CN104122506B - A kind of LED drives power supply test method - Google Patents
A kind of LED drives power supply test method Download PDFInfo
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- CN104122506B CN104122506B CN201310146447.5A CN201310146447A CN104122506B CN 104122506 B CN104122506 B CN 104122506B CN 201310146447 A CN201310146447 A CN 201310146447A CN 104122506 B CN104122506 B CN 104122506B
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- power supply
- driving power
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Abstract
The embodiment of the invention discloses a kind of LED and drive power supply test method, including: the various open-circuit conditions of simulation LED drive power, LED drive power is carried out open test, if described driving power source performance all detects normally under various open-circuit condition, then test is passed through.The present invention can test out LED before LED is dispatched from the factory and drive whether power supply can cause the damage driving power supply under open-circuit condition, prevents underproof LED from coming into the market, and reduces after service cost.
Description
Technical field
The present invention relates to circuit test field, be specifically related to a kind of LED and drive power supply test method.
Background technology
Light emitting diode (Light Emitting Diode, LED) has life-span length, light efficiency height, spoke due to it
Penetrate the most expanded application of advantage low, low in energy consumption.The application scenario of LED is extensive, highway, tunnel,
Its figure can be seen in Factory Building, market, residential quarter etc..
LED includes that driving power supply and LED, LED is the load driving power supply.Due to single LEDs merit
Rate is typically small, and high-powered LED lamp needs plurality of LEDs tandem working, owing to LED is typically welding
In printed board, LED is likely to occur rosin joint, or owing to the situations such as vibration, variations in temperature cause LED
With solder joint loose contact, LED drive power arises that load open circuit in these cases, causes LED to drive
Galvanic electricity source is damaged.
Summary of the invention
Embodiments provide a kind of LED and drive power supply test method, it is possible to before LED is dispatched from the factory
Test out LED and drive whether power supply can cause the damage driving power supply under open-circuit condition, prevent defective
LED come into the market, reduce after service cost.
The LED that the present invention provides drives power supply test method, including:
Close the connection between the load of described driving power supply and described driving power supply, start described driving power supply,
After described driving power work is stable, disconnect the connection between described driving power supply and described load；
After the first testing time, detect described driving power source performance the most normal；
Close the connection between described driving power supply and described load, start described driving power supply, treat described in drive
After the working stability of galvanic electricity source, set test rate with first and described load is carried out the transient state of the first set point number
Opening operation, wherein, described transient state opening operation is to disconnect the company between described driving power supply and described load
After first sets turn-off time, the connection between described driving power supply and described load is closed after connecing；
Detect described driving power source performance the most normal；
Close described driving power supply, disconnect the connection between described driving power supply and described load, start described
Drive power supply；
After the second testing time, detect described driving power source performance the most normal；
Close described driving power supply, disconnect the connection between described driving power supply and described load, drive described
Galvanic electricity source carries out the transient state of the second set point number and starts operation, and wherein, described transient state starts operation for starting institute
After first sets the working time, described driving power supply is closed after stating driving power supply；
Detect described driving power source performance the most normal；
If more than detecting the most normal step of described driving power source performance all detect described driving power source performance
Normally, then test is passed through.
Alternatively, described detection described driving power source performance the most normally may include that
Close the connection between the load of described driving power supply and described driving power supply, wherein said driving power supply
Load be LED；
Start described driving power supply；
Detection LED whether normal luminous；
If described LED normal luminous, described driving power source performance is normal.
Alternatively, described detection described driving power source performance the most normally may include that
Start described driving power supply；
Whether detect the output voltage of described driving power supply in rated output voltage scope；
Whether detect the output electric current of described driving power supply in output-current rating scope；
If the described output voltage of described driving power supply and described output electric current are respectively in rated output voltage scope
In the range of output-current rating, the most described driving power source performance is normal.
Alternatively, described startup described driving power supply includes:
The input of described driving power supply is connected to input power.
Alternatively, described first testing time is in the range of 1～8 hours.
Alternatively, described first test rate is set as 1 time/second.
Alternatively, described first set point number is 20 times.
Alternatively, described second testing time is in the range of 1～8 hours.
Alternatively, described second set point number is 20 times.
Alternatively, described first the working time is set in the range of 3～10 seconds.
The present invention simulates the various open-circuit conditions of LED drive power, and LED drive power is carried out open test,
If LED drive power does not all go out to property abnormality under various test conditions, illustrate that LED drive power is opened a way
Performance is qualified.The test result of the present invention can help designer producing as the judging basis of properties of product
Product test phase finds out the open-circuit-protection performance whether existing defects of LED drive power, finds defect also in time
It is efficiently modified.The present invention is possible to prevent underproof LED to come into the market, and reduces after service cost.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to enforcement
In example or description of the prior art, the required accompanying drawing used is briefly described, it should be apparent that, describe below
In accompanying drawing be only some embodiments of the present invention, for those of ordinary skill in the art, do not paying
On the premise of going out creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the flow chart that a kind of LED that the embodiment of the present invention provides drives power supply test method.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clearly
Chu, be fully described by, it is clear that described embodiment be only a part of embodiment of the present invention rather than
Whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art are not making creation
The every other embodiment obtained under property work premise, broadly falls into the scope of protection of the invention.
Refer to Fig. 1, Fig. 1 is that a kind of LED that the embodiment of the present invention provides drives power supply test method
Flow chart, including:
101, Guan Bi drives the connection between power supply and the load driving power supply, starts and drives power supply, to be driven
After power work is stable, disconnect the connection driven between power supply and load.
Step 101 simulates LED drive power in normal work, and the situation of the long-term open circuit of load drives electricity
The load in source is usually LED.Wherein, Guan Bi drives the connection between power supply and the load driving power supply concrete
For the cathode output end and cathode output end that drive power supply being respectively connecting to positive pole and the negative pole of load.Start
Driving power supply to be specially drives the input of power supply to connect input power.Power work is driven the most specially to drive
The output voltage in galvanic electricity source and output electric current reach rated value.
102, after the first testing time, detection drives power source performance the most normal.
Alternatively, the first testing time in the range of 1～8 hour, preferably 1 hour.
Wherein, the most normal method of detection driving power source performance can be:
Guan Bi drives the connection between power supply and the load driving power supply, and the load wherein driving power supply is LED；
Start and drive power supply；
Detection LED whether normal luminous；
If LED normal luminous, drive power source performance normal.
Wherein, the most normal method of detection driving power source performance can also be:
Start and drive power supply；
Whether detection drives the output voltage of power supply in rated output voltage scope；
Whether detection drives the output electric current of power supply in output-current rating scope；
If driving the output voltage of power supply and output electric current electric in rated output voltage scope and specified output respectively
In the range of stream, then drive power source performance normal.
103, Guan Bi drives the connection between power supply and load, starts and drives power supply, and power work to be driven is steady
After Ding, with the first setting test rate to loading the transient state opening operation carrying out the first set point number, wherein,
Transient state opening operation is to close after first sets turn-off time after disconnection drives the connection between power supply and load
Close the connection driven between power supply and load.
Step 103 simulates LED drive module in normal work, the situation of load transients open circuit.
Alternatively, the first setting test rate can be 1 time/second, and the first set point number can be 20 times, the
One time setting turn-off time as second level.
104, detection drives power source performance the most normal.
Wherein, detection drives the most normal concrete steps of power source performance with reference to step 102, repeats no more here.
105, close the connection between driving power supply, disconnection to drive power supply and load, start and drive power supply.
Step 105 is simulated LED drive power and is under dead status, the situation of the long-term open circuit of load.Wherein,
Close and drive power supply to be specially the connection disconnected between the input and the input power that drive power supply.
106, after the second testing time, detection drives power source performance the most normal.
Alternatively, may range from 1～8 hour of the second testing time, preferably 1 hour, detection drove
The most normal concrete steps of power source performance, with reference to step 102, repeat no more here.
107, close and drive power supply, disconnect the connection driven between power supply and load, carry out the to driving power supply
The transient state of two set point numbers starts operation, and wherein, transient state starts operation and drives after power supply through first for starting
Close after setting the working time and drive power supply.
Step 107 is simulated LED drive power and is under dead status, open-circuit condition the feelings starting driving power supply
Condition.
Alternatively, the second set point number can be 20 times, first set the working time may range from 3～10
Second, preferably 5 seconds.
108, detection drives power source performance the most normal.
If more than 109 detection drives power source performance, the most normal step is just all detecting driving power source performance
Often, then test is passed through.
The various open-circuit conditions of the present embodiment simulation LED drive power, carry out open circuit and survey LED drive power
Examination, if LED drive power does not all go out to property abnormality under various test conditions, illustrates LED drive power
Open circuit performance is qualified.The test result of the present invention can help designer as the judging basis of properties of product
Find out the open-circuit-protection performance whether existing defects of LED drive power in the product test stage, find in time to lack
Fall into and be efficiently modified.The present embodiment is possible to prevent underproof LED to come into the market, and reduces and takes after sale
Business cost.
Above disclosed be only present pre-ferred embodiments, certainly can not with this limit the present invention it
Interest field, the equivalent variations therefore made according to the claims in the present invention, still belong to the scope that the present invention is contained.
Claims (10)
1. a LED drives power supply test method, it is characterised in that including:
Close the connection between the load of described driving power supply and described driving power supply, start described driving power supply,
After described driving power work is stable, disconnect the connection between described driving power supply and described load；
After the first testing time, detect described driving power source performance the most normal；
Close the connection between described driving power supply and described load, start described driving power supply, treat described in drive
After the working stability of galvanic electricity source, set test rate with first and described load is carried out the transient state of the first set point number
Opening operation, wherein, described transient state opening operation is to disconnect the company between described driving power supply and described load
After first sets turn-off time, the connection between described driving power supply and described load is closed after connecing；
Detect described driving power source performance the most normal；
Close described driving power supply, disconnect the connection between described driving power supply and described load, start described
Drive power supply；
After the second testing time, detect described driving power source performance the most normal；
Close described driving power supply, disconnect the connection between described driving power supply and described load, drive described
Galvanic electricity source carries out the transient state of the second set point number and starts operation, and wherein, described transient state starts operation for starting institute
After first sets the working time, described driving power supply is closed after stating driving power supply；
Detect described driving power source performance the most normal；
If more than detecting the most normal step of described driving power source performance all detect described driving power source performance
Normally, then test is passed through.
Method the most according to claim 1, it is characterised in that described detection described driving power supply
Can the most normally include:
Close the connection between the load of described driving power supply and described driving power supply, wherein said driving power supply
Load be LED；
Start described driving power supply；
Detection LED whether normal luminous；
If described LED normal luminous, described driving power source performance is normal.
Method the most according to claim 1, it is characterised in that described detection described driving power supply
Can the most normally include:
Start described driving power supply；
Detect the output voltage of described driving power supply whether in the range of rated output voltage；
Detect the output electric current of described driving power supply whether in the range of output-current rating；
If the described output voltage of described driving power supply and described output electric current are respectively at described rated output voltage
In the range of scope and described output-current rating, the most described driving power source performance is normal.
4. according to the method described in any one of claims 1 to 3, it is characterised in that described in described startup
Driving power supply includes:
The input of described driving power supply is connected to input power.
Method the most according to claim 1, it is characterised in that described first testing time in the range of
1～8 hours.
Method the most according to claim 1, it is characterised in that described first sets test rate as 1
Secondary/second.
Method the most according to claim 1, it is characterised in that described first set point number is 20 times.
Method the most according to claim 1, it is characterised in that described second testing time in the range of
1～8 hours.
Method the most according to claim 1, it is characterised in that described second set point number is 20 times.
Method the most according to claim 1, it is characterised in that described first sets the working time
Scope is 3～10 seconds.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310146447.5A CN104122506B (en) | 2013-04-25 | 2013-04-25 | A kind of LED drives power supply test method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310146447.5A CN104122506B (en) | 2013-04-25 | 2013-04-25 | A kind of LED drives power supply test method |
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| Publication Number | Publication Date |
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| CN104122506A CN104122506A (en) | 2014-10-29 |
| CN104122506B true CN104122506B (en) | 2016-12-28 |
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| CN201310146447.5A Active CN104122506B (en) | 2013-04-25 | 2013-04-25 | A kind of LED drives power supply test method |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106093806B (en) * | 2016-06-07 | 2019-03-22 | 中国南方航空工业(集团)有限公司 | Helicopter AC power-supply system detection device |
| CN109870626B (en) | 2019-03-22 | 2020-11-06 | 北京集创北方科技股份有限公司 | Open circuit detection method and LED display device |
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| CN201615931U (en) * | 2009-12-22 | 2010-10-27 | 重庆四联启蓝半导体照明有限公司 | Led driver testing system |
| CN102455417A (en) * | 2010-10-14 | 2012-05-16 | 泰金宝光电(苏州)有限公司 | Testing system of LED (Light Emitting Diode) lamp |
| CN102486532A (en) * | 2010-12-01 | 2012-06-06 | 西安大昱光电科技有限公司 | LED (light-emitting diode) power source analysis and test system |
| CN102540103A (en) * | 2010-12-09 | 2012-07-04 | 西安中科麦特电子技术设备有限公司 | Novel light emitting diode (LED) switching power supply test system |
| CN202721885U (en) * | 2012-06-05 | 2013-02-06 | 新宝电机(东莞)有限公司 | LED drive power aging test load |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7535375B2 (en) * | 2006-07-21 | 2009-05-19 | Mcdermott Sr Vernon C | Lamp or LED failure monitoring system |
| US8421858B2 (en) * | 2010-12-03 | 2013-04-16 | Lextar Electronics Corp. | Inspection machine, inspecting method and inspecting system |
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2013
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201615931U (en) * | 2009-12-22 | 2010-10-27 | 重庆四联启蓝半导体照明有限公司 | Led driver testing system |
| CN102455417A (en) * | 2010-10-14 | 2012-05-16 | 泰金宝光电(苏州)有限公司 | Testing system of LED (Light Emitting Diode) lamp |
| CN102486532A (en) * | 2010-12-01 | 2012-06-06 | 西安大昱光电科技有限公司 | LED (light-emitting diode) power source analysis and test system |
| CN102540103A (en) * | 2010-12-09 | 2012-07-04 | 西安中科麦特电子技术设备有限公司 | Novel light emitting diode (LED) switching power supply test system |
| CN202721885U (en) * | 2012-06-05 | 2013-02-06 | 新宝电机(东莞)有限公司 | LED drive power aging test load |
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| CN104122506A (en) | 2014-10-29 |
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