CN103884279B - 一种激光跟踪仪横轴与竖轴垂直度检测方法 - Google Patents
一种激光跟踪仪横轴与竖轴垂直度检测方法 Download PDFInfo
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CN109974586B (zh) * | 2019-04-20 | 2021-03-16 | 北京工业大学 | 用于激光追踪仪几何误差又一补偿装置 |
CN112325777B (zh) * | 2020-11-04 | 2021-12-07 | 北京交通大学 | 一种测量转轴六自由度几何误差的光学测量装置 |
CN113701720B (zh) * | 2021-08-31 | 2023-08-15 | 中煤科工集团重庆研究院有限公司 | 一种用于摄影测量坐标定位的标识系统 |
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CN2288418Y (zh) * | 1996-04-17 | 1998-08-19 | 中国计量科学研究院 | 经纬仪综合检验仪 |
KR20040085397A (ko) * | 2003-03-31 | 2004-10-08 | 한국항공우주산업 주식회사 | 레이저 트랙커 검교정용 장치 |
CN101586965A (zh) * | 2009-07-20 | 2009-11-25 | 中国航空工业第一集团公司北京长城计量测试技术研究所 | 光电跟踪仪角跟踪误差测试方法 |
EP1420264B1 (de) * | 2002-11-15 | 2011-01-05 | Leica Geosystems AG | Verfahren und Vorrichtung zur Kalibrierung eines Messsystems |
CN102519361A (zh) * | 2011-12-28 | 2012-06-27 | 二重集团(德阳)重型装备股份有限公司 | 激光跟踪仪专用工作台及激光跟踪测量方法 |
CN103017686A (zh) * | 2012-12-04 | 2013-04-03 | 中国科学院光电技术研究所 | 一种利用激光跟踪仪调整主镜光轴与水平轴垂直的方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN2288418Y (zh) * | 1996-04-17 | 1998-08-19 | 中国计量科学研究院 | 经纬仪综合检验仪 |
EP1420264B1 (de) * | 2002-11-15 | 2011-01-05 | Leica Geosystems AG | Verfahren und Vorrichtung zur Kalibrierung eines Messsystems |
KR20040085397A (ko) * | 2003-03-31 | 2004-10-08 | 한국항공우주산업 주식회사 | 레이저 트랙커 검교정용 장치 |
CN101586965A (zh) * | 2009-07-20 | 2009-11-25 | 中国航空工业第一集团公司北京长城计量测试技术研究所 | 光电跟踪仪角跟踪误差测试方法 |
CN102519361A (zh) * | 2011-12-28 | 2012-06-27 | 二重集团(德阳)重型装备股份有限公司 | 激光跟踪仪专用工作台及激光跟踪测量方法 |
CN103017686A (zh) * | 2012-12-04 | 2013-04-03 | 中国科学院光电技术研究所 | 一种利用激光跟踪仪调整主镜光轴与水平轴垂直的方法 |
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Effective date of registration: 20200805 Address after: 100029 Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee after: Institute of Microelectronics of the Chinese Academy of Sciences Address before: 100190, No. 19 West Fourth Ring Road, Beijing, Haidian District Patentee before: Aerospace Information Research Institute,Chinese Academy of Sciences Effective date of registration: 20200805 Address after: 100190, No. 19 West Fourth Ring Road, Beijing, Haidian District Patentee after: Aerospace Information Research Institute,Chinese Academy of Sciences Address before: 100094, No. 9 Deng Nan Road, Beijing, Haidian District Patentee before: Academy of Opto-Electronics, Chinese Academy of Sciences |