CN103605052B - The on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment method - Google Patents

Abstract

The invention discloses the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment method, comprising: the capacitance of calculating tested GIS; Determine test waveform parameter value; According to tested GIS capacitance, required test waveform parameter value calculation test loop parameter; Build test circuit according to the loop parameter that calculates gained; The test circuit that utilization is built carries out oscillation mode impulse voltage withstand test to GIS. The on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS provided by the invention waveform adjustment system and method, waveform adjustment method can be in the parameter of carrying out grasping before formal high-potting test waveform, has avoided the blindness of test; The present invention adopts the method for numerical computations to carry out the calculating of test loop parameter, has the advantages that computational accuracy is high, be convenient to enforcement; It is simple that waveform price modification system proposed by the invention has use, is convenient to the feature of field conduct.

Description

The on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment method

Technical field

The present invention relates to the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment system and method, belong to electrical equipment field trial technical field.

Background technology

Gas-insulating and fully-enclosed formula combined electrical apparatus (GIS) is one of most important power equipment in electrical network, and its operational reliability is directly connected to the safety and stability of whole network system. But, in recent years along with a large amount of uses of voltage levels electrical network Large scale construction and GIS equipment, there are a lot of main equipments that cause because of product design, manufacture, technique, material and main annex quality problem and cannot or be forced to the situation that extension is dispatched from the factory in these equipment, in later stage transport, installation, debugging and a lot of faults and the accident of occurring again in service. The failure cause that GIS equipment occurs at present can be divided into several aspects such as product design, manufacturing process, cooperation part quality, on-the-spot installation quality, and these problems may be respectively in product export type approval test, on-the-spot commissioning test, equipment exposure in service.

The security reliability being in operation in order to improve GIS equipment, resistance test is impacted to GIS in relevant criterion and code suggestion and the scene that is recommended in. Two index shock waves that tradition is used, its generating means volume is large, generation efficiency is low, is unfavorable for the GIS of voltage levels to carry out field trial. IEC60060-3 does to power equipment the oscillation mode High Voltage Impulse Waveform that on-the-spot impulse voltage withstand test uses and has done clearly regulation, the oscillation mode High Voltage Impulse Waveform of recommending has the high feature that is applicable to on-the-spot use of generation efficiency, thereby has solved the problem that surge voltage inconvenience in the past produces at the scene and uses.

Utilize oscillation mode surge voltage scene to carry out in GIS equipment impulse voltage withstand test, test waveform parameter is its key link, in order accurately to realize Field adjustment oscillation mode High Voltage Impulse Waveform, studying corresponding on-the-spot waveform adjustment method, to carry out this test for scene significant.

Summary of the invention

Object: in order to overcome the deficiencies in the prior art, the invention provides the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment system and method.

Technical scheme: for solving the problems of the technologies described above, the technical solution used in the present invention is:

The on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment method, is characterized in that, comprises the steps:

Step 1) calculate the capacitance of tested GIS;

Step 2) determine test waveform parameter value;

Step 3) according to tested GIS capacitance, required test waveform parameter value calculation test loop parameter;

Step 4) build test circuit according to the loop parameter that calculates gained;

Step 5) utilize the test circuit of building to carry out oscillation mode impulse voltage withstand test to GIS.

As preferred version, step 2) described in waveform parameter value meet the requirement of IEC60060-3 standard, waveform parameter comprises wave head time, wave rear time and frequency of oscillation; Waveform comprises oscillation mode lightning impulse and oscillation mode switching impulse.

Step 3) described in loop parameter comprise main capacitance value, harmonic inductance value, wave front resistance value and wave rear resistance value.

Described loop parameter is to obtain according to the method for numerical computations, the capacitance that data used are GIS and test waveform parameter value.

The on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment system, is characterized in that, comprising:

Initial setting up module, for arranging the capacitance of tested GIS, the concrete numerical value of required test waveform parameter;

Computation analysis module, for according to the given parameter of initial setting up module, counter circuit parameter, obtains testing the concrete numerical value of required loop parameter;

Result output module, for exporting the concrete numerical value of required loop parameter.

The described on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment system, is characterized in that: described test waveform parameter comprises waveform wave head time, wave rear time and frequency of oscillation.

The described on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment system, is characterized in that: described loop parameter comprises main capacitance value, harmonic inductance value, wave front resistance value and wave rear resistance value.

Beneficial effect: the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS provided by the invention waveform adjustment system and method, there is following beneficial effect: 1) waveform adjustment method of the present invention can be in the parameter of carrying out grasping before formal high-potting test waveform, avoided the blindness of test; 2) the present invention adopts the method for numerical computations to carry out the calculating of test loop parameter, has the advantages that computational accuracy is high, be convenient to enforcement; 3) waveform price modification system proposed by the invention has use simply, is convenient to the feature of field conduct.

Brief description of the drawings

Fig. 1 is the schematic flow sheet of the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS of the present invention waveform adjustment method;

Fig. 2 a and Fig. 2 b are the electrical equipment field trial oscillation mode High Voltage Impulse Waveform figure that IEC60060-3 specifies;

Fig. 3 is the desired oscillation mode surge voltage of IEC60060-3 parameter request scope;

Fig. 4 is test circuit figure;

Fig. 5 is the structured flowchart of the embodiment of the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS of the present invention waveform adjustment system.

Detailed description of the invention

Below in conjunction with accompanying drawing, the present invention is further described.

As shown in Figure 1, be the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment method, step S101: calculate the capacitance of tested GIS equipment, can utilize electric bridge actual measurement to obtain, also can obtain according to the Structure Calculation of tested GIS.

Step S102: determine test waveform parameter value. Test waveform adopts the desired oscillation mode surge voltage of IEC60060-3, and its waveform as shown in Figure 2 a and 2 b. Fig. 2 a is oscillation mode lightning impulse voltage waveform, and Fig. 2 b is oscillation mode operating impulse voltage waveform. Its waveform parameter is wave head time T_f, wave rear time T_tAnd frequency of oscillation f, waveform parameter value requires as shown in Figure 3, can be according to the selected a certain occurrence of this parameter area as given parameters in enforcement.

Step S103: according to the capacitance of tested GIS and definite test waveform parameter value calculation test loop parameter. As shown in Figure 4, wherein 1 is main capacitance C to test circuit₂, 3 be that harmonic inductance L, 2 is for wave front resistance R_f, 4 be wave rear resistance R_t, 5 be tested GIS (be capacitive in test, with lumped capacitance represent) C₀. Main capacitance value C₂According to the capacitance C of tested GIS₀Determine, main capacitance value is larger, and efficiency is higher, and main capacitance value can adopt the tested GIS capacitance of 10 times, i.e. C conventionally₂＝10C₀, now known parameters is wave head time T_f, wave rear time T_t, frequency of oscillation f, main capacitance value C₂, tested GIS capacitance C₀. Being calculated as of other test loop parameters:

Harmonic inductance value is determined according to following formula:

$L=\frac{1}{4{\mathrm{\π}}^2{f}^{2}C}---\left(1\right)$

Wherein C=C₀C₂/(C₀+C₂)

Wave front resistance value is determined according to following formula:

$R_f=2L{(\frac{1}{LC}-\frac{{\mathrm{\π}}^2}{T_f^2})}^{1/2}---\left(2\right)$

Wave rear resistance value is determined according to following formula:

$R_t=\frac{T_t}{0.25(C_2+C_0)}-R_f---\left(3\right)$

Step S104: according to calculated value optional test loop parameter, build test circuit.

Step S105: the oscillation mode impulse voltage withstand test that carries out GIS.

Embodiment 2

According to the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment method of the invention described above, the present invention also provides the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS waveform adjustment system, below is elaborated with regard to the specific embodiment of the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS of the present invention waveform adjustment system. The structural representation of the on-the-spot oscillation mode impulse voltage withstand test of a kind of GIS of embodiment of the present invention waveform adjustment system has been shown in Fig. 5, wherein:

201 is initial setting up module, arrange and calculate the required initial parameter in test loop, comprise and calculate or survey the tested GIS capacitance obtaining, test waveform parameter value, test waveform parameter value comprises oscillating waveform frequency, wave head time and wave rear time, its numerical value should meet the requirement of IEC60060-3, can be according to the selected a certain occurrence of this parameter area as given parameters.

203 is computation analysis module, and according to given calculation of parameter test loop parameter, test loop parameter is main capacitance value, harmonic inductance value, wave front resistance value and wave rear resistance value.

204 is result output module, results needed can be exported, for field trial provides test loop parameter value according to the calculated value of computation analysis module.

The above is only the preferred embodiment of the present invention; be noted that for those skilled in the art; under the premise without departing from the principles of the invention, can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.

Claims (1)

1. the on-the-spot oscillation mode impulse voltage withstand test of a GIS waveform adjustment method, is characterized in that, comprisesFollowing steps:

Step 1) calculate the capacitance of tested GIS;

Step 2) determine test waveform parameter value; Described waveform parameter value meets IEC60060-3 standardRequirement, waveform parameter comprises wave head time, wave rear time and frequency of oscillation; Waveform comprises oscillation modeLightning impulse and oscillation mode switching impulse;

Step 3) join according to tested GIS capacitance, required test waveform parameter value calculation test loopNumber; Described loop parameter comprises main capacitance value, harmonic inductance value, wave front resistance value and wave rear resistance value;Described loop parameter is to obtain according to the method for numerical computations, the capacitance that data used are GISWith test waveform parameter value;

In test circuit, comprise main capacitance C₂, harmonic inductance L, wave front resistance R_f, wave rear resistance R_t、Tested GIS capacitance C₀; Main capacitance value C₂According to the capacitance C of tested GIS₀Determine main capacitance valueLarger, efficiency is higher, and main capacitance value adopts the tested GIS capacitance of 10 times, i.e. C₂＝10C₀,Now known parameters is wave head time T_f, wave rear time T_t, frequency of oscillation f, main capacitance value C₂, testedGIS capacitance C₀; ?

Harmonic inductance value is determined according to following formula:

$L=\frac{1}{4{\mathrm{\π}}^2{f}^{2}C}---\left(1\right)$

Wherein C=C₀C₂/(C₀+C₂)

Wave front resistance value is determined according to following formula:

$R_f=2L{(\frac{1}{LC}-\frac{{\mathrm{\π}}^2}{T_f^2})}^{1/2}---\left(2\right)$

Wave rear resistance value is determined according to following formula:

$R_t=\frac{T_t}{0.25(C_2+C_0)}-R_f---\left(3\right)$

Step 4) build test circuit according to the loop parameter that calculates gained;

Step 5) utilize the test circuit of building to carry out oscillation mode impulse voltage withstand test to GIS.