CN104136933B - 用金属塞密封的磁场探头 - Google Patents

用金属塞密封的磁场探头 Download PDF

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Publication number
CN104136933B
CN104136933B CN201380010971.8A CN201380010971A CN104136933B CN 104136933 B CN104136933 B CN 104136933B CN 201380010971 A CN201380010971 A CN 201380010971A CN 104136933 B CN104136933 B CN 104136933B
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China
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container
hollow cavity
field probe
magnetic resonance
fluid sample
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CN201380010971.8A
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English (en)
Chinese (zh)
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CN104136933A (zh
Inventor
J·F·苏伊吉维尔
J·W·威克普
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Publication of CN104136933A publication Critical patent/CN104136933A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/30—Sample handling arrangements, e.g. sample cells, spinning mechanisms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/243—Spatial mapping of the polarizing magnetic field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
    • G01R33/48—NMR imaging systems
    • G01R33/54—Signal processing systems, e.g. using pulse sequences ; Generation or control of pulse sequences; Operator console
    • G01R33/56—Image enhancement or correction, e.g. subtraction or averaging techniques, e.g. improvement of signal-to-noise ratio and resolution
    • G01R33/565—Correction of image distortions, e.g. due to magnetic field inhomogeneities
    • G01R33/56563—Correction of image distortions, e.g. due to magnetic field inhomogeneities caused by a distortion of the main magnetic field B0, e.g. temporal variation of the magnitude or spatial inhomogeneity of B0
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49016—Antenna or wave energy "plumbing" making
    • Y10T29/49018—Antenna or wave energy "plumbing" making with other electrical component

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Measuring Magnetic Variables (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
CN201380010971.8A 2012-02-27 2013-02-22 用金属塞密封的磁场探头 Active CN104136933B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261603406P 2012-02-27 2012-02-27
US61/603,406 2012-02-27
PCT/IB2013/051462 WO2013128355A1 (en) 2012-02-27 2013-02-22 Magnetic field probe sealed with a metallic plug

Publications (2)

Publication Number Publication Date
CN104136933A CN104136933A (zh) 2014-11-05
CN104136933B true CN104136933B (zh) 2016-06-15

Family

ID=48093042

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380010971.8A Active CN104136933B (zh) 2012-02-27 2013-02-22 用金属塞密封的磁场探头

Country Status (8)

Country Link
US (1) US9097752B2 (enExample)
EP (1) EP2820439B1 (enExample)
JP (1) JP6019140B2 (enExample)
CN (1) CN104136933B (enExample)
BR (1) BR112014020657B1 (enExample)
MX (1) MX2014009707A (enExample)
RU (1) RU2616765C2 (enExample)
WO (1) WO2013128355A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2584369A1 (en) * 2011-10-17 2013-04-24 Koninklijke Philips Electronics N.V. Magnetic field probe for MRI with a fluoroelastomer or a solution of a fluorine-containing compound
US9437331B2 (en) 2014-02-18 2016-09-06 Savannah River Nuclear Solutions, Llc Inherently safe passive gas monitoring system
US9817254B2 (en) 2015-02-23 2017-11-14 Honeywell International Inc. Stabilization gas environments in a proton-exchanged lithium niobate optical chip
US9638764B2 (en) * 2015-04-08 2017-05-02 Allegro Microsystems, Llc Electronic circuit for driving a hall effect element with a current compensated for substrate stress
US10107873B2 (en) 2016-03-10 2018-10-23 Allegro Microsystems, Llc Electronic circuit for compensating a sensitivity drift of a hall effect element due to stress
US10162017B2 (en) 2016-07-12 2018-12-25 Allegro Microsystems, Llc Systems and methods for reducing high order hall plate sensitivity temperature coefficients
WO2022008548A1 (en) * 2020-07-07 2022-01-13 Eidgenössische Technische Hochschule (ETH) Magnetic field probe, particularly for magnetic resonance applications, and tracking arrangement comprising the same
CN113031529B (zh) * 2021-03-17 2024-06-21 张宸豪 一种扣压机的智能控制方法及系统
US12455301B2 (en) 2023-12-11 2025-10-28 Allegro Microsystems, Llc Hall plate current sensor having stress compensation

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CA986297A (en) * 1972-06-07 1976-03-30 Mark Slaffer Magnetic field probe
SU571775A1 (ru) * 1976-05-10 1977-09-05 Предприятие П/Я А-1758 Проточный зонд дл измерени магнитных полей
US5346672A (en) 1989-11-17 1994-09-13 Gene Tec Corporation Devices for containing biological specimens for thermal processing
US5684401A (en) 1996-02-01 1997-11-04 Board Of Trustees Of The University Of Illinois Apparatus and method for compensation of magnetic susceptibility variation in NMR microspectroscopy detection microcoils
US6242915B1 (en) * 1999-08-27 2001-06-05 General Electric Company Field-frequency lock system for magnetic resonance system
US7919308B2 (en) 2002-06-14 2011-04-05 Agilent Technologies, Inc. Form in place gaskets for assays
WO2007003218A1 (en) * 2005-07-05 2007-01-11 Commissariat A L'energie Atomique Apparatus for high-resolution nmr spectroscopy and/or imaging with an improved filling factor and rf field amplitude
EP1847845A1 (en) * 2006-04-19 2007-10-24 Eidgenössische Technische Hochschule (ETH) Susceptibility-matched magnetic field probe and method for manufacturing the same
DE102008019091A1 (de) * 2008-04-16 2009-10-29 Bmdsys Gmbh Kryostat und biomagnetisches Messsystem mit Hochfrequenzabschirmung
JP2010266233A (ja) * 2009-05-12 2010-11-25 Murata Mfg Co Ltd 磁界検出装置
JP2011169793A (ja) * 2010-02-19 2011-09-01 Murata Mfg Co Ltd 磁界プローブ
EP2584369A1 (en) * 2011-10-17 2013-04-24 Koninklijke Philips Electronics N.V. Magnetic field probe for MRI with a fluoroelastomer or a solution of a fluorine-containing compound

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
2H trnasmit-receive NMR probes for magnetic field monitoring in NMR;PEKKA SIPILA等;《MAGNETIC RESONANCE IN MEDICINE》;20110501;第65卷;1498－1506 *

Also Published As

Publication number Publication date
CN104136933A (zh) 2014-11-05
EP2820439A1 (en) 2015-01-07
JP6019140B2 (ja) 2016-11-02
JP2015509400A (ja) 2015-03-30
US9097752B2 (en) 2015-08-04
RU2014137916A (ru) 2016-04-20
MX2014009707A (es) 2014-09-12
BR112014020657A2 (enExample) 2017-06-20
EP2820439B1 (en) 2015-06-17
WO2013128355A1 (en) 2013-09-06
BR112014020657B1 (pt) 2021-09-08
RU2616765C2 (ru) 2017-04-18
US20150028871A1 (en) 2015-01-29

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