CN103852719A - Key switch on-off counting circuit - Google Patents
Key switch on-off counting circuit Download PDFInfo
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- CN103852719A CN103852719A CN201210510618.3A CN201210510618A CN103852719A CN 103852719 A CN103852719 A CN 103852719A CN 201210510618 A CN201210510618 A CN 201210510618A CN 103852719 A CN103852719 A CN 103852719A
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Abstract
The invention discloses a key switch on-off counting circuit. The key switch on-off counting circuit comprises a key switch service life testing device, a counting module and a delay switch module. During testing, when a key switch is continuously turned on and off once, tuning-on time of the key switch turned on under the action of the key switch service life testing device reaches first delay time set by the delay switch module, and second staying time of the key switch which is turned on and then turned off under the action of the key switch service life testing device reaches second delay time set by the delay switch module, the state of the delay switch module is turned over twice, and the counting module carries out counting once. The testing hidden hazard that the key switch is not locked when turned on or cannot be turned off is avoided, effectiveness of testing of the on-off frequency is guaranteed, testing accuracy is high, and labor intensity is lowered.
Description
Technical field
The present invention relates to switch detection field, particularly relate to a kind of keyswitch break-make counting circuit.
Background technology
Lamp lighting is seen everywhere in modern society the inside, and light fixture when in use, can move to light fixture keyswitch, and the reliability of keyswitch break-make seems very important so, will consider the life-span of switch in the time of Design of Luminaires.
At present in the time of the life-span of Test Switchboard number of times, general use a picture to press key head pointing, use circuit control, it is moved up and down by key head, now the button of needs test is put into key testing instrument button subfacies, adjust button and instrument by the distance between key head, when key testing instrument frock run down to the end by key head time, keyswitch is once pressed to work, then stop for a moment, while moving upward to top by key head, stop for a moment, move downward again the upper and lower like this switch on and off counting that just completed for twice one time.
But above-mentioned method of testing has hidden danger, when keyswitch damages, button is pressed can conducting but can not be locked, and detecting instrument is also continuing test, and the testing time obtaining is like this just inaccurate.If or keyswitch displacement, the key head of pressing of detecting instrument will be by less than keyswitch like this, and button instrument still continues counting, and the testing time obtaining is like this also inaccurate.
Summary of the invention
Based on this, be necessary to exist for current detection keyswitch the problem of hidden danger, a kind of keyswitch break-make counting circuit that can detect keyswitch break-make effective degree is provided.
A kind of keyswitch break-make counting circuit, for testing the effective break-make number of times of keyswitch, comprises device used for testing life of key switch and counting module, it is characterized in that, also comprises delay switch module; Described device used for testing life of key switch by key head for periodically pressing described keyswitch, described keyswitch connects described delay switch module, described delay switch module connects described counting module, and described counting module, described delay switch module are connected respectively power supply with described device used for testing life of key switch; Described delay switch module is detecting that the state of conducting and disconnection appears in keyswitch successively, and while meeting following condition, control counting module and once count cumulative: the ON time of described keyswitch is greater than the first delay time that described delay switch module is set; Be greater than the second delay time that described delay switch module is set the trip time of described keyswitch; Wherein, described the first delay time is set as being greater than the pressing the residence time and being less than pressing the cycle by key head by key head of described device used for testing life of key switch; Described the second delay time be set as being less than described device used for testing life of key switch by the withdrawal residence time of key head.
In an embodiment, described delay switch module comprises time delay circuit unit in parallel and the first switch element therein;
Described time delay circuit unit connects described keyswitch, when described keyswitch conducting described in time delay circuit unit switch on power, the signal output part of described time delay circuit unit connects described the first switch element, for controlling described the first switch element conducting;
Described the first switch element connects described counting module, starts counting for controlling described counting module.
Therein in an embodiment, described time delay circuit unit is RC delay circuit, comprise the first divider resistance, the second divider resistance and the first filter capacitor, described the first divider resistance is connected with the second divider resistance and is passed through described keyswitch and is connected power supply, described the first filter capacitor described the second divider resistance in parallel or described the first divider resistance, the common port of described the first divider resistance, the second divider resistance and the first filter capacitor is connected the signal input part of described the first switch element as the signal output part of described RC delay circuit.
Therein in an embodiment, described the first switch element comprises field effect transistor and the first relay, the grid of described field effect transistor connects the signal output part of described time delay circuit unit, the drain electrode of described field effect transistor or source electrode connect power supply after connecting the coil of described the first relay, the switch contact of described the first relay connects respectively described counting module, the switch contact Continuous Closed of described the first relay merges to be opened once, and described counting module is counted once; Otherwise do not count.
In an embodiment, described counting module connects described device used for testing life of key switch therein, for controlling the testing time of described device used for testing life of key switch.
In an embodiment, also comprise second switch unit therein, described second switch unit connects described device used for testing life of key switch and described counting module, switches on or off power supply for controlling described device used for testing life of key switch.
In an embodiment, described second switch unit is the second relay therein, and the coil of described the second relay is connected to described counting module and power supply, and the switch contact of described the second relay connects described device used for testing life of key switch and power supply.
In an embodiment, described counting module is TCN-P61B counter therein.
In an embodiment, also comprise voltage reduction module therein, described voltage reduction module connects power supply and described delay switch module.
In an embodiment, also comprise rectification module therein, described rectification module connects described voltage reduction module and described delay switch module.
Above-mentioned keyswitch break-make counting circuit, comprises device used for testing life of key switch, counting module and delay switch module.When test, the continuous conducting of described keyswitch also disconnects once, described keyswitch ON time when conducting under described device used for testing life of key switch effect reaches the first delay time that described delay switch module is set, and reach the second delay time of described delay switch module setting the trip time while disconnection again after conducting under described device used for testing life of key switch effect time, described delay switch module status continuous overturning twice, described counting module is counted once.While having avoided keyswitch conducting, not locked or keyswitch such as can not disconnect at the test hidden danger, ensures the validity of break-make number of times test, and measuring accuracy is high and reduced labour intensity.
Brief description of the drawings
Fig. 1 is keyswitch break-make counting circuit one example structure schematic diagram of the present invention;
Fig. 2 is another example structure schematic diagram of keyswitch break-make counting circuit of the present invention;
Fig. 3 is the circuit theory diagrams of keyswitch break-make counting circuit of the present invention one embodiment.
Embodiment
Below in conjunction with drawings and Examples, the present invention is described in more detail.
As shown in Figure 1, be the structural representation of keyswitch break-make counting circuit of the present invention one embodiment.A kind of keyswitch break-make counting circuit, for testing effective break-make number of times of keyswitch 200, comprises device used for testing life of key switch 100, delay switch module 300 and counting module 400.Device used for testing life of key switch 100 press key head 140(as shown in Figure 2) aim at keyswitch 200, keyswitch 200 connects delay switch module 300, delay switch module 300 connection count modules 400, above-mentioned device used for testing life of key switch 100, delay switch module 300 and counting module 400 are connected respectively power supply.
As shown in Figure 2, device used for testing life of key switch 100 use similar finger the same by key head 140, move up and down by key head 140 by the circuit (not shown) control of establishing in device used for testing life of key switch body 120.Keyswitch 200 is positioned over by the suitable distance in key head 140 belows, moves down keyswitch 200 is carried out to pressing operation one time by key head 140.Once pressing in the cycle, by the timing definition of pressing and stopping by key head of device used for testing life of key switch 100 for pressing residence time Tps, be defined as excess time and regain residence time Trs, also a cycle of pressing is the summation of pressing residence time Tps and regaining residence time Trs.
Keyswitch 200 is usually used in Design of Luminaires, and in the time that keyswitch 200 is pressed first, it can be locked and the circuit turn-on that keeps keyswitch 200 to access.In the time that keyswitch 200 is pressed again, button is upspring, and the circuit that it accesses disconnects.
The keyswitch break-make counting circuit of the present embodiment is counted the touch potential of keyswitch 200, be exactly that delay switch module 300 is detecting that the state of conducting and disconnection appears in keyswitch 200 successively, and while meeting following condition, control counting module 400 and once count cumulative:
The ON time of keyswitch 200 is greater than the first delay time T1 that delay switch module 300 is set; Be greater than the second delay time T2 that delay switch module 300 is set the trip time of keyswitch 200.
Wherein, the first delay time T1 is greater than the pressing residence time Tps and being less than pressing the cycle by key head by key head of device used for testing life of key switch 100; The second delay time T2 be less than device used for testing life of key switch 100 by the withdrawal residence time Trs of key head.The first delay time T1 and the second delay time T2 are the time of setting, be respectively used to determine whether occur qualified locked and upspring.
In the time adopting the keyswitch 200 break-make counting circuits of the present embodiment to test, the state that occurs successively conducting and disconnection taking keyswitch 200 is once counted cumulatively as condition, shows that keyswitch 200 has been successfully completed once the complete operation of opening and closing.
When keyswitch 200 is normal, press all corresponding locked or upspring at every turn.
In the time that button is locked, keyswitch 200 conductings, the ON time of keyswitch 200 must be greater than presses residence time Tps; The locked state of button can be continued until and press arrival next time simultaneously, and the ON time of keyswitch 200 is greater than the first delay time, also meets the normal condition of keyswitch 200.
In the time that button is upspring, keyswitch 200 disconnects, be the trip time of keyswitch 200 device used for testing life of key switch 100 by the withdrawal residence time Trs of key head.Due to needs upper once press arrival before, delay switch module 300 is controlled counting module 400 and is counted, therefore the second delay time T2 should be less than the withdrawal residence time Trs by key head.Also meet the normal condition of keyswitch 200.Therefore, above-mentioned condition does not affect for the normal counting that completes switch.
When keyswitch 200 damages, be divided into two kinds of situations: 1, press rear button at every turn and all can upspring, can not keep locked; 2, press for the first time afterwards and just can not upspring again.
For the 1st kind of situation, because each pressing keys all can be along with upspringing by key head, so the ON time of keyswitch 200 is exactly to press residence time Tps by key head, it is less than the first delay time T1, do not meet counting condition, therefore in the time that the damage of this situation appears in keyswitch 200, the counting of counting module 400 will stop.
For the 2nd kind of situation, there is no break time, do not meet counting condition yet, therefore, in the time that the damage of this situation appears in keyswitch 200, the counting of counting module 400 will stop.
Therefore effective break-make number of times that, the keyswitch break-make counting circuit of the present embodiment can Test Switchboard.
As shown in Figure 2, in the present embodiment, delay switch module 300 comprises time delay circuit unit 320 and the first switch element 340.It is rear in parallel with the first switch element 340 that time delay circuit unit 320 connects keyswitch 200, when keyswitch 200 conducting, time delay circuit unit 320 switches on power, and the signal output part of time delay circuit unit 320 connects the signal input part of the first switch element 340 for controlling this first switch element 340 conductings.The first switch element 340 connection count modules 400 are controlled counting module 400 and are started counting.
Specifically as shown in Figure 3, above-mentioned time delay circuit unit 320 is RC delay circuit, comprises the first divider resistance R1, the second divider resistance R2 and the first filter capacitor C1.After above-mentioned the first divider resistance R1 and the second divider resistance R2 series connection, switch on power by keyswitch 200, the first filter capacitor C1 the second divider resistance R2 in parallel, the common port of the first divider resistance R1, the second divider resistance R2 and the first filter capacitor C1 is connected above-mentioned the first switch element 340 as the signal output part of this time delay circuit unit 320.
The resistance of above-mentioned the first divider resistance R1 is much larger than the resistance of the second divider resistance R2, after keyswitch 200 conductings, after the first divider resistance R1 and the second divider resistance R2 dividing potential drop, to the first filter capacitor C1 charging, the resistance of cause the first divider resistance R1 is much larger than the resistance of the second divider resistance R2, so the first filter capacitor C1 has charged and has needed certain hour, it is above-mentioned the first delay time, rise to the cut-in voltage of the first switch element 340 through the voltage of first delay time the first filter capacitor C1, the first switch element 340 conductings, start the basis of counting as counting module 400.
In the time that keyswitch 200 disconnects again after above-mentioned conducting, time delay circuit unit 320 power-off, the first filter capacitor C1 starts electric discharge.The first filter capacitor C1 both end voltage is through a period of time, and, in the time that the second delay time is decreased to the cut-in voltage that is less than the first switch element 340, the first switch element 340 disconnects, and counting module 400 counting button switch 200 break-makes once.In other embodiments, above-mentioned time delay circuit unit 320 also can realize by other circuit, when keyswitch 200 conducting, the state turnover of the first switch element 340 is not limited to conducting upset, also can be and disconnect upset, the state turnover while disconnection again after same keyswitch 200 conductings also can be conducting upset.
As shown in Figure 3, above-mentioned the first switch element 340 comprises field effect transistor Q1 and the first relay K 1.The grid of field effect transistor Q1 connects the signal output part of time delay circuit unit 320, it is the common port of above-mentioned the first divider resistance R1, the second divider resistance R2 and the first filter capacitor C1, the drain electrode of field effect transistor Q1 or source electrode connect power supply after connecting the coil of the first relay K 1, the switch contact of the first relay K 1 is connection count module 400 respectively, the switch contact of the first relay K 1 continuously closed a, counting module 400 of unlatching is counted once, otherwise is not counted.
In the time of keyswitch 200 conducting, when the signal voltage that time delay circuit unit 320 provides reaches the cut-in voltage of field effect transistor Q1, field effect transistor Q1 conducting, the first relay K 1 coil electricity, the switch contact closure of the first relay K 1.When disconnecting again after keyswitch 200 conductings, when the signal voltage that time delay circuit unit 320 provides is less than the cut-in voltage of field effect transistor Q1, field effect transistor Q1 disconnects, the not conducting of coil of the first relay K 1, the switch contact of the first relay K 1 is opened, and counting module 400 counting button switch 200 break-makes once.
Further, above-mentioned counting module 400 connects device used for testing life of key switch 100, stops test for controlling device used for testing life of key switch 100 reaching after default testing time.Start test before, counting module 400 can arrange the total break-make number of times that needs test, when counting module 400 carries out break-make counting while reaching the break-make number of times of this setting to keyswitch 200, counting module 400 is controlled device used for testing life of key switch 100 and is stopped keyswitch 200 to detect.In different product different industries use procedure at present, be different to the serviceable life of switch, and the switch life that meets market user demand is all at up to ten thousand times, some touch-switchs are wanted 100,000 hundreds of thousands time even, for different key switch, different total number measured is set, not only meet the testing requirement of keyswitch but also saved production cost, reduce workload.
Above-mentioned counting module 400 is controlled device used for testing life of key switch 100 and is stopped detecting and can realize by second switch unit (not shown) is set, second switch unit connects device used for testing life of key switch 100 and counting module 400, and second switch unit connects device used for testing life of key switch 100 and power supply, in the time reaching above-mentioned default break-make number of times, counting module 400 is controlled second switch unit, makes device used for testing life of key switch 100 power-off stop detecting.
As shown in Figure 3, above-mentioned second switch unit (figure is mark not) is coil connection count module 400 and the power supply of the second relay K 2, the second relay K 2, and the switch contact of the second relay K 2 connects device used for testing life of key switch 100 and power supply.In the time reaching above-mentioned default break-make number of times, counting module 400 auto-breakings, the coil blackout of the second relay K 2, the switch contact of K2 disconnects, and device used for testing life of key switch 100 power-off also stop detecting.
As shown in Figure 3, above-mentioned counting module 400 can be TCN-P61B counter.Pin 1 is connected with pin 4 by the switch contact of the first relay K 1, and as the input signal of counter TCN-P61B, once, counter TCN-P61B counts once for the continuous closure of the switch contact of the first relay K 1, disconnection.Pin 18 is connected by switch with pin 19 and switches on power.
Further, above-mentioned TCN-P61B counter connects hummer SP1 in the time that counter TCN-P61B counting reaches the break-make number of times of above-mentioned setting, 18,19 pins of counter TCN-P61B disconnect, 17,18 pin conductings, and hummer SP1 sends warning and reminds staff to detect end; The second relay K 2 coil blackouts simultaneously, the switch contact of K2 disconnects, and device used for testing life of key switch 100 quits work.
As shown in Figure 3, this keyswitch break-make counting circuit comprises transformer circuit (figure is mark not), is specially transformer T1, civil power is down to suitable voltage and supplies with delay switch module 300.
Further, this keyswitch break-make counting circuit comprises rectification circuit B1, becomes direct current to supply with delay switch module 300 AC rectification.This circuit also comprises Voltage stabilizing module (figure is mark not), offers delay switch module 300 stable DC electricity, concrete, can be stabilivolt circuit or three-terminal voltage-stabilizing circuit (as shown in Figure 3).This circuit also comprises filtering circuit (figure is mark not), specifically comprises the second filter capacitor C2 and the 3rd filter capacitor C3, respectively by the current filtering after the electric current after voltage stabilizing and rectification.
Taking embodiment illustrated in fig. 3 as example, elaborate the course of work of keyswitch break-make counting circuit of the present invention below.
Start to be electrified, counter TCN-P61B starts working, and electric current flows to 18,19 pins of TCN-P61B, the second relay K 2 coil electricities, and the normally opened contact closure of K2, device used for testing life of key switch 100 is switched on, and starts working.
Electric current is through transformer T1 transformation simultaneously, then pass through rectification circuit B1 rectification, the 3rd filter capacitor C3 carries out filtering, through the 24V DC voltage of three-terminal voltage-stabilizing circuit (being specially 7824 three-terminal voltage-stabilizing circuit) stable output, then through the second filter capacitor C2 filtering, electric current is to the first relay K 1 coil, because field effect transistor Q2 grid level does not have voltage, so not conducting of Q2, the normally closed normally opened contact of the first relay K 1 is failure to actuate, and counter TCN-P61B does not count.
While starting to test, when keyswitch 200 being depressed by key head 140 arrival bottoms of device used for testing life of key switch 100, after keyswitch 200 conductings, through the first divider resistance R1 and the second divider resistance R2 dividing potential drop, to the first filter capacitor C1 charging, because the first divider resistance R1 resistance is very large compared to the second divider resistance R2, the second divider resistance R2 divides to such an extent that voltage is less, so the first filter capacitor C1 needs the first delay time to charge, the voltage of the first filter capacitor C1 slowly rises, when upper up voltage reaches after the cut-in voltage of field effect transistor Q2, field effect transistor Q2 conducting, the first relay K 1 coil electricity, the normally opened contact closure of K1 coil, as the basis of counter TCN-P61B counting.
Now keyswitch 200 is in the time again pressing by key head 140, keyswitch 200 disconnects, now the second divider resistance R2 discharges to the first filter capacitor C1, field effect transistor Q2 grid voltage reduces, when being reduced to the closing after voltage of field effect transistor Q2, the first relay K 1 coil blackout, the normally opened contact of K1 coil disconnects, and counter TCN-P61B counts once.Keyswitch 200 is waited for and is pressed key head 140 button again, so circulation is gone down, until counter TCN-P61B counting is while reaching default testing time, and counter TCN-P61B auto-breaking, device used for testing life of key switch 100 stops test, has completed the life test of keyswitch 200.
In the time that keyswitch 200 damages: after pressing by key head 140, in the time leaving by key head 140, keyswitch 200 rises immediately, be that keyswitch 200 can not be locked in the position of conducting, ON time is now the residence time that moves to the end by key head 140, the residence time that moves to the end by key head 140 is certain, and be set to be less than the first delay time, so have little time the first filter capacitor C1 to be charged to the voltage that field effect transistor Q2 opens, the coil not conducting all the time of the first relay K 1, counter TCN-P61B does not count.By the time, when laboratory technician observes, can know the test life-span of keyswitch 200.
When after keyswitch 200 displacements, not below device used for testing life of key switch 100 is pressed key head 140 time, pressing key head 140 presses less than keyswitch 200, now keyswitch 200 is no matter be the state in conducting or disconnection, as long as certain state keeps getting off, the state of field effect transistor Q2 can not change, the normally opened contact of the first relay K 1 also can remain on certain state, counter TCN-P61B does not count, by the time when laboratory technician checks, move on to button instrument button subfacies, also just can continue to test and count.
When keyswitch 200 damages, in the time of conducting state, the ON time of keyswitch 200 can reach the first delay time always, the first relay K 1 switch contact closure, but keyswitch 200 can not disconnect, and there is no trip time, counter TCN-P61B does not count.
In the time that counter TCN-P61B count down to the on off test number of times of setting, 18,19 pins of counter TCN-P61B disconnect, 17,18 pin conductings, and hummer SP1 loudspeaker are sounded, and notify laboratory technician to test end.Meanwhile, the second relay K 2 coil blackouts, K2 normally opened contact disconnects, and device used for testing life of key switch 100 power-off, quit work.
By adding after delay switch module 300, can avoid keyswitch 200 conducting time, not locked or keyswitch 200 such as can not disconnect at the test hidden danger, ensures the validity of break-make number of times test, and measuring accuracy is high and reduced labour intensity.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (10)
1. a keyswitch break-make counting circuit, for testing the effective break-make number of times of keyswitch, comprises device used for testing life of key switch and counting module, it is characterized in that, also comprises delay switch module;
Described device used for testing life of key switch by key head for periodically pressing described keyswitch, described keyswitch connects described delay switch module, described delay switch module connects described counting module, and described counting module, described delay switch module are connected respectively power supply with described device used for testing life of key switch;
Described delay switch module is detecting that the state of conducting and disconnection appears in keyswitch successively, and while meeting following condition, controls counting module and once count cumulative:
The ON time of described keyswitch is greater than the first delay time that described delay switch module is set; Be greater than the second delay time that described delay switch module is set the trip time of described keyswitch;
Wherein, described the first delay time is set as being greater than the pressing the residence time and being less than pressing the cycle by key head by key head of described device used for testing life of key switch; Described the second delay time be set as being less than described device used for testing life of key switch by the withdrawal residence time of key head.
2. keyswitch break-make counting circuit according to claim 1, is characterized in that, described delay switch module comprises time delay circuit unit in parallel and the first switch element;
Described time delay circuit unit connects described keyswitch, when described keyswitch conducting described in time delay circuit unit switch on power, the signal output part of described time delay circuit unit connects described the first switch element, for controlling described the first switch element conducting;
Described the first switch element connects described counting module, starts counting for controlling described counting module.
3. keyswitch break-make counting circuit according to claim 2, it is characterized in that, described time delay circuit unit is RC delay circuit, comprise the first divider resistance, the second divider resistance and the first filter capacitor, described the first divider resistance is connected with the second divider resistance and is passed through described keyswitch and is connected power supply, described the first filter capacitor described the second divider resistance in parallel or described the first divider resistance, described the first divider resistance, the common port of the second divider resistance and the first filter capacitor is connected the signal input part of described the first switch element as the signal output part of described RC delay circuit.
4. keyswitch break-make counting circuit according to claim 2, it is characterized in that, described the first switch element comprises field effect transistor and the first relay, the grid of described field effect transistor connects the signal output part of described time delay circuit unit, the drain electrode of described field effect transistor or source electrode connect power supply after connecting the coil of described the first relay, the switch contact of described the first relay connects respectively described counting module, the switch contact Continuous Closed of described the first relay merges to be opened once, and described counting module is counted once; Otherwise do not count.
5. keyswitch break-make counting circuit according to claim 1, is characterized in that, described counting module connects described device used for testing life of key switch, stops test for controlling described device used for testing life of key switch reaching after default testing time.
6. keyswitch break-make counting circuit according to claim 5, it is characterized in that, also comprise second switch unit, described second switch unit connects described device used for testing life of key switch and described counting module, switches on or off power supply for controlling described device used for testing life of key switch.
7. keyswitch break-make counting circuit according to claim 6, it is characterized in that, described second switch unit is the second relay, the coil of described the second relay is connected to described counting module and power supply, and the switch contact of described the second relay connects described device used for testing life of key switch and power supply.
8. keyswitch break-make counting circuit according to claim 1, is characterized in that, described counting module is TCN-P61B counter.
9. keyswitch break-make counting circuit according to claim 1, is characterized in that, also comprises voltage reduction module, and described voltage reduction module connects power supply and described delay switch module.
10. keyswitch break-make counting circuit according to claim 9, is characterized in that, also comprises rectification module, and described rectification module connects described voltage reduction module and described delay switch module.
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