CN104062537A - Multi-core cable terminal crimping quality rapid detection apparatus and detection method - Google Patents

Abstract

The invention discloses a multi-core cable terminal crimping quality rapid detection apparatus and a detection method. The detection apparatus comprises a detection speed control circuit. The detection speed control circuit is connected with a detection sequential control circuit; the detection sequential control circuit is connected with an open circuit and misplacement detection circuit; and the open circuit and misplacement detection circuit is connected with a fault determination and warning circuit. The beneficial effect of the detection apparatus is that the detection apparatus can carry out automatic rapid detection on the faults of open circuit, misplacement, crimping resistance surpassing the standard and the like which are caused after the crimping of the terminals of a multi-core cable with more than eight cores.

Description

Multicore cable terminal compression joint quality device for fast detecting and detection method

Technical field

The present invention relates to a kind of multicore cable terminal compression joint quality device for fast detecting and detection method.

Background technology

At present, the pressure size of domestic existing cable terminal crimp quality Main Basis crimp head is controlled, and by detected pressures, judges terminal compression joint quality.For high current power cable terminal crimp quality, detect, adopt optical image technology to analyze terminal after crimping and the cross-section image at line junction surface carries out manual analysis judgement.The cable terminal crimp quality that these quality determining methods are suitable for 1～4 core thick line footpath detects.And for the detection of the cable for digital communication terminal compression joint quality of 8～128 cores, adopt pressure detection, cross-section image to detect to carry out efficiency very low, and due to wire diameter in cable for digital communication very thin (0.4mm or 0.5mm), it is larger that pressure detection and cross-section image detect error., for the cable for digital communication terminal compression joint quality problems of 32 more core 0.4mm wire diameters of consumption, analyze and research for this reason, designed and developed a kind of multicore cable terminal compression joint quality rapid detection apparatus.

According to national automobile industry standard < < QC/T29106-2004 low tension cables for automobiles bundle technical conditions > > regulation terminal compression joint site voltage, index is fallen: electricity Ya Jiang≤3mV (sectional area of wire 0.5mm ², test current 5A) ,≤5mV (sectional area of wire 0.75mm ², test current 10A) He≤8mV (sectional area of wire 1.0mm ², test current 15A) etc. 7 kinds of situations, can estimate telecommunication cable terminal compression joint site voltage Jiang Ying≤2mV (sectional area of wire 0.125mm ², wire diameter 0.4mm, test current 0.2A), be equivalent to press connecting resistance≤1.5m Ω.

In GJB < < GJB1216-91 electric connector contact general specification > >, stipulate, touch voltage Jiang≤the 54mV of A type silver-plated copper wire (28 wire gauge wire diameter 0.376mm, test current 1.5A), be equivalent to Jie electric shock Zu≤36m Ω.

The resistance calculated value of the copper conductor of wire diameter 0.4mm is 139.33m Ω/m.Due to the impact of the technical factor such as copper material purity, wire diameter consistance, the Standard General regulation Wei≤148m Ω/m that dispatches from the factory of telecommunication cable producer.

Summary of the invention

Object of the present invention is exactly in order to address the above problem, a kind of multicore cable terminal compression joint quality device for fast detecting and detection method are provided, and it has advantages of can to the open circuit after multicore cable crimp type terminals more than 8 heart yearns, dislocation, crimping resistance be overproof etc., fault be carried out automatic fast detecting.

To achieve these goals, the present invention adopts following technical scheme:

A kind of multicore cable terminal compression joint quality device for fast detecting, comprise: detection speed control circuit, described detection speed control circuit is connected with detection sequential control circuit, described detection sequential control circuit is connected with open circuit dislocation testing circuit, and described open circuit dislocation testing circuit is connected with fault judgement warning circuit.

Described detection speed control circuit comprises: 555 IC circuit ₇, resistance R ₁₀, variable resistor R ₁₁, capacitor C ₆and capacitor C ₇;

555 IC circuit ₇vCC termination power, 555 IC circuit ₇v _cOend passes through capacitor C ₇ground connection, 555 IC circuit ₇d _iSCend respectively with resistance R ₁₀with variable resistor R ₁₁one end connect, resistance R ₁₀another termination power, variable resistor R ₁₁the other end respectively with capacitor C ₆one end, 555 IC circuit ₇tR end and 555 IC circuit ₇tH end connect, capacitor C ₆other end ground connection, 555 IC circuit ₇eND end ground connection;

555 IC circuit ₇in R _dend judges the Sheffer stroke gate IC in warning circuit with fault ₂₄output terminal connect, 555 IC circuit ₇oUT end with detect sequential control circuit in the CP of d type flip flop hold and be connected, synchronous clock control signal is provided.

Described detection sequential control circuit comprises: during detection, the crimp type terminal of the detected cable other end inserts in cable socket Connecter-B and forms firmly and connect, and each heart yearn in 32 heart yearns of cable is by triode T _biwith d type flip flop IC _30iconnect d type flip flop IC _30iwith input end 1D and Sheffer stroke gate IC ₂₁output terminal connect, described Sheffer stroke gate IC ₂₁input end T _1ewith triode T in fault judgement warning circuit ₁emitter T _1econnect described triode T _bibase stage pass through resistance R _biwith d type flip flop IC _30ioutput terminal connect, described triode T _bibase stage also pass through resistance R _biwith diode D _bipositive pole connect, diode D _binegative pole and fault judgement warning circuit in triode T ₁base stage T _1bconnect described diode D _bipositive pole with pass through resistance R _biwith triode T _bibase stage connect, described triode T _bicollector by cable socket Connecter-B, be connected with each heart yearn of cable, described triode T _biemitter pass through resistance R _eibe connected with ground; The 32nd triode T _b32collector resistance R also ₃with light emitting diode D ₁negative pole connect, light emitting diode D ₁positive pole connect power supply V _cc; Described d type flip flop IC ₃₀₁output terminal and d type flip flop IC ₃₀₂input end 1D connects, and the non-output terminal of 32 d type flip flops connects together, and the pulse control end CP of 32 d type flip flops links together and is connected with the output terminal CP of IC7 in detection speed control circuit.

Described open circuit dislocation testing circuit comprises: constant current source I _s, described constant current source I _sone end and power supply V _cconnect described constant current source constant current source I _sother one end by slide rheostat R ₁be connected with 32 heart yearns, described each with slide rheostat R ₁on the heart yearn connecting, be all provided with successively resistance R _ci, and light emitting diode D _ci, described light emitting diode D _cipositive pole and resistance R _ciconnect described light emitting diode D _cinegative pole all by connect successively with door IC _1iwith light emitting diode D _oiwith resistance R ₂one end connect, described resistance R ₂other one end and fault judgement warning circuit in triode T ₂base stage T _2bend links together, to control triode T ₂conducting or cut-off, described light emitting diode D _oipositive pole with door IC _1ioutput terminal connect, described and a door IC _1itwo input ends respectively with Q _iwith light emitting diode D _cinegative pole connect, wherein, i=1,2 ..., 32; During detection, the crimp type terminal of detected cable one end inserts in cable socket Connecter-A and forms firmly and connect.

Described fault judgement warning circuit comprises: triode T ₁, triode T ₂, triode T ₃, resistance R ₄, resistance R ₅, resistance R ₆, resistance R ₇, capacitor C ₁, capacitor C ₂, hummer HA, Sheffer stroke gate IC ₂₂, Sheffer stroke gate IC ₂₃, Sheffer stroke gate IC ₂₄; Described triode T ₁base stage T _1bwith diode D in detection sequential control circuit _oinegative pole T _1bconnect described triode T ₁emitter T _1ewith Sheffer stroke gate IC in detection sequential control circuit ₂₁input end T _1econnect described triode T ₁collector and power supply V _ccconnect described triode T ₁emitter T _1ealso pass through resistance R ₇ground connection;

Triode T ₂base stage T _2bend passes through capacitor C ₂ground connection, triode T ₂base stage T _2bend also with open circuit dislocation testing circuit in resistance R ₂t _2bend connects; Triode T ₂collector connect power supply V _cc; Triode T ₂emitter pass through resistance R ₆ground connection; Resistance R ₅first end meet respectively triode T ₂emitter and Sheffer stroke gate IC ₂₂two input ends; Resistance R ₅other one end connecting triode T ₃base stage; One end of hummer HA connects power supply V _cc; Other one end connecting triode T of hummer HA ₃collector, triode T ₃grounded emitter; Resistance R ₄a termination power V _cc, resistance R ₄the other end pass through capacitor C ₁ground connection;

Described Sheffer stroke gate IC ₂₂two input end parallel connections after be connected with the emitter of triode T2, Sheffer stroke gate IC ₂₂output terminal and Sheffer stroke gate IC ₂₃input end connect, Sheffer stroke gate IC ₂₃another input end and Sheffer stroke gate IC ₂₄output terminal connect, Sheffer stroke gate IC ₂₃output terminal and Sheffer stroke gate IC ₂₄input end connect, Sheffer stroke gate IC ₂₄another input end respectively and resistance R ₄, capacitor C ₁connect; Sheffer stroke gate IC ₂₄output terminal R _dwith IC in detection speed control circuit ₇r _dconnect.

A detection method for multicore cable terminal compression joint quality device for fast detecting, comprises the steps:

Step (1a): two corresponding insertions in test cable socket Connecter-A and Connecter-B of terminals while by cable, switch on power;

Step (2a): detect sequential control circuit and receive first CP pulse;

Step (3a): the d type flip flop IC that detects sequential control circuit ₃₀₁q ₁end is high level; Enter step (4a) and step (13a);

Step (4a): open circuit dislocation testing circuit judge cable and terminal whether conducting or equivalent resistance overproof, if not conducting or the overproof step (5a) that just enters of equivalent resistance; If conducting equivalent resistance are less than standard value and just enter step (14a);

Step (5a): the IC of open circuit dislocation testing circuit ₁₀₁q ₁end is high level; Enter step (6a);

Step (6a): the triode T that detects sequential control circuit ₁cut-off;

Step (7a): the IC of open circuit dislocation testing circuit ₁₀₁output high level;

Step (8a): the light emitting diode D of open circuit dislocation testing circuit _o1the luminous alarm of conducting;

Step (9a): the triode T of fault judgement warning circuit ₂saturation conduction;

Step (10a): the triode T of fault judgement warning circuit ₃conducting is amplified, and hummer HA sends alarm sound;

The IC of step (11a) fault judgement warning circuit ₂₂output low level, IC ₂₄output low level;

IC in step (12a) detection speed control circuit ₇the CP signal of output is 0V;

Step (13a): detect sequential control circuit CP pulse termination, the 1st heart yearn test finishes;

Step (14a): the triode T that detects sequential control circuit ₁saturation conduction;

Step (15a): the IC of open circuit dislocation testing circuit ₁₀₁a ₁end is low level;

Step (16a): the light emitting diode D of open circuit dislocation testing circuit _o1not conducting;

Step (17a): the triode T of fault judgement warning circuit ₂cut-off;

Step (18a): the IC of fault judgement warning circuit ₂₂output high level, IC ₂₄output high level;

Step (19a): IC in detection speed control circuit ₇normal work, sends the 2nd CP pulse signal to detecting sequential control circuit;

Step (20a): the 1st heart yearn test finishes, and automatically returns to step (2a) and detects the 2nd heart yearn;

The automatic repeating step of detection (2a) of 2-32 heart yearn is to step (20a);

When detecting the 32nd heart yearn conducting, detect the luminous alarm of light emitting diode D1 in sequential control circuit, 32 heart yearns of prompting cable all detect end.

Beneficial effect of the present invention:

1, can to the open circuit after multicore cable crimp type terminals more than 8 heart yearns, dislocation, crimping resistance be overproof etc., fault be carried out automatic fast detecting.

2, can between 0.05～0.5 second, set the detection time of each heart yearn.

While 3, finding quality fault in testing process, stop detecting and sound and report to the police and photoelectric display alarm, photoelectric display alarm is corresponding with the heart yearn that quality fault occurs.

Be applicable to cable terminal crimp quality relatively stable, to detecting in the not high situation of heart yearn crimping equivalent resistance accuracy requirement, relatively detection speed is fast.

Accompanying drawing explanation

Fig. 1 is the equivalent resistance of test loop;

Fig. 2 is testing circuit structural drawing;

Fig. 3 is open circuit dislocation testing circuit schematic diagram;

Fig. 4 is detection speed control circuit;

Fig. 5 is for detecting sequential control circuit schematic diagram;

Fig. 6 is fault judgement warning circuit schematic diagram;

Fig. 7 is fast detecting process flow diagram;

Wherein, 1, detection speed control circuit, 2, detect sequential control circuit, 3, open circuit dislocation testing circuit, 4, fault judgement warning circuit.

Embodiment

Below in conjunction with accompanying drawing and embodiment, the invention will be further described.

As shown in Figure 2, a kind of multicore cable terminal compression joint quality detection device, comprise: detection speed control circuit 1, described detection speed control circuit 1 is connected with detection sequential control circuit 2, described detection sequential control circuit 2 is connected with open circuit dislocation testing circuit 3, and described open circuit dislocation testing circuit 3 is connected with fault judgement warning circuit 4.

As shown in Figure 4, described detection speed control circuit 1 comprises: 555 IC circuit ₇, resistance R ₁₀, variable resistor R ₁₁, capacitor C ₆and capacitor C ₇;

555 IC circuit ₇vCC termination power, 555 IC circuit ₇v _cOend passes through capacitor C ₇ground connection, 555 IC circuit ₇d _iSCend respectively with resistance R ₁₀with variable resistor R ₁₁one end connect, resistance R ₁₀another termination power, variable resistor R ₁₁the other end respectively with capacitor C ₆one end, 555 IC circuit ₇tR end and 555 IC circuit ₇tH end connect, capacitor C ₆other end ground connection, 555 IC circuit ₇eND end ground connection;

555 IC circuit ₇in R _dend judges the Sheffer stroke gate IC in warning circuit 4 with fault ₂₄output terminal connect, 555 IC circuit ₇oUT end with detect sequential control circuit 2 in the CP of d type flip flop hold and be connected, synchronous clock control signal is provided.

As shown in Figure 5, described detection sequential control circuit 2 comprises: during detection, the crimp type terminal of the detected cable other end inserts in cable socket Connecter-B and forms firmly and connect, and each heart yearn in 32 heart yearns of cable is by triode T _biwith d type flip flop IC _30iconnect d type flip flop IC _30iwith input end 1D and Sheffer stroke gate IC ₂₁output terminal connect, described Sheffer stroke gate IC ₂₁input end T _1ewith triode T in fault judgement warning circuit 4 ₁emitter T _1econnect described triode T _bibase stage pass through resistance R _biwith d type flip flop IC _30ioutput terminal connect, described triode T _bibase stage also pass through resistance R _biwith diode D _bipositive pole connect, diode D _binegative pole and fault judgement warning circuit 4 in triode T ₁base stage T _1bconnect described diode D _bipositive pole with pass through resistance R _biwith triode T _bibase stage connect, described triode T _bicollector by cable socket Connecter-B, be connected with each heart yearn of cable, described triode T _biemitter pass through resistance R _eibe connected with ground; The 32nd triode T _b32collector resistance R also ₃with light emitting diode D ₁negative pole connect, light emitting diode D ₁positive pole connect power supply V _cc; Described d type flip flop IC ₃₀₁output terminal and d type flip flop IC ₃₀₂input end 1D connects, and the non-output terminal of 32 d type flip flops connects together, and the pulse control end CP of 32 d type flip flops links together and is connected with the output terminal CP of IC7 in detection speed control circuit 1.

As shown in Figure 3, described open circuit dislocation testing circuit 3 comprises: constant current source I _s, described constant current source I _sone end and power supply V _cconnect described constant current source constant current source I _sother one end by slide rheostat R ₁be connected with 32 heart yearns, described each with slide rheostat R ₁on the heart yearn connecting, be all provided with successively resistance R _ci, and light emitting diode D _ci, described light emitting diode D _cipositive pole and resistance R _ciconnect described light emitting diode D _cinegative pole all by connect successively with door IC _1iwith light emitting diode D _oiwith resistance R ₂one end connect, described resistance R ₂other one end and fault judgement warning circuit 4 in triode T ₂base stage T _2bend links together, to control triode T ₂conducting or cut-off, described light emitting diode D _oipositive pole with door IC _1ioutput terminal connect, described and a door IC _1itwo input ends respectively with Q _iwith light emitting diode D _cinegative pole connect, wherein, i=1,2 ..., 32; During detection, the crimp type terminal of detected cable one end inserts in cable socket Connecter-A and forms firmly and connect.

As shown in Figure 6, described fault judgement warning circuit 4 comprises: triode T ₁, triode T ₂, triode T ₃, resistance R ₄, resistance R ₅, resistance R ₆, resistance R ₇, capacitor C ₁, capacitor C ₂, hummer HA, Sheffer stroke gate IC ₂₂, Sheffer stroke gate IC ₂₃, Sheffer stroke gate IC ₂₄; Described triode T ₁base stage T _1bwith diode D in detection sequential control circuit 2 _oinegative pole T _1bconnect described triode T ₁emitter T _1ewith Sheffer stroke gate IC in detection sequential control circuit 2 ₂₁input end T _1econnect described triode T ₁collector and power supply V _ccconnect described triode T ₁emitter T _1ealso pass through resistance R ₇ground connection;

Triode T ₂base stage T _2bend passes through capacitor C ₂ground connection, triode T ₂base stage T _2bend also with open circuit dislocation testing circuit 3 in resistance R ₂t _2bend connects; Triode T ₂collector connect power supply V _cc; Triode T ₂emitter pass through resistance R ₆ground connection; Resistance R ₅first end meet respectively triode T ₂emitter and Sheffer stroke gate IC ₂₂two input ends; Resistance R ₅other one end connecting triode T ₃base stage; One end of hummer HA connects power supply V _cc; Other one end connecting triode T of hummer HA ₃collector, triode T ₃grounded emitter; Resistance R ₄a termination power V _cc, resistance R ₄the other end pass through capacitor C ₁ground connection;

Described Sheffer stroke gate IC ₂₂two input end parallel connections after be connected with the emitter of triode T2, Sheffer stroke gate IC ₂₂output terminal and Sheffer stroke gate IC ₂₃input end connect, Sheffer stroke gate IC ₂₃another input end and Sheffer stroke gate IC ₂₄output terminal connect, Sheffer stroke gate IC ₂₃output terminal and Sheffer stroke gate IC ₂₄input end connect, Sheffer stroke gate IC ₂₄another input end respectively and resistance R ₄, capacitor C ₁connect; Sheffer stroke gate IC ₂₄output terminal R _dwith IC in detection speed control circuit 1 ₇r _dconnect.

As shown in Figure 7, a kind of detection method of multicore cable terminal compression joint quality device for fast detecting, comprises the steps:

Step (1a): two corresponding insertions in test cable socket Connecter-A and Connecter-B of terminals while by cable, switch on power;

Step (2a): detect sequential control circuit 2 and receive first CP pulse;

Step (3a): the d type flip flop IC that detects sequential control circuit 2 ₃₀₁q ₁end is high level; Enter step (4a) and step (13a);

Step (4a): open circuit dislocation testing circuit 3 judge cable and terminal whether conducting or equivalent resistance overproof, if not conducting or the overproof step (5a) that just enters of equivalent resistance; If conducting equivalent resistance are less than standard value and just enter step (14a);

Step (5a): the IC of open circuit dislocation testing circuit 3 ₁₀₁q ₁end is high level; Enter step (6a);

Step (6a): the triode T that detects sequential control circuit 2 ₁cut-off;

Step (7a): the IC of open circuit dislocation testing circuit 3 ₁₀₁output high level;

Step (8a): the light emitting diode D of open circuit dislocation testing circuit 3 _o1the luminous alarm of conducting;

Step (9a): the triode T of fault judgement warning circuit 4 ₂saturation conduction;

Step (10a): the triode T of fault judgement warning circuit 4 ₃conducting is amplified, and hummer HA sends alarm sound;

The IC of step (11a) fault judgement warning circuit 4 ₂₂output low level, IC ₂₄output low level;

IC in step (12a) detection speed control circuit 1 ₇the CP signal of output is 0V;

Step (13a): detect sequential control circuit 2CP pulse termination, the 1st heart yearn test finishes;

Step (14a): the triode T that detects sequential control circuit 2 ₁saturation conduction;

Step (15a): the IC of open circuit dislocation testing circuit 3 ₁₀₁a ₁end is low level;

Step (16a): the light emitting diode D of open circuit dislocation testing circuit 3 _o1not conducting;

Step (17a): the triode T of fault judgement warning circuit 4 ₂cut-off;

Step (18a): the IC of fault judgement warning circuit 4 ₂₂output high level, IC ₂₄output high level;

Step (19a): IC in detection speed control circuit 1 ₇normal work, sends the 2nd CP pulse signal to detecting sequential control circuit 2;

Step (20a): the 1st heart yearn test finishes, and automatically returns to step (2a) and detects the 2nd heart yearn;

The automatic repeating step of detection (2a) of 2-32 heart yearn is to step (20a);

When detecting the 32nd heart yearn conducting, detect the luminous alarm of light emitting diode D1 in sequential control circuit 2,32 heart yearns of prompting cable all detect end.

Impedance analysis after telecommunication cable terminal compression joint

In enterprise practical technological design, carry out cutting according to 2 times of demand cable length, then the crimp type terminal respectively at two ends, requires terminal numbering corresponding one by one.After terminal compression joint, two terminals are plugged on terminal base and measure respectively.The equivalent resistance of its test loop is illustrated in fig. 1 shown below:

In Fig. 1, R _t1the contact resistance after terminal and socket are pegged graft, R _t2the crimping resistance after terminal and copper cash crimping, R _t3the resistance of cable copper cash, R _tit is the total equivalent resistance of test loop.

Because 32 core cable for digital communication are used conventionally in digital SPC exchange machine room, according to different machine room layout requirements, its unit cable length is commonly used within the scope of 2～15m, and double length is 4～30m.Therefore it is as shown in the table for the maximum resistance that, test cable allows after crimp type terminal.

Known by above-mentioned analysis, need the cable equiva lent impedance wider range detecting, between 667～6670m Ω, and design loss requirement in digital signal communication according to cable core crimping apparatus, technology level and cable during detecting instrument, we determine that take equivalent resistance 8 Ω is benchmark.It is defective surpassing 8 Ω, and heart yearn open circuit, dislocation equivalent resistance in period are more than 30M Ω conventionally, are far longer than 8 Ω.

The mass defect of cable after crimping

Mass defect after cable terminal crimping is divided into electrical characteristics defect and the large class of open defect two.Electrical characteristics defect comprises equivalent resistance R _texceed standard-required, the reason of generation has three aspects:

(1) after terminal grafting, contact resistance is overproof.The number of cables of measuring due to every day is a lot, and terminal socket is after repeated multiple times plug, and elastic sheet metal produces mechanical fatigue, and elasticity coefficient reduces, and causes that contact resistance is overproof.

(2) terminal compression joint resistance is overproof.The one, the pressure during because of crimping is inadequate, wire is compressed and causes crimp type terminal overproof.The 2nd, because the crimping position defect (oxidation, distortion, dirt etc.) of wire or terminal causes.

(3) cable copper conductor resistance is overproof.In cable, copper conductor purity does not reach standard-required, wire diameter is less than nominal value or local damage etc. and all can causes that conductor resistance increases.

So, only take pressure detection or optical detection, be difficult to by whole electrical characteristics defect inspections out.

Open defect after crimping is less to quality relative effect, generally takes visual or checks with amplifier, and this class defect generally can not occur in technology ensuring situation.

Fig. 2 is testing circuit structured flowchart.

In Fig. 2, sequential control is controlled, detected to detection speed, open circuit dislocation detects and fault judgement warning circuit 4 forms fast detecting unit.Fig. 3,4,5,6 is respectively open circuit dislocation testing circuit 3, detection speed control circuit 1, detection sequential control circuit 2 and fault judgement warning circuit 4.

Known according to Fig. 3 to Fig. 6 circuit working principle, the cable two-terminal (public affairs) after crimping is inserted in respectively in the A socket and B socket of tester.After open detection button, its trace routine as shown in Figure 7.

Reliability design analysis

In fast detecting process, determine that the key components of detecting reliability has two groups.Wherein, R _b1～R _b32, R _e1～R _e32, T _b1～T _b32, IC ₃₀₁～IC ₃₃₂correlation parameter error size to triode T _bbase stage when high level, can enter state of saturation, guarantee V _cES≤ 0.1V is most important, R ₁, I _s, R _c1～R _c32, D _c1～D _c32, IC ₁₀₁～IC ₁₃₂correlation parameter error has determined IC ₁₀₁～IC ₁₃₂input end A ₁～A ₃₂can low level reliable.

Design constant current source I _sprovide the working current of 10 ± 0.5mA, triode T _bselect 2N9014, its V _cESbase stage input current Ying≤1mA during≤0.1 ± 0.05V.R _b1～R _b32=2.1K Ω ± 5%, R _e1～R _e32=33 Ω ± 5%, IC ₃₀₁～IC ₃₃₂the d type flip flop of selecting TTL structure, it exports minimum high level is 3.8V, output current is 1～6mA.I _belectric current can obtain by calculating following formula.

$I_b=\frac{V_Q-V_{\mathrm{bes}}-I_e{R}_e}{R_b}$

Application worst case design and above-mentioned formula can obtain base current minimum value I _bminfor:

$I_{b\min }=\frac{3.8-0.7-10.5\&times;34.65\&times;{10}^{-3}}{2.205\&times;{10}^3}=1.24\left(\mathrm{mA}\right),$ Visible I _bminbe greater than 1mA, can guarantee triode T when minimum high level voltage _b1～T _b32be in state of saturation and V _ces≤ 0.1V, saturation voltage drop test condition is I _c=10mA, I _b=1mA, H _fe≤ 80.

When testing circuit and terminal conducting, should guarantee IC ₁₀₁～IC ₁₃₂input end A ₁～A ₃₂level V _a≤ 0.7V, may cause IC if surpass 0.7V ₁₀₁～IC ₁₃₂output terminal is that high level produces erroneous judgement.V _aby following formula, can be calculated.

V _A＝V _ces+I _e·(R _e+R _T)

Application worst case design and formula can obtain V _amaximal value V _amaxfor:

V _Amax＝0.15+10.5×(34.65+8)×10- ³＝0.598(V)

Obviously, V _amaxbe less than 0.7V, can guarantee that cable terminal crimp quality meets detected passing through under standard-required prerequisite.

Although above-mentioned, by reference to the accompanying drawings the specific embodiment of the present invention is described; but be not limiting the scope of the invention; one of ordinary skill in the art should be understood that; on the basis of technical scheme of the present invention, those skilled in the art do not need to pay various modifications that creative work can make or distortion still in protection scope of the present invention.

Claims (6)

1. a multicore cable terminal compression joint quality device for fast detecting, it is characterized in that, comprise: detection speed control circuit, described detection speed control circuit is connected with detection sequential control circuit, described detection sequential control circuit is connected with open circuit dislocation testing circuit, and described open circuit dislocation testing circuit is connected with fault judgement warning circuit.

2. a kind of multicore cable terminal compression joint quality device for fast detecting as claimed in claim 1, is characterized in that, described detection speed control circuit comprises: 555 IC circuit ₇, resistance R ₁₀, variable resistor R ₁₁, capacitor C ₆and capacitor C ₇;

555 IC circuit ₇vCC termination power, 555 IC circuit ₇v _cOend passes through capacitor C ₇ground connection, 555 IC circuit ₇d _iSCend respectively with resistance R ₁₀with variable resistor R ₁₁one end connect, resistance R ₁₀another termination power, variable resistor R ₁₁the other end respectively with capacitor C ₆one end, 555 IC circuit ₇tR end and 555 IC circuit ₇tH end connect, capacitor C ₆other end ground connection, 555 IC circuit ₇eND end ground connection;

555 IC circuit ₇in R _dend judges the Sheffer stroke gate IC in warning circuit with fault ₂₄output terminal connect, 555 IC circuit ₇oUT end with detect sequential control circuit in the CP of d type flip flop hold and be connected, synchronous clock control signal is provided.

3. a kind of multicore cable terminal compression joint quality device for fast detecting as claimed in claim 1, it is characterized in that, described detection sequential control circuit comprises: during detection, the crimp type terminal of the detected cable other end inserts in cable socket Connecter-B and forms firmly and connect, and each heart yearn in 32 heart yearns of cable is by triode T _biwith d type flip flop IC _30iconnect d type flip flop IC _30iwith input end 1D and Sheffer stroke gate IC ₂₁output terminal connect, described Sheffer stroke gate IC ₂₁input end T _1ewith triode T in fault judgement warning circuit ₁emitter T _1econnect described triode T _bibase stage pass through resistance R _biwith d type flip flop IC _30ioutput terminal connect, described triode T _bibase stage also pass through resistance R _biwith diode D _bipositive pole connect, diode D _binegative pole and fault judgement warning circuit in triode T ₁base stage T _1bconnect described diode D _bipositive pole with pass through resistance R _biwith triode T _bibase stage connect, described triode T _bicollector by cable socket Connecter-B, be connected with each heart yearn of cable, described triode T _biemitter pass through resistance R _eibe connected with ground; The 32nd triode T _b32collector resistance R also ₃with light emitting diode D ₁negative pole connect, light emitting diode D ₁positive pole connect power supply V _cc; Described d type flip flop IC ₃₀₁output terminal and d type flip flop IC ₃₀₂input end 1D connects, and the non-output terminal of 32 d type flip flops connects together, and the pulse control end CP of 32 d type flip flops links together and is connected with the output terminal CP of IC7 in detection speed control circuit.

4. a kind of multicore cable terminal compression joint quality device for fast detecting as claimed in claim 1, is characterized in that, described open circuit dislocation testing circuit comprises: constant current source I _s, described constant current source I _sone end and power supply V _cconnect described constant current source constant current source I _sother one end by slide rheostat R ₁be connected with 32 heart yearns, described each with slide rheostat R ₁on the heart yearn connecting, be all provided with successively resistance R _ci, and light emitting diode D _ci, described light emitting diode D _cipositive pole and resistance R _ciconnect described light emitting diode D _cinegative pole all by connect successively with door IC _1iwith light emitting diode D _oiwith resistance R ₂one end connect, described resistance R ₂other one end and fault judgement warning circuit in triode T ₂base stage T _2bend links together, to control triode T ₂conducting or cut-off, described light emitting diode D _oipositive pole with door IC _1ioutput terminal connect, described and a door IC _1itwo input ends respectively with Q _iwith light emitting diode D _cinegative pole connect, wherein, i=1,2 ..., 32; During detection, the crimp type terminal of detected cable one end inserts in cable socket Connecter-A and forms firmly and connect.

5. a kind of multicore cable terminal compression joint quality device for fast detecting as claimed in claim 1, is characterized in that, described fault judgement warning circuit comprises: triode T ₁, triode T ₂, triode T ₃, resistance R ₄, resistance R ₅, resistance R ₆, resistance R ₇, capacitor C ₁, capacitor C ₂, hummer HA, Sheffer stroke gate IC ₂₂, Sheffer stroke gate IC ₂₃, Sheffer stroke gate IC ₂₄; Described triode T ₁base stage T _1bwith diode D in detection sequential control circuit _oinegative pole T _1bconnect described triode T ₁emitter T _1ewith Sheffer stroke gate IC in detection sequential control circuit ₂₁input end T _1econnect described triode T ₁collector and power supply V _ccconnect described triode T ₁emitter T _1ealso pass through resistance R ₇ground connection;

Triode T ₂base stage T _2bend passes through capacitor C ₂ground connection, triode T ₂base stage T _2bend also with open circuit dislocation testing circuit in resistance R ₂t _2bend connects; Triode T ₂collector connect power supply V _cc; Triode T ₂emitter pass through resistance R ₆ground connection; Resistance R ₅first end meet respectively triode T ₂emitter and Sheffer stroke gate IC ₂₂two input ends; Resistance R ₅other one end connecting triode T ₃base stage; One end of hummer HA connects power supply V _cc; Other one end connecting triode T of hummer HA ₃collector, triode T ₃grounded emitter; Resistance R ₄a termination power V _cc, resistance R ₄the other end pass through capacitor C ₁ground connection;

Described Sheffer stroke gate IC ₂₂two input end parallel connections after be connected with the emitter of triode T2, Sheffer stroke gate IC ₂₂output terminal and Sheffer stroke gate IC ₂₃input end connect, Sheffer stroke gate IC ₂₃another input end and Sheffer stroke gate IC ₂₄output terminal connect, Sheffer stroke gate IC ₂₃output terminal and Sheffer stroke gate IC ₂₄input end connect, Sheffer stroke gate IC ₂₄another input end respectively and resistance R ₄, capacitor C ₁connect; Sheffer stroke gate IC ₂₄output terminal R _dwith IC in detection speed control circuit ₇r _dconnect.

6. the method for quick of the device as described in above-mentioned arbitrary claim, is characterized in that, comprises the steps:

Step (1a): two corresponding insertions in test cable socket Connecter-A and Connecter-B of terminals while by cable, switch on power;

Step (2a): detect sequential control circuit and receive first CP pulse;

Step (3a): the d type flip flop IC that detects sequential control circuit ₃₀₁q ₁end is high level; Enter step (4a) and step (13a);

Step (4a): open circuit dislocation testing circuit judge cable and terminal whether conducting or equivalent resistance overproof, if not conducting or the overproof step (5a) that just enters of equivalent resistance; If conducting equivalent resistance are less than standard value and just enter step (14a);

Step (5a): the IC of open circuit dislocation testing circuit ₁₀₁q ₁end is high level; Enter step (6a);

Step (6a): the triode T that detects sequential control circuit ₁cut-off;

Step (7a): the IC of open circuit dislocation testing circuit ₁₀₁output high level;

Step (8a): the light emitting diode D of open circuit dislocation testing circuit _o1the luminous alarm of conducting;

Step (9a): the triode T of fault judgement warning circuit ₂saturation conduction;

Step (10a): the triode T of fault judgement warning circuit ₃conducting is amplified, and hummer HA sends alarm sound;

The IC of step (11a) fault judgement warning circuit ₂₂output low level, IC ₂₄output low level;

IC in step (12a) detection speed control circuit ₇the CP signal of output is 0V;

Step (13a): detect sequential control circuit CP pulse termination, the 1st heart yearn test finishes;

Step (14a): the triode T that detects sequential control circuit ₁saturation conduction;

Step (15a): the IC of open circuit dislocation testing circuit ₁₀₁a ₁end is low level;

Step (16a): the light emitting diode D of open circuit dislocation testing circuit _o1not conducting;

Step (17a): the triode T of fault judgement warning circuit ₂cut-off;

Step (18a): the IC of fault judgement warning circuit ₂₂output high level, IC ₂₄output high level;

Step (19a): IC in detection speed control circuit ₇normal work, sends the 2nd CP pulse signal to detecting sequential control circuit;

Step (20a): the 1st heart yearn test finishes, and automatically returns to step (2a) and detects the 2nd heart yearn;

The automatic repeating step of detection (2a) of 2-32 heart yearn is to step (20a);

When detecting the 32nd heart yearn conducting, detect the luminous alarm of light emitting diode D1 in sequential control circuit, 32 heart yearns of prompting cable all detect end.