CN103761057A - Method for improving reliability of hard disk - Google Patents

Abstract

The invention discloses a method for improving the reliability of a hard disk. The method includes acquiring parameters of hard disk arrays at different sampling times, calculating membership values including temperature, performance, operating time and power, corresponding to the parameters of the hard disk arrays at different sampling times, acquiring average values A, B and C corresponding to the temperature, performance, operating time of the hard disk and a minimum D of the membership corresponding to the power, acquiring a hard disk array aggregation value F = aA+bB+cC+dD, changing the size of the hard disk arrays, repeating the steps to acquire aggregation values corresponding to hard disk arrays with different sizes, and finding out the hard disk array corresponding to a maximized aggregation value to serve as a most reliable array. a = 0.1, B = 0.2, C = 0.3, and d = 0.4. Compared with the prior art, the method has the advantages that temperature can be decreased by 20% to 30%, the hard disk error rate can be decreased effectively, and reliability of the hard disk can be improved.

Description

A kind of method that improves hard disk reliability

Technical field

The invention belongs to Computer Storage field, more specifically, relate to a kind of method that improves hard disk reliability.

Background technology

Storage system is being faced with the problems such as the huge electricity charge and high error rate, and these are all relevant with the excessive temperature of storage system, and experiment statistics finds that temperature affects the life-span of hard disk to a great extent.For the larger problem of energy consumption, the Energy Saving Strategy of current storage system is as far as possible load centralization to be arrived to the hard disk of minority, allows more hard disk in dormant state, reduces the energy consumption that High Rotation Speed causes.Pay close attention to a large amount of loads on a small amount of hard disk, but this strategy can cause high capacity hard disk all the time in hot operation state, cause that hard disk failure rate sharply rises.And on a small amount of hard disk, carry out the difference that too much IO operation may cause temperature between hard disk, system can not be freezed effectively like this.Compared with CPU, under existence conditions, storage system is carried out to temperature control more difficult, first, the relation between temperature and electric weight in storage system is non-linear and discrete, just to temperature, control has brought great calculated amount for this; Secondly, the feature that storage system is reacted slow has determined that system is easy to enter non-steady state under accurately controlling; Finally, to the management of hard disk, also must consider that the access times of disk are limited.In addition, the raising of temperature can make storage system just face performance bottleneck.Therefore, thus control temperature improve storage equipment reliability there is very great meaning.

Summary of the invention

For above defect or the Improvement requirement of prior art, the invention provides a kind of method that improves hard disk reliability, its object is, by introducing temperature prediction and feedback mechanism, effectively to improve the reliability of memory device.

For achieving the above object, according to one aspect of the present invention, provide a kind of method that improves hard disk reliability, comprised the following steps:

(1) obtain the parameter of different sampling instant hard disk arrays, comprise temperature (t0, t1 ..., tn), performance (p0, p1 ..., pn), working time (o0, o1 ..., on) and power consumption (c0, c1 ..., cn), wherein n represents the quantity of sampled point;

(2) calculate the corresponding membership values of parameter of different sampling instant hard disk arrays, comprise temperature (T _t0, T _t1..., T _tn), performance (P _p0, P _p1..., P _pn), working time (O _o0, O _o1..., O _on) and power consumption (C _c0, C _c1..., C _cn);

(3) obtaining step (2) obtain hard disk temperature, performance, working time corresponding membership values mean value A=(T _t0+ T _t1+ ... + T _tn)/n, B=(P _t0+ P _t1+ ... + P _tn)/n, C=(O _t0+ O _t1+ ... + O _tnthe minimum value D of the corresponding membership values of)/n and power consumption;

(4) obtain the polymerization value F=aA+bB+cC+dD of this hard disk array, wherein a=0.1, b=0.2, c=0.3, d=0.4;

(5) change the size of disk array, repeat above-mentioned steps (1) to (4), to obtain the polymerization value that different big or small disk arrays are corresponding, and find and make the maximum corresponding disk array of polymerization value as the most reliable disk array.

Preferably, the following formula of the concrete employing of step (2):

$T_{\mathrm{tn}}=\left\{\begin{array}{cc}1,& \mathrm{tn}\&le;30\\ \frac{50-\mathrm{tn}}{50-30},& 30<\mathrm{tn}<50\\ 0,& \mathrm{tn}\&GreaterEqual;50\end{array}\right.$

$P_{\mathrm{pn}}=\left\{\begin{array}{cc}0,& \frac{\mathrm{pn}}{p0}\&le;0.8\\ \frac{\frac{\mathrm{pn}}{p0}-0.8}{1.2-0.8},& 0.8<\frac{\mathrm{pn}}{p0}<1.2\\ 1,& \frac{\mathrm{pn}}{p0}\&GreaterEqual;1.2\end{array}\right.$

$O_{\mathrm{on}}=\left\{\begin{array}{cc}0,& \mathrm{on}\&le;30\\ \frac{\mathrm{on}-30}{60-30},& 30<\mathrm{on}<60\\ 1,& \mathrm{on}\&GreaterEqual;60\end{array}\right.$

$C_{\mathrm{cn}}=\exp (-\frac{{\left(S_n{P}_n\right)}^2}{2{\mathrm{\&sigma;}}^2})$

Wherein, S _nfor the Disk State vector in n moment, P _nfor the power consumption vector of each disk power consumption composition of n moment, σ is constant, the half that its value is maximum power dissipation in sampling interval.

In general, the above technical scheme of conceiving by the present invention compared with prior art, can obtain following beneficial effect:

(1) the present invention can effectively improve the reliability of memory device: owing to having adopted step (1) and step (2), to the method for taking fuzzy control of storage system, in sample point, obtain temperature, performance, the occurrence of these four parameters of working time and power consumption, calculates it in the each self-corresponding membership values of each sample point.With respect to accurate control, adopt fuzzy control not only to greatly reduce the calculated amount of storage system, also avoided the easy undesirable state often occurring under accurately controlling, make storage system more easily enter steady state (SS).

(2) the present invention adopts the mechanism of temperature prediction, in step (2), the temperature of the latter half, performance, working time and power consumption all obtain by prediction, wherein the prediction of temperature according to the heat derivation of equation out, adopts forecasting mechanism can reduce to a great extent the expense of storage system.

(3) the present invention can be to the repeatedly polymerization of polymerization value, and in step (3), to temperature, the membership values of performance and working time, averages; To the membership values of power consumption, go the minimum value of membership values in all sampled points, this is polymerization for the first time.To four values that obtain in step (3), in step (4), again carry out polymerization calculating, obtain an end value.By the polymerization of twice, can make the such abstract concept of reliability of storage system express intuitively by a numerical value.

(4) the present invention can repeatedly adjust disk array, finds and makes storage system reliability the highest.In step (5), repeatedly adjust the size of disk array, find the disk array that makes end value maximum in step (4).The comparison that relatively transfers end value size to of system reliability, can more easily find the disk array that reliability is the highest like this.

Accompanying drawing explanation

Fig. 1 is the process flow diagram that the present invention improves the method for hard disk reliability.

Embodiment

In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.In addition,, in each embodiment of described the present invention, involved technical characterictic just can combine mutually as long as do not form each other conflict.

Integral Thought of the present invention is to provide a kind of method of fuzzy control, so-called fuzzy control, be exactly to temperature, power consumption, working time, performance calculates result with subordinate function separately respectively, the result of subordinate function is on 0 to 1 interval, the result obtaining more approaches 1, just represents more to meet the requirement of control, and 0 expression is undesirable.Wherein the subordinate function of power consumption is exponential form, and its value is 0 never, represents that power consumption always meets the requirements.Other use linear subordinate function, and result can be 0.

Controller is to predict the performance of a storage system in sampling section.Concrete grammar is the time period that will predict to be divided into two parts, and front portion is the control stage, and the latter half is forecast period.In the control stage, controller can carry out difference input, and forecast period, according to the input in the stage of control, can be predicted the temperature of storage system at this one-phase, power consumption, working time, performance.Wherein the prediction of temperature is to go out two temperature difference and two relating to parameters between sampled point according to the heat derivation of equation, then according to recursive least squares, obtains the value of these two parameters.So just can arrive temperature now according to the temperature prediction of a upper sampled point.

The data that obtain by control stage and test phase, the power consumption that the each sampled point of whole sampling section is obtained, temperature, performance, the membership values of running time is carried out respectively polymerization, by the polymerization value polymerization again obtaining, obtains a final value.

According to the different input of control stage, available end value is also different.The input in so continuous adjustment control stage, selects a maximum value.This is worth corresponding control inputs, is exactly by power consumption, performance, and temperature, the running time is in conjunction with obtaining best input policing.

As shown in Figure 1, the method that the present invention improves hard disk reliability comprises the following steps:

(1) obtain the parameter of different sampling instant hard disk arrays, comprise temperature (t0, t1,, tn), performance (p0, p1,, pn), working time (o0, o1,, on) and power consumption (c0, c1,, cn), wherein n represents the quantity of sampled point, its span is 50 to 100, and the time interval of sampling is 75 minutes to 90 minutes;

(2) calculate the corresponding membership values of parameter of different sampling instant hard disk arrays, comprise temperature (T _t0, T _t1..., T _tn), performance (P _p0, P _p1..., P _pn), working time (O _o0, O _o1..., O _on) and power consumption (C _c0, C _c1..., C _cn); T _tn, P _pn, O _on, C _cnconcrete formula as follows:

$T_{\mathrm{tn}}=\left\{\begin{array}{cc}1,& \mathrm{tn}\&le;30\\ \frac{50-\mathrm{tn}}{50-30},& 30<\mathrm{tn}<50\\ 0,& \mathrm{tn}\&GreaterEqual;50\end{array}\right.$

$P_{\mathrm{pn}}=\left\{\begin{array}{cc}0,& \frac{\mathrm{pn}}{p0}\&le;0.8\\ \frac{\frac{\mathrm{pn}}{p0}-0.8}{1.2-0.8},& 0.8<\frac{\mathrm{pn}}{p0}<1.2\\ 1,& \frac{\mathrm{pn}}{p0}\&GreaterEqual;1.2\end{array}\right.$

$O_{\mathrm{on}}=\left\{\begin{array}{cc}0,& \mathrm{on}\&le;30\\ \frac{\mathrm{on}-30}{60-30},& 30<\mathrm{on}<60\\ 1,& \mathrm{on}\&GreaterEqual;60\end{array}\right.$

$C_{\mathrm{cn}}=\exp (-\frac{{\left(S_n{P}_n\right)}^2}{2{\mathrm{\&sigma;}}^2})$

Wherein S _nfor the Disk State vector in n moment, i.e. the operation halted state of disk, P _nfor the power consumption vector of each disk power consumption composition of n moment, σ is constant, the half that its value is maximum power dissipation in sampling interval.

(3) obtaining step (2) obtain hard disk temperature, performance, working time corresponding membership values mean value A=(T _t0+ T _t1+ ... + T _tn)/n, B=(P _t0+ P _t1+ ... + P _tn)/n, C=(O _t0+ O _t1+ ... + O _tnthe minimum value D of the corresponding membership values of)/n and power consumption;

(4) obtain the polymerization value F=aA+bB+cC+dD of this hard disk array, wherein a=0.1, b=0.2, c=0.3, d=0.4;

(5) change the size of disk array, repeat above-mentioned steps (1) to (4), to obtain the polymerization value that different big or small disk arrays are corresponding, and find and make the maximum corresponding disk array of polymerization value as the most reliable disk array.

Those skilled in the art will readily understand; the foregoing is only preferred embodiment of the present invention; not in order to limit the present invention, all any modifications of doing within the spirit and principles in the present invention, be equal to and replace and improvement etc., within all should being included in protection scope of the present invention.

Claims (2)

1. a method that improves hard disk reliability, is characterized in that, comprises the following steps:

(1) obtain the parameter of different sampling instant hard disk arrays, comprise temperature (t0, t1 ..., tn), performance (p0, p1 ..., pn), working time (o0, o1 ..., on) and power consumption (c0, c1 ..., cn), wherein n represents the quantity of sampled point;

(2) calculate the corresponding membership values of parameter of different sampling instant hard disk arrays, comprise temperature (T _t0, T _t1..., T _tn), performance (P _p0, P _p1..., P _pn), working time (O _o0, O _o1..., O _on) and power consumption (C _c0, C _c1..., C _cn);

(3) obtaining step (2) obtain hard disk temperature, performance, working time corresponding membership values mean value A=(T _t0+ T _t1+ ... + T _tn)/n, B=(P _t0+ P _t1+ ... + P _tn)/n, C=(O _t0+ O _t1+ ... + O _tnthe minimum value D of the corresponding membership values of)/n and power consumption;

(4) obtain the polymerization value F=aA+bB+cC+dD of this hard disk array, wherein a=0.1, b=0.2, c=0.3, d=0.4;

(5) change the size of disk array, repeat above-mentioned steps (1) to (4), to obtain the polymerization value that different big or small disk arrays are corresponding, and find and make the maximum corresponding disk array of polymerization value as the most reliable disk array.

2. according to claim 1, it is characterized in that the following formula of the concrete employing of step (2):

$T_{\mathrm{tn}}=\left\{\begin{array}{cc}1,& \mathrm{tn}\&le;30\\ \frac{50-\mathrm{tn}}{50-30},& 30<\mathrm{tn}<50\\ 0,& \mathrm{tn}\&GreaterEqual;50\end{array}\right.$

$P_{\mathrm{pn}}=\left\{\begin{array}{cc}0,& \frac{\mathrm{pn}}{p0}\&le;0.8\\ \frac{\frac{\mathrm{pn}}{p0}-0.8}{1.2-0.8},& 0.8<\frac{\mathrm{pn}}{p0}<1.2\\ 1,& \frac{\mathrm{pn}}{p0}\&GreaterEqual;1.2\end{array}\right.$

$O_{\mathrm{on}}=\left\{\begin{array}{cc}0,& \mathrm{on}\&le;30\\ \frac{\mathrm{on}-30}{60-30},& 30<\mathrm{on}<60\\ 1,& \mathrm{on}\&GreaterEqual;60\end{array}\right.$

$C_{\mathrm{cn}}=\exp (-\frac{{\left(S_n{P}_n\right)}^2}{2{\mathrm{\&sigma;}}^2})$

Wherein, S _nfor the Disk State vector in n moment, P _nfor the power consumption vector of each disk power consumption composition of n moment, σ is constant, the half that its value is maximum power dissipation in sampling interval.

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