CN103954538A - Dry-type granule granularity measuring device - Google Patents
Dry-type granule granularity measuring device Download PDFInfo
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- CN103954538A CN103954538A CN201410195358.4A CN201410195358A CN103954538A CN 103954538 A CN103954538 A CN 103954538A CN 201410195358 A CN201410195358 A CN 201410195358A CN 103954538 A CN103954538 A CN 103954538A
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Abstract
The invention provides a dry-type granule granularity measuring device which comprises a light source system, a suspension system, a detection system and a computer processing system, wherein the suspension system comprises a vacuum chamber, an upper and lower pole plates are horizontally arranged in the vacuum chamber, the upper pole plate is connected to the ground, the lower pole plate is connected with the negative pole of a direct current power supply, and the positive pole of the direct current power supply is connected to the ground; a granule tank for containing granules to be measured is arranged between the upper pole plate and the lower pole plate; and the granule tank is connected with a vibrating bar which penetrates out of the vacuum chamber. The device for measuring granule granularity is simple and convenient to operate and quick and accurate for measurement, and provides a solution for quick analysis and detection in the fields of laboratories and industry.
Description
Technical field
The present invention relates to a kind of particle size analyzer, specifically a kind of dry type grain graininess measurement mechanism.
Background technology
Particle size analyzer is a kind of instrument for testing solid particle size and distributing, and it has been widely used in the fields such as biology, physics, chemical industry, pharmacy and Analysis on Environment Contamination.Existing particle size analyzer comprises laser particle analyzer and particle image instrument.Laser particle analyzer adopts Mie scattering principle to test dynamic particle, and dynamic particle can be disperseed by wet method, dry method or dry-wet integratedization mode.
Existing laser particle analyzer is comprised of four major parts substantially: 1) light-source system; 2) suspension system; 3) detection system; 4) computer processing system.Most monochromaticity and the good laser of directivity of adopting of light source in light-source system, also can adopt light emitting diode, and its fundamental purpose is irradiate particle and scattering occurs.Suspension system generally comprises the circulation system and sample cell, and its fundamental purpose is particle to be placed in to fluid disperse and suspend, to guarantee that particle can be irradiated to and occur scattering by light source.Detection system is generally comprised of lens and sensor devices (as CCD or photomultiplier), is used for recording the scattered light of particle to light source.The data that computer processing system obtains detection system according to adopted measuring principle are carried out computational analysis and are provided particle size distribution figure.Measuring principle mainly contains two kinds: the Brownian movement principle of particle and the particle Mie scattering principle to light source.
Suspension system is a core of laser particle analyzer, and it has determined to a great extent operability, measuring accuracy, the measurement range of laser particle analyzer and has measured cost.Existing laser particle analyzer generally adopts the method (being wet method) of liquid suspended-particle to reach the object of dispersion and suspended particulate substance, as: the grain graininess instrument (CN102095672B) that a kind of particle-size measuring instrument (CN102207443B), a kind of multi-method merge, a kind of a kind of method (CN101769847B) and method (CN101393209B) of using dynamic light scattering high-sensitively detecting microcystin of measuring polytetrafluoroethylpowder powder mean grain size and particle diameter distribution thereof, all adopt wet method to disperse.But wet processing has following drawback: 1) consider that some particle may be dissolved in some liquid, therefore want this class particle just to measure and must choose suitable liquid.This must cause measuring process loaded down with trivial details, and testing cost is high.2) because particle size analyzer need to be added up just and can obtain result integral particle sample, therefore wet processing need to be installed fluid circulation system, pass through fluid circulation system, particle flows with fluid, this can make particle dispersion suspension on the one hand, is for each particle can be irradiated to by light source in flow process on the other hand.But this must cause Measuring Time long, reliability reduces.3) when laser is by liquid, certain decay can occur, thereby cause the sensitivity of system, measuring accuracy is poor.Even if system can configure highly sensitive CCD, but this inevitable system cost that greatly increased again.
Except wet processing, prior art also has the dry type measuring method that adopts gas suspension particle.Thereby but dry method still needs to make gas flow to drive particle flow.And gas flow can cause that gas density and refractive index change, this can disturb laser optical path to a certain extent, reduces measuring accuracy.In addition, adopt drying measure, particle can be attached to circulating device surface, pollutes the whole circulation system, causes cleaning up very difficult.
Summary of the invention
Object of the present invention is just to provide a kind of dry type grain graininess measurement mechanism, with solve existing laser particle analyzer in kinetic measurement process because particles circulating motion causes complex operation, Measuring Time is long, measuring accuracy is low problem.
The present invention is achieved in that a kind of dry type grain graininess measurement mechanism, comprises light-source system, suspension system, detection system and computer processing system; Described suspension system comprises vacuum chamber, has been horizontally disposed with upper and lower two pole plates in described vacuum chamber, described top crown ground connection, and described bottom crown connects the negative pole of direct supply, the plus earth of described direct supply; Between described top crown and described bottom crown, be provided with for holding the particle pond of particle to be measured, described particle pond connects the vibrating arm that passes described vacuum chamber.
The present invention has been horizontally disposed with upper and lower two pole plates in vacuum chamber, top crown ground connection, and bottom crown connects the negative pole of direct supply, the plus earth of direct supply, like this, direct supply power is coupled between upper and lower pole plate, thereby produces uniform plasma between upper and lower pole plate.Particle in particle pond spreads out from particle pond by vibrating arm, enters in plasma and is with negative charge, because like charges repels mutually, therefore, between particle, will repel each other, thereby particle is spread out, form the suspension system of a stable state, dispersion.Therefore because the gas in vacuum chamber is substantially static, can overcome in existing dry process because gas flow causes the shortcoming of interference to laser optical path, and then can improve measuring accuracy.
Suspension system in the present invention is because using plasma disperses particle and in stable state suspended state, therefore measuring process belongs to dry process, this dry process is compared with the wet processing of existing laser particle analyzer, the series of problems that the measuring process that can avoid existing wet processing to bring is loaded down with trivial details, Measuring Time is long etc.
Described bottom crown is metal plate; On described bottom crown, be provided with for preventing that the particle being spread out by described particle pond from falling the glass ring in described bottom crown outside.On bottom crown, put glass ring, this can constrain in the particle being spread out by particle pond bottom crown top on the one hand, so that the camera in detection system is observed in certain visual field; On the other hand, after measuring complete deenergization, particle will drop in bottom crown glass ring naturally, follow-up need be taken out bottom crown to clean, and need not clean whole vacuum chamber, overcome each deficiency of measuring the whole circulation system of complete necessary cleaning in existing dry method and wet processing, simple, convenient.
Surface at described bottom crown is formed with frosted layer by frosting technology, on the surface of described frosted layer, by blacking technique, is formed with blacking layer.Blacking layer on bottom crown can effectively absorb bias light, improves the discrimination of the captured movement of particles trace image of camera.
Described top crown is comprised of two ITO electro-conductive glass, and the ITO rete in two described ITO electro-conductive glass is bonded to each other.This " sandwich " shape structure of top crown, can prevent that the high energy particle in discharge process applying plasma from damaging ITO rete.
Described particle pond is formed by the multiple layer metal net compacting of different meshes; Described vibrating arm is vertical setting, and described particle pond joins by horizontally disposed insulating bar and described vibrating arm.Because particle pond is made and formed by wire netting, so particle pond will be charged at plasma area, by insulating bar, particle pond and vibrating arm joined, and can avoid to vibrating arm, damaging vibrating arm because of the charge transfer on particle pond.
Center position in described bottom crown bottom surface is socketed with insulation sleeve, and in described insulation sleeve, cross-under has plain conductor, and described bottom crown joins by the negative pole of described plain conductor and described direct supply.
On the cavity of described vacuum chamber, have air intake opening and gas outlet; By described air intake opening, can in described vacuum chamber, be filled with air or argon gas, at described air intake opening, place is provided with flowmeter, by regulating described flowmeter can control the air pressure in described vacuum chamber; In described gas outlet, place is provided with for measuring the vacuum meter of vacuum chamber internal gas pressure.
Described light-source system is arranged on the outer position relative with the side window of described vacuum chamber of described vacuum chamber; Described light-source system comprises semiconductor laser, in the place ahead of described semiconductor laser, is provided with plano-convex cylindrical lens; Described semiconductor laser and described plano-convex cylindrical lens are together arranged on a lifting table.By regulating the height of described lifting table, can make described semiconductor laser successively scan and irradiate particle to be measured.
Described detection system is arranged on the top of the upper window of described vacuum chamber; Described detection system comprises camera, is provided with the increment ring being connected with camera lens rear portion before described camera; The place ahead at described camera lens is provided with bandpass filter, is sent out light frequency sharp fall within the scope of the frequency passband of described bandpass filter by described semiconductor laser.At camera lens rear portion, increment ring is set, can takes into account the visual field and the enlargement ratio of camera, the visual field can reach the scope of several centimetres, is conducive to a large amount of particulate samples to be added up.Simultaneously, bandpass filter is set before camera lens, make its frequency passband scope cover the centre frequency of laser that semiconductor laser is sent out, only allow near the scattered light of laser center frequency to enter camera, can effectively filter the bias light of plasma, effectively improve the contrast of particle image, and then improve measuring accuracy.
Camera in described computer processing system and described detection system joins; Described camera is for taking the Brownian movement trace image of particle in vacuum chamber and transferring to described computer processing system, and described computer processing system is for according to the mean square displacement <r of received image calculation particle
2>, and according to the Brownian movement principle of particle, according to formula
The particle diameter of count particles; In formula: k
bfor Boltzmann constant, T is temperature, and t is the duration of camera image, and η is gas viscosity, and r is particle position.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Fig. 2 is the structural representation of top crown in the present invention.
Fig. 3 is bottom crown and connect the structural representation of wire in the present invention.
Fig. 4 is by the path curves figure of a captured particle of camera in the present invention.
In figure: 1, vacuum chamber, 2, bandpass filter, 3, top crown, 3-1, glassy layer, 3-2, ITO rete, 4, particle pond, 5, vibrating arm, 6, side window, 7, particle to be measured, 8, plano-convex cylindrical lens, 9, lifting table, 10, semiconductor laser, 11, glass ring, 12, bottom crown, 12-1, metal plate, 12-2, frosted layer, 12-3, blacking layer, 13, insulation sleeve, 14, flowmeter, 15, direct supply, 16, vacuum meter, 17, camera, 18, increment ring, 19, camera lens, 20, computer processing system, 21, plain conductor.
Embodiment
As shown in Figure 1, the present invention includes light-source system, suspension system, detection system and computer processing system 20.
Suspension system comprises vacuum chamber 1, and vacuum chamber 1 is surrounded by stainless steel cavity, stainless steel cavity ground connection; In vacuum chamber 1, be horizontally disposed with upper and lower two pole plates, top crown 3 ground connection, bottom crown 12 connects the negative pole of direct supply 15, the plus earth of direct supply 15, direct supply 15 is positioned at outside vacuum chamber 1.After direct supply 15 is connected, by electric discharge, between upper and lower pole plate, produce uniform plasma.The voltage of direct supply 15 can be 0～1000V.
As shown in Figure 2, top crown 3 is comprised of two ITO electro-conductive glass, each piece ITO electro-conductive glass includes glassy layer 3-1 (material can be quartz glass) and is plated in the ITO conductive membrane layer 3-2 (being called for short ITO rete) on glassy layer 3-1, these two ITO electro-conductive glass are superimposed in opposite directions, and the ITO rete 3-2 in two ITO electro-conductive glass is close together, make top crown 3 form " sandwich " structure of " glassy layer-ITO rete-glassy layer " shape, this structure can prevent that the high energy particle in discharge process applying plasma from damaging ITO rete 3-2.
As shown in Figure 3, bottom crown 12 comprises the metal plate 12-1 of bottom, and metal plate 12-1 can be dull and stereotyped for square, for example, be the metal plate of 50 * 50mm; Surface at metal plate 12-1 is formed with frosted layer 12-2 by frosting technology, on the surface of frosted layer 12-2, by blacking technique, is formed with blacking layer 12-3.Blacking layer 12-3 can absorb bias light effectively, improves the discrimination of the captured particle 7 movement locus images of vacuum chamber 1 top camera 17.Centre-drilling hole at the bottom of the plate of metal plate 12-1 is socketed with insulation sleeve 13 in bored hole, and the material of insulation sleeve 13 can be teflon, and the wall thickness of insulation sleeve 13 can be 10mm; In the interior cross-under of insulation sleeve 13, have plain conductor 21, metal plate 12-1 joins by plain conductor 21 and the negative pole of the outer direct supply 15 of vacuum chamber 1.Because bottom crown 12 is metal plate structure, so it equates with the distance between top crown 3, therefore can produce uniform plasma during electric discharge between upper and lower pole plate.
Between top crown 3 and bottom crown 12, be provided with for holding the particle pond 4 of particle 7 to be measured, particle pond 4 is formed by the multiple layer metal net compacting of different meshes, the surface in particle pond 4 is preferably in horizontality, and the center in particle pond 4 is preferably on the axial line in upper and lower pole plate, and the height in particle pond 4 can be arranged on the middle part of upper and lower pole plate.Particle pond 4 joins by the connecting link of level and vertical vibrating arm 5, and vibrating arm 5 passes outside vacuum chamber 1.Outside vacuum chamber 1, by moving up and down vibrating arm 5, can make particle pond 4 move up and down, outside vacuum chamber 1, by rotational vibrations bar 5, can make particle pond 4 move left and right; Outside vacuum chamber 1, by making vibrating arm 5 vibrations can make the particle in particle pond 4 spread out outside particle pond 4, the vibration of vibrating arm 5 can also can be passed through electric operating by operating manually, and during electric operating, its frequency can be 1～10Hz.Connecting link between particle pond 4 and vibrating arm 5 is insulating bar, and its material can be teflon; This insulating bar can prevent particle pond 4 in plasma region because conduction is damaged vibrating arm 5.
The particle 7 being provided with on bottom crown 12 for preventing from being spread out by particle pond 4 is fallen the glass ring 11 in bottom crown 12 outsides, and the diameter of glass ring 11 is slightly less than the length of side of bottom crown 12.Glass ring 11 can constrain in the particle being spread out by particle pond 47 bottom crown 12 tops on the one hand, so that the camera in detection system 17 is observed in certain visual field; On the other hand, after measuring complete deenergization, particle 7 will drop in bottom crown glass ring 11 naturally, follow-up need be taken out bottom crown 12 to clean, and need not clean whole vacuum chamber 1, overcome each deficiency of measuring the whole circulation system of complete necessary cleaning in existing dry method and wet processing, simple, convenient.
On the cavity of vacuum chamber 1, have air intake opening and gas outlet.By air intake opening, can in vacuum chamber 1, be filled with air or argon gas; Air intake opening place is provided with flowmeter 14, and this flowmeter 14 can be mass flowmeter, by adjust flux meter 14, can control the air pressure in vacuum chamber 1; In gas outlet, place is provided with for measuring the vacuum meter 16 of vacuum chamber 1 internal gas pressure.Air pressure general control in vacuum chamber 1 is between 10～200Pa.
Light-source system is arranged on the outer position relative with the side window 6 of vacuum chamber 1 of vacuum chamber 1, and side window 6 can be made by quartz glass.Light-source system comprises semiconductor laser 10, in the place ahead of semiconductor laser 10, is provided with plano-convex cylindrical lens 8, and plano-convex cylindrical lens 8 is arranged on lens carrier; Semiconductor laser 10, plano-convex cylindrical lens 8 and lens carrier are together arranged on a lifting table 9.The power bracket of semiconductor laser 10 is 5～100mW, and the centre wavelength of semiconductor laser 10 laser of sending out is 532nm or 650nm.
The axis of lens of plano-convex cylindrical lens 8 should vertically arrange, so that the laser of being sent out by semiconductor laser 10 forms the laser beam of a fan-shaped surface level after plano-convex cylindrical lens 8 expands.By regulating the horizontal level of plano-convex cylindrical lens 8, make the laser beam of laser formed fan-shaped surface level after plano-convex cylindrical lens 8 can cover the corresponding width range of bottom crown 12, that is: make laser spread angle cover all particles in corresponding surface level, and particle is irradiated.Lifting table 9 can be driven by stepper motor, by regulating umber of pulse and the frequency of stepper motor, can regulate the height of lifting table 9.The minimum step of stepper motor can reach micron dimension, so the present invention can successively scan micron particles.
Detection system is arranged on the top of the upper window of vacuum chamber 1, and upper window can be made by quartz glass.Detection system comprises camera 17, and camera 17 is high-resolution camera, the optical axis of camera 17 vertically, during video recording the focal plane of camera 17 with expand after fan-shaped surface level laser beam must be coplanar; Before camera 17, be provided with the increment ring 18 being connected with camera lens 19 rear portions; Increment ring 18 is comprised of more piece, can single-unit or more piece use; Camera lens 19 is generally telephoto lens, and its maximum focal length can reach 250mm.The cooperation of increment ring 18 and telephoto lens 19, can make camera 17 take into account the visual field and enlargement ratio, and the visual field can reach the scope of several centimetres, is conducive to a large amount of particulate samples to be added up.
In the place ahead of camera lens 19, be provided with bandpass filter 2, bandpass filter 2 is arranged on cage mount pad.The frequency passband scope of bandpass filter 2 cover by semiconductor laser 10 send out light frequency sharp, so only allow near the scattered light of laser center frequency to enter camera, can effectively filter the bias light of plasma, effectively improve the contrast of particle image, and then improve measuring accuracy.
Computer processing system 20 joins with the camera 17 in detection system; The Brownian movement track video recording of the particle that camera 17 is captured is the file of MOV form, this document transfers to computer processing system 20 by camera 17, in computer processing system 20, prestore the Matlab program of finishing, this program can be identified and follow the tracks of the particle in video recording; Computer processing system 20 mean square displacement <r of count particles first after receiving video recording
2>, afterwards according to the Brownian movement principle of particle, according to formula
Calculate the particle diameter of all particles, obtain particle size distribution figure; In formula: k
bfor Boltzmann constant, T is temperature, and t is the duration of camera image, and η is gas viscosity (corresponding with air pressure), and r is particle position.
With a specific embodiment, introduce measuring process of the present invention below.
In conjunction with Fig. 1, particle 7 to be measured is placed in to the particle pond 4 in vacuum chamber 1; To being filled with argon gas and vacuumizing in vacuum chamber 1, make air pressure reach 70Pa.The voltage that direct supply 15 is set is 300V, connects direct supply 15, makes bottom crown 12 electronegative, produces uniform plasma afterwards by electric discharge between upper and lower pole plate.
Open semiconductor laser 10, it is 50mW that its power is set, and the centre wavelength of semiconductor laser 10 laser of sending out is 532nm.The plano-convex cylindrical lens 8 that regulates semiconductor laser 10 the place aheads, vertically arranges the axis of lens, guarantees that laser forms a fan-shaped surface level laser beam after expanding.The horizontal level that regulates plano-convex cylindrical lens 8, makes fan-shaped surface level laser-beam divergence angle can cover the corresponding width range of bottom crown 12.The umber of pulse of control step motor and frequency, regulate the height of lifting table 9, make fan-shaped surface level laser beam along bottom crown 12 top about 8mm At The Height glancing incidences in vacuum chamber 1, this position also may be irradiated less than particle, follow-up need to again adjusting.
Regulate vibrating arm 5 so that the center position of particle pond 4 in upper and lower pole plate.Outside vacuum chamber 1, make vibrating arm 5 vibrations, thereby drive particle pond 4 vibrations in vacuum chamber 1, the particle in particle pond 4 is spread out.Spread the rear rotational vibrations bar 5 of particle 7 particle pond 4 has been moved apart to plasma region.Camera 17 Real Time Observation that this process can arrange by vacuum chamber 1 top.
The particle 7 spreading out enters in plasma region, in plasma, the ion of electronegative electronics and positively charged can run up on particle, due to the movement velocity of the electronics movement velocity much larger than ion, when therefore the electron stream on running up to particle and ion current reach balance, particle generally can be with upper a certain amount of negative charge.Particle 7 can move downward due to the effect of gravity in plasma region; In the time of near particle 7 drops to bottom crown 12, because bottom crown 12 has negative potential, so particle 7 will be subject to applied force of electrostatic field upwards.When the gravity being subject to when particle 7 and electrostatic field force reach balance, particle 7 will be suspended near bottom crown 12 tops.Meanwhile, because particle 7 all carries negative charge, between them, will mutually repel, thereby scatter, form a good dispersion, suspension system.
Regulate the height of lifting table 9, make fan-shaped surface level Ear Mucosa Treated by He Ne Laser Irradiation after expanding to the particle to be measured 7 of the bottom.Regulate the horizontal level of plano-convex cylindrical lens 8, control and be irradiated to the laser power density on particle 7 to be measured, make after particle scattering laser high-visiblely, but make again optical pressure can not affect greatly particle 7 motions.
After on particle 7, can there is scattering, camera 17 records for scattered light in Ear Mucosa Treated by He Ne Laser Irradiation.Regulate increment ring 18 and camera lens 19 focal lengths, and regulate focusing ring focusing, make camera 17 focal planes and fan-shaped surface level laser beam coplanar, and make camera 17 visual field size to fits, clear picture.
As shown in Figure 4, there is shown the Brownian movement geometric locus figure of one of them captured particle of camera 17 in 25 seconds.The Brownian movement geometric locus figure of camera 17 particle of recording saves as MOV form and is sent to computer processing system 20.The Matlab program writing in advance in computer processing system 20 reads the file of this MOV form, draws the mean square displacement <r of particle by computing
2>, and according to the Brownian movement principle of particle
carry out count particles radius R, wherein, k
bfor Boltzmann constant, T is temperature, and t is video time, and η is gas viscosity, and r is particle position.
Regulate the height of lifting table 9, make the fan-shaped surface level laser beam successively scanning from the bottom to top after expanding irradiate particle 7 to be measured, in other embodiment, also can, by regulating the height of lifting table 9, make laser beam successively scanning from top to bottom irradiate particle 7 to be measured.Laser beam successively scans when irradiating particle to be measured 7, also successively the record a video movement locus image of particle of camera 17, the image that 20 pairs of cameras 17 of computer processing system transmit carries out computing, processing, to draw the particle diameter of all particles, finally can draw the particle size distribution figure of particle.
Simple, convenient while adopting the present invention to measure grain graininess, measure rapidly, accurately, for detecting, the express-analysis of laboratory and industrial circle provides a solution.
Claims (10)
1. a dry type grain graininess measurement mechanism, comprises light-source system, suspension system, detection system and computer processing system; It is characterized in that, described suspension system comprises vacuum chamber, has been horizontally disposed with upper and lower two pole plates in described vacuum chamber, described top crown ground connection, and described bottom crown connects the negative pole of direct supply, the plus earth of described direct supply; Between described top crown and described bottom crown, be provided with for holding the particle pond of particle to be measured, described particle pond connects the vibrating arm that passes described vacuum chamber.
2. dry type grain graininess measurement mechanism according to claim 1, is characterized in that, described bottom crown is metal plate; On described bottom crown, be provided with for preventing that the particle being spread out by described particle pond from falling the glass ring in described bottom crown outside.
3. dry type grain graininess measurement mechanism according to claim 1, is characterized in that, on the surface of described bottom crown, by frosting technology, is formed with frosted layer, on the surface of described frosted layer, by blacking technique, is formed with blacking layer.
4. dry type grain graininess measurement mechanism according to claim 1, is characterized in that, described top crown is comprised of two ITO electro-conductive glass, and the ITO rete in two described ITO electro-conductive glass is bonded to each other.
5. dry type grain graininess measurement mechanism according to claim 1, is characterized in that, described particle pond is formed by the multiple layer metal net compacting of different meshes; Described vibrating arm is vertical setting, and described particle pond joins by horizontally disposed insulating bar and described vibrating arm.
6. dry type grain graininess measurement mechanism according to claim 1, it is characterized in that, center position in described bottom crown bottom surface is socketed with insulation sleeve, and in described insulation sleeve, cross-under has plain conductor, and described bottom crown joins by the negative pole of described plain conductor and described direct supply.
7. dry type grain graininess measurement mechanism according to claim 1, is characterized in that, has air intake opening and gas outlet on the cavity of described vacuum chamber; By described air intake opening, can in described vacuum chamber, be filled with air or argon gas, at described air intake opening, place is provided with flowmeter, by regulating described flowmeter can control the air pressure in described vacuum chamber; In described gas outlet, place is provided with for measuring the vacuum meter of vacuum chamber internal gas pressure.
8. according to the dry type grain graininess measurement mechanism described in claim 1～7 any one, it is characterized in that, described light-source system is arranged on the outer position relative with the side window of described vacuum chamber of described vacuum chamber; Described light-source system comprises semiconductor laser, in the place ahead of described semiconductor laser, is provided with plano-convex cylindrical lens; Described semiconductor laser and described plano-convex cylindrical lens are together arranged on a lifting table.
9. dry type grain graininess measurement mechanism according to claim 8, is characterized in that, described detection system is arranged on the top of the upper window of described vacuum chamber; Described detection system comprises camera, is provided with the increment ring being connected with camera lens rear portion before described camera; The place ahead at described camera lens is provided with bandpass filter, is sent out light frequency sharp fall within the scope of the frequency passband of described bandpass filter by described semiconductor laser.
10. dry type grain graininess measurement mechanism according to claim 9, is characterized in that, the camera in described computer processing system and described detection system joins; Described camera is for taking the Brownian movement trace image of particle in vacuum chamber and transferring to described computer processing system, and described computer processing system is for according to the mean square displacement <r of received image calculation particle
2>, and according to the Brownian movement principle of particle, according to formula
The particle diameter of count particles; In formula: k
bfor Boltzmann constant, T is temperature, and t is the duration of camera image, and η is gas viscosity, and r is particle position.
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| CN110044782A (en) * | 2019-05-20 | 2019-07-23 | 西南石油大学 | Across the scale wide spectrum partial size plugging formula Analytical Methods of Grain Grade of one kind |
| CN110044782B (en) * | 2019-05-20 | 2019-10-11 | 西南石油大学 | Across the scale wide spectrum partial size plugging formula Analytical Methods of Grain Grade of one kind |
| US10782220B1 (en) | 2019-05-20 | 2020-09-22 | Southwest Petroleum University | Cross-scale wide-spectrum particle size plugging formula granularity analysis method |
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