CN103831256A - Non-normal temperature test module - Google Patents
Non-normal temperature test module Download PDFInfo
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- CN103831256A CN103831256A CN201210475917.8A CN201210475917A CN103831256A CN 103831256 A CN103831256 A CN 103831256A CN 201210475917 A CN201210475917 A CN 201210475917A CN 103831256 A CN103831256 A CN 103831256A
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- high temperature
- normal temperature
- temperature test
- test module
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Abstract
The invention discloses a non-normal temperature test module, which comprises a base, a bracket and a motor mounted on the base, a fixed seat supported by the bracket, a turntable connected to the motor, and a plurality of fixtures mounted on the turntable. The fixed seat is provided with a plurality of mounting seats corresponding to the fixtures, and the mounting seats are provided with high temperature warehouses. The non-normal temperature test module provided by the invention can reduce the machine space occupation, can make the product operate under a thermal insulation condition, and can control the heating time and temperature to meet the requirements of different heating tests.
Description
Technical field
The present invention relates to a kind of heating of rotating disc type semiconductor Test handler, particularly a kind of non-normal temperature test module.
Background technology
In semiconductor test Packaging Industry, heating test is the stability test to the operation of semiconductor Realization of Product simulation high-temperature situation, and to semiconductor product appearance through heating after vision-based detection (2D, 3D), so, rotating disc type semiconductor heating Test handler can be to the charging of semiconductor Realization of Product standard material pipe, test and product carried out after outward appearance detection (2D, 3D) through heating, non-defective unit directly enters discharging station, and defective products enters in classification pipe after screening by test and light inspection etc.
But the test package board of existing rotating disc type semiconductor heating Test handler only possesses normal temperature test function, does not possess the function of high temperature test.High temperature test board on market can only reach 80 ℃, and high temperature test stands in open the inside, space operation, because space is open, can be subject to extraneous interference and cause temperature fluctuation larger, thereby the requirement of the test that cannot reach a high temperature (high temperature test requires the temperature difference between ± 3～5 ℃).In addition, high temperature test need to be heated to element certain temperature, and the time that the heating of open high temperature test station needs is also more of a specified duration.
In addition, original equipment is to adopt depression bar to fix element, higher for the material requirement of depression bar like this, and can not well control for seal in the time of high temperature test.
Summary of the invention
For solving the problems of the technologies described above, the invention provides a kind of non-normal temperature test module, with realize to electronic component fast, accurately heating, improve efficiency and the precision of the test of non-normal temperature.
For achieving the above object, technical scheme of the present invention is as follows:
A kind of non-normal temperature test module, comprise base, be arranged on the rotating disk that the support on described base is connected with motor, by the holder of described stent support, with described motor, and be arranged on the multiple fixtures on described rotating disk, on described holder, be provided with the mount pad of the described fixture of multiple correspondences, high temperature storehouse is installed on described mount pad, and inside, described high temperature storehouse is provided with Intelligent heating system.
Preferably, multiple described mount pads are the circle-shaped edge that is evenly distributed on described holder.
Preferably, described fixture is clip manipulator, on described clip manipulator, is provided with groove.
By technique scheme, non-normal temperature test module provided by the invention, its compared to existing technology tool have the following advantages:
1. owing to not needing independent high temperature test board and rotating disc type semiconductor heating Test handler jointly to use, therefore, using the present invention can reduce board takes up room, by two work flows (non-normal temperature is tested and sealed) are incorporated on same machine, reduce human error and improved operating efficiency;
2. the high temperature storehouse of closed design can make product operation under insulation situation;
3. high temperature storehouse heating can be controlled heat time and temperature to meet the requirement of different heating test, also can in the situation that not heating, operate and avoid temperature fluctuation, therefore, can increase work efficiency and flexibility;
4. clip manipulator is after heat treatment and high temperature resistant processing, can guarantee under hot environment operation indeformable, therefore, in the groove that is fixed on clip manipulator that electronic component etc. can be firm.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme in the embodiment of the present invention, below the accompanying drawing of required use during embodiment is described is briefly described.
Fig. 1 is the disclosed non-normal temperature test module structural representation of the embodiment of the present invention;
Fig. 2 is structural representation when clip manipulator retaining element in Fig. 1.
Numeral in figure:
11. base 12. support 13. holders
14. motor 15. rotating disk 16. clip manipulators
17. mount pad 18. high temperature storehouse 21. groove 22. electronic components
The specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described.
According to Fig. 1 and 2, non-normal temperature test module provided by the invention, comprise base 11, be arranged on the holder 13 that the support 12 on base 11 supports with motor 14, by support 12, the rotating disk 15 being connected with motor 14, and be arranged on the multiple clip manipulators 16 on rotating disk 15, on clip manipulator 16, be provided with groove 21, by groove 21 fixed electronic elements 22; On holder 13, be provided with the mount pad 18 of multiple corresponding clip manipulators 16, multiple mount pads 17 are the circle-shaped edge that is evenly distributed on holder 13, and high temperature storehouse 18 is installed on mount pad 17, are provided with Intelligent heating system in high temperature storehouse 18.
Operation principle of the present invention is:
This non-normal temperature test module is arranged on rotating disc type semiconductor heating Test handler, and rotating disk 15 step pitch under the drive of motor 14 is rotated, and the groove 21 of simultaneously by relevant device, electronic component 22 being put into clip manipulator 16 is according to the order of sequence fixing;
Rotating disk 15 continues step pitch under motor 14 drives and rotates, in the time that electronic component 22 turns to 18 position, high temperature storehouse, automatically electronic component 22 is heated by the Intelligent heating system in high temperature storehouse 18, and according to treat high temperature test project difference and automatically control heat time and heating-up temperature, then under keeping warm mode, electronic component 22 is tested accordingly;
In addition, can also be according to the quantity in how many adjusting high temperature storehouses 18 of test event, such as in the time not needing high temperature test or high temperature test project to be less than existing high temperature storehouse 18 number is installed, the quantity in high temperature storehouse 18 is constant, only needs the Intelligent heating system in the corresponding high temperature of Based Intelligent Control storehouse 18 not work; In the time need to being greater than existing high temperature storehouse 18 the high temperature test project of number is installed, the high temperature storehouse 18 of respective numbers can be installed on unnecessary holder 13 again.
What the present invention adopted is the high temperature storehouse 18 of closed design, multiple high temperature storehouse 18 is arranged on the station that needs high temperature test, in the time that the electronic component 22 on clip manipulator 16 turns to 18 position, high temperature storehouse by rotating disk 15, can heat electronic component 22 by the Intelligent heating system in high temperature storehouse 18, and due to high temperature storehouse 18 closure designs, therefore can keep electronic component 22 operation under insulation situation, can control the temperature difference between ± 3-5 ℃, and 18 designs of high temperature storehouse can make the maximum temperature of high temperature test reach 120 ℃.
In addition, design by high temperature storehouse 18, can also be by the Intelligent heating system control heat time of 18 inside, high temperature storehouse and temperature to meet different heating test requests; In the time that any electronic component 22 all does not need to carry out high temperature test, the Intelligent heating system in high temperature storehouse 18 can stop heating automatically, can realize like this and in the situation that not heating, carry out corresponding operating, and the interior temperature fluctuation in high temperature storehouse 18 is minimum, measuring accuracy is high, and operating efficiency and flexibility are high.
In the present invention, adopt clip manipulator 16 fixed electronic elements 22, because all clip manipulators 16 all pass through high-temperature process, therefore, in high temperature test process, clip manipulator 16 can Yin Gaowen and occur distortion, electronic component 22 can firmly be fixed in the groove 21 of clip manipulator 16 and there will not be distortion or loosening, has effectively guaranteed measuring accuracy and efficiency.
To the above-mentioned explanation of the disclosed embodiments, make professional and technical personnel in the field can realize or use the present invention.To be apparent for those skilled in the art to the multiple modification of above-described embodiment, General Principle as defined herein can, in the situation that not departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention will can not be restricted to these embodiment shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (3)
1. a non-normal temperature test module, comprise base, be arranged on the rotating disk that the support on described base is connected with motor, by the holder of described stent support, with described motor, and be arranged on the multiple fixtures on described rotating disk, it is characterized in that, on described holder, be provided with the mount pad of the described fixture of multiple correspondences, high temperature storehouse is installed on described mount pad, and inside, described high temperature storehouse is provided with Intelligent heating system.
2. non-normal temperature test module according to claim 1, is characterized in that, multiple described mount pads are the circle-shaped edge that is evenly distributed on described holder.
3. non-normal temperature test module according to claim 1, is characterized in that, described fixture is clip manipulator, on described clip manipulator, is provided with groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210475917.8A CN103831256B (en) | 2012-11-21 | 2012-11-21 | Non-room temperature test module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210475917.8A CN103831256B (en) | 2012-11-21 | 2012-11-21 | Non-room temperature test module |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103831256A true CN103831256A (en) | 2014-06-04 |
| CN103831256B CN103831256B (en) | 2016-12-21 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210475917.8A Active CN103831256B (en) | 2012-11-21 | 2012-11-21 | Non-room temperature test module |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104889073A (en) * | 2015-06-15 | 2015-09-09 | 宁夏大学 | Screening instrument for sensing components of fuel gas meter electronic counter |
| CN105223439A (en) * | 2015-09-29 | 2016-01-06 | 芜湖宏景电子股份有限公司 | Auto navigation automatic aging test unit |
| CN107064695A (en) * | 2017-06-05 | 2017-08-18 | 中国电子科技集团公司第四十研究所 | A kind of automatic charging machine design method applied to filters to test |
| CN107121631A (en) * | 2017-06-05 | 2017-09-01 | 中国电子科技集团公司第四十研究所 | A kind of on-line testing method applied to SAW filter |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3810541A (en) * | 1972-09-25 | 1974-05-14 | Gte Sylvania Inc | Method of segregating temperature responsive circuit breakers according to their opening temperature |
| JP2001133513A (en) * | 1999-11-05 | 2001-05-18 | Murata Mfg Co Ltd | Heating classifier |
| CN2644023Y (en) * | 2003-09-15 | 2004-09-29 | 陈伟民 | Automatic temperature sorting device with jump switch typed thermoregulator |
| CN201434891Y (en) * | 2009-05-14 | 2010-03-31 | 杭州科策电热技术有限公司 | Multifunctional rotary automatic detecting table |
| CN202943039U (en) * | 2012-11-21 | 2013-05-22 | 江苏格朗瑞科技有限公司 | Non-normal temperature test module |
-
2012
- 2012-11-21 CN CN201210475917.8A patent/CN103831256B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3810541A (en) * | 1972-09-25 | 1974-05-14 | Gte Sylvania Inc | Method of segregating temperature responsive circuit breakers according to their opening temperature |
| JP2001133513A (en) * | 1999-11-05 | 2001-05-18 | Murata Mfg Co Ltd | Heating classifier |
| CN2644023Y (en) * | 2003-09-15 | 2004-09-29 | 陈伟民 | Automatic temperature sorting device with jump switch typed thermoregulator |
| CN201434891Y (en) * | 2009-05-14 | 2010-03-31 | 杭州科策电热技术有限公司 | Multifunctional rotary automatic detecting table |
| CN202943039U (en) * | 2012-11-21 | 2013-05-22 | 江苏格朗瑞科技有限公司 | Non-normal temperature test module |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104889073A (en) * | 2015-06-15 | 2015-09-09 | 宁夏大学 | Screening instrument for sensing components of fuel gas meter electronic counter |
| CN105223439A (en) * | 2015-09-29 | 2016-01-06 | 芜湖宏景电子股份有限公司 | Auto navigation automatic aging test unit |
| CN107064695A (en) * | 2017-06-05 | 2017-08-18 | 中国电子科技集团公司第四十研究所 | A kind of automatic charging machine design method applied to filters to test |
| CN107121631A (en) * | 2017-06-05 | 2017-09-01 | 中国电子科技集团公司第四十研究所 | A kind of on-line testing method applied to SAW filter |
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| Publication number | Publication date |
|---|---|
| CN103831256B (en) | 2016-12-21 |
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