CN103968942A - Fully automatic plane spectrum analyzer - Google Patents
Fully automatic plane spectrum analyzer Download PDFInfo
- Publication number
- CN103968942A CN103968942A CN201310034908.XA CN201310034908A CN103968942A CN 103968942 A CN103968942 A CN 103968942A CN 201310034908 A CN201310034908 A CN 201310034908A CN 103968942 A CN103968942 A CN 103968942A
- Authority
- CN
- China
- Prior art keywords
- light
- detecting device
- full automatic
- spectroanalysis instrument
- pick
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
The invention discloses a fully automatic plane spectrum analyzer which comprises an outer cover, a light source, a light path with the front end connected with the light source, a biaxial controller, a an object sage connected with the biaxial controller, a detection device connected with the biaxial controller and a data processing device connected with the detection device, wherein the biaxial controller is connected with the data processing device, the detection device comprises a reflector and a detector, and the detector comprises a visible light detector and an invisible light detector which are connected in parallel. The fully automatic plane spectrum analyzer has the advantages that light refraction and reflection performance of an optical lens at any angle can be detected fast and conveniently, and the fully automatic plane spectrum analyzer is high in detection efficiency and wide in range of wavelength capable of being tested.
Description
Technical field
The invention belongs to a kind of optical lens detection instrument, especially relate to a kind of full automatic planar spectroanalysis instrument.
Background technology
The detecting instrument of existing plane optical mirror slip is when detecting the optical property of eyeglass, mostly adopt the mode of raster scanning to carry out transmitance measurement, once can only detect refraction or the reflection of light of a certain special angle of eyeglass, if need to carry out the measurement of another angle, eyeglass to be measured and the position of adjusting reflecting optics need to reload.And while adjusting the relative angle of eyeglass to be measured and reflecting optics, need manual adjustments, and detection efficiency is low, and difficulty is larger.The light wavelength scope that the detecting instrument of existing plane optical mirror slip can detect is generally 250nm ~ 1100nm, and wavelength coverage is narrower, thereby can not draw the performance of optical mirror slip accurately.
Summary of the invention
The refraction and the reflecting properties that the object of the present invention is to provide a kind of light at any angle that can convenient and swift detection optical mirror slip, detection efficiency is high and can detect the full automatic planar spectroanalysis instrument that wavelength coverage is very wide.
According to an aspect of the present invention, a kind of full automatic planar spectroanalysis instrument is provided, comprise light path, two axis controllers, the objective table being connected with two axis controllers, the pick-up unit being connected with two axis controllers and the data processing equipment being connected with pick-up unit that outer cover, light source, front end are connected with light source, two axis controllers are connected with data processing equipment, pick-up unit comprises catoptron and detecting device, and detecting device comprises visible light detector and the invisible light detecting device being in parallel.Two axis controllers are connected with pick-up unit with objective table, make to control by two axis controllers the position of objective table and pick-up unit, control optical mirror slip to be measured on objective table and the position of catoptron, conveniently detect optical mirror slip and reflect at any angle and reflecting properties.Being provided with visible light detector in parallel and invisible light detecting device increases the detection wavelength coverage of full automatic planar spectroanalysis instrument of the present invention, while detecting optical mirror slip to the performance of visible ray, open visible light detector, while detecting optical mirror slip to the performance of invisible light, open invisible light detecting device, easy to use.The energy conversion of the light that data processing equipment can detect detecting device is that transmitance or reflectivity energy trace show, thereby can draw intuitively transmittance or the reflectivity of eyeglass to be measured.
In some embodiments, full automatic planar spectroanalysis instrument also comprises base, and objective table is located on base, has guaranteed the stationarity of objective table.
In some embodiments, pick-up unit also comprises the integrating sphere and the web member being connected with detecting device of being located between catoptron and detecting device, integrating sphere is connected with catoptron with detecting device, and pick-up unit is connected with base by web member, and web member is located between base and objective table.Be provided with integrating sphere, thereby the light of catoptron reflection is acted on detecting device very efficiently through integrating sphere, reduced scattering and disappearing of light.
In some embodiments, data processing equipment is computer, thereby the result that detecting device can be detected shows by computer.
In some embodiments, light source is connected by optical fiber with light path.
In some embodiments, objective table and web member and base junction are provided with index dial, make to observe more intuitively the position relationship of objective table and pick-up unit.
In some embodiments, light path rear end is provided with polaroid.Thereby by adjusting the direction of polaroid, reach the requirement of automatic measurement S polarized light and P polarized light.
In some embodiments, two axis controllers are controllor for step-by-step motor.
Accompanying drawing explanation
Fig. 1 is a kind of embodiment schematic diagram of full automatic planar spectroanalysis instrument of the present invention;
Fig. 2 is the another kind of embodiment schematic diagram of full automatic planar spectroanalysis instrument of the present invention.
Embodiment
Below in conjunction with accompanying drawing, the present invention is further detailed explanation.
See figures.1.and.2: full automatic planar spectroanalysis instrument, comprise light path 3, two axis controllers 4, the objective table 8 being connected with two axis controllers 4, the pick-up unit 5 being connected with two axis controllers 4 and the data processing equipment 6 being connected with pick-up unit 5 that outer cover 1, light source 2, front end are connected with light source 2, pick-up unit 5 is connected by data line with data processing equipment 6, light source 2 is connected by optical fiber 9 with light path 3, and two axis controllers 4 are connected with data processing equipment 6.Data processing equipment 6 is computer, and two axis controllers 4 are controllor for step-by-step motor.Pick-up unit 5 comprises catoptron 51 and detecting device 52, detecting device 52 comprises visible light detector 521 and the invisible light detecting device 522 being in parallel, visible light detector 521 is connected with data processing equipment 6 respectively by data line with invisible light detecting device 522, and the detection wavelength coverage of detecting device 52 is 380nm ~ 2500nm.
Full automatic planar spectroanalysis instrument also comprises base 7, and objective table 8 is located on base 7.
Pick-up unit 5 also comprises the integrating sphere 53 and the web member 54 being connected with detecting device 52 of being located between catoptron 51 and detecting device 52, detecting device 52 is connected with web member 54 by visible light detector 521, visible light detector 521 is located on web member 54, integrating sphere 53 is connected with catoptron 51 with detecting device 52, integrating sphere 53 is connected with detecting device 52 by optical fiber, pick-up unit 5 is connected with base 7 by web member 54, and web member 54 is located between base 7 and objective table 8.
Objective table 8 and web member 54 are provided with index dial 10 with base 7 junctions.
Light path 3 rear ends are provided with polaroid 31, by adjusting the direction of polaroid 31, realize and automatically measure S polarized light and P polarized light.
When full automatic planar spectroanalysis instrument is worked, open light source 2, confirm that the light that light source sends enters integrating sphere 53 after light path 3, confirm the energy of light, eyeglass to be measured is placed in to objective table 8, the anglec of rotation of objective table 8 is set by two axis controllers 4, thereby sets the eyeglass to be measured be fixed on objective table 8 and the level angle of light path 3.Start light source 2, the directional light that light is 1 ~ 5mm through light path 3 back, then act on eyeglass to be measured.With reference to Fig. 1, when eyeglass to be measured is vertical with light path 3, simultaneously by the control of two axis controllers 4, web member 54 drives catoptron 51, integrating sphere 53 and the suitable angle of detecting device 52 rotation, make the light horizontal force being sent by light path 3 on eyeglass to be measured, see through the light horizontal force of eyeglass to be measured on catoptron 51, act on the light of catoptron 51 through integrating sphere 53 effects, integrating sphere 53 is delivered to the energy of light on detecting device 52 via optical fiber transmission, computer calculates the energy that is sent to detecting device 52 energy trace that sees through of eyeglass to be measured again, testing result is shown, thereby record the transmittance of eyeglass to be measured, detection time is in 0.5s, improved detection speed.
With reference to Fig. 2: when eyeglass to be measured and light path 3 out of plumb, by the control of two axis controllers 4, catoptron 51 is rotated to an angle, measurement of angle scope is 5 ° ~ 80 °, make light path 2 act on the light of eyeglass to be measured, after lens reflecting to be measured, reflection ray acts on catoptron 51, finally records the reflecting properties of optical mirror slip.Meanwhile, can, by using visible light detector 521 and invisible light detecting device 522, draw the reflection of light performance of eyeglass to be measured to different wave length.
Full automatic planar spectroanalysis instrument of the present invention, by the measurement to the transmittance of eyeglass to be measured and reflectivity, can draw the amount of energy of eyeglass to be measured.
Above-described is only the preferred embodiment of the present invention, it should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise of the invention, can also make some distortion and improvement, and these all belong to protection scope of the present invention.
Claims (8)
1. full automatic planar spectroanalysis instrument, it is characterized in that, comprise light path, two axis controllers, the objective table being connected with two axis controllers, the pick-up unit being connected with two axis controllers and the data processing equipment being connected with pick-up unit that outer cover, light source, front end are connected with light source, described two axis controllers are connected with data processing equipment, described pick-up unit comprises catoptron and detecting device, and described detecting device comprises visible light detector and the invisible light detecting device being in parallel.
2. full automatic planar spectroanalysis instrument according to claim 1, is characterized in that, also comprises base, and described objective table is located on base.
3. full automatic planar spectroanalysis instrument according to claim 2, it is characterized in that, described pick-up unit also comprises the integrating sphere and the web member being connected with detecting device of being located between catoptron and detecting device, described integrating sphere is connected with catoptron with detecting device, described pick-up unit is connected with base by web member, and described web member is located between base and objective table.
4. full automatic planar spectroanalysis instrument according to claim 1, is characterized in that, described data processing equipment is computer.
5. full automatic planar spectroanalysis instrument according to claim 1, is characterized in that, described light source is connected by optical fiber with light path.
6. full automatic planar spectroanalysis instrument according to claim 3, is characterized in that, described objective table and web member and base junction are provided with index dial.
7. full automatic planar spectroanalysis instrument according to claim 5, is characterized in that, described light path rear end is provided with polaroid.
8. full automatic planar spectroanalysis instrument according to claim 1, is characterized in that, described two axis controllers are controllor for step-by-step motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310034908.XA CN103968942B (en) | 2013-01-30 | 2013-01-30 | Full automatic planar spectroanalysis instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310034908.XA CN103968942B (en) | 2013-01-30 | 2013-01-30 | Full automatic planar spectroanalysis instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103968942A true CN103968942A (en) | 2014-08-06 |
| CN103968942B CN103968942B (en) | 2016-04-06 |
Family
ID=51238724
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310034908.XA Active CN103968942B (en) | 2013-01-30 | 2013-01-30 | Full automatic planar spectroanalysis instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103968942B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1282867A (en) * | 2000-09-01 | 2001-02-07 | 浙江大学 | Spectrometer for colour separating and composing parts in liquid crystal projector |
| JP2007139585A (en) * | 2005-11-18 | 2007-06-07 | Olympus Corp | Reflectance measuring instrument and adjustment technique of optical axis thereof |
| US20090128823A1 (en) * | 2007-11-20 | 2009-05-21 | Industrial Technology Research Institute | Reflectance measuring apparatus |
| CN102042876A (en) * | 2010-12-07 | 2011-05-04 | 上海衡伟信息技术有限公司 | Remote online spectrum detection system |
| CN203101026U (en) * | 2013-01-30 | 2013-07-31 | 佛山市北创光电科技有限公司 | Fully-automatic planar spectrum analyzer |
-
2013
- 2013-01-30 CN CN201310034908.XA patent/CN103968942B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1282867A (en) * | 2000-09-01 | 2001-02-07 | 浙江大学 | Spectrometer for colour separating and composing parts in liquid crystal projector |
| JP2007139585A (en) * | 2005-11-18 | 2007-06-07 | Olympus Corp | Reflectance measuring instrument and adjustment technique of optical axis thereof |
| US20090128823A1 (en) * | 2007-11-20 | 2009-05-21 | Industrial Technology Research Institute | Reflectance measuring apparatus |
| CN102042876A (en) * | 2010-12-07 | 2011-05-04 | 上海衡伟信息技术有限公司 | Remote online spectrum detection system |
| CN203101026U (en) * | 2013-01-30 | 2013-07-31 | 佛山市北创光电科技有限公司 | Fully-automatic planar spectrum analyzer |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103968942B (en) | 2016-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103364386B (en) | Deep ultraviolet laser Raman spectrometer | |
| CN201622345U (en) | Laser distance measurement device | |
| CN105067528B (en) | Two-dimentional confocal microscopy nonlinear strength scanning system and measuring method | |
| CN202533371U (en) | Deep ultraviolet (DUV) laser Raman spectrometer | |
| CN103487408A (en) | Portable field glass transmittance and reflectivity testing spectrophotometer | |
| CN203908936U (en) | Back reflection measuring device | |
| CN202057596U (en) | Comparison-type reflectivity measuring instrument | |
| CN104931239B (en) | A kind of MTF test device and method for small-sized off-axis optical system | |
| CN102226689A (en) | Method for measuring coaxial error of thru-beams | |
| CN203101026U (en) | Fully-automatic planar spectrum analyzer | |
| CN103105283B (en) | Focal distance measuring device of single-spectrum large-diameter long-focus lens | |
| CN203100685U (en) | Lens center thickness optical detector | |
| CN204115872U (en) | A kind of detachable infrared spectral radiant is measured and is coaxially seen collimation device | |
| CN104501908A (en) | Photoelectric sensor detecting liquid level | |
| CN104266968B (en) | High accuracy polarization two is to reflection automatic measuring instrument | |
| CN105823622A (en) | Oscillating mirror-based MTF measurement device | |
| CN103968942B (en) | Full automatic planar spectroanalysis instrument | |
| CN104330053A (en) | Micro angle measurement method and device | |
| CN104567796A (en) | 3D shooting ranging method | |
| CN103792072B (en) | A kind of automatic beam change welding goggles light diffusion value test system and method | |
| CN204008064U (en) | The inclined to one side detector of a kind of optical axis center | |
| CN103148807A (en) | Ultraviolet and visible light double optical axis parallelism calibration device under external field environment | |
| CN203286992U (en) | Detection device for verticality of laser beam | |
| CN215415039U (en) | Device capable of simultaneously measuring multi-angle retroreflection coefficients | |
| CN205786353U (en) | A kind of transmittance meter based on rotating filtering sheet monochromator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP03 | Change of name, title or address |
Address after: One of the 528000 Chancheng District of Guangdong city of Foshan province Huayi four season Road No. 28 room 1001 Patentee after: Guangdong North photoelectric Polytron Technologies Inc Address before: Chancheng District of Guangdong city in Foshan province 528000 quarter of Huayi Road No. 28, room 1001 four Patentee before: FOSHAN BEICHUANG PHOTOELECTRIC TECHNOLOGY Co.,Ltd. |