CN103955050B - A kind of multi-pass microscopic system - Google Patents
A kind of multi-pass microscopic system Download PDFInfo
- Publication number
- CN103955050B CN103955050B CN201410198849.4A CN201410198849A CN103955050B CN 103955050 B CN103955050 B CN 103955050B CN 201410198849 A CN201410198849 A CN 201410198849A CN 103955050 B CN103955050 B CN 103955050B
- Authority
- CN
- China
- Prior art keywords
- lens
- light source
- subsystems
- smooth
- picture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Microscoopes, Condenser (AREA)
Abstract
The present invention provides a kind of multi-pass microscopic system, including: the first smooth subsystems, for measuring targets imaging, form the first picture；Second smooth subsystems, for measuring targets imaging, forms the second picture, and the amplification of the second smooth subsystems is different from the amplification of the first smooth subsystems；Image collecting device, is positioned at the position of the first picture, for being acquired the first picture；Image collecting device is also located at the position of the second picture, for being acquired the second picture；First light source, for providing bias light to the first smooth subsystems；Secondary light source, for providing bias light to the second smooth subsystems；Control circuit, including processor, the first light source described in described processor Time-sharing control and secondary light source can realize image acquisition to luminous intensity corresponding to image to can make image collecting device.Multi-pass microscopic system of the present invention can realize the detection of different enlargement ratios to examined object, and simple in construction, cheap.
Description
Technical field
The technical field of the present invention relates to optical instrument field, particularly relates to a kind of multi-pass microscopic system.
Background technology
Optical microscope is to utilize optical principle, and the unresolvable small material of naked eyes is zoomed into observable fine structure, is that one is engaged in the essential instrument and equipment of various scientific research activity for people.
The purposes of optical microscope is quite varied, application is all had in the every field such as biology, physics, chemistry, astronomy, materialogy, medical science, even relevant to our daily life cosmetology industry, is also adopted by microscope and human body skin, hair quality is carried out detection etc..Visible, optical microscope is closely related with the productive life field of the mankind.
According to different application and research purpose, existing optical microscope includes multiple class, such as: biological microscope, metallurgical microscope, polarizing microscope etc..All these microscopical structures, are all made up of the mechanical part of an optical system and support optical system, and optical system mainly includes changeable object lens, eyepiece and condenser lens etc.；Mechanical part is mainly made up of microscope base, handel, focus adjustment and objective switch-over device.
In the optical microscope of prior art, it is typically equipped with the object lens of multiple different enlargement ratio.Can manually or motor rotating device realizes the switching of object lens, to adjust enlargement ratio time actually used.
But, optical microscope belongs to precision machined optical instrument, and its machine components are more, production process is complicated, and finished product is expensive.Especially can realize the optical microscope that different enlargement ratio adjusts, structure is the most complicated, brings limitation therefore to many basic unit's research or production unit Application Optics microscope.Particularly optical microscope is in the detection of some small sample is applied, and the optical microscope of prior art is the most reasonable for cost performance.
Summary of the invention
The present invention can provide a kind of multi-pass microscopic system, can realize different enlargement ratio and can simplify structure, reduce price.For solving the problems referred to above, the present invention provides a kind of multi-pass microscopic system, carries out imaging for measuring targets, including: the first smooth subsystems, for measuring targets imaging, form the first picture；Second smooth subsystems, for measuring targets imaging, forms the second picture, and the amplification of described second smooth subsystems is different from the amplification of described first smooth subsystems；Image collecting device, is positioned at the position of described first picture, for being acquired described first picture；Described image collecting device is also located at the position of described second picture, for being acquired described second picture；First light source, for providing bias light to described first smooth subsystems；Secondary light source, for providing bias light to described second smooth subsystems；Control circuit, including processor, is all connected with described first light source and described secondary light source, for controlling the first light source so that the first picture described in image acquisition device, is additionally operable to control secondary light source so that the second picture described in image acquisition device；First light source described in described processor Time-sharing control and secondary light source are to image acquisition device can be made to the luminous intensity of image.
Compared with prior art, technical scheme includes advantages below:
In multi-pass microscopic system of the present invention, the first picture and the second of the formation of the second smooth subsystems that first smooth subsystems is formed is as being all projected to the receiving plane of image collecting device, by control circuit Time-sharing control the first light source and secondary light source: control the first light source luminescent intensity relatively greatly to first as being received by image collecting device and gather, and the less brightness making the second picture of secondary light source luminous intensity is not high enough cannot be received by image collecting device and gather.Similarly, control secondary light source luminous intensity relatively greatly to second as being received by image collecting device and gather, and the less brightness making the first picture of the first light source luminescent intensity is not high enough cannot be received by image collecting device and gather, simultaneously because the enlargement ratio of heretofore described second smooth subsystems is different from the enlargement ratio of described first smooth subsystems, therefore, multi-pass microscopic system of the present invention can gather the picture of object under test difference enlargement ratio, meet detection demand, the present invention uses a set of image collecting device, the amplification of different multiplying can be realized by Time-sharing control the first light source and secondary light source, simple in construction, cheap, cost performance is high, range is wide.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of multi-pass microscopic system one embodiment of the present invention；
Fig. 2 is the schematic diagram of control circuit one embodiment in Fig. 1.
Detailed description of the invention
As described in the background art, prior art can realize that the microscopic system structure of different enlargement ratio is complex, cost is higher, and therefore range is restricted.
To this end, the present invention provides a kind of multi-pass microscopic system, carry out imaging for measuring targets, including: the first smooth subsystems, for measuring targets imaging, form the first picture；Second smooth subsystems, for measuring targets imaging, forms the second picture, and the amplification of described second smooth subsystems is different from the amplification of described first smooth subsystems；First light source, for providing bias light to described first smooth subsystems；Secondary light source, for providing bias light to described second smooth subsystems；Image collecting device, is positioned at the position of described first picture, for being acquired the image of described first picture；Described image collecting device is also located at the position of described second picture, for being acquired the image of described second picture；Control circuit, including processor, is all connected with described first light source and described secondary light source, for controlling the first light source, so that the first picture described in image acquisition device, is additionally operable to control secondary light source, so that the second picture described in image acquisition device；First light source described in described processor Time-sharing control and secondary light source are to image acquisition device can be made to the luminous intensity of image.
In the present invention, the first picture and the second of the formation of the second smooth subsystems that first smooth subsystems is formed is as being all projected to the receiving plane of image collecting device, by control circuit Time-sharing control the first light source and secondary light source: control the first light source luminescent intensity relatively greatly to first as being received by image collecting device and gather, and the less brightness making the second picture of secondary light source luminous intensity is not high enough cannot be received by image collecting device and gather.Similarly, control secondary light source luminous intensity relatively greatly to second as being received by image collecting device and gather, and the less brightness making the first picture of the first light source luminescent intensity is not high enough cannot be received by image collecting device and gather, simultaneously because the enlargement ratio of heretofore described second smooth subsystems is different from the enlargement ratio of described first smooth subsystems, therefore, multi-pass microscopic system of the present invention can gather the picture of object under test difference enlargement ratio, meet detection demand, the present invention uses a set of image collecting device, the amplification of different multiplying can be realized by Time-sharing control the first light source and secondary light source, simple in construction, cheap, cost performance is high, range is wide.
Understandable for enabling the above-mentioned purpose of the present invention, feature and advantage to become apparent from, below in conjunction with the accompanying drawings the specific embodiment of the present invention is described in detail.
With reference to Fig. 1, it is shown that the schematic diagram of multi-pass microscopic system one embodiment of the present invention.Multi-pass microscopic system of the present invention includes:
Containing object lens light path subsystem 1, carry out imaging for measuring targets 4 according to the first enlargement ratio, form the first picture.The described light path subsystem containing object lens includes: object lens 11 coaxial with described object lens 11 and relative to object lens 11 away from the first lens 13 of object under test 4.In the present embodiment, described first enlargement ratio is 20～400 times, it is thus possible to measuring targets 4 realizes preferably amplification effect.
The present embodiment is the first smooth subsystems containing object lens light path subsystem 1, and described first lens 13 are convex lens.But the structure of the first smooth subsystems is not restricted by the present invention, in other embodiments, described first smooth subsystems can also is that the light path system that other optical elements (such as: lens or multiple lens) form.Or, described first smooth subsystems may also include other optical elements except object lens 11 and the first lens 13, and such as, described first smooth subsystems could be included for the optical element being corrected the image quality of the first picture.
The subsystem of light path without object lens 2, carries out imaging for measuring targets 4 according to the second enlargement ratio, forms the second picture.The described subsystem of light path without object lens 2 includes: the second lens 21 coaxial with described second lens 21 and relative to the second lens 21 away from the 3rd lens 23 of object under test 4.In the present embodiment, described second enlargement ratio is 1～20 times, less than described first enlargement ratio, but owing to not including object lens without object lens light path subsystem 2, therefore, with compared with object lens light path subsystem 1, there is bigger visual field, imaging can be carried out with the large area of measuring targets 4.
The subsystem of light path without object lens 2 of the present embodiment is the second smooth subsystems.Described second lens the 21, the 3rd lens 23 are convex lens.But the structure of the second smooth subsystems is not restricted by the present invention, in other embodiments, described second smooth subsystems can also is that other lens or multiple lens composition light path system.Or, described second smooth subsystems may also include other optical elements except the second lens 21 and the 3rd lens 23, and such as, described second smooth subsystems could be included for the optical element being corrected the image quality of the second picture.
In the present embodiment, described parallel with the optical axis (and optical axis of the 3rd lens 23) of the second lens 21 in the described subsystem of light path without object lens 2 containing the optical axis (and optical axis that the first lens 13 are still) of object lens 11 in object lens light path subsystem 1, the structure that can make multi-pass microscopic system is compacter, but the invention is not limited in this regard.
The present embodiment multi-pass microscopic system also includes: image collecting device 3, is positioned at the position of described first picture, for being acquired described first picture；Described image collecting device 3 is also located at the position of described second picture, for being acquired described second picture.Specifically, described image collecting device 3 is imageing sensor, for the image of collection is converted to the signal of telecommunication.Such as, described image collecting device 3 can include charge coupled cell (Charge-coupled Device, CCD) 31, but the kind of image collecting device 3 is not restricted by the present invention.
As it is shown in figure 1, in the present embodiment, parallel with the optical axis without object lens light path subsystem 2 containing object lens light path subsystem 1, and the receiving plane (i.e. the receiving plane of CCD31) of described image collecting device 3 intersects vertically with the described optical axis containing object lens light path subsystem 1.In order to make described the first picture formed containing object lens light path subsystem 1 and without object lens light path subsystem 2 second as the receiving plane of image collecting device 3 all can be projected to, described also include containing object lens light path subsystem 1:
Semi-transparent semi-reflecting lens 14, is arranged between described first lens 13 and image collecting device 3, for making the light transmission through the first lens 13 arrive the receiving plane of described image collecting device.Concrete, the angle of described semi-transparent semi-reflecting lens 14 and the first lens 13 optical axis is 45 degree, and the reflecting surface of described semi-transparent semi-reflecting lens 14 is towards the side without object lens light path subsystem 2.
The described subsystem of light path without object lens 2 also includes: prism 24, optical path direction is arranged between described 3rd lens 23 and described semi-transparent semi-reflecting lens 14, the reflecting surface of luminous reflectance Zhi described semi-transparent semi-reflecting lens 14 for will transmit through the 3rd lens 23, thus reflex to the receiving plane of described image collecting device 3 further.Specifically, described prism 24 includes the first right-angle surface, the second right-angle surface and the inclined-plane between described first right-angle surface, the second right-angle surface, described inclined-plane be arranged in parallel with described semi-transparent semi-reflecting lens 14, described inclined-plane is reflecting surface towards the face of described semi-transparent semi-reflecting lens 14, described first right-angle surface is parallel with the 3rd lens 23 and is oppositely arranged, the optical axis of described second right-angle surface and the 3rd lens 23 parallel and close to described containing object lens light path subsystem 1.Light through the 3rd lens 23 can reflect, through the described second direct face from the outgoing of described prism 24 after reflection through described first right-angle surface arrival inclined-plane.
It should be noted that the described structure containing object lens light path subsystem 1 with without object lens light path subsystem 2 is not restricted by the present invention.Such as, in other embodiments, the receiving plane (i.e. the receiving plane of CCD31) of described image collecting device 3 can also intersect vertically with the optical axis of the described subsystem of light path without object lens 2, the most described subsystem of light path without object lens 2 can include semi-transparent semi-reflecting lens, described can include reflecting mirror containing object lens light path subsystem 1, those skilled in the art can revise deformation accordingly and replace according to embodiment illustrated in fig. 1.
The most such as, in other embodiments, if the receiving plane of described image collecting device 3 enough big (or little containing object lens light path subsystem 1 and the structure comparison without object lens light path subsystem 2), described image collecting device 3 all can intersect vertically with the described optical axis containing object lens light path subsystem 1 with without object lens light path subsystem 2, it is also possible to is not provided with described semi-transparent semi-reflecting lens and reflecting mirror.
Additionally, in other embodiments, described prism 24 may be replaced by other reflecting mirror.The present invention should not limited with this.
Multi-pass microscopic system of the present invention also includes: the first light source 16, for providing bias light to described containing object lens light path subsystem 1.Specifically, described first light source 16 is used for illuminating the described corresponding region Han object lens light path subsystem 1 visual field.
Secondary light source 25, for providing bias light to the described subsystem of light path without object lens 2.Specifically, described secondary light source 25 is used for illuminating corresponding region, the described subsystem of light path without object lens 2 visual field.
Control circuit 5, in conjunction with reference to Fig. 2, illustrates the schematic diagram of control circuit 5 in Fig. 1.Control circuit 5, including processor 22, all it is connected with described first light source 15 and described secondary light source 25, for control the first light source 15 so that image collecting device 3 gathers described first picture, is additionally operable to control secondary light source 25 so that image collecting device 3 gathers described second picture；Described in described processor 22 Time-sharing control, the first light source 15 and secondary light source 25 are to the luminous intensity that image collecting device 3 can be made to collect image.
In the present embodiment, described in described processor 22 Time-sharing control, the first light source 15 and secondary light source 25 are opened.Specifically, described processor 100 controls to control secondary light source 25 when described first light source 15 is opened and cuts out, when first light source 15 is opened, luminous intensity is sufficiently large can make first as being gathered by image collecting device 3, and now secondary light source 25 is closed, second as being insufficient to bright and cannot be gathered by image collecting device 3, image information that object under test amplifies according to the first enlargement ratio (the biggest multiplying power) that what described microscopic system obtained is.Similarly, close when described processor 100 controls to control described first light source 15 when described secondary light source 25 is opened, when secondary light source 25 is opened, luminous intensity is sufficiently large can make second as being gathered by image collecting device 3, and now the first light source 15 is closed, first as being insufficient to bright and cannot be gathered by image collecting device 3, what described microscopic system obtained is the image information amplified according to the second enlargement ratio (less multiplying power) of object under test, but can realize the purpose that measuring targets large area carries out detecting.
It is relatively simple that processor 22 controls the mode that light source opens or closes, but the invention is not limited in this regard, in other embodiments, described processor 22 can be with the light and shade (i.e. luminous intensity) of the first light source 15 and secondary light source 25 described in Time-sharing control, so that one of them of two light sources illuminate as being gathered (i.e. the brightness of picture higher than gather threshold value) by image collecting device 3, simultaneously another light source illuminate as cannot be gathered by image collecting device 3 (as brightness less than gathering threshold value).
Please continue to refer to Fig. 1, the present embodiment also includes the first lens barrel 12 containing object lens light path subsystem 1, described object lens 11 are arranged at described first lens barrel 12 one end towards object under test 4, described first lens 13 are arranged in described first lens barrel 12, and described semi-transparent semi-reflecting lens 14 is arranged at described first lens barrel 12 one end away from object under test 4.The described subsystem of light path without object lens 2 also includes the second lens barrel 26, described second lens 21 are arranged at described second lens barrel 26 one end towards object under test 4, described 3rd lens 23 are arranged in described second lens barrel 26, and described prism 24 is arranged at described second lens barrel 26 one end away from object under test 4.Described first lens barrel 12 and the second lens barrel 26 can play protection optical element and arrange the effect of optical element relative position relation.In other embodiments, alternate manner can be used to protect optical element or the relative position relation of optical element is set.
As it is shown in figure 1, the first lens barrel 12 is provided with optical baffle 17 towards one end of object under test 4, described optical baffle 17 be arranged in parallel (parallel with optical axis direction) with described object lens 11, for stopping the light leak between described first light source 15 and secondary light source 25.The first light source 15(or secondary light source 25 is opened to reduce) detection first is as second being illuminated by light leak as (or first picture) and the problem that gathered by image collecting device 3 time (or second picture), thus reduce detection interference, improve accuracy of detection.
As it is shown in figure 1, described multi-pass microscopic system includes object stage (not shown), being used for placing object under test 4, described object under test 4 includes the first detection zone and the 34, second detection region 35 and the 3rd detection region 36；Described object stage includes the first visual field district, the second visual field district and the 3rd visual field district.
Described containing object lens light path subsystem 1 for the object under test 4 being positioned over the first visual field district is carried out imaging.In the present embodiment, the first detection region 34 of object under test 4 is positioned at described first visual field district, described containing object lens light path subsystem 1 for the first of described object under test 4 the detection region 34 is carried out imaging.
The described subsystem of light path without object lens 2 is for carrying out imaging to the object under test being positioned over the second visual field district and/or the 3rd visual field district.In the present embodiment, second detection region 35 of object under test 4 is positioned at described second visual field district, 3rd detection region 36 of object under test 4 is positioned at described 3rd visual field district, and the described subsystem of light path without object lens 2 is for carrying out imaging to the second of described object under test 4 the detection region 35 and the 3rd detection region 36.
Described first light source 15, for illuminating the first detection zone 34 of described object under test 4；Described first light source 15 is positioned at below described object under test 4 first detection zone 34.
It should be noted that, bigger enlargement ratio measuring targets 4 is used to carry out imaging, purpose is the details obtaining more objects under test, alternatively, it is additionally provided with light source collecting lens 16 between described first light source 15 and described object under test 4, to improve the brightness of the first picture, and then image collecting device 3 is made to obtain the information of more object under test 4 first detection zone 34.
Described secondary light source 25, for illuminating the second detection zone 35 and the 3rd detection zone 36 of described object under test 4；Described secondary light source 24 is positioned at above described object under test 4 and near described second detection zone 35 and the 3rd detection zone 36.
In order to make described image collecting device 3 more preferably collect the information of object under test 4, described image collecting device 3 is also connected with a position control；Described processor 22, is connected with described position control, for regulating described image collecting device 3 containing object lens light path subsystem 1, without the position in object lens light path subsystem 2 light path by described position control.Specifically, in the present embodiment, described position control is for controlling described image collecting device 3 along the position containing object lens light path subsystem 1 optical axis direction, make described first picture and the second image focu in the receiving surface of described image collecting device 3, thus obtain the picture of object under test 4 the most clearly, and then improve the accuracy of described object under test 4 detection.
In conjunction with reference to Fig. 1 and Fig. 2, in the present embodiment, described position control includes: motor 33, the motor controller being connected with described motor 33；Described processor 22 is connected with described motor controller, for controlling described motor 33 by the described motor controller of control, and then regulates the position of described image collecting device 3, in order to realize automatically focusing on.
Electric signal input end and electrical signal 51 it is additionally provided with on object under test 4 described in the present embodiment, such as, described object under test is diabetes patient's blood sample, second detection zone 35 can export, by described electrical signal 51, the electricity physiological signal that biochemical reaction produces, and described electricity physiological signal is a kind of signal of telecommunication from the output of described electrical signal 51.
Such as: on object under test 4, be placed with specific reagent paper in advance, the electron ion that enzyme generation biochemical reaction specific with on reagent paper causes is increased by blood glucose, thus is recorded the change of electrical conductivity by electrical signal 51；3rd detection zone 36 can change according to the color of the specific observation station of this detection zone thus measure more biochemical indicator simultaneously, such as: under the auxiliary of the specific reagent paper being placed on object under test 4 or immersion coating, by the pH value changing judgement sample of color.
Described control circuit also includes:
Analog input end 101(includes analog input end 1 and analog input end 2) it is connected with described electrical signal 51, for receiving the signal of telecommunication that object under test produces.Such as, described electricity physiological signal.Analog output 102, for applying excitation voltage for object under test 4.
Described processor 22 is additionally operable to make the signal of telecommunication transmission of described analog input end 101 to described analog output 102.
It is to say, the multi-pass microscopic system of the present embodiment can obtain the optical signal (such as: image information) of examining object can also obtain the signal of telecommunication of examining object, such that it is able to provide examining object to detect data in more detail.
It should be noted that control circuit described in the present embodiment also includes outfan；Described image collecting device 3 is for being converted to the signal of telecommunication by the picture gathered；Described control circuit also includes the image capture controller being connected with image collecting device and the Signal Compression processor being connected with described image capture controller, described image capture controller controls described image collecting device and is acquired, and also sends the described signal of telecommunication to Signal Compression processor；Described Signal Compression processor is for processing described Signal Compression processor, it is thus achieved that picture signal；In the present embodiment, described image collecting device 3 includes that CCD31, described image capture controller are CCD controller 32, and described Signal Compression processor processes for the signal of telecommunication forming CCD31.
Described processor 22 in described control circuit, is connected with described Signal Compression processor, is additionally operable to send to outfan described picture signal.
Alternatively, described outfan for storage circuit 103, image display cell 105, user interface elements 104(UI) in one or more.
In the present embodiment, described processor 22 and storage circuit 103, image display cell 105, user interface elements 104(UI) all it is connected.
Described processor 22, can store picture signal transmission to storage circuit 103 the first picture of examined object 4 or the information of the second picture correspondence.
Described processor 22, can send picture signal to image display cell 105, and the image corresponding for the first picture gathered by image collecting device 3 or the second picture processes and export.As in figure 2 it is shown, described control circuit also includes the outside display interface 106 being connected with described image display cell 105, for being connected in display device export the picture of the object under test 4 of multi-pass microscopic system detection, to provide the user impression more intuitively.Outside display interface 106 is the interface being linked with mobile terminal, and described mobile terminal can be mobile phone, panel computer etc..
Described processor 22, can send picture signal to user interface elements 104.Described user interface elements 104 is except receiving described picture signal, user instruction can also be sent to described processor 22, described user instruction can be to open the first light source 15 or the instruction of secondary light source 25, can be regulation the first light source 15 or instruction of secondary light source 25 light and shade, or make the instruction that image collecting device 3 focuses on automatically.
Below in conjunction with the using method of the present embodiment multi-pass microscopic system, further describe the technical scheme of multi-pass microscopic system of the present invention.Described using method includes:
Being positioned on object stage by object under test 4, wherein, the first detection zone 34 of described object under test 4 is positioned at the visual field containing object lens optical subsystem 1, and the second detection zone 35 of described object under test 4 and the 3rd detection zone 36 are positioned at the visual field without object lens optical subsystem 2.
Switch on power 6, by control circuit 5 Time-sharing control the first light source 15, the switch of secondary light source 24, make the first detection zone 34 of object under test 4 and the second detection zone 35 of object under test 4 and the 3rd detection zone 36 as being projected to respectively on CCD in the different time stage.
Then the picture signal that processor 22 gathers according to CCD31 and passes back through Signal Compression circuit, according to auto-focusing algorithm, operation motor controller, the focal position that mobile CCD 31 to focus algorithm obtains, to reach auto-focusing, make the first detection zone 34 of object under test 4 and the second detection zone 35 of object under test 4 become on CCD31 with the 3rd detection zone 36 clearly as.
Observed the image of object under test 4 first detection zone 34 containing object lens light path subsystem 1 by the object lens 11 of high multiple, containing object lens light path subsystem 1 according to the object lens selected, the amplification effect of 20 to 400 multiplying powers can be reached.
The amplification of the subsystem of light path without object lens 2 is between 1 to 20 times, and the picture after amplification projects to CCD31 through prism 24 and semi-transparent semi-reflecting lens 14.With compared with object lens light path subsystem 1, although the amplification without object lens light path subsystem 2 is limited, but can detect with measuring targets 4 larger area scope.
To sum up, the multi-pass microscopic system that the present invention provides can provide different enlargement ratio, such that it is able to meet the demand of different user.Additionally, the present invention only comprises a set of image collecting device and realizes the switching of different enlargement ratio by controlling light source, simple in construction, cheap.
It should be noted that, this microscopic system sentencing double light path illustrates, but the invention is not limited in this regard, in other embodiments, described multi-pass microscopic system can also include other light subsystems, and constitute the multi-pass microscopic system of three light paths, four light paths etc., to provide the selection of more multiplying power, improve the general applicability of multi-pass microscopic system further.Specifically, similar with the microscopic system of above-mentioned double light path, different light sources can be set, by the processor in control circuit, light source is carried out Time-sharing control, detect with the picture respectively different light paths formed by image collecting device.The present invention can correspondingly be revised according to above-described embodiment, deforms and replace by those skilled in the art.
Although present disclosure is as above, but the present invention is not limited to this.Any those skilled in the art, without departing from the spirit and scope of the present invention, all can make various changes or modifications, and therefore protection scope of the present invention should be as the criterion with claim limited range.
Claims (18)
1. a multi-pass microscopic system, carries out imaging for measuring targets, it is characterised in that including:
First smooth subsystems, for measuring targets imaging, forms the first picture；
Second smooth subsystems, for measuring targets imaging, forms the second picture, described second light path subsystem
The amplification of system is different from the amplification of described first smooth subsystems；
Image collecting device, is positioned at the position of described first picture, for being acquired described first picture；
Described image collecting device is also located at the position of described second picture, for adopting described second picture
Collection；
First light source, for providing bias light to described first smooth subsystems；
Secondary light source, for providing bias light to described second smooth subsystems；
Control circuit, including processor, is all connected with described first light source and described secondary light source, is used for controlling
Make the first light source so that the first picture described in image acquisition device, be additionally operable to control secondary light source so that
Second picture described in image acquisition device；First light source and second described in described processor Time-sharing control
Light source, to image acquisition device can be made to the luminous intensity of image, makes described image collecting device divide
Time gather described first picture and the second picture.
2. multi-pass microscopic system as claimed in claim 1, it is characterised in that described first light path subsystem
The enlargement ratio of system is more than the enlargement ratio of described second smooth subsystems, described second smooth subsystems
Visual field more than the visual field of described first smooth subsystems.
3. multi-pass microscopic system as claimed in claim 2, it is characterised in that
Described first smooth subsystems is containing object lens light path subsystem, including: object lens are coaxial with described object lens
And relative to described object lens away from the first lens of object under test；
Described second smooth subsystems is without object lens light path subsystem, including: the second lens and described second
Lens coaxial and relative to described second lens away from the 3rd lens of object under test.
4. multi-pass microscopic system as claimed in claim 3, it is characterised in that described first light path subsystem
Unite parallel with the optical axis of the second described smooth subsystems, and the receiving plane of described image collecting device with
The optical axis of described first smooth subsystems intersects vertically；
Described multi-pass microscopic system also includes: semi-transparent semi-reflecting lens, is arranged at described first lens with described
Between image collecting device, for making the light transmission through the first lens arrive described image collecting device
Receiving plane；
Reflecting mirror, is arranged on optical path direction between described 3rd lens and described semi-transparent semi-reflecting lens, is used for
Will transmit through the luminous reflectance reflecting surface to described semi-transparent semi-reflecting lens of the 3rd lens；
The reflecting surface of described semi-transparent semi-reflecting lens is for the reception by reflected light back to described image collecting device
Face.
5. multi-pass microscopic system as claimed in claim 4, it is characterised in that described semi-transparent semi-reflecting lens with
Described first smooth subsystems optical axis included angle is 45 degree, and the reflecting surface of described semi-transparent semi-reflecting lens is towards
The side of two smooth subsystems.
6. multi-pass microscopic system as claimed in claim 5, it is characterised in that described reflecting mirror is Rhizoma Sparganii
Mirror, including: the first right-angle surface, the second right-angle surface and be positioned at described first right-angle surface, the second right-angle surface
Between inclined-plane, described inclined-plane be arranged in parallel with described semi-transparent semi-reflecting lens, and described inclined-plane is towards described half
The face of semi-reflective mirror is reflecting surface thoroughly.
7. multi-pass microscopic system as claimed in claim 4, it is characterised in that described first light path subsystem
System also includes that the first lens barrel, described object lens are arranged at described first lens barrel one end towards object under test,
Described first lens are arranged in described first lens barrel, and described semi-transparent semi-reflecting lens is arranged at described first mirror
Cylinder is away from one end of object under test；
Described second smooth subsystems also includes that the second lens barrel, described second lens are arranged at described second lens barrel
Towards one end of object under test, described 3rd lens are arranged in described second lens barrel, and described reflecting mirror sets
It is placed in described second lens barrel one end away from object under test.
8. multi-pass microscopic system as claimed in claim 7, it is characterised in that described first lens barrel towards
One end of object under test is provided with optical baffle, is used for stopping between described first light source and secondary light source
Light leak.
9. multi-pass microscopic system as claimed in claim 2, it is characterised in that described multi-pass microscope
System includes object stage, is used for placing object under test；Object under test includes the first detection zone, the second inspection
Survey district and the 3rd detection zone；
Described first smooth subsystems carries out imaging for the first detection zone of measuring targets；
Described second smooth subsystems becomes for the second detection zone and the 3rd detection zone of measuring targets
Picture；
Described first light source, is used for illuminating described first detection zone；
Described secondary light source, is used for illuminating described second detection zone and the 3rd detection zone.
10. multi-pass microscopic system as claimed in claim 9, it is characterised in that described object under test is placed
On described object stage, described first light source is positioned at the lower section of object under test the first detection zone；Described
Two light sources are positioned at above described object under test and near described second detection zone and the 3rd detection zone.
11. multi-pass microscopic systems as claimed in claim 10, it is characterised in that described first light source and institute
State and between object under test, be additionally provided with light source collecting lens.
12. multi-pass microscopic systems as claimed in claim 1, it is characterised in that described processor is for dividing
Time control described first light source and secondary light source is opened.
13. multi-pass microscopic systems as claimed in claim 1, it is characterised in that described image collecting device
For the image of collection is converted to the signal of telecommunication；
Described control circuit also includes:
The image capture controller being connected with described image collecting device, is used for controlling described image collecting device
It is acquired；
The Signal Compression processor being connected with described image capture controller, for being formed image collecting device
The described signal of telecommunication process, it is thus achieved that picture signal；
Described control circuit also includes outfan；
Described processor, is connected with described Signal Compression processor, is additionally operable to send extremely described picture signal
Described outfan.
14. multi-pass microscopic systems as claimed in claim 13, it is characterised in that described outfan is storage
One or more in circuit, image display cell, user interface elements.
15. multi-pass microscopic systems as claimed in claim 1, it is characterised in that described image collecting device
It is connected with a position control；
Described processor, is connected with described position control, for being regulated by described position control
Described image collecting device position on described first smooth subsystems or the second smooth subsystems light path.
16. multi-pass microscopic systems as claimed in claim 15, it is characterised in that described position control
Including: motor and the motor controller of described motors；
Described processor is connected with described motor controller, right for being realized by the described motor controller of control
The control of described motor, to regulate the position of described image collecting device.
17. multi-pass microscopic systems as claimed in claim 1, it is characterised in that described object under test is used for
During detection, produce the signal of telecommunication, described object under test is additionally provided with electric signal input end and telecommunications
Number outfan, described control circuit also includes:
Analog input end, is connected with described electrical signal, for receiving the signal of telecommunication that object under test produces；
Analog output, for applying excitation voltage for object under test；
Described processor is additionally operable to make the signal of telecommunication transmission of described analog input end to described analog output.
The 18. multi-pass microscopic systems as described in claim 1～17 any one claim, it is characterised in that
Described image collecting device includes CCD.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410198849.4A CN103955050B (en) | 2014-05-13 | 2014-05-13 | A kind of multi-pass microscopic system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410198849.4A CN103955050B (en) | 2014-05-13 | 2014-05-13 | A kind of multi-pass microscopic system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103955050A CN103955050A (en) | 2014-07-30 |
| CN103955050B true CN103955050B (en) | 2016-08-24 |
Family
ID=51332341
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410198849.4A Active CN103955050B (en) | 2014-05-13 | 2014-05-13 | A kind of multi-pass microscopic system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103955050B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018534589A (en) | 2015-09-30 | 2018-11-22 | 蘇州精創光学儀器有限公司Ｓｕｚｈｏｕ Ｐｔｃ Ｏｐｔｉｃａｌ Ｉｎｓｔｒｕｍｅｎｔ Ｃｏ．，Ｌｔｄ | Glass surface stress meter and multi-tempered glass surface stress meter |
| CN105115635B (en) * | 2015-09-30 | 2018-05-11 | 苏州精创光学仪器有限公司 | Multiple tempered glass surface stress instrument |
| CN107271442A (en) * | 2017-07-21 | 2017-10-20 | 黄宁 | A kind of medical test multipurpose test system |
| JP7109130B2 (en) * | 2018-04-04 | 2022-07-29 | 株式会社エビデント | microscope |
| CN109061864A (en) * | 2018-08-29 | 2018-12-21 | 北京铂石空间科技有限公司 | Light path switching device and optical path switching method |
| CN111505819B (en) * | 2020-05-21 | 2022-04-05 | 杨星瑶 | Microscopy instrument and method for repeated positioning and measurement by using digital sequence image |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3854665B2 (en) * | 1996-08-30 | 2006-12-06 | オリンパス株式会社 | microscope |
| CN2919282Y (en) * | 2006-07-03 | 2007-07-04 | 北京华旗资讯数码科技有限公司 | Combined type microscope |
| KR101089292B1 (en) * | 2009-05-20 | 2011-12-02 | 한국과학기술원 | Reflection and Fluorescence Hybrid in-vivo Confocal Laser Scanning Microscope for Bio-Medical Applications |
| CN102593011B (en) * | 2011-01-06 | 2015-09-16 | 北京中电科电子装备有限公司 | A kind of optical recognition system |
| CN103235406B (en) * | 2013-04-27 | 2015-01-07 | 中国科学院化学研究所 | Total internal reflection illumination and semi-total internal reflection illumination dual optical path fluorescence microscope system |
-
2014
- 2014-05-13 CN CN201410198849.4A patent/CN103955050B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN103955050A (en) | 2014-07-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103955050B (en) | A kind of multi-pass microscopic system | |
| US10229310B2 (en) | High throughput partial wave spectroscopic microscopy and associated systems and methods | |
| US10578851B2 (en) | Automated hardware and software for mobile microscopy | |
| CN102353519B (en) | Resolving power evaluation method for three-generation dim light image intensifier | |
| EP2630536B1 (en) | Microscope system | |
| US10116848B2 (en) | Illumination and imaging system for imaging raw samples with liquid in a sample container | |
| WO2011132586A1 (en) | Cell observation device and cell observation method | |
| JP6676613B2 (en) | Method and apparatus for microscopic inspection of a sample | |
| EP2402813A2 (en) | Microscope and area determination method | |
| WO2011132587A1 (en) | Cell observation device and cell observation method | |
| US20210217190A1 (en) | Analyzer for three-dimensionally analyzing a medical sample by means of a light field camera | |
| CN106210520A (en) | A kind of automatic focusing electronic eyepiece and system | |
| US9906698B2 (en) | Imaging apparatus and imaging method | |
| CN103168265A (en) | Imaging systems and associated methods thereof | |
| WO2014070082A1 (en) | Quantitative phase microscopy for label-free high-contrast cell imaging | |
| US20230062698A1 (en) | Method for digitally staining cells | |
| CN108845406A (en) | The full-automatic micro imaging method of more multiplying powers and device | |
| CN105807413B (en) | It is a kind of to fall radioglold phase microscope based on light modulation techniques | |
| CN204883038U (en) | Sample test is with digital microscope of portable panel computer | |
| CN218728311U (en) | Large eyepiece microscope convenient to observe | |
| WO2020010634A1 (en) | Cell image processing system and method, automatic smear reading device, and storage medium | |
| CN110178015B (en) | Image pickup method and image pickup apparatus | |
| CN110161671A (en) | Microscopic imaging device is imaged in dark field, light field, phase contrast, fluorescence multi-modal synchronization | |
| JP2018105936A (en) | Microscope and method for supporting setting | |
| CN103105285B (en) | Shadow-rejection based test method and test instrument for optical fiber panel limiting resolution |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |