CN103901617B - Wavefront detection-free adaptive optical system based on model - Google Patents
Wavefront detection-free adaptive optical system based on model Download PDFInfo
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Abstract
A wavefront detection-free adaptive optical system based on a model comprises a main control computer, a digital-to-analog converter, a high-voltage amplifier, a reflection deformable mirror, a focusing lens, a facula detector, an image capture card and a wavefront correction method, wherein a distorted wavefront to be corrected is reflected on the focusing lens through the reflection deformable mirror and then focused on the facula detector located on the focal plane of the distorted wavefront through the focusing lens, the main control computer outputs a control signal obtained through wavefront correction method operation to the high-voltage amplifier, the signal is amplified through the high-voltage amplifier and applied to each driver of the reflection deformable mirror to enable the reflection deformable mirror to generate a deformation in the direction opposite to the direction of the wavefront to be detected, and finally various aberrations of the incident beam wavefront are corrected. The system is simple in structure, low in cost, high in convergence speed, easy to realize and wider in application range.
Description
Technical field
The invention belongs to optical technical field, relate to a kind of new ADAPTIVE OPTICS SYSTEMS, particularly a kind of based on model without Wavefront detecting ADAPTIVE OPTICS SYSTEMS.
Background technology
The various Static and dynamic aberrations existed in optical system have had a strong impact on the performance of optical system.Adaptive optical technique is the powerful measure improving the resolution characteristic of optical imaging system and the beam quality of laser system.Obtain application in fields such as astronomical imaging, Laser Transmission, industry and medical imagings at present.
Conventional ADAPTIVE OPTICS SYSTEMS is made up of Wavefront sensor, wavefront controller and wave-front corrector three parts.The existence of Wavefront sensor makes whole ADAPTIVE OPTICS SYSTEMS complex structure, cost intensive, and its application is difficult to be expanded and popularize.In the applied environment that wavefront information cannot be measured, as lasercom, laser intracavity aberration correction, expansion target etc., this type systematic uses limited.
Compare conventional adaptive optical technique, Wavefront detecting link is no longer needed without Wavefront detecting ADAPTIVE OPTICS SYSTEMS, thus system complexity reduces greatly, and has than conventional adaptive optical technique application space more widely, as the environment that above-mentioned wavefront cannot be measured.But existingly mostly adopt various blind optimized algorithm as systematic control algorithm without Wavefront detecting ADAPTIVE OPTICS SYSTEMS, as genetic algorithm, particle cluster algorithm, random paralleling gradient descent algorithm or simulated annealing, this type systematic is called that model-free optimizes ADAPTIVE OPTICS SYSTEMS.Speed of convergence is that model-free optimizes the greatest drawback of ADAPTIVE OPTICS SYSTEMS slowly, is difficult to use in real-time aberration correction system, is only applicable to the application scenario do not required the time.
Summary of the invention
Technical matters to be solved by this invention is high for prior art complex structure, cost and is difficult to the deficiency applied in some occasion, and existing without problems such as Wavefront detecting ADAPTIVE OPTICS SYSTEMS speed of convergence are slow, propose that a kind of structure is simple, with low cost, fast convergence rate, be easy to realize and wider novel without Wavefront detecting ADAPTIVE OPTICS SYSTEMS of range of application.
Technical matters to be solved by this invention is realized by following technical scheme.The present invention be a kind of based on model without Wavefront detecting ADAPTIVE OPTICS SYSTEMS, be characterized in: comprise main control computer, digital to analog converter, high-voltage amplifier, reflection deformable mirror, condenser lens, laser spot detection device, image pick-up card, wave front correction method forms, distorted wavefront to be corrected reflexes on condenser lens by deformation reflection mirror, on the laser spot detection device of line focus lens focus on its focal plane, main control computer outputs to high-voltage amplifier the control signal obtained through wave front correction method computing, this signal amplifies through high-voltage amplifier again, be applied on each driver of deformation reflection mirror, distorting lens catoptron is made to produce the deflection contrary with wavefront direction to be measured, the various aberrations of correction of a final proof incident beam wavefront.
In system of the present invention, the preferred specific implementation step of described wave front correction method is as follows:
(1) Zernike polynomial expression or K-L polynomial basis function that one group characterizes wave front aberration is defined; Calculate the gradient second moment of each rank Zernike aberration x component, y component, and invert, be designated as
;
(2) measured the far field light intensity of aberration to be corrected by laser spot detection device, be read into main control computer through image pick-up card, intercept centered by barycenter
the image planes of size, and calculate the image planes light intensity sum intercepting part, be designated as
,
span is 10 ~ 20 times of diffraction limits;
(3) Zernike or K-L each rank pattern and the relation between distorting lens influence function is utilized to obtain distorting lens driver control signal corresponding to each rank pattern, amplify through high-voltage amplifier again and be applied to each driver of distorting lens, thus each rank Zernike or K-L aberration are converted to distoring mirror shape, each rank Zernike or K-L mode coefficient vector are designated as
;
(4) distorting lens produce each rank Zernike or K-L aberration respectively with addition of wavefronts to be corrected, line focus lens focus, far-field spot corresponding to the wavefront after superposition is measured by the laser spot detection device be placed on condenser lens focal plane, be read into main control computer through image pick-up card again, intercept centered by barycenter
the image planes of size, and calculate the light intensity sum intercepting part image planes, the light intensity sum that N rank Zernike aberration is corresponding is designated as respectively
, N is positive integer;
(5) in main control computer, respectively will
with aberration hot spot sum to be measured
do difference operation, obtain one
dimensional vector
;
;
(6) formula is utilized
obtain each controller drive singal of distorting lens corresponding to wavefront to be corrected, this drive singal is applied to each driver of distorting lens through high-voltage amplifier amplification, and generate the deflection contrary with wavefront direction to be measured, be added to wavefront to be corrected;
(7) by correct after residual wave previous crops be wavefront to be corrected, repeat step (2)-(6) until algorithm meets the end condition preset, before described end condition comprises certain iterations or residual wave, corresponding far-field spot light intensity sum is greater than a threshold value.
The principle of present system is: in geometric optical theory, the barycenter of far-field spot intensity is relevant with wavefront distortion to be corrected.Through certain mathematic(al) manipulation can derive obtain certain some light intensity value on the imaging surface of far field and the second moment of wavefront gradients linear, utilize above-mentioned principle design system closed loop wave front correction method.Adopt deformation reflection mirror as the wavefront correction device of ADAPTIVE OPTICS SYSTEMS, deformation reflection mirror is controlled by described wave front correction method.Each time in iteration, hot spot sum corresponding with wavefront to be corrected for far-field spot light intensity sum corresponding for the wavefront to be corrected of superposition Zernike or K-L aberration is done difference operation, then is multiplied by the inverse distorting lens drive singal that can obtain current iteration number of times of wavefront gradients second moment.Drive singal is amplified and is applied to each driver of distorting lens, change the surface configuration of distorting lens, produce corresponding phase compensation amount.
The present invention compared with prior art, has the following advantages:
(1) conventional ADAPTIVE OPTICS SYSTEMS is made up of Wavefront sensor, wavefront controller and wave-front corrector three parts.The present invention does not need Wavefront sensor that the complicacy of whole system and cost are reduced greatly;
(2) the present invention directly calculates control signal from picture plane picture, avoids the shortcoming of Wavefront sensor and the separate light splitting of imaging system in usual ADAPTIVE OPTICS SYSTEMS, waste incident light energy, improves the efficiency of light energy utilization;
(3) conventional ADAPTIVE OPTICS SYSTEMS, as the ADAPTIVE OPTICS SYSTEMS based on Hartmann sensor, needs prior demarcation before using.The present invention does not need prior demarcation, can correct together with the static aberration of wavefront to be corrected and system self;
(4) existing slow without Wavefront detecting ADAPTIVE OPTICS SYSTEMS speed of convergence, be the maximum bottleneck applying it to real time correction field.The present invention compared to the prior art speed of convergence improves greatly, and required iterations is few, can be applied to adaptive optics real time correction field.
Accompanying drawing explanation
Fig. 1 structural representation of the present invention;
The process flow diagram of Fig. 2 wave front correction method of the present invention.
Embodiment
Referring to accompanying drawing, further describe concrete technical scheme of the present invention, so that those skilled in the art understands the present invention further.
As shown in Figure 1, a kind of being made up of main control computer, digital to analog converter, high-voltage amplifier, reflection deformable mirror, condenser lens, laser spot detection device, image pick-up card without Wavefront detecting ADAPTIVE OPTICS SYSTEMS based on model.Distorted wavefront to be corrected reflexes on condenser lens by deformation reflection mirror, on the laser spot detection device of line focus lens focus on its focal plane, main control computer reads capture card data, realize wave front correction method, and the control signal obtained through wave front correction method computing is outputted to digital to analog converter, digital signal is converted to simulating signal and sends high-voltage amplifier to by digital to analog converter, control signal is amplified through high-voltage amplifier, be applied on each driver of deformation reflection mirror, distorting lens catoptron is made to produce the deflection contrary with wavefront direction to be measured, the various aberrations of correction of a final proof incident beam wavefront.
During concrete enforcement, can carry out as follows:
(1) pre-service, comprises gradient inverse matrix and distorting lens control signal corresponding to constituent parts Zernike pattern calculates, and this two parts information calculated in advance, it doesn't matter with wavefront to be corrected, stores with for subsequent use.
A gradient second moment calculates.First define the basis function that a group characterizes wave front aberration, the implementation case for Zernike polynomial expression, but is not limited to Zernike polynomial expression, as K-L polynomial expression etc.Calculate the gradient second moment of each rank Zernike aberration x component, y component, and invert, be designated as
.
The distorting lens control signal calculating that B constituent parts Zernike pattern is corresponding.The calculating of distorting lens drive singal corresponding to each single-order Zernike pattern is completed according to formula (1).
(1)
Wherein
for driver control signal vector,
for the mutual relationship matrix between driver influence function and Zernike pattern,
for the coupled matrix between driver influence function, for symmetrical matrix is reversible.Matrix
with
prior measurement or calculating, it doesn't matter with aberration to be corrected.
(2) iterative process.For N rank mode correction, iterative process is described.
A measures the far field light intensity of aberration to be corrected by laser spot detection device, is read into main control computer, intercepts centered by barycenter through image pick-up card
the image planes of size, and calculate the light intensity sum intercepting part image planes, be designated as
,
span is 10 ~ 20 times of diffraction limits;
B is with coefficient
substitute into formula (1) and obtain the
the distorting lens drive singal that rank Zernike pattern aberration is corresponding, and this signal is outputted to digital-to-analog conversion part by main control computer, distorting lens is applied to again through high-voltage amplifier, the face shape that distorting lens produces and addition of wavefronts to be corrected, line focus lens focus, measure far-field spot corresponding to the wavefront after superposition by the laser spot detection device be placed on condenser lens focal plane, then be read into main control computer through image pick-up card, intercept centered by barycenter
the image planes of size, and calculate the light intensity sum intercepting part image planes, be designated as
.Repeat above process, obtain the light intensity sum that N rank Zernike aberration is corresponding, be designated as respectively
.Total Zernike coefficient vector is
.
C, in main control computer, calculates Q by formula (2).
(2)
D utilizes formula (3) to obtain each controller drive singal of distorting lens corresponding to wavefront to be corrected, this drive singal is applied to each driver of distorting lens through high-voltage amplifier amplification, generate the deflection contrary with wavefront direction to be measured, be added to wavefront to be corrected, before obtaining residual wave.
(3)
Residual wave previous crops after correction is wavefront to be corrected by E, and repeat steps A-D until algorithm meets the end condition preset, the far-field spot light intensity sum as corresponding before certain iterations or residual wave is greater than a threshold value.
(3) iterative process terminates, and wave front aberration is corrected.
Fig. 2 be based on model without Wavefront detecting adaptive optics closed loop wave front correction method process flow diagram.
The part that the present invention does not elaborate can with reference to techniques well known.
Claims (1)
1. one kind based on model without Wavefront detecting ADAPTIVE OPTICS SYSTEMS, it is characterized in that: comprise main control computer, digital to analog converter, high-voltage amplifier, reflection deformable mirror, condenser lens, laser spot detection device, image pick-up card, wave front correction method forms, distorted wavefront to be corrected reflexes on condenser lens by deformation reflection mirror, on the laser spot detection device of line focus lens focus on its focal plane, main control computer outputs to high-voltage amplifier the control signal obtained through wave front correction method computing, this signal amplifies through high-voltage amplifier again, be applied on each driver of deformation reflection mirror, distorting lens catoptron is made to produce the deflection contrary with wavefront direction to be measured, the various aberrations of correction of a final proof incident beam wavefront,
The specific implementation step of described wave front correction method is as follows:
(1) Zernike polynomial expression or K-L polynomial basis function that one group characterizes wave front aberration is defined; Calculate the gradient second moment of each rank Zernike aberration x component, y component, and invert, be designated as P;
(2) measured the far field light intensity of aberration to be corrected by laser spot detection device, be read into main control computer through image pick-up card, centered by barycenter, intercept the image planes of M × M size, and calculate the image planes light intensity sum intercepting part, be designated as I
0, M span is 10 ~ 20 times of diffraction limits;
(3) Zernike or K-L each rank pattern and the relation between distorting lens influence function is utilized to obtain distorting lens driver control signal corresponding to each rank pattern, amplify through high-voltage amplifier again and be applied to each driver of distorting lens, thus each rank Zernike or K-L aberration are converted to distoring mirror shape, each rank Zernike or K-L mode coefficient vector are designated as a;
(4) distorting lens produce each rank Zernike or K-L aberration respectively with addition of wavefronts to be corrected, line focus lens focus, far-field spot corresponding to the wavefront after superposition is measured by the laser spot detection device be placed on condenser lens focal plane, main control computer is read into again through image pick-up card, the image planes of M × M size are intercepted centered by barycenter, and calculating the light intensity sum intercepting part image planes, the light intensity sum that N rank Zernike aberration is corresponding is designated as I respectively
1, I
2 i
n, N is positive integer;
(5) in main control computer, respectively by I
1, I
2 i
nwith aberration hot spot sum I to be measured
0do difference operation, obtain a N dimensional vector Q,
(6) formula is utilized
obtain each controller drive singal of distorting lens corresponding to wavefront to be corrected, this drive singal is applied to each driver of distorting lens through high-voltage amplifier amplification, and generate the deflection contrary with wavefront direction to be measured, be added to wavefront to be corrected;
(7) by correct after residual wave previous crops be wavefront to be corrected, repeat step (2)-(6) until algorithm meets the end condition preset, before described end condition comprises certain iterations or residual wave, corresponding far-field spot light intensity sum is greater than a threshold value.
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| CN112882224B (en) * | 2021-01-19 | 2021-12-14 | 中国工程物理研究院激光聚变研究中心 | Wavefront control method |
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