CN103884883A - Multichannel probe for logic analysis, and probe assembly thereof - Google Patents

Multichannel probe for logic analysis, and probe assembly thereof Download PDF

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Publication number
CN103884883A
CN103884883A CN201210563369.4A CN201210563369A CN103884883A CN 103884883 A CN103884883 A CN 103884883A CN 201210563369 A CN201210563369 A CN 201210563369A CN 103884883 A CN103884883 A CN 103884883A
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probe
hyperchannel
cable
electrically connected
terminal
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CN201210563369.4A
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CN103884883B (en
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史慧
张琰
王悦
王铁军
李维森
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Rigol Technologies Inc
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Rigol Technologies Inc
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Abstract

The invention relates to the field of testing, and specifically relates to a multichannel probe for logic analysis, and a probe assembly thereof. The multichannel probe assembly comprises at least one probe front end. The probe front end comprises a signal cable and a test terminal; the test terminal comprises a plug-in terminal and a grounding terminal; the signal cable is provided with a shield net and a center signal conductor; the second end of the signal cable is provided with two pins; one pin is electrically connected with the plug-in terminal through the center signal conductor; the other pin is electrically connected with the grounding terminal through the shield net; and the two pins can be plugged into two insertion holes in double-row insertion holes at one end of a probe main body. According to the embodiments of the invention, the topology structure and probe assembly which are used for high-performance multichannel universal probe are designed so that excellent signal acquisition performance and user application convenience are provided to the maximum degree. The designed replaceable probe front end can be connected to the probe main body so that the use is convenient, replacement is facilitated, and various test requirements are satisfied.

Description

A kind of probe of the hyperchannel for logic analysis and probe assembly thereof
Technical field
The present invention relates to field tests, be specifically related to a kind of probe of the hyperchannel for logic analysis and probe assembly thereof.
Background technology
Hyperchannel probe is used to obtain the multiple signals of equipment under test, under more complicated signal measurement application scenario, has significant advantage.Most typical application is as logic analyser or has the oscillographic front-end probe of logic analysis function.In the time will more comprehensively analyzing an electronic system, just need the signal that is hopeful to observe gather out simultaneously, be input in tester and analyze by probe.Wherein one end of probe is connected on testing tool, for example oscillograph or logic analyser, and being connected to the probe other end by one group of cable, the other end can be divided into some independently tiny probes (front end of popping one's head in), directly or by probe frontal attachments is connected on electronic system measured point.
Because needle construction is not often just arranged in the measured point in an electronic system, it is more often structure complicated and changeable, and often also can be distant between measured point, and probe and measured point between being connected also need convenient and reliable, meanwhile, signal collected quality and reduction degree are also had to very high requirement.There are exactly multiple test channel and easy to use for several features of the probe maximum of logic analysis.
A kind of multi channel signals common on market is popped one's head in, adopt and adopt textile technology to weave on multi channel signals line and hyperchannel ground wire, be woven into flat ribbon cable, and coordinate probe point (front end of popping one's head in) to measure, as the 54620-68701 logic analysis instrument probe of Agilent.But above-mentioned probe, is similar parallel lines or twisted-pair feeder owing to adopting between the signal wire of textile technology and ground wire, and frequency response and bandwidth to signal are totally unfavorable, cause overshoot larger.And this strip line cable, because every line is thinner, therefore easily damage.
Also have on the market now a kind of high-performance multi channel signals to catch probe, the Chinese patent " a kind of multi-channel signal acquisition probe " taking number of patent application as 200780018189 is as example.In order to overcome the shortcoming of above-mentioned probe, ensure the quality of collection signal, its each passage all can adopt separate coaxial cable to carry out transmission of electric signals.Some on electrical property independently coaxial cable formed the thicker wider cable of a ribbon or column by different processing technologys.Specifically as shown in Figure 1, one end of this cable is connected to a connector, be used for surveying instrument on connector interconnect, as measured signal to the interface of surveying instrument.The other end is separated into separately independently coaxial cable, and every coaxial cable is fixedly connected with separately a probe adapter, has independently signal probe or other collection signal device on probe adapter, as the entrance of measured signal, realizes hyperchannel probe.Wherein, the central signal conductors of coaxial cable is used as the path of signal transmission, and its outer shielding conductor is done shielding use, the quality by its ground connection with guarantee signal.But each signal probe is all fixed in ribbon cable, cannot be disassembled.Probe adapter is made up of circuit board, shell and splicing ear, wherein the upper circuit lead of circuit board is connected in series to a damping resistance in the middle of splicing ear and cable, can regulate like this high frequency frequency response of hyperchannel probe, reduce the ring that probe cable causes, i.e. damped oscillation.
As from the foregoing, multi-channel signal acquisition probe of the prior art has following shortcoming:
1, each probe front end cannot be dismantled, if damaged, just cannot be replaced.
2,, because cable is longer, therefore can only increase the resistance of damping resistance, ability suppressed ringing; And the electric capacity of damping resistance and cable has directly formed a low pass circuit, its resistance has limited again the bandwidth of probe, and bandwidth and attenuation ratio cannot change.
3, because signal attenuation circuit of the prior art is arranged on the card extender in the middle of probe, be therefore directed to different testing apparatuss and only there is a kind of fixing attenuation ratio.
4, identical coaxial cable, cannot configure different probe adapters.And each adapter cannot the row's of measurement pin geometric ratio comparatively dense measured object, can only being connected with measured source one one of little probe when measurement.And the measured source of often arranging aciculiform formula is also more common, thus can have a great impact for connection reliability like this, and very inconvenient user operation, cause measurement form single.
Summary of the invention
The embodiment of the present invention is provided for hyperchannel probe and the probe assembly thereof of logic analysis, the problem that cannot dismantle for solving each probe front end of prior art.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, comprises at least one probe front end;
Described probe front end comprises: a signal cable and be located at the calibrating terminal of described signal cable first end; Described calibrating terminal comprises: plug-in unit terminal and ground terminal;
Described signal cable has gauze screen and is positioned at the central signal conductors of described gauze screen; The second end of described signal cable is provided with two contact pins, and a contact pin is electrically connected to described plug-in unit terminal by the central signal conductors of described signal cable, and another contact pin is electrically connected to described ground terminal by the gauze screen of described signal cable; Two described contact pins can be pegged graft mutually with two jacks in the double jack of probe body one end.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, described probe assembly also comprises: two ends are respectively the probe adapter of double contact pin and double jack, and the double contact pin of described probe adapter and double jack are independently electrically connected described probe adapter is inner corresponding; In two contact pins of described signal cable and the double jack of described probe adapter, two jacks are pegged graft mutually, and the double jack of described probe body one end and the double contact pin of described probe adapter are pegged graft mutually.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, the calibrating terminal of described probe front end also comprises: have the front end pcb board of attenuator circuit, signal cable is welded on one end of front end pcb board, and plug-in unit terminal and ground terminal are welded on respectively the other end of front end pcb board.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, one end of described attenuator circuit is electrically connected described plug-in unit terminal, and the other end is electrically connected the central signal conductors of described signal cable.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, described attenuator circuit comprises: the damping resistance of series connection and bleeder circuit, described damping resistance one end is electrically connected described plug-in unit terminal, described bleeder circuit one end is electrically connected the central signal conductors of described signal cable, and described bleeder circuit comprises resistance parallel with one another and electric capacity.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, described plug-in unit terminal and described ground terminal composition one have the stairstepping of long end and short end, and described plug-in unit terminal is described long end.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, described probe assembly also comprises: ground connection expansion annex; Described ground terminal is inserted in one end that described ground connection expansion annex has contact pin, and the other end with jack is concordant with the outer end of described plug-in unit terminal; The jack of described ground connection expansion annex is electrically connected with described ground terminal by the contact pin of described ground connection expansion annex.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, a side of the calibrating terminal of described probe front end is provided with at least two assembling posts, and opposite side is provided with at least two pilot holes, described assembling post on adjacent two calibrating terminals is corresponding with pilot hole position, mutually engaging.
The above-mentioned hyperchannel probe assembly for logic analysis, wherein, described probe assembly at least also comprises one of following assembly or its combination in any: with the male extended line of described plug-in unit terminal or the corresponding connection of described ground terminal, female extended line, test probe, test clip.
A kind of probe of the hyperchannel for logic analysis that the embodiment of the present invention provides, comprising: the hyperchannel probe assembly described in probe body and as above any;
Described probe body comprises: plug, ribbon cable and have the adaptor interface box of double jack;
Described adaptor interface box have double jack one end connect described hyperchannel probe assembly, its other end connects the second end of described ribbon cable;
The first end of described ribbon cable connects described plug.
The above-mentioned probe of the hyperchannel for logic analysis, wherein, described ribbon cable comprises many coaxial cables, described coaxial cable has respectively central signal conductors, internal insulating layer, gauze screen and external insulation from the inside to the outside; One socket hole correspondence of described adaptor interface box is electrically connected independently with the central signal conductors of multiple described coaxial cables of described ribbon cable the second end, and its another socket hole is corresponding to be electrically connected with the gauze screen of described coaxial cable.
The above-mentioned probe of the hyperchannel for logic analysis, wherein, built-in the first pcb board of described adaptor interface box, a socket hole of described adaptor interface box is electrically connected with the central signal conductors of many coaxial cables of described ribbon cable the second end independently by many cablings correspondences on described the first pcb board; Another socket hole is electrically connected with the gauze screen of coaxial cable every described by the ground wire on described the first pcb board is corresponding;
Built-in the second pcb board of described plug, many cablings correspondences of described the second pcb board are electrically connected independently with the central signal conductors of many coaxial cables of described ribbon cable first end; The ground wire correspondence of described the second pcb board is electrically connected with the gauze screen of coaxial cable every described.
The above-mentioned probe of the hyperchannel for logic analysis, wherein, described hyperchannel probe also comprises: poroid insulant, described ribbon cable arrives the weld of described the first pcb board and/or described the second pcb board through described poroid insulant; The cable guide clearance hole of the corresponding described poroid insulant of each pad of described weld.
The probe of the hyperchannel for logic analysis and probe assembly thereof that the embodiment of the present invention provides, by topological structure and the probe assembly of design high-performance hyperchannel universal probe, farthest provide superior signals collecting performance and user's ease of use.Wherein the removable probe front end of design, can be directly connected to probe body or be transferred in probe body by adapter, easy to use, is beneficial to replacing, is used for meeting various test requests; The front end of simultaneously popping one's head in has attenuator circuit, has ensured that probe has maximum bandwidth, and can be because cable electric capacity causes Bandwidth Reduction, has ensured bandwidth, the amplitude-frequency response measured; Only need in addition to use a probe body, coordinate different probe front ends, just can be arranged to the hyperchannel probe of differential declines ratio, different bandwidth, facilitate user to upgrade; And bring in the row's of measurement needle construction before can combining several probes, and can also use as chip pin structure, the annex that pore structure etc. are different is measured the different measured objects of surveying, and farthest facilitates user to measure; The ribbon cable that also uses the coaxial cable of multilayer insulation shielding to form in connection procedure, and ribbon cable is welded on pcb board by poroid insulant, not only ensure maximum bandwidth and the isolation of interchannel signal of probe, reduced channels crosstalk, made to weld more convenient neat simultaneously.
Brief description of the drawings
Accompanying drawing described herein is used to provide a further understanding of the present invention, forms the application's a part, does not form limitation of the invention.In the accompanying drawings:
Fig. 1 is the structural representation of hyperchannel probe of the prior art;
Fig. 2 A and Fig. 2 B are the structural representation of the probe front end in the embodiment of the present invention;
Fig. 3 is the perspective view of the probe adapter in the embodiment of the present invention;
Fig. 4 is the annexation schematic diagram of the probe adapter in the embodiment of the present invention and pop one's head in front end and adaptor interface box;
Fig. 5 is the electrical block diagram of a kind of attenuator circuit in the embodiment of the present invention;
Fig. 6 A to Fig. 6 D is in the embodiment of the present invention, will pop one's head in front end and ground connection expansion enclosure group parent structure schematic diagram in a row;
Fig. 7 is the structural representation of embodiment of the present invention middle part sub-probe assembly;
Fig. 8 A is probe front end in the embodiment of the present invention and the syndeton schematic diagram of male extended line;
Fig. 8 B is probe front end in the embodiment of the present invention and the syndeton schematic diagram of female extended line;
Fig. 8 C is probe front end in the embodiment of the present invention and the syndeton schematic diagram of test clip;
Fig. 9 is the hyperchannel sonde configuration schematic diagram for logic analysis in the embodiment of the present invention;
Figure 10 is the inner structure schematic diagram of the adaptor interface box in the embodiment of the present invention;
Figure 11 is the inner structure schematic diagram of the plug in the embodiment of the present invention;
Figure 12 is the poroid insulant inner structure schematic diagram in the embodiment of the present invention.
Embodiment
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with accompanying drawing, the embodiment of the present invention is described in further detail.At this, schematic description and description of the present invention is used for explaining the present invention, but not as a limitation of the invention.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, comprises at least one probe front end, and the structure of probe front end is as shown in Fig. 2 A and 2B;
One of Fig. 2 B probe front end, comprising: a signal cable 12 and be located at the calibrating terminal 16 of described signal cable 12 first ends; Described calibrating terminal 16 comprises: plug-in unit terminal 17 and ground terminal 18;
Described signal cable 12 has gauze screen and is positioned at the central signal conductors of described gauze screen; The second end of described signal cable 12 is provided with two contact pins 13, a contact pin is electrically connected to plug-in unit terminal 17 by the central signal conductors of described signal cable, for being connected with measured signal, another contact pin is electrically connected to ground terminal 18 by the gauze screen of described signal cable, for the reference of circuit-under-test be connected; These two contact pins can be pegged graft mutually with two jacks in the double jack of probe body one end.Preferably, can mutually peg graft by two jacks upper and lower corresponding with probe body, be convenient for measuring.Preferably, the probe front end in Fig. 2 B can be made into probe front end as shown in Figure 2 A after encapsulate technique.
The above embodiment of the present invention, by topological structure and the probe assembly of design high-performance hyperchannel universal probe, farthest provides superior signals collecting performance and user's ease of use.Wherein the removable probe front end of design, can be connected in probe body, easy to use, is beneficial to replacing, is used for meeting various test requests.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, preferably, described probe assembly also comprises: two ends are respectively the probe adapter of double contact pin and double jack, specifically as shown in Figure 3, the double contact pin of described probe adapter and double jack are independently electrically connected described probe adapter is inner corresponding.
Concrete, as shown in Figure 4, two jacks in two contact pins of described signal cable 12 and the double jack of described probe adapter 5 are pegged graft mutually, and the double contact pin of the double jack of described adaptor interface box 3 one end and the probe adapter 5 of probe body is pegged graft mutually.Preferably, described probe adapter is can buckle, and in the time that two jacks in two contact pins of signal cable and the double jack of described probe adapter are pegged graft mutually, probe front end is withheld, increase connectivity robustness, facilitated plug, replacing simultaneously.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, preferably, the calibrating terminal 16 of described probe front end also comprises front end pcb board, and signal cable 12 is welded on one end of front end pcb board, and plug-in unit terminal 17 and ground terminal 18 are welded on respectively the other end of front end pcb board.A contact pin of probe front end, successively by central signal conductors and the front end pcb board of described signal cable 12, is electrically connected to plug-in unit terminal 17; Another contact pin by gauze screen and the front end pcb board of described signal cable 12, is electrically connected to ground terminal 18 successively.On front end pcb board, be also provided with attenuator circuit.Concrete; after attenuator circuit by measured signal by probe front end, connect into testing apparatus; play the protective effect to equipment under test; also reduced the load effect of testing apparatus to circuit-under-test simultaneously; thereby can reduce more really measured signal, ensure bandwidth and the amplitude-frequency response measured.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, preferably, for the measured signal that ensures to receive accurate as far as possible, need attenuator circuit as far as possible near measured signal, described attenuator circuit is located to described probe front end, one end of attenuator circuit is electrically connected described plug-in unit terminal like this, and the other end is electrically connected the central signal conductors of described signal cable.Described plug-in unit terminal, successively by the central signal conductors of described attenuator circuit, signal cable, is electrically connected with a contact pin of described signal cable the second end.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, as shown in Figure 5, preferably, described attenuator circuit comprises: damping resistance R1 and the bleeder circuit of series connection, described damping resistance R1 one end is electrically connected described plug-in unit terminal, the other end is electrically connected one end of described bleeder circuit, and damping resistance R1 is used for improving frequency response; The other end of described bleeder circuit is electrically connected the central signal conductors of described signal cable, for equipment under test is carried out to dividing potential drop.Described bleeder circuit comprises resistance R parallel with one another 2 and capacitor C 1.Concrete, P1 is a pad, weldering connector terminals, and for being connected with measured signal, P2 is a pad, the central signal conductors of welding signal cable.The screen layer of ground terminal and signal cable welds together by the cabling of front end pcb board, for connecting the reference ground of circuit-under-test, the attenuator circuit of probe front end inside, together with signal cable, plug-in unit terminal soldering, then, by encapsulate technique, forms final profile like this.Input resistance and electric capacity that wherein R3, C2 are equipment under test.R2, C1, for R3, C2 are carried out to dividing potential drop, form decay.Preferably, the attenuator circuit of probe in front end, has determined the attenuation multiple of multi-channel signal acquisition probe in the time changing R2 and C1, just to have changed attenuation multiple, can produce the little probe front end of differential declines multiple, selects for user, upgrades.For example, in the situation that not considering stray capacitance, as A times of need decay, A=(R2+R3)/R3=(C1+C2)/C1, preferably, when the input resistance of input equipment is 10k Ω, input capacitance is 90pF, and in attenuator circuit, R2 is 90k Ω, C1 is 10pF, when damping resistance is got 249 Ω, can realize good frequency response, reach bandwidth more than 300MHz.Wherein C1 is used for compensating equipment under test input capacitance C2, makes the amplitude-frequency response of high and low frequency basically identical.Attenuation multiple, signal cable bandwidth, damping resistance R1 and circuit board parasitic parameter have determined that hyperchannel obtains the bandwidth of probe, by optimizing these parameters, can realize the probe front end of different bandwidth, provide user to use, just can realize multiple Measurement bandwidth, and do not need to buy different complete probes, and facilitate user, cost-saving.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, as shown in Figure 2 A, described plug-in unit terminal and described ground terminal composition one have the stairstepping of long end and short end, and described plug-in unit terminal is described long end.In other embodiment provided by the invention, this plug-in unit terminal can also be concordant with ground terminal, is convenient for measuring multi-form measured object, as arranged needle construction etc.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, as shown in Fig. 6 A to Fig. 6 D, described probe assembly also comprises: ground connection expansion annex 20; Described ground terminal 18 is inserted in one end that described ground connection expansion annex 20 has contact pin, and the other end with jack is concordant with the outer end of described plug-in unit terminal 17; The jack of described ground connection expansion annex 20 is electrically connected with described ground terminal 18 by the contact pin of described ground connection expansion annex.Preferably, one side of calibrating terminal is designed with at least two pilot holes 21, relative opposite side is designed with at least two outstanding assembling posts 22, described assembling post on adjacent two calibrating terminals is corresponding with pilot hole position, engaging mutually, by the assembling post 22 of a calibrating terminal being put into the pilot hole 21 of another calibrating terminal, can be by n calibrating terminal as shown in Fig. 6 C, be laminated into the combination of calibrating terminal and the ground connection expansion annex of 2 × n row parent structure, as Fig. 6 D, for the measured source of the row's of being convenient for measuring aciculiform formula, wherein pilot hole 21 calculates according to the elasticity coefficient process of cover material with the size of assembling post 22, after like this their alignings being pressed, can connect closely.In the time that measured source is double-row needle structure, user can insert probe adapter on adaptor interface box, and probe adapter front end can insert again several probe front ends.Each probe front end is installed after ground connection expansion annex, some probe front ends of installing ground connection expansion annex, be connected with assembling post by structural pilot hole, will form a row female, and the assembly sequency that this mother's row testing sequence can be popped one's head between front end by change is adjusted, for user's thermometrically brings better convenience and dirigibility.
At the above-mentioned hyperchannel probe assembly for logic analysis of the present invention, in another preferred embodiment, providing one can be without by grafting ground connection expansion annex, the row mother adapter that can directly measure the measured source of row's aciculiform formula.As shown in Figure 4, arranging female adapter 4 can directly measure the measured source of the forms such as row's pin.Concrete, the probe front end described in above-described embodiment is built in the female adapter 4 of row, without the probe front end of pegging graft again, easy to use like this.
The hyperchannel probe assembly for logic analysis that the embodiment of the present invention provides, preferably, as shown in Figure 7, described probe assembly at least also comprises one of following assembly or its combination in any: with the male extended line 8 of described plug-in unit terminal or the corresponding connection of described ground terminal, female extended line 9, test probe 10, test clip 11.
Concrete, in the time need to measuring discrete independent signal source, can insert male extended line 8 and female extended line 9 on front end at probe, male extended line 8 and female extended line 9 are used to be connected the measured source of distinct interface form, specifically referring to shown in Fig. 8 A and Fig. 8 B.Certainly, when measured source is bad while being connected and fixed, also can be as shown in Figure 8 C, the plug-in unit terminal of stairstepping long end is inserted in test clip 11, make test clip 11 connect measured source, carry out to clamp more reliably measured source by test clip 11 like this, for example chip pin or the conductor that all the other leak outside.Preferably, the nose end of female extended line 9 can also be inserted in test clip 11.
In another preferred embodiment, can also, directly on male extended line 8 and/or the female extended line 9 female adapters of the row of insertion, then use male extended line 8 and/or female extended line 9 to connect measured source.
The embodiment of the present invention also provides a kind of probe of the hyperchannel for logic analysis, as shown in Figure 9, comprising: probe body and the hyperchannel probe assembly described in above-mentioned any embodiment;
Described probe body comprises: plug 1, ribbon cable 2 and have the adaptor interface box 3 of double jack; Concrete, plug 1 is used for being connected with measured source.
The probe adapter 5 that one end that described adaptor interface box 3 has double jack connects described hyperchannel probe assembly has one end of double contact pin, and its other end connects the second end of described ribbon cable 2; The effect of probe adapter 5 is probe front end and the probe body of connecting multi-channel probe assembly, probe adapter 5 has formed the spacing hole of isolation one by one by structural housing, can allow probe front end stable the snapping in its double jack of contact pin 13, increase the fastness that probe front end patches, be not easy to come off.Multiple probe front ends insert after the double jack of probe adapter 5 simultaneously, can be by probe adapter 5 be extracted to adaptor interface box 3, can disposablely pull out multiple probe front ends, the parent signal that more changes gear easily and efficiently gathers adapter 4, be inserted into adaptor interface box 3, for arranging the test of pin measured source.
Illustrate as one, in embodiments of the present invention, described hyperchannel probe can not have probe adapter 5, and described adaptor interface box 3 has the contact pin 13 of one end of double jack and the probe front end of described hyperchannel probe assembly and directly pegs graft.
The first end of described ribbon cable 2 connects described plug 1, and ribbon cable 2 is for providing signalling channel at plug 1 and adaptor interface box 3.
By the plug-in unit terminal 17 of measured signal access probe front end, make measured signal finally access the central signal conductors of a coaxial cable of ribbon cable, finally pass through the signaling interface of plug connect into analysis instrument.
In the embodiment of the present invention, for the hyperchannel probe of logic analysis, preferably, described ribbon cable comprises many coaxial cables, and described coaxial cable has respectively central signal conductors, internal insulating layer, gauze screen and external insulation from the inside to the outside.In the embodiment of the present invention, for ensureing that multi-channel signal acquisition probe has enough bandwidth, and each interchannel has certain isolation, can avoid interchannel interference, therefore adopt multiple coaxial cable parallel connections for the cable of signal transmission, and be grouped together by external insulation layer, form a ribbon cable.Preferably, central signal conductors can adopt nichrome wire, and internal insulating layer can adopt fluorinated ethylene propylene (FEP) insulation, and gauze screen uses tin-coated copper braided wire, and external insulation is generally plastics or rubber, for example tetrafluoroethene (THV).Coaxial cable in the embodiment of the present invention can certainly use other material, as long as cable has certain pliability.This ribbon-style cable is in the time being connected with plug and adaptor interface box, the external insulation of each coaxial cable is wherein peeled off, the gauze screen that each coaxial cable exposes is stripped from after extending a segment distance again, expose internal insulating layer, after being extended to a segment distance, internal insulating layer is stripped from again, make center conductor extend again a segment distance, the independently electrical connection corresponding with a socket hole of adaptor interface box after cutting off, and the corresponding electrical connection in another socket hole of gauze screen and adaptor interface box.
Hyperchannel for logic analysis in the embodiment of the present invention is popped one's head in, preferably, built-in the first pcb board of adaptor interface box, a socket hole of described adaptor interface box is electrically connected with the central signal conductors of many coaxial cables of described ribbon cable the second end accordingly independently by many cablings on described the first pcb board; Another socket hole is electrically connected with the gauze screen of coaxial cable every described accordingly by the ground wire on described the first pcb board; Built-in the second pcb board of described plug, many cablings of described the second pcb board are electrically connected independently with the central signal conductors of many coaxial cables of described ribbon cable first end accordingly; The ground wire of described the second pcb board is electrically connected with the gauze screen of coaxial cable every described accordingly, and the cabling on pcb board is isolated mutually, therefore by the pad on pcb board, can be connected with connector.
In the embodiment of the present invention, for the hyperchannel probe of logic analysis, preferably, described hyperchannel probe also comprises: poroid insulant, and described ribbon cable arrives the weld of described the first pcb board and/or described the second pcb board through described poroid insulant; The cable guide clearance hole of the corresponding described poroid insulant of each pad of described weld.First, taking the first pcb board as example, as shown in figure 10, the central signal conductors that ribbon cable exposes, after the poroid insulant 25 through isolation mutually, is welded on the first pcb board 26 respectively, and it is more convenient neat that being arranged so that of above-mentioned poroid insulant welded.By the first pcb board 26 mutually isolation cabling be welded on double jack on the first pcb board 26 and be electrically connected after, cooperation shell, has just formed adaptor interface box, utilize poroid insulant to weld, ensure the maximum bandwidth of probe, and the isolation of interchannel signal, channels crosstalk reduced.
Again taking the second pcb board as example, as shown in figure 11, poroid insulant 30 is positioned near the weld 29 of the second pcb board 28, and ribbon cable 31 is through poroid insulant 30, and reaching the weld 29 of the second pcb board 28, the setting of above-mentioned poroid insulant 30 has also facilitated welding.
Preferably, the concrete structure of poroid insulant 25 or 30 is shown in Figure 12, on poroid insulant, comprise several cable guide clearance holes 31, by ribbon cable, each coaxial cable is through after described cable guide clearance hole 31, on pcb board, corresponding solder joint goes out to weld.
To sum up, in embodiment provided by the present invention, by the general probe assembly of design high-performance hyperchannel and the topological structure of front probe, farthest provide superior signals collecting performance and user's ease of use.Design removable front-end probe simultaneously, and can coordinate probe adapter, be firmly connected in probe body, be used for meeting various test requests.And by various probe assemblies and various combination thereof, measure different measurands, easy to use.
Above-described embodiment; object of the present invention, technical scheme and beneficial effect are further described; institute is understood that; the foregoing is only the specific embodiment of the present invention; the protection domain being not intended to limit the present invention; within the spirit and principles in the present invention all, any amendment of making, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.

Claims (13)

1. for the hyperchannel probe assembly of logic analysis, it is characterized in that, comprise at least one probe front end;
Described probe front end comprises: a signal cable and be located at the calibrating terminal of described signal cable first end; Described calibrating terminal comprises: plug-in unit terminal and ground terminal;
Described signal cable has gauze screen and is positioned at the central signal conductors of described gauze screen; The second end of described signal cable is provided with two contact pins, and a contact pin is electrically connected to described plug-in unit terminal by the central signal conductors of described signal cable, and another contact pin is electrically connected to described ground terminal by the gauze screen of described signal cable; Two described contact pins can be pegged graft mutually with two jacks in the double jack of probe body one end.
2. the hyperchannel probe assembly for logic analysis according to claim 1, it is characterized in that, described probe assembly also comprises: two ends are respectively the probe adapter of double contact pin and double jack, and the double contact pin of described probe adapter and double jack are independently electrically connected described probe adapter is inner corresponding; In two contact pins of described signal cable and the double jack of described probe adapter, two jacks are pegged graft mutually, and the double jack of described probe body one end and the double contact pin of described probe adapter are pegged graft mutually.
3. the hyperchannel probe assembly for logic analysis according to claim 1, it is characterized in that, the calibrating terminal of described probe front end also comprises: the front end pcb board with attenuator circuit, signal cable is welded on one end of described front end pcb board, and plug-in unit terminal and ground terminal are welded on respectively the other end of described front end pcb board.
4. the hyperchannel probe assembly for logic analysis according to claim 3, is characterized in that, one end of described attenuator circuit is electrically connected described plug-in unit terminal, and the other end is electrically connected the central signal conductors of described signal cable.
5. the hyperchannel probe assembly for logic analysis according to claim 4, it is characterized in that, described attenuator circuit comprises: the damping resistance of series connection and bleeder circuit, described damping resistance one end is electrically connected described plug-in unit terminal, described bleeder circuit one end is electrically connected the central signal conductors of described signal cable, and described bleeder circuit comprises resistance parallel with one another and electric capacity.
6. the hyperchannel probe assembly for logic analysis according to claim 1, is characterized in that, described plug-in unit terminal and described ground terminal composition one have the stairstepping of long end and short end, and described plug-in unit terminal is described long end.
7. the hyperchannel probe assembly for logic analysis according to claim 6, is characterized in that, described probe assembly also comprises: ground connection expansion annex; Described ground terminal is inserted in one end that described ground connection expansion annex has contact pin, and the other end with jack is concordant with the outer end of described plug-in unit terminal; The jack of described ground connection expansion annex is electrically connected with described ground terminal by the contact pin of described ground connection expansion annex.
8. the hyperchannel probe assembly for logic analysis according to claim 1, it is characterized in that, described probe assembly at least also comprises one of following assembly or its combination in any: with the male extended line of described plug-in unit terminal or the corresponding connection of described ground terminal, female extended line, test probe, test clip.
9. the hyperchannel probe assembly for logic analysis according to claim 7, is characterized in that,
One side of the calibrating terminal of described probe front end is provided with at least two assembling posts, and opposite side is provided with at least two pilot holes, and the described assembling post on adjacent two calibrating terminals is corresponding with pilot hole position, mutually engaging.
10. the probe of the hyperchannel for logic analysis, is characterized in that, comprising: probe body and the hyperchannel probe assembly as described in the claims 1 to 8 any;
Described probe body comprises: plug, ribbon cable and have the adaptor interface box of double jack;
One end that described adaptor interface box has double jack connects described hyperchannel probe assembly, and its other end connects the second end of described ribbon cable;
The first end of described ribbon cable connects described plug.
11. probes of the hyperchannel for logic analysis according to claim 10, it is characterized in that, described ribbon cable comprises many coaxial cables, and described coaxial cable has respectively central signal conductors, internal insulating layer, gauze screen and external insulation from the inside to the outside; One socket hole correspondence of described adaptor interface box is electrically connected independently with the central signal conductors of multiple described coaxial cables of described ribbon cable the second end, and its another socket hole is corresponding to be electrically connected with the gauze screen of described coaxial cable.
12. probes of the hyperchannel for logic analysis according to claim 10, it is characterized in that, built-in the first pcb board of described adaptor interface box, a socket hole of described adaptor interface box is electrically connected with the central signal conductors of many coaxial cables of described ribbon cable the second end independently by many cablings correspondences on described the first pcb board; Another socket hole is electrically connected with the gauze screen of coaxial cable every described by the ground wire on described the first pcb board is corresponding;
Built-in the second pcb board of described plug, many cablings correspondences of described the second pcb board are electrically connected independently with the central signal conductors of many coaxial cables of described ribbon cable first end; The ground wire correspondence of described the second pcb board is electrically connected with the gauze screen of coaxial cable every described.
13. probes of the hyperchannel for logic analysis according to claim 12, it is characterized in that, described hyperchannel probe also comprises: poroid insulant, and described ribbon cable arrives the weld of described the first pcb board and/or described the second pcb board through described poroid insulant; The cable guide clearance hole of the corresponding described poroid insulant of each pad of described weld.
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