地，用于PIV(10)的节点表示过程输入变量10可能是存储装置生产故障的潜在根本原因。在一个实施例中，用于PIV(4，5，6，7，8，9)的节点是用于PIV(11，12)和PIV(13)的节点的父节点。在一个实施例中，用于PIV(11，12)和PIV(13)的节点是用于PIV(4，5，6，7，8，9)的节点的子节点。在一个实施例中，用于PIV(10)的节点是用于PIV(14，15，16)的节点和用于PIV(17，18，19,20)的节点的父节点。在一个实施例中，用于PIV(14，15，16)和PIV(17，18，19,20)的节点是用于PIV(10)的节点的子节点。
在一个实施例中，这些节点指示对应于特定节点与其父节点中的过程输入变量是存储生产故障的根本原因的可能性的数据。例如，用于PIV(11，12)的节点可以指示对应于除了过程输入变量11和12之外的过程输入变量4-9是存储装置生产故障的根本原因的可能性的数据，因为用于PIV(4，5，6，7，8，9)的节点是用于PIV(11，12)的节点的父节点。在一个实施例中，汇总节点不被视为用于PIV(4，5，6，7，8，9)的节点或用于PIV(10)的节点的父节点，而是以图形方式表示可能是存储装置生产故障的潜在根本原因的部分或全部过程输入变量的数据的汇总。
如在图4所示的实施例中可以看到，为某些节点显示了相关数据，例如日志值数据或G2数据。在一个实施例中，不是所有的节点都包含相关数据。在一个实施例中，相关数据可以包括可有用于确定生产故障的潜在根本原因的其他类型的相关数据。
在图4所示的一个实施例中，在对应的过程输入变量的节点中示出了失败概率和通过概率。此外，在一个实施例中，示出了失败概率和通过概率的比率。
在图5所示的一个实施例中，该报告包括叶报告(leaf report)。该叶报告例如可以包括用于包含可能是存储装置生产故障的潜在根本原因的过程输入变量的一个或多个节点的响应概率。该叶报告例如还可以包括用于包含可能是存储装置生产故障的根本原因的过程输入变量的一个或多个节点的响应计数值。
在图6-8所示实施例中，该报告包括一个或多个相关数据图表。在图6和7所示的实施例中，示出了用于主要部件分析的相关数据图。主要部件分析例如可以将多维信息压缩成二维空间。图6所示的实施例例如可以是FAIL(失败)的相关输出，而图7所示的实施例例如可以是PASS(通过)的相关输出。在图6和图7所示的实施例中，PIV31对于FAIL比PASS更负相关于PIV33和24。在图8所示的一个实施例中，示出了具有用于一个或多个过程输入变量的数个分割和G2数据的相关数据表。
在一个实施例中，可以基于是存储装置生产故障的潜在根本原因的过程输入变量的识别而调整工厂106a-106c中的一个或多个。例如，基于是存储装置生产故障的潜在根本原因的过程输入变量，站内的工具或设备可以被暂时关闭，以便进行翻新。
在一个实施例中，虽然在图4-8中公开了某些数据、图表、图形和表格，但是所生成的报告可以包括对用户识别或验证存储装置生产故障的根本原因或存储装置生产故障的潜在根本原因可能是有用的附加的数据、图表、图形和表格。此外，在一个实施例中，所生成的报告的某些部分或全部可以被显示在网页上或被发送到一个或多个适当的用户。在一个实施例中，基于由工厂质量控制单元104a-104c中的一个或多个所发送的触发信号，所生成的报告可以由分析单元102自动生成。
在一个实施例中，在图9中示出了用于存储装置生产故障分析系统的确定存储装置生产故障的根本原因的过程。在方框S902中，分析单元102从工厂质量控制单元(例如工厂质量控制单元104a-104c中的一个)接收触发信号。在方框S904中，当接收到触发信号时，分析单元102从数据库108提取生产数据。存储装置生产数据例如可以包括过程输入变量。在方框S906中，分析单元部分地基于过程输入变量的分析来识别存储装置生产故障的一个或多个潜在根本原因。
如前面所指出的，生产故障分析系统100不必局限于存储装置生产故障分析系统。在一个实施例中，生产故障分析系统可以用于除磁盘驱动器之外的其他装置的生产。例如，工厂106a-106c可以生产装置，而工厂质量控制单元104a-104c可以为这些装置生成生产数据。
在一个实施例中，工厂质量控制单元104a-104c从生产数据分析装置的累积产量，并基于该累积产量的分析确定何时已发生生产故障。例如，当累积产量下降到低于预定的累积产量阈值时，工厂质量控制单元104a-104c可以确定何时已发生存储装置生产故障。
在一个实施例中，工厂质量控制单元104a-104c从生产数据分析装置的站产量，并基于该站产量的分析确定何时已发生存储装置生产故障。例如，当站产量下降到低于预定的站产量阈值时，工厂质量控制单元104a-104c可以确定已发生生产故障。
在一个实施例中，在图10中示出了用于生产故障分析系统的确定生产故障的根本原因的过程。在一个实施例中，在图10中公开的过程类似于上面所公开的过程，但它可以适用于其他装置，而不是磁盘驱动器。在这种情况下，以上公开的步骤可以适用于其他装置，而不是磁盘驱动器。
在方框S1002中，分析单元102从工厂质量控制单元(例如，工厂质量控制单元104a-104c)接收触发信号。在方框S1004中，分析单元102从数据库108提取生产数据。在一个实施例中，生产数据包括过程输入变量。在方框S1006中，分析单元102部分地基于过程输入变量的分析来识别生产故障的一个或多个潜在根本原因。
在一个实施例中，工厂质量控制单元104a-104c以及分析单元102可以被用于确定生产成功的一个或多个潜在根本原因。例如，当站产量或累积产量为可接受水平时，分析单元102可以确定对成功作出贡献的过程输入变量。在一个实施例中，是生产成功的潜在根本原因的过程输入变量可以被用于锁定在有利条件以重复该成功。
本领域技术人员应当理解，与本文公开的示例相关描述的各种说明性逻辑块、模块以及算法部件可以被实现为电子硬件、计算机软件或两者的组合。此外，这些实施例也可以体现于使处理器或计算机履行或执行某些功能的非暂时性机器可读介质。
为了清楚地说明硬件和软件的这种可互换性，以上已经在功能性方面一般性地描述了各种说明性部件、块、模块、电路和处理部件。这种功能是实现为硬件还是软件取决于特定应用和施加于整个系统的设计约束。本领域技术人员可以以不同的方式为每一特定应用实现所描述的功能，但是，这种实现决策不应被解释为导致脱离所公开的设备和方法的范围。
与本文公开的示例相关描述的方法或算法的各部分可以以硬件、由处理器执行的软件模块或这两者的组合直接体现。该方法或算法的各部分也可以以示例中提供的顺序不同的顺序执行。软件模块可以驻留在RAM存储器、快闪存储器、ROM存储器、EPROM存储器、EEPROM存储器、寄存器、硬盘、可移除磁盘、光盘或本领域已知的任何其它形式的存储介质中。示例性存储介质耦合到处理器，使得该处理器能够从该存储介质读取信息和将信息写入该存储介质。在替代方案中，存储介质可以与处理器是一体的。处理器和存储介质可以驻留于专用集成电路(ASIC)中。
提供所公开示例的先前描述是为了使本领域技术人员能够制造或使用所公开的方法和设备。对于本领域技术人员，对这些示例的各种修改将是显而易见的，并且本文所定义的原理可以应用于其它示例而不脱离所公开的方法和设备的精神或范围。所述实施例在所有方面都仅被认为是说明性的而非限制性的，因此，本公开的范围是由所附的权利要求而不是由前面的说明书来表示。在权利要求的等同物的含义和范围内的所有改变都将包括在其范围内。
Claims (36)
1.一种存储装置生产故障分析系统，其包括：
工厂质量控制单元，其被配置为当检测到存储装置生产故障时发送触发信号；以及
分析单元，其被配置为至少通过以下步骤确定所述存储装置生产故障的根本原因：
从工厂质量控制单元接收所述触发信号；
当接收到所述触发信号时，从数据库提取存储装置生产数据，其中，所述存储装置生产数据包括过程输入变量；以及
部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因。
2.根据权利要求1所述的系统，其中所述工厂质量控制单元被配置为生成所述存储装置生产数据。
3.根据权利要求2所述的系统，其中所述存储装置生产数据包括累积产量，并且所述工厂质量控制单元基于所述累积产量检测所述存储装置生产故障。
4.根据权利要求2所述的系统，其中所述存储装置生产数据包括站产量，并且所述工厂质量控制单元基于所述站产量检测所述存储装置生产故障。
5.根据权利要求1所述的系统，其中所述分析单元被进一步配置为至少通过以下步骤确定所述存储装置生产故障的根本原因：
清除所述存储装置生产数据。
6.根据权利要求5所述的系统，其中所述过程输入变量包括一个或多个配置数据。
7.根据权利要求6所述的系统，其中清除所述存储装置生产数据进一步包括：
基于配置数据的量，分离所述过程输入变量以便进行分析。
8.根据权利要求1所述的系统，其中所述分析单元被进一步配置为至少通过以下步骤确定所述存储装置生产故障的根本原因：
生成指示对应于所述存储装置生产故障的根本原因的过程输入变量的报告。
9.根据权利要求8所述的系统，其中所述报告包括相关数据，该相关数据指示对应于所述存储装置生产故障的根本原因的过程输入变量和所述存储装置生产故障的根本原因的相关性。
10.根据权利要求9所述的系统，其中所述相关数据包括日志值数据。
11.根据权利要求9所述的系统，其中所述相关数据包括G2数据。
12.根据权利要求8所述的系统，其中所述报告包括决策树图。
13.根据权利要求8所述的系统，其中所述报告包括叶报告。
14.根据权利要求8所述的系统，其中所述报告包括相关数据图表。
15.根据权利要求8所述的系统，其中所述报告包括针对对应于所述存储装置生产故障的根本原因的过程输入变量的存储装置失败数据和存储装置通过数据。
16.根据权利要求1所述的系统，其中部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述存储装置生产故障的根本原因的概率；以及
部分基于所确定的概率而识别是所述存储装置生产故障的潜在根本原因的过程输入变量。
17.根据权利要求1所述的系统，其中部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述存储装置生产故障的根本原因的误差平方和；以及
部分基于所确定的误差平方和而识别是所述存储装置生产故障的潜在根本原因的过程输入变量。
18.一种用于存储装置生产故障分析系统确定存储装置生产故障的根本原因的方法，所述方法至少包括：
从工厂质量控制单元接收触发信号，所述触发信号在检测到存储装置生产故障时生成；
当接收到所述触发信号时，从数据库提取存储装置生产数据，其中，所述存储装置生产数据包括过程输入变量；以及
部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因。
19.根据权利要求18所述的方法，其中所述工厂质量控制单元被配置为生成存储装置生产数据。
20.根据权利要求19所述的方法，其中所述存储装置生产数据包括累积产量，并且所述工厂质量控制单元基于所述累积产量检测所述存储装置生产故障。
21.根据权利要求19所述的方法，其中所述存储装置生产数据包括站产量，并且所述工厂质量控制单元基于所述站产量检测所述存储装置生产故障。
22.根据权利要求18所述的方法，进一步包括：
清除所述存储装置生产数据。
23.根据权利要求22所述的方法，
其中所述过程输入变量包括一个或多个配置数据，以及
其中，清除所述存储装置生产数据进一步包括：
基于配置数据的量，分离所述过程输入变量以便进行分析。
24.根据权利要求18所述的方法，进一步包括：
生成指示对应于所述存储装置生产故障的根本原因的过程输入变量的报告。
25.根据权利要求24所述的方法，其中所述报告包括相关数据，所述相关数据指示对应于所述存储装置生产故障的根本原因的过程输入变量和所述存储装置生产故障的根本原因的相关性。
26.根据权利要求24所述的方法，其中所述报告包括针对对应于所述存储装置生产故障的根本原因的过程输入变量的存储装置失败数据和存储装置通过数据。
27.根据权利要求18所述的方法，其中部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述存储装置生产故障的根本原因的概率；以及
部分基于所确定的概率而识别是所述存储装置生产故障的潜在根本原因的过程输入变量。
28.根据权利要求18所述的方法，其中部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述存储装置生产故障的根本原因的误差平方和；以及
部分基于所确定的误差平方和而识别是所述存储装置生产故障的潜在根本原因的过程输入变量。
29.一种包括指令的非暂时性机器可读介质，当执行所述指令时，所述指令引导计算系统执行以下操作，包括：
从工厂质量控制单元接收触发信号，所述触发信号在检测到存储装置生产故障时生成；
当接收到所述触发信号时，从数据库提取存储装置生产数据，其中，所述存储装置生产数据包括过程输入变量；以及
部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因。
30.根据权利要求29所述的非暂时性机器可读介质，其中所述计算机系统被进一步引导执行以下操作，包括：
生成指示对应于所述存储装置生产故障的根本原因的过程输入变量的报告。
31.根据权利要求29所述的非暂时性机器可读介质，其中部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述存储装置生产故障的根本原因的概率；以及
部分基于所确定的概率而识别是所述存储装置生产故障的潜在根本原因的过程输入变量。
32.根据权利要求29所述的非暂时性机器可读介质，其中部分基于所述过程输入变量的分析而识别所述存储装置生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述存储装置生产故障的根本原因的误差平方和；以及
部分基于所确定的误差平方和识别是所述存储装置生产故障的潜在根本原因的过程输入变量。
33.一种生产故障分析系统，其包括：
工厂质量控制单元，其被配置为当检测到生产故障时发送触发信号；以及
分析单元，其被配置为至少通过以下步骤确定所述生产故障的根本原因：
从工厂质量控制单元接收所述触发信号；
当接收到所述触发信号时，从数据库提取生产数据，其中，所述生产数据包括过程输入变量；以及
部分基于所述过程输入变量的分析而识别所述生产故障的一个或多个潜在根本原因。
34.根据权利要求33所述的系统，其中所述分析单元被进一步配置为至少通过以下步骤确定所述生产故障的根本原因：
生成指示对应于所述生产故障的根本原因的过程输入变量的报告。
35.根据权利要求33所述的系统，其中部分基于所述过程输入变量的分析而识别所述生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述生产故障的根本原因的概率；以及
部分基于所确定的概率而识别是所述生产故障的潜在根本原因的过程输入变量。
36.根据权利要求33所述的系统，其中部分基于所述过程输入变量的分析而识别所述生产故障的一个或多个潜在根本原因进一步包括：
确定所述过程输入变量是所述生产故障的根本原因的误差平方和；以及
部分基于所确定的误差平方和而识别是所述生产故障的潜在根本原因的过程输入变量。
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Also Published As
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| US20140277673A1 (en) | 2014-09-18 |
| HK1203669A1 (zh) | 2015-10-30 |
| US9417628B2 (en) | 2016-08-16 |
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