CN103750838A - Distributed vessel and acupoint multi-parameter tester and testing method - Google Patents
Distributed vessel and acupoint multi-parameter tester and testing method Download PDFInfo
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- CN103750838A CN103750838A CN201410030142.2A CN201410030142A CN103750838A CN 103750838 A CN103750838 A CN 103750838A CN 201410030142 A CN201410030142 A CN 201410030142A CN 103750838 A CN103750838 A CN 103750838A
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Abstract
The invention discloses a distributed vessel and acupoint multi-parameter tester and testing method. The tester is composed of a combined sensor A, a combined sensor B, sensor connection lines, a measuring and data processing system and a comprehensive data analyzing system. Twenty-five electrodes are distributed according to shape rules of a circle center, an inner ring and an outer ring. By means of a gate circuit, parameters and parameter distribution of impedance spectroscopy, impedance imaging and oxygen partial pressure of gates of the electrodes are measured. Temperature and temperature distribution are measured through an infrared measuring mode. The measured parameters are measured and collected through the measuring and data processing system, the comprehensive data analyzing system carries out data analysis, and the testing process is controlled through a computer. By means of the tester, four kinds of parameters and parameter distribution of a vessel and acupoint area can be detected, and is a research device used for physicochemical property research of acupoints through parameter comparison. Modern technologies are used for analyzing and sorting a large quantity of data and researching mutual relations of the parameters and parameter distribution and distribution rules, and a basic instrument is provided for theoretical research of traditional Chinese medicine vessels and acupoints.
Description
One, technical field
The present invention relates to Chinese medical theory research, particularly meridian point distributes and studies, specifically the distributed multi parameter tester of meridian point.
Two, background technology
The traditional Chinese medical science is one of representative of Chinese culture.To the theoretical research of the traditional Chinese medical science, it is the research field that China greatly develops and subsidizes.One of development bottleneck of theory of Chinese medical science is that the traditional Chinese medical science detecting instrument that supports traditional Chinese medical science system lacks.In theory of Chinese medical science, meridians and acupuncture point are the human body key positions of tcm diagnosis treatment, and in the historical long river of Traditional Chinese Medicine research, the research at meridians and acupuncture point occupies very important effect.The < < Chinese medicine meridian detection instrument > > that Chinese Patent Application No.: CN201120310017 announces, disclose a kind of Chinese medicine meridian detection instrument, the bioelectrical signals at the different meridians of the human body place obtaining respectively by acupoint biological electrical signal detection probe is identified collaterals of human.The < < personal pocket meridian energy detector > > that Chinese Patent Application No.: CN201020146433.5 announces discloses a kind of personal pocket meridian energy detector design, directly measures acupuncture point with respect to the D.C. resistance of reference point.< < Chinese medicine acupoint positioning device and method > > that Chinese Patent Application No.: CN201110280650.2 announces, announce a kind of Chinese medicine acupoint positioning device, adopted WAVELET PACKET DECOMPOSITION technology to carry out acupuncture point judgement.The < < human body acupoint resistance value detector > > that Chinese Patent Application No.: CN200720128897.1 announces discloses a kind of human body acupoint resistance value detector, by measuring D.C. resistance judgement acupuncture point.Above-mentioned prior art plays a good role to the research of meridian point, and what these technology detected employing to meridians is direct current resistance m easurem ent technology.Due to the shortage of pertinent instruments, the research at meridians and acupuncture point does not also have precise definition, so the application of above-mentioned patent is subject to certain restrictions, finding accurately of acupuncture point also exists certain deviation.The mechanism that the present invention is meridians and acupuncture point provides a kind of electronic measuring instrument and equipment.For setting up Basic Theories of Chinese Medicine, provide the scientific instrument with modern technologies feature, for the research of meridian point is provided fundamental basis.
Three, summary of the invention
The meridian point tester that the object of this invention is to provide a kind of distributed multiparameter, solve the deficiency of one-parameter single-point bit test in prior art, the mode that adopts distributed, multiparameter provides foundation for meridian point accurate location, for developing of motherland's medical science rarity provided fundamental basis.
The object of the invention is to reach like this: tester consists of A, two groups of combination sensors of B, A, B two sensors connecting line, measurement and data handling system, comprehensive data analysis system; Sensor connecting line connects combination sensor and measurement and data handling system, and sensor sensing signal is flowed to and measured and data handling system; Measurement is connected with comprehensive data analysis system with data handling system, measurement receives comprehensive data analysis system command with the microprocessor in data handling system, control related sensor and measure and gather measurement parameter, measurement parameter is flowed to comprehensive data analysis system and analyze.
Described combination sensor consists of combination sensor shell, infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens, infrared filter and measurement electrode; Combination sensor shell is cylindrical shape, shell bottom installation infrared filter, and inside is installation infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens successively from top to bottom; Infrared Lens and infrared filter and combination sensor shell form a seal cavity, and an inflator pump, vent valve are installed in Infrared Lens top; Between infrared filter and combination sensor shell, spring is housed, infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but can be free to slide.
Measurement electrode is comprised of 25 electrodes, 25 electrodes are arranged according to the center of circle and inside and outside toroidal, successively electrode is numbered: center of circle electrode is No. 1, eight electrodes of the circular distribution of inner ring are numbered No. 2-9,16 electrodes that outer ring annulus distributes are No. 10-25, No. 1 electrode of electrode centers and the 2-9 electrode of inner ring are arranged on infrared filter near a side of skin, 16 electrodes that outer ring distributes are numbered No. 10-25, race diameter is the twice of inner ring diameter, and the 10-25 electrode of outer ring is arranged on combination sensor shell.
Described infrared filter is circular, has passage on it.
Described Infrared Detectors is no-refrigeration infrared focal plane detector, and infrared driving and data acquisition circuit are by power supply and biasing circuit, amplification and filter circuit, and analog to digital conversion circuit and programmable gate array form; Power supply and biasing circuit are connected to no-refrigeration infrared focal plane detector, for no-refrigeration infrared focal plane detector provides power supply and offset signal, the image outputting analog signal of no-refrigeration infrared focal plane detector is by after amplifying and amplifying with filter circuit, through analog to digital conversion circuit, convert digital signal to and flow to programmable gate array, the master clock of no-refrigeration infrared focal plane detector, reset signal, integrated signal, row useful signal, the first row signal are connected with programmable gate array.
Measure with data handling system and formed by multi-channel gating switch control circuit, impedance spectrum measuring circuit, impedance imaging measuring circuit, partial pressure of oxygen measuring circuit, microprocessor; The electrode connecting line of A, B two sensors connecting line is connected with multi-channel gating switch control circuit, and Infrared Detectors output data serial communication interface is connected with microprocessor.
While carrying out impedance spectrum measurement, multi-channel gating switch control circuit is respectively selected the negative electrode of an electrode in its 25 electrodes from combination sensor A and combination sensor B by electrode connecting line, be connected to impedance spectrum measuring circuit; While carrying out impedance imaging measurement, multi-channel gating switch control circuit is selected the negative electrode of 10-25 electrode from combination sensor A or combination sensor B by electrode connecting line, be connected to impedance imaging measuring circuit; Carry out partial pressure of oxygen while measuring, multi-channel gating switch control circuit in the 1-25 electrode of combination sensor A or combination sensor B, selects an antikathode of same electrode and anodic bonding to partial pressure of oxygen measuring circuit by electrode connecting line.
Microprocessor is connected with impedance spectrum measuring circuit, receives the measurement data of impedance spectrum measuring circuit; Microprocessor is connected with impedance imaging measuring circuit, receives the measurement data of impedance imaging measuring circuit; Microprocessor is connected with partial pressure of oxygen measuring circuit, receives the measurement data of partial pressure of oxygen measuring circuit; Microprocessor is connected with multi-channel gating switch control circuit, controls gating switch to specifying the gating of electrode cathode or anode; Microprocessor is connected with the Infrared Detectors output data serial communication interface in sensor connecting line, reads its output data from Infrared Detectors;
Microprocessor is connected with comprehensive data analysis system, by measurement data, gives comprehensive data analysis system.
While carrying out impedance spectrum measurement, 25 connecting lines that are connected with the electrode cathode of combination sensor A in electrode connecting line A are connected to 25 and select 1 circuit A, and 25 select 1 circuit A therefrom to select a connecting line to be connected to impedance spectrum measuring circuit; 25 connecting lines that are connected with the electrode cathode of combination sensor B in electrode connecting line B are connected to 25 and select 1 circuit B, and 25 select 1 circuit B therefrom to select a connecting line to be connected to impedance spectrum measuring circuit;
The described impedance imaging that carries out is when measure, and multi-channel gating switch control circuit is selected the negative electrode of 10-25 electrode from combination sensor A or combination sensor B by electrode connecting line, through 2, select 1 circuit to be connected to impedance imaging measuring circuit;
The described partial pressure of oxygen that carries out is when measure, multi-channel gating switch control circuit is by 25 negative electrode and the anodes that select No. 1-25 certain electrode of 1 circuit Selection and Constitute sensors A and combination sensor B, then by 2 negative electrode and the anodes that select 1 circuit Selection and Constitute sensors A or combination sensor B.
Electrode is single is circular, be respectively from bottom to up electrode cathode (26), zirconium dioxide (27), electrode anode (28), electrode anode is connected to the connector being connected with sensor connecting line with micro wiring with electrode cathode, 1-16 electrode is manufactured on infrared filter by micro fabrication, and the outer edge joint of electrode cathode touches skin; The area that electrode and connection wire account for infrared filter is less than 30%.
In multi parameter tester, sensor is combination sensor, responds to respectively channel-point impedance spectrum, partial pressure of oxygen, Temperature Distribution, impedance imaging parameter;
Combination sensor consists of combination sensor shell, infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens, infrared filter and exploring electrode; 25 electrodes are arranged evenly according to the center of circle and inside and outside toroidal; The installation of infrared filter adopts method that can be flexible, by Infrared Lens and infrared filter and combination sensor shell, form a seal cavity, an inflator pump and vent valve are installed in Infrared Lens top, infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but infrared filter can be free to slide; In infrared filter outer ring, there is a spring, while carrying out impedance imaging test, open vent valve, under spring action, infrared filter indentation combination sensor shell, the electrode on infrared filter does not contact skin; While carrying out impedance spectrum, partial pressure of oxygen test, close vent valve, open inflator pump, infrared filter stretches out combination sensor shell, the electrode contact skin on infrared filter; The installation site of Infrared Lens and Infrared Detectors guarantees skin blur-free imaging on Infrared Detectors that electrode cathode contacts.
Measurement receives comprehensive data analysis system command with the microprocessor in data handling system, control related sensor and measure and gather measurement parameter: by gating circuit, the gating of electrode is measured respectively parameter and the parameter distribution of impedance spectrum, impedance imaging, partial pressure of oxygen, by infrared survey mode, measure temperature and Temperature Distribution, measurement is measured and is gathered by measuring with data handling system, and comprehensive data analysis system is carried out data analysis.
The control flow of the microprocessor in measurement and data handling system:
Start, the first step, receives comprehensive data analysis system command; Second step, does judgement require to measure Temperature Distribution? no, enter the 6th step, be that the 3rd step, receives infrared driving and data acquisition circuit data; The 4th step, computation of table lookup Temperature Distribution; The 5th step, uploads to comprehensive data analysis system by temperature profile data, returns to the first step; The 6th step, does judgement require to measure impedance imaging? no, enter the 11 step, be, the 7th step, controls vent valve venting, the 8th step, to impedance imaging measuring circuit, send measuring command, the 9th step, the measurement data of collection impedance imaging measuring circuit, the tenth step, impedance measurement data are sent to comprehensive data analysis system, return to the first step; The 11 step, does judgement require to measure impedance spectrum? no, enter the 13 step, be, the 12 step, operation impedance spectrum is measured subprogram, returns to the first step; The 13 step, does judgement require to measure partial pressure of oxygen? no, return to the first step, be, the 14 step, partial pressure of oxygen is measured subprogram, returns to the first step, and circulation comes and goes.
In measurement and data handling system, be connected to the impedance spectrum measurement procedure on Infrared Detectors:
Start, the first step, controls inflator pump inflation, second step, i=1, j=1, the 3rd step, the i electrode cathode of control gating circuit Selection and Constitute sensors A, control the j electrode cathode of gating circuit Selection and Constitute sensor B, f=0, the 4th step, arranges frequency f, the 5th step, reads real part, imaginary part, and deposit real part, imaginary part and corresponding electrode pair, measuring frequency f in data base, the 6th step, judgement f < 100? be, the stepping of f=f+100 hertz, return to the 4th step, no, the 7th step, judgement 100≤f < 1000, be, the stepping of f=f+1000 hertz, return to the 4th step, no, the 8th step, judgement 1000≤f < 10K, be, the stepping of f=f+10K hertz, return to the 4th step, no, the 9th step, the stepping of f=f+100K hertz, the tenth step, judgement f > 1000K? no, return to the 4th step, be, the 11 step, j=j+1, the 12 step, judgement j > 25? no, return to the 3rd step, be, the 13 step, j=1, i=i+1, the 14 step, judgement i > 25?, no, return to the 3rd step, be that the 15 step, gives comprehensive data analysis system by data, finishes,
Partial pressure of oxygen measurement procedure:
Start, the first step, controls charge valve inflation, second step, i=1, the 3rd step, the negative electrode of control gating circuit Selection and Constitute sensor i electrode and anodic bonding are to partial pressure of oxygen measuring circuit, and the 4th step, gathers partial pressure of oxygen measuring circuit output voltage, the 5th step, computation of table lookup oxygen partial pressure value, the 6th step, i=i+1, the 7th step judgement i > 25?, no, return to the 3rd step, be, finish.
In described impedance imaging measuring circuit, DSP CONTROL flow process:
Start K=10, M=K+2, N=k+3, the first step: control 16 and select 1 circuit gating K, K+1 electrode is inputted as sinusoidal signal, second step: control 16 and select 1 circuit gating M, N electrode is connected to the analog digital conversion interface of digital signal processing chip as measurement output electrode, by analog digital conversion interface, gather the voltage signal between M, N electrode, the 3rd step, N=N+1, the 4th step, judgement N > 25? no, enter two steps, be, the 5th step: N=N-25+9, the 6th step, : judgement N=K? no, enter two steps, be, the 7th step: M=M+1, the 8th step, judgement M > 25? no, enter two steps, be, the 9th step, M=M-25+9, the tenth step, judgement M=K? no, enter two steps, be, the 11 step, K=K+1, the 12 step, judgement K=26? no, return to the first step, be, the 13 step, according to measurement data, set up and solve relevant Maxwell equation, computing impedance imaging parameters, the 14 step, impedance imaging data are sent to microprocessor, finish.
No-refrigeration infrared focal plane detector flow process: the first step, output drives sequential; Second step, reads in no-refrigeration infrared focal plane detector image signal; The 3rd step, image rectification; The 4th step, the data after correction flow to digital signal processor, and the 5th step, returns to second step, moves in circles.
The method for correcting image of no-refrigeration infrared focal plane detector comprises experiment test image correction parameters and image rectification two parts:
Experiment test image correction parameters: video camera is placed on to 0,1,2,3 ... under 60 degrees Celsius of environment, measure respectively photographic subjects and be the target of 0 degree Celsius and 60 degrees Celsius, by ambient temperature x degree Celsius, i at 0 degree Celsius of photographic subjects temperature is capable, the measurement value of j row is labeled as X0ij (x), by ambient temperature x degree Celsius, the i at 60 degrees Celsius of photographic subjects temperature is capable, and the measurement value of j row is labeled as Xhij (x); At x degree Celsius of computing environment temperature: Gij (x)=255/ (Xhij (x)-X0ij (x)), Qij (x)=-Gij (x) X0ij (x); Obtain Gij (x), Qij (x) is that under ambient temperature x degree Celsius, i is capable, the correction parameter of j row.
Method for correcting image: the first step, from digital temperature sensor, read ambient temperature, second step, according to ambient temperature, reads correction parameter, and it is capable that i is calculated under x degree Celsius of ambient temperature in design, and the correction parameter of j row is respectively Gij (x), Qij (x); The 3rd step, reads no-refrigeration infrared focal plane detector image signal, establishes the i reading capable, and the data of j row are Dij; The 4th step, correction data=Gij (x) Dij+Qij (x).
Comprehensive data analysis system program:
Start, State selective measurements parameter, sends measuring command to microprocessor; Receive microprocessor measurement data, show and storage of measurement data, measurement data is carried out to analytical calculation, finish.
Good effect of the present invention is:
1, the present invention adopts distributed parameters test, can detect the parameter distribution of channel-point and periphery thereof, by the parameter comparison acupuncture point that is as the criterion, provides reference,
2, the present invention adopts multi-parameters test, can Impedance measurement spectrum, partial pressure of oxygen, Temperature Distribution, 4 parameters of impedance imaging, and one-parameter test relatively, test is according to more reliable.
3, adopt modern science and technology technology, carry out analysis, the arrangement of mass data in comprehensive data analysis system, mutual relation and the parameter distribution rule of research parameter distribution, for the theoretical research at Chinese medicine meridian acupuncture point lays the foundation.
Four, accompanying drawing explanation
Fig. 1 is the population structure schematic diagram of the distributed multi parameter tester of this meridian point.
Fig. 2 is combination sensor structural representation.
Fig. 3 is measurement electrode scattergram.
Fig. 4 is single electrode structure schematic diagram.
Fig. 5 is infrared filter structure side view.
Fig. 6 is infrared filter structure upward view.
Fig. 7 is Infrared Detectors and infrared driving and data acquisition circuit structured flowchart.
Fig. 8 is power supply and biasing circuit and no-refrigeration infrared focal plane detector circuit figure in Infrared Detectors.
Fig. 9 is that infrared driving and data acquisition circuit amplify and filter circuit figure.
Figure 10 is analog to digital conversion circuit figure in infrared driving and data acquisition circuit.
Figure 11～Figure 14 is the programmable gate array circuit diagram that infrared driving and data acquisition circuit adopt.
Figure 15 measures and data handling system structured flowchart in the distributed multi parameter tester of this meridian point.
Figure 16 is the gating circuit block diagram while carrying out impedance spectrum measurement.
Figure 17 is the gating circuit block diagram while carrying out impedance spectrum imaging measurement.
Figure 18 is the gating circuit block diagram while carrying out partial pressure of oxygen measurement.
Figure 19 25 selects 1 circuit diagram.
Figure 20 2 selects 1 circuit diagram.
Figure 21 is impedance spectrum measuring circuit figure.
Figure 22 is impedance spectrum imaging measurement circuit diagram block diagram.
Figure 23 is sinusoidal signal generator circuit diagram in impedance imaging measuring circuit.
Figure 24 16 selects 1 circuit diagram in impedance imaging circuit.
Figure 25 amplifies and filter circuit figure in impedance imaging measuring circuit.
Figure 26 is digital signal processing circuit figure in impedance imaging measuring circuit.
Figure 27 is microcontroller circuit figure in measurement and data handling system.
Figure 28 is inflator pump and vent valve control circuit figure.
Figure 29 is Digital Signal Processing flow chart in impedance imaging measuring circuit.
Figure 30 is microprocessor flow chart in measurement and data handling system.
Figure 31 is impedance spectrum measurement procedure figure.
Figure 32 is partial pressure of oxygen measurement procedure figure.
Figure 33 is comprehensive data analysis system program flow chart.
In figure, 1～25 electrode, 26 electrode cathodes, 27 zirconium dioxides, 28 electrode anodes, 29 infrared filters, 30 passages, 26-8,26-1,26-4 are that infrared filter upside is looked negative electrode, 30-8,30-1,30-4 is the passage of infrared filter upside apparent time.
Five, the specific embodiment
Referring to accompanying drawing 1-6.
This instrument consists of A, two combination sensors of B, A, B two sensors connecting line, measurement and data handling system, comprehensive data analysis system.Combination sensor is used for responding to channel-point impedance spectrum, partial pressure of oxygen, Temperature Distribution, impedance imaging parameter, sensor connecting line is for flowing to sensor sensing signal to measure and data handling system, measure the induced signal with data handling system Analysis and measurement combination sensor, obtain channel-point impedance spectrum, partial pressure of oxygen, Temperature Distribution, impedance imaging parameter, and measured parameter is flowed to comprehensive data analysis system.
Described sensor connecting line comprises negative electrode and the anodic bonding line of 25 measurement electrode, totally 50, and 5 of simulation ground wires; Infrared driving and data acquisition circuit be for transmitting 6 of the serial communication interfaces of Infrared Detectors output data, 2 of power lines, and 2 of digital ground wires, 2 of inflator pump control lines, vent valve control line 2 are followed, and amount to 69 connecting lines; Wherein the negative electrode of each electrode and anodic bonding line are twisted-pair feeder; 69 sleeve pipe suits for connecting line outside, and be connected with special connecting piece.
Combination sensor consists of combination sensor shell, infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens, infrared filter and measurement electrode; Combination sensor shell is cylindrical shape, shell bottom installation infrared filter, and inside is installation infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens successively from top to bottom; Infrared Lens and infrared filter and combination sensor shell form a seal cavity, inflator pump, vent valve and a spring are installed in Infrared Lens top, infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but can be free to slide.
The installation of infrared filter adopts method for designing that can be flexible, telescopic method is Infrared Lens and infrared filter and a seal cavity of combination sensor shell composition, an inflator pump and vent valve are installed in Infrared Lens top, infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but infrared filter can be free to slide.In infrared filter outer ring, there is a spring.When carrying out impedance imaging test, open vent valve, under spring action, infrared filter indentation combination sensor shell, the electrode on infrared filter does not contact skin.When carrying out impedance spectrum, partial pressure of oxygen test, close vent valve, open inflator pump, infrared filter stretches out combination sensor shell, the electrode contact skin on infrared filter.
Measurement electrode is comprised of 25 electrodes, and as shown in Figure 3, electrode is circular distribution.Successively electrode is numbered: center of circle electrode is No. 1, eight electrodes of the circular distribution of inner ring are numbered No. 2-9, No. 1 electrode at center and the 2-9 electrode of inner ring are arranged on infrared filter near a side of skin, 16 electrodes that outer ring distributes are numbered No. 10-25, race diameter is the twice of inner ring diameter, and the 10-25 electrode of outer ring is arranged on combination sensor shell.
As shown in Figure 4, electrode two ends are electrode cathode 26 and electrode anode 28 to single electrode, and there is zirconium dioxide 27 centre.Electrode is circular, and electrode anode is connected to the connector being connected with sensor connecting line with micro wiring with electrode cathode.1-16 electrode is manufactured on infrared filter by micro fabrication, and the outer edge joint of electrode cathode touches skin.The area that electrode and connection wire account for infrared filter is less than 30%.
As shown in Figure 5, Figure 6.On infrared filter 29, have anode passage 30, infrared filter is circular, can pass through infrared light, filters visible ray, and passage can contact with gas in shell electrode anode.Infrared filter top is equipped with 1-9 electrode, and electrode is arranged on the ragged edge of combination sensor shell, and the outer limit of electrode cathode can touch skin.
Combination sensor consists of combination sensor shell, infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens, infrared filter and measurement electrode; Combination sensor shell is cylindrical shape, shell bottom installation infrared filter, and inside is installation infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens successively from top to bottom; Infrared Lens and infrared filter and combination sensor shell form a seal cavity, an inflator pump, vent valve are installed in Infrared Lens top, between infrared filter and combination sensor shell, spring is housed, infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but can be free to slide.
Referring to Fig. 7.Infrared Detectors is used for measuring Temperature Distribution, is no-refrigeration infrared focal plane detector.Infrared driving and data acquisition circuit consist of power supply and biasing circuit, amplification and filter circuit, analog to digital conversion circuit, programmable gate array.Power supply and biasing circuit provide power supply and offset signal for no-refrigeration infrared focal plane detector, the image outputting analog signal of no-refrigeration infrared focal plane detector is by after amplifying and amplifying with filter circuit, through analog to digital conversion circuit, convert digital signal to and flow to programmable gate array, the master clock of no-refrigeration infrared focal plane detector, reset signal, integrated signal, row useful signal, the first row signal are connected with programmable gate array.
Referring to Fig. 8.In figure, U3 is no-refrigeration infrared focal plane detector, UL01021E for French ULIS company, U1, U2, U4, U5, U6, U7, U8 form power supply and biasing circuit, the TPS79533 of U1, U2Wei U.S. TEXAS INSTRUMENTS company, the MAX6004 of U4, U5Wei U.S. MAXIM company, the LM317 of U6Wei U.S. TEXAS INSTRUMENTS company, the TLV5638 of U7, U8Wei U.S. TEXAS INSTRUMENTS company, MC is master clock; INT is integrated signal; RESET is reset signal; LIGNE1 is the first row signal; DATAVAL is row useful signal; By AOUT, output signal to and amplify and filter circuit.
In Fig. 9, amplify with filter circuit figure in, the OPA2890 of U1Shi U.S. TEXAS INSTRUMENTS company, interface AOUT is connected to the output of no-refrigeration infrared focal plane detector; ADCIN is connected to the input of analog to digital conversion circuit.
In Figure 10 Infrared Detectors in analog to digital conversion circuit, the AD9244 of U2Wei U.S. Analog Devices company; AOUT meets the ADCIN interface amplifying with filter circuit, CLK+, CLK-, DB0 ... DB13 is output pixel signal, connects programmable gate array.
Referring to Figure 11～Figure 14, infrared driving and data acquisition circuit adopt programmable gate array circuit diagram.Programmable gate array chip is selected the XC3S1200 of U.S. XILINX company.
Referring to Figure 15.Measure with data handling system and formed by multi-channel gating switch control circuit, impedance spectrum measuring circuit, impedance imaging measuring circuit, partial pressure of oxygen measuring circuit, microprocessor.The electrode connecting line of two sensors connecting line is connected with multi-channel gating switch control circuit, and the output data serial communication interface of infrared driving and data acquisition circuit is connected with microprocessor.While carrying out impedance spectrum measurement, multi-channel gating switch control circuit is respectively selected the negative electrode of one of them electrode from combination sensor A and combination sensor B by electrode connecting line, be connected to impedance spectrum measuring circuit.While carrying out impedance imaging measurement, multi-channel gating switch control circuit is selected the negative electrode of 10-25 electrode from combination sensor A or combination sensor B by electrode connecting line, be connected to impedance imaging measuring circuit.Carry out partial pressure of oxygen while measuring, multi-channel gating switch control circuit in the 1-25 electrode of combination sensor A or combination sensor B, selects an antikathode of same electrode and anodic bonding to partial pressure of oxygen measuring circuit by electrode connecting line.Microprocessor is connected with impedance spectrum measuring circuit, receives the measurement data of impedance spectrum measuring circuit; Microprocessor is connected with impedance imaging measuring circuit, receives the measurement data of impedance imaging measuring circuit; Microprocessor is connected with partial pressure of oxygen measuring circuit, receives the measurement data of partial pressure of oxygen measuring circuit; Microprocessor is connected with multi-channel gating switch control circuit, controls gating switch to specifying the gating of electrode cathode or anode; Microprocessor is connected with the Infrared Detectors output data serial communication interface in sensor connecting line, reads output data from Infrared Detectors.Microprocessor is connected with comprehensive data analysis system, by measurement data, gives comprehensive data analysis system.Figure 16～Figure 20 is when carrying out respectively impedance spectrum measurement, impedance imaging and measuring, the gating circuit block diagram of partial pressure of oxygen while measuring.
While carrying out impedance measurement, 25 connecting lines that are connected with the electrode cathode of combination sensor A in electrode connecting line A are connected to 25 and select 1 circuit A, and 25 select 1 circuit A therefrom to select a connecting line to be connected to impedance spectrum measuring circuit; 25 connecting lines that are connected with the electrode cathode of combination sensor B in electrode connecting line B are connected to 25 and select 1 circuit B, and 25 select 1 circuit B therefrom to select a connecting line to be connected to impedance spectrum measuring circuit.
While carrying out impedance imaging measurement, multi-channel gating switch control circuit is selected the negative electrode of 10-25 electrode from combination sensor A or combination sensor B by electrode connecting line, be connected to impedance imaging measuring circuit.
Carry out partial pressure of oxygen while measuring, multi-channel gating switch control circuit is selected in 1-25 electrode from combination sensor A or combination sensor B by electrode connecting line, selects an antikathode of same electrode and anodic bonding to partial pressure of oxygen measuring circuit.When carrying out impedance imaging measurement and partial pressure of oxygen measurement, used 2 to select 1 gating circuit.
Figure 19 25 selects in 1 circuit, and N1-N25 is 25 selective connecting lines, and OUT is gating connecting line, and A, B, C, A1, B1, C1 are connected to microprocessor.The chip of chip type selecting National Semiconductor: MM74HC4051.
Figure 20 2 selects in 1 circuit diagram, in figure, there are 3 tunnels 2 to select 1 circuit, can from X0, X1, select to be communicated with X, can from Y0, Y1, select to be communicated with Y, can from Z0, Z1, select to be communicated with Z, A, B, C be connected to microprocessor. the chip of chip type selecting National Semiconductor: MM74HC4053.
Figure 21 is impedance spectrum measuring circuit figure.The main chip of impedance spectrum measuring circuit is U.S. Analog Devices, the chip AD5933 of Inc..In figure, POLE1, POLE2 is connected with gate.SCL, SDA measures control interface with the impedance spectrum of microprocessor and is connected.
Figure 22 is impedance spectrum imaging measurement circuit diagram block diagram.Sinusoidal signal generation circuit produces sinusoidal current source, by 16, selects 1 circuit from 10-25 electrode, to select two input electrodes.Select 1 circuit from 10-25 electrode, to select two measurement electrode by 16, as input signal end, be connected to and amplify and filter circuit, amplify the analog digital conversion interface that is connected to digital signal processing circuit with the output of filter circuit.10-25 electrode cathode line passes through wherein 4 electrode cathode lines of impedance imaging gating circuit gating.Select for 4 16 the gating of 1 circuit to be controlled by digital signal processing circuit.
Figure 23 is sinusoidal signal generator circuit diagram in impedance imaging measuring circuit.Sinusoidal signal generation circuit is for generation of sinusoidal signal; U1 is DDS integrated circuit, and model is AD9852, by U.S. Analog Devices company, produced, and DDS_D0-DDS_D7, DDS_A0-DDS_A5 is connected to digital signal processing circuit, for controlling the output frequency of DDS.
Figure 24 16 selects 1 circuit diagram in impedance imaging circuit.N1-N16 is 16 with selective connecting line, and X is gating connecting line, and A, B, C, A1, B1, C1 are connected to digital signal processing circuit; U1, U2: the chip of National Semiconductor: MM74HC4051U3: the chip of National Semiconductor: MM74HC4053.
Referring to amplifying and filter circuit figure in Figure 25 impedance imaging measuring circuit.In figure, U1, the TLC2254 chip that U2Wei U.S. TexasInstruments company produces, the AD623 chip that U3Wei U.S. Analog Devices company produces, IN1, IN2 is input interface, individual 16 selects 1 circuit to be connected respectively with even, OUT is output interface, is connected to the analog digital conversion interface of digital signal processing circuit.
Figure 26 is digital signal processing circuit figure in impedance imaging measuring circuit.In figure, UC1: digital signal processing chip, model is TMS320F2812,, U.S. TEXAS INSTRUMENTS company produces.The 2nd pin of UC1 is analog digital conversion interface, is connected with the output of filter circuit with amplification.Other universal input/output interface is used for controlling 4 16 and selects 1 circuit and sinusoidal signal generation circuit.90th, 91 pins are connected with microprocessor, for communicating by letter between digital signal processing chip and microprocessor.
In measurement and data handling system, partial pressure of oxygen measuring circuit is identical with amplification and filter circuit in impedance imaging measuring circuit; IN1, IN2 is input interface, is connected respectively with anode, the negative electrode of gate, OUT is output interface, is connected to the analog digital conversion interface of microcontroller circuit.
Figure 27 is microcontroller circuit figure in measurement and data handling system.Microprocessor is the MSP430F135 that U.S. TexasInstruments company produces.The 2nd foot connects the output of partial pressure of oxygen measuring circuit, and the 33rd, 34 feet connect 90,91 feet of digital signal processing chip.Other universal input/output interface is connected with impedance spectrum measuring circuit, partial pressure of oxygen measuring circuit, inflator pump and vent valve control circuit respectively.
Figure 28 is inflator pump and vent valve control circuit figure.Two inflator pumps and two vent valves all adopt identical circuit; P is connected with the input/output interface of microprocessor, and A, B connect inflator pump and vent valve control line.
While using this tester to study meridian point, because sensor is combination sensor, respond to respectively channel-point impedance spectrum, partial pressure of oxygen, Temperature Distribution, impedance imaging parameter, adopt distributed frame, wherein test zone is the multiple spot of acupuncture point periphery, can detect the parameter distribution of channel-point and periphery thereof.Measurement receives comprehensive data analysis system command with the microprocessor in data handling system, control related sensor and measure and gather measurement parameter, by gating circuit, the gating of electrode is measured respectively parameter and the parameter distribution of impedance spectrum, impedance imaging, partial pressure of oxygen, by infrared survey mode, measure temperature and Temperature Distribution, measurement parameter gathers by measuring with data handling system, and comprehensive data analysis system is carried out data analysis.
This tester has been introduced modern science and technology, measurement receives comprehensive data analysis system command with the microprocessor in data handling system, control related sensor and measure and gather measurement parameter, measurement parameter is flowed to comprehensive data analysis system to be analyzed, comprehensive data analysis system adopts common computer, convenient operation person operates control, and date processing fast, reliably.
Figure 29～33rd, software processes flow process.Computer is worked fast according to operation control flow.
The control flow of the microprocessor in measurement and data handling system:
Start, the first step, receives comprehensive data analysis system command; Second step, does judgement require to measure Temperature Distribution? no, enter the 6th step, be that the 3rd step, receives infrared driving and data acquisition circuit data; The 4th step, computation of table lookup Temperature Distribution; The 5th step, uploads to comprehensive data analysis system by temperature profile data, returns to the first step; The 6th step, does judgement require to measure impedance imaging? no, enter the 11 step, be, the 7th step, controls vent valve venting, the 8th step, to impedance imaging measuring circuit, send measuring command, the 9th step, the measurement data of collection impedance imaging measuring circuit, the tenth step, impedance measurement data are sent to comprehensive data analysis system, return to the first step; The 11 step, does judgement require to measure impedance spectrum? no, enter the 13 step, be, the 12 step, operation impedance spectrum is measured subprogram, returns to the first step; The 13 step, does judgement require to measure partial pressure of oxygen? no, return to the first step, be, the 14 step, partial pressure of oxygen is measured subprogram, returns to the first step, and circulation comes and goes.
In measurement and data handling system, be connected to the impedance spectrum measurement procedure on Infrared Detectors:
Start, the first step, controls inflator pump inflation, second step, i=1, j=1, the 3rd step, the i electrode cathode of control gating circuit Selection and Constitute sensors A, control the j electrode cathode of gating circuit Selection and Constitute sensor B, f=0, the 4th step, arranges frequency f, the 5th step, reads real part, imaginary part, and deposit real part, imaginary part and corresponding electrode pair, measuring frequency f in data base, the 6th step, judgement f < 100? be, the stepping of f=f+100 hertz, return to the 4th step, no, the 7th step, judgement 100≤f < 1000, be, the stepping of f=f+1000 hertz, return to the 4th step, no, the 8th step, judgement 1000≤f < 10K, be, the stepping of f=f+10K hertz, return to the 4th step, no, the 9th step, the stepping of f=f+100K hertz, the tenth step, judgement f > 1000K? no, return to the 4th step, be, the 11 step, j=j+1, the 12 step, judgement j > 25? no, return to the 3rd step, be, the 13 step, j=1, i=i+1, the 14 step, judgement i > 25?, no, return to the 3rd step, be that the 15 step, gives comprehensive data analysis system by data, finishes,
Partial pressure of oxygen measurement procedure:
Start, the first step, controls charge valve inflation, second step, i=1, the 3rd step, the negative electrode of control gating circuit Selection and Constitute sensor i electrode and anodic bonding are to partial pressure of oxygen measuring circuit, and the 4th step, gathers partial pressure of oxygen measuring circuit output voltage, the 5th step, computation of table lookup oxygen partial pressure value, the 6th step, i=i+1, the 7th step judgement i > 25?, no, return to the 3rd step, be, finish.
In impedance imaging measuring circuit, DSP CONTROL flow process:
Start K=10, M=K+2, N=k+3, the first step: control 16 and select 1 circuit gating K, K+1 electrode is inputted as sinusoidal signal, second step: control 16 and select 1 circuit gating M, N electrode is connected to the analog digital conversion interface of digital signal processing chip as measurement output electrode, by analog digital conversion interface, gather the voltage signal between M, N electrode, the 3rd step, N=N+1, the 4th step, judgement N > 25? no, enter two steps, be, the 5th step: N=N-25+9, the 6th step, : judgement N=K? no, enter two steps, be, the 7th step: M=M+1, the 8th step, judgement M > 25? no, enter two steps, be, the 9th step, M=M-25+9, the tenth step, judgement M=K? no, enter two steps, be, the 11 step, K=K+1, the 12 step, judgement K=26? no, return to the first step, be, the 13 step, according to measurement data, set up and solve relevant Maxwell equation, computing impedance imaging parameters, the 14 step, impedance imaging data are sent to microprocessor, finish.
No-refrigeration infrared focal plane detector flow process: the first step, output drives sequential; Second step, reads in no-refrigeration infrared focal plane detector image signal; The 3rd step, image rectification; The 4th step, the data after correction flow to digital signal processor, and the 5th step, returns to second step, moves in circles.
The method for correcting image of no-refrigeration infrared focal plane detector comprises experiment test image correction parameters and image rectification two parts:
Experiment test image correction parameters: 0,1,2,3 ... under 60 degrees Celsius of environment, measure respectively photographic subjects and be the target of 0 degree Celsius and 60 degrees Celsius, by ambient temperature x degree Celsius, i at 0 degree Celsius of photographic subjects temperature is capable, the measurement value of j row is labeled as X0ij (x), by ambient temperature x degree Celsius, the i at 60 degrees Celsius of photographic subjects temperature is capable, and the measurement value of j row is labeled as Xhij (x); At x degree Celsius of computing environment temperature: Gij (x)=255/ (Xhij (x)-X0ij (x)), Qij (x)=-Gij (x) X0ij (x); Obtain Gij (x), Qij (x) is that under ambient temperature x degree Celsius, i is capable, the correction parameter of j row;
Method for correcting image: the first step, from digital temperature sensor, read ambient temperature, second step, according to ambient temperature, reads correction parameter, and it is capable that i is calculated under x degree Celsius of ambient temperature in design, and the correction parameter of j row is respectively Gij (x), Qij (x); The 3rd step, reads no-refrigeration infrared focal plane detector image signal, establishes the i reading capable, and the data of j row are Dij; The 4th step, correction data=Gij (x) Dij+Qij (x).
Comprehensive data analysis system program:
Start, State selective measurements parameter, sends measuring command to microprocessor; Receive microprocessor measurement data, show and storage of measurement data, measurement data is carried out to analytical calculation, finish.
Claims (10)
1. the distributed multi parameter tester of meridian point, is characterized in that: tester consists of A, two groups of combination sensors of B, A, B two sensors connecting line, measurement and data handling system, comprehensive data analysis system; Sensor connecting line connects combination sensor and measurement and data handling system, and sensor sensing signal is flowed to and measured and data handling system; Measurement is connected with comprehensive data analysis system with data handling system, measurement receives comprehensive data analysis system command with the microprocessor in data handling system, control related sensor and measure and gather measurement parameter, measurement parameter is flowed to comprehensive data analysis system and analyze;
Described combination sensor consists of combination sensor shell, infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens, infrared filter and measurement electrode; Combination sensor shell is cylindrical shape, shell bottom installation infrared filter, and inside is installation infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens successively from top to bottom; Infrared Lens and infrared filter and combination sensor shell form a seal cavity, and an inflator pump, vent valve are installed in Infrared Lens top; Between infrared filter and combination sensor shell, spring is housed, infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but can be free to slide.
2. the distributed multi parameter tester of meridian point as claimed in claim 1, it is characterized in that: described measurement electrode is comprised of 25 electrodes, 25 electrodes are arranged according to the center of circle and inside and outside toroidal, successively electrode is numbered: center of circle electrode is No. 1, eight electrodes of the circular distribution of inner ring are numbered No. 2-9, 16 electrodes that outer ring annulus distributes are No. 10-25, No. 1 electrode of electrode centers and the 2-9 electrode of inner ring are arranged on infrared filter near a side of skin, 16 electrodes that outer ring distributes are numbered No. 10-25, race diameter is the twice of inner ring diameter, the 10-25 electrode of outer ring is arranged on combination sensor shell,
Described infrared filter (29) is circular, has passage (30) on it;
Described Infrared Detectors is no-refrigeration infrared focal plane detector, and infrared driving and data acquisition circuit are by power supply and biasing circuit, amplification and filter circuit, and analog to digital conversion circuit and programmable gate array form; Power supply and biasing circuit are connected to no-refrigeration infrared focal plane detector, for no-refrigeration infrared focal plane detector provides power supply and offset signal, the image outputting analog signal of no-refrigeration infrared focal plane detector is by after amplifying and amplifying with filter circuit, through analog to digital conversion circuit, convert digital signal to and flow to programmable gate array, the master clock of no-refrigeration infrared focal plane detector, reset signal, integrated signal, row useful signal, the first row signal are connected with programmable gate array;
Described sensor connecting line comprises negative electrode and the anodic bonding line of 25 measurement electrode, totally 50, and 5 of simulation ground wires; Infrared driving and data acquisition circuit be for transmitting 6 of the serial communication interfaces of Infrared Detectors output data, 2 of power lines, and 2 of digital ground wires, 2 of inflator pump control lines, vent valve control line 2 are followed, and amount to 69 connecting lines; Wherein the negative electrode of each electrode and anodic bonding line are twisted-pair feeder; 69 connecting line outsides are set with sleeve pipe.
3. the distributed multi parameter tester of meridian point as claimed in claim 1, is characterized in that: described measurement and data handling system are comprised of multi-channel gating switch control circuit, impedance spectrum measuring circuit, impedance imaging measuring circuit, partial pressure of oxygen measuring circuit, microprocessor; The electrode connecting line of A, B two sensors connecting line is connected with multi-channel gating switch control circuit, and Infrared Detectors output data serial communication interface is connected with microprocessor;
While carrying out impedance spectrum measurement, multi-channel gating switch control circuit is respectively selected the negative electrode of an electrode in its 25 electrodes from combination sensor A and combination sensor B by electrode connecting line, be connected to impedance spectrum measuring circuit; While carrying out impedance imaging measurement, multi-channel gating switch control circuit is selected the negative electrode of 10-25 electrode from combination sensor A or combination sensor B by electrode connecting line, be connected to impedance imaging measuring circuit;
Carry out partial pressure of oxygen while measuring, multi-channel gating switch control circuit in the 1-25 electrode of combination sensor A or combination sensor B, selects an antikathode of same electrode and anodic bonding to partial pressure of oxygen measuring circuit by electrode connecting line; Microprocessor is connected with impedance spectrum measuring circuit, receives the measurement data of impedance spectrum measuring circuit; Microprocessor is connected with impedance imaging measuring circuit, receives the measurement data of impedance imaging measuring circuit; Microprocessor is connected with partial pressure of oxygen measuring circuit, receives the measurement data of partial pressure of oxygen measuring circuit; Microprocessor is connected with multi-channel gating switch control circuit, controls gating switch to specifying the gating of electrode cathode or anode; Microprocessor is connected with the Infrared Detectors output data serial communication interface in sensor connecting line, reads its output data from Infrared Detectors;
Microprocessor is connected with comprehensive data analysis system, by measurement data, gives comprehensive data analysis system.
4. the distributed multi parameter tester of meridian point as claimed in claim 3, is characterized in that:
The described impedance spectrum that carries out is when measure, and 25 connecting lines that are connected with the electrode cathode of combination sensor A in electrode connecting line A are connected to 25 and select 1 circuit A, and 25 select 1 circuit A therefrom to select a connecting line to be connected to impedance spectrum measuring circuit; 25 connecting lines that are connected with the electrode cathode of combination sensor B in electrode connecting line B are connected to 25 and select 1 circuit B, and 25 select 1 circuit B therefrom to select a connecting line to be connected to impedance spectrum measuring circuit;
The described impedance imaging that carries out is when measure, and multi-channel gating switch control circuit is selected the negative electrode of 10-25 electrode from combination sensor A or combination sensor B by electrode connecting line, through 2, select 1 circuit to be connected to impedance imaging measuring circuit;
The described partial pressure of oxygen that carries out is when measure, multi-channel gating switch control circuit is by 25 negative electrode and the anodes that select No. 1-25 certain electrode of 1 circuit Selection and Constitute sensors A and combination sensor B, then by 2 negative electrode and the anodes that select 1 circuit Selection and Constitute sensors A or combination sensor B.
5. the distributed multi parameter tester of meridian point as claimed in claim 2, it is characterized in that: described electrode is single for circular, be respectively from bottom to up electrode cathode (26), zirconium dioxide (27), electrode anode (28), electrode anode is connected to the connector being connected with sensor connecting line with micro wiring with electrode cathode, 1-16 electrode is manufactured on infrared filter by micro fabrication, and the outer edge joint of electrode cathode touches skin; The area that electrode and connection wire account for infrared filter is less than 30%.
6. a method of testing for the distributed multi parameter tester of meridian point, is characterized in that: in multi parameter tester, sensor is combination sensor, responds to respectively channel-point impedance spectrum, partial pressure of oxygen, Temperature Distribution, impedance imaging parameter;
Combination sensor consists of combination sensor shell, infrared driving and data acquisition circuit, Infrared Detectors, Infrared Lens, infrared filter and exploring electrode; 25 electrodes are arranged evenly according to the center of circle and inside and outside toroidal; The installation of infrared filter adopts method that can be flexible, by Infrared Lens and infrared filter and combination sensor shell, forms a seal cavity,
An inflator pump and vent valve are installed in Infrared Lens top, and infrared filter relies on sealing rubber ring and the combination sensor body seal of infrared filter outer ring, but infrared filter can be free to slide; In infrared filter outer ring, there is a spring, while carrying out impedance imaging test, open vent valve, under spring action, infrared filter indentation combination sensor shell, the electrode on infrared filter does not contact skin; While carrying out impedance spectrum, partial pressure of oxygen test, close vent valve, open inflator pump, infrared filter stretches out combination sensor shell, the electrode contact skin on infrared filter; The installation site of Infrared Lens and Infrared Detectors guarantees skin blur-free imaging on Infrared Detectors that electrode cathode contacts;
Measurement receives comprehensive data analysis system command with the microprocessor in data handling system, control related sensor and measure and gather measurement parameter: by gating circuit, the gating of electrode is measured respectively parameter and the parameter distribution of impedance spectrum, impedance imaging, partial pressure of oxygen, by infrared survey mode, measure temperature and Temperature Distribution, measurement is measured and is gathered by measuring with data handling system, and comprehensive data analysis system is carried out data analysis.
7. the method for testing of the distributed multi parameter tester of meridian point as claimed in claim 6, is characterized in that: the control flow of the microprocessor in described measurement and data handling system:
Start, the first step, receives comprehensive data analysis system command; Second step, does judgement require to measure Temperature Distribution? no, enter the 6th step, be that the 3rd step, receives infrared driving and data acquisition circuit data; The 4th step, computation of table lookup Temperature Distribution; The 5th step, uploads to comprehensive data analysis system by temperature profile data, returns to the first step; The 6th step, does judgement require to measure impedance imaging? no, enter the 11 step, be, the 7th step, controls vent valve venting, the 8th step, to impedance imaging measuring circuit, send measuring command, the 9th step, the measurement data of collection impedance imaging measuring circuit, the tenth step, impedance measurement data are sent to comprehensive data analysis system, return to the first step; The 11 step, does judgement require to measure impedance spectrum? no, enter the 13 step, be, the 12 step, operation impedance spectrum is measured subprogram, returns to the first step; The 13 step, does judgement require to measure partial pressure of oxygen? no, return to the first step, be, the 14 step, partial pressure of oxygen is measured subprogram, returns to the first step, and circulation comes and goes.
8. the method for testing of the distributed multi parameter tester of meridian point as claimed in claim 6, is characterized in that: the impedance spectrum measurement procedure in described measurement and data handling system:
Start, the first step, controls inflator pump inflation, second step, i=1, j=1, the 3rd step, the i electrode cathode of control gating circuit Selection and Constitute sensors A, control the j electrode cathode of gating circuit Selection and Constitute sensor B, f=0, the 4th step, arranges frequency f, the 5th step, reads real part, imaginary part, and deposit real part, imaginary part and corresponding electrode pair, measuring frequency f in data base, the 6th step, judgement f < 100? be, the stepping of f=f+100 hertz, return to the 4th step, no, the 7th step, judgement 100≤f < 1000, be, the stepping of f=f+1000 hertz, return to the 4th step, no, the 8th step, judgement 1000≤f < 10K, be, the stepping of f=f+10K hertz, return to the 4th step, no, the 9th step, the stepping of f=f+100K hertz, the tenth step, judgement f > 1000K? no, return to the 4th step, be, the 11 step, j=j+1, the 12 step, judgement j > 25? no, return to the 3rd step, be, the 13 step, j=1, i=i+1, the 14 step, judgement i > 25?, no, return to the 3rd step, be that the 15 step, gives comprehensive data analysis system by data, finishes,
Partial pressure of oxygen measurement procedure:
Start, the first step, controls charge valve inflation, second step, i=1, the 3rd step, the negative electrode of control gating circuit Selection and Constitute sensor i electrode and anodic bonding are to partial pressure of oxygen measuring circuit, and the 4th step, gathers partial pressure of oxygen measuring circuit output voltage, the 5th step, computation of table lookup oxygen partial pressure value, the 6th step, i=i+1, the 7th step judgement i > 25?, no, return to the 3rd step, be, finish.
9. the method for testing of the distributed multi parameter tester of meridian point as claimed in claim 6, is characterized in that: in described impedance imaging measuring circuit, and DSP CONTROL flow process:
Start K=10, M=K+2, N=k+3, the first step: control 16 and select 1 circuit gating K, K+1 electrode is inputted as sinusoidal signal, second step: control 16 and select 1 circuit gating M, N electrode is connected to the analog digital conversion interface of digital signal processing chip as measurement output electrode, by analog digital conversion interface, gather the voltage signal between M, N electrode, the 3rd step, N=N+1, the 4th step, judgement N > 25? no, enter two steps, be, the 5th step: N=N-25+9, the 6th step, : judgement N=K? no, enter two steps, be, the 7th step: M=M+1, the 8th step, judgement M > 25? no, enter two steps, be, the 9th step, M=M-25+9, the tenth step, judgement M=K? no, enter two steps, be, the 11 step, K=K+1, the 12 step, judgement K=26? no, return to the first step, be, the 13 step, according to measurement data, set up and solve relevant Maxwell equation, computing impedance imaging parameters, the 14 step, impedance imaging data are sent to microprocessor, finish,
No-refrigeration infrared focal plane detector flow process: the first step, output drives sequential; Second step, reads in no-refrigeration infrared focal plane detector image signal; The 3rd step, image rectification; The 4th step, the data after correction flow to digital signal processor, and the 5th step, returns to second step, moves in circles;
The method for correcting image of no-refrigeration infrared focal plane detector comprises experiment test image correction parameters and image rectification two parts:
Experiment test image correction parameters: 0,1,2,3 ... under 60 degrees Celsius of environment, measure respectively photographic subjects and be the target of 0 degree Celsius and 60 degrees Celsius, by ambient temperature x degree Celsius, i at 0 degree Celsius of photographic subjects temperature is capable, the measurement value of j row is labeled as X0ij (x), by ambient temperature x degree Celsius, the i at 60 degrees Celsius of photographic subjects temperature is capable, and the measurement value of j row is labeled as Xhij (x); At x degree Celsius of computing environment temperature: Gij (x)=255/ (Xhij (x)-X0ij (x)), Qij (x)=-Gij (x) X0ij (x); Obtain Gij (x), Qij (x) is that under ambient temperature x degree Celsius, i is capable, the correction parameter of j row;
Method for correcting image: the first step, from digital temperature sensor, read ambient temperature, second step, according to ambient temperature, reads correction parameter, and it is capable that i is calculated under x degree Celsius of ambient temperature in design, and the correction parameter of j row is respectively Gij (x), Qij (x); The 3rd step, reads no-refrigeration infrared focal plane detector image signal, establishes the i reading capable, and the data of j row are Dij; The 4th step, correction data=Gij (x) Dij+Qij (x).
10. the method for testing of the distributed multi parameter tester of meridian point as claimed in claim 6, is characterized in that: described comprehensive data analysis system program:
Start, State selective measurements parameter, sends measuring command to microprocessor; Receive microprocessor measurement data, show and storage of measurement data, measurement data is carried out to analytical calculation, finish.
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