CN103604829A - Test system and test method for normal emissivity of solar selective coating - Google Patents

Test system and test method for normal emissivity of solar selective coating Download PDF

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Publication number
CN103604829A
CN103604829A CN201310636311.2A CN201310636311A CN103604829A CN 103604829 A CN103604829 A CN 103604829A CN 201310636311 A CN201310636311 A CN 201310636311A CN 103604829 A CN103604829 A CN 103604829A
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vacuum
computer processor
vacuum chamber
heating
solar selective
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CN103604829B (en
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谭卓鹏
沈剑山
周福云
邓金雁
贺冬枚
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CAMDA NEW ENERGY EQUIPMENT Co Ltd
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CAMDA NEW ENERGY EQUIPMENT Co Ltd
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Abstract

The invention discloses a test system and a test method for normal emissivity of a solar selective coating. The test system comprises a vacuum heating mechanism, a black body, a temperature control mechanism, a measuring mechanism, a driving mechanism and a computer processing mechanism, wherein the temperature control mechanism controls running of the vacuum heating mechanism and the black body, the driving mechanism drives running of the measuring mechanism, and the measuring mechanism detects energy of a to-be-tested sample and the black body respectively, converts detected energy into a voltage signal and sends the voltage signal to the computer processing mechanism. The test system has the advantages of simpleness, low cost, stable performance and convenient operation, and the test method the advantages of easiness, reliable technology and high test efficiency.

Description

Solar selective coat normal emittance test macro and method of testing
Technical field
The present invention relates to emissivity measurement technical field, particularly relate to a kind of solar selective coat normal emittance test macro and method of testing.
Background technology
Under heat radiator normal to a surface direction spectral radiance and uniform temp, the ratio of the normal direction spectral radiance of black matrix is called For Normal Spectral Emittance.If to normal emittance specified wavelength λ 1-λ 2 scopes, be called normal direction band emission rate or normal direction integrated emissivity.The measurement result of normal direction integrated emissivity is only a numerical value, is therefore convenient to the comparison between different sample measurement results, is widely used.
Normal emittance is the thermal radiation capability that has characterized coating, and it is relevant with the factors such as wavelength of the component of material, surface condition, temperature, investigation, so it is the multivariate function, and Measurement accuracy is very difficult.The ultimate principle that energy method is surveyed emissivity is directly to measure the emittance of sample, can calculate the emissivity of sample according to Planck or Stefan-Boltzmann law and emissivity definition.Due to the larger error of measurement existence of absolute radiation energy, so the main energy comparison that adopts is measured at present,, under same temperature, measure respectively the emittance of black matrix and sample, calculate both ratio.
It is measuring system that the energy method emissivity equipment of recent domestic mainly adopts Fourier analysis spectrometer.As the energy method that document Journal of Physics:Conference Series 13 (2005) 63 – 66 provide is surveyed normal emittance device, can realize the For Normal Spectral Emittance of wavelength coverage 0.6 ~ 25 μ m and temperature range 60-1500 ℃, but Fourier analysis spectrometer complex structure and cost are expensive, and it is large that technology realizes difficulty.During work, this kind equipment first carries out light-splitting processing by interferometer to the emittance of sample, measure spectrum emissivity then, so testing efficiency is low.
Adopt the spendable at low temperatures device of special measuring system seldom; the device that patent CN202794079U provides can be measured 90 ℃ of following normal emittances; but this device, after using certain hour, needs shutdown to carry out cooling, and its measuring accuracy and stability are unsatisfactory as seen.
Summary of the invention
Based on this, be necessary for the problem of the shortcoming of prior art and meet the needs in trough type solar power generation field, a kind of solar selective coat normal emittance test macro and method of testing are provided, realize the measurement of the coating normal emittance within the scope of 300~600 ℃ of wavelength coverage 0.4~10.4 μ m, temperature, equipment is simple, with low cost, technology is reliable, testing efficiency is high.
A solar selective coat normal emittance test macro, comprising:
Heating in vacuum mechanism, for vacuum environment is provided, and heats testing sample;
Black matrix, described black matrix is cylindrical cavity formula structure, is provided with the first thermopair in the cavity of described black matrix;
Temperature control mechanism, for controlling described heating in vacuum organisation operations;
Measuring mechanism, for measuring the energy of testing sample and described black matrix, and becomes voltage signal by surveyed energy conversion;
Driving mechanism, for driving described measuring mechanism running;
Computer processor structure, for showing and manipulate measurement data, and stores result;
Described heating in vacuum mechanism and the first thermopair are all electrically connected at described temperature control mechanism; Described measuring mechanism is located at the top position of described heating in vacuum mechanism, and described black matrix is positioned at the sidepiece of described measuring mechanism; Described driving mechanism and computer processor structure are all electrically connected at described measuring mechanism; Described temperature control mechanism is controlled described heating in vacuum mechanism and the running of the first thermopair, described driving mechanism drives described measuring mechanism running, described measuring mechanism is surveyed the energy of testing sample and black matrix respectively, and is sent to described computer processor structure after the energy conversion of detection is become to voltage signal.
Therein in an embodiment, described heating in vacuum mechanism comprises vacuum chamber and is located at the warm table in described vacuum chamber, described vacuum chamber is provided with vacuum interface and electric interfaces, described vacuum chamber is connected with vacuum suction unit through described vacuum interface, and described warm table is connected in described temperature control mechanism through electric interfaces.
In an embodiment, the locular wall of described vacuum chamber is water-cooling structure therein, offers recirculated water entrance, circulating water outlet and calcium fluoride window on described locular wall; In described warm table, be provided with the second thermopair.
In an embodiment, described temperature control mechanism comprises PID temperature controller and relay therein, and described PID temperature controller is electrically connected at described computer processor structure, and described relay is electrically connected at described PID temperature controller.
Therein in an embodiment, described measuring mechanism comprises detector, lock-in amplifier and data collecting card, described detector be positioned at described heating in vacuum mechanism directly over, described lock-in amplifier is electrically connected at described detector, and described data collecting card is electrically connected at described lock-in amplifier.
In an embodiment, described detector is connected with stepper motor therein, and described stepper motor is electrically connected at described driving mechanism, and described driving mechanism drives stepper motor to rotate.
In an embodiment, the end of probe of described detector is provided with water-cooled grating outward therein.
Therein in an embodiment, described computer processor structure comprises display module, processing module and memory module, described display module is used for showing test data and can carries out parameter input, described processing module is for test data is processed, and described memory module is for the data after stores processor.
A method of testing for solar selective coat normal emittance, comprises the following steps:
1., calibration testing;
2., testing sample is placed on described warm table, and close door for vacuum chamber;
3., start to vacuumize, treat that the pressure in vacuum chamber reaches 10 -3during Pa, the recirculated cooling water in the locular wall of unlatching vacuum chamber, sets heating-up temperature and starts to be heated to black matrix identical with the temperature of setting with the temperature of testing sample by computer processor structure;
4., described detector first detects the energy of testing sample, and converts voltage signal V to through described lock-in amplifier s, by described data collecting card by voltage signal V safter collection, be sent to described computer processor structure and show through described display module; Meanwhile, driving mechanism drives described stepping electricity to enter running described in described data acquisition card control, and then drives described detector rotation, and the energy of described black matrix is surveyed, and the energy of surveying converts voltage signal V to through described lock-in amplifier b, by described data collecting card by voltage signal V bafter collection, be sent to described computer processor structure and show through described display module;
5., described processing module is to V sand V bprocess, can obtain normal emittance ε=V s/ V b;
6., to V sand V bnumerical measuring more than three times, draws different ε values, averages and can obtain the integration normal emittance of testing sample;
7., stop heating, stop described vacuum suction unit simultaneously, take out testing sample, complete test.
In an embodiment, 1. step specifically comprises the following steps therein:
Vacuum suction unit is connected in to the vacuum interface of described vacuum chamber, standard white plate is placed on described warm table, close door for vacuum chamber;
Open vacuum suction unit and computer processor structure, treat that at normal temperatures the pressure in vacuum chamber reaches 10 -3pa, measures standard white plate, by computer processor structure realization calibration and background noise, deducts.
Close vacuum suction unit, take out standard white plate, complete calibration.
Above-mentioned solar selective coat normal emittance test macro and method of testing, test macro is simple, easy to use, has improved measuring accuracy and stability.Described heating in vacuum mechanism and vacuum suction unit are quick type of attachment, have optimized the resource distribution of vacuum suction unit.Between heating in vacuum mechanism and detector, be mounted with water-cooled grating, reduced environmental radiation.Its method of testing is simple, reliable, convenient operation, and test result is accurate.
The present invention is applicable to the normal emittance of coating within the scope of 300~600 ℃ of scopes of temperature, wavelength 0.4~10.6 μ m and measures, and controls accurately, measures test result accurate, and cost of testing system is relatively cheap, and technology is simple and reliable, stable performance, and testing efficiency is high.
Accompanying drawing explanation
Fig. 1 is test system structure schematic diagram of the present invention.
Fig. 2 is method of testing process flow diagram of the present invention.
Below parts sign flag explanation of the present invention:
Heating in vacuum mechanism 10, vacuum chamber 11, vacuum interface 12, electric interfaces 13, recirculated water entrance 14, circulating water outlet 15, calcium fluoride window 16, warm table 17, the second thermopair 18, black matrix 20, the first thermopair 21, temperature control mechanism 30, PID temperature controller 31, relay 32, measuring mechanism 40, detector 41, water-cooled grating 42, lock-in amplifier 43, data collecting card 44, driving mechanism 50, stepper motor 51, computer processor structure 60, display module 61, processing module 62, memory module 63.
Embodiment
For further understanding feature of the present invention, technological means and the specific purposes that reach, function, resolve the advantages and spirit of the present invention, by below in conjunction with accompanying drawing and embodiment, detailed description of the present invention being further understood.
A solar selective coat normal emittance test macro, comprising: heating in vacuum mechanism 10, black matrix 20, temperature control mechanism 30, measuring mechanism 40, driving mechanism 50 and computer processor structure 60.Black matrix 20 is cylindrical cavity formula structure, is provided with silicon-carbon heating plate and the first thermopair 21, the first thermopairs 21 are fixed on silicon-carbon plate heating plate center in the cavity of black matrix 20.
Heating in vacuum mechanism 10 and the first thermopair 21 are all electrically connected at temperature control mechanism 30; Measuring mechanism 40 is located at the top position of heating in vacuum mechanism 10, and black matrix 20 is positioned at the sidepiece of measuring mechanism 40; Driving mechanism 50 and computer processor structure 60 are all electrically connected at measuring mechanism 40.Temperature control mechanism 30 is controlled
10 runnings of heating in vacuum mechanism, driving mechanism 50 drives measuring mechanism 40 runnings, and measuring mechanism 40 is surveyed the energy of testing sample and black matrix 20 respectively, and is sent to computer processor structure 60 after the energy conversion of detection is become to voltage signal.
Heating in vacuum mechanism 10, for vacuum environment is provided, and heats testing sample.Heating in vacuum mechanism 10 comprises vacuum chamber 11 and is located at the warm table 17 in vacuum chamber 11.Vacuum chamber 11 is provided with vacuum interface 12 and electric interfaces 13, and vacuum chamber 11 is connected with vacuum suction unit through vacuum interface 12, and warm table 17 is connected in temperature control mechanism 30 through electric interfaces 13.
The locular wall of vacuum chamber 11 is water-cooling structure, offers recirculated water entrance 14, circulating water outlet 15 and calcium fluoride window 16 on locular wall.Adopt water-cooling structure, prevent that locular wall is overheated, the inner side of locular wall is through polishing, to reduce environment stray radiation.Calcium fluoride window 16 is positioned at the top of vacuum chamber 11.
Vacuum chamber 11 is connected by rapid-acting coupling with vacuum suction unit, and when not doing normal emittance test, vacuum suction unit can carry out other vacuum suction work, has optimized resource distribution.
In warm table 17, be provided with the center that the second thermopair 18, the second thermopairs 18 are fixed on warm table 17, warm table 17, with heat exchange pattern heating, guarantees uniformity of temperature profile.
Temperature control mechanism 30, for controlling 10 runnings of heating in vacuum mechanism.Temperature control mechanism 30 comprises PID temperature controller 31 and relay 32.PID temperature controller 31 is electrically connected at computer processor structure 60, and relay 32 is electrically connected at PID temperature controller 31, and described the first thermopair 21 and the second thermopair 18 are all electrically connected with relay 32.PID temperature controller 31, for temperature control and demonstration, can be heated to 600 ℃ and maintenance by room temperature by vacuum chamber 11 in 30min.The first thermopair 21 and the second thermopair 18 are sent to relay 32 by the temperature signal of measurement, and the temperature value that relay 32 is inputted according to PID temperature controller 31 rises to design temperature from the temperature of motion tracking warm table 17.Temperature is controlled by PID temperature controller 31 and is controlled and realize.
Measuring mechanism 40, for measuring the energy of testing sample and black matrix 20, and becomes voltage signal by surveyed energy conversion.Measuring mechanism 40 comprises detector 41, lock-in amplifier 43 and data collecting card 44.Detector 41 be positioned at heating in vacuum mechanism 10 directly over, face calcium fluoride window 16.Lock-in amplifier 43 is electrically connected at detector 41, and data collecting card 44 is electrically connected at lock-in amplifier 43.Detector 41 is connected with stepper motor 51, and stepper motor 51 is electrically connected at driving mechanism 50, and driving mechanism 50 drives stepper motor 51 to rotate, and stepper motor 51 drives detector 41 rotations, to survey respectively the energy of black matrix 20 and testing sample.
Detector 41 is light quantity subtype semiconductor refrigeration type, and steady operation, does not affect measuring accuracy for a long time.The end of probe of detector 41 is provided with water-cooled grating 42 outward, to reduce environmental radiation.
Driving mechanism 50, for driving measuring mechanism 40 runnings.Detector 41 first detects the energy of testing sample, and after detection, data collecting card 44 is controlled driving mechanism 50 and driven stepping electricity to enter running, and then drives detector 41 rotations, and the energy of black matrix 20 is surveyed.
Computer processor structure 60, for showing and manipulate measurement data, and by result storage, carries out centralized control by emissivity measurement software, carries out parameter input, data display and processing, storage etc.Computer processor structure 60 comprises display module 61, processing module 62 and memory module 63.Display module 61 is for showing test data and can carrying out parameter input, and processing module 62 is for test data is processed, and memory module 63 is for the data after stores processor.
Detector 41 first detects the energy of testing sample, and converts voltage signal V to through lock-in amplifier 43 s, by data collecting card 44 by voltage signal V safter collection, be sent to computer processor structure 60 and show through display module 61.Meanwhile, data collecting card 44 is controlled driving mechanisms 50 and is driven stepping electricity to enter running, and then drives detector 41 rotations, and the energy of black matrix 20 is surveyed, and the energy of surveying converts voltage signal V to through lock-in amplifier 43 b, by data collecting card 44 by voltage signal V bafter collection, be sent to computer processor structure 60 and show through display module 61.62 couples of Vs of processing module and Vb process, because of under same temperature, the Voltage-output signal of detector 41 and the emittance of testing sample are linear, so testing sample and the ratio of the energy of black matrix 20 can convert the ratio of the magnitude of voltage of detector 41 to, can obtain normal emittance ε=V s/ V b.
Test macro based on solar selective coat normal emittance, its method of testing comprises the following steps:
S1, calibration testing; This step specifically comprises following three steps
S1-1, vacuum suction unit is connected in to the vacuum interface 12 of described vacuum chamber 11, standard white plate is placed on described warm table 17, close 11 of vacuum chambers;
S1-2, unlatching vacuum suction unit and computer processor structure 60, treat that the pressure in vacuum chamber 11 reaches 10 at normal temperatures -3pa, measures standard white plate, all crosses computer processor structure 60 and realizes calibration and background noise deduction.
S1-3, close vacuum suction unit, take out standard white plate, complete calibration.
S2, testing sample is placed on described warm table 17, and closes 11 of vacuum chambers;
S3, start to vacuumize, treat that the pressure in vacuum chamber 11 reaches 10 -3during Pa, the recirculated cooling water in the locular wall of unlatching vacuum chamber 11, sets heating-up temperature and starts to be heated to black matrix 20 identical with the temperature of setting with the temperature of testing sample by computer processor structure;
S4, described detector 41 first detect the energy of testing sample, and convert voltage signal V to through described lock-in amplifier 43 s, by described data collecting card 44 by voltage signal V safter collection, be sent to described computer processor structure 60 and show through described display module 61; Simultaneously, described data collecting card 44 is controlled described driving mechanism 50 and is driven described stepping electricity to enter running, and then drive 41 rotations of described detector, and and the energy of described black matrix 20 to be surveyed, the energy of surveying converts voltage signal V to through described lock-in amplifier 43 b, by described data collecting card 44 by voltage signal V bafter collection, be sent to described computer processor structure 60 and show through described display module 61;
S5,62 couples of V of described processing module sand V bprocess, can obtain normal emittance ε=V s/ V b;
S6, to V sand V bnumerical measuring more than three times, draws different ε values, averages and can obtain the integration normal emittance of testing sample;
S7, stop heating, stop described vacuum suction unit simultaneously, take out testing sample, complete test.
In sum, above-mentioned solar selective coat normal emittance test macro and method of testing, test macro is simple, easy to use, has improved measuring accuracy and stability.Described heating in vacuum mechanism 10 and vacuum suction unit are quick type of attachment, have optimized the resource distribution of vacuum suction unit.Between heating in vacuum mechanism 10 and detector 41, be mounted with water-cooled grating 42, reduced environmental radiation.Its method of testing is simple, reliable, convenient operation, and test result is accurate.
The present invention is applicable to the normal emittance that quick variation and the temperature of coating within the scope of 300~600 ℃ of temperature control accurately, measure within the scope of wavelength 0.4~10.6 μ m and measures, test result is accurate, and cost of testing system is relatively cheap, and technology is simple and reliable, stable performance, testing efficiency is high.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.

Claims (10)

1. a solar selective coat normal emittance test macro, is characterized in that, comprising:
Heating in vacuum mechanism, for vacuum environment is provided, and heats testing sample;
Black matrix, described black matrix is cylindrical cavity formula structure, is provided with the first thermopair in the cavity of described black matrix;
Temperature control mechanism, for controlling described heating in vacuum mechanism and the running of the first thermopair;
Measuring mechanism, for measuring the energy of testing sample and described black matrix, and becomes voltage signal by surveyed energy conversion;
Driving mechanism, for driving described measuring mechanism running;
Computer processor structure, for showing and manipulate measurement data, and stores result;
Described heating in vacuum mechanism and the first thermopair are all electrically connected at described temperature control mechanism; Described measuring mechanism is located at the top position of described heating in vacuum mechanism, and described black matrix is positioned at the sidepiece of described measuring mechanism; Described driving mechanism and computer processor structure are all electrically connected at described measuring mechanism; Described temperature control mechanism is controlled described heating in vacuum organisation operations, described driving mechanism drives described measuring mechanism running, described measuring mechanism is surveyed the energy of testing sample and black matrix respectively, and is sent to described computer processor structure after the energy conversion of detection is become to voltage signal.
2. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described heating in vacuum mechanism comprises vacuum chamber and is located at the warm table in described vacuum chamber, described vacuum chamber is provided with vacuum interface and electric interfaces, described vacuum chamber is connected with vacuum suction unit through described vacuum interface, and described warm table is connected in described temperature control mechanism through electric interfaces.
3. solar selective coat normal emittance test macro according to claim 2, is characterized in that, the locular wall of described vacuum chamber is water-cooling structure, offers recirculated water entrance, circulating water outlet and calcium fluoride window on described locular wall; In described warm table, be provided with the second thermopair.
4. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described temperature control mechanism comprises PID temperature controller and relay, described PID temperature controller is electrically connected at described computer processor structure, and described relay is electrically connected at described PID temperature controller.
5. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described measuring mechanism comprises detector, lock-in amplifier and data collecting card, described detector be positioned at described heating in vacuum mechanism directly over, described lock-in amplifier is electrically connected at described detector, and described data collecting card is electrically connected at described lock-in amplifier.
6. solar selective coat normal emittance test macro according to claim 5, is characterized in that, described detector is connected with stepper motor, and described stepper motor is electrically connected at described driving mechanism, and described driving mechanism drives stepper motor to rotate.
7. solar selective coat normal emittance test macro according to claim 5, is characterized in that, the end of probe of described detector is provided with water-cooled grating outward.
8. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described computer processor structure comprises display module, processing module and memory module, described display module is used for showing test data and can carries out parameter input, described processing module is for test data is processed, and described memory module is for the data after stores processor.
9. a method of testing for solar selective coat normal emittance, is characterized in that, comprises the following steps:
1., calibration testing;
2., testing sample is placed on described warm table, and close door for vacuum chamber;
3., start to vacuumize, treat that the pressure in vacuum chamber reaches 10 -3during Pa, the recirculated cooling water in the locular wall of unlatching vacuum chamber, sets heating-up temperature and starts to be heated to black matrix identical with the temperature of setting with the temperature of testing sample by computer processor structure;
4., described detector first detects the energy of testing sample, and converts voltage signal V to through described lock-in amplifier s, by described data collecting card by voltage signal V safter collection, be sent to described computer processor structure and show through described display module; Meanwhile, driving mechanism drives described stepping electricity to enter running described in described data acquisition card control, and then drives described detector rotation, and the energy of described black matrix is surveyed, and the energy of surveying converts voltage signal V to through described lock-in amplifier b, by described data collecting card by voltage signal V bafter collection, be sent to described computer processor structure and show through described display module;
5., described processing module is to V sand V bprocess, can obtain normal emittance ε=V s/ V b;
6., to V sand V bnumerical measuring more than three times, draws different ε values, averages and can obtain the wave band normal emittance of testing sample;
7., stop heating, stop described vacuum suction unit simultaneously, take out testing sample, complete test.
10. the method for testing of solar selective coat normal emittance according to claim 9, is characterized in that, 1. step specifically comprises the following steps:
Vacuum suction unit is connected in to the vacuum interface of described vacuum chamber, standard white plate is placed on described warm table, close door for vacuum chamber;
Open vacuum suction unit and computer processor structure, treat that at normal temperatures the pressure in vacuum chamber reaches 10 -3pa, measures standard white plate, by computer processor structure realization calibration and background noise, deducts;
Close vacuum suction unit, take out standard white plate, complete calibration.
CN201310636311.2A 2013-12-03 2013-12-03 Solar selective coat normal emittance test macro and method of testing Expired - Fee Related CN103604829B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109521039A (en) * 2018-11-21 2019-03-26 哈尔滨工业大学 The vacuum plant and method of the print heater of solid material high temperature emissive rate measurement

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000036468A (en) * 1998-07-17 2000-02-02 Dainippon Screen Mfg Co Ltd Substrate processor and substrate processing method therefor
CN102042993A (en) * 2010-11-23 2011-05-04 清华大学 System for measuring normal spectral emissivity of high-temperature material
CN102095750A (en) * 2010-12-17 2011-06-15 中国计量科学研究院 Device and method for measuring IR (infrared ray) normal emittance
CN202794079U (en) * 2012-05-18 2013-03-13 北京星达科技发展有限公司 Normal emissivity detecting equipment
CN203011815U (en) * 2013-01-16 2013-06-19 锦州阳光气象科技有限公司 Material normal emission ratio test system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000036468A (en) * 1998-07-17 2000-02-02 Dainippon Screen Mfg Co Ltd Substrate processor and substrate processing method therefor
CN102042993A (en) * 2010-11-23 2011-05-04 清华大学 System for measuring normal spectral emissivity of high-temperature material
CN102095750A (en) * 2010-12-17 2011-06-15 中国计量科学研究院 Device and method for measuring IR (infrared ray) normal emittance
CN202794079U (en) * 2012-05-18 2013-03-13 北京星达科技发展有限公司 Normal emissivity detecting equipment
CN203011815U (en) * 2013-01-16 2013-06-19 锦州阳光气象科技有限公司 Material normal emission ratio test system

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
于洋 等: "中温法向发射率测试方法研究", 《中国空间科学学会空间材料专业委员会2009学术交流会》, 31 December 2009 (2009-12-31), pages 288 - 292 *
刘宝明 等: "材料法向光谱发射率测定装置", 《计量学报》, vol. 7, no. 3, 31 July 1986 (1986-07-31), pages 204 - 210 *
原遵东 等: "材料光谱发射率精密测量装置", 《仪器仪表学报》, vol. 29, no. 8, 31 August 2008 (2008-08-31), pages 1660 - 1664 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109521039A (en) * 2018-11-21 2019-03-26 哈尔滨工业大学 The vacuum plant and method of the print heater of solid material high temperature emissive rate measurement

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CF01 Termination of patent right due to non-payment of annual fee