CN103928003B - Grid driving circuit, restoration method thereof, display panel and display device - Google Patents
Grid driving circuit, restoration method thereof, display panel and display device Download PDFInfo
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- CN103928003B CN103928003B CN201310755318.6A CN201310755318A CN103928003B CN 103928003 B CN103928003 B CN 103928003B CN 201310755318 A CN201310755318 A CN 201310755318A CN 103928003 B CN103928003 B CN 103928003B
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Abstract
The invention discloses a grid driving circuit, a restoration method thereof, a display panel and a display device, wherein the restoration method is used for improving the restoration capacity of the grid driving circuit. The grid driving circuit comprises M levels of driving sub-circuits, a restoration circuit and an Nth-level restoration sub-circuit. Each level of driving sub-circuit comprises a shift register circuit and a scanning control circuit. The restoration circuit at least comprises M levels of restoration sub-circuits corresponding to the M levels of driving sub-circuits. The Nth-level restoration sub-circuit is used for providing a scanning signal for the (N+1)th-level shift register circuit according to an output signal of the Nth-level shift register circuit when the (N+1)th-level scanning control circuit works abnormally in forward scanning and providing a scanning signal for the (N-1)th-level shift register circuit according to an output signal of the Nth-level shift register circuit when the (N-1)th-level scanning control circuit works abnormally in reverse scanning, wherein N=2,3,4......M-2, M-1, and M is a positive integer equal to or larger than four.
Description
Technical field
The present invention relates to display technology field, more particularly, to a kind of gate driver circuit and its restorative procedure, display floater
And display device.
Background technology
Liquid crystal display (liquid crystal display, lcd) or Organic Light Emitting Diode (organic light-
Emitting diode, oled) there is Low emissivity, small volume and low power consuming, gradually replace in certain applications and pass
The cathode ray tube display (cathode ray tube display, crt) of system, thus it is widely used in notebook electricity
Brain, personal digital assistant (personal digital assistant, pda), flat-surface television, or the information products such as mobile phone
On.The mode of conventional liquid crystal is with display image using external drive chip come the chip in driving panel, but in order to
Reduce component number and reduce manufacturing cost, be developing progressively in recent years and driving circuit structure is directly made in display floater
On, for example with skill gate driver circuit (gate driver) being integrated on array base palte (gate on array, goa)
Art.
Goa technology is compared traditional chip on film (chip on flex/film, cof) and is directly bound (chip on glass
On glass, cog) technique, goa technology not only can be cost-effective, and panel can accomplish the symmetrical design for aesthetic in both sides,
The function of being mainly characterized by relying on goa unit continuous trigger to realize its shift LD of this technology, eliminates grid integrated circuit
Binding (bonding) region of (gate ic) and fan-out wiring space are it is achieved that the design of narrow frame；Simultaneously because can
To save the technique of gate direction bonding, production capacity and yields are lifted also than advantageous.
However, in goa technology, continuous and continuous trigger the working method on goa cellular construction has lacking of itself
Fall into, such as during forward scan: once certain a line it is assumed here that when abnormal conditions in the goa unit of line n, due to the (n+1)th row
Goa unit need after the trigger receiving line n goa unit, just can start working, and now the goa of line n is mono-
First operation irregularity it is impossible to normally be exported, therefore, the goa unit of the (n+1)th row nor normal work, and then the (n+1)th row
Goa unit below also cannot normal work, display floater cannot normally show.Again during such as reverse scan: once certain a line,
It is assumed here that when abnormal conditions in the goa unit of line n, because the goa unit of the (n-1)th row needs receiving line n goa
After the trigger of unit, just can start working, and now the goa cell operation of line n is extremely it is impossible to carry out normally defeated
Go out, therefore, the goa unit of the (n-1)th row nor normal work, and then the goa unit of the (n-1)th row to the 1st row also cannot be normal
Work, display floater cannot normally show.
Content of the invention
The embodiment of the present invention provides a kind of gate driver circuit and its restorative procedure, display floater and display device, to carry
The repair ability of the gate driver circuit of high array base palte.
The embodiment of the present invention employs the following technical solutions:
The present invention provides a kind of gate driver circuit, comprising:
M level drive sub-circuits, drive sub-circuits described in every one-level include shift register circuit and scan control circuit；
Repair circuit, described reparation circuit at least includes m level corresponding with the described drive sub-circuits of m level and repairs electronic circuit；
Described shift register circuit is used for providing gate drive signal to array base palte；
Described scan control circuit is used for providing forward scan signal just to realize to described shift register circuit at the same level
To scanning；Or provide reverse scan signal to realize reverse scan to described shift register circuit at the same level；
N-th grade of described reparation electronic circuit, for forward scan, when (n+1)th grade of described scan control circuit operation irregularity,
Output signal according to n-th grade of described shift register circuit provides scanning signal for (n+1)th grade of described shift register circuit；With
And, for reverse scan, when (n-1)th grade of described scan control circuit operation irregularity, according to n-th grade of described shift register circuit
Output signal be that (n-1)th grade of described shift register circuit provides scanning signal；
Wherein, n=2,3,4......, m-2, m-1, m are the positive integer equal to or more than 4.
The embodiment of the present invention has the beneficial effect that: is carried out by the reparation electronic circuit of the gate driver circuit of array substrate
Rational wiring, when the scan control circuit of positive and negative scanning gate driver circuit abnormal, can be according to corresponding reparation
Electronic circuit is repaired to gate driver circuit, improves the repair ability of array base palte gate driver circuit it is ensured that liquid crystal
The yields that display produces.
The embodiment of the present invention provides a kind of display floater, including the gate driver circuit that example offer is performed as described above.
The embodiment of the present invention has the beneficial effect that: the array base palte gate driver circuit of display floater has multiple reparation
Circuit, when gate driver circuit abnormal, repairs electronic circuit and gate driver circuit can be repaired, improve array base
The repair ability of gate plate drive circuit is it is ensured that the yields of production of liquid crystal displays.
The embodiment of the present invention provides a kind of display device, including the display floater that example offer is performed as described above.
A kind of restorative procedure of gate driver circuit of the embodiment of the present invention, drives for repairing the grid that example offer is performed as described above
Galvanic electricity road, comprising:
During forward scan, when (n+1)th grade of described scan control circuit operation irregularity, make n-th grade of described reparation electronic circuit
The lead of outfan is electrically connected in infall with the driving signal input of (n+1)th grade of described shift register circuit, by n-th grade of institute
The drive signal stating shift register circuit output is supplied to the scanning signal input of (n+1)th grade of described shift register circuit；
During reverse scan, when (n-1)th grade of described scan control circuit operation irregularity, make n-th grade of described reparation electronic circuit
The lead of outfan is electrically connected in infall with the scanning signal input of (n-1)th grade of described shift register circuit, according to n-th grade
The drive signal of described shift register circuit output provides to the scanning signal input of (n-1)th grade of described shift register circuit to be swept
Retouch signal；
Wherein, n=2,3,4......, m-2, m-1；M is the positive integer equal to or more than 4.
The embodiment of the present invention has the beneficial effect that: is closed by the reparation circuit of the gate driver circuit of array substrate
The wiring of reason, can be used for repairing by repairing in electronic circuit when the scan control circuit of described gate driver circuit abnormal
Multiple lead is electrically connected with the respective wire of this gate driver circuit, thus corresponding to abnormal scan control circuit
Shift register circuit provides scanning signal it is ensured that the yields of production of liquid crystal displays.
Brief description
Fig. 1 is the structural representation of the first gate driver circuit provided in an embodiment of the present invention；
Fig. 2 is the structural representation of second gate driver circuit provided in an embodiment of the present invention；
Fig. 3 is the structural representation of the third gate driver circuit provided in an embodiment of the present invention；
Fig. 4 is the structural representation of the 4th kind of gate driver circuit provided in an embodiment of the present invention；
Fig. 5 is the schematic diagram that gate driver circuit shown in Fig. 1 is repaired provided in an embodiment of the present invention；
Fig. 6 is the schematic diagram that gate driver circuit shown in Fig. 3 is repaired provided in an embodiment of the present invention；
Fig. 7 is that the grid of the forward scan that gate driver circuit according to Fig. 1 provided in an embodiment of the present invention obtains drives
Galvanic electricity road；
Fig. 8 is that the grid of the reverse scan that gate driver circuit according to Fig. 3 provided in an embodiment of the present invention obtains drives
Galvanic electricity road.
Specific embodiment
Below in conjunction with Figure of description, embodiments of the invention are illustrated it will be appreciated that enforcement described herein
Example is merely to illustrate and explains the present invention, is not limited to the present invention.And the reality in the case of not conflicting, in this explanation
Apply the feature in example and embodiment can be combined with each other.
Referring to Fig. 1, the embodiment of the present invention provides a kind of gate driver circuit, comprising:
M level drive sub-circuits, every one-level drive sub-circuits include shift register circuit, and such as shift register circuit s/r (1) is extremely
Shift register circuit s/r (m), shift register circuit s/r (1) to s/r (m) is used for providing gate drive signal to array base palte；
Every one-level drive sub-circuits include scan control circuit, and such as scan control circuit tb (1) scan control circuit, to tb (m), scans
Control circuit tb (1) is used for providing forward scan signal to realize forward scan to shift register circuit at the same level to tb (m)；Or
There is provided reverse scan signal to shift register circuit at the same level to realize reverse scan.
Gate driver circuit also includes repairing circuit, and this reparation circuit includes multiple reparation electronic circuits, such as first initially repaiies
Multiple electronic circuit rp a, the second initial reparation electronic circuit rp b, reparation electronic circuit rp (1) are to reparation electronic circuit rp (m)；Repair son electricity
Road rp (1) to rp (m) is corresponded with m level drive sub-circuits.
N-th grade of reparation electronic circuit, for during forward scan, when (n+1)th grade of scan control circuit tb (n+1) operation irregularity,
Output signal according to n-th grade of shift register circuit s/r (n) is that (n+1)th grade of shift register circuit s/r (n+1) provides scanning letter
Number；And, for during reverse scan, when (n-1)th grade of scan control circuit tb (n-1) operation irregularity, according to n-th grade of shift LD
The output signal of circuit s/r (n) is that (n-1)th grade of shift register circuit s/r (n-1) provides scanning signal；Wherein, n=2,3,
4......, m-2, m-1, m are the positive integer equal to or more than 4.
It should be understood that clock cable clk1 and clk2 is necessary to gate driver circuit normal work, respectively
Electrically connect with every one-level shift register circuit；High level signal line vgh and low level signal line vgl is that gate driver circuit is normal
Work is necessary, electrically connects with every one-level shift register circuit respectively.
Gate driver circuit also includes control signal wire conl, electrically connects with each reparation electronic circuit respectively, in any level
During scan control circuit operation irregularity, provide high level signal or low level signal.
The attachment structure of gate driver circuit is specific as follows:
Every one-level scan control circuit includes the first trigger input, the second trigger input and scanning signal
Outfan；Every one-level shift register circuit includes scanning signal input, drive signal outfan and trigger outfan, often
One-level is repaired electronic circuit and is included input, outfan and control end.
First trigger input of n-th grade of scan control circuit and the trigger of (n-1)th grade of shift register circuit
Outfan electrical connection, the second trigger input of n-th grade of scan control circuit and the triggering of (n+1)th grade of shift register circuit
Signal output part electrically connects, the scanning letter of the scanning signal outfan of n-th grade of scan control circuit and n-th grade of shift register circuit
The electrical connection of number input.
The lead of the outfan of n-th grade of reparation electronic circuit is inputted with the scanning signal of (n+1)th grade of shift register circuit respectively
The scanning signal input of end and (n-1)th grade of shift register circuit intersects and insulated from each other, such as the infall 101 shown in Fig. 1；
The control end of n-th grade of reparation electronic circuit is electrically connected with control signal wire conl, the input of n-th grade of reparation electronic circuit
Electrically connect with the drive signal outfan of n-th grade of shift register circuit.
In the present embodiment, repaired to m-1 level by n-th grade of reparation electronic circuit of the gate driver circuit of array substrate
Electronic circuit is reasonably connected up, in the 3rd level drive sub-circuits of described gate driver circuit are to m-2 level drive sub-circuits
Scan control circuit when abnormal occur, can be according to the corresponding circuit of repairing of abnormal level drive sub-circuits to gate driver circuit
Repaired, improve the repair ability of array base palte gate driver circuit it is ensured that the yields of production of liquid crystal displays.
Preferably, the first trigger input of the 1st grade of scan control circuit and original trigger signal line stv are electrically connected
Connect, the trigger outfan electricity of the second trigger input of the 1st grade of scan control circuit and the 2nd grade of shift register circuit
Connect, the scanning signal outfan of the 1st grade of scan control circuit is electrically connected with the scanning signal input of the 1st grade of shift register circuit
Connect；
The input of the 1st grade of reparation electronic circuit is electrically connected with the drive signal outfan of the 1st grade of shift register circuit, and the 1st
The control end that level repairs electronic circuit is electrically connected with control signal wire conl, the lead of outfan and the 2nd of the 1st grade of reparation electronic circuit
The scanning signal input of level shift register circuit intersects and insulated from each other.By the of the gate driver circuit of array substrate
Repair electronic circuit for 1 grade reasonably to be connected up, for the gate driver circuit of forward scan, when the 2nd grade of gate driver circuit
When scan control circuit abnormal, electronic circuit rp (1) can be repaired according to the 1st grade and gate driver circuit is repaired, carry
The repair ability of high array base palte gate driver circuit is it is ensured that the yields of production of liquid crystal displays.
Preferably, the first initial reparation electronic circuit rp a includes input, outfan and control end；
The input of the first initial reparation electronic circuit rp a is electrically connected with original trigger signal line stv, and first initially repairs
The control end of electronic circuit rp a is electrically connected with control signal wire conl, the lead of the outfan of the first initial reparation electronic circuit rp a
Intersect and insulated from each other with the scanning signal input of the 1st grade of shift register circuit s/r (1).By the grid of array substrate
First initial electronic circuit rp a circuit of repairing of drive circuit is reasonably connected up, for the raster data model electricity of forward scan
Road, when the 1st grade of scan control circuit tb (1) of gate driver circuit abnormal, can be according to the first initial reparation son electricity
Road rp a repairs to gate driver circuit, improves the repair ability of array base palte gate driver circuit it is ensured that liquid crystal
The yields that display produces.
Preferably, the first trigger input of m level scan control circuit tb (m) and original trigger signal line stv
Electrical connection, the second trigger input of m level scan control circuit tb (m) and m-1 level shift register circuit s/r (m-
1) trigger outfan electrical connection, the scanning signal outfan of m level scan control circuit tb (m) and the displacement of m-1 level
The scanning signal input electrical connection of register circuit s/r (m)；
M level repairs the input of electronic circuit rp (m) and the drive signal outfan of m level shift register circuit s/r (m)
Electrical connection, the control end that m level repairs electronic circuit rp (m) is electrically connected with control signal wire conl, and m level repairs electronic circuit rp
M the lead of the outfan of () is intersected and insulated from each other with the scanning signal input of m-1 level shift register circuit s/r (m-1).
Repair electronic circuit rp (m) by the m level of the gate driver circuit of array substrate reasonably to be connected up, for reverse scan
Gate driver circuit, when m-1 level scan control circuit tb (m-1) of gate driver circuit abnormal, can basis
M level is repaired electronic circuit rp (m) and gate driver circuit is repaired, and improves the reparation energy of array base palte gate driver circuit
Power is it is ensured that the yields of production of liquid crystal displays.
Preferably, the input of the second initial reparation electronic circuit rp b is electrically connected with original trigger signal line stv, at the beginning of second
The control end beginning to repair electronic circuit rp b is electrically connected with control signal wire conl, the outfan of the second initial reparation electronic circuit rp b
Lead intersect and insulated from each other with the scanning signal input of m level shift register circuit s/r (m).
In the present embodiment, entered by the second of the gate driver circuit of array substrate the initial electronic circuit rpb circuit of repairing
Row is rational to be connected up, for the gate driver circuit of reverse scan, as the m level scan control circuit tb of gate driver circuit
M () is repaired when abnormal, can be according to the second initial reparation electronic circuit rp b to m level scan control circuit tb (m)
Repaired, improve the repair ability of array base palte gate driver circuit it is ensured that the yields of production of liquid crystal displays.
Each electronic circuit of repairing can switch for tft, the reparation electronic circuit belonging to the gate electrode of tft switch and tft switch
Control end electrically connects, and the source electrode of tft switch is electrically connected with the input of the reparation electronic circuit belonging to tft switch, tft switch
Drain electrode is electrically connected with the outfan of the reparation electronic circuit belonging to tft switch.
It should be noted that tft switch can be N-shaped tft or p-type tft, accordingly, when being repaired, control signal
Line conl provides high level signal or low level signal to control the on or off of tft switch.
Additionally, this control signal wire conl is the signal line being separately provided, in the scan control of gate driver circuit
When circuit abnormal, this control signal wire conl can not input signal.
The embodiment of the present invention has the beneficial effect that: is carried out by the reparation electronic circuit of the gate driver circuit of array substrate
Rational wiring, when the scan control circuit of positive and negative scanning gate driver circuit abnormal, can be according to corresponding reparation
Electronic circuit is repaired to gate driver circuit, improves the repair ability of array base palte gate driver circuit it is ensured that liquid crystal
The yields that display produces.
Referring to Fig. 2, the embodiment of the present invention provides another kind of gate driver circuit, with the gate driver circuit shown in Fig. 1 not
It is with part, substitute control signal wire conl with high level signal line vgh, the scan control circuit of gate driver circuit occurs
When abnormal, provide high level signal from high level signal line vgh to the control end of the reparation electronic circuit being attached thereto.For example with
N-shaped tft, as repairing electronic circuit, provides high level signal from high level signal line vgh to the control end of the tft being attached thereto,
This tft is made to turn on.
It is of course also possible to control signal wire conl is substituted by low level signal line vgl, electric as repairing son using p-type tft
Road, provides low level signal from low level signal line vgl to the control end of the tft being attached thereto, and so that this tft is turned on, this structure
It is simple modification with the gate driver circuit shown in Fig. 2, will not be described here.
Referring to Fig. 3, the embodiment of the present invention provides another kind of gate driver circuit, with the raster data model electricity shown in Fig. 1 or Fig. 2
Road has similar structure, and difference is, the control of each reparation electronic circuit of gate driver circuit that the present embodiment provides
End is electrically connected with the drive signal outfan of the shift register circuit of corresponding stage, respectively repairs input and the control signal of electronic circuit
Line or high level signal line vgh electrical connection.
When the scan control circuit of gate driver circuit abnormal, by control signal wire conl or high level signal line
Vgh provides high level signal to the input of the reparation electronic circuit being attached thereto, and is electrically connected by with the control end repairing electronic circuit
Shift register circuit provide drive signal, thus to repair electronic circuit outfan electrically connect shift register circuit offer
Scanning signal.
Preferably, repair the tft switch that electronic circuit includes, this tft switchs as N-shaped tft.
The embodiment of the present invention has the beneficial effect that: in certain one-level scan control circuit operation irregularity, is controlled by this scanning
The reparation electronic circuit that circuit processed connects provides scanning signal for the mobile register circuit of this level, thus improving array base palte raster data model
The repair ability of circuit is it is ensured that the yields of production of liquid crystal displays.
The embodiment of the present invention provides a kind of restorative procedure of gate driver circuit, comprising:
If (n+1)th grade of scan control circuit tb (n+1) occurs extremely thus the forward direction having influence on this gate driver circuit is swept
Retouch, then make the scanning of n-th grade of lead of outfan repairing electronic circuit rp (n) and (n+1)th grade of shift register circuit s/r (n+1)
Signal input part electrically connects in infall, thus being (n+1)th according to the drive signal that n-th grade of shift register circuit s/r (n) exports
The scanning signal input of level shift register circuit s/r (n+1) provides scanning signal.
If (n-1)th grade of scan control circuit tb (n-1) occurs extremely thus having influence on reversely sweeping of this gate driver circuit
Retouch, then make the scanning of n-th grade of lead of outfan repairing electronic circuit rp (n) and (n-1)th grade of shift register circuit s/r (n-1)
Signal input part electrically connects in infall, thus being (n-1)th according to the drive signal that n-th grade of shift register circuit s/r (n) exports
The scanning signal input of level shift register circuit s/r (n-1) provides scanning signal.
Preferably, also include: during forward scan, when the 2nd grade of scan control circuit operation irregularity, make the 1st grade to repair son electricity
The lead of outfan of road rp (1) is electrically connected in infall with the scanning signal input of the 2nd grade of shift register circuit s/r (2),
Thus the scanning being the 2nd grade of shift register circuit s/r (2) according to the drive signal that the 1st grade of shift register circuit s/r (1) exports
Signal input part provides scanning signal.
Preferably, also include: during forward scan, when the 1st grade of scan control circuit operation irregularity, make the first initial reparation
The lead of outfan of Schaltkreis p a is electrically connected in infall with the scanning signal input of the 1st grade of shift register circuit s/r (1)
Connect, thus providing scanning letter according to the scanning signal input that original trigger signal is the 11st grade of shift register circuit s/r (1)
Number.
Preferably, also include: during reverse scan, when m-1 level scan control circuit tb (m-1) operation irregularity, make m level
The scanning signal input of the lead of outfan and m-1 level shift register circuit s/r (m-1) of repairing electronic circuit rp (m) exists
Infall electrically connects, thus being m-1 level shift LD electricity according to the drive signal that m level shift register circuit s/r (m) exports
The scanning signal input of road s/r (mn-1) provides scanning signal.
Preferably, also include: during reverse scan, when m level scan control circuit tb (m) operation irregularity, make second initial
Repair the lead of outfan of electronic circuit rp b and the scanning signal input of m level shift register circuit s/r (m) in infall
Electrical connection, thus provide scanning according to the scanning signal input that original trigger signal is m level shift register circuit s/r (m)
Signal.
It should be noted that forward scan and reverse scan non-concurrent reparation, the defeated of each reparation electronic circuit can not be made
The lead going out end is electrically connected with the scanning signal input of two shift register circuits simultaneously.
Specifically, can make to repair by laser welding according to the corresponding relation repairing electronic circuit and abnormal scan control circuit
The wire electrical connection of the outfan of multiple electronic circuit and intersecting therewith fork.
Referring to Fig. 5, show the schematic diagram after the gate driver circuit shown in Fig. 1 is repaired, gate driver circuit
For, during forward scan, the 1st grade of scan control circuit tb (1) and (n+1)th grade of scan control circuit tb (n+1) occur extremely, then
The first initial lead of outfan repairing electronic circuit and the 1st grade of shift register circuit s/r (1) are made by laser welding technology
Scanning signal outfan electrically connects, and forms pad 500；Make the outfan of n-th grade of reparation electronic circuit by laser welding technology
Lead electrically connect with the scanning signal outfan of (n+1)th grade of shift register circuit s/r (n+1), formed pad 501；Cut-out
1st grade of scan control circuit tb (1) of operation irregularity and each end of (n+1)th grade of scan control circuit tb (n+1), such as: first touches
Signalling input, the second trigger input and scanning signal outfan.Control signal wire conl is each reparation electronic circuit
Control end high level signal or low level signal are provided.Certainly when the tft repairing electronic circuit switchs as N-shaped it is also possible to by
High level signal line vgh substitutes control signal wire to provide high level signal；Or when the tft repairing electronic circuit switchs as p-type,
Substitute control signal wire conl to provide low level signal by low level signal line vgl.
Referring to Fig. 6, show the schematic diagram after the gate driver circuit shown in Fig. 3 is repaired, repaired with above-mentioned
Journey is similar, and difference is, each tft switch repairing electronic circuit can only select N-shaped tft to switch, and control signal wire conl carries
For high level signal.Certainly it is also possible to low control is replaced by high level signal line vgh when the tft repairing electronic circuit switchs as N-shaped
Holding wire is providing high level signal.
The embodiment of the present invention has the beneficial effect that: in certain one-level scan control circuit operation irregularity, is controlled by this scanning
The reparation electronic circuit that circuit processed connects provides scanning signal for the mobile register circuit of this level, thus improving array base palte raster data model
The repair ability of circuit is it is ensured that the yields of production of liquid crystal displays.
It should be noted that the various embodiments described above of the present invention can also have multiple modifications, few examples are as follows:
For example, with reference to the gate driver circuit obtaining on the basis of Fig. 1 shown in Fig. 7, this gate driver circuit is just used for
To scanning, the reference of Fig. 7 is identical with Fig. 1, different from the gate driver circuit shown in Fig. 1 outside be repair circuit do not wrap
Include m level and repair electronic circuit and the second initial reparation electronic circuit.Gate driver circuit shown in Fig. 7, can in forward scan
Using with the gate driver circuit shown in Fig. 1 identical restorative procedure, with the reparation shown in Fig. 5 in forward scan after grid
Drive circuit is similar.Again for example, with reference to the gate driver circuit obtaining on the basis of Fig. 3 shown in Fig. 8, this gate driver circuit
Be only used for reverse scan, the reference of Fig. 8 is identical with Fig. 3, different from the gate driver circuit shown in Fig. 3 outside be repair
Circuit does not include the 1st grade and repairs electronic circuit and the first initial reparation electronic circuit.Gate driver circuit shown in Fig. 8 is in reverse scan
When, can using with the gate driver circuit shown in Fig. 3 in reverse scan identical restorative procedure, with the reparation shown in Fig. 6
Gate driver circuit afterwards is similar.Those skilled in the art are according to the present invention it should be appreciated that can be according to Fig. 1 to Fig. 4
Gate driver circuit carries out modification, obtains multiple gate driver circuits meeting inventive concept, and those gate driver circuits are equal
In the scope of the present invention.
The embodiment of the present invention provides a kind of display floater, the gate driver circuit providing including such as above-described embodiment.
The embodiment of the present invention has the beneficial effect that: is closed by the reparation circuit of the gate driver circuit of array substrate
The wiring of reason, can play repair, improves battle array when the scan control circuit of described gate driver circuit abnormal
The repair ability of row substrate gate driver circuit is it is ensured that the yields of production of liquid crystal displays.
The embodiment of the present invention provides a kind of display device, the display floater providing including such as above-described embodiment.
The embodiment of the present invention has the beneficial effect that: is closed by the reparation circuit of the gate driver circuit of array substrate
The wiring of reason, can play repair, improves battle array when the scan control circuit of described gate driver circuit abnormal
The repair ability of row substrate gate driver circuit is it is ensured that the yields of production of liquid crystal displays.
Obviously, those skilled in the art can carry out the various changes and modification essence without deviating from the present invention to the present invention
God and scope.So, if these of the present invention repair the scope belonging to the claims in the present invention and its equivalent technologies with modification
Within, then the present invention is also intended to comprise these changes and modification.
Claims (18)
1. a kind of gate driver circuit is it is characterised in that include:
M level drive sub-circuits, drive sub-circuits described in every one-level include shift register circuit and scan control circuit；
Repair circuit, described reparation circuit at least includes m level corresponding with the described drive sub-circuits of m level and repairs electronic circuit；
Described shift register circuit is used for providing gate drive signal to array base palte；
Described scan control circuit is used for providing forward scan signal to sweep to realize forward direction to described shift register circuit at the same level
Retouch；Or provide reverse scan signal to realize reverse scan to described shift register circuit at the same level；
N-th grade of described reparation electronic circuit, for forward scan, when (n+1)th grade of described scan control circuit operation irregularity, according to
The output signal of n-th grade of described shift register circuit provides scanning signal for (n+1)th grade of described shift register circuit；And, use
In reverse scan, when (n-1)th grade of described scan control circuit operation irregularity, defeated according to n-th grade of described shift register circuit
Going out signal provides scanning signal for (n-1)th grade of described shift register circuit；
Wherein, n=2,3,4......, m-2, m-1, m are the positive integer equal to or more than 4.
2. gate driver circuit as claimed in claim 1 is it is characterised in that also include:
Control signal wire, in scan control circuit operation irregularity described in any level, providing high to described reparation electronic circuit
Level signal/low level signal.
3. gate driver circuit as claimed in claim 2 is it is characterised in that described scan control circuit includes the first triggering letter
Number input, the second trigger input and scanning signal outfan, described shift register circuit includes scanning signal input
End, drive signal outfan and trigger outfan, described reparation electronic circuit includes input, outfan and control end；
First trigger input of n-th grade of described scan control circuit and the triggering of (n-1)th grade of described shift register circuit
Signal output part electrically connects, and the second trigger input of n-th grade of described scan control circuit and (n+1)th grade of described displacement are posted
Deposit the trigger outfan electrical connection of circuit, described in the scanning signal outfan of n-th grade of described scan control circuit and n-th grade
The scanning signal input electrical connection of shift register circuit；
N-th grade of described reparation input of electronic circuit and the drive signal outfan/described control of n-th grade of described shift register circuit
Holding wire electrical connection processed, n-th grade of described control end repairing electronic circuit and the described shift LD of described control signal wire/the n-th grade
Circuit drive signal outfan electrical connection, n-th grade described repair electronic circuit outfan lead respectively with described in (n+1)th grade
The described scanning signal input of the scanning signal input of shift register circuit and (n-1)th grade of described shift register circuit intersects
And it is insulated from each other.
4. gate driver circuit as claimed in claim 3 it is characterised in that:
First trigger input of the 1st grade of described scan control circuit is electrically connected with original trigger signal line, described in the 1st grade
Second trigger input of scan control circuit and the trigger outfan of the 2nd grade of described shift register circuit are electrically connected
Connect, the scanning signal input of the scanning signal outfan of the 1st grade of described scan control circuit and the 1st grade of described shift register circuit
End electrical connection；
The 1st grade of described reparation input of electronic circuit and the drive signal outfan/described control of the 1st grade of described shift register circuit
Holding wire electrical connection processed, the 1st grade of described control end repairing electronic circuit and the described shift LD in described control signal wire/1st grade
The drive signal outfan electrical connection of circuit, the 1st grade of described lead of outfan repairing electronic circuit is posted with the 2nd grade of described displacement
The scanning signal input depositing circuit intersects and insulated from each other.
5. gate driver circuit as claimed in claim 4 is it is characterised in that described reparation circuit also includes first initially repairs
Electronic circuit, the described first initial electronic circuit of repairing includes input, outfan and control end；
The described first initial input repairing electronic circuit is electrically connected with described original trigger signal line/described control signal wire,
The described first initial control end repairing electronic circuit is electrically connected with described control signal wire/described original trigger signal line, described
The first initial scanning signal input repairing the lead of outfan of electronic circuit and the 1st grade of described shift register circuit intersect and
Insulated from each other.
6. gate driver circuit as claimed in claim 5 it is characterised in that:
First trigger input of the described scan control circuit of m level is electrically connected with original trigger signal line, described in m level
Second trigger input of scan control circuit and the trigger outfan of the described shift register circuit of m-1 level are electrically connected
Connect, the scanning signal input of the scanning signal outfan of the described scan control circuit of m level and the described shift register circuit of m level
End electrical connection；
M level is described to repair the input of electronic circuit and the drive signal outfan/described control of the described shift register circuit of m level
Holding wire electrical connection processed, the described control end repairing electronic circuit of m level and the described shift LD of described control signal wire/the m level
The drive signal outfan electrical connection of circuit, the described lead of outfan repairing electronic circuit of m level and the described displacement of m-1 level
The scanning signal input of register circuit intersects and insulated from each other.
7. gate driver circuit as claimed in claim 6 is it is characterised in that described reparation circuit also includes second initially repairs
Electronic circuit, the described second initial electronic circuit of repairing includes input, outfan and control end；
The described second initial input repairing electronic circuit is electrically connected with described original trigger signal line/described control signal wire,
The described second initial control end repairing electronic circuit is electrically connected with described control signal wire/described original trigger signal line, described
The second initial scanning signal input repairing the lead of outfan of electronic circuit and the described shift register circuit of m level intersect and
Insulated from each other.
8. described gate driver circuit as arbitrary in claim 3 to 7 is it is characterised in that each reparation of described reparation circuit is sub
Circuit includes a tft switch, and the gate electrode of described tft switch is electrically connected with the control end of affiliated described reparation electronic circuit, institute
The source electrode stating tft switch is electrically connected with the input of affiliated described reparation electronic circuit, drain electrode and institute that described tft switchs
The outfan electrical connection of the described reparation electronic circuit belonging to.
9. gate driver circuit as claimed in claim 8 is it is characterised in that described tft switchs as N-shaped tft, described control letter
Number line provides high level signal.
10. gate driver circuit as claimed in claim 8 is it is characterised in that described tft switchs as p-type tft, each described repaiies
When the control end of multiple electronic circuit is electrically connected with described control signal wire, described control signal wire provides low level signal.
A kind of 11. display floaters are it is characterised in that include the gate driver circuit as described in any one of claim 1 to 10.
A kind of 12. display devices are it is characterised in that include display floater as claimed in claim 11.
A kind of 13. restorative procedures of gate driver circuit, for repairing gate driver circuit as claimed in claim 7, it is special
Levy and be, comprising:
During forward scan, when (n+1)th grade of described scan control circuit operation irregularity, make n-th grade of described output repairing electronic circuit
The lead at end is electrically connected in infall with the driving signal input of (n+1)th grade of described shift register circuit, by n-th grade of described shifting
The drive signal of position register circuit output is supplied to the scanning signal input of (n+1)th grade of described shift register circuit；
During reverse scan, when (n-1)th grade of described scan control circuit operation irregularity, make n-th grade of described output repairing electronic circuit
The lead at end is electrically connected in infall with the scanning signal input of (n-1)th grade of described shift register circuit, according to n-th grade
The drive signal of shift register circuit output provides scanning letter to the scanning signal input of (n-1)th grade of described shift register circuit
Number；
Wherein, n=2,3,4......, m-2, m-1；M is the positive integer equal to or more than 4.
14. methods as claimed in claim 13 are it is characterised in that also include:
During forward scan, when the 2nd grade of described scan control circuit operation irregularity, make the 1st grade of described outfan repairing electronic circuit
Lead electrically connect in infall with the scanning signal input of the 2nd grade of described shift register circuit, according to the 1st grade of described displacement
The drive signal of register circuit output provides scanning signal to the scanning signal input of the 2nd grade of described shift register circuit.
15. methods as claimed in claim 13 are it is characterised in that also include:
During forward scan, when the 1st grade of described scan control circuit operation irregularity, make the first initial outfan repairing electronic circuit
Lead is electrically connected in infall with the scanning signal input of the 1st grade of described shift register circuit, according to original trigger signal, to
The scanning signal input of the 1st grade of described shift register circuit provides scanning signal.
16. methods as claimed in claim 13 are it is characterised in that also include:
During reverse scan, when m-1 level described scan control circuit operation irregularity, make the described output repairing electronic circuit of m level
The lead at end is electrically connected in infall with the scanning signal input of the described shift register circuit of m-1 level, according to m level
The drive signal of shift register circuit output, provides scanning to the scanning signal input of the described shift register circuit of m-1 level
Signal.
17. methods as claimed in claim 13 are it is characterised in that also include:
During reverse scan, when m level described scan control circuit operation irregularity, make the second initial outfan repairing electronic circuit
Lead is electrically connected in infall with the scanning signal input of the described shift register circuit of m level, according to original trigger signal, to
The scanning signal input of the described shift register circuit of m level provides scanning signal.
18. methods as described in any one of claim 13 to 17 are it is characterised in that also include:
The described first trigger input of described scan control circuit of cut-out operation irregularity, described second trigger are defeated
Enter end and described scanning signal outfan；
Each described control end repairing electronic circuit is when electrically connecting with described control signal wire, and described control signal wire described is repaiied for each
The control end of multiple electronic circuit provides high level signal or low level signal；Or, each described control end repairing electronic circuit with each
The drive signal outfan electrical connection of self-corresponding described shift register circuit, and each described input repairing electronic circuit and institute
When stating control signal wire electrical connection, described control signal wire provides high level signal for each described control end repairing electronic circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310755318.6A CN103928003B (en) | 2013-12-31 | 2013-12-31 | Grid driving circuit, restoration method thereof, display panel and display device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310755318.6A CN103928003B (en) | 2013-12-31 | 2013-12-31 | Grid driving circuit, restoration method thereof, display panel and display device |
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| Publication Number | Publication Date |
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| CN103928003A CN103928003A (en) | 2014-07-16 |
| CN103928003B true CN103928003B (en) | 2017-02-01 |
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| CN104143309A (en) * | 2014-07-24 | 2014-11-12 | 京东方科技集团股份有限公司 | Array substrate, display panel and repairing method of display panel |
| CN104505045B (en) * | 2014-12-29 | 2017-04-12 | 深圳市华星光电技术有限公司 | Liquid crystal display panel, gate drive circuit and fault detection method of gate drive circuit |
| KR20160096777A (en) * | 2015-02-05 | 2016-08-17 | 삼성디스플레이 주식회사 | Gate driver and display apparatus including the same |
| CN105259681B (en) * | 2015-11-04 | 2018-05-18 | 武汉华星光电技术有限公司 | It repairs raster data model substrate and adjusts the method and liquid crystal display of its output |
| CN105551423B (en) * | 2016-03-04 | 2018-06-29 | 京东方科技集团股份有限公司 | A kind of grid integrated drive electronics, array substrate and its restorative procedure |
| CN106782290B (en) * | 2016-12-28 | 2020-05-05 | 广东聚华印刷显示技术有限公司 | Array substrate, display panel and display device |
| CN106935181A (en) * | 2017-05-22 | 2017-07-07 | 厦门天马微电子有限公司 | Gate driving circuit |
| CN109979373B (en) * | 2019-05-07 | 2023-08-08 | 京东方科技集团股份有限公司 | Shift register unit, shift register, display device and test method thereof |
| CN110299110B (en) * | 2019-06-28 | 2020-10-02 | 上海天马有机发光显示技术有限公司 | Driving method of grid driving circuit, grid driving circuit and display device |
| EP4020443A4 (en) | 2019-08-21 | 2023-01-11 | BOE Technology Group Co., Ltd. | Display substrate and manufacturing method therefor, and display device |
| US11900884B2 (en) | 2019-08-21 | 2024-02-13 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Display substrate having a scan driving circuit with a plurality of shift registers and manufacturing method thereof, display device |
| KR20210086314A (en) * | 2019-12-31 | 2021-07-08 | 엘지디스플레이 주식회사 | Display apparatus and multi screen display apparatus using the same |
| CN111445841B (en) * | 2020-05-14 | 2022-04-08 | 京东方科技集团股份有限公司 | Display device and detection method thereof |
| CN113539177B (en) * | 2021-07-30 | 2022-12-02 | 京东方科技集团股份有限公司 | Scanning control circuit, driving method thereof, grid driving circuit and display device |
| CN113871434B (en) * | 2021-09-17 | 2023-04-18 | 深圳市华星光电半导体显示技术有限公司 | Display panel and repairing method thereof |
| CN118397947B (en) * | 2024-06-26 | 2024-09-06 | 惠科股份有限公司 | Gate driving circuit, gate driving circuit repairing method and display panel |
| CN118571192A (en) * | 2024-07-02 | 2024-08-30 | 惠科股份有限公司 | Driving circuit and driving method of display panel and display device |
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| KR20070076293A (en) * | 2006-01-18 | 2007-07-24 | 삼성전자주식회사 | Liquid crystal display and method of repairing the same |
| CN101510411B (en) * | 2009-03-05 | 2011-01-19 | 友达光电股份有限公司 | Display device and renovation method thereof |
| CN102708779B (en) * | 2012-01-13 | 2014-05-14 | 京东方科技集团股份有限公司 | Shift register and driving device thereof, grid driving device and display device |
| CN103426385B (en) * | 2012-05-15 | 2016-03-02 | 京东方科技集团股份有限公司 | Gate drive apparatus, array base palte and display device |
| CN202736457U (en) * | 2012-06-18 | 2013-02-13 | 北京京东方光电科技有限公司 | Array-substrate grid drive circuit and LCD |
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