CN104051484B - Possess the imaging sensor of the pixel with increased optical crosstalk and its use - Google Patents
Possess the imaging sensor of the pixel with increased optical crosstalk and its use Download PDFInfo
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Abstract
Present application is related to a kind of imaging sensor for possessing the pixel with increased optical crosstalk and its used.A kind of imaging sensor includes the first pixel and the second pixel.First pixel includes the first light-sensitive element, the first optical filter and the first lenticule.Second pixel is adjacent to the first pixel placement and comprising the second light-sensitive element, the second optical filter and the second lenticule.First pixel is configured to increase optical crosstalk obscure second light-sensitive element that at least some light at first lenticule in the light of reception are directed to second pixel to reduce color.
Description
CROSS REFERENCE TO RELATED is referred to
Present application advocates the rights and interests of No. 61/789,013 U.S. Provisional Application case filed in 15 days March in 2013.The
No. 61/789,013 U.S. Provisional Application case is hereby incorporated herein by hereby.
Technical field
The present invention generally relates to imaging sensor, and in particular (but not exclusively) it is related to cmos image sensor
In optical crosstalk.
Background technology
Imaging sensor has become generally existing.It is widely used in Digital Still Camera, cellular phone, security camera with
And in medical science, automobile and other application.To manufacture imaging sensor and in particular complementary metal oxide semiconductor
The technology of (" CMOS ") imaging sensor constantly rapidly develops.For example, to high-resolution and compared with low power consumption
Demand promoted the further miniaturizations of these imaging sensors and integrated.
Conventional cmos image sensor uses colorful optical filter array, for example, be arranged to the red of the referred to as array of Bayer pattern
Color, green and blueness (RGB).In addition, in colorful optical filter array can the transparent pixels comprising also referred to as panchromatic pixels so as to
Increase the susceptibility of imaging sensor.Also the colorful optical filter array comprising transparent pixels can claim in addition to RGB color optical filter
To be arranged to RGBC pattern of pixels.
However, some RGBC patterns can be obscured by color.Color, which is obscured, refers to the region that wrong color appears in image
In effect.For example, for example red or blueness color can be seen in the region that should be green.Color obscures at least portion
Point ground occurs due to alignment of the transparent filter in RGBC patterns.Imaging sensor with transparent pixels is relatively easy to occur
Color is obscured, because transparent pixels do not produce any color information of its own in addition to luminous intensity.
The content of the invention
One embodiment of the present of invention provides a kind of imaging sensor, and it includes：First pixel, it has first photosensitive yuan
Part, the first optical filter and the first lenticule；And second pixel, it is adjacent to first pixel and disposed, photosensitive with second
Element, the second optical filter and the second lenticule, wherein first pixel is configured to receive at first lenticule
Light at least some light second light-sensitive element of second pixel is directed to increase optical crosstalk.
Another embodiment of the present invention provides a kind of imaging sensor, and it includes：Multiple pixels, its be arranged to some rows and
The array of several columns, wherein the multiple pixel includes the colour element and transparent picture being arranged according to a pattern in the array
Element so that the transparent pixels are arranged on the diagonal of the array；At least one of described colour element, it has the
One light-sensitive element, colored filter and the first lenticule；And at least one of transparent pixels, its be adjacent to it is described at least
One colour element and dispose, with the second light-sensitive element, transparent filter and the second lenticule, wherein described, at least one is color
Color pixel is configured at least some light at first lenticule in the light of reception being directed to described at least one
Second light-sensitive element of individual transparent pixels is to increase optical crosstalk.
Another embodiment of the present invention provides a kind of method that color reduced in imaging sensor is obscured, methods described bag
Include：Light is received at the first lenticule of the first pixel of described image sensor, first pixel is micro- comprising described first
Lens, the first light-sensitive element and the first optical filter；Light is received at the second lenticule of the second pixel of described image sensor,
Second pixel includes second lenticule, the second light-sensitive element and the second optical filter；Will be at first lenticule
At least some light in the light received are directed to second light-sensitive element of second pixel to increase optical crosstalk.
Brief description of the drawings
The non-limiting and exhaustive embodiment of the present invention is described with reference to following figure, wherein unless otherwise defined,
Similar reference numerals refer to similar component in each all view.
Fig. 1 is the block diagram for illustrating imaging sensor according to an embodiment of the invention.
Fig. 2 is the figure of the pel array for the imaging sensor that embodiments in accordance with the present invention illustrate RGBC patterns.
Fig. 3 is to illustrate the flow chart that embodiments in accordance with the present invention reduce the process that color is obscured.
Fig. 4 A are three pictures of the backside illuminated imaging sensor that embodiments in accordance with the present invention have increased crosstalk
The cross-sectional view of element.
Fig. 4 B are three pictures of the front side-illuminated formula imaging sensor that embodiments in accordance with the present invention have increased crosstalk
The cross-sectional view of element.
Fig. 5 is three pixels of the imaging sensor of the lenticule for the curvature that embodiments in accordance with the present invention have change
Cross-sectional view.
Fig. 6 is three pixels of the imaging sensor of the lenticule for the height that embodiments in accordance with the present invention have change
Cross-sectional view.
Fig. 7 is three pictures of the imaging sensor of the light-sensitive element for the junction depth that embodiments in accordance with the present invention have change
The cross-sectional view of element.
Fig. 8 is the cross-sectional view of three pixels of the imaging sensor that embodiments in accordance with the present invention have recessed lenticule.
Fig. 9 A illustrate embodiments in accordance with the present invention and are made up of the positive photoresist for forming recessed lenticule
Gray scale mask.
Fig. 9 B illustrate embodiments in accordance with the present invention and are made up of the negative photoresist for forming recessed lenticule
Gray scale mask.
Figure 10 is the three of the imaging sensor of the recessed lenticule for effective depth of focus that embodiments in accordance with the present invention have change
The cross-sectional view of individual pixel.
Figure 11 is three of the imaging sensor that embodiments in accordance with the present invention have both convex lenticule and recessed lenticule
The cross-sectional view of pixel.
Embodiment
The embodiment of the imaging sensor described herein for possessing the pixel with increased optical crosstalk.It is described below
In, numerous specific details are stated to provide a thorough understanding of embodiments.However, those skilled in the relevant art it will be recognized that
Technology described herein can without one of described specific detail or it is one or more of in the case of practice or can
Put into practice by other methods, component, material etc..In other examples, not showing or describing in detail well-known structure, material
Material operates to avoid making some aspects from obscuring.
Referring to for " one embodiment " or " embodiment " is meant with reference to the embodiment institute in the whole text in this specification
Special characteristic, structure or the characteristic of description are contained at least one embodiment of the present invention.Therefore, in this specification in the whole text
The appearance of phrase " in one embodiment " or " in one embodiment " are not necessarily all referring to same embodiment in each position.This
Outside, the special characteristic, structure or characteristic can be combined in any suitable manner in one or more embodiments.
Fig. 1 is the block diagram for illustrating imaging sensor 100 according to an embodiment of the invention.Imaging sensor 100
Illustrated embodiment includes the zone of action (that is, pel array 105), reading circuit 110, function logic 115 and control electricity
Road 120.
Pel array 105 can for dorsal part or front side-illuminated formula imaging pixel (for example, pixel PD1 ..., Pn) two-dimentional battle array
Row.In one embodiment, each pixel is effect element sensor (" APS "), such as complementary metal oxide semiconductor
(" CMOS ") imaging pixel.As illustrated, each pixel is arranged into a line (for example, row R1 to Ry) and a row (for example, row
C1 to Cx) in obtain people, place or the view data of object, described image data then can be used reproduce the people,
The image of point or object.
After each pixel has obtained its view data or image charge, described image data are read by reading circuit 110
Go out and be sent to function logic 115.Reading circuit 110 can include amplifying circuit, analog/digital conversion circuit or other.Function logic
115 can only store described image data or even by effect after application image (for example, cut out, rotate, remove blood-shot eye illness, adjustment
Brightness, adjustment contrast or other) manipulate described image data.In one embodiment, reading circuit 110 can be along reading
Alignment once reads a line view data (illustrated) or can be used a variety of other technologies (not illustrating) readings described
View data, such as series read-out or all pixels of full parellel reading simultaneously.
Control circuit 120 is coupled to pel array 105 to control the operating characteristic of pel array 105.For example, control
Circuit 120 can produce the shutter signal for controlling image to obtain.
Fig. 2 is the figure of the pel array 200 for the imaging sensor that embodiments in accordance with the present invention illustrate RGBC patterns.
Array 200 is a possible embodiment of Fig. 1 pel array 105.It can be included in the zone of action of imaging sensor several
Colour imaging pixel, such as red (R), green (G) and blue (B) imaging pixel.In imaging sensor also comprising transparent or
The pixel of further referred to as panchromatic (P).Fig. 2 shows wherein transparent diagonal 204- of (that is, panchromatic (the P)) pixel along array 200
206 arrange to form a possible RGBC pattern of checkerboard pattern.However, when transparent pixels are arranged on diagonal, color
Obscuring to occur.As mentioned above, color, which is obscured, refers to wrong color and appears in effect in the region of image.Citing
For, for example red or blueness color can be seen in the region that should be green.In the RGBC patterns shown in fig. 2,
Color obscure can at least partially due to transparent filter diagonally 204-206 alignment and in those diagonal sides
Occur upwards.
Therefore, embodiments of the invention intentionally increase the optical crosstalk in pel array to reduce the effect that color is obscured
Should.Optical crosstalk refer to when the light being guided at object pixel it is spuious into adjacent pixel when.In Conventional image sensor, light
It is the adverse effect being mitigated to learn crosstalk, because can often make the realistic colour information of object pixel from the spuious light of adjacent pixel
Distortion.However, optical crosstalk, which has, blends the color of object pixel pixel adjacent thereto expecting of reducing that color obscures whereby
Less than benefit.Embodiments of the invention intentionally induce and/or increased the light of the desired characteristics as cmos image sensor
Crosstalk is learned to reduce the effect that color is obscured.
Fig. 3 is to illustrate the flow chart that embodiments in accordance with the present invention reduce the process 300 that color is obscured.As in Fig. 3
Shown, process 300 is included in the first process frame 305 that light is received at the first lenticule of the first pixel.In process frame 310
In, light is received also at the second lenticule of the second pixel.In process frame 315, the light received at the first lenticule is drawn
The light-sensitive element to the second pixel is led to increase optical crosstalk.By way of example, Fig. 4 A are with increased optical crosstalk
Backside illuminated imaging (BSI) sensor 400 three pixels (that is, pixel 1, pixel 2 and pixel 3) cross-sectional view.Into
It is a possible embodiment party of at least some pixels in the pixel included in Fig. 1 pel array 105 as sensor 400
Case.
The illustrated example of imaging sensor 400 is shown as comprising the front side for being placed in Semiconductor substrate 404
Metal level 402 on (that is, such as the bottom side oriented in Figure 4 A) and the dorsal part (that is, top side) for being placed in Semiconductor substrate 404
On planarization/passivation layer 406.Each pixel of imaging sensor 400 includes optical filter (that is, 408-412), lenticule (i.e.,
414-418) and light-sensitive element (that is, photodiode 420-424).Fig. 4 A lenticule 414-418 is convex lens.It is more specific next
Say, each lenticule has plano-convex exterior shape.Planoconvex spotlight can make light convergence and referred to as positive lens due to it.Fig. 4 A are illustrated in
The light received at each pixel converges to the focus (that is, 430,432 substantially in the top of light incident side 438 of photodiode
And 434) so that at least some light in the light received at each lenticule are directed into the photodiode of neighborhood pixels.
For example, light 428 is received at lenticule 416, wherein some light in the light are respectively directed to neighborhood pixels 1 and 3
Photodiode 420 and 424.Similarly, some light in the light 426 received at lenticule 414 are directed into neighbouring picture
The photodiode 422 of element 2.Therefore, imaging sensor 400 intentionally induces and/or increased optical crosstalk, as mentioned above
And, this can reduce the effect that color is obscured.
In the presence of several embodiments of the imaging sensor 400 for inducing and/or increasing optical crosstalk.In one embodiment
In, pixel can be made for higher.In Fig. 4 A illustrated example, each pixel has can be from the bottom side of lenticule
The 436 height H measured to the light incident side 438 of photodiode.Can be (such as micro- by increasing one or more elements
Mirror, optical filter, complanation layer 406 and Semiconductor substrate 404) thickness the height H of pixel is made for it is larger to increase optics
Crosstalk.The height H of pixel can be also adjusted by changing the junction depth of each photodiode, following article will be more detailed with reference to Fig. 7
Carefully discuss.
In another embodiment, it can be lured by reducing effective depth of focus of each focus (that is, focus 430,432 and 434)
Hair and/or increase optical crosstalk.Can be approximately from the bottom side 436 of lenticule to the distance of focus, so as to consider by effective depth of focus D
The characteristic of the medium (for example, lenticule, optical filter, complanation layer and substrate) passed through wherein to light.In an example, lead to
Cross and change the material of lenticule to change (for example, increase) refractive index to reduce effective depth of focus D.In another example, it can change
The curvature of lenticule is shorter so as to which effective depth of focus D is made for.By way of example, the curvature of lenticule is bigger, effective depth of focus
It is shorter.Again in another example, the thickness for changing lenticule also changes effective depth of focus.By way of example, lenticule is thicker, has
Imitate depth of focus shorter.
No matter using which embodiment of increase optical crosstalk, embodiment disclosed herein is provided which suitably and only
The optical crosstalk increase of amount.That is, the optical crosstalk of the desired amount can be comprising directing light to adjacent photodiode and not
Further guiding.Therefore, in an example, light is only directed to the photodiode of adjacent pixels.In one embodiment,
This can be by adjusting pixels tall H, effective depth of focus D or both combination so that effective depth of focus D is more than or equal to pixels tall H's
A quarter is realized.In addition, want the increased optical crosstalk of minimum in order to ensure realizing, adjustable pixels tall and/
Or depth of focus D causes effective depth of focus D to be less than or equal to pixels tall H half.
As mentioned above, the dorsal part that imaging sensor 400 is incident in for wherein light on the dorsal part of imaging sensor 400 shines
Ming Dynasty style imaging sensor.However, embodiment disclosed herein is also applied equally to front side-illuminated formula (FSI) imaging sensing
Device.For example, Fig. 4 B are the front side-illuminated formula imaging sensors 400 ' that embodiments in accordance with the present invention have increased crosstalk
Three pixels cross-sectional view.The illustrated example of front side-illuminated formula imaging sensor 400 ' is shown as comprising placement
Metal level 402 on the front side (that is, top side) of Semiconductor substrate 404.Complanation layer 406, optical filter 408-418 and lenticule
414-418 is also placed on the front side of imaging sensor 400 ' (that is, top side).It is discussed herein above to be used to induce and/or increase
The embodiment of optical crosstalk in imaging sensor 400 is applied equally to Fig. 4 B front side-illuminated formula imaging sensor 400 ',
The height H of pixel only can be increased in addition by increasing the thickness of metal level 402.
In Fig. 4 A and 4B illustrated example, each pixel has identical pixels tall H and effective depth of focus D.
Therefore, incident light is directed at least one neighborhood pixels by each pixel in array.Or, only some pixels can be configured
To increase optical crosstalk.That is, incident light can be directed on the photodiode of neighborhood pixels by some pixels, and it is described
Neighborhood pixels are by the fenced photodiode to its own of incident light.By way of example, colour element is made to increase crosstalk but not
It can be favourable transparent pixels is increased crosstalk.In other words, the light being incident in colour element can be directed into adjacent transparent
In pixel, but it is incident in the light on transparent pixels and will be substantially held in the transparent pixels.In order to illustrate, Fig. 5 is
Embodiments in accordance with the present invention have the cross-sectional view of three pixels of the imaging sensor 500 of the lenticule of the curvature of change.
As can be seen, nearly lenticule 514 and 518 is more curved near lenticule 516.Therefore, effective depth of focus D2 of focus 530 and 534 is big
In effective depth of focus D1 of focus 532.In one embodiment, effective depth of focus D2 is more than the height H of pixel half so as to by light
It is enclosed in pixel 1 and 3.In addition, optical filter 508 and 512 can be transparent (that is, panchromatic) optical filter, and optical filter 510 is colour
(for example, red, green or blueness) optical filter.In this way, the light being incident on the lenticule 514 of transparent pixels 1 is channeled
To be substantially incident on photodiode 420 without being incident on other photodiodes.Similarly, transparent pixels are incident in
Light on 3 lenticule 518 is channeled to be substantially incident on photodiode 424 without being incident in other photodiodes
On, and at least some light in the light being incident on the lenticule 516 of colour element 2 are directed into the photoelectricity of neighbouring transparent pixels
On both diodes 420 and 424.
A common process for making lenticule can relate to use press mold pressing resin, subsequently then heat (backflow) step.
Therefore, the common process can only produce the lenticule of convex shape due to surface tension.If made for each lenticule
With the resin of similar quantity, then gained lenticule is by with the effective depth of focus of substantially the same curvature and therefore identical.In order to
The lenticule with different curvature is made, the technique using gray scale mask can be used.For example, will be photic by gray scale mask
Resist-type microlens material layer is exposed to light source.Need only single exposure.Microlens layer be more exposed to correspond to ash
Larger thickness or relatively small thickness will be had by spending the part of the light of the part with high transmission of mask, and this depends on the layer
It is negative photoresist or positive photoresist.Similarly, microlens layer have less exposure to covered corresponding to gray scale
The part of the light with relatively low radioparent part of mould will have relatively small thickness or larger thickness, and it is negative that this, which depends on the layer,
Property photoresist or positive photoresist.Positive photoresist is the portion for being exposed to light of wherein photoresist
Divide the photoresist for the type for becoming soluble in development of photoresist agent.The unexposed part of photoresist is kept not
Dissolve in development of photoresist agent.Negative photoresist is that the part for being exposed to light of wherein photoresist becomes not
Dissolve in the photoresist of the type of development of photoresist agent.The unexposed portion of photoresist is shown by photoresist
Shadow agent is dissolved.Therefore, it can develop to manufacture with many by the positive photoresist or negative photoresist for making to be exposed through
Plant the lenticule of curvature or shape.The curvature or shape of lenticule are the radioparent patterns of the change according to gray scale mask.
Fig. 6 is the lenticule 614-618 for the height that embodiments in accordance with the present invention have change imaging sensor 600
The cross-sectional view of three pixels.As can be seen, lenticule 616 is higher than neighbouring lenticule 614 and 618.That is, lenticule
616 height h2 is more than the height h1 of neighbouring lenticule 614 and 618.Therefore, effective depth of focus D2 of focus 630 and 634 is more than Jiao
Effective depth of focus D1 of point 632 so that the light being incident on lenticule 616 is directed into photodiode 420 and 424, and incident
It is enclosed in the light on lenticule 614 and 618 in its respective pixel.
Fig. 7 be embodiments in accordance with the present invention have change junction depth (for example, J1 and J2) light-sensitive element (for example,
Photodiode 720-724) imaging sensor 700 three pixels cross-sectional view.In the illustrated embodiment,
Junction depth refer to Semiconductor substrate 404 front side (that is, bottom side) between surface 702 and the light incident side of photodiode away from
From.For example, junction depth J1 is measured from the light incident side 704 of front side surface 702 and photodiode 720.Similarly,
Junction depth J2 is measured from the light incident side 706 of front side surface 702 and photodiode 722.Can be during making by adjusting
It is whole to adjust junction depth being implanted into photodiode region 720-724 implantation energy.In one embodiment, implantation energy is got over
Height, junction depth is shorter.More implantation energy is generally taken to be penetrated into form photodiode region in substrate deeper, so that
Cause deeper junction depth.In Fig. 7 illustrated example, the junction depth J2 of photodiode 722 is more than neighbouring photoelectricity
The junction depth J1 of diode 720 and 724.Therefore, as can be seen, the light being incident on lenticule 416 can be respectively directed to neighbour
The photodiode 720 and 724 of nearly pixel 1 and 3, and the light being incident on (for example) lenticule 414 is not incident in photoelectricity
On diode 722.Therefore, Fig. 7 embodiment can allow the optics string that pixel 2 increases on the photodiode of adjacent pixels
Disturb, and pixel 1 and 3 is not added to the optical crosstalk on the photodiode of pixel 2.
Fig. 4 A-7 foregoing lenticule is shown and is described as convex lenticule, it is also referred to as positive convergence lenticule.
In another embodiment for increasing optical crosstalk, at least some lenticules in lenticule can be made as to the diverging of negative or light micro-
Mirror.In one embodiment, this is realized by the way that lenticule is made as into concave.Because recessed lenticule causes light to dissipate,
Therefore it can increase the optical crosstalk between adjacent pixel naturally.
Fig. 8 is three pixels of the imaging sensor 800 that embodiments in accordance with the present invention have recessed lenticule 814-818
Cross-sectional view.Such as it can be seen from Fig. 8, each pixel includes the lenticule with the effective depth of focus D1 of identical.The depth of focus of negative lens
To be empty, because the lens dissipate light rather than assemble light.Herein, each pixel included in imaging sensor 800
It is configured to be directed on the photodiode of neighborhood pixels to increase optical crosstalk by incident light.Similar to being discussed above
The positive lenticule stated, it can be desirable that the light being directed in adjacent pixel, which is not extended past adjacent pixels,.Otherwise, optical crosstalk can
To be excessive.Therefore, in one embodiment, by ensure effective depth of focus D1 of each focus (for example, focus 832) be more than or
1/3rd equal to the height H of pixel limit the maximum of optical crosstalk.
In one embodiment, made using the technique using the gray scale mask similar to gray scale mask as described above
Make recessed lenticule.Fig. 9 A illustrate embodiments in accordance with the present invention by the positive photoresist system for forming recessed lenticule
Into gray scale mask 902.If making recessed lenticule using positive photoresist (such as by gray scale mask 902), that
The interior part of mask must be lighter than the outer portion of mask.Therefore, the interior part of gained lenticule will be relatively thin, and outer portion
Will be relatively thick.Fig. 9 B illustrate embodiments in accordance with the present invention by the negative photoresist system for forming recessed lenticule
Into gray scale mask 904.
In the embodiment in fig. 8, bearing each of lenticule has the effective depth of focus D1 of identical.However, in other realities
Apply in example, only some pixels can be configured to increase optical crosstalk.That is, using negative lenticule, some pixels will can enter
Light is penetrated to be directed on the photodiode of neighborhood pixels, and the neighborhood pixels are by the fenced pole of photoelectricity two to its own of incident light
Pipe.As discussed above, it can be favourable colour element is increased crosstalk but transparent pixels is increased crosstalk.In other words,
The light being incident in colour element can be directed into adjacent transparent pixel, but is incident in the light on transparent pixels and will substantially be protected
Hold in the transparent pixels.In order to illustrate, Figure 10 is effective depth of focus that embodiments in accordance with the present invention have change
The cross-sectional view of three pixels of recessed lenticule 1014-1018 imaging sensor 1000.Can in the following manner will be recessed micro-
Mirror 1014-1018 is made as with different effective depths of focus：Make the changes in material used between lenticule and photodiode
And/or make material, size and the change in shape of lenticule.Such as demonstrated in Figure 10, focus 1032, which has, is shorter than focus 1030
Effective depth of focus D2 effective depth of focus D1.In one embodiment, optical filter 508 and 512 is transparent filter, and optical filter 510
For colored filter (for example, red, green or blueness).Therefore, colour element 2 is configured to receive light 1028 and by light 1028
In at least some light be directed on the photodiode 420 and 424 of neighbouring transparent pixels 1 and 3.Transparent pixels 1 are configured to
With effective depth of focus D2 so that light 1026 is received and channeled to be incident in photodiode 420 at negative lenticule 1014
Above it is not incident in adjacent photodiode.
Figure 11 is the imaging sensor 1100 that embodiments in accordance with the present invention have both convex lenticule and recessed lenticule
The cross-sectional view of three pixels.In the illustrated embodiment, pixel 1 and 3 be respectively with transparent filter 508 and
512 transparent pixels, and pixel 2 is the colour element with colored filter 510.The focus 1132 of pixel 2 has effective burnt
Deep D1 causes at least some light incided in the light on negative (that is, recessed) lenticule 1116 to be directed into neighbouring transparent pixels 1 and 2
Photodiode 420 and 424.There is focus 1130 and 1134 effective depth of focus D2 to incide on just (that is, convex) lenticule
Light be only channeled to its corresponding photodiode without being directed into adjacent photodiode.In this embodiment, color images
Element can increase optical crosstalk and transparent pixels do not increase optical crosstalk.
The above description to illustrated embodiment of the invention comprising content described in abstract of invention is not intended to
For exhaustive or limit the invention to disclosed precise forms.Although this hair is described herein for illustration purposes
Bright specific embodiment and example, but such as those skilled in the relevant art it will be recognized that can make each within the scope of the invention
Plant modification.
These modifications can be made to the present invention according to discussed in detail above.Term used in appended claims is not
It is interpreted as limiting the invention to the specific embodiment disclosed in specification.But, the scope of the present invention will be completely by institute
Attached claims determine that described claims will be understood according to the claim canons of construction created.
Claims (32)
1. a kind of imaging sensor, it includes：
First pixel, it has the first light-sensitive element, the first optical filter and the first lenticule；And
Second pixel, it is adjacent to first pixel and disposed, micro- with the second light-sensitive element, the second optical filter and second
Mirror, wherein first pixel is configured at least some light at first lenticule in the light of reception being directed to institute
Second light-sensitive element of the second pixel is stated to increase optical crosstalk,
Wherein described first lenticule for convex surface and with substantially above the light incident side of first light-sensitive element
First focus so that it is photosensitive that at least some light in the light received at first lenticule are directed into described second
Element, wherein first effective depth of focus of first focus is less than or equal to the half of the height of first pixel, and wherein
The height of first pixel is measured to the light incident side of first light-sensitive element from the bottom side of the lenticule.
2. imaging sensor according to claim 1, wherein described first effective depth of focus of first focus be more than or
Equal to a quarter of the height of first pixel.
3. imaging sensor according to claim 1, wherein first optical filter is colored filter and described second
Optical filter is transparent filter, and wherein described second pixel is configured to so that the light being incident on second lenticule is real
It is incident in matter on second light-sensitive element without being incident on first light-sensitive element.
4. imaging sensor according to claim 3, wherein second lenticule for convex surface and with having second
The second focus at depth of focus is imitated, wherein second effective depth of focus is more than described first effective depth of focus.
5. imaging sensor according to claim 4, wherein second effective depth of focus is more than the height of second pixel
The half of degree, and measure second pixel to the light incident side of second light-sensitive element wherein from the bottom side of the lenticule
Height.
6. imaging sensor according to claim 4, wherein first lenticule is micro- with being different from described second
The curvature of the curvature of mirror.
7. imaging sensor according to claim 4, wherein first lenticule is micro- with being different from described second
The height of the height of mirror.
8. imaging sensor according to claim 3, wherein first pixel has the height more than second pixel
The height of degree, and measure second pixel to the light incident side of second light-sensitive element wherein from the bottom side of the lenticule
Height.
9. imaging sensor according to claim 8, wherein first light-sensitive element of first pixel is placed in
At first junction depth, and second light-sensitive element of second pixel is placed at the second junction depth, wherein described first
Junction depth is more than second junction depth.
10. a kind of imaging sensor, it includes：
First pixel, it has the first light-sensitive element, the first optical filter and the first lenticule；And
Second pixel, it is adjacent to first pixel and disposed, micro- with the second light-sensitive element, the second optical filter and second
Mirror, wherein first pixel is configured at least some light at first lenticule in the light of reception being directed to institute
Second light-sensitive element of the second pixel is stated to increase optical crosstalk；
Wherein described first lenticule is concave surface, so that at least some in the light being incident on first lenticule
Light diffuses to second light-sensitive element.
11. imaging sensor according to claim 10, wherein first lenticule has at first effective depth of focus
The first focus, and described first effective depth of focus of wherein described first focus is more than or equal to the height of first pixel
1/3rd, and measure first pixel to the light incident side of first light-sensitive element wherein from the bottom side of the lenticule
Height.
12. imaging sensor according to claim 11, wherein first optical filter is colored filter and described the
Two optical filters are transparent filter, wherein second lenticule is concave surface and burnt with second at second effective depth of focus
Point, wherein second effective depth of focus is more than described first effective depth of focus so that the light being incident on second lenticule is real
It is incident in matter on second light-sensitive element without being incident on first light-sensitive element.
13. imaging sensor according to claim 10, wherein first optical filter is colored filter and described the
Two optical filters are transparent filter, wherein second lenticule is convex surface so that be incident on second lenticule
Light is substantially incident on second light-sensitive element without being incident on first light-sensitive element.
14. a kind of imaging sensor, it includes：
Multiple pixels, it is arranged to some rows and the array of several columns, is arranged wherein the multiple pixel is included according to a pattern
Colour element and transparent pixels in the array so that the transparent pixels are arranged on the diagonal of the array；
At least one of described colour element, it has the first light-sensitive element, colored filter and the first lenticule；And it is described
At least one of transparent pixels, it is adjacent at least one described colour element and disposed, with the second light-sensitive element, transparent
Optical filter and the second lenticule, wherein at least one described colour element is configured to the reception at first lenticule
At least some light in light are directed to second light-sensitive element of at least one transparent pixels to increase optical crosstalk.
15. imaging sensor according to claim 14, wherein first lenticule for convex surface and with substantial
The first focus above the light incident side of first light-sensitive element so that the light received at first lenticule
In at least some light be directed into second light-sensitive elements of the transparent pixels.
16. imaging sensor according to claim 15, wherein first effective depth of focus of first focus is less than or waited
In the half of the height of at least one colour element, and wherein from the bottom side of the lenticule to first light-sensitive element
Light incident side measurement at least one colour element height.
17. imaging sensor according to claim 16, wherein described first effective depth of focus of first focus is more than
Or a quarter of the height equal at least one colour element.
18. imaging sensor according to claim 14, wherein at least one described transparent pixels are configured to so that entering
Penetrate substantially be incident on second light-sensitive element in the light on second lenticule it is photosensitive without being incident in described first
On element.
19. imaging sensor according to claim 16, wherein second lenticule for convex surface and with second
The second focus at effective depth of focus, wherein second effective depth of focus is more than described first effective depth of focus.
20. imaging sensor according to claim 19, wherein second effective depth of focus is more than, described at least one is saturating
The half of the height of bright pixel, and measure institute to the light incident side of second light-sensitive element wherein from the bottom side of the lenticule
State the height of at least one transparent pixels.
21. imaging sensor according to claim 19, wherein first lenticule is micro- with being different from described second
The curvature of the curvature of lens.
22. imaging sensor according to claim 19, wherein first lenticule is micro- with being different from described second
The height of the height of lens.
23. imaging sensor according to claim 18, wherein the colour element has more than the transparent pixels
The height of height, and measure the color images to the light incident side of first light-sensitive element wherein from the bottom side of the lenticule
The height of element, and the height from the bottom side of the lenticule to the light incident side of second light-sensitive element measurement transparent pixels
Degree.
24. imaging sensor according to claim 23, wherein described the first of at least one colour element is photosensitive
Component positioning is at the first junction depth, and second light-sensitive element of at least one transparent pixels is placed in the second junction depth
At degree, wherein first junction depth is more than second junction depth.
25. a kind of imaging sensor, it includes：
Multiple pixels, it is arranged to some rows and the array of several columns, is arranged wherein the multiple pixel is included according to a pattern
Colour element and transparent pixels in the array so that the transparent pixels are arranged on the diagonal of the array；
At least one of described colour element, it has the first light-sensitive element, colored filter and the first lenticule；And it is described
At least one of transparent pixels, it is adjacent at least one described colour element and disposed, with the second light-sensitive element, transparent
Optical filter and the second lenticule, wherein at least one described colour element is configured to the reception at first lenticule
At least some light in light are directed to second light-sensitive element of at least one transparent pixels to increase optical crosstalk；
Wherein described first lenticule is concave surface, so that at least some in the light being incident on first lenticule
Light diffuses to second light-sensitive element of the transparent pixels, and wherein described first lenticule has in first effective depth of focus
First focus at place, wherein described first effective depth of focus of first focus is more than or equal to the height of the colour element
1/3rd, and measure the colour element to the light incident side of first light-sensitive element wherein from the bottom side of the lenticule
Height.
26. imaging sensor according to claim 25, wherein second lenticule for concave surface and with second
The second focus at effective depth of focus, wherein second effective depth of focus is more than described first effective depth of focus so that be incident in described
Light on second lenticule is substantially incident on second light-sensitive element without being incident on first light-sensitive element.
27. imaging sensor according to claim 25, wherein second lenticule is convex surface so that be incident in institute
The light on the second lenticule is stated substantially to be incident on second light-sensitive element without being incident on first light-sensitive element.
28. a kind of method that color reduced in imaging sensor is obscured, methods described includes：
Light is received at the first lenticule of the first pixel of described image sensor, first pixel is micro- comprising described first
Lens, the first light-sensitive element and the first optical filter；
Light is received at the second lenticule of the second pixel of described image sensor, second pixel is micro- comprising described second
Lens, the second light-sensitive element and the second optical filter；And
At least some light in the light that will be received at first lenticule are directed to described the of second pixel
Two light-sensitive elements are to increase optical crosstalk；
Wherein described first lenticule for convex surface and with substantially above the light incident side of first light-sensitive element
First focus so that it is photosensitive that at least some light in the light received at first lenticule are directed into described second
Element, wherein first effective depth of focus of first focus is less than or equal to the half of the height of first pixel, and wherein
The height of first pixel is measured to the light incident side of first light-sensitive element from the bottom side of the lenticule.
29. method according to claim 28, wherein first optical filter is colored filter and described second filters
Piece is transparent filter, and methods described further comprises the light received at second lenticule being directed to second light
Quick element is without being directed to first light-sensitive element.
30. method according to claim 29, wherein first lenticule and second lenticule are convex surface.
31. a kind of method that color reduced in imaging sensor is obscured, methods described includes：
Light is received at the first lenticule of the first pixel of described image sensor, first pixel is micro- comprising described first
Lens, the first light-sensitive element and the first optical filter；
Light is received at the second lenticule of the second pixel of described image sensor, second pixel is micro- comprising described second
Lens, the second light-sensitive element and the second optical filter；And
At least some light in the light that will be received at first lenticule are directed to described the of second pixel
Two light-sensitive elements are to increase optical crosstalk；Wherein described first lenticule and second lenticule are concave surface.
32. method according to claim 31, wherein first lenticule is concave surface and described second lenticule is
Convex surface.
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