CN103952676B - A kind of BaTi of b axle orientation 2o 5the preparation method of film - Google Patents
A kind of BaTi of b axle orientation 2o 5the preparation method of film Download PDFInfo
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- CN103952676B CN103952676B CN201410191839.8A CN201410191839A CN103952676B CN 103952676 B CN103952676 B CN 103952676B CN 201410191839 A CN201410191839 A CN 201410191839A CN 103952676 B CN103952676 B CN 103952676B
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- film
- bati
- axle orientation
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- annealing
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Abstract
The invention discloses a kind of BaTi depositing b axle orientation on electrode materials
2o
5the technology of preparing of film.By BaTi
2o
5on the substrate that pottery adopts the mode of pulsed laser deposition or magnetron sputtering to be deposited on to be coated with Pt electrode, obtain amorphous BaTi
2o
5film; Then be placed in 900-1000 DEG C of stove by the substrate depositing film and anneal, be placed in DC electric field by sample during annealing, field intensity is 200-3000V/cm, anneals and within 1-2 hour, can obtain height b axle orientation BaTi
2o
5film.The present invention can prepare BaTi on Pt electrode
2o
5film, the film prepared has height b axle orientation; And present invention process is simple, with low cost, and can be applicable to prepare other oriented film, have broad application prospects.
Description
Technical field
The present invention relates to a kind of BaTi
2o
5the technology of preparing of ferroelectric membranc, particularly a kind of BaTi depositing b axle orientation on electrode materials
2o
5the technology of preparing of film.
Background technology
Ferroelectric membranc has good dielectric, piezoelectricity, ferroelectric, the characteristic such as pyroelectricity, photoelectricity and nonlinear optics, has a wide range of applications in fields such as microelectronics, photoelectron, integrated optics and microelectromechanical systemss.In recent years, ferroelectric membranc receives extensive concern as the commercial applications of Ferroelectric Random Access Memory.Ferroelectric Random Access Memory (be called for short FRAM) has non-volatile, high read or write speed, high storage density, reduce power consumption, low-work voltage and the repetitive read-write advantage such as often, in a lot of fields such as information processing, transmission and mobile communication, there is boundless application prospect.BaTi
2o
5it is a kind of novel lead-free ferroelectric material.It has, and specific inductivity is large, Curie temperature is high, is easy to existing traditional memory technology mutually compatible, is convenient to the feature of the commercial applications of product.Current BaTi
2o
5film, particularly has the BaTi of orientation
2o
5the technology of preparing of film also lacks very much, rarely seen employing pulsed laser deposition technique, is prepared the BaTi of certain b axle orientation by regulation and control mode of deposition
2o
5film.Mainly by first depositing and BaTi on substrate
2o
5the MgO that lattice is close, and then obtain b axle orientation BaTi by epitaxy
2o
5film (CN201010137524).And must be deposited on electrode materials (being generally Pt) as the ferroelectric membranc that ferroelectric memory uses.Adopt pulsed laser deposition technology, (substrate temperature 670 DEG C, oxygen pressure 12.5Pa) is at Pt (111)/Ti/SiO under severe conditions
2/ Si deposition on substrate has gone out the BaTi with certain b axle orientation
2o
5film (J.Wangetal./JournalofAlloysandCompounds512 (2012) 140 – 143).Current technology is difficult to the BaTi preparing high orientation efficiently on Pt electrode
2o
5film.
Summary of the invention
The object of the invention is the BaTi providing a kind of height of deposition b axle orientation on electrode materials
2o
5the method of ferroelectric membranc.
For achieving the above object, adopt technical scheme as follows:
A kind of BaTi of b axle orientation
2o
5the preparation method of film, is included in the deposition on substrate being coated with Pt electrode materials and goes out amorphous BaTi
2o
5film, then puts into stove and anneals under electric field-assisted.
A kind of BaTi of b axle orientation
2o
5the preparation method of film, comprises the following steps:
By BaTi
2o
5on the substrate that pottery adopts the mode of pulsed laser deposition or magnetron sputtering to be deposited on to be coated with Pt electrode, obtain amorphous BaTi
2o
5film; Then be placed in 900-1000 DEG C of stove by the substrate depositing film and anneal, be placed in DC electric field by sample during annealing, field intensity is 200-3000V/cm, annealing 1-2 hour.
Present invention utilizes BaTi
2o
5only there is the feature of excellent ferroelectric properties on b direction of principal axis: only have 140 and 70 along other two axial specific inductivity, and the axial specific inductivity of b can reach 20000, easily occur polarization at b direction of principal axis.When direction of polarization (along b axle) is consistent with direction of an electric field, free energy is minimum, therefore by preferentially growing in this direction, realizes the oriented growth of b axle.First the present invention goes out amorphous film at deposition on substrate, then high temperature annealing, and when utilizing electric field to regulate and control to anneal, crystal growth process, realizes the preferred orientation of b axle.BaTi
2o
5during crystalline growth, its direction of growth is by substrate and BaTi
2o
5the impact of interfacial energy, strain energy.When not applying externally magnetic field effect, generally there will be with substrate lattice closer to oriented growth (when being coated with Pt, being generally (510) orientation).Only have when extra electric field reaches some strength, coherence can be overcome when affecting, just there will be the growth consistent with direction of an electric field.But electric field can not be too large, and time too large, in stove, atmosphere (N2) can puncture.
The present invention and existing BaTi
2o
5method for manufacturing thin film is compared has following advantage:
BaTi can be prepared on Pt electrode
2o
5film, the film prepared has height b axle orientation;
Technique is simple, with low cost, and can be applicable to prepare other oriented film, has broad application prospects.
Accompanying drawing explanation
Fig. 1: the non-crystalline state BaTi before embodiment 1 annealing
2o
5film.
Fig. 2: embodiment 1 anneal after film thing phase.
Fig. 3: the film thing phase that embodiment 2 obtains.
Fig. 4: the film thing phase that embodiment 3 obtains.
Fig. 5: the film thing phase that embodiment 4 obtains.
Fig. 6: the film thing phase that embodiment 5 obtains.
Fig. 7: the film thing phase that embodiment 6 obtains.
Fig. 8: the film thing phase that embodiment 7 obtains.
Fig. 9: the film thing phase that embodiment 8 obtains.
Figure 10: the film thing phase that embodiment 9 obtains.
Figure 11: the film thing phase that embodiment 10 obtains.
Embodiment
In order to understand the present invention better, below in conjunction with embodiment and accompanying drawing, the invention will be further described, but content of the present invention is not only confined to the following examples.
The BaTi of height b axle orientation
2o
5the preparation method of film: go out amorphous BaTi at the deposition on substrate being coated with Pt electrode materials
2o
5film, then puts into stove and anneals under electric field-assisted.Present method can prepare BaTi on Pt electrode
2o
5film, the film prepared has height b axle orientation.
The BaTi of height b axle orientation
2o
5the preparation method of film, step is as follows:
By BaTi
2o
5on the substrate that pottery adopts the mode of pulsed laser deposition or magnetron sputtering to be deposited on to be coated with Pt electrode, obtain amorphous BaTi
2o
5film; Then be placed in 900-1000 DEG C of stove by the substrate depositing film and anneal, be placed in DC electric field by sample during annealing, field intensity is 200-3000V/cm, anneals and within 1-2 hour, can obtain having height b axle orientation BaTi
2o
5film.
Present method make use of BaTi
2o
5only there is the feature of excellent ferroelectric properties on b direction of principal axis: only have 140 and 70 along other two axial specific inductivity, and the axial specific inductivity of b can reach 20000, easily occur polarization at b direction of principal axis.When direction of polarization (along b axle) is consistent with direction of an electric field, free energy is minimum, therefore by preferentially growing in this direction, realizes the oriented growth of b axle.First the present invention goes out amorphous film at deposition on substrate, then high temperature annealing, and when utilizing electric field to regulate and control to anneal, crystal growth process, realizes the preferred orientation of b axle.BaTi
2o
5during crystalline growth, its direction of growth is by substrate and BaTi
2o
5the impact of interfacial energy, strain energy.When not applying externally magnetic field effect, generally there will be with substrate lattice closer to oriented growth (when being coated with Pt, being generally (510) orientation).Only have when extra electric field reaches some strength, coherence can be overcome when affecting, just there will be the growth consistent with direction of an electric field.But electric field can not be too large, and time too large, in stove, atmosphere (N2) can puncture.Meanwhile, present method technique is simple, with low cost, and can be applicable to prepare other oriented film, has broad application prospects.
Embodiment 1
With BaTi
2o
5pottery is target, adopts laser pulse (PLD) depositing the MgO deposition on substrate BaTi of Pt electrode
2o
5film.Mode of deposition is O
2dividing potential drop 12.5Pa, laser energy density 2J/cm
2, substrate temperature 25 DEG C.Product is see accompanying drawing 1, BaTi
2o
5for non-crystalline state.Then BaTi will be deposited
2o
5the tube furnace that temperature is 850 DEG C put into by the substrate of film, anneals 2 hours, applies the DC electric field of 200V/cm voltage simultaneously.Thing after annealing is met each other Fig. 2.BaTi after annealing
2o
5resolve into BaTiO
3.
Embodiment 2
Annealing temperature in embodiment 1 is become 900 DEG C, and the thing after annealing is see accompanying drawing 3.Originally amorphous film is no longer resolve into BaTiO
3, but be transformed into the BaTi of crystallization
2o
5film, and in b axle orientation.
Embodiment 3
Annealing temperature in embodiment 1 is become 950 DEG C, and the thing after annealing is see accompanying drawing 4.Originally amorphous film is no longer resolve into BaTiO
3, but be transformed into the BaTi of crystallization
2o
5film, in b axle orientation, crystallinity is better than 900 DEG C of annealed sample.
Embodiment 4
Annealing temperature in embodiment 1 is become 1000 DEG C, and annealing time is 1 hour.Thing after annealing is see accompanying drawing 5.Originally amorphous film is no longer resolve into BaTiO
3, but be transformed into the BaTi of crystallization
2o
5film, in b axle orientation, crystallinity is better than 950 DEG C of annealed sample.
Embodiment 5
Annealing temperature in embodiment 1 is become 1050 DEG C, and annealing time is 1 hour.Thing after annealing is see accompanying drawing 6.Non-crystalline state BaTi after annealing
2o
5film resolve into BaTiO
3.
Embodiment 6
DC electric field when embodiment 4 being annealed is removed, and the thing after annealing is see accompanying drawing 7.Mainly see the diffraction peak of MgO matrix.Be also shown in BaTi
2o
5(510) and (020) diffraction peak.Illustrate when without electric field, BaTi
2o
5oriented growth not obvious.
Embodiment 7
DC electric field in embodiment 4 is become 500V/cm, the thing after annealing see accompanying drawing 8, non-crystalline state BaTi
2o
5film be transformed to crystalline state, and b axle orientation is better.
Embodiment 8
DC electric field in embodiment 4 is become 2000V/cm, and the thing after annealing, see accompanying drawing 9, obtains the better BaTi of b axle orientation ratio voltage 1000V/cm
2o
5film.
Embodiment 9
DC electric field in embodiment 4 is become 3000V/cm, and the thing after annealing, see accompanying drawing 10, obtains the BaTi of b axle orientation
2o
5film is suitable when orientation and crystallinity and 2000V/cm field intensity.
Embodiment 10
With BaTi
2o
5pottery is target, adopts magnetron sputtering depositing the MgO deposition on substrate BaTi of Pt electrode
2o
5film.Product thing is met each other Fig. 1, in non-crystalline state.Then BaTi will be deposited
2o
5the tube furnace that temperature is 950 DEG C put into by the substrate of film, anneals 2 hours, applies the DC electric field of 2000V/cm voltage simultaneously.Thing after annealing, see accompanying drawing 11, obtains the BaTi of crystallization
2o
5film, in b axle orientation.
Claims (1)
1. the BaTi of a b axle orientation
2o
5the preparation method of film, is characterized in that comprising the following steps:
By BaTi
2o
5on the substrate that pottery adopts the mode of pulsed laser deposition or magnetron sputtering to be deposited on to be coated with Pt electrode, obtain amorphous BaTi
2o
5film; Then be placed in 900-1000 DEG C of stove by the substrate depositing film and anneal, be placed in DC electric field by sample during annealing, field intensity is 200-3000V/cm, annealing 1-2 hour.
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WO2022178288A1 (en) * | 2021-02-18 | 2022-08-25 | Drexel University | Ultrahigh anharmonicity low-permittivity tunable thin-film |
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JP6575411B2 (en) * | 2016-03-28 | 2019-09-18 | Tdk株式会社 | Dielectric thin film element |
CN105977136A (en) * | 2016-05-27 | 2016-09-28 | 清华大学 | Semiconductor structure and method for preparing the same |
CN108794940B (en) * | 2018-06-21 | 2020-04-28 | 北京工业大学 | Texture BaTi2O5Preparation method of PVDF flexible piezoelectric composite material |
Citations (3)
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---|---|---|---|---|
CN1288981A (en) * | 2000-09-18 | 2001-03-28 | 南京大学 | Low-electric field inducting control method to orient film prepared through a wet chemical process |
CN101818327A (en) * | 2010-03-30 | 2010-09-01 | 武汉理工大学 | Method for preparing barium dititanate (BaTi2O5) ferroelectric film on silicon (Si) single crystal substrate |
CN102584335A (en) * | 2012-01-13 | 2012-07-18 | 武汉理工大学 | Preparation method of BaTi2O5 thin films growing in a preferred orientation |
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JP4594488B2 (en) * | 2000-04-13 | 2010-12-08 | 株式会社東芝 | Sputtering target |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1288981A (en) * | 2000-09-18 | 2001-03-28 | 南京大学 | Low-electric field inducting control method to orient film prepared through a wet chemical process |
CN101818327A (en) * | 2010-03-30 | 2010-09-01 | 武汉理工大学 | Method for preparing barium dititanate (BaTi2O5) ferroelectric film on silicon (Si) single crystal substrate |
CN102584335A (en) * | 2012-01-13 | 2012-07-18 | 武汉理工大学 | Preparation method of BaTi2O5 thin films growing in a preferred orientation |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022178288A1 (en) * | 2021-02-18 | 2022-08-25 | Drexel University | Ultrahigh anharmonicity low-permittivity tunable thin-film |
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