CN103728161A - Spectroscopic analysis-based sulfur hexafluoride gas sampling device - Google Patents
Spectroscopic analysis-based sulfur hexafluoride gas sampling device Download PDFInfo
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- CN103728161A CN103728161A CN201410001815.1A CN201410001815A CN103728161A CN 103728161 A CN103728161 A CN 103728161A CN 201410001815 A CN201410001815 A CN 201410001815A CN 103728161 A CN103728161 A CN 103728161A
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Abstract
The invention discloses a spectroscopic analysis-based sulfur hexafluoride gas sampling device, which comprises a first filter lens, a second filter lens and a sampling chamber, wherein the first filter lens and the second filter lens are connected with a light incidence surface and a light emergence surface of the sampling chamber, respectively; a gas inlet close to the first filter lens is formed in the top of the sampling chamber and internally provided with a filter and a filter screen, the filter screen is obliquely arranged above the filter, the oblique angle between the surface of the filter screen and a horizontal plane ranges from 15 degrees to 45 degrees; a gas outlet close to the second filter lens is formed in the bottom of the sampling chamber and connected with a gas containing bag; a reflection barrier coating is arranged on the surface of the inner cavity wall of the sampling chamber. The spectroscopic analysis-based sulfur hexafluoride gas sampling device is small in sampling quantity, capable of effectively isolating interference light, high in analysis precision, and flexible in operation.
Description
Technical field
The present invention relates to gas sampling device, relate in particular to a kind of sulfur hexafluoride gas sampling device based on spectral analysis.
Background technology
Conventionally support the use at present two class devices and dusty gas analyser both at home and abroad State of Air pollution is carried out to overall monitor: a class is and the matching used sampler of open light path face source emission gas analyzer, this kind of sampler do not collected dusty gas, but at dusty gas region division light source R-T unit, directly utilize the passage that dusty gas region forms to analyze the spectrum of dusty gas composition formation wherein, determine the composition of dusty gas, but this sampler exists sampling arbitrarily, sample the defects such as unstable and inaccurate, measurement and analysis precision have been had a strong impact on, another kind ofly be and the matching used sealed type sampling device of gas composition analyser, this kind of sampler exist sampling amount large, can not effectively isolate defects such as disturbing light, for Petrochemical Area, bulky refuse, process the monitoring in the uncontrollable discharge sources such as field, large-scale plant and petroleum gas storage and transport station and loss source, flexibility of operation is poor, can not meet the demand of procedure operation.
In addition, for above-mentioned the second sealed type sampling device, this kind of sampler is to take full advantage of the infrared light that light source sends, and improved to a certain extent measuring accuracy, but is easily subject to the interference of dust and steam.More seriously, dust or steam can not be completely evenly in the absorption of sampling hut's inwall, make like this reflection paths of the infrared light of different passages can not be identical, like this, the infrared light variation of the different passages that caused by dust or Vapor adsorption is just difficult to be consistent, therefore from principle, adopt the gas sample chamber of reflectivity inwall to be difficult to suppress completely dust or the harmful effect of steam to measurement result.
Summary of the invention
The technical problem to be solved in the present invention is, large for gas sampling device sampling amount in prior art, can not effectively isolate above-mentioned defects such as disturbing the low and malfunction of light, analysis precision, provide a kind of sampling amount little, can effectively isolate the sulfur hexafluoride gas sampling device based on spectral analysis that disturbs the high and flexible operation of light, analysis precision.
The technical scheme that the present invention solves the problems of the technologies described above is:
1. the sulfur hexafluoride gas sampling device based on spectral analysis, is mainly comprised of sampling hut, the first filter glass, second filter glass the first silica gel ring, the second silica gel ring, air intake opening, filter screen, filtrator, gas outlet and gas collecting bag:
Described sampling hut is the air chamber of a casting, and preferably stainless steel material is made, and it is provided with and hinders reflectance coating, light entrance face and light-emitting face; Top, sampling hut is provided with air intake opening near the first filter glass, is provided with filtrator and is inclined at the filter screen of filtrator top in air intake opening; Bottom, sampling hut is provided with gas outlet near the second filter glass, and gas outlet is connected with gas collecting bag;
Described the first filter glass is connected with the light entrance face of described sampling hut by the first silica gel ring;
Described the second filter glass is connected with the light-emitting face of described sampling hut by the second silica gel ring;
Internal chamber wall surface, described sampling hut is provided with obstruction reflectance coating.
Above-mentioned filtrator is silit filtrator, and the angular range at the pitch angle between screen surface and surface level that its top arranges is 15 °～45 °.
Above-mentioned obstruction reflectance coating is the coating of being made by silicon, germanium or zinc selenide.
Feature of the present invention:
1. the first filter glass of the present invention is connected with light-emitting face with the light entrance face of sampling hut respectively with the second filter glass, such design has realized the sealing assembling between the first filter glass and the second filter glass and sampling hut, can effectively isolate interference light, fully guaranteed that sampling hut's inner Infrared formation spectrum is not subject to the impact of external interference light, thereby the accuracy that has guaranteed sampling output element spectrum reflection information, has greatly improved analysis precision.
2. sampling hut of the present invention is the air chamber of a casting, and can be according to the different volumes that need to set this sampling hut, such design has not only solved the large technical barrier that waits of sampling amount in prior art, has also greatly improved the flexibility of operation of described sampler.
3. the present invention is provided with filtrator and the filter screen being inclined at above filtrator in the air intake opening of top, sampling hut, and first, filter screen can filter the gas entering in sampling hut for the first time, and the sediments such as the large granular impurity being mingled with in gas are stopped; Secondly, filtrator can filter for the second time to the gas that filter for the first time through filter screen, further filters out graininess impurity in gas and moisture etc., and such being designed with is beneficial to the analysis precision that improves described sampler.
4. the gas outlet of bottom, sampling hut of the present invention is connected with gas collecting bag, and this gas collecting bag, for collecting the gas of discharging from gas outlet, is avoided environment.
5. internal chamber wall surface, sampling hut of the present invention is provided with obstruction reflectance coating, the reflectivity that enters the infrared light in sampling hut can reduce greatly, even can approach zero, like this in total incident light, catoptrical variation just reduces greatly on the impact of total incident light, dust or steam just can be reduced within the scope of acceptable the impact of analysis precision, thereby improved the ability that the anti-dust of described sampler or steam disturb, further improved the measurement of described sampler or the accuracy of analytical structure.
6. filtrator of the present invention is silit filtrator.Silit filtrator can effectively filter out moisture excessive in gas and graininess impurity.
7. sampler sampling amount of the present invention is little, can effectively isolate interference light, and analysis precision is high, and flexible operation.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the invention will be further described, in accompanying drawing:
Fig. 1 is the structural representation that the present invention is based on the sulfur hexafluoride gas sampling device of spectral analysis;
In figure, 1 is sampling hut, and 2 is the first filter glass, and 3 is the second filter glass, and 4 is the first silica gel ring, and 5 is the second silica gel ring, and 6 is air intake opening, and 7 is filter screen, and 8 is filtrator, and 9 is gas outlet, and 10 is gas collecting bag, and 11 for hindering reflectance coating.
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, the invention will be further described.
The present invention is based on spectral analysis sulfur hexafluoride gas sampling device preferred embodiment structure as shown in Figure 1,
Based on a sulfur hexafluoride gas sampling device for spectral analysis, by sampling hut 1, the first filter glass 2, the second filter glass 3 first silica gel rings 4, the second silica gel ring 5, air intake opening 6, filter screen 7, filtrator 8, gas outlet 9 and gas collecting bag 10, formed.
Described sampling hut 1 is the air chamber of a casting, and preferably stainless steel material is made, and volume is 40ml, and it is provided with and hinders reflectance coating 11, light entrance face 12 and light-emitting face 13; 1 top, sampling hut is provided with air intake opening 6 near the first filter glass 2, is provided with filtrator 8 and is inclined at the filter screen 7 of filtrator 8 tops in air intake opening 6; 1 bottom, sampling hut is provided with gas outlet 9 near the second filter glass 3, and gas outlet 9 is connected with gas collecting bag 10.
Described the first filter glass 2 is connected with the light entrance face 12 of described sampling hut 1 by the first silica gel ring 4.
Described the second filter glass 3 is connected with the light-emitting face 13 of described sampling hut 1 by the second silica gel ring 5.
1 internal chamber wall surface, described sampling hut is provided with and hinders reflectance coating 11.
Described filtrator 8 is silit filtrator, and the angular range at the pitch angle between filter screen 7 surfaces and surface level that its top arranges is 15 °～45 °.
The coating of described obstruction reflectance coating 11 for being made by silicon, germanium or zinc selenide.
It should be noted that for those of ordinary skills, can be improved according to the above description or convert, and all these improvement and conversion all should belong to the protection domain of the claims in the present invention.
Claims (3)
1. the sulfur hexafluoride gas sampling device based on spectral analysis, it is characterized in that, mainly by sampling hut, the first filter glass, the second filter glass, the first silica gel ring, the second silica gel ring, air intake opening, filter screen, filtrator, gas outlet and gas collecting bag, formed:
Described sampling hut is the air chamber of a casting, and it is provided with and hinders reflectance coating, light entrance face and light-emitting face; Top, sampling hut is provided with air intake opening near the first filter glass, is provided with filtrator and is inclined at the filter screen of filtrator top in air intake opening; Bottom, sampling hut is provided with gas outlet near the second filter glass, and gas outlet is connected with gas collecting bag;
Described the first filter glass is connected with the light entrance face of described sampling hut by the first silica gel ring;
Described the second filter glass is connected with the light-emitting face of described sampling hut by the second silica gel ring;
Internal chamber wall surface, described sampling hut is provided with obstruction reflectance coating.
2. the sulfur hexafluoride gas sampling device based on spectral analysis according to claim 1, is characterized in that, described filtrator is silit filtrator, and the angular range at the pitch angle between screen surface and surface level that its top arranges is 15 °～45 °.
3. the sulfur hexafluoride gas sampling device based on spectral analysis according to claim 1, is characterized in that, described obstruction reflectance coating is the coating of being made by silicon, germanium or zinc selenide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410001815.1A CN103728161A (en) | 2014-01-03 | 2014-01-03 | Spectroscopic analysis-based sulfur hexafluoride gas sampling device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410001815.1A CN103728161A (en) | 2014-01-03 | 2014-01-03 | Spectroscopic analysis-based sulfur hexafluoride gas sampling device |
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| CN103728161A true CN103728161A (en) | 2014-04-16 |
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| CN201410001815.1A Pending CN103728161A (en) | 2014-01-03 | 2014-01-03 | Spectroscopic analysis-based sulfur hexafluoride gas sampling device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109115716A (en) * | 2018-07-12 | 2019-01-01 | 镇江市爱威尔电子有限公司 | A kind of Multifunction infrared gas sensor |
| CN109238789A (en) * | 2018-10-19 | 2019-01-18 | 袁永华 | A kind of natural gas sampler and its sampling method |
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| CN200975958Y (en) * | 2006-09-26 | 2007-11-14 | 李明 | Gas sampling chamber |
| CN101131348A (en) * | 2006-08-25 | 2008-02-27 | 淄博惠杰电气技术开发有限公司 | SF6 gas measuring device |
| CN101514960A (en) * | 2009-03-23 | 2009-08-26 | 吉林市中准仪表开发有限责任公司 | SF* detecting system based on photoacoustic spectroscopic technology |
| CN202582954U (en) * | 2012-03-14 | 2012-12-05 | 南京顺泰科技有限公司 | Infrared pollution gas sampling device |
| CN103076301A (en) * | 2013-01-15 | 2013-05-01 | 南京麟派电力工程有限公司 | Infrared-based SF6 (sulfur hexafluoride) gas decomposition product detecting device |
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2014
- 2014-01-03 CN CN201410001815.1A patent/CN103728161A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101131348A (en) * | 2006-08-25 | 2008-02-27 | 淄博惠杰电气技术开发有限公司 | SF6 gas measuring device |
| CN200975958Y (en) * | 2006-09-26 | 2007-11-14 | 李明 | Gas sampling chamber |
| CN101514960A (en) * | 2009-03-23 | 2009-08-26 | 吉林市中准仪表开发有限责任公司 | SF* detecting system based on photoacoustic spectroscopic technology |
| CN202582954U (en) * | 2012-03-14 | 2012-12-05 | 南京顺泰科技有限公司 | Infrared pollution gas sampling device |
| CN103076301A (en) * | 2013-01-15 | 2013-05-01 | 南京麟派电力工程有限公司 | Infrared-based SF6 (sulfur hexafluoride) gas decomposition product detecting device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109115716A (en) * | 2018-07-12 | 2019-01-01 | 镇江市爱威尔电子有限公司 | A kind of Multifunction infrared gas sensor |
| CN109238789A (en) * | 2018-10-19 | 2019-01-18 | 袁永华 | A kind of natural gas sampler and its sampling method |
| CN109238789B (en) * | 2018-10-19 | 2021-05-11 | 广州威品技术研发有限公司 | Natural gas sampling device and sampling method thereof |
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Application publication date: 20140416 |