CN104111164B - A kind of calibration steps of light wave component testing based on vector network analyzer - Google Patents

Abstract

The present invention proposes the calibration steps of a kind of light wave component testing based on vector network analyzer, the signal source of vector network analyzer produces test signal, one drive test trial signal coupled to vector network analyzer receiver R1 channel reception by bonder, another drive test trial signal enters electrooptic conversion module, the optical signal of electrooptic conversion module output loads on tested light wave components and parts, the transmission signal of tested light wave components and parts is converted to the signal of telecommunication by photoelectric conversion module, received by vector network analyzer receiver channel B, the reflected signal of tested light wave components and parts is received by vector network analyzer receiver C-channel after circulator is converted to the signal of telecommunication by another photoelectric conversion module；Described receiver R1 passage is port 1, and receiver channel B is port 2, and receiver C-channel is port 3.The system cost of the present invention is lower, and calibration accuracy is higher, simple to operate.

Description

A kind of calibration steps of light wave component testing based on vector network analyzer

Technical field

The present invention relates to technical field of measurement and test, particularly to a kind of light wave component testing based on vector network analyzer Calibration steps.

Background technology

Along with the development of optical communication technique, the importance of light wave component testing and analysis all the more highlights.The most Some method of testings are divided into two kinds: a kind of is to use special light wave components and parts analyser, even if directly encourage tested with light wave Components and parts, analyze its reflection and transmission wave, directly measure tested part characteristic, and the advantage of this method is instrument calibration technology Maturation, but frequency (wavelength) resolution is relatively low；Another kind is to use photoelectronic method, uses microwave to modulate optical wavelength and swashs Encouraging measured piece, then transmission and reflected signal are demodulated to microwave frequency band are analyzed, its advantage is frequency (wavelength) resolution Higher, but systematic error is difficult to calibrate.

Also have the implementation method of a kind of simplicity, directly use vector network analyzer and optoelectronic converter part to build light wave Analysis platform, but its calibration can only preliminary calibration, its phase test result precision is the highest.It is currently based on vector network analyzer The calibration of light wave components and parts can only carry out thru calibration.

Summary of the invention

For the shortcoming of above-mentioned three kinds of light wave component testing methods, the present invention proposes a kind of based on vector network analysis The optic component detection calibration method of instrument.

The technical scheme is that and be achieved in that:

A kind of calibration steps of light wave component testing based on vector network analyzer, the signal of vector network analyzer Source produces test signal, and a drive test trial signal coupled to vector network analyzer receiver R1 channel reception by bonder, separately One drive test trial signal enters electrooptic conversion module, and the optical signal of electrooptic conversion module output loads on tested light wave components and parts, quilt The transmission signal of light-metering ripple components and parts is converted to the signal of telecommunication by photoelectric conversion module, by vector network analyzer receiver channel B Receive, the reflected signal of tested light wave components and parts after circulator is converted to the signal of telecommunication by another photoelectric conversion module by vector net Network analyser receiver C-channel receives；Described receiver R1 passage is port 1, and receiver channel B is port 2, and receiver C leads to Road is port 3:

Port 1 microwave error include directional error EDF, transmission tracking error ESTF, source mismatch error ESF and reflection with Track error E SRF；

E/O switching device model includes the directivity of electro-optic conversion transmission error coefficient ESOTF and E/O device microwave end by mistake Difference EEODF；

O/E switching device model includes matching error EOESF of transmission error coefficient EOSTF, O/E device of O/E device Microwave matching error with an inside；

The microwave error of port 2 and port 3 includes receiver transmission tracking error ERTF and receiver mismatches error E LF；

Tested light wave device model only includes transmitting error coefficient OS₂₁With reflection error coefficient OS₁₁Two parameters；

With tested light wave components and parts for test plane, by the error of E/O and O/E device and port 1, port 2, port 3 Microwave error merges, and input uses vector network analyzer internal receipt machine C/R1, and transmission port is vector network analyzer Receiver B/R1, simplifies light wave component testing error model based on vector network analyzer；

Calibration process includes:

Step (a), by vacant for test E/O transducer rear end, test volume S in vector network analyzer_31MAnd S_21MFor:

$S_{31M}=\frac{C}{R_1}=e_{00}=M_1---\left(1\right)$

$S_{21M}=\frac{B}{R_1}=e_{31}=M_2---\left(2\right)$

Step (b), accesses light total reflection meter, its reflection characteristic coefficient OS₁₁=1, test volume S in vector network analyzer_31M For:

$S_{31M}=\frac{C}{R_1}=e_{00}+\frac{e_{10}*e_{01}}{1-e_{41}*e_{14}}=M_3---\left(3\right)$

Step (c), is joined directly together E/O transducer back end test port and O/E transducer head end test port, transmission spy Property coefficient OS₂₁=1, test volume S in vector network analyzer_21MFor:

$S_{21M}=\frac{B}{R_1}=e_{31}+\frac{e_{10}*e_{32}}{1-e_{35}*e_{53}}=M_4---\left(4\right)$

Calibrate complete, access tested light wave components and parts, measuring transmission loss value OS of tested light wave components and parts_11MAnd reflection Characteristic test value OS_21MExpression formula be:

$S_{31M}=\frac{C}{R_1}=e_{00}+\frac{e_{10}*e_{01}}{1-e_{41}*e_{14}}*O{S}_{11}---\left(5\right)$

$S_{21M}=\frac{B}{R_1}=e_{31}+\frac{e_{10}*e_{32}}{1-e_{35}*e_{53}}*O{S}_{21}---\left(6\right)$

Test result after calibration is:

${\mathrm{OS}}_{11}=\frac{S_{31M}-M_1}{M_3-M_1}---\left(7\right)$

${\mathrm{OS}}_{21}=\frac{S_{21M}-M_2}{M_4-M_2}---\left(8\right).$

The invention has the beneficial effects as follows:

(1) vector network analyzer internal error and photoelectron modular converter error are calibrated simultaneously；

(2) improve phase and amplitude measuring accuracy simultaneously；

(3) platform test dynamic range is improved.

Accompanying drawing explanation

In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing In having technology to describe, the required accompanying drawing used is briefly described, it should be apparent that, the accompanying drawing in describing below is only this Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to Other accompanying drawing is obtained according to these accompanying drawings.

Fig. 1 is the test philosophy figure of the calibration steps of present invention light wave based on vector network analyzer component testing；

Fig. 2 is light wave component testing error model figure based on vector network analyzer；

Fig. 3 is light wave component testing error equivalent model figure based on vector network analyzer；

Fig. 4 is E/O back end test port vacant error model figure；

Fig. 5 is that E/O back end test port accesses light total reflection meter error model figure；

Fig. 6 is joined directly together for test port and connects error model figure.

Detailed description of the invention

Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Describe, it is clear that described embodiment is only a part of embodiment of the present invention rather than whole embodiments wholely.Based on Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under not making creative work premise Embodiment, broadly falls into the scope of protection of the invention.

The light wave components and parts calibration being currently based on vector network analyzer has only carried out thru calibration.The present invention uses vector Network Analyzer and optoelectronic converter part build light wave analysis platform, set up its test error model, provide a kind of precision relatively Method high, that vector network analyzer inside and optoelectronic module error can be calibrated simultaneously.

Test philosophy such as Fig. 1 institute of the calibration steps of present invention light wave based on vector network analyzer component testing Show.The signal source of vector network analyzer VNA produces test signal, uses bonder to couple a drive test trial signal and receives to VNA Machine R1 channel reception.Another drive test trial signal enters the optical signal of electrooptic conversion module E/O, E/O output and loads on tested photoelectricity Components and parts DUT.The transmission signal of tested photoelectric component is converted to the signal of telecommunication by photoelectric conversion module O/E, by VNA receiver B Channel reception.The reflected signal of tested photoelectric component is after circulator is converted to the signal of telecommunication to another photoelectric conversion module O/E Received by receiver C-channel.Vector network analysis internal signal sources and a road local vibration source Lo are produced by same frequency reference；Modulation Source provides modulated signal for electrooptic conversion module E/O；Demodulation source provides demodulated signal for photoelectric conversion module O/E.Above-mentioned coupling Device is used as electric bridge and substitutes.

Vector network analyzer VNA includes 4 ports, and the VNA of the present invention employs wherein three ports, port 1, port 2 and choosing of port 3 be randomness, be not intended as limiting the scope of the invention.Port 1 employs R1 receiver, For R1 passage；Port 2 employs receiver B, for channel B；Port 3 employs receiver C, for C-channel.

Based on vector network analyzer light wave component testing error model as in figure 2 it is shown, port 1 microwave error includes Directional error EDF, transmission tracking error ESTF, source mismatch error ESF and skin tracking error E SRF.

There is not matching problem in E/O switching device due to light, the reflection echo of light does not cause E/O microwave incoming signal Change, therefore E/O switching device model includes electro-optic conversion transmission coefficient ESOTF and the directional error of E/O device microwave end EEODF。

There is not matching problem, non-emissive optical echo in O/E switching device model due to light, therefore its model includes O/E Matching error EOESF of transmission coefficient EOSTF, O/E device of device and the microwave matching error of an inside.Within O/E Microwave matching error exports without light wave, is therefore a closed circuit.

The microwave error of port 2 and port 3 includes receiver transmission tracking error ERTF and receiver mismatches error E LF.

There is not matching problem, and O/E device areflexia light in tested smooth wave device, the most tested light wave device model only wraps Include transmission error coefficient OS₂₁With reflection error coefficient OS₁₁Two parameters.

The circulator degree of coupling is the highest, it is believed that the reflection light of tested smooth wave device is all reflected into another O/E device.

With tested smooth wave device DUT for test plane, by the error of E/O and O/E device and port 1, port 2, port 3 Microwave error merges, and input uses VNA internal receipt machine C/R1, and transmission port is VNA receiver B/R1, now can simplify To light wave component testing error model based on VNA, as shown in Figure 3.

Calibration process comprises the following steps:

Step (a), by vacant for test E/O transducer rear end.The now light output of E/O transducer enters in air, there is no Reflection, is equivalent to test port in microwave and connects desired load, and now error model is as shown in Figure 4.

Test volume S in VNA_31MAnd S_21MFor

$S_{31M}=\frac{C}{R_1}=e_{00}=M_1---\left(1\right)$

$S_{21M}=\frac{B}{R_1}=e_{31}=M_2---\left(2\right)$

Step (b), accesses light total reflection meter.The principle of light total reflection meter can analogy and the preferable open circuit in microwave test Device, its reflection error coefficient OS₁₁=1, therefore error model is as shown in Figure 5.

Test volume S in VNA_31MFor

$S_{31M}=\frac{C}{R_1}=e_{00}+\frac{e_{10}*e_{01}}{1-e_{41}*e_{14}}=M_3---\left(3\right)$

Step (c), is joined directly together E/O transducer back end test port and O/E transducer head end test port, now may be used Be analogous in microwave test is straight-through, transmits error coefficient OS₂₁=1, therefore error model is as shown in Figure 6.

Test volume S in VNA_21MFor:

$S_{21M}=\frac{B}{R_1}=e_{31}+\frac{e_{10}*e_{32}}{1-e_{35}*e_{53}}=M_4---\left(4\right)$

So far calibrate complete, access device under test, as it is shown on figure 3, measuring transmission loss value OS of light wave components and parts_11MWith Reflection characteristic test value OS_21MExpression formula be:

$S_{31M}=\frac{C}{R_1}=e_{00}+\frac{e_{10}*e_{01}}{1-e_{41}*e_{14}}*O{S}_{11}---\left(5\right)$

$S_{21M}=\frac{B}{R_1}=e_{31}+\frac{e_{10}*e_{32}}{1-e_{35}*e_{53}}*O{S}_{21}---\left(6\right)$

Therefore the test result after calibration is

${\mathrm{OS}}_{11}=\frac{S_{31M}-M_1}{M_3-M_1}---\left(7\right)$

${\mathrm{OS}}_{21}=\frac{S_{21M}-M_2}{M_4-M_2}---\left(8\right)$

In above-mentioned calibration process, the sequencing of step (a), step (b) and step (c) can adjust, and these conversion are all The protection domain of claims of the present invention should be belonged to.

The calibration steps of present invention light wave based on vector network analyzer component testing, based on VNA and an electric light Transducer and two optical-electrical converters, therefore system cost is lower；The present invention considers that vector network analyzer and photoelectricity turn simultaneously The electricity error of parallel operation, calibration accuracy is higher, and therefore certainty of measurement is higher；Only need to make that test port is vacant, connect light total reflection Meter and straight-through can completing are calibrated, simple to operate；Owing to being vector calibration, amplitude and the phase of tested components and parts therefore can be provided Position.

The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all essences in the present invention Within god and principle, any modification, equivalent substitution and improvement etc. made, should be included within the scope of the present invention.

Claims (1)

1. the calibration steps of a light wave component testing based on vector network analyzer, it is characterised in that vector network divides The signal source of analyzer produces test signal, and a drive test trial signal coupled to vector network analyzer receiver R1 by bonder and leads to Road receives, and another drive test trial signal enters E/O switching device, and the optical signal of E/O switching device output loads on tested light wave unit Device, the transmission signal of tested light wave components and parts is converted to the signal of telecommunication by an O/E switching device, vector network analyzer connects Receipts machine channel B receives, and the reflected signal of tested light wave components and parts is after circulator is converted to the signal of telecommunication by the 2nd O/E switching device Received by vector network analyzer receiver C-channel；Described receiver R1 passage is port 1, and receiver channel B is port 2, connects Receipts machine C-channel is port 3；

Port 1 microwave error includes that directional error EDF, transmission tracking error ESTF, source mismatch error ESF and skin tracking are by mistake Difference ESRF；

E/O switching device model includes the directivity of electro-optic conversion transmission error coefficient ESOTF and E/O switching device microwave end by mistake Difference EEODF；

O/E switching device model includes the matching error of transmission error coefficient EOSTF, O/E switching device of O/E switching device The microwave matching error of EOESF and an inside；

The microwave error of port 2 and port 3 includes receiver transmission tracking error ERTF and receiver mismatches error E LF；

Tested light wave device model only includes transmitting error coefficient OS₂₁With reflection error coefficient OS₁₁；

With tested light wave components and parts for test plane, by E/O switching device and the error of O/E switching device and port 1, port 2, The microwave error of port 3 merges, and input uses vector network analyzer internal receipt machine C/R1, and transmission port is vector network Analyser receiver B/R1, simplifies light wave component testing error model based on vector network analyzer；

Calibration process includes:

Step (a), by vacant for test E/O switching device rear end, test volume S in vector network analyzer_31MAnd S_21MFor:

$S_{31M}=\frac{C}{R_1}=e_{00}=M_1---\left(1\right)$

$S_{21M}=\frac{B}{R_1}=e_{31}=M_2---\left(2\right)$

Wherein, e represents the Transmitting error cofficient in light wave component testing error model, and the subscript of e represents light wave components and parts and surveys Each internodal direction of propagation in examination error model；

Step (b), light total reflection meter, its reflection characteristic coefficient OS are accessed in E/O switching device rear end₁₁=1, vector network analyzer Middle test volume S_31MFor:

$S_{31M}=\frac{C}{R_1}=e_{00}+\frac{e_{10}*e_{01}}{1-e_{41}*e_{14}}=M_3---\left(3\right)$

Step (c), is joined directly together E/O switching device back end test port and an O/E switching device head end test port, passes Defeated characteristic coefficient OS₂₁=1, test volume S in vector network analyzer_21MFor:

$S_{21M}=\frac{B}{R_1}=e_{31}+\frac{e_{10}*e_{32}}{1-e_{35}*e_{53}}=M_4---\left(4\right)$

Calibrate complete, access tested light wave components and parts, measuring transmission loss value OS of tested light wave components and parts_11MAnd reflection characteristic Test value OS_21MExpression formula be:

$S_{31M}=\frac{C}{R_1}=e_{00}+\frac{e_{10}*e_{01}}{1-e_{41}*e_{14}}*{\mathrm{OS}}_{11}---\left(5\right)$

$S_{21M}=\frac{B}{R_1}=e_{31}+\frac{e_{10}*e_{32}}{1-e_{35}*e_{53}}*{\mathrm{OS}}_{21}---\left(6\right)$

Test result after calibration is:

${\mathrm{OS}}_{11}=\frac{S_{31M}-M_1}{M_3-M_1}---\left(7\right)$

${\mathrm{OS}}_{21}=\frac{S_{21M}-M_2}{M_4-M_2}---\left(8\right).$