CN104122506A - LED lamp driving power test method - Google Patents
LED lamp driving power test method Download PDFInfo
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- CN104122506A CN104122506A CN201310146447.5A CN201310146447A CN104122506A CN 104122506 A CN104122506 A CN 104122506A CN 201310146447 A CN201310146447 A CN 201310146447A CN 104122506 A CN104122506 A CN 104122506A
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Abstract
An embodiment of the invention discloses an LED lamp driving power test method. The LED lamp driving power test method comprises the steps of simulating various open circuit states of an LED driving power; conducting an open circuit test on the LED driving power; and passing the test if the performance of the driving power is detected to be normal under the various open circuit states. According to the invention, the LED lamp driving power test method can be used for testing whether the open states of the LED lamp driving power would result in damage to the driving power at before an LED lamp leaves the factory, unqualified LED lamps can be prevented from entering the market, and the after-sales service cost is reduced.
Description
Technical field
The present invention relates to circuit test field, be specifically related to a kind of LED lamp driving power source method of testing.
Background technology
Light emitting diode (Light Emitting Diode, LED) is applied in recent years because it has the advantage that the life-span is long, light efficiency is high, radiation is low, low in energy consumption.The application scenario of LED lamp is extensive, and its figure can be seen in highway, tunnel, factory building, market, residential quarter etc.
LED lamp comprises driving power and LED, the load that LED is driving power.Because single LEDs power is generally less, high-powered LED lamp needs plurality of LEDs tandem working, because LED lamp is normally welded in printed board, may there is rosin joint in LED lamp, or because the situations such as vibration, temperature variation cause LED lamp and solder joint loose contact, LED driving power just there will be load open circuit in these cases, causes LED driving power to damage.
Summary of the invention
The embodiment of the present invention provides a kind of LED lamp driving power source method of testing, can before dispatching from the factory, LED lamp test out the damage whether LED lamp driving power source can cause driving power under open-circuit condition, prevent that underproof LED lamp from coming into the market, reduce after service cost.
LED lamp driving power source method of testing provided by the invention, comprising:
Being connected between closed described driving power and the load of described driving power, starts described driving power, after described driving power working stability, disconnects being connected between described driving power and described load;
After the first test duration, whether normally detect described driving power performance;
Being connected between closed described driving power and described load, start described driving power, after described driving power working stability, with the first setting test rate, described load is carried out the transient state opening operation of the first set point number, wherein, described transient state opening operation is to disconnect after being connected between described driving power and described load being connected between closed described driving power and described load after first setting trip time;
Whether normally detect described driving power performance;
Close described driving power, disconnect being connected between described driving power and described load, start described driving power;
After the second test duration, whether normally detect described driving power performance;
Close described driving power, disconnect being connected between described driving power and described load, described driving power is carried out to the transient state start-up operation of the second set point number, wherein, described transient state start-up operation is closed described driving power after starting described driving power after the first setting working time;
Whether normally detect described driving power performance;
If more than detect described driving power performance whether normal step all to detect described driving power performance normal, test is passed through.
Alternatively, whether the described driving power performance of described detection normally can comprise:
Being connected between closed described driving power and the load of described driving power, the load of wherein said driving power is LED;
Start described driving power;
Whether normally luminously detect LED;
If described LED is normal, luminous described driving power performance is normal.
Alternatively, whether the described driving power performance of described detection normally can comprise:
Start described driving power;
Whether detect the output voltage of described driving power in rated output voltage scope;
Whether detect the output current of described driving power in output-current rating scope;
If the described output voltage of described driving power and described output current are respectively within the scope of rated output voltage scope and output-current rating, described driving power performance is normal.
Alternatively, the described driving power of described startup comprises:
The input end of described driving power is connected to input power.
Alternatively, the scope of described the first test duration is 1～8 hour.
Alternatively, described the first setting test rate is 1 time/second.
Alternatively, described the first set point number is 20 times.
Alternatively, the scope that is is 1～8 hour described the second test duration.
Alternatively, described the second set point number is 20 times.
Alternatively, the described first scope of setting the working time is 3～10 seconds.
The present invention simulates the various open-circuit conditions of LED driving power, and LED driving power is carried out to open test, illustrates that LED driving power open circuit performance is qualified if LED driving power does not all go out to property abnormality under various test conditions.Test result of the present invention can be used as the judging basis of properties of product, and whether the open-circuit-protection performance that helps deviser to find out LED driving power in the product test stage exists defect, finds in time defect and effectively improves.The present invention can prevent that underproof LED lamp from coming into the market, and reduces after service cost.
Brief description of the drawings
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the process flow diagram of a kind of LED lamp driving power source method of testing of providing of the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiment.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
Please refer to Fig. 1, Fig. 1 is the process flow diagram of a kind of LED lamp driving power source method of testing of providing of the embodiment of the present invention, comprising:
101, being connected between closed driving power and the load of driving power, starts driving power, after power work to be driven is stable, disconnects being connected between driving power and load.
Step 101 is simulated LED driving power in normal work, the situation of the long-term open circuit of load, and the load of driving power is generally LED.Wherein, be specially the positive pole and the negative pole that the cathode output end of driving power and cathode output end are connected to respectively to load being connected between closed driving power and the load of driving power.Start the input end connection input power that driving power is specially driving power.Output voltage and output current that driving power working stability is specially driving power reach ratings.
102,, after the first test duration, whether normally detect driving power performance.
Alternatively, the scope of the first test duration is 1～8 hour, is preferably 1 hour.
Wherein, detecting the whether normal method of driving power performance can be:
Being connected between closed driving power and the load of driving power, wherein the load of driving power is LED;
Start driving power;
Whether normally luminously detect LED;
If LED is normal, luminous driving power performance is normal.
Wherein, detecting the whether normal method of driving power performance can also be:
Start driving power;
Whether detect the output voltage of driving power in rated output voltage scope;
Whether detect the output current of driving power in output-current rating scope;
If the output voltage of driving power and output current are respectively within the scope of rated output voltage scope and output-current rating, driving power performance is normal.
103, being connected between closed driving power and load, start driving power, after power work to be driven is stable, with the first setting test rate, load is carried out the transient state opening operation of the first set point number, wherein, transient state opening operation is to disconnect after being connected between driving power and load being connected between closed driving power and load after first setting trip time.
Step 103 is simulated LED driver module in normal work, the situation that load moment opens a way.
Alternatively, the first setting test rate can be 1 time/second, and the first set point number can be 20 times, and first sets the time that be level second trip time.
104, whether detection driving power performance is normal.
Wherein, detect the whether normal concrete steps refer step 102 of driving power performance, repeat no more here.
105, close driving power, disconnect being connected between driving power and load, start driving power.
Step 105 is simulated LED driving power under dead status, the situation of the long-term open circuit of load.Wherein, closing driving power is specially and disconnects being connected between the input end of driving power and input power.
106,, after the second test duration, whether normally detect driving power performance.
Alternatively, the scope of the second test duration can be 1～8 hour, is preferably 1 hour, detects the whether normal concrete steps refer step 102 of driving power performance, repeats no more here.
107, close driving power, disconnect being connected between driving power and load, driving power is carried out to the transient state start-up operation of the second set point number, wherein, transient state start-up operation is closed driving power after starting driving power after the first setting working time.
Step 107 is simulated LED driving power and starts under dead status, open-circuit condition the situation of driving power.
Alternatively, the second set point number can be 20 times, and the first scope of setting the working time can be 3～10 seconds, is preferably 5 seconds.
108, whether detection driving power performance is normal.
If 109 detect above driving power performance whether normal step all to detect driving power performance normal, test is passed through.
The various open-circuit conditions of the present embodiment simulation LED driving power, carry out open test to LED driving power, illustrate that LED driving power open circuit performance is qualified if LED driving power does not all go out to property abnormality under various test conditions.Test result of the present invention can be used as the judging basis of properties of product, and whether the open-circuit-protection performance that helps deviser to find out LED driving power in the product test stage exists defect, finds in time defect and effectively improves.The present embodiment can prevent that underproof LED lamp from coming into the market, and reduces after service cost.
Above disclosed is only preferred embodiment of the present invention, certainly can not limit with this interest field of the present invention, and the equivalent variations of therefore doing according to the claims in the present invention, still belongs to the scope that the present invention is contained.
Claims (10)
1. a LED lamp driving power source method of testing, is characterized in that, comprising:
Being connected between closed described driving power and the load of described driving power, starts described driving power, after described driving power working stability, disconnects being connected between described driving power and described load;
After the first test duration, whether normally detect described driving power performance;
Being connected between closed described driving power and described load, start described driving power, after described driving power working stability, with the first setting test rate, described load is carried out the transient state opening operation of the first set point number, wherein, described transient state opening operation is to disconnect after being connected between described driving power and described load being connected between closed described driving power and described load after first setting trip time;
Whether normally detect described driving power performance;
Close described driving power, disconnect being connected between described driving power and described load, start described driving power;
After the second test duration, whether normally detect described driving power performance;
Close described driving power, disconnect being connected between described driving power and described load, described driving power is carried out to the transient state start-up operation of the second set point number, wherein, described transient state start-up operation is closed described driving power after starting described driving power after the first setting working time;
Whether normally detect described driving power performance;
If more than detect described driving power performance whether normal step all to detect described driving power performance normal, test is passed through.
2. method according to claim 1, is characterized in that, whether the described driving power performance of described detection normally comprises:
Being connected between closed described driving power and the load of described driving power, the load of wherein said driving power is LED;
Start described driving power;
Whether normally luminously detect LED;
If described LED is normal, luminous described driving power performance is normal.
3. method according to claim 1, is characterized in that, whether the described driving power performance of described detection normally comprises:
Start described driving power;
Whether detect the output voltage of described driving power in rated output voltage scope;
Whether detect the output current of described driving power in output-current rating scope;
If the described output voltage of described driving power and described output current are respectively within the scope of described rated output voltage scope and described output-current rating, described driving power performance is normal.
4. according to the method described in claims 1 to 3 any one, it is characterized in that, the described driving power of described startup comprises:
The input end of described driving power is connected to input power.
5. method according to claim 1, is characterized in that, the scope of described the first test duration is 1～8 hour.
6. method according to claim 1, is characterized in that, described the first setting test rate is 1 time/second.
7. method according to claim 1, is characterized in that, described the first set point number is 20 times.
8. method according to claim 1, is characterized in that, the scope of described the second test duration is 1～8 hour.
9. method according to claim 1, is characterized in that, described the second set point number is 20 times.
10. method according to claim 1, is characterized in that, the described first scope of setting the working time is 3～10 seconds.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310146447.5A CN104122506B (en) | 2013-04-25 | 2013-04-25 | A kind of LED drives power supply test method |
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| CN201310146447.5A CN104122506B (en) | 2013-04-25 | 2013-04-25 | A kind of LED drives power supply test method |
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| CN104122506A true CN104122506A (en) | 2014-10-29 |
| CN104122506B CN104122506B (en) | 2016-12-28 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106093806A (en) * | 2016-06-07 | 2016-11-09 | 中国南方航空工业(集团)有限公司 | Helicopter AC power-supply system detection device |
| CN109870626A (en) * | 2019-03-22 | 2019-06-11 | 北京集创北方科技股份有限公司 | Open circuit detection method and LED display |
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| US20080036616A1 (en) * | 2006-07-21 | 2008-02-14 | Mcdermott Vernon C Sr | Lamp or led failure monitoring system |
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| US11417252B2 (en) | 2019-03-22 | 2022-08-16 | Chipone Technology (Beijing) Co., Ltd. | Open circuit detection method and LED display device |
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| CN104122506B (en) | 2016-12-28 |
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