CN103645354B - Method and support for detecting LED fluorescent lamp - Google Patents
Method and support for detecting LED fluorescent lamp Download PDFInfo
- Publication number
- CN103645354B CN103645354B CN201310606515.1A CN201310606515A CN103645354B CN 103645354 B CN103645354 B CN 103645354B CN 201310606515 A CN201310606515 A CN 201310606515A CN 103645354 B CN103645354 B CN 103645354B
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- Prior art keywords
- support
- contact chip
- daylight lamp
- led daylight
- detection
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- 238000000034 method Methods 0.000 title claims abstract description 4
- 238000001514 detection method Methods 0.000 claims abstract description 44
- 238000012360 testing method Methods 0.000 claims abstract description 28
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 20
- 229910052802 copper Inorganic materials 0.000 claims abstract description 20
- 239000010949 copper Substances 0.000 claims abstract description 20
- 238000009413 insulation Methods 0.000 claims description 28
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 12
- 239000004020 conductor Substances 0.000 abstract 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000011017 operating method Methods 0.000 description 2
- 208000019901 Anxiety disease Diseases 0.000 description 1
- 230000036506 anxiety Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004134 energy conservation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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- Measuring Leads Or Probes (AREA)
- Testing Relating To Insulation (AREA)
Abstract
The invention provides a method and a support for detecting an LED fluorescent lamp. The support for detecting the LED fluorescent lamp comprises an integrated insulating voltage resistance tester, a movable track, a fixed contact piece support, a movable contact piece support, a locking knob, a radiator contact piece, a spring, a copper connecting rod and a return conductor, wherein the return conductor is arranged inside the support for detecting the LED fluorescent lamp and connected with the fixed contact piece support, the movable contact piece support and the radiator contact piece, and forms a test loop together with the integrated insulating voltage resistance tester, the movable contact piece support is used for moving in the movable track freely, the position of the movable contact piece support is fixed through the locking knob according to detection requirements, and the copper connecting rod can stretch out and draw back freely by using the spring. By adopting the detection support provided by the invention can improve the detection efficiency and reduce the production cost of enterprises.
Description
Technical field
The invention belongs to mechanical field, particularly to a kind of LED daylight lamp detection method and support.
Background technology
Currently, the anxiety of the energy makes the application of LED lamp become energy-conservation, the main flow of green illumination in the whole world, LED
The manufacture of daylight lamp is the most extensively risen.It is known that LED daylight lamp is as illuminating product, in production process
Middle needs carry out strict insulation voltage-withstand test, and at present, tradition LED daylight lamp is both end power supplying, i.e. daylight
One end of lamp is zero line, and one end is live wire, but traditional LED daylight lamp insulation resistance test equipment is in reality
In the operation of border, detection process is more numerous and diverse, reduces at the detection efficiency manufacturing LED daylight lamp, adds
Production cost.
Summary of the invention
Based on above-mentioned technical problem present in prior art.It is an object of the invention to propose a kind of LED day
Light modulation detection method and support, solve in current LED daylight lamp production process, and insulate resistance test program
Numerous and diverse production efficiency caused reduces, and increases the defect of enterprise's production cost.
The invention provides a kind of LED daylight lamp detection support, including: integrated insulation Hi-pot Tester, shifting
Dynamic track, fixed contact piece support, removable contact chip support, locking knob, radiator contact chip, bullet
Spring, copper connecting rod and return wire, wherein, described return wire is placed in described LED daylight lamp detection support
Inside, with described fixed contact piece support, described removable contact chip support and described radiator contact chip phase
Connecting, and form test loop with described integrated insulation Hi-pot Tester, described removable contact chip support is used
In moving freely in described moving track, and according to detection demand, fixed institute by by described locking knob
Stating the position of removable contact chip support, it is flexible free that described copper connecting rod utilizes described spring to realize.
Detecting support based on above-mentioned LED daylight lamp, above-mentioned integrated insulation Hi-pot Tester is used for arranging test to be executed
Making alive and discharge current.
Detecting support based on above-mentioned LED daylight lamp, above-mentioned moving track is used for regulating described removable contact chip
Distance between support and described fixed contact piece support, in order to the LED daylight lamp of detection different length.
Detecting support based on above-mentioned LED daylight lamp, above-mentioned removable contact chip support includes that described may move connects
The contact chip of contact support, described copper connecting rod, described spring and described locking knob, described copper connecting rod
Being connected together with the contact chip of described removable contact chip support, described spring housing is at described copper connecting rod
On, make described copper connecting rod have resilience force flexibly.
Detecting support based on above-mentioned LED daylight lamp, above-mentioned locking knob uses then moving at testing jig two ends
After the distance of the contact chip of moving contacting plate support is adjusted, the contact chip of fixing removable contact chip support.
Detecting support based on above-mentioned LED daylight lamp, above-mentioned radiator contact chip is by the test voltage of radiator
And electric current, feed back to described insulation Hi-pot Tester by described return wire.
LED daylight lamp detection method based on above-mentioned LED daylight lamp detection support, including: by described
Distance between described removable contact chip support and described fixed contact piece support is adjusted by moving track
After, the position of described removable contact chip support is fixed by described locking knob, opens the pressure survey of integrated insulation
Examination instrument 1, arranges test and applies voltage and discharge current, and LED fluorescent lamp tube to be tested is placed in described LED
In daylight lamp detection support, open detection switch, detect LED daylight lamp.
The invention has the beneficial effects as follows: the present invention solves both end power supplying LED daylight lamp in production test,
Respectively daylight lamp two ends, radiator are connected with backflow wire, then start and test numerous and diverse the lacking of this step
Point, improves detection efficiency, reduces enterprise's production cost.It is characterized in insulation Hi-pot Tester and detection
Frame is integrated, reduces operating procedure, it is achieved portable and quick detection.
Accompanying drawing explanation
Fig. 1 is that a kind of structure equipped with the LED daylight lamp detection support of insulation Hi-pot Tester of the present invention is shown
It is intended to；
Fig. 2 is the structural representation of a kind of integrated insulation Hi-pot Tester of the present invention；
Fig. 3 is the structural representation of the moving track of a kind of LED daylight lamp detection support of the present invention；
Fig. 4 is the structure schematic diagram of a kind of fixed contact piece support knot of the present invention；
Fig. 5 is the structural representation of a kind of removable contact chip support of the present invention.
In the drawings: the most integrated insulation Hi-pot Tester, 2. moving track, 3. fixed contact piece support, 4. can move
Moving contacting plate support, 5. locking knob, 6. radiator contact chip, 7. spring, the most copper connecting rod
Detailed description of the invention
The invention will be further described with embodiment below in conjunction with the accompanying drawings, it is noted that described reality
Execute example and be intended merely to facilitate the understanding of the present invention, and it is not played any restriction effect.
The present invention is further detailed explanation with detailed description of the invention below in conjunction with the accompanying drawings.
As Figure 1-5, a kind of LED daylight lamp detection equipped with insulation Hi-pot Tester that the present invention provides
Support, this support can fix all of assembly, and these assemblies include integrated insulation Hi-pot Tester 1, mobile
Track 2, fixed contact piece support 3, removable contact chip support 4, locking knob 5, radiator contact chip 6,
Spring 7 and copper connecting rod 8.Return wire (not shown) is placed in detection internal stent, contacts with fixing
Plate rack 3, removable contact chip support 4 and radiator contact chip 6 are reliably connected, resistance to integrated insulation afterwards
Pressure tester 1 forms test loop.Removable contact chip support 4 can move freely in moving track 2,
And in good time by the position of the fixing removable contact chip support 4 of locking knob 5, copper connecting rod 8 can be at spring 7
Stroke in well stretch.
Integrated insulation Hi-pot Tester 1 is used for arranging test and applies voltage and discharge current.
Moving track 2 is used for regulating the distance between removable contact chip support 4 and fixed contact piece support 3,
It is easy to test the LED daylight lamp of different length.
Removable contact chip support 4 includes the removable contact chip 9 of contact chip support 4, copper connecting rod 8, bullet
Spring 7 and locking knob 5, copper connecting rod 8 is reliably connected with the contact chip 9 of removable contact chip support 4, bullet
Spring 7 is enclosed within copper connecting rod 8, makes connecting rod have resilience force flexibly.
Locking knob 5 distance of the contact chip 9 of then removable contact chip support 4 at testing jig two ends
After adjusting, the contact chip 9 of fixing removable contact chip support 4.
Radiator contact chip 6 is by the test voltage of radiator and electric current, feeds back to insulation by return wire
Hi-pot Tester 1.
In use, can be by removable contact chip support 4 and fixed contact piece by moving track 2
After distance between support 3 is adjusted and with locking knob 5, the position of removable contact chip support 4 is solid
Fixed, so can test the LED daylight lamp of different length.Open integrated insulation Hi-pot Tester 1, now
Insulation Hi-pot Tester 1 sets test and applies voltage and discharge current.Now by LED daylight to be tested
Fluorescent tube is placed in the LED daylight lamp detection support that the present invention provides, and opens detection switch, so carries out LED
Daylight lamp have detected.
The LED daylight lamp detection support provided by the invention described above, will insulation Hi-pot Tester return wire
It is designed as LED daylight lamp detection support, and insulation Hi-pot Tester is become with this LED daylight lamp rack set
Integrally, all return wires are connected with insulation voltage-withstand test by detection internal stent, it is achieved LED daylight lamp
Quick and a whole set of support of detection portable.
The invention has the beneficial effects as follows: the present invention solves both end power supplying LED daylight lamp in production test,
Respectively daylight lamp two ends, radiator are connected with backflow wire, then start and test numerous and diverse the lacking of this step
Point, improves detection efficiency, reduces enterprise's production cost.It is characterized in insulation Hi-pot Tester and detection
Frame is integrated, reduces operating procedure, it is achieved portable and quick detection.
Insulation Hi-pot Tester is combined together, when all parameters set by the present invention with LED daylight lamp detection support
After reserving, only LED daylight lamp steadily need to be placed in test bracket, after pressing test switch, just can be short
The test result that insulation is pressure is drawn in time, very convenient and quick.
Being described above is only the specific embodiment of the present invention, it is clear that under technical scheme instructs
Amendment or local that anyone of this area is made are replaced, and belong to the scope that claims of the present invention limits.
Claims (6)
1. a LED daylight lamp detection support, it is characterised in that including: integrated insulation Hi-pot Tester,
Moving track, fixed contact piece support, removable contact chip support, locking knob, radiator contact chip,
Spring, copper connecting rod and return wire, wherein, described return wire is placed in the detection of described LED daylight lamp
Inside frame, with described fixed contact piece support, described removable contact chip support and described radiator contact chip
It is connected, and forms test loop, described removable contact chip support with described integrated insulation Hi-pot Tester
For moving freely in described moving track, and according to detection demand, fixed by by described locking knob
The position of described removable contact chip support, described removable contact chip support includes described removable contact chip
The contact chip of support, described copper connecting rod, described spring and described locking knob, described copper connecting rod and institute
The contact chip stating removable contact chip support is connected together, described spring housing on described copper connecting rod,
Making described copper connecting rod have resilience force flexibly, described copper connecting rod utilizes described spring can realize stretching
Freely.
2. LED daylight lamp detection support as claimed in claim 1, it is characterised in that described integrated absolutely
Edge Hi-pot Tester is used for arranging test and applies voltage and discharge current.
3. LED daylight lamp detection support as claimed in claim 1, it is characterised in that described moving rail
Road is for regulating the distance between described removable contact chip support and described fixed contact piece support, in order to
The LED daylight lamp of detection different length.
4. LED daylight lamp detection support as claimed in claim 1, it is characterised in that described locking rotating
After button is adjusted by then distance at the contact chip of the removable contact chip support of testing jig one end, fixing can
The contact chip of moving contact plate rack.
5. LED daylight lamp detection support as claimed in claim 1, it is characterised in that described radiator
Contact chip is by the test voltage of radiator and electric current, feeds back to described insulation by described return wire pressure
Tester.
6. the LED daylight lamp inspection of arbitrary LED daylight lamp based on claim 1 to 5 detection support
Survey method, including: by described moving track by described removable contact chip support and described fixed contact piece
After distance between support is adjusted, the position of described removable contact chip support is fixed by described locking knob,
Open integrated insulation Hi-pot Tester 1, test is set and applies voltage and discharge current, LED daylight to be tested
Fluorescent tube is placed in described LED daylight lamp detection support, opens detection switch, detects LED daylight lamp.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310606515.1A CN103645354B (en) | 2013-11-25 | 2013-11-25 | Method and support for detecting LED fluorescent lamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310606515.1A CN103645354B (en) | 2013-11-25 | 2013-11-25 | Method and support for detecting LED fluorescent lamp |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103645354A CN103645354A (en) | 2014-03-19 |
| CN103645354B true CN103645354B (en) | 2017-01-11 |
Family
ID=50250604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310606515.1A Expired - Fee Related CN103645354B (en) | 2013-11-25 | 2013-11-25 | Method and support for detecting LED fluorescent lamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103645354B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103901360A (en) * | 2014-03-28 | 2014-07-02 | 山东明华光电科技有限公司 | LED lamp tube test frame |
| CN106324413B (en) * | 2016-07-29 | 2018-12-28 | 海宁市智慧光电有限公司 | A kind of test device of LED spotlight |
| CN106501687B (en) * | 2016-10-13 | 2019-08-27 | 深圳Tcl数字技术有限公司 | Lamp bar discharge test method and device |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61288176A (en) * | 1985-06-17 | 1986-12-18 | Ngk Insulators Ltd | Method and device for testing bushing |
| JPH09304469A (en) * | 1996-05-09 | 1997-11-28 | Nissin Electric Co Ltd | Jig for withstand voltage test |
| CN102305916B (en) * | 2011-05-27 | 2013-05-01 | 张家港市瑞腾科技有限公司 | Ageing rack for daylight lamp |
| CN202405223U (en) * | 2011-12-16 | 2012-08-29 | 荆州市大明灯业有限公司 | Assembling and testing device of fluorescent lamp |
| CN203054007U (en) * | 2012-11-09 | 2013-07-10 | 福州慧丰机电有限公司 | Fluorescent lamp aging test bracket |
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2013
- 2013-11-25 CN CN201310606515.1A patent/CN103645354B/en not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| CN103645354A (en) | 2014-03-19 |
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Granted publication date: 20170111 |