CN104090023A - Apparatus for detecting electromagnetic-pulse eddy current of electrical-network metal material - Google Patents
Apparatus for detecting electromagnetic-pulse eddy current of electrical-network metal material Download PDFInfo
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- CN104090023A CN104090023A CN201410229769.0A CN201410229769A CN104090023A CN 104090023 A CN104090023 A CN 104090023A CN 201410229769 A CN201410229769 A CN 201410229769A CN 104090023 A CN104090023 A CN 104090023A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
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Abstract
The invention relates to an apparatus for detecting electromagnetic-pulse eddy current of an electrical-network metal material. The apparatus comprises a single-chip microcomputer which generates a periodic trigger pulse to an oscillator, the output of the oscillator is connected with a probe, a sine excitation signal generated by the oscillator is transmitted to the probe, the probe emits the sine excitation signal to a test piece and acquires a reflection signal of the test piece and outputs the reflection signal to a signal detecting circuit, the signal detecting circuit extracts a part sensitive to crack defects from the reflection signal of the test piece and transmits the part sensitive to crack defects to an amplifier which is connected with an A/D converting circuit, an amplified signal is converted into a data signal and the data signal is transmitted to the single-chip microcomputer, the single-chip microcomputer performs processing and determination on the input signal and drives a buzzer, and the relative size of a crack defect is displayed on an LED display. The apparatus is used to detect cracks on metal surface and near surface and is simple in structure, high in sensitivity and portable.
Description
Technical field
The invention belongs to electric system technical field of nondestructive testing, especially a kind of electrical network metal material electromagnetic pulse eddy current testing device.
Background technology
Electrical network metal material is complex-shaped, traditional surface inspecting method as magnetic, infiltration can not be completely applicable.EDDY CURRENT is development in recent years a kind of Dynamic Non-Destruction Measurement faster, effects on surface opening crackle is very sensitive, under the rugged surroundings such as surface coating, rough surface, humidity, also can carry out testing, there is simple in structure, highly sensitive, the advantage such as frequency response characteristic is good and test circuit is simple, be specially adapted to the testing of fatigue crack and the surface stress crackle of complex-shaped electrical network metal material.The broadband properties that impulse eddy current has makes it be very suitable for the crack detection of metal deep layer and the pulse characteristic of excitation makes eddy current in metal, exist a very high peak value to be easy to observe and measure.And pulse characteristic can be carried out the transient analysis that traditional EDDY CURRENT can not be carried out.Electromagnetic pulse eddy current can be realized the surface of material and detect, and does not have the special purpose device for electrical network metal material electromagnetic pulse EDDY CURRENT at present, need to carry out instrument trial-production.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of electrical network metal material electromagnetic pulse eddy current testing device is provided.
The present invention solves its technical matters and takes following technical scheme to realize:
A kind of electrical network metal material electromagnetic pulse eddy current testing device, comprise single-chip microcomputer, single-chip microcomputer produces periodic triggers pulse, trigger pulse is input to oscillator, the output of oscillator is connected with probe, the sinusoidal excitation signal that oscillator is produced is transferred on the drive coil of probe, drive coil is placed on detected test specimen, to test specimen transmitting sinusoidal excitation signal, the magnetic test coil of probe gathers the reflected signal of test specimen, the test specimen reflected signal of collection is exported to signal detection circuit by magnetic test coil, signal detection circuit extracts the part to crack defect sensitivity and flows to amplifier from test specimen reflected signal, amplifier is connected with A/D change-over circuit, after converting the signal after amplifying to digital signal, flow to single-chip microcomputer, single-chip microcomputer is processed after judgement input signal, drive hummer, and by the relative size of IED display demonstration crack defect.
And, described probe comprises the drive coil being wrapped on U-shaped magnet, open centre point place at U-shaped magnet is mounted with the bar magnet vertical with U-shaped magnet plane, on bar magnet, be wound with magnetic test coil, described drive coil is mutually vertical with magnetic test coil, and the two ends of drive coil are the excitation end corresponding with test specimen position, the variation of magnetic test coil inductive loop counter magnetic field, and exported by the output terminal of magnetic test coil, be converted into electric signal by hardware circuit.
And described oscillator is a LC oscillatory circuit that produces pumping signal.
And, described signal detection circuit comprises amplifying circuit, the output of amplifying circuit is connected with the filtering circuit that is used for eliminating various interference, filtering circuit is connected with signal selecting circuit, signal selecting circuit is connected with peak value computing circuit, peak value computing circuit is followed the tracks of the current signal collecting constantly, the peak value of current signal is selected, and converted to DC signal output to A/D change-over circuit.
Wherein, the noise jamming when power frequency interference that filtering circuit front end employing Hi-pass filter causes for filter out power harmonic wave and mobile probe, the second level adopts the bandpass filter that is subject to signal selecting circuit control.
Wherein, signal selecting circuit is made up of capacitance matrix and potentiometer.
Wherein, the concrete circuit being formed by sampling holder and comparer that adopts of peak value computing circuit.
And, described single-chip microcomputer specifically adopts the single-chip microcomputer of MCS8051 model, the concrete model adopting of described A/D change-over circuit is AD14433, single-chip microcomputer receives the signal of A/D change-over circuit output by P0 interface, the P2 interface of single-chip microcomputer is connected with the switch control interface of hummer, and the P1 interface of single-chip microcomputer is connected with the driving interface of LED display.
Advantage of the present invention and good effect are:
Plan of the present invention designs and produces a kind of simple in structure, highly sensitive and portable metal surface and nearly surface crack testing device, the ultimate principle of this application of installation electromagnetic pulse eddy current test, adopt magnetic material to make a kind of meticulous eddy current sensor, extract faint Signal of Cracks for front end, background application single chip machine controlling circuit, process the filtering of extracting, amplify, the signals such as A/D conversion, finally by Micro Controller Unit (MCU) driving sound, light is reported to the police, in the time finding defect, the hummer alarm of sounding, and light the LED of different numbers simultaneously, show the relative depth of crackle.
Brief description of the drawings
Fig. 1 is the pie graph of apparatus of the present invention;
Fig. 2 is the structure principle chart of popping one's head in apparatus of the present invention;
Fig. 3 is the circuit theory diagrams of oscillator of the present invention;
Fig. 4 is the block diagram of signal detection circuit in the present invention;
Fig. 5 is the schematic diagram of peak value computing circuit in signal detection circuit of the present invention;
Fig. 6 is the catenation principle figure of single-chip microcomputer and A/D convertor circuit in the present invention;
Fig. 7 is Single-chip Controlling schematic diagram in the present invention.
Embodiment
Below in conjunction with accompanying drawing, the embodiment of the present invention is further described, following examples are descriptive, are not determinate, can not limit protection scope of the present invention with this.
A kind of electrical network metal material electromagnetic pulse eddy current testing device, comprise single-chip microcomputer, single-chip microcomputer produces periodic triggers pulse, trigger pulse is input to oscillator, the output of oscillator is connected with probe, the sinusoidal excitation signal that oscillator is produced is transferred on the drive coil of probe, drive coil is placed on detected test specimen, to test specimen transmitting sinusoidal excitation signal, the magnetic test coil of probe gathers the reflected signal of test specimen, the test specimen reflected signal of collection is exported to signal detection circuit by magnetic test coil, signal detection circuit extracts the part to crack defect sensitivity and flows to amplifier from test specimen reflected signal, amplifier is connected with A/D change-over circuit, after converting the signal after amplifying to digital signal, flow to single-chip microcomputer, single-chip microcomputer is processed after judgement input signal, drive hummer, and by the relative size of IED display demonstration crack defect.
In specific embodiment of the invention, as shown in Figure 2, described probe comprises the drive coil 1 being wrapped on U-shaped magnet 2, open centre point place at U-shaped magnet is mounted with the bar magnet 4 vertical with U-shaped magnet plane, on bar magnet, be wound with magnetic test coil 3, described drive coil is mutually vertical with magnetic test coil, the two ends of drive coil are the excitation end corresponding with test specimen position, on drive coil, pass to the sine wave of certain frequency, in the time that probe is mobile along test specimen surface, test specimen surface can produce certain distribution and big or small eddy current under action of alternating magnetic field, in the time having crackle, can there is corresponding change in Eddy Distribution and size, the variation of magnetic test coil inductive loop counter magnetic field, and exported by the output terminal of magnetic test coil, be converted into electric signal by hardware circuit, can reflect the situation of defect by situation of change.
In specific embodiment of the invention, as shown in Figure 3, described oscillator is that pumping signal produces circuit, this circuit comprises an on-off circuit being made up of resistance R 2 and PNP triode, and be connected with on-off circuit in parallel with capacitor C 1 and drive coil L1 by resistance R 1 after the LC oscillatory circuit that is composed in series with diode D1, in figure, L2 is magnetic test coil, single-chip microcomputer produces circuit generation pumping signal by this pumping signal after producing periodic triggers pulse, pumping signal is an approximate sine wave, the advantage of LC oscillatory circuit is simple in structure, easily starting of oscillation, frequency is convenient to adjust.
In specific embodiment of the invention, described signal detection circuit comprises and faint voltage signal is amplified to to be applicable to be value (about 2V) so that the amplifying circuit of rear class processing, and is used for eliminating the filtering circuit of various interference.Filtering circuit is connected with signal selecting circuit, and signal selecting circuit carrys out gating desired signal by the band passband rate of controlling wave filter, controls the output frequency of oscillator simultaneously, and its controlled frequency scope is: 100Hz---6MHz.Signal selecting circuit is connected with peak value computing circuit, and peak value computing circuit is followed the tracks of the current signal collecting constantly, the peak value of current signal is selected, and converted to DC signal output to A/D change-over circuit.
Wherein, noise jamming when the power frequency interference that filtering circuit front end employing Hi-pass filter causes for filter out power harmonic wave and mobile probe, the second level adopts bandpass filter to be subject to signal selecting circuit control, for the frequency of selecting different length of penetration defects to react, only allow gating signal to pass through, the logical frequency-tuning range of its band is 100Hz---6MHz, and corresponding length of penetration is 0-9.99mm.
Wherein, signal selecting circuit is made up of capacitance matrix and potentiometer, adopt specific matching circuit to process, by changing the band passband rate that changes wave filter with the filter capacitor parameter value of filter match and potentiometer resistance value, select the multi-form frequency component signal matching with crackle length of penetration and multi-form damage, thereby can select different frequencies according to different lengths of penetration, filter out the frequency adapting with this degree of depth and suppress other interfering frequencies, can effectively detect different depth defect, multi-form damage thus.
Wherein, the concrete employing of peak value computing circuit is made up of sampling holder and comparer, and as shown in Figure 5, in the time of Vi>Vo, A1 is output as high level, diode V
dconducting is to capacitor C
apcharge and control A2 sampling, when after peak value, Vi<Vo, A1 is output as low level, diode V
doppositely cut-off, capacitor C
apcontinue to keep voltage, and continuation of the journey makes A2 now continue output Vo to A2, that is, peak value is kept and converts to direct current signal, gives AD and samples, and start the signal of A/D using this as single-chip microcomputer, starts sampling.Peak value sampling circuit has two functions: sampling and maintenance.The sampled value retention time, according to output frequency Lookup protocol.The eddy current device that we develop, due to generally held standard signal at 10kHz with once, frequency is lower, therefore A1, A2 adopt LF398 such peak value sampling circuit.Its effect is better.
In specific embodiment of the invention, described amplifying circuit specifically adopts the amplifying circuit of differential form, and this amplifying circuit is that 10-200mV feeble signal of magnetic test coil output is amplified to 1-2V amplitude.
In specific embodiment of the invention, as shown in Figure 6, described single-chip microcomputer specifically adopts the single-chip microcomputer of MCS8051 model, the concrete model adopting of described A/D change-over circuit is AD14433, single-chip microcomputer receives the signal of A/D change-over circuit output by P0 interface, the P2 interface of single-chip microcomputer is connected with the switch control interface of hummer, trigger pip with different frequency rhythm impulse form drives buzzer warning, the P1 interface of single-chip microcomputer is connected with the driving interface of LED display, shows length of penetration and test duration with digital shape in formula LED display.
The principles of signal processing of single-chip microcomputer
As shown in Figure 7, described single-chip microcomputer to the processing procedure of input signal is:
(1) control signal is again as the external interrupt input signal of single-chip microcomputer, and down trigger mode is edging trigger mode, starts the signal of A/D using this as single-chip microcomputer, starts sampling.With an I/O mouth of single-chip microcomputer, as the control mouth line of sampling holder, before look-at-me is come, this control mouth line is set to the required level of sampling (being high level to LF398), after look-at-me is come, be set to and keep level (being low level to LF398), and start A/D and start sampled data.
(2) single-chip microcomputer obtains digital voltage value from A/D converter AD14433, by the length of penetration that is converted to of its linearity, and this length of penetration was deposited in RAM6264 storer by measurement point and time, in liquid crystal display, show length of penetration and this Measuring Time in this measurement moment of this measurement point simultaneously.In the time that the crackle detecting or damage exceed setting value, hummer sends rapid chimes of doom.
After measurement completes, leave not displacement data in the same time of each measurement point in RAM6264 in, can press as required measurement point by mini-printer printout, also can by RS232 serial communication interface by each measurement point not displacement data in the same time deliver in PC computing machine and process again.
Claims (5)
1. an electrical network metal material electromagnetic pulse eddy current testing device, it is characterized in that: comprise single-chip microcomputer, single-chip microcomputer produces periodic triggers pulse, trigger pulse is input to oscillator, the output of oscillator is connected with probe, the sinusoidal excitation signal that oscillator is produced is transferred on the drive coil of probe, drive coil is placed on detected test specimen, to test specimen transmitting sinusoidal excitation signal, the magnetic test coil of probe gathers the reflected signal of test specimen, the test specimen reflected signal of collection is exported to signal detection circuit by magnetic test coil, signal detection circuit extracts the part to crack defect sensitivity and flows to amplifier from test specimen reflected signal, amplifier is connected with A/D change-over circuit, after converting the signal after amplifying to digital signal, flow to single-chip microcomputer, single-chip microcomputer is processed after judgement input signal, drive hummer, and by the relative size of IED display demonstration crack defect.
2. electrical network metal material electromagnetic pulse eddy current testing device according to claim 1, it is characterized in that: described probe comprises the drive coil being wrapped on U-shaped magnet, open centre point place at U-shaped magnet is mounted with the bar magnet vertical with U-shaped magnet plane, on bar magnet, be wound with magnetic test coil, described drive coil is mutually vertical with magnetic test coil, the two ends of drive coil are the excitation end corresponding with test specimen position, the variation of magnetic test coil inductive loop counter magnetic field, and exported by the output terminal of magnetic test coil, be converted into electric signal by hardware circuit.
3. electrical network metal material electromagnetic pulse eddy current testing device according to claim 1, is characterized in that: described oscillator is a LC oscillatory circuit that produces pumping signal.
4. electrical network metal material electromagnetic pulse eddy current testing device according to claim 1, it is characterized in that: described signal detection circuit comprises amplifying circuit, the output of amplifying circuit is connected with the filtering circuit that is used for eliminating various interference, filtering circuit is connected with signal selecting circuit, signal selecting circuit is connected with peak value computing circuit, peak value computing circuit is followed the tracks of the current signal collecting constantly, the peak value of current signal is selected, and convert DC signal output to A/D change-over circuit
Wherein, the noise jamming when power frequency interference that filtering circuit front end employing Hi-pass filter causes for filter out power harmonic wave and mobile probe, the second level adopts the bandpass filter that is subject to signal selecting circuit control,
Wherein, signal selecting circuit is made up of capacitance matrix and potentiometer,
Wherein, the concrete circuit being formed by sampling holder and comparer that adopts of peak value computing circuit.
5. electrical network metal material electromagnetic pulse eddy current testing device according to claim 1, it is characterized in that: described single-chip microcomputer specifically adopts the single-chip microcomputer of MCS8051 model, the concrete model adopting of described A/D change-over circuit is AD14433, single-chip microcomputer receives the signal of A/D change-over circuit output by P0 interface, the P2 interface of single-chip microcomputer is connected with the switch control interface of hummer, and the P1 interface of single-chip microcomputer is connected with the driving interface of LED display.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410229769.0A CN104090023A (en) | 2014-05-28 | 2014-05-28 | Apparatus for detecting electromagnetic-pulse eddy current of electrical-network metal material |
| PCT/CN2014/084597 WO2015180266A1 (en) | 2014-05-28 | 2014-08-18 | Electromagnetic pulsed eddy current detection device for power grid metal material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410229769.0A CN104090023A (en) | 2014-05-28 | 2014-05-28 | Apparatus for detecting electromagnetic-pulse eddy current of electrical-network metal material |
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| CN104090023A true CN104090023A (en) | 2014-10-08 |
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| CN201410229769.0A Pending CN104090023A (en) | 2014-05-28 | 2014-05-28 | Apparatus for detecting electromagnetic-pulse eddy current of electrical-network metal material |
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| WO (1) | WO2015180266A1 (en) |
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| CN104391035A (en) * | 2014-11-17 | 2015-03-04 | 合肥华凌股份有限公司 | Defect detection device for evaporator pipe fitting and production system of pipe winding type evaporator |
| CN104535644A (en) * | 2014-12-24 | 2015-04-22 | 钢研纳克检测技术有限公司 | Eddy current probe for detecting multi-direction defects on thin steel plate surface |
| CN106645389A (en) * | 2015-11-04 | 2017-05-10 | 江苏爱福特科技开发有限公司 | Hydraulic support top beam pin cracks detection apparatus |
| CN106841380A (en) * | 2017-01-25 | 2017-06-13 | 哈尔滨理工大学 | For miniature synchronization damage method and device are visited every the top layer of magneto |
| CN107132270A (en) * | 2017-06-27 | 2017-09-05 | 华东交通大学 | A kind of defectoscope |
| CN107300586A (en) * | 2017-07-12 | 2017-10-27 | 辽宁红阳检测有限公司 | A kind of full information recording impulse eddy current flaw detec |
| CN108760875A (en) * | 2018-05-18 | 2018-11-06 | 广东省特种设备检测研究院珠海检测院 | A kind of portable tape clad stress metal pipeline-weld positioning device and localization method |
| CN111443128A (en) * | 2020-04-26 | 2020-07-24 | 海南师范大学 | Variable-depth metal crack detection system |
| CN112611800A (en) * | 2020-11-16 | 2021-04-06 | 江苏安泰安全技术有限公司 | Rapid scanning method and system for detecting microcracks on surface of pressure equipment |
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| CN104391035A (en) * | 2014-11-17 | 2015-03-04 | 合肥华凌股份有限公司 | Defect detection device for evaporator pipe fitting and production system of pipe winding type evaporator |
| CN104535644A (en) * | 2014-12-24 | 2015-04-22 | 钢研纳克检测技术有限公司 | Eddy current probe for detecting multi-direction defects on thin steel plate surface |
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| CN106841380B (en) * | 2017-01-25 | 2020-04-28 | 哈尔滨理工大学 | Surface layer damage detection method and device for micro synchronous magnetic isolation motor |
| CN107132270A (en) * | 2017-06-27 | 2017-09-05 | 华东交通大学 | A kind of defectoscope |
| CN107300586A (en) * | 2017-07-12 | 2017-10-27 | 辽宁红阳检测有限公司 | A kind of full information recording impulse eddy current flaw detec |
| CN108760875A (en) * | 2018-05-18 | 2018-11-06 | 广东省特种设备检测研究院珠海检测院 | A kind of portable tape clad stress metal pipeline-weld positioning device and localization method |
| CN111443128A (en) * | 2020-04-26 | 2020-07-24 | 海南师范大学 | Variable-depth metal crack detection system |
| CN112611800A (en) * | 2020-11-16 | 2021-04-06 | 江苏安泰安全技术有限公司 | Rapid scanning method and system for detecting microcracks on surface of pressure equipment |
| CN112782271A (en) * | 2020-12-29 | 2021-05-11 | 沈阳工业大学 | Crack detection device and method based on balanced electromagnetic technology |
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| WO2015180266A1 (en) | 2015-12-03 |
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Address after: 300010 Tianjin city Hebei District Wujing Road No. 39 Applicant after: State Grid Corporation of China Applicant after: State Grid Tianjin Electric Power Company Address before: 100031 Xicheng District West Chang'an Avenue, No. 86, Beijing Applicant before: State Grid Corporation of China Applicant before: State Grid Tianjin Electric Power Company |
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Application publication date: 20141008 |