CN104090185A - Testing system and method - Google Patents
Testing system and method Download PDFInfo
- Publication number
- CN104090185A CN104090185A CN201410308544.4A CN201410308544A CN104090185A CN 104090185 A CN104090185 A CN 104090185A CN 201410308544 A CN201410308544 A CN 201410308544A CN 104090185 A CN104090185 A CN 104090185A
- Authority
- CN
- China
- Prior art keywords
- testing apparatus
- processor
- testing
- test
- electronic equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
The embodiment of the invention discloses a testing system. The testing system comprises a processor, a memory, M tested-device interfaces and N testing-device interfaces, wherein the memory is connected with the processor and a plurality of testing script files are stored in the memory; the M tested-device interfaces are connected with the processor; the N testing-device interfaces are connected with the processor. The processor obtains material codes of tested electronic devices, the testing script files corresponding to the material codes are obtained from the memory, the testing script files are analyzed so as to generate action commands, the action commands are sent to the N testing-device interfaces, the N testing-device interfaces are connected with the same kind of testing devices, the testing devices connected with the N testing-device interfaces are respectively connected with the corresponding tested electronic device, the processor obtains response information of the tested electronic devices, and the operating states of the tested electronic devices are determined according to the response information. By means of the testing system, the time consumed for testing a large number of electronic devices in the same kind can be greatly shortened, and testing cost can be reduced. The invention further discloses a testing method.
Description
Technical field
The invention belongs to electronic equipment technical field of quality detection, relate in particular to test macro and method of testing.
Background technology
In the research and development and production run of electronic equipment, need to test the various functions of electronic equipment, to guarantee the quality of product.Current testing apparatus once can only be tested an electronic equipment, in the time will testing a large amount of electronic equipments of the same type, can only to each electronic equipment, test successively, can expend a large amount of time.
How shortening a large amount of electronic equipments of the same type are tested to the spent time, is those skilled in the art's problem demanding prompt solutions.
Summary of the invention
In view of this, the object of the embodiment of the present invention is to provide a kind of test macro and method of testing, to shorten, a large amount of electronic equipments of the same type is tested to the spent time.
For achieving the above object, the invention provides following technical scheme:
A test macro, comprising:
Processor:
With the storer that described processor is connected, described memory stores has a plurality of test script files;
M the equipment under test interface being connected with described processor, tested electronic equipment can be connected with described equipment under test interface;
N the testing apparatus interface being connected with described processor, testing apparatus can be connected with described testing apparatus interface, and wherein, N and M are not less than 2 integer, and N is not less than M;
Described processor obtains the material code of tested electronic equipment, from described storer, obtain the test script file corresponding with described material code, resolve described test script file and generate action command, to n testing apparatus interface, send described action command, wherein, n is the integer that is not more than N, described n testing apparatus interface is connected with same testing apparatus, be connected with a tested electronic equipment respectively with described n the testing apparatus that testing apparatus interface is connected, described processor obtains the response message of described tested electronic equipment, according to described response message, determine the running status of described tested electronic equipment.
Preferably, above-mentioned test macro comprises M testing apparatus interface group, and each testing apparatus interface group comprises a plurality of testing apparatus interfaces, and a plurality of testing apparatus interfaces in each testing apparatus interface group are at least the communication interface of two types.
Preferably, in above-mentioned test macro, described processor is monokaryon multiline procedure processor or polycaryon processor, and described processor sends described action command to described n testing apparatus interface concurrent.
Preferably, above-mentioned test macro also comprises the display device being connected with described processor, described display device is used for showing test data, and described test data comprises one or more in the running status of response message that described processor gets and described tested electronic equipment.
The present invention also discloses a kind of method of testing, be applied to test macro, described test macro comprises processor, the storer being connected with described processor, M the equipment under test interface being connected with described processor, and N the testing apparatus interface being connected with described processor, wherein, N and M are not less than 2 integer, and N is not less than M, and described method of testing comprises:
Described processor obtains the material code of tested electronic equipment;
Described processor obtains the test script file corresponding with described material code from described storer;
Described processor is resolved described test script file and is generated action command;
Described processor sends described action command to n testing apparatus interface, wherein, n is the integer that is not more than N, and described n testing apparatus interface is connected with same testing apparatus, is connected respectively with described n the testing apparatus that testing apparatus interface is connected with a tested electronic equipment;
Described processor obtains the response message of described tested electronic equipment, determines the running status of described tested electronic equipment according to described response message.
Preferably, in above-mentioned method of testing, described processor obtains the material code of tested electronic equipment, comprising: the serial number that obtains tested electronic equipment; The serial number that utilization prestores and the corresponding relation of material code, determine material code corresponding to described water stream number, and wherein, in described corresponding relation, the equipment of same type is corresponding to same material code.
Preferably, in the situation that described processor is monokaryon multiline procedure processor or polycaryon processor, in above-mentioned method of testing, described processor, to the instruction of described n testing apparatus interface sending action, is specially: described processor is to the instruction of described n testing apparatus interface concurrent sending action.
Preferably, in the situation that described test macro comprises the display device being connected with described processor, described method of testing also comprises: described processor is controlled described display device and shown test data, and described test data comprises one or more in the running status of response message that described processor gets and described tested electronic equipment.
Preferably, above-mentioned method of testing also comprises: described processor is stored to described storer by described test data.
As can be seen here, beneficial effect of the present invention is: based on test macro disclosed by the invention, before test, a plurality of congener tested electronic equipments are connected to equipment under test interfaces different in test macro, each equipment under test is connected with a testing apparatus respectively, these testing apparatuss are same testing apparatus, and testing apparatus is connected to respectively to corresponding testing apparatus interface in test macro; In test process, processor obtains the test script file corresponding with the material code of tested electronic equipment, the test script file that parsing gets generates action command, to a plurality of testing apparatus interfaces that are connected with testing apparatus, send this action command, make each testing apparatus carry out same test action, processor obtains the response message of each electronic equipment afterwards, and according to response message, determines the running status of tested electronic equipment.Based on test macro disclosed by the invention, can disposable a plurality of congener electronic equipments be tested, thereby can shorten, a large amount of class of electronic devices of the same race are tested to the spent time.In addition, for the different testing requirement of distinct electronic apparatuses, only corresponding testing apparatus need be connected to the testing apparatus interface in test macro, by processor, resolve corresponding test script file afterwards and just can complete test, there is good extendability and dirigibility, owing to need to not developing special-purpose test macro for different testing requirements, therefore can reduce the testing cost of electronic equipment, thereby reduce production costs.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only embodiments of the invention, for those of ordinary skills, do not paying under the prerequisite of creative work, other accompanying drawing can also be provided according to the accompanying drawing providing.
Fig. 1 is the structural representation of a kind of test macro disclosed by the invention;
Fig. 2 is for to carry out the application schematic diagram in test process based on test macro shown in Fig. 1;
Fig. 3 is the structural representation of another kind of test macro disclosed by the invention;
Fig. 4 is the process flow diagram of a kind of method of testing disclosed by the invention.
Embodiment
The present invention discloses a kind of test macro, can disposable a plurality of electronic equipments of the same type be tested, thereby shorten, a large amount of electronic equipments of the same type is tested to the spent time.
Test macro disclosed by the invention comprises:
Processor:
The storer being connected with processor, memory stores has a plurality of test script files;
The M being connected with processor equipment under test interface, tested electronic equipment can be connected with equipment under test interface;
The N being connected with processor testing apparatus interface, testing apparatus can be connected with testing apparatus interface, and wherein, N and M are not less than 2 integer, and N is not less than M;
In test process, processor obtains the material code of tested electronic equipment, from storer, obtain the test script file corresponding with material code, resolve test script file and generate action command, to the instruction of n testing apparatus interface sending action, wherein, n is the integer that is not more than N, n testing apparatus interface is connected with same testing apparatus, that is to say that n testing apparatus interface is connected with respectively a testing apparatus, and the testing apparatus connecting with n testing apparatus interface is identical testing apparatus, the testing apparatus being connected with n testing apparatus interface is connected with a tested electronic equipment respectively, obtain the response message of tested electronic equipment, according to response message, determine the running status of tested electronic equipment.
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Embodiment based in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
Referring to Fig. 1, the structural representation that Fig. 1 is a kind of test macro disclosed by the invention.This test macro comprises processor 100, storer 200, equipment under test interface 301 to 304, testing apparatus interface 401 to 404.
Wherein:
Storer 200 is connected with processor 100, and memory stores has a plurality of test script files.
Equipment under test interface 301 to 304 is connected with processor 100 respectively.Tested electronic equipment can be connected with equipment under test interface, that is to say, the communication interface in equipment under test interface and tested electronic equipment matches.In the present invention, alleged connection can be both wired connection, can be also wireless connections.In concrete application, equipment under test interface 301 to 304 can be serial ports, GPIB (general purpose interface bus) interface, USB (USB (universal serial bus)) interface, Ethernet interface, CAN (controller local area network) interface, LXI (LAN extension for instrumentation, a kind of modular testing platform standard based on LAN (Local Area Network)) interface or blue tooth interface.
Testing apparatus interface 401 to 404 is connected with processor 100 respectively.Testing apparatus can be connected with testing apparatus interface, that is to say, the communication interface in testing apparatus interface and testing apparatus matches.
Here it should be noted that, M equipment under test interface and N testing apparatus interface can be set in test macro disclosed by the invention, and wherein M and N are more than or equal to 2 integer, and N is not less than M.It is only a kind of example that 301 to 304 and 4 testing apparatus interfaces 401 to 404 of 4 equipment under test interfaces are set in Fig. 1.
Below the process of a plurality of class of electronic devices of the same race being tested based on test macro shown in Fig. 1 is described, refer to Fig. 2.
Before test, operating personnel are connected to respectively tested electronic equipment interfaces 301 to 304 by tested electronic equipment 501 to 504, testing apparatus 601 to 604 is connected to respectively to testing apparatus interface 401 to 404, certainly, also will by tested electronic equipment 501 to 504 and testing apparatus 601 to 604 one by one correspondence establishment be connected.Concrete, connecting tested electronic equipment 501 and equipment under test interface 301, connecting test equipment 601 and testing apparatus interface 401, connect tested electronic equipment 501 and testing apparatus 601; Connect tested electronic equipment 502 and equipment under test interface 302, connecting test equipment 602 and testing apparatus interface 402, connect tested electronic equipment 502 and testing apparatus 602; Connect tested electronic equipment 503 and equipment under test interface 303, connecting test equipment 603 and testing apparatus interface 403, connect tested electronic equipment 503 and testing apparatus 603; Connect tested electronic equipment 504 and equipment under test interface 304, connecting test equipment 604 and testing apparatus interface 404, connect tested electronic equipment 504 and testing apparatus 604.
Wherein, the electronic equipment that tested electronic equipment 501 to 504 is one species, testing apparatus 601 to 604 is identical testing apparatus.According to the test event that will carry out tested electronic equipment, select corresponding testing apparatus, in enforcement, testing apparatus can be multimeter, programmable DC power supply or oscillograph, the kind of testing apparatus is not limited thereto certainly.It should be noted that, class of electronic devices of the same race alleged in the present invention refers to: the electronic equipment that content measurement is identical with evaluation index, the namely identical electronic equipment of test process.In enforcement, congener electronic equipment can be the electronic equipment of same model, can be also with electronic equipment a series of and that operational factor is identical.
Afterwards, operating personnel can manually input the material code of tested electronic equipment, also can input the serial number of tested electronic equipment, by processor 100, determine the material code corresponding with this serial number.Processor 100 finds out the test script file corresponding with material code from a plurality of test script files of storer 200 storages.Test script file consists of multirow test instruction, and every a line test instruction is all an independent instruction.
After receiving open detection order, processor 100 is resolved test script files and is generated action commands, afterwards by the action command generating to 401 to 404 transmissions of testing apparatus interface, thereby action command is transferred to testing apparatus 601 to 604.Testing apparatus 601 to 604, after receiving action command, drives connected tested electronic equipment thereby carry out this action command.Afterwards, processor 100 obtains the response message of tested electronic equipment 501 to 504, utilizes the response message receiving to determine the running status of each tested electronic equipment, thus the disposable test completing tested electronic equipment 501 to 504.
Here testing apparatus it should be noted that: in the situation that can gather the response message of tested electronic equipment, processor 100 can obtain from each testing apparatus the response message of tested electronic equipment, in addition, processor 100 can also directly obtain its response message from tested electronic equipment.
In addition, processor 100 is determined the running status of tested electronic equipment according to response message, can carry out according to existing mode, as determined whether normally operation of electronic equipment by comparison response message and default condition or default numerical range, not limit here.
Based on test macro disclosed by the invention, before test, a plurality of congener tested electronic equipments are connected to equipment under test interfaces different in test macro, each equipment under test is connected with a testing apparatus respectively, these testing apparatuss are same testing apparatus, and testing apparatus is connected to respectively to corresponding testing apparatus interface in test macro; In test process, processor obtains the test script file corresponding with the material code of tested electronic equipment, the test script file that parsing gets generates action command, to a plurality of testing apparatus interfaces that are connected with testing apparatus, send this action command, make each testing apparatus carry out same test action, processor obtains the response message of each electronic equipment afterwards, and according to response message, determines the running status of tested electronic equipment.Based on test macro disclosed by the invention, can disposable a plurality of congener electronic equipments be tested, thereby can shorten, a large amount of class of electronic devices of the same race are tested to the spent time.In addition, for the different testing requirement of distinct electronic apparatuses, only corresponding testing apparatus need be connected to the testing apparatus interface in test macro, by processor, resolve corresponding test script file afterwards and just can complete test, there is good extendability and dirigibility, owing to need to not developing special-purpose test macro for different testing requirements, therefore can reduce the testing cost of electronic equipment, thereby reduce production costs.
As preferred implementation, M testing apparatus interface group can be set in test macro, namely the quantity of testing apparatus interface group is identical with the quantity of equipment under test interface, each testing apparatus interface group comprises a plurality of testing apparatus interfaces, and a plurality of testing apparatus interfaces in each testing apparatus interface group are at least the communication interface of two types.
Below in conjunction with Fig. 3, its structure is described.
Referring to Fig. 3, the structural representation that Fig. 3 is another kind of test macro disclosed by the invention.This test macro comprises processor 100, storer 200, equipment under test interface 301 to 304, and testing apparatus interface group 400,700,800 and 900.
Wherein:
Storer 200 is connected with processor 100, and memory stores has a plurality of test script files.
Equipment under test interface 301 to 304 is connected with processor 100 respectively.Tested electronic equipment can be connected with equipment under test interface, that is to say, the communication interface in equipment under test interface and tested electronic equipment matches.In concrete application, equipment under test interface 301 to 304 can be serial ports, gpib interface, USB interface, Ethernet interface, CAN interface, LXI interface or blue tooth interface.
Testing apparatus interface group 400 comprises testing apparatus interface 401 to 403, testing apparatus interface group 700 comprises testing apparatus interface 701 to 703, testing apparatus interface group 800 comprises testing apparatus interface 801 to 803, and testing apparatus interface group 900 comprises testing apparatus interface 901 to 903.Each testing apparatus interface is connected with processor 100 respectively.In each testing apparatus interface group, a plurality of testing apparatus interfaces are at least the communication interface of two types.Here it should be noted that, each testing apparatus interface group comprises that three testing apparatus interfaces are only a kind of examples, and the present invention does not specifically limit the quantity of testing apparatus interface in testing apparatus interface group.
Compare with test macro shown in Fig. 1, in the test macro shown in Fig. 3, be provided with the testing apparatus interface group identical with equipment under test interface quantity, that is to say shown in Fig. 3 in test macro that the quantity of testing apparatus interface is the integral multiple of equipment under test interface quantity.In the time need to carrying out multinomial test for an electronic equipment, the required testing apparatus of test all can be connected in test macro to corresponding testing apparatus interface, thereby disposable a plurality of electronic equipments of the same type be carried out to multinomial test.
Here in conjunction with an example, describe.
Suppose and will carry out three tests to 4 tested electronic equipments, be designated as respectively test 1, test 2 and test 3.Test 1 needs use test equipment one, need to move test script file one, test 2 needs use test equipment two, need to move test script file two, test 3 needs use test equipment three, need to move test script file three, and testing apparatus interface group 400,700,800 and 900 comprises the testing apparatus interface mating with three kinds of testing apparatuss.
Before test, operating personnel are connected to respectively equipment under test interface 301 to 304 by 4 tested electronic equipments, tested electronic equipment is connected respectively with testing apparatus, and wherein, one, testing apparatus two of tested electronic equipment and a testing apparatus and a testing apparatus three are connected.
Operating personnel are connected to respectively corresponding testing apparatus interface in testing apparatus interface group 400,700,800 and 900 by 4 testing apparatuss one, 4 testing apparatuss two and 4 testing apparatuss three.Afterwards, according to the mailing address of 4 testing apparatuss one, revise test script file one, according to the mailing address of 4 testing apparatuss two, revise test script file two, according to the mailing address of 4 testing apparatuss three, revise test script file three, so that processor 100 is resolved after each test script file, action command can be sent to corresponding testing apparatus interface.In enforcement, the mailing address of each testing apparatus can be the interface IP address of connected testing apparatus interface.
Certainly, in enforcement, also can complete according to the mailing address defining in each test script file the connection of testing apparatus and testing apparatus interface, now just not need to revise the test script file prestoring.
In test process, processor 100 obtains test script file one, test script file two and test script file three from storer 200 according to material code.Afterwards, resolve successively each test script file getting, thereby complete three of 4 tested electronic equipments tests.Wherein, the process of tested electronic equipment being carried out to a test is: processor 100 is resolved test script file and generated action command, afterwards the action command generating is sent to corresponding testing apparatus interface, thereby action command is transferred to testing apparatus.Testing apparatus, after receiving action command, drives connected tested electronic equipment thereby carry out this action command.Afterwards, processor 100 obtains the response message of tested electronic equipment, utilizes the response message receiving to determine the running status of each tested electronic equipment.
To sum up, the test macro based on shown in Fig. 3 of the present invention, can carry out multinomial test to a plurality of class of electronic devices of the same race.
As optimal way, in test macro, in M testing apparatus interface group, the type of a plurality of testing apparatus interfaces forms identical.Take Fig. 3 as example: three testing apparatus interfaces in testing apparatus interface group 400,700,800 and 900 are three dissimilar communication interfaces, as be any three in serial ports, gpib interface, USB interface, Ethernet interface, CAN interface, LXI interface and blue tooth interface.In the process of test system building, can for example, according to the type of testing apparatus interface in selected each testing apparatus interface group of the type of the communication interface of testing apparatus: each testing apparatus interface group comprises a serial ports, a USB interface and a blue tooth interface.
In the situation that testing apparatus only comprises single communication interface, the test macro based on above-mentioned can carry out same test to a plurality of class of electronic devices of the same race.
In the above-mentioned disclosed test macro of the present invention, processor 100 preferably adopts monokaryon multiline procedure processor or polycaryon processor, in this case, processor is in the process of n testing apparatus interface sending action instruction, can adopt the mode of parallel sending action, to the instruction of n testing apparatus interface sending action, compare successively with processor 100, can further shorten the spent time of each testing procedure, when a test event comprises a plurality of testing procedure, can obviously shorten the test duration of whole test event.
In addition, can also in the above-mentioned disclosed proving installation of the present invention, display device be further set, this display device is connected with processor, for showing test data.Wherein, test data comprises one or more in the running status of response message that processor gets and described tested electronic equipment.
The present invention also discloses a kind of method of testing, this method of testing is applied to test macro, wherein test macro comprises processor, the storer being connected with processor, M the equipment under test interface being connected with processor, and the N being connected with processor testing apparatus interface, wherein, N and M are not less than 2 integer, and N is not less than M.Its process flow diagram as shown in Figure 4, comprising:
Step S1: processor obtains the material code of tested electronic equipment.
Step S2: processor obtains the test script file corresponding with material code from storer.In storer, store a plurality of test script files.
Step S3: processor is resolved test script file and generated action command.
Step S4: processor is to the instruction of n testing apparatus interface sending action.Wherein, n is the integer that is not more than N, and n testing apparatus interface is connected with same testing apparatus, and the testing apparatus being connected with n testing apparatus interface is connected with a tested electronic equipment respectively.
Step S5: processor obtains the response message of tested electronic equipment, determines the running status of tested electronic equipment according to response message.In the situation that testing apparatus can gather the response message of tested electronic equipment, processor can obtain the response message of tested electronic equipment from each testing apparatus, and in addition, processor can also directly obtain its response message from tested electronic equipment.
Based on method disclosed by the invention, processor is after resolving test script file generation action command, to a plurality of testing apparatus interfaces that are connected with testing apparatus, send this action command, make each testing apparatus carry out same test action, processor obtains the response message of each electronic equipment afterwards, and according to response message, determine the running status of tested electronic equipment, disposable a plurality of congener electronic equipments are tested, thereby can shorten, a large amount of class of electronic devices of the same race are tested to the spent time.
In enforcement, operating personnel can directly input the material code of electronic equipment to be measured, so that processor obtains material code.In addition, processor can also adopt other modes to obtain the material code of tested electronic equipment.
For example: processor obtains the serial number of tested electronic equipment; The serial number that utilization prestores and the corresponding relation of material code, determine the material code that water stream number is corresponding, and wherein, in corresponding relation, the equipment of same type is corresponding to same material code.In specific implementation process, the serial number of the tested electronic equipment that processor obtains can manually be inputted by operating personnel, also can set up the communication connection of processor and barcode scanning gun, operating personnel use barcode scanning gun to carry out barcode scanning operation to tested electronic equipment, by barcode scanning gun, the definite serial number of barcode scanning are sent to processor.
In the situation that the processor in test macro is monokaryon multiline procedure processor or polycaryon processor, processor, to the instruction of n testing apparatus interface sending action, is specially: processor is to the instruction of n testing apparatus interface concurrent sending action.To the instruction of n testing apparatus interface sending action, compare successively with processor, the spent time of each testing procedure can be further shortened in the parallel sending action instruction of processor, when a test event comprises a plurality of testing procedure, can obviously shorten the test duration of whole test event.
In addition, in the situation that test macro also comprises display device, on the basis of method of testing shown in Fig. 4, following steps can also be set: processor is controlled display device and shown test data, wherein, test data comprises one or more in the running status of response message that processor gets and tested electronic equipment.
In addition, processor can also be stored to storer by test data, to test data is reviewed and inquired about.
Finally, also it should be noted that, in this article, relational terms such as the first and second grades is only used for an entity or operation to separate with another entity or operational zone, and not necessarily requires or imply and between these entities or operation, have the relation of any this reality or sequentially.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thereby the process, method, article or the equipment that make to comprise a series of key elements not only comprise those key elements, but also comprise other key elements of clearly not listing, or be also included as the intrinsic key element of this process, method, article or equipment.The in the situation that of more restrictions not, the key element being limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment that comprises described key element and also have other identical element.
In this instructions, each embodiment adopts the mode of going forward one by one to describe, and each embodiment stresses is the difference with other embodiment, between each embodiment identical similar part mutually referring to.For the disclosed device of embodiment, because it corresponds to the method disclosed in Example, so description is fairly simple, relevant part partly illustrates referring to method.
Above-mentioned explanation to the disclosed embodiments, makes professional and technical personnel in the field can realize or use the present invention.To the multiple modification of these embodiment, will be apparent for those skilled in the art, General Principle as defined herein can, in the situation that not departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention will can not be restricted to these embodiment shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (9)
1. a test macro, is characterized in that, comprising:
Processor:
With the storer that described processor is connected, described memory stores has a plurality of test script files;
M the equipment under test interface being connected with described processor, tested electronic equipment can be connected with described equipment under test interface;
N the testing apparatus interface being connected with described processor, testing apparatus can be connected with described testing apparatus interface, and wherein, N and M are not less than 2 integer, and N is not less than M;
Described processor obtains the material code of tested electronic equipment, from described storer, obtain the test script file corresponding with described material code, resolve described test script file and generate action command, to n testing apparatus interface, send described action command, wherein, n is the integer that is not more than N, described n testing apparatus interface is connected with same testing apparatus, be connected with a tested electronic equipment respectively with described n the testing apparatus that testing apparatus interface is connected, described processor obtains the response message of described tested electronic equipment, according to described response message, determine the running status of described tested electronic equipment.
2. test macro according to claim 1, it is characterized in that, described test macro comprises M testing apparatus interface group, and each testing apparatus interface group comprises a plurality of testing apparatus interfaces, and a plurality of testing apparatus interfaces in each testing apparatus interface group are at least the communication interface of two types.
3. test macro according to claim 1 and 2, is characterized in that, described processor is monokaryon multiline procedure processor or polycaryon processor, and described processor sends described action command to described n testing apparatus interface concurrent.
4. test macro according to claim 3, it is characterized in that, also comprise the display device being connected with described processor, described display device is used for showing test data, and described test data comprises one or more in the running status of response message that described processor gets and described tested electronic equipment.
5. a method of testing, be applied to test macro, it is characterized in that, described test macro comprises processor, the storer being connected with described processor, M the equipment under test interface being connected with described processor, and N the testing apparatus interface being connected with described processor, wherein, N and M are not less than 2 integer, and N is not less than M, described method of testing comprises:
Described processor obtains the material code of tested electronic equipment;
Described processor obtains the test script file corresponding with described material code from described storer;
Described processor is resolved described test script file and is generated action command;
Described processor sends described action command to n testing apparatus interface, wherein, n is the integer that is not more than N, and described n testing apparatus interface is connected with same testing apparatus, is connected respectively with described n the testing apparatus that testing apparatus interface is connected with a tested electronic equipment;
Described processor obtains the response message of described tested electronic equipment, determines the running status of described tested electronic equipment according to described response message.
6. method of testing according to claim 5, is characterized in that, described processor obtains the material code of tested electronic equipment, comprising:
Obtain the serial number of tested electronic equipment;
The serial number that utilization prestores and the corresponding relation of material code, determine material code corresponding to described water stream number, and wherein, in described corresponding relation, the equipment of same type is corresponding to same material code.
7. detection method according to claim 6, it is characterized in that, in the situation that described processor is monokaryon multiline procedure processor or polycaryon processor, described processor, to the instruction of described n testing apparatus interface sending action, is specially: described processor is to the instruction of described n testing apparatus interface concurrent sending action.
8. method of testing according to claim 7, is characterized in that, in the situation that described test macro comprises the display device being connected with described processor, described method of testing also comprises:
Described processor is controlled described display device and is shown test data, and described test data comprises one or more in the running status of response message that described processor gets and described tested electronic equipment.
9. method of testing according to claim 8, is characterized in that, also comprises: described processor is stored to described storer by described test data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410308544.4A CN104090185A (en) | 2014-06-30 | 2014-06-30 | Testing system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410308544.4A CN104090185A (en) | 2014-06-30 | 2014-06-30 | Testing system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104090185A true CN104090185A (en) | 2014-10-08 |
Family
ID=51637916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410308544.4A Pending CN104090185A (en) | 2014-06-30 | 2014-06-30 | Testing system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104090185A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105486903A (en) * | 2015-11-23 | 2016-04-13 | 西门子数控（南京）有限公司 | Expansion board, detection system and detection method |
| CN105510744A (en) * | 2015-12-18 | 2016-04-20 | 杭州士兰微电子股份有限公司 | Programmer test device and test method |
| CN105577293A (en) * | 2014-10-13 | 2016-05-11 | 炬芯（珠海）科技有限公司 | Bluetooth equipment testing method, Bluetooth equipment testing device and Bluetooth equipment testing system |
| CN106055463A (en) * | 2016-05-25 | 2016-10-26 | 努比亚技术有限公司 | Testing device, system and method |
| CN107168832A (en) * | 2017-04-26 | 2017-09-15 | 中控智慧科技股份有限公司 | The method of automatic detection, device |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030212522A1 (en) * | 2002-05-09 | 2003-11-13 | Sutton Christopher K. | Externally controllable electronic test program |
| CN1574268A (en) * | 2003-05-30 | 2005-02-02 | 夏普株式会社 | Device test apparatus and test method |
| CN201075873Y (en) * | 2007-05-29 | 2008-06-18 | 华为技术有限公司 | Network appliance hardware indicators automatization testing system and equipment |
| CN101247293A (en) * | 2008-03-11 | 2008-08-20 | 福建星网锐捷网络有限公司 | Automatic test approach and system |
| CN101581761A (en) * | 2008-05-12 | 2009-11-18 | 中兴通讯股份有限公司 | System and method for realizing production test |
| CN102185738A (en) * | 2011-05-13 | 2011-09-14 | 迈普通信技术股份有限公司 | Communication equipment hardware host testing system and testing method |
| US20120131385A1 (en) * | 2010-11-19 | 2012-05-24 | Inventec Corporation | Testing mehtod for unit under test |
| CN102998613A (en) * | 2012-11-26 | 2013-03-27 | 李文海 | Test system and method capable of realizing parallel testing of circuit board |
-
2014
- 2014-06-30 CN CN201410308544.4A patent/CN104090185A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030212522A1 (en) * | 2002-05-09 | 2003-11-13 | Sutton Christopher K. | Externally controllable electronic test program |
| CN1574268A (en) * | 2003-05-30 | 2005-02-02 | 夏普株式会社 | Device test apparatus and test method |
| CN201075873Y (en) * | 2007-05-29 | 2008-06-18 | 华为技术有限公司 | Network appliance hardware indicators automatization testing system and equipment |
| CN101247293A (en) * | 2008-03-11 | 2008-08-20 | 福建星网锐捷网络有限公司 | Automatic test approach and system |
| CN101581761A (en) * | 2008-05-12 | 2009-11-18 | 中兴通讯股份有限公司 | System and method for realizing production test |
| US20120131385A1 (en) * | 2010-11-19 | 2012-05-24 | Inventec Corporation | Testing mehtod for unit under test |
| CN102185738A (en) * | 2011-05-13 | 2011-09-14 | 迈普通信技术股份有限公司 | Communication equipment hardware host testing system and testing method |
| CN102998613A (en) * | 2012-11-26 | 2013-03-27 | 李文海 | Test system and method capable of realizing parallel testing of circuit board |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105577293A (en) * | 2014-10-13 | 2016-05-11 | 炬芯（珠海）科技有限公司 | Bluetooth equipment testing method, Bluetooth equipment testing device and Bluetooth equipment testing system |
| CN105577293B (en) * | 2014-10-13 | 2018-10-30 | 炬芯（珠海）科技有限公司 | A kind of test method of bluetooth equipment, apparatus and system |
| CN105486903A (en) * | 2015-11-23 | 2016-04-13 | 西门子数控（南京）有限公司 | Expansion board, detection system and detection method |
| CN105486903B (en) * | 2015-11-23 | 2018-07-20 | 西门子数控（南京）有限公司 | Expansion board, detecting system and detection method |
| CN105510744A (en) * | 2015-12-18 | 2016-04-20 | 杭州士兰微电子股份有限公司 | Programmer test device and test method |
| CN106055463A (en) * | 2016-05-25 | 2016-10-26 | 努比亚技术有限公司 | Testing device, system and method |
| CN106055463B (en) * | 2016-05-25 | 2019-03-12 | 努比亚技术有限公司 | A kind of test device, system and method |
| CN107168832A (en) * | 2017-04-26 | 2017-09-15 | 中控智慧科技股份有限公司 | The method of automatic detection, device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104090185A (en) | Testing system and method | |
| CN104636254B (en) | Generate method and apparatus, method of testing and the equipment of test case | |
| CN105067933B (en) | General-purpose system and test method for electronics testability demonstration and assessment | |
| CN106708719A (en) | Business function testing method and apparatus | |
| CN103678093A (en) | Automatic testing framework and testing method | |
| CN110673585B (en) | Test method, test device and test system for train air conditioning system | |
| CN204291050U (en) | A kind of dispatching and monitoring information check system | |
| CN109800119A (en) | A kind of product function test method and device | |
| CN102541734A (en) | Method and device for testing pressure of equipment based on android platform | |
| WO2015149596A1 (en) | Iec61850-based communication simulation method for leakage current on-line monitoring device | |
| WO2015149595A1 (en) | Iec61850-based communication simulation method for insulation on-line monitoring device | |
| CN109298317A (en) | A kind of Intelligent test device and its test method of middle low-frequency channel | |
| CN109614321A (en) | For the continuous integrating of ATS software and the system of delivery | |
| CN107943008A (en) | Automated diagnostic test method based on VT systems | |
| CN104009882A (en) | Equivalent satellite power supply system testing method and system based on distributed architecture | |
| CN105446849A (en) | Product testing method and device | |
| CN105162664A (en) | Automatic platform testing method and system developed based on intermediate layers of instruments | |
| CN102238048B (en) | Protocol consistency testing method and system | |
| CN105717472A (en) | Electric energy quality monitoring terminal simulator | |
| CN104270269A (en) | Method for automatically configuring network cards | |
| CN104267284A (en) | One-click cooperative testing and detecting method and device for stability control system | |
| CN104237723A (en) | Low-frequency cable network testing system and method based on boundary scanning | |
| CN109313228A (en) | Electrical network check device | |
| CN105890810A (en) | Setting method for temperature detecting equipment and grain condition detecting system | |
| CN104880596A (en) | Volt-ampere vector wireless test method used for transformer substation system debugging |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20141008 |