CN103983866A - Lamp filament testing device - Google Patents
Lamp filament testing device Download PDFInfo
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- CN103983866A CN103983866A CN201410138708.3A CN201410138708A CN103983866A CN 103983866 A CN103983866 A CN 103983866A CN 201410138708 A CN201410138708 A CN 201410138708A CN 103983866 A CN103983866 A CN 103983866A
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- Prior art keywords
- pin
- filament
- circuit
- js48s
- diode
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- Testing Of Individual Semiconductor Devices (AREA)
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Abstract
The invention discloses a lamp filament testing device. The lamp filament testing device comprises a direct-current power source 1, an alternating-current power source 2, an ampere meter, a voltage meter, an instrument transformer, a shaping circuit, an amplification circuit, a time control circuit and a counting circuit. By the adoption of the lamp filament testing device, the current, the voltage and the work time of a lamp filament of the cathode of an electrical vacuum device can be directly measured, the testing range is wide, measurement results are accurate and reliable, control is sensitive, operation is convenient, automatic work can be achieved through setting, the size is small, power consumption is low and efficiency is high.
Description
Technical field
The present invention relates to a kind of proving installation, relate in particular to a kind of filament proving installation.
Background technology
In microwave electron tube process of producing product, understand the product quality of microwave electron tube and will measure to obtain parameter index accurately to microwave electron tube, such as at travelling-wave tube, the electron tubes such as magnetron have in the product of cathode portion, for understanding its quality, need to know the filament electrical quantity index of negative electrode, just need can measurement products filament when work electric current, the instrument of the technical indicator of the aspect such as voltage and working time, so far, still there is no the ready-made electric current that can directly measure the filament of electron tube negative electrode, the device of voltage and working time, certainly let alone to reach test specification wide, measurement result Zhun Que ﹑ is reliable, control the Ling Min ﹑ Cao Fang of work Bian ﹑ automatic operation can be set, the long-pending little ﹑ merit of body consumes the current reality of low ﹑ efficiency height etc. and uses the requirement in especially electron tube test use.
Summary of the invention
The present invention is for electric current, voltage and the working time of filament that can thermometrically electron tube negative electrode, a kind of filament proving installation is provided, and technical scheme of the present invention is: described filament proving installation comprises direct supply 1, AC power 2, reometer, voltage table, mutual inductor, shaping circuit, amplifying circuit, time control circuit, counting circuit; Described direct supply 1 is used to counting circuit, time control circuit, amplifying circuit that work capacity is provided, and described AC power 2 is for providing work capacity to filament; Described reometer is connected with described filament, and for measuring the working current of filament, described voltage table and filament parallel, for measuring the operating voltage of filament; Described mutual inductor is connected between filament and shaping circuit, described mutual inductor is for converting the working current of filament to electric signal, described electric signal exports amplifying circuit to after processing by shaping circuit, electric signal after described amplifying circuit is processed exports time control circuit to, after processing, described time control circuit generates driving power signal, described time control circuit output driving power signal is to AC power 2, and driving power signal controlling AC power 2 realizes filament energising or power-off; Described time control circuit is also for generating the count signal that drives counting circuit, and described count signal drives counting of counting circuit; When filament is worked, when the numerical value of counting circuit setting is identical with the numerical value of counting circuit actual count, counting circuit sends silence signal to AC power 2, now 2 pairs of filament power-off of AC power, and counting circuit is stored current actual count value; When filament is opened a way, filament does not produce working current, and mutual inductor is exported without electric signal, and time control circuit does not generate driving power signal, do not receive the AC power 2 of driving power signal in off working state, counting circuit stops counting and storing current count value.
Described filament proving installation, described in it, mutual inductor is current transformer, described current transformer converts the large electric current in filament to little electric current in proportion.
Described filament proving installation, described shaping circuit is by diode D
1, diode D
2, diode D
3, diode D
4, electrochemical capacitor C
1and resistance R
1form described diode D
1plus earth, its negative electrode connects current transformer and diode D
2anode, described diode D
3negative electrode and diode D
4anode be connected and be serially connected, described diode D
3anode and diode D
2negative electrode, electrochemical capacitor C
1positive pole and resistance R
1be connected; Described resistance R
1be connected with amplifying circuit; Described diode D
4plus earth; Described electrochemical capacitor C
1minus earth.
Described filament proving installation, described mutual inductor is the current transformer of 100:1.
Described filament proving installation, described time control circuit comprises a JS48S device and the 2nd JS48S device, 7 pin of a described JS48S device connect the positive pole of direct supply 1,2 pin of the one JS48S device connect 1 pin of the 2nd JS48S device, 1 pin of the one JS48S device connects 6 pin of counting circuit DH48J device, 4 pin of the one JS48S device connect filament, 3 pin of the one JS48S device are sky pin, 8 pin of the one JS48S device connect 2 pin of the 2nd JS48S device, 6 pin ground connection of the one JS48S device, 5 pin of a JS48S device are sky pin; 7 pin of the 2nd JS48S device connect the positive pole of direct supply 1, and 3 pin of the 2nd JS48S device, 5 pin, 6 pin and 8 pin are all sky pin, 4 pin ground connection of the 2nd JS48S device.
Described filament proving installation, described counting circuit comprises DH48J device, 7 pin of described DH48J device connect the positive pole of direct supply 1,2 pin ground connection, 1 pin connects amplifying circuit output, and 3 pin, 4 pin and 5 pin are all sky pin, 8 pin connect 1 pin that AC power 2,6 pin connect a JS48S device.
Described filament proving installation, described amplifying circuit can be transistor amplifier circuit.
Described filament proving installation, described transistor amplifier circuit comprises, transistor 3DG27B, capacitance-resistance biasing resistor R
b, capacitance-resistance biasing resistor R
c, coupling capacitance C
bwith coupling capacitance C
c, wherein: the base stage of described transistor 3DG27B connects capacitance-resistance biasing resistor R
b, shaping circuit and coupling capacitance C
b, by coupling capacitance C
baccept the output signal of shaping circuit; The collector of transistor 3DG27B and capacitance-resistance biasing resistor R
cwith coupling capacitance C
cconnect, by coupling capacitance C
coutput is amplified control signal to time control circuit.
Described filament proving installation, described amplifying circuit is integrated operational amplifier circuit.
Described filament proving installation, described integrated operational amplifier circuit adopts anti-phase proportional amplifier, and described proportional amplifier inverting input is connected with the output terminal of shaping circuit, receives the output signal of shaping circuit; Described proportional amplifier reversed-phase output is connected with time control circuit, and output is amplified control signal to time control circuit.
Adopt filament proving installation of the present invention, described filament (negative electrode) test specification is wide, and measurement result Zhun Que ﹑ is reliable; Control the clever quick ﹑ behaviour side of working just ﹑ automatic operation can be set, can be used as the ageing rack use of filament, and the little ﹑ merit of described instrument volume to consume low ﹑ efficiency high.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, the accompanying drawing the following describes is only some embodiment that record in the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
The inner block diagram that connects of Fig. 1 embodiment of the present invention;
A kind of transistor amplifier circuit figure that Fig. 2 embodiment of the present invention provides;
The another kind of integrated operational amplifier circuit figure that Fig. 3 embodiment of the present invention provides;
The shaping circuit figure that Fig. 4 embodiment of the present invention provides;
The JS48S device insert row schematic diagram of Fig. 5 encapsulation;
the DH48J device insert row schematic diagram of Fig. 6 encapsulation.
Embodiment
The present invention, in order to solve electric current, voltage and the working time of filament that can thermometrically electron tube negative electrode, provides a kind of filament proving installation.
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Embodiment based in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to protection scope of the present invention.
Embodiment mono-
Refer to Fig. 1, the filament proving installation that Fig. 1 provides for the embodiment of the present invention, described filament proving installation comprises direct supply 1, AC power 2, reometer, voltage table, the current transformer of 100:1, shaping circuit, amplifying circuit, time control circuit, counting circuit.
Described time control circuit comprises a JS48S device and the 2nd JS48S device, 7 pin of a described JS48S device connect the positive pole of direct supply 1,2 pin of the one JS48S device connect 1 pin of the 2nd JS48S device, 1 pin of the one JS48S device connects 6 pin of counting circuit DH48J device, 4 pin of the one JS48S device connect filament, 3 pin of the one JS48S device are sky pin, 8 pin of the one JS48S device connect 2 pin of the 2nd JS48S device, 6 pin ground connection of the one JS48S device, 5 pin of a JS48S device are sky pin; 7 pin of the 2nd JS48S device connect the positive pole of direct supply 1, and 3 pin of the 2nd JS48S device, 5 pin, 6 pin and 8 pin are all sky pin, 4 pin ground connection of the 2nd JS48S device.
Described counting circuit comprises DH48J device, and 7 pin of described DH48J device connect the positive pole of direct supply 1,2 pin ground connection, and 1 pin connects amplifying circuit output, and 3 pin, 4 pin and 5 pin are all sky pin, and 8 pin connect 1 pin that AC power 2,6 pin connect a JS48S device.
Described shaping circuit is by diode D
1, diode D
2, diode D
3, diode D
4, electrochemical capacitor C
1and resistance R
1form described diode D
1plus earth, its negative electrode connects current transformer and diode D
2anode, described diode D
3negative electrode and diode D
4anode be connected and be serially connected, described diode D
3anode and diode D
2negative electrode, electrochemical capacitor C
1positive pole and resistance R
1be connected; Described resistance R
1be connected with amplifying circuit; Described diode D
4plus earth; Described electrochemical capacitor C
1minus earth.
The amplifying circuit of described filament proving installation is transistor amplifier circuit, and described transistor amplifier circuit comprises, transistor 3DG27B, capacitance-resistance biasing resistor R
b, capacitance-resistance biasing resistor R
c, coupling capacitance C
bwith coupling capacitance C
c, wherein: the base stage of described transistor 3DG27B connects capacitance-resistance biasing resistor R
b, shaping circuit and coupling capacitance C
b, by coupling capacitance C
baccept the output signal of shaping circuit; The collector of transistor 3DG27B and capacitance-resistance biasing resistor R
cwith coupling capacitance C
cconnect, by coupling capacitance C
coutput is amplified control signal to time control circuit.
Described direct supply 1 is used to counting circuit, time control circuit, amplifying circuit that work capacity is provided, and described AC power 2 is for providing work capacity to filament; Described reometer is connected with described filament, and for measuring the working current of filament, described voltage table and filament parallel, for measuring the operating voltage of filament; The current transformer of described 100:1 is connected between filament and shaping circuit, described current transformer is for converting the working current of filament to electric signal, described electric signal exports amplifying circuit to after processing by shaping circuit, electric signal after described amplifying circuit is processed exports time control circuit to, after processing, described time control circuit generates driving power signal, described time control circuit output driving power signal is to AC power 2, and driving power signal controlling AC power 2 realizes filament energising or power-off; Described time control circuit is also for generating the count signal that drives counting circuit, and described count signal drives counting of counting circuit; When filament is worked, when the numerical value of counting circuit setting is identical with the numerical value of counting circuit actual count, counting circuit sends silence signal to AC power 2, now 2 pairs of filament power-off of AC power, and counting circuit is stored current actual count value; When filament is opened a way, time control circuit does not generate driving power signal, does not receive the AC power 2 of driving power signal in off working state, and counting circuit stops counting and storing current count value.
Embodiment bis-
Embodiment bis-is basic identical with embodiment mono-technical scheme, the difference of the two is, described in embodiment bis-, amplifying circuit is integrated operational amplifier circuit, described filament proving installation, described integrated operational amplifier circuit adopts anti-phase proportional amplifier, described proportional amplifier inverting input is connected with the output terminal of shaping circuit, receives the output signal of shaping circuit; Described proportional amplifier reversed-phase output is connected with time control circuit, and output is amplified control signal to time control circuit.
Claims (10)
1. a filament proving installation, is characterized in that, described filament proving installation comprises: direct supply 1, AC power 2, reometer, voltage table, mutual inductor, shaping circuit, amplifying circuit, time control circuit, counting circuit;
Described direct supply 1 is used to counting circuit, time control circuit, amplifying circuit that work capacity is provided, and described AC power 2 is for providing work capacity to filament; Described reometer is connected with described filament, and for measuring the working current of filament, described voltage table and filament parallel, for measuring the operating voltage of filament; Described mutual inductor is connected between filament and shaping circuit, described mutual inductor is for converting the working current of filament to electric signal, described electric signal exports amplifying circuit to after processing by shaping circuit, electric signal after described amplifying circuit is processed exports time control circuit to, after processing, described time control circuit generates driving power signal, described time control circuit output driving power signal is to AC power 2, and driving power signal controlling AC power 2 realizes filament energising or power-off; Described time control circuit is also for generating the count signal that drives counting circuit, and described count signal drives counting of counting circuit; When filament is worked, when the numerical value of counting circuit setting is identical with the numerical value of counting circuit actual count, counting circuit sends silence signal to AC power 2, now 2 pairs of filament power-off of AC power, and counting circuit is stored current actual count value; When filament is opened a way, filament does not produce working current, and mutual inductor is exported without electric signal, and time control circuit does not generate driving power signal, do not receive the AC power 2 of driving power signal in off working state, counting circuit stops counting and storing current count value.
2. filament proving installation as claimed in claim 1, is characterized in that, described mutual inductor is current transformer.
3. filament proving installation as claimed in claim 2, is characterized in that, described shaping circuit is by diode (D
1), diode (D
2), diode (D
3), diode (D
4), electrochemical capacitor (C
1) and resistance (R
1) form described diode (D
1) plus earth, its negative electrode connects current transformer and diode (D
2) anode, described diode (D
3) negative electrode and diode (D
4) anode be connected and be serially connected, described diode (D
3) anode and diode (D
2) negative electrode, electrochemical capacitor (C
1) positive pole and resistance (R
1) be connected; Described resistance (R
1) be connected with amplifying circuit; Described diode (D
4) plus earth; Described electrochemical capacitor (C
1) minus earth.
4. filament proving installation as claimed in claim 2, is characterized in that, described current transformer is the current transformer of 100:1.
5. filament proving installation as claimed in claim 1, it is characterized in that, described time control circuit comprises a JS48S device and the 2nd JS48S device, 7 pin of the one JS48S device connect the positive pole of direct supply 1, 2 pin of the one JS48S device connect 1 pin of the 2nd JS48S device, 1 pin of the one JS48S device connects 6 pin of counting circuit DH48J device, 4 pin of the one JS48S device connect filament, 3 pin of the one JS48S device are sky pin, 8 pin of the one JS48S device connect 2 pin of the 2nd JS48S device, 6 pin ground connection of the one JS48S device, 5 pin of the one JS48S device are sky pin, 7 pin of the 2nd JS48S device connect the positive pole of direct supply 1, and 3 pin of the 2nd JS48S device, 5 pin, 6 pin and 8 pin are all sky pin, 4 pin ground connection of the 2nd JS48S device.
6. filament proving installation as claimed in claim 1, it is characterized in that, described counting circuit comprises DH48J device, 7 pin of described DH48J device connect the positive pole of direct supply 1,2 pin ground connection, 1 pin connects amplifying circuit output, and 3 pin, 4 pin and 5 pin are all sky pin, 8 pin connect 1 pin that AC power 2,6 pin connect a JS48S device.
7. the filament proving installation as described in claim 1-6 any one claim, is characterized in that, described amplifying circuit is transistor amplifier circuit.
8. filament proving installation as claimed in claim 7, is characterized in that, described transistor amplifier circuit comprises, transistor 3DG27B, capacitance-resistance biasing resistor R
b, capacitance-resistance biasing resistor R
c, coupling capacitance C
bwith coupling capacitance C
c, wherein: the base stage of described transistor 3DG27B connects capacitance-resistance biasing resistor R
b, shaping circuit and coupling capacitance C
b, by coupling capacitance C
baccept the output signal of shaping circuit; The collector of transistor 3DG27B and capacitance-resistance biasing resistor R
cwith coupling capacitance C
cconnect, by coupling capacitance C
coutput is amplified control signal to time control circuit.
9. the filament proving installation as described in claim 1-6 any one claim, is characterized in that, described amplifying circuit is integrated operational amplifier circuit.
10. filament proving installation as claimed in claim 9, is characterized in that, described integrated operational amplifier circuit adopts anti-phase proportional amplifier, and described proportional amplifier inverting input is connected with the output terminal of shaping circuit, receives the output signal of shaping circuit; Described proportional amplifier reversed-phase output is connected with time control circuit, and output is amplified control signal to time control circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410138708.3A CN103983866B (en) | 2014-04-09 | 2014-04-09 | A kind of filament test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410138708.3A CN103983866B (en) | 2014-04-09 | 2014-04-09 | A kind of filament test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103983866A true CN103983866A (en) | 2014-08-13 |
| CN103983866B CN103983866B (en) | 2017-06-06 |
Family
ID=51275911
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410138708.3A Active CN103983866B (en) | 2014-04-09 | 2014-04-09 | A kind of filament test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103983866B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109709380A (en) * | 2018-12-29 | 2019-05-03 | 上海联影医疗科技有限公司 | Detect method and device, computer equipment, storage medium and the medical imaging device of accelerator working characteristics |
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Cited By (2)
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|---|---|---|---|---|
| CN109709380A (en) * | 2018-12-29 | 2019-05-03 | 上海联影医疗科技有限公司 | Detect method and device, computer equipment, storage medium and the medical imaging device of accelerator working characteristics |
| CN109709380B (en) * | 2018-12-29 | 2022-01-25 | 上海联影医疗科技股份有限公司 | Method and device for detecting operating characteristics of accelerator |
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| Publication number | Publication date |
|---|---|
| CN103983866B (en) | 2017-06-06 |
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