CN103713201B - Distributed automatic compensation surface static potential test system - Google Patents
Distributed automatic compensation surface static potential test system Download PDFInfo
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- CN103713201B CN103713201B CN201310722033.2A CN201310722033A CN103713201B CN 103713201 B CN103713201 B CN 103713201B CN 201310722033 A CN201310722033 A CN 201310722033A CN 103713201 B CN103713201 B CN 103713201B
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Abstract
The invention discloses a distributed automatic compensation surface static potential test system and relates to the electrical variable measuring device technology field. The distributed automatic compensation surface static potential test system comprises a potential test compensation instrument which is used for acquiring the potential at a surface of a detected electrified body through an array parallel plate capacitor and is further used for carrying out automatic compensation for the potential at the surface of the detected electrified body through the array parallel plate capacitor after acquisition, a computer which is used for calculating potential data acquired by the potential test compensation instrument and downloading an instruction to the potential test compensation instrument to carry out automatic potential compensation, and a data interface circuit which is used for realizing data communication between the potential test compensation instrument and the computer. The potential test system solves a null shift problem and improves measuring precision of the static potential at a surface of a detected object.
Description
Technical field
The present invention relates to the measurement mechanism technical field of electric variable, relate in particular to a kind of potential test system of distributed auto-compensation surface electrostatic current potential.
Background technology
Non-contacting sensor has direct induction type, Spiralism type, variable displacement type, air ionization formula etc. in the world at present, but the overwhelming majority carries out " point " to measure, this is because sensor such as can not accomplish to interfere with each other between very little and sensor at the factor impact, causes being difficult to realize the measurement to conducting medium material face current potential.At present, having a kind of technology is single-sensor mechanical scanning method, although can realize the measurement of face, because the time of mechanical motion is longer, charge discharging resisting, causes measurement result to occur deviation.The measurement of medium face Potential distribution is the international headache facing at present, and a technical barrier of the contactless pot development of a long-term puzzlement is again that drift problem is difficult to solve.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of potential test system of distributed auto-compensation surface electrostatic current potential, and described potential test system has solved drift problem, has improved the degree of accuracy of potential measurement.
For solving the problems of the technologies described above, the technical solution used in the present invention is: a kind of potential test system of distributed auto-compensation surface electrostatic current potential, it is characterized in that comprising: the potential test compensation instrument that by array parallel plate capacitor, the current potential on tested electrified body surface is carried out auto-compensation after by array parallel plate capacitor, the current potential on tested electrified body surface being gathered and gathered, compensate instrument and carry out the computing machine of current potential auto-compensation to potential test for calculating potential data that potential test compensation instrument collects lower teletype command, and for realizing the data interface circuit that carries out data communication between potential test compensation instrument and computing machine.
Preferably, described potential test compensation instrument comprises the potential acquisition passage that some strip adoption parallel plate capacitors gather the current potential on tested electrified body surface; For receiving the current potential information of potential acquisition passage collection and this information being uploaded to computing machine, the single-chip microcomputer of the order output potential compensating signal then passing down according to computing machine; And the potential compensation signal that for receive single-chip microcomputer down pass corresponding with potential acquisition passage, then output electrical signals carries out the potential compensation passage of potential compensation to tested electrified body surface to parallel plate capacitor.
Preferably, every potential acquisition passage comprises parallel plate capacitor C1, program control test switch S 1, operational amplifier U1-U2, resistance R 1-R3 and A/D modular converter, one end ground connection of described capacitor C 1, the other end connects an input end of amplifier U1 through program control test switch S 1, another input end of amplifier U1 is connected with its output terminal, the output terminal of amplifier U1 connects the output terminal of amplifier U2 successively through resistance R 1 and resistance R 3, one termination power of resistance R 2, the other end of resistance R 2 is divided into two-way, the node of first via connecting resistance R1 and resistance R 3, the second tunnel connects an input end of amplifier U2, another input end grounding of amplifier U2, the input end of the output termination A/D modular converter of amplifier U2, the output terminal of A/D modular converter connects the input end of single-chip microcomputer, the control end of program control test switch S 1 connects an output terminal of single-chip microcomputer.
Preferably, every potential compensation passage comprises feedback potential compensation switch S 2, D/A modular converter, resistance R 4-R6 and amplifier U3, the input end of described D/A modular converter connects the output terminal of single-chip microcomputer, an output terminal of D/A modular converter connects the output terminal of amplifier U3 successively through resistance R 4 and resistance R 6, one termination power of resistance R 5, the other end of resistance R 5 is divided into two-way, the first via connects an input end of amplifier U3, the node of the second road connecting resistance R4 and resistance R 6, another input end grounding of amplifier U3, the output terminal of described amplifier U3 connects the ungrounded end of described capacitor C 1 through feedback potential compensation switch S 2, the control end of described feedback potential compensation switch S 2 connects an output terminal of single-chip microcomputer.
Preferably, described data interface circuit is serial port circuit or usb circuit.
Preferably, described potential acquisition passage is provided with 64, and described potential compensation passage is provided with 64.
The beneficial effect that adopts technique scheme to produce is: start before potential test, the program control test switches set of system and feedback potential compensation switches set are in off-state, array distribution parallel plate capacitor is in close tested electrified body process, and electric capacity produces induced potential.Computing machine sends program control test switches set closure after test instruction to single-chip microcomputer, by amplifier, the weak voltage signals of electric capacity is amplified to processing, can effectively reduce like this measured capacitance induced charge and release.
The weak voltage signals that array distribution capacitive sensing is produced, amplify from steady zero formula operational amplifier by copped wave, this amplifier requires to have extremely low input offset voltage, the temperature of offset voltage is floated with long time drift extremely low, very low input bias current, high open-loop gain, higher switching rate, unity gain bandwidth is large, when unity gain is up to standard, there is internal compensation, there is internal modulation compensating circuit, the release time can reduce overload time, only have atomic little copped wave spike leakage etc. at input end, output terminal.
Signal after amplification enters single-chip microcomputer inside through A/D modular converter, then carries out two-way communication by usb interface module and computing machine, and the data of collecting are carried out calculation process by computing machine, by the data storage of handling well.Single-chip microcomputer is opened program control test switches set, will feed back potential compensation switches set closure, then the current potential recording is applied to array distribution parallel plate capacitor two ends, and the electric weight leaking in measuring process is supplemented.Before measuring for the second time, first disconnect feedback potential compensation switches set, repeat for the first time all survey record processes.Described system has realized the array distributed measurement of tested electrified body, has solved contactless potentiometric drift problem, has improved the degree of accuracy of measuring.
Brief description of the drawings
Below in conjunction with the drawings and specific embodiments, the present invention is further detailed explanation.
Fig. 1 is system principle diagram of the present invention;
Fig. 2 is the schematic diagram of potential test compensation instrument in system of the present invention.
Embodiment
As shown in Figure 1, a kind of potential test system of distributed auto-compensation surface electrostatic current potential, comprising: potential test compensation instrument, computing machine and data interface circuit.After being gathered and gather the current potential on tested electrified body surface by array parallel plate capacitor, described potential test compensation instrument, by array parallel plate capacitor, the current potential on tested electrified body surface is carried out to auto-compensation.Described potential test compensation instrument comprises the potential acquisition passage that some strip adoption parallel plate capacitors gather the current potential on tested electrified body surface; For receiving the current potential information of potential acquisition passage collection and this information being uploaded to computing machine, the single-chip microcomputer of the order output potential compensating signal then passing down according to computing machine; And the potential compensation signal that for receive single-chip microcomputer down pass corresponding with potential acquisition passage, then output electrical signals carries out the potential compensation passage of potential compensation to tested electrified body surface to parallel plate capacitor.Described potential acquisition passage is provided with 64 in the present embodiment, and described potential compensation passage is provided with 64, and the number of acquisition channel and test channel also can arrange as required.
As shown in Figure 2, every potential acquisition passage comprises parallel plate capacitor C1, program control test switch S 1, operational amplifier U1-U2, resistance R 1-R3 and A/D modular converter, one end ground connection of described capacitor C 1, the other end connects an input end of amplifier U1 through program control test switch S 1, another input end of amplifier U1 is connected with its output terminal, the output terminal of amplifier U1 connects the output terminal of amplifier U2 successively through resistance R 1 and resistance R 3, one termination power of resistance R 2, the other end of resistance R 2 is divided into two-way, the node of first via connecting resistance R1 and resistance R 3, the second tunnel connects an input end of amplifier U2, another input end grounding of amplifier U2, the input end of the output termination A/D modular converter of amplifier U2, the output terminal of A/D modular converter connects the input end of single-chip microcomputer, the control end of program control test switch S 1 connects an output terminal of single-chip microcomputer.
As shown in Figure 2, every potential compensation passage comprises feedback potential compensation switch S 2, D/A modular converter, resistance R 4-R6 and amplifier U3, the input end of described D/A modular converter connects the output terminal of single-chip microcomputer, an output terminal of D/A modular converter connects the output terminal of amplifier U3 successively through resistance R 4 and resistance R 6, one termination power of resistance R 5, the other end of resistance R 5 is divided into two-way, the first via connects an input end of amplifier U3, the node of the second road connecting resistance R4 and resistance R 6, another input end grounding of amplifier U3, the output terminal of described amplifier U3 connects the ungrounded end of described capacitor C 1 through feedback potential compensation switch S 2, the control end of described feedback potential compensation switch S 2 connects an output terminal of single-chip microcomputer.
Described computing machine compensates instrument for the potential data that calculates potential test compensation instrument and collect lower teletype command to potential test and carries out current potential auto-compensation.Described data interface circuit is used for realizing between potential test compensation instrument and computing machine and carries out data communication, and described data interface circuit can use serial port circuit or usb circuit, and preferred the application uses USB interface, conveniently carries out the assembling of system.
Start before potential test, the program control test switches set of system and feedback potential compensation switches set are in off-state, and array distribution parallel plate capacitor is in close tested electrified body process, and electric capacity produces induced potential.Computing machine sends program control test switches set closure after test instruction to single-chip microcomputer, by amplifier, the weak voltage signals of electric capacity is amplified to processing, can effectively reduce like this measured capacitance induced charge and release.
The weak voltage signals that array distribution capacitive sensing is produced, amplify from steady zero formula operational amplifier by copped wave, this amplifier requires to have extremely low input offset voltage, the temperature of offset voltage is floated with long time drift extremely low, very low input bias current, high open-loop gain, higher switching rate, unity gain bandwidth is large, when unity gain is up to standard, there is internal compensation, there is internal modulation compensating circuit, the release time can reduce overload time, only have atomic little copped wave spike leakage etc. at input end, output terminal.
Signal after amplification enters single-chip microcomputer inside through A/D modular converter, then carries out two-way communication by usb interface module and computing machine, and the data of collecting are carried out calculation process by computing machine, by the data storage of handling well.Single-chip microcomputer is opened program control test switches set, will feed back potential compensation switches set closure, then the current potential recording is applied to array distribution parallel plate capacitor two ends, and the electric weight leaking in measuring process is supplemented.Before measuring for the second time, first disconnect feedback potential compensation switches set, repeat for the first time all survey record processes.Described system has realized the array distributed measurement of tested electrified body, has solved contactless potentiometric drift problem, has improved the degree of accuracy of measuring.
Applied specific case herein principle of the present invention and embodiment thereof are set forth, the explanation of above embodiment is just with helping understand method of the present invention and core concept thereof.It should be pointed out that for the person of ordinary skill of the art, can also carry out some improvement and modification to the present invention under the premise without departing from the principles of the invention, these improvement and modification also fall in the protection domain of the claims in the present invention.
Claims (4)
1. the potential test system of a distributed auto-compensation surface electrostatic current potential, it is characterized in that comprising: the potential test compensation instrument that by array parallel plate capacitor, the electrostatic potential on tested electrified body surface is carried out auto-compensation after by array parallel plate capacitor, the electrostatic potential on tested electrified body surface being gathered and gathered, compensate instrument and carry out the computing machine of current potential auto-compensation to potential test for calculating electrostatic potential data that potential test compensation instrument collects lower teletype command, and for realizing the data interface circuit that carries out data communication between potential test compensation instrument and computing machine, described potential test compensation instrument comprises the potential acquisition passage that some strip adoption parallel plate capacitors gather the electrostatic potential on tested electrified body surface, for receiving the electrostatic potential information of potential acquisition passage collection and this information being uploaded to computing machine, the single-chip microcomputer of the order output potential compensating signal then passing down according to computing machine, and the potential compensation signal that for receive single-chip microcomputer down pass corresponding with potential acquisition passage, then output electrical signals carries out the potential compensation passage of potential compensation to tested electrified body surface to parallel plate capacitor, every potential acquisition passage comprises parallel plate capacitor C1, program control test switch S 1, operational amplifier U1-U2, resistance R 1-R3 and A/D modular converter, one end ground connection of described capacitor C 1, the other end connects an input end of amplifier U1 through program control test switch S 1, another input end of amplifier U1 is connected with its output terminal, the output terminal of amplifier U1 connects the output terminal of amplifier U2 successively through resistance R 1 and resistance R 3, one termination power of resistance R 2, the other end of resistance R 2 is divided into two-way, the node of first via connecting resistance R1 and resistance R 3, the second tunnel connects an input end of amplifier U2, another input end grounding of amplifier U2, the input end of the output termination A/D modular converter of amplifier U2, the output terminal of A/D modular converter connects the input end of single-chip microcomputer, the control end of program control test switch S 1 connects an output terminal of single-chip microcomputer.
2. the potential test system of distributed auto-compensation surface electrostatic current potential according to claim 1, it is characterized in that: every potential compensation passage comprises feedback potential compensation switch S 2, D/A modular converter, resistance R 4-R6 and amplifier U3, the input end of described D/A modular converter connects the output terminal of single-chip microcomputer, an output terminal of D/A modular converter connects the output terminal of amplifier U3 successively through resistance R 4 and resistance R 6, one termination power of resistance R 5, the other end of resistance R 5 is divided into two-way, the first via connects an input end of amplifier U3, the node of the second road connecting resistance R4 and resistance R 6, another input end grounding of amplifier U3, the output terminal of described amplifier U3 connects the ungrounded end of described capacitor C 1 through feedback potential compensation switch S 2, the control end of described feedback potential compensation switch S 2 connects an output terminal of single-chip microcomputer.
3. the potential test system of distributed auto-compensation surface electrostatic current potential according to claim 1, is characterized in that: described data interface circuit is serial port circuit or usb circuit.
4. the potential test system of distributed auto-compensation surface electrostatic current potential according to claim 1, is characterized in that: described potential acquisition passage is provided with 64, and described potential compensation passage is provided with 64.
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| CN201310722033.2A CN103713201B (en) | 2013-12-24 | 2013-12-24 | Distributed automatic compensation surface static potential test system |
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| CN201310722033.2A CN103713201B (en) | 2013-12-24 | 2013-12-24 | Distributed automatic compensation surface static potential test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI601962B (en) * | 2016-12-21 | 2017-10-11 | 財團法人工業技術研究院 | Static electricity detecting system and method |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI645200B (en) * | 2018-01-04 | 2018-12-21 | 國立彰化師範大學 | Non-contact static electricity measuring device |
| CN114137325B (en) * | 2021-11-30 | 2022-09-27 | 中国人民解放军陆军工程大学 | Bionic circuit, system and method for non-contact electrostatic potential distribution test |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1019526B (en) * | 1990-03-23 | 1992-12-16 | 中国人民解放军军械工程学院 | Electrastatic dynamic potential measuring device |
| JP2007047015A (en) * | 2005-08-10 | 2007-02-22 | Hugle Electronics Inc | Device for measuring static electricity, and surface potential sensor |
| WO2012043443A1 (en) * | 2010-09-28 | 2012-04-05 | 株式会社フジクラ | Capacitance sensor and method for determining failure of capacitance sensor |
| CN202066903U (en) * | 2011-05-16 | 2011-12-07 | 华南理工大学 | Intelligent device suitable for static dynamic potential real-time test |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| TWI601962B (en) * | 2016-12-21 | 2017-10-11 | 財團法人工業技術研究院 | Static electricity detecting system and method |
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