CN103645104B - Universal test machine clamp slipped defects curve yield point inductive method - Google Patents

Universal test machine clamp slipped defects curve yield point inductive method Download PDF

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Publication number
CN103645104B
CN103645104B CN201310727705.9A CN201310727705A CN103645104B CN 103645104 B CN103645104 B CN 103645104B CN 201310727705 A CN201310727705 A CN 201310727705A CN 103645104 B CN103645104 B CN 103645104B
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China
Prior art keywords
point
yield point
curve
lower yield
slippage
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CN103645104A (en
Inventor
阳信
周平
杨碧英
郭享平
张献义
罗新生
罗清明
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Sichuan Desheng Group Vanadium Titanium Co Ltd
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Sichuan Desheng Group Vanadium Titanium Co Ltd
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Abstract

The invention discloses universal test machine clamp slipped defects curve yield point inductive method, comprise the following steps: (A) skidding yield point defect curve type judges; (B) lower yield point judged according to yield point defect curve type and system reads or calculates actual lower yield point or lower yield point scope.The type of described skidding yield point defect curve comprises following three kinds: the critical localisation of platform just appears in (1) point of slippage; (2) point of slippage appears at platform postmedian, and overall trend is even; (3) continue to skid.The invention provides a kind of universal test machine clamp slipped defects curve yield point inductive method, better can be calculated the physical property of hot rolled ribbed bars by these computing method, greatly reduce the error range of calculating, improve accuracy.

Description

Universal test machine clamp slipped defects curve yield point inductive method
Technical field
The present invention relates to a kind of defect curve data computing method, relate to the calculating of a kind of universal test machine clamp slipped defects curve yield point, derivation method specifically.
Background technology
The inspection of the physical property of iron and steel enterprise's hot rolled ribbed bars, major equipment is universal testing machine.Universal testing machine mainly for the production of the mensuration of hot rolled ribbed bars mechanical property, in daily process of the test, usually along with the stretching of sample, there is the skidding sound of ", ", curve in data gathering system, " to turn back " phenomenon along with skidding sound occurrence law or erratic stress numerical, cause system automatic decision lower yield point to be slipped up, greatly have impact on the determination of product parameters.
Summary of the invention
In view of this, the invention provides a kind of universal test machine clamp slipped defects curve yield point inductive method, the physical property of hot rolled ribbed bars better can be calculated by these computing method, combine the judgement of computing machine and artificial choosing, greatly to reduce and the error range of specification calculating and people are the randomness of getting a little, improve accuracy.
For solving above technical matters, technical scheme of the present invention is:
Universal test machine clamp slipped defects curve yield point inductive method, comprises the following steps:
(A) skidding yield point defect curve type judges;
(B) lower yield point judged according to yield point defect curve type and system reads or calculates actual lower yield point or lower yield point scope.
The type of described skidding yield point defect curve comprises following three kinds:
(1) just there is the critical localisation of platform in the point of slippage;
(2) point of slippage appears at platform postmedian, and overall trend is even;
(3) continue to skid.
The point of slippage in described situation (1) just appears at the critical localisation of platform, and there is no stress decrease point above, system can judge that this point is as " lower yield point ", and according to trend and the position of yield point elongation before and after curve, actual lower yield point should be in the defect area of curve, and the strength values scope of this lower yield point then should at upper increase by the 5 ~ 10MPa of " lower yield point " of system judgement.
Described situation (2) has a, b two points in the graph, wherein b point " lower yield point " that judge for system, and a point is the minimum point of this section of slipped defects curve of removing point of slippage extra curvature.
Described situation (2) is by observing b point defect downslide amplitude, curve is follow-up has interval comparatively even, some regions that downslide amplitude is comparatively close, judge that this region is as the testing machine point of slippage with this, can this region of direct hedge and do not affect choosing of lower yield point, b point selection a point should be got rid of as actual lower yield point.
The fluctuation of the curve generation continuation of lower surrender in described situation (3), minimum point on system meeting judgment curves is lower yield point, by artificially analyzing the curve trend of lower surrender, and people is the scope choosing lower yield point, its strength values scope is " lower yield point " upper increase by 5 ~ 20MPa that system judges.
Compared with prior art, the present invention has following beneficial effect:
On the basis of the yield point that the present invention judges at computing machine, the position occurred by the trend and curve defect of observing curve and frequency carry out artificial arrangement and conclusion again, thus can determine the concrete numerical value of lower yield point or span more accurately, greatly reduce and specification computing machine judges time the error range of generation and simple people be the randomness of getting a little, further increase accuracy.
Accompanying drawing explanation
Fig. 1 is flawless curve map of the present invention;
Fig. 2 is slipped defects curve map of the present invention;
Fig. 3 is the local curve figure of the point of slippage of the present invention when just there is the critical localisation of platform;
Fig. 4 is the local curve figure that the point of slippage of the present invention appears at platform postmedian;
Fig. 5 is the local curve figure that the present invention continues to skid.
Embodiment
Core thinking of the present invention is, a kind of universal test machine clamp slipped defects curve yield point inductive method is provided, the physical property of hot rolled ribbed bars better can be calculated by these computing method, combine the judgement of computing machine and artificial choosing, greatly to reduce and the error range of specification calculating and people are the randomness of getting a little, improve accuracy.
In order to make those skilled in the art understand technical scheme of the present invention better, below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
Embodiment
As shown in Fig. 1,2,3,4,5, universal test machine clamp slipped defects curve yield point inductive method, comprises the following steps:
(A) skidding yield point defect curve type judges;
(B) lower yield point judged according to yield point defect curve type and system reads or calculates actual lower yield point or lower yield point scope.
The type of described skidding yield point defect curve comprises following three kinds:
(1) just there is the critical localisation of platform in the point of slippage;
(2) point of slippage appears at platform postmedian, and overall trend is even;
(3) continue to skid.
The point of slippage in described situation (1) just appears at the critical localisation of platform, and there is no stress decrease point above, system can judge that this point is as " lower yield point ", and according to trend and the position of yield point elongation before and after curve, actual lower yield point should be in the defect area of curve, and the strength values scope of this lower yield point then should at upper increase by the 5 ~ 10MPa of " lower yield point " of system judgement.
Described situation (2) has a, b two points in the graph, wherein b point " lower yield point " that judge for system, and a point is the minimum point of this section of slipped defects curve of removing point of slippage extra curvature.
Described situation (2) is by observing b point defect downslide amplitude, curve is follow-up has interval comparatively even, some regions that downslide amplitude is comparatively close, judge that this region is as the testing machine point of slippage with this, can this region of direct hedge and do not affect choosing of lower yield point, b point selection a point should be got rid of as actual lower yield point.
The fluctuation of the curve generation continuation of lower surrender in described situation (3), minimum point on system meeting judgment curves is lower yield point, by artificially analyzing the curve trend of lower surrender, and people is the scope choosing lower yield point, its strength values scope is " lower yield point " upper increase by 5 ~ 20MPa that system judges.
Below be only the preferred embodiment of the present invention, it should be pointed out that above-mentioned preferred implementation should not be considered as limitation of the present invention, protection scope of the present invention should be as the criterion with claim limited range.For those skilled in the art, without departing from the spirit and scope of the present invention, can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.

Claims (1)

1. universal test machine clamp slipped defects curve yield point inductive method, is characterized in that, comprise the following steps:
Step (A) skidding yield point defect curve type judges;
Step (B) reads according to the lower yield point that yield point defect curve type and system judge or calculates actual lower yield point or lower yield point scope;
The type of described skidding yield point defect curve comprises following three kinds:
(1) just there is the critical localisation of platform in the point of slippage;
(2) point of slippage appears at platform postmedian, and overall trend is even;
(3) continue to skid;
Wherein, the point of slippage in type (1) just appears at the critical localisation of platform, and there is no stress decrease point above, system can judge that this point is as " lower yield point ", and according to trend and the position of yield point elongation before and after curve, actual lower yield point should be in the defect area of curve, and the strength values scope of this lower yield point then should at upper increase by the 5 ~ 10MPa of " lower yield point " of system judgement;
Type (2) has a, b two points in the graph, wherein b point " lower yield point " that judge for system, and a point is the minimum point of this section of slipped defects curve of removing point of slippage extra curvature; By observing b point defect downslide amplitude, curve is follow-up has interval comparatively even, some regions that downslide amplitude is comparatively close, judge that this some region is as the testing machine point of slippage with this, can this some region of direct hedge and do not affect choosing of lower yield point, b point selection a point should be got rid of as actual lower yield point;
The fluctuation of the curve generation continuation of lower surrender in type (3), minimum point on system meeting judgment curves is lower yield point, by artificially analyzing the curve trend of lower surrender, and people is the scope choosing lower yield point, its strength values scope is " lower yield point " upper increase by 5 ~ 20MPa that system judges.
CN201310727705.9A 2013-12-25 2013-12-25 Universal test machine clamp slipped defects curve yield point inductive method Active CN103645104B (en)

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CN103645104B true CN103645104B (en) 2015-12-09

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1054664A (en) * 1990-03-02 1991-09-18 吴介卿 By simple extension test determination ductile metal opening mode critical stress intensity factors
CN101661271A (en) * 2009-09-16 2010-03-03 天津钢管集团股份有限公司 Method for controlling whole-course displacement in program-controlled metal material stretching test

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1054664A (en) * 1990-03-02 1991-09-18 吴介卿 By simple extension test determination ductile metal opening mode critical stress intensity factors
CN101661271A (en) * 2009-09-16 2010-03-03 天津钢管集团股份有限公司 Method for controlling whole-course displacement in program-controlled metal material stretching test

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
误读与纠正;陈训诰;《冶金标准化与质量》;20040218(第01期);第37-40页 *

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