CN103686783B - Pilot frequency RSTD measuring method and device - Google Patents

Pilot frequency RSTD measuring method and device Download PDF

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CN103686783B
CN103686783B CN201210351686.XA CN201210351686A CN103686783B CN 103686783 B CN103686783 B CN 103686783B CN 201210351686 A CN201210351686 A CN 201210351686A CN 103686783 B CN103686783 B CN 103686783B
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subframe
parameter
frame
initial
sub
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CN103686783A (en
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周晗
冯淑兰
刘劲楠
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Ruide Yinfang (Nantong) Information Technology Co., Ltd
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Huawei Technologies Co Ltd
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Abstract

The embodiment of the invention discloses a pilot frequency RSTD measuring method and device. The method comprises the steps that a parameter of a first sub frame configured for a reference signal is acquired, and a parameter of a second sub frame configured for UE for pilot frequency RSTD measuring is acquired; according to the parameter of the first sub frame and the parameter of the second sub frame, the number of overlap sub frames between the first sub frame and the second sub frame is determined; and when the number of the overlap sub frames is greater than a first threshold value, pilot frequency RSTD measuring is executed. According to the embodiment of the invention, before pilot frequency RSTD measuring is executed, the number of the overlap sub frames between the first sub frame and the second sub frame is determined; when the number of the overlap sub frames exceeds the first threshold value which meets the performance of pilot frequency RSTD measuring, pilot frequency RSTD measuring is executed; the success of pilot frequency RSTD measuring is ensured; the accuracy of pilot frequency RSTD measuring is improved; and a processing resource assigned by UE for pilot frequency RSTD measuring is effectively used.

Description

Alien frequencies rstd measuring method and device
Technical field
The present invention relates to communication technical field, more particularly to inter-frequency reference signal time difference (rstd, Referencesignal time difference) measuring method and device.
Background technology
Using detection reaching time-difference (otdoa, observed time difference of arrival) positioning side When method is positioned to user equipment (ue, user equipment), need to realize by measuring rstd.
In prior art, when carrying out rstd measurement, using one of multiple neighbor cells of ue neighbor cell as reference Cell, the transmission time of the signal arrival ue being sent except other neighbor cells of reference cell by ue measurement is sent with reference cell Signal reach ue transmission time time difference, the signal that above-mentioned neighbor cell sends is commonly referred to location reference signals (prs, positioning reference signals).Wherein, if the neighbor cell of ue is the different of the current service cell of ue Frequency cell, then need to carry out rstd measurement in the space (gap) specified by the current service cell of ue, for convenience of description will be upper Rstd measurement in the case of stating is referred to as alien frequencies rstd measurement.Neighbor cell due to ue sends shared time-domain resource during prs Generally not exclusively overlapping with the time-domain resource shared by the gap specified by the current service cell of ue, for example, the neighbor cell of ue The prs sending takies the 0th to 5 subframe in time-domain resource, and the gap specified by the current service cell of ue takies time-domain resource 4th to 9 subframe, then what the two was overlapping is the 4th and the 5th subframe, and that is, ue can only be entered using above-mentioned the 4th and the 5th overlapping subframe Row alien frequencies rstd measures.
From the foregoing, it will be observed that adopting alien frequencies rstd measuring method of the prior art, when the time-domain resource that gap takies is accounted for prs With number of sub frames overlapping between time-domain resource less when it may appear that alien frequencies rstd measurement unsuccessful or do not reach certainty of measurement will Situation about asking, thus waste the process resource of ue.
Content of the invention
Provide alien frequencies rstd measuring method and device in the embodiment of the present invention, surveyed with solving alien frequencies rstd in prior art Amount is inaccurate, easily wastes the problem of ue process resource.
In order to solve above-mentioned technical problem, the embodiment of the invention discloses following technical scheme:
On the one hand, provide a kind of alien frequencies rstd measuring method, methods described includes: is retrieved as the first of reference signal configuration The parameter of subframe, and it is retrieved as the parameter of second subframe for alien frequencies rstd measurement of ue configuration;According to the described first son The number of the overlap sub-frame between the first subframe and the second subframe described in the parameter determination of the parameter of frame and the second subframe;When described When the number of overlap sub-frame is more than the first threshold value, execution described alien frequencies rstd measurement.
On the one hand in conjunction with, in the first possible implementation, described be retrieved as ue configuration for rstd measurement The parameter of the first subframe includes: obtain the initial time of described the first subframe for reference signal configuration, described first subframe Initial time includes the initial frame number of described first subframe and the initial subframe number of described first subframe;Obtain described the of configuration The number of sub frames of one subframe.
In conjunction with the first possible implementation, in the possible implementation of second, described first subframe is described Reference signal sends the subframe of time period occupancy;When the described number when described overlap sub-frame is more than the first threshold value, execute institute State alien frequencies rstd measurement, specifically include: when the number of described overlap sub-frame is more than the first threshold value, in FDD fdd mould Described alien frequencies rstd measurement is executed under formula;Or,
Described first subframe is the subframe that described reference signal sends first reference signal blocks in the time period;Described work as institute When the number stating overlap sub-frame is more than the first threshold value, execution described alien frequencies rstd measurement, specifically include: when described overlap sub-frame Number when being more than the first threshold value, execute described alien frequencies rstd measurement under time division duplex tdd pattern.
In conjunction with the first possible implementation, or the implementation that second is possible, in the third possible realization In mode, described the second subframe being retrieved as reference signal configuration includes: obtains described surveying for alien frequencies rstd for ue configuration The initial time of the second subframe of amount, the initial time of described second subframe includes the initial frame number of described second subframe and described The initial subframe number of the second subframe;Obtain the number of sub frames of described second subframe of configuration.
In conjunction with the third possible implementation, in the 4th kind of possible implementation, described sub according to described first The number of the overlap sub-frame between the first subframe and the second subframe described in the parameter determination of the parameter of frame and the second subframe, comprising: Calculate the initial frame number of described second subframe and the product of every frame length and the initial subframe number of described second subframe and, as First parameter;Calculate the initial subframe number of the initial frame number of described first subframe and the product of every frame length and described first subframe Sum, as the second parameter;When described first parameter is not less than described second parameter, determine the number of described overlap sub-frame Difference with described first parameter after being added with the number of sub frames of described first subframe for: described second parameter;When the described first ginseng When number is less than described second parameter, determine that the number of described overlap sub-frame is: the son of described first parameter and described second subframe Difference with described second parameter after frame number addition, and the smaller value between the number of sub frames of described first subframe.
In conjunction with the possible implementation of second, or the third possible implementation, or the 4th kind of possible realization side Formula, in the 5th kind of possible implementation, before the described parameter of the first subframe being retrieved as reference signal configuration, described side Method also includes: arrange described first threshold value, described first threshold value be described first subframe number of sub frames with pre-set Meet the smaller value between the minimum number of sub frames of the first subframe of described alien frequencies rstd measurement.
On the other hand, a kind of alien frequencies rstd measurement apparatus are provided, described device includes: acquiring unit, it is used for being retrieved as joining Examine the parameter of the first subframe of signal configuration, and the ginseng being retrieved as second subframe for alien frequencies rstd measurement of ue configuration Number;Determining unit, for described in the parameter of the first subframe that obtained according to described acquiring unit and the parameter determination of the second subframe The number of the overlap sub-frame between the first subframe and the second subframe;Measuring unit, for the overlap determining when described determining unit When the number of subframe is more than the first threshold value, execution described alien frequencies rstd measurement.
In conjunction with the other hand, in the first possible implementation, described acquiring unit includes: the first subframe parameter obtains Take subelement, for obtaining the initial time of described the first subframe for reference signal configuration, described first subframe initial when Between include the initial frame number of described first subframe and the initial subframe number of described first subframe, and obtain configuration described first The number of sub frames of subframe;Second subframe parameter acquiring subelement, for obtaining described measuring for alien frequencies rstd for ue configuration The initial time of the second subframe, the initial time of described second subframe includes the initial frame number and described second of described second subframe The initial subframe number of subframe, and obtain the number of sub frames of described second subframe of configuration.
In conjunction with the first possible implementation, in the possible implementation of second, described determining unit includes: ginseng Number computation subunit, for calculating the initial frame number of described second subframe and the product of every frame length and rising of described second subframe The sum of beginning subframe numbers, as the first parameter, and calculates the initial frame number of described first subframe and the product of every frame length and institute State the sum of the initial subframe number of the first subframe, as the second parameter;Overlap sub-frame number determination subelement, for when described parameter When the first parameter that computation subunit calculates is not less than described second parameter, determine that the number of described overlap sub-frame is: described the Two parameters be added with the number of sub frames of described first subframe after difference with described first parameter;When described parameter computation unit meter When the first parameter calculated is less than described second parameter, determine that the number of described overlap sub-frame is: described first parameter and described the Difference with described second parameter after the number of sub frames addition of two subframes, and less between the number of sub frames of described first subframe Value.
In conjunction with the first possible implementation, or the implementation that second is possible, in the third possible realization side In formula, described device also includes: arranging unit, for being retrieved as the first subframe of reference signal configuration in described acquiring unit Before parameter, arrange described first threshold value, described first threshold value be described first subframe number of sub frames with pre-set Meet the smaller value between the minimum number of sub frames of the first subframe of described alien frequencies rstd measurement.
In the embodiment of the present invention when carrying out alien frequencies rstd measurement, it is retrieved as the ginseng of the first subframe of reference signal configuration Number, and it is retrieved as the parameter of second subframe for alien frequencies rstd measurement of ue configuration, the parameter according to the first subframe and the The number of the overlap sub-frame between parameter determination first subframe of two subframes and the second subframe, when the number of described overlap sub-frame is big When the first threshold value, execution described alien frequencies rstd measurement.Due to first before execution alien frequencies rstd measurement in the embodiment of the present invention First determine the number of the overlap sub-frame between the first subframe and the second subframe, meet alien frequencies when the number of overlap sub-frame has exceeded During the first threshold value of rstd measurement performance, just execution alien frequencies rstd measurement, thereby may be ensured that the success of alien frequencies rstd measurement, Improve the precision of alien frequencies rstd measurement, effectively utilizes ue are the distributed process resource of alien frequencies rstd measurement.
Brief description
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing Have technology description in required use accompanying drawing be briefly described it should be apparent that, for those of ordinary skill in the art Speech, without having to pay creative labor, can also obtain other accompanying drawings according to these accompanying drawings.
Fig. 1 a is an embodiment block diagram of alien frequencies rstd measuring method of the present invention;
Fig. 1 b is overlapping between a kind of first subframe and the second subframe schematic diagram in Fig. 1 a;
Fig. 2 a is another embodiment block diagram of alien frequencies rstd measuring method of the present invention;
Fig. 2 b is a kind of schematic diagram of overlap sub-frame under fdd pattern in Fig. 2 a;
Fig. 2 c is the schematic diagram of another kind of overlap sub-frame under fdd pattern in Fig. 2 a;
Fig. 2 d is a kind of schematic diagram of overlap sub-frame under tdd pattern in Fig. 2 a;
Fig. 2 e is the schematic diagram of another kind of overlap sub-frame under tdd pattern in Fig. 2 a;
Fig. 3 a is the embodiment block diagram of alien frequencies rstd measurement apparatus of the present invention;
Fig. 3 b is the embodiment block diagram of acquiring unit in Fig. 3 a;
Fig. 3 c is the embodiment block diagram of determining unit in Fig. 3 a.
Specific embodiment
Following examples of the present invention provide alien frequencies rstd measuring method and device.
In order that those skilled in the art more fully understand the technical scheme in the embodiment of the present invention, and make the present invention real Apply the above-mentioned purpose of example, feature and advantage can become apparent from understandable, below in conjunction with the accompanying drawings to technical side in the embodiment of the present invention Case is described in further detail.
Referring to Fig. 1 a, it is the first embodiment flow chart of alien frequencies rstd measuring method of the present invention:
Step 101: be retrieved as the parameter of the first subframe of reference signal configuration, and be retrieved as ue configuration for alien frequencies The parameter of the second subframe of rstd measurement.
In the present embodiment, reference signal can be specially cell special reference signal (crs, cell Specificreference signal) or location reference signals (prs, position reference signal), this Bright embodiment is follow-up to be all described with reference signal for prs for convenience, then sub for the first of prs configuration accordingly Frame can be specially prs subframe;For the second subframe of alien frequencies rstd measurement, the service that can be specially ue in prior art is little The gap(space that area configures for ue) subframe.
Wherein, obtain the first subframe parameter can include being retrieved as the first subframe of reference signal configuration initial when Between, the initial time of described first subframe includes the initial frame number of described first subframe and the initial subframe of described first subframe Number, and the number of sub frames obtaining described first subframe of configuration;The parameter obtaining the second subframe can include being retrieved as ue configuration The second subframe for alien frequencies rstd measurement initial time, the initial time of described second subframe includes described second subframe Initial frame number and described second subframe initial subframe number, and obtain configuration described second subframe number of sub frames.Generally In communication system, every ten subframes constitute a frame (alternatively referred to as system-frame or radio frames), the first subframe in the present embodiment Initial frame number refers to the frame number of first subframe place frame in the first subframe, and the initial subframe number of the first subframe refers in the first subframe First subframe subframe numbers in this first subframe place frame;In the same manner, the initial frame number of the second subframe refers in the second subframe First subframe place frame frame number, the initial subframe number of the second subframe refers in the second subframe first subframe at this first Subframe numbers in the frame of subframe place.
Step 102: between parameter according to the first subframe and parameter determination first subframe of the second subframe and the second subframe Overlap sub-frame number.
Specifically, the initial frame number of described second subframe and the product of every frame length and described second subframe can be calculated The sum of initial subframe number, as the first parameter, the i.e. product+the second of the every frame length of initial frame number * of the first parameter=the second subframe The initial subframe number of subframe;And calculate the initial frame number of described first subframe and the product of every frame length and described first subframe Initial subframe number sum, as the second parameter, the i.e. product+the of the every frame length of initial frame number * of the second parameter=the first subframe The initial subframe number of one subframe.
When described first parameter is not less than described second parameter, when described first parameter is not less than described second parameter When, determine that the number of described overlap sub-frame is with described first after described second parameter is added with the number of sub frames of described first subframe The difference of parameter, i.e. the number of sub frames of the number of overlap sub-frame=described second parameter+described first subframe-described first parameter Difference;When described first parameter be less than described second parameter when, determine described overlap sub-frame number be described first parameter with Difference with described second parameter after the number of sub frames addition of described second subframe, and between the number of sub frames of described first subframe Smaller value, i.e. number=min (number of sub frames of described first parameter+described second subframe-described second parameter, the institute of overlap sub-frame State the number of sub frames of the first subframe).
Referring to Fig. 1 b, it is overlapping schematic diagram between a kind of first subframe and the second subframe: in Fig. 1 b, show one Frame, this frame comprises ten subframes it is assumed that the first subframe is prs subframe, and the second subframe is gap subframe.Wherein gap subframe occupies this The 4th work song frame to the 9th work song frame in frame, prs subframe occupies the 0th work song frame to the 5th work song frame in this frame, then gap subframe Overlapping subframe is the 4th work song frame and the 5th work song frame between prs subframe, above-mentioned overlapping subframe be ue actual be used for into The subframe of row alien frequencies rstd measurement.
Step 103: when the number of overlap sub-frame is more than the first threshold value, execution alien frequencies rstd measurement.
In the present embodiment, the first threshold value can be that the number of sub frames of described first subframe is described different with meeting of pre-setting Smaller value between the minimum number of sub frames of the first subframe of frequency rstd measurement.
As seen from the above-described embodiment, determine first between the first subframe and the second subframe before execution alien frequencies rstd measurement The number of overlap sub-frame, when the number of overlap sub-frame has exceeded the first threshold value meeting alien frequencies rstd measurement performance, just holds Row alien frequencies rstd measures, and thereby may be ensured that the success of alien frequencies rstd measurement, improves the precision of alien frequencies rstd measurement, effectively utilizes Ue is the distributed process resource of alien frequencies rstd measurement.
Referring to Fig. 2, it is the second embodiment flow chart of alien frequencies rstd measuring method of the present invention, this example show and carry out The detailed process of alien frequencies rstd measurement:
Step 201: be retrieved as the initial time of the first subframe of reference signal configuration, and the first subframe obtaining configuration Number of sub frames.
Wherein, the initial time of the first subframe includes initial frame number and the initial subframe number of the first subframe.When the first subframe When being specially alien frequencies prs subframe, according to the feature of different communication modes, alien frequencies prs subframe sends time period (prs in alien frequencies prs Occasion) the upper subframe taking is different.Wherein, in FDD (fdd, frequency divisionduplexing) mould Under formula, an alien frequencies prs of network side configuration sends the subframe comprising in the time period and is for transmitting under alien frequencies prs signal Row subframe, when therefore carrying out alien frequencies rstd measurement under fdd pattern, alien frequencies prs subframe is to account for an alien frequencies prs transmission time period Subframe;In time division duplex (tdd, time division duplexing) pattern, an alien frequencies prs of network side configuration Send the subframe comprising in the time period in addition to comprising the descending sub frame for transmitting alien frequencies prs signal, also comprise some up Subframe, sends in the time period in an alien frequencies prs, sub-frame of uplink is distributed according to the proportioning of network side with descending sub frame, When therefore carrying out alien frequencies rstd measurement under tdd pattern, alien frequencies prs subframe is to be allocated in the alien frequencies prs transmission time period The descending sub frame of first prs block.
In actual applications, can be sent a notification message by the lateral ue of network, alien frequencies prs in this notification message, can be comprised The transmission cycle (uses t in the present embodimentprsRepresent), from the initial subframe of alien frequencies prs transmission time period sends the cycle with respect to prs (i.e. position on the prs transmission cycle for the initial subframe of alien frequencies prs transmission time period, in the present embodiment for the deviant of beginning subframe Use δprsRepresent), the skew number of sub frames that the alien frequencies prs transmission time period sends the time period with respect to same frequency prs (is used in the present embodiment nPrs, sf, offsetRepresent), and alien frequencies prs send the time period take number of sub frames (in the present embodiment, use nprsRepresent).Tie below Close detailed calculating process and describe a kind of acquisition initial frame number of alien frequencies prs subframe and the process of initial subframe number:
First, calculate the initial frame number with frequency prs sends the time period and (in the present embodiment, use nF, start, intrafddRepresent) and Initial subframe number (uses n in the present embodimentSf, start, intrafddRepresent): wherein,
nsf,start,intrafddprsmod 10;
n f , start , intrafdd = ( n * t prs + δ prs - n sf , start , intrafdd 10 ) mod 1024 ;
In above formula, Expression rounds up, nF, currentRepresent that ue works as The frame number of front place frame, nSf, currentRepresent that ue is currently located the subframe numbers of frame.
Secondly, the initial frame number of time period is sent according to same frequency prs and initial subframe number calculates alien frequencies prs and sends the time period Initial frame number (in the present embodiment, use nF, start, interfddRepresent) and initial subframe number (in the present embodiment, use nSf, start, interfdd Represent): wherein,
nSf, start, interfdd=(nSf, start, intrafdd+nprs,sf,offset)mod 10;
In above formula, the number of sub-frames that 10 each frame of expression comprise,Represent and round downwards.
Step 202: be retrieved as the initial time of second subframe for alien frequencies rstd measurement of ue configuration, and acquisition is joined The number of sub frames of the second subframe put.
The initial time of the wherein second subframe includes initial frame number and the initial subframe number of the second subframe.In practical application In, when the second subframe is specially gap subframe, in the notification message that the lateral ue of network sends, the gap cycle can be comprised further (in the present embodiment, use tGap, periodRepresent), the initial subframe of gap is with respect to deviant (the i.e. gap of the initial subframe in gap cycle Position on the gap cycle for the initial subframe, use t in the present embodimentGap, offsetRepresent), and number of sub frames (this that gap takies N is used in embodimentgapRepresent).Describe a kind of initial frame number of acquisition gap subframe with reference to detailed calculating process and initiate The process of subframe numbers, this acquisition process needs to use calculated n in abovementioned steps 201F, start, interfddWith nSf, start, intrafdd:
Wherein,
nsf,gap,start=tgap,offsetmod 10;
In above formula,
k = arg min k = { k 1 , k 2 } { | n f , start , interfdd * 10 + n sf , start , interfdd - k * t gap , period - t gap , offset | } , Wherein, arg represents By k1And k2Substitute into above formula respectively | nF, start, interfdd*10+nSf, start, interfdd-k*tgap,period-tgap,offset| in, obtain Two values are designated as n1 and n2, take the corresponding k value of less value from n1 and n2, for example, if n1 is < n2, k=k1If, n1 > N2, then k=k2.
Wherein,
In lte communication system, ngapSix subframes can be fixed as, for other communication systems, then can be according to agreement Regulation setting ngap, this embodiment of the present invention is not limited.
Step 203: calculate initial frame number and the product of every frame length and the initial subframe number of the second subframe of the second subframe Sum, as the first parameter, and calculate initiateing of the initial frame number of the first subframe and the product of every frame length and the first subframe The sum of subframe numbers, as the second parameter.
According to the parameter obtaining in abovementioned steps 201 and step 202, it is possible to obtain for determining alien frequencies prs subframe and gap The number of the overlap sub-frame between subframe (uses n in the present embodimentPrs, interRepresent), wherein,
First parameter=nF, gap, start*10+nSf, gap, start, the second parameter=nF, start, interfdd*10+nSf, start, interfdd, " 10 " in above-mentioned two parameter represent every frame length, the number of sub frames that is, every frame comprises.
Step 204: compare the first parameter and the second parameter, when the first parameter is not less than the second parameter, determine overlapping son The number of frame is the first value, when the first parameter is less than the second parameter, determines that the number of overlap sub-frame is second value.
In the present embodiment, first be worth be added with the number of sub frames of described first subframe for described second parameter after with described first The difference of parameter;Second value is the difference after described first parameter is added with the number of sub frames of described second subframe with described second parameter Value, and the smaller value between the number of sub frames of described first subframe.
Understand in conjunction with aforementioned applications example:
Work as nf,gap,start*10+nSf, gap, start≥nF, start, interfdd*10+nSf, start, interfddWhen,
nprs,inter=nf,start,interfdd*10+nsf,start,interfdd+nprs-(nsf,gap,start*10+nsf,gap,start);
Work as nf,gap,start*10+nsf,gap,start< nf,start,interfdd*10+nSf, start, interfddWhen,
nPrs, inter=min { nsf,gap,start*10+nsf,gap,start+ngap-(nf,start,interfdd*10+ nSf, start, interfdd),nprs}.
Referring to Fig. 2 b, it is a kind of schematic diagram of the overlap sub-frame under fdd pattern in the present embodiment: wherein, alien frequencies prs subframe Take the 0th work song frame to the 5th work song frame on a frame, the 3rd work song frame in gap subframe one subframe of occupancy is to the 8th work song Frame, then overlap sub-frame is the 3rd work song frame to the 5th work song frame, i.e. nPrs, interFor 3.
Referring to Fig. 2 c, it is the schematic diagram of another kind of overlap sub-frame under fdd pattern in the present embodiment: wherein, alien frequencies prs subframe Take the 3rd work song frame to the 8th work song frame on a frame, the 0th work song frame in gap subframe one subframe of occupancy is to the 5th work song Frame, then overlap sub-frame be similarly the 3rd work song frame to the 5th work song frame, i.e. nPrs, interFor 3.
Referring to Fig. 2 d, it is a kind of schematic diagram of overlap sub-frame under tdd pattern in the present embodiment: wherein, be allocated to first The alien frequencies prs subframe of prs block takies the 2nd work song frame and the 3rd work song frame on a frame, and gap subframe takies in a subframe 3rd work song frame to the 8th work song frame, then overlap sub-frame is the 3rd work song frame, i.e. nPrs, interFor 1.
Referring to Fig. 2 e, it is the schematic diagram of another kind of overlap sub-frame under tdd pattern in the present embodiment: wherein, be allocated to first The alien frequencies prs subframe of individual prs block takies the 2nd work song frame and the 3rd work song frame on a frame, and gap subframe takies in a subframe The 0th work song frame to the 5th work song frame, then overlap sub-frame be the 2nd work song frame and the 3rd work song frame, i.e. nPrs, interFor 2.
Step 205: judge that whether the number of overlap sub-frame is more than the first threshold value, if so, then execution step 206;Otherwise, Execution step 207.
In the present embodiment, optionally, the number of sub frames that the first threshold value is the first subframe and expiring of pre-setting, can be set Smaller value between the minimum number of sub frames of the first subframe of foot described alien frequencies rstd measurement.In conjunction with aforementioned applications example, this first The number of sub frames of subframe is number of sub frames n that alien frequencies prs subframe sends the time period and comprisesprs, meet the alien frequencies of alien frequencies rstd measurement The minimum number of sub frames of prs subframe can be determined by emulation, as shown in table 1 below, is a kind of difference being determined according to simulation result Meet under prs bandwidth alien frequencies rstd measurement minimum number of sub frames lmin of alien frequencies prs subframe example:
Table 1
Step 206: execution alien frequencies rstd measurement, terminates current process.
Step 207: abandon this alien frequencies rstd measurement, terminate current process.
As seen from the above-described embodiment, determine first between the first subframe and the second subframe before execution alien frequencies rstd measurement The number of overlap sub-frame, when the number of overlap sub-frame has exceeded the first threshold value meeting alien frequencies rstd measurement performance, just holds Row alien frequencies rstd measures, and thereby may be ensured that the success of alien frequencies rstd measurement, improves the precision of alien frequencies rstd measurement, effectively utilizes Ue is the distributed process resource of alien frequencies rstd measurement.
Corresponding with the embodiment of alien frequencies rstd measuring method of the present invention, present invention also offers alien frequencies rstd measurement apparatus Embodiment.
Referring to Fig. 3 a, it is the embodiment block diagram of alien frequencies rstd measurement apparatus of the present invention, this device is generally arranged at ue side:
This device includes: acquiring unit 310, determining unit 320 and measuring unit 330.
Wherein, acquiring unit 310, for being retrieved as the parameter of the first subframe of reference signal configuration, and are retrieved as ue The parameter of second subframe for alien frequencies rstd measurement of configuration;
Determining unit 320, for the parameter of the first subframe that obtained according to described acquiring unit 310 and the ginseng of the second subframe Number determines the number of the overlap sub-frame between described first subframe and the second subframe;
Measuring unit 330, the number of the overlap sub-frame for determining when described determining unit 320 is more than the first threshold value When, execution described alien frequencies rstd measurement.
Referring to Fig. 3 b, it is the embodiment block diagram of acquiring unit in Fig. 3 a:
This acquiring unit 310 may include that
First subframe parameter acquiring subelement 311, for obtaining the initial of described the first subframe for reference signal configuration Time, the initial time of described first subframe includes the initial frame number of described first subframe and the initial subframe of described first subframe Number, and the number of sub frames obtaining described first subframe of configuration;
Second subframe parameter acquiring subelement 312, for obtain described measure for alien frequencies rstd for ue configuration the The initial time of two subframes, the initial time of described second subframe includes the initial frame number of described second subframe and described second son The initial subframe number of frame, and obtain the number of sub frames of described second subframe of configuration.
Referring to Fig. 3 c, it is the embodiment block diagram of determining unit in Fig. 3 a:
This determining unit 320 may include that
Parameter computation unit 321, for calculating the initial frame number of described second subframe and the product of every frame length and institute State the sum of the initial subframe number of the second subframe, as the first parameter, and calculate the initial frame number of described first subframe and every frame The product of length and described first subframe initial subframe number and, as the second parameter;
Overlap sub-frame number determination subelement 322, for described first ginseng calculating when described parameter computation unit 321 When number is not less than described second parameter, determine that the number of described overlap sub-frame is: described second parameter and described first subframe Difference with described first parameter after number of sub frames addition;When described first parameter that described parameter computation unit 321 calculates is little When described second parameter, determine that the number of described overlap sub-frame is: the number of sub frames of described first parameter and described second subframe Smaller value between difference with described second parameter, and the number of sub frames of described first subframe after addition.
Optionally, the device shown in Fig. 3 a can further include (not shown in Fig. 3 a):
Arranging unit, for be retrieved as reference signal configuration in described acquiring unit 310 the parameter of the first subframe before, Described first threshold value is set, and described first threshold value is that the number of sub frames of described first subframe is described different with meeting of pre-setting Smaller value between the minimum number of sub frames of the first subframe of frequency rstd measurement.
As seen from the above-described embodiment, when carrying out alien frequencies rstd measurement, it is retrieved as the first subframe of reference signal configuration Parameter, and be retrieved as ue configuration for alien frequencies rstd measurement the second subframe parameter, the parameter according to the first subframe and The number of the overlap sub-frame between parameter determination first subframe of the second subframe and the second subframe, when the number of described overlap sub-frame During more than the first threshold value, execution described alien frequencies rstd measurement.Due in the embodiment of the present invention execution alien frequencies rstd measurement before Determine the number of the overlap sub-frame between the first subframe and the second subframe first, meet alien frequencies when the number of overlap sub-frame has exceeded During the first threshold value of rstd measurement performance, just execution alien frequencies rstd measurement, thereby may be ensured that the success of alien frequencies rstd measurement, Improve the precision of alien frequencies rstd measurement, effectively utilizes ue are the distributed process resource of alien frequencies rstd measurement.
Those skilled in the art can be understood that technology in the embodiment of the present invention can be by software plus required Common hardware mode realizing, common hardware includes universal integrated circuit, general cpu, general-purpose storage, universal elements Come in fact Deng naturally it is also possible to special IC, special cpu, private memory, special components and parts etc. are included by specialized hardware Existing, but the former is more preferably embodiment in many cases.Based on such understanding, the technical scheme in the embodiment of the present invention is originally In other words prior art is contributed in matter partly can be embodied in the form of software product, and this computer software produces Product can be stored in storage medium, such as read only memory (rom, read-only memory), random access memory (ram, Random access memory), magnetic disc, CD etc., including some instructions with so that computer equipment (being People's computer, server, or network equipment etc.) execution each embodiment of the present invention or embodiment some partly described Method.
Each embodiment in this specification is all described by the way of going forward one by one, identical similar portion between each embodiment Divide mutually referring to what each embodiment stressed is the difference with other embodiment.Real especially for system For applying example, because it is substantially similar to embodiment of the method, so description is fairly simple, referring to embodiment of the method in place of correlation Part illustrate.
Invention described above embodiment, does not constitute limiting the scope of the present invention.Any in the present invention Spirit and principle within modification, equivalent and improvement of being made etc., should be included within the scope of the present invention.

Claims (5)

1. a kind of inter-frequency reference signal time difference rstd measuring method is it is characterised in that methods described includes:
Be retrieved as the parameter of the first subframe of reference signal configuration, and be retrieved as ue configuration for the of alien frequencies rstd measurement The parameter of two subframes;
Weight between first subframe and the second subframe described in the parameter determination of the parameter according to described first subframe and the second subframe The number of folded subframe;
When the number of described overlap sub-frame is more than the first threshold value, execution described alien frequencies rstd measurement;
The parameter of described the first subframe being retrieved as reference signal configuration includes:
Obtain the initial time of described the first subframe for reference signal configuration, the initial time of described first subframe includes described The initial frame number of the first subframe and the initial subframe number of described first subframe;
Obtain the number of sub frames of described first subframe of configuration;
Described the second subframe for alien frequencies rstd measurement being retrieved as ue configuration includes:
Obtain the initial time of described the second subframe for ue configuration for alien frequencies rstd measurement, the initiateing of described second subframe Time includes the initial frame number of described second subframe and the initial subframe number of described second subframe;
Obtain the number of sub frames of described second subframe of configuration;
Described in the parameter determination of the described parameter according to described first subframe and the second subframe between the first subframe and the second subframe Overlap sub-frame number, comprising:
Calculate the initial frame number of described second subframe and the product of every frame length and the initial subframe number of described second subframe and, As the first parameter;
Calculate the initial frame number of described first subframe and the product of every frame length and the initial subframe number of described first subframe and, As the second parameter;
When described first parameter is not less than described second parameter, determine that the number of described overlap sub-frame is: described second parameter Difference with described first parameter after being added with the number of sub frames of described first subframe;
When described first parameter be less than described second parameter when, determine that the number of described overlap sub-frame is: described first parameter with Difference with described second parameter after the number of sub frames addition of described second subframe, and between the number of sub frames of described first subframe Smaller value.
2. method according to claim 1 it is characterised in that
Described first subframe is the subframe that described reference signal sends time period occupancy;
When the described number when described overlap sub-frame is more than the first threshold value, execution described alien frequencies rstd measurement, specifically include: when When the number of described overlap sub-frame is more than the first threshold value, execute described alien frequencies rstd measurement under FDD fdd pattern;Or Person,
Described first subframe is the subframe that described reference signal sends first reference signal blocks in the time period;
When the described number when described overlap sub-frame is more than the first threshold value, execution described alien frequencies rstd measurement, specifically include: when When the number of described overlap sub-frame is more than the first threshold value, execute described alien frequencies rstd measurement under time division duplex tdd pattern.
3. method according to claim 1 to 2 any one is it is characterised in that the described reference signal configuration that is retrieved as Before the parameter of the first subframe, methods described also includes:
Described first threshold value is set, described first threshold value be described first subframe number of sub frames with pre-set meet institute State the smaller value between the minimum number of sub frames of the first subframe of alien frequencies rstd measurement.
4. a kind of alien frequencies rstd measurement apparatus are it is characterised in that described device includes:
Acquiring unit, for being retrieved as the parameter of the first subframe of reference signal configuration, and be retrieved as ue configuration for different The parameter of the second subframe of frequency rstd measurement;
Determining unit, for described in the parameter of the first subframe that obtained according to described acquiring unit and the parameter determination of the second subframe The number of the overlap sub-frame between the first subframe and the second subframe;
Measuring unit, for when the number of the overlap sub-frame that described determining unit determines is more than the first threshold value, execution is described Alien frequencies rstd measures;
Described acquiring unit includes:
First subframe parameter acquiring subelement, for obtaining the initial time of described the first subframe for reference signal configuration, institute The initial time stating the first subframe includes the initial frame number of described first subframe and the initial subframe number of described first subframe, and Obtain the number of sub frames of described first subframe of configuration;
Second subframe parameter acquiring subelement, for obtaining described the second subframe measuring for alien frequencies rstd for ue configuration Initial time, the initial time of described second subframe includes the initial frame number of described second subframe and the initial of described second subframe Subframe numbers, and obtain the number of sub frames of described second subframe of configuration;
Described determining unit includes:
Parameter computation unit, for calculating the initial frame number of described second subframe and the product of every frame length and described second son The sum of the initial subframe number of frame, as the first parameter, and calculates the initial frame number of described first subframe and taking advantage of of every frame length Long-pending with the initial subframe number of described first subframe and, as the second parameter;
Overlap sub-frame number determination subelement, is not less than described for the first parameter of calculating when described parameter computation unit During two parameters, determine that the number of described overlap sub-frame is: described second parameter be added with the number of sub frames of described first subframe after with The difference of described first parameter;When the first parameter that described parameter computation unit calculates is less than described second parameter, determine The number of described overlap sub-frame is: described first parameter be added with the number of sub frames of described second subframe after with described second parameter Smaller value between difference, and the number of sub frames of described first subframe.
5. device according to claim 4 is it is characterised in that described device also includes:
Arranging unit, for be retrieved as reference signal configuration in described acquiring unit the parameter of the first subframe before, institute is set State the first threshold value, described first threshold value be described first subframe number of sub frames with pre-set meet described alien frequencies rstd Smaller value between the minimum number of sub frames of the first subframe of measurement.
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WO2012042056A1 (en) * 2010-10-01 2012-04-05 Nokia Siemens Networks Oy Inter-frequency measurements for observed time difference of arrival
CN102457960A (en) * 2010-11-02 2012-05-16 大唐移动通信设备有限公司 Measuring processing method and equipment for auxiliary observation arrival time difference positioning

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WO2012042056A1 (en) * 2010-10-01 2012-04-05 Nokia Siemens Networks Oy Inter-frequency measurements for observed time difference of arrival
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