CN103604829A - Test system and test method for normal emissivity of solar selective coating - Google Patents
Test system and test method for normal emissivity of solar selective coating Download PDFInfo
- Publication number
- CN103604829A CN103604829A CN201310636311.2A CN201310636311A CN103604829A CN 103604829 A CN103604829 A CN 103604829A CN 201310636311 A CN201310636311 A CN 201310636311A CN 103604829 A CN103604829 A CN 103604829A
- Authority
- CN
- China
- Prior art keywords
- vacuum
- computer processor
- vacuum chamber
- heating
- solar selective
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 77
- 238000010998 test method Methods 0.000 title claims abstract description 14
- 239000011248 coating agent Substances 0.000 title abstract description 6
- 238000000576 coating method Methods 0.000 title abstract description 6
- 230000007246 mechanism Effects 0.000 claims abstract description 101
- 238000010438 heat treatment Methods 0.000 claims abstract description 35
- 230000009183 running Effects 0.000 claims abstract description 17
- 238000012545 processing Methods 0.000 claims abstract description 15
- 239000000523 sample Substances 0.000 claims description 37
- 239000011159 matrix material Substances 0.000 claims description 31
- 238000005259 measurement Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 8
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 claims description 6
- 229910001634 calcium fluoride Inorganic materials 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 6
- 239000004576 sand Substances 0.000 claims description 6
- 238000001816 cooling Methods 0.000 claims description 5
- 230000005611 electricity Effects 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 4
- 239000000498 cooling water Substances 0.000 claims description 3
- 238000005516 engineering process Methods 0.000 abstract description 6
- 230000005855 radiation Effects 0.000 description 6
- 230000003595 spectral effect Effects 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 3
- HMDDXIMCDZRSNE-UHFFFAOYSA-N [C].[Si] Chemical compound [C].[Si] HMDDXIMCDZRSNE-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Abstract
The invention discloses a test system and a test method for normal emissivity of a solar selective coating. The test system comprises a vacuum heating mechanism, a black body, a temperature control mechanism, a measuring mechanism, a driving mechanism and a computer processing mechanism, wherein the temperature control mechanism controls running of the vacuum heating mechanism and the black body, the driving mechanism drives running of the measuring mechanism, and the measuring mechanism detects energy of a to-be-tested sample and the black body respectively, converts detected energy into a voltage signal and sends the voltage signal to the computer processing mechanism. The test system has the advantages of simpleness, low cost, stable performance and convenient operation, and the test method the advantages of easiness, reliable technology and high test efficiency.
Description
Technical field
The present invention relates to emissivity measurement technical field, particularly relate to a kind of solar selective coat normal emittance test macro and method of testing.
Background technology
Under heat radiator normal to a surface direction spectral radiance and uniform temp, the ratio of the normal direction spectral radiance of black matrix is called For Normal Spectral Emittance.If to normal emittance specified wavelength λ 1-λ 2 scopes, be called normal direction band emission rate or normal direction integrated emissivity.The measurement result of normal direction integrated emissivity is only a numerical value, is therefore convenient to the comparison between different sample measurement results, is widely used.
Normal emittance is the thermal radiation capability that has characterized coating, and it is relevant with the factors such as wavelength of the component of material, surface condition, temperature, investigation, so it is the multivariate function, and Measurement accuracy is very difficult.The ultimate principle that energy method is surveyed emissivity is directly to measure the emittance of sample, can calculate the emissivity of sample according to Planck or Stefan-Boltzmann law and emissivity definition.Due to the larger error of measurement existence of absolute radiation energy, so the main energy comparison that adopts is measured at present,, under same temperature, measure respectively the emittance of black matrix and sample, calculate both ratio.
It is measuring system that the energy method emissivity equipment of recent domestic mainly adopts Fourier analysis spectrometer.As the energy method that document Journal of Physics:Conference Series 13 (2005) 63 – 66 provide is surveyed normal emittance device, can realize the For Normal Spectral Emittance of wavelength coverage 0.6 ~ 25 μ m and temperature range 60-1500 ℃, but Fourier analysis spectrometer complex structure and cost are expensive, and it is large that technology realizes difficulty.During work, this kind equipment first carries out light-splitting processing by interferometer to the emittance of sample, measure spectrum emissivity then, so testing efficiency is low.
Adopt the spendable at low temperatures device of special measuring system seldom; the device that patent CN202794079U provides can be measured 90 ℃ of following normal emittances; but this device, after using certain hour, needs shutdown to carry out cooling, and its measuring accuracy and stability are unsatisfactory as seen.
Summary of the invention
Based on this, be necessary for the problem of the shortcoming of prior art and meet the needs in trough type solar power generation field, a kind of solar selective coat normal emittance test macro and method of testing are provided, realize the measurement of the coating normal emittance within the scope of 300~600 ℃ of wavelength coverage 0.4~10.4 μ m, temperature, equipment is simple, with low cost, technology is reliable, testing efficiency is high.
A solar selective coat normal emittance test macro, comprising:
Heating in vacuum mechanism, for vacuum environment is provided, and heats testing sample;
Black matrix, described black matrix is cylindrical cavity formula structure, is provided with the first thermopair in the cavity of described black matrix;
Temperature control mechanism, for controlling described heating in vacuum organisation operations;
Measuring mechanism, for measuring the energy of testing sample and described black matrix, and becomes voltage signal by surveyed energy conversion;
Driving mechanism, for driving described measuring mechanism running;
Computer processor structure, for showing and manipulate measurement data, and stores result;
Described heating in vacuum mechanism and the first thermopair are all electrically connected at described temperature control mechanism; Described measuring mechanism is located at the top position of described heating in vacuum mechanism, and described black matrix is positioned at the sidepiece of described measuring mechanism; Described driving mechanism and computer processor structure are all electrically connected at described measuring mechanism; Described temperature control mechanism is controlled described heating in vacuum mechanism and the running of the first thermopair, described driving mechanism drives described measuring mechanism running, described measuring mechanism is surveyed the energy of testing sample and black matrix respectively, and is sent to described computer processor structure after the energy conversion of detection is become to voltage signal.
Therein in an embodiment, described heating in vacuum mechanism comprises vacuum chamber and is located at the warm table in described vacuum chamber, described vacuum chamber is provided with vacuum interface and electric interfaces, described vacuum chamber is connected with vacuum suction unit through described vacuum interface, and described warm table is connected in described temperature control mechanism through electric interfaces.
In an embodiment, the locular wall of described vacuum chamber is water-cooling structure therein, offers recirculated water entrance, circulating water outlet and calcium fluoride window on described locular wall; In described warm table, be provided with the second thermopair.
In an embodiment, described temperature control mechanism comprises PID temperature controller and relay therein, and described PID temperature controller is electrically connected at described computer processor structure, and described relay is electrically connected at described PID temperature controller.
Therein in an embodiment, described measuring mechanism comprises detector, lock-in amplifier and data collecting card, described detector be positioned at described heating in vacuum mechanism directly over, described lock-in amplifier is electrically connected at described detector, and described data collecting card is electrically connected at described lock-in amplifier.
In an embodiment, described detector is connected with stepper motor therein, and described stepper motor is electrically connected at described driving mechanism, and described driving mechanism drives stepper motor to rotate.
In an embodiment, the end of probe of described detector is provided with water-cooled grating outward therein.
Therein in an embodiment, described computer processor structure comprises display module, processing module and memory module, described display module is used for showing test data and can carries out parameter input, described processing module is for test data is processed, and described memory module is for the data after stores processor.
A method of testing for solar selective coat normal emittance, comprises the following steps:
1., calibration testing;
2., testing sample is placed on described warm table, and close door for vacuum chamber;
3., start to vacuumize, treat that the pressure in vacuum chamber reaches 10
-3during Pa, the recirculated cooling water in the locular wall of unlatching vacuum chamber, sets heating-up temperature and starts to be heated to black matrix identical with the temperature of setting with the temperature of testing sample by computer processor structure;
4., described detector first detects the energy of testing sample, and converts voltage signal V to through described lock-in amplifier
s, by described data collecting card by voltage signal V
safter collection, be sent to described computer processor structure and show through described display module; Meanwhile, driving mechanism drives described stepping electricity to enter running described in described data acquisition card control, and then drives described detector rotation, and the energy of described black matrix is surveyed, and the energy of surveying converts voltage signal V to through described lock-in amplifier
b, by described data collecting card by voltage signal V
bafter collection, be sent to described computer processor structure and show through described display module;
5., described processing module is to V
sand V
bprocess, can obtain normal emittance ε=V
s/ V
b;
6., to V
sand V
bnumerical measuring more than three times, draws different ε values, averages and can obtain the integration normal emittance of testing sample;
7., stop heating, stop described vacuum suction unit simultaneously, take out testing sample, complete test.
In an embodiment, 1. step specifically comprises the following steps therein:
Vacuum suction unit is connected in to the vacuum interface of described vacuum chamber, standard white plate is placed on described warm table, close door for vacuum chamber;
Open vacuum suction unit and computer processor structure, treat that at normal temperatures the pressure in vacuum chamber reaches 10
-3pa, measures standard white plate, by computer processor structure realization calibration and background noise, deducts.
Close vacuum suction unit, take out standard white plate, complete calibration.
Above-mentioned solar selective coat normal emittance test macro and method of testing, test macro is simple, easy to use, has improved measuring accuracy and stability.Described heating in vacuum mechanism and vacuum suction unit are quick type of attachment, have optimized the resource distribution of vacuum suction unit.Between heating in vacuum mechanism and detector, be mounted with water-cooled grating, reduced environmental radiation.Its method of testing is simple, reliable, convenient operation, and test result is accurate.
The present invention is applicable to the normal emittance of coating within the scope of 300~600 ℃ of scopes of temperature, wavelength 0.4~10.6 μ m and measures, and controls accurately, measures test result accurate, and cost of testing system is relatively cheap, and technology is simple and reliable, stable performance, and testing efficiency is high.
Accompanying drawing explanation
Fig. 1 is test system structure schematic diagram of the present invention.
Fig. 2 is method of testing process flow diagram of the present invention.
Below parts sign flag explanation of the present invention:
Heating in vacuum mechanism 10, vacuum chamber 11, vacuum interface 12, electric interfaces 13, recirculated water entrance 14, circulating water outlet 15, calcium fluoride window 16, warm table 17, the second thermopair 18, black matrix 20, the first thermopair 21, temperature control mechanism 30, PID temperature controller 31, relay 32, measuring mechanism 40, detector 41, water-cooled grating 42, lock-in amplifier 43, data collecting card 44, driving mechanism 50, stepper motor 51, computer processor structure 60, display module 61, processing module 62, memory module 63.
Embodiment
For further understanding feature of the present invention, technological means and the specific purposes that reach, function, resolve the advantages and spirit of the present invention, by below in conjunction with accompanying drawing and embodiment, detailed description of the present invention being further understood.
A solar selective coat normal emittance test macro, comprising: heating in vacuum mechanism 10, black matrix 20, temperature control mechanism 30, measuring mechanism 40, driving mechanism 50 and computer processor structure 60.Black matrix 20 is cylindrical cavity formula structure, is provided with silicon-carbon heating plate and the first thermopair 21, the first thermopairs 21 are fixed on silicon-carbon plate heating plate center in the cavity of black matrix 20.
Heating in vacuum mechanism 10 and the first thermopair 21 are all electrically connected at temperature control mechanism 30; Measuring mechanism 40 is located at the top position of heating in vacuum mechanism 10, and black matrix 20 is positioned at the sidepiece of measuring mechanism 40; Driving mechanism 50 and computer processor structure 60 are all electrically connected at measuring mechanism 40.Temperature control mechanism 30 is controlled
10 runnings of heating in vacuum mechanism, driving mechanism 50 drives measuring mechanism 40 runnings, and measuring mechanism 40 is surveyed the energy of testing sample and black matrix 20 respectively, and is sent to computer processor structure 60 after the energy conversion of detection is become to voltage signal.
Heating in vacuum mechanism 10, for vacuum environment is provided, and heats testing sample.Heating in vacuum mechanism 10 comprises vacuum chamber 11 and is located at the warm table 17 in vacuum chamber 11.Vacuum chamber 11 is provided with vacuum interface 12 and electric interfaces 13, and vacuum chamber 11 is connected with vacuum suction unit through vacuum interface 12, and warm table 17 is connected in temperature control mechanism 30 through electric interfaces 13.
The locular wall of vacuum chamber 11 is water-cooling structure, offers recirculated water entrance 14, circulating water outlet 15 and calcium fluoride window 16 on locular wall.Adopt water-cooling structure, prevent that locular wall is overheated, the inner side of locular wall is through polishing, to reduce environment stray radiation.Calcium fluoride window 16 is positioned at the top of vacuum chamber 11.
In warm table 17, be provided with the center that the second thermopair 18, the second thermopairs 18 are fixed on warm table 17, warm table 17, with heat exchange pattern heating, guarantees uniformity of temperature profile.
Test macro based on solar selective coat normal emittance, its method of testing comprises the following steps:
S1, calibration testing; This step specifically comprises following three steps
S1-1, vacuum suction unit is connected in to the vacuum interface 12 of described vacuum chamber 11, standard white plate is placed on described warm table 17, close 11 of vacuum chambers;
S1-2, unlatching vacuum suction unit and computer processor structure 60, treat that the pressure in vacuum chamber 11 reaches 10 at normal temperatures
-3pa, measures standard white plate, all crosses computer processor structure 60 and realizes calibration and background noise deduction.
S1-3, close vacuum suction unit, take out standard white plate, complete calibration.
S2, testing sample is placed on described warm table 17, and closes 11 of vacuum chambers;
S3, start to vacuumize, treat that the pressure in vacuum chamber 11 reaches 10
-3during Pa, the recirculated cooling water in the locular wall of unlatching vacuum chamber 11, sets heating-up temperature and starts to be heated to black matrix 20 identical with the temperature of setting with the temperature of testing sample by computer processor structure;
S4, described detector 41 first detect the energy of testing sample, and convert voltage signal V to through described lock-in amplifier 43
s, by described data collecting card 44 by voltage signal V
safter collection, be sent to described computer processor structure 60 and show through described display module 61; Simultaneously, described data collecting card 44 is controlled described driving mechanism 50 and is driven described stepping electricity to enter running, and then drive 41 rotations of described detector, and and the energy of described black matrix 20 to be surveyed, the energy of surveying converts voltage signal V to through described lock-in amplifier 43
b, by described data collecting card 44 by voltage signal V
bafter collection, be sent to described computer processor structure 60 and show through described display module 61;
S5,62 couples of V of described processing module
sand V
bprocess, can obtain normal emittance ε=V
s/ V
b;
S6, to V
sand V
bnumerical measuring more than three times, draws different ε values, averages and can obtain the integration normal emittance of testing sample;
S7, stop heating, stop described vacuum suction unit simultaneously, take out testing sample, complete test.
In sum, above-mentioned solar selective coat normal emittance test macro and method of testing, test macro is simple, easy to use, has improved measuring accuracy and stability.Described heating in vacuum mechanism 10 and vacuum suction unit are quick type of attachment, have optimized the resource distribution of vacuum suction unit.Between heating in vacuum mechanism 10 and detector 41, be mounted with water-cooled grating 42, reduced environmental radiation.Its method of testing is simple, reliable, convenient operation, and test result is accurate.
The present invention is applicable to the normal emittance that quick variation and the temperature of coating within the scope of 300~600 ℃ of temperature control accurately, measure within the scope of wavelength 0.4~10.6 μ m and measures, test result is accurate, and cost of testing system is relatively cheap, and technology is simple and reliable, stable performance, testing efficiency is high.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (10)
1. a solar selective coat normal emittance test macro, is characterized in that, comprising:
Heating in vacuum mechanism, for vacuum environment is provided, and heats testing sample;
Black matrix, described black matrix is cylindrical cavity formula structure, is provided with the first thermopair in the cavity of described black matrix;
Temperature control mechanism, for controlling described heating in vacuum mechanism and the running of the first thermopair;
Measuring mechanism, for measuring the energy of testing sample and described black matrix, and becomes voltage signal by surveyed energy conversion;
Driving mechanism, for driving described measuring mechanism running;
Computer processor structure, for showing and manipulate measurement data, and stores result;
Described heating in vacuum mechanism and the first thermopair are all electrically connected at described temperature control mechanism; Described measuring mechanism is located at the top position of described heating in vacuum mechanism, and described black matrix is positioned at the sidepiece of described measuring mechanism; Described driving mechanism and computer processor structure are all electrically connected at described measuring mechanism; Described temperature control mechanism is controlled described heating in vacuum organisation operations, described driving mechanism drives described measuring mechanism running, described measuring mechanism is surveyed the energy of testing sample and black matrix respectively, and is sent to described computer processor structure after the energy conversion of detection is become to voltage signal.
2. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described heating in vacuum mechanism comprises vacuum chamber and is located at the warm table in described vacuum chamber, described vacuum chamber is provided with vacuum interface and electric interfaces, described vacuum chamber is connected with vacuum suction unit through described vacuum interface, and described warm table is connected in described temperature control mechanism through electric interfaces.
3. solar selective coat normal emittance test macro according to claim 2, is characterized in that, the locular wall of described vacuum chamber is water-cooling structure, offers recirculated water entrance, circulating water outlet and calcium fluoride window on described locular wall; In described warm table, be provided with the second thermopair.
4. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described temperature control mechanism comprises PID temperature controller and relay, described PID temperature controller is electrically connected at described computer processor structure, and described relay is electrically connected at described PID temperature controller.
5. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described measuring mechanism comprises detector, lock-in amplifier and data collecting card, described detector be positioned at described heating in vacuum mechanism directly over, described lock-in amplifier is electrically connected at described detector, and described data collecting card is electrically connected at described lock-in amplifier.
6. solar selective coat normal emittance test macro according to claim 5, is characterized in that, described detector is connected with stepper motor, and described stepper motor is electrically connected at described driving mechanism, and described driving mechanism drives stepper motor to rotate.
7. solar selective coat normal emittance test macro according to claim 5, is characterized in that, the end of probe of described detector is provided with water-cooled grating outward.
8. solar selective coat normal emittance test macro according to claim 1, it is characterized in that, described computer processor structure comprises display module, processing module and memory module, described display module is used for showing test data and can carries out parameter input, described processing module is for test data is processed, and described memory module is for the data after stores processor.
9. a method of testing for solar selective coat normal emittance, is characterized in that, comprises the following steps:
1., calibration testing;
2., testing sample is placed on described warm table, and close door for vacuum chamber;
3., start to vacuumize, treat that the pressure in vacuum chamber reaches 10
-3during Pa, the recirculated cooling water in the locular wall of unlatching vacuum chamber, sets heating-up temperature and starts to be heated to black matrix identical with the temperature of setting with the temperature of testing sample by computer processor structure;
4., described detector first detects the energy of testing sample, and converts voltage signal V to through described lock-in amplifier
s, by described data collecting card by voltage signal V
safter collection, be sent to described computer processor structure and show through described display module; Meanwhile, driving mechanism drives described stepping electricity to enter running described in described data acquisition card control, and then drives described detector rotation, and the energy of described black matrix is surveyed, and the energy of surveying converts voltage signal V to through described lock-in amplifier
b, by described data collecting card by voltage signal V
bafter collection, be sent to described computer processor structure and show through described display module;
5., described processing module is to V
sand V
bprocess, can obtain normal emittance ε=V
s/ V
b;
6., to V
sand V
bnumerical measuring more than three times, draws different ε values, averages and can obtain the wave band normal emittance of testing sample;
7., stop heating, stop described vacuum suction unit simultaneously, take out testing sample, complete test.
10. the method for testing of solar selective coat normal emittance according to claim 9, is characterized in that, 1. step specifically comprises the following steps:
Vacuum suction unit is connected in to the vacuum interface of described vacuum chamber, standard white plate is placed on described warm table, close door for vacuum chamber;
Open vacuum suction unit and computer processor structure, treat that at normal temperatures the pressure in vacuum chamber reaches 10
-3pa, measures standard white plate, by computer processor structure realization calibration and background noise, deducts;
Close vacuum suction unit, take out standard white plate, complete calibration.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310636311.2A CN103604829B (en) | 2013-12-03 | 2013-12-03 | Solar selective coat normal emittance test macro and method of testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310636311.2A CN103604829B (en) | 2013-12-03 | 2013-12-03 | Solar selective coat normal emittance test macro and method of testing |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103604829A true CN103604829A (en) | 2014-02-26 |
CN103604829B CN103604829B (en) | 2016-05-11 |
Family
ID=50123073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310636311.2A Expired - Fee Related CN103604829B (en) | 2013-12-03 | 2013-12-03 | Solar selective coat normal emittance test macro and method of testing |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN103604829B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109521039A (en) * | 2018-11-21 | 2019-03-26 | 哈尔滨工业大学 | The vacuum plant and method of the print heater of solid material high temperature emissive rate measurement |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000036468A (en) * | 1998-07-17 | 2000-02-02 | Dainippon Screen Mfg Co Ltd | Substrate processor and substrate processing method therefor |
CN102042993A (en) * | 2010-11-23 | 2011-05-04 | 清华大学 | System for measuring normal spectral emissivity of high-temperature material |
CN102095750A (en) * | 2010-12-17 | 2011-06-15 | 中国计量科学研究院 | Device and method for measuring IR (infrared ray) normal emittance |
CN202794079U (en) * | 2012-05-18 | 2013-03-13 | 北京星达科技发展有限公司 | Normal emissivity detecting equipment |
CN203011815U (en) * | 2013-01-16 | 2013-06-19 | 锦州阳光气象科技有限公司 | Material normal emission ratio test system |
-
2013
- 2013-12-03 CN CN201310636311.2A patent/CN103604829B/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000036468A (en) * | 1998-07-17 | 2000-02-02 | Dainippon Screen Mfg Co Ltd | Substrate processor and substrate processing method therefor |
CN102042993A (en) * | 2010-11-23 | 2011-05-04 | 清华大学 | System for measuring normal spectral emissivity of high-temperature material |
CN102095750A (en) * | 2010-12-17 | 2011-06-15 | 中国计量科学研究院 | Device and method for measuring IR (infrared ray) normal emittance |
CN202794079U (en) * | 2012-05-18 | 2013-03-13 | 北京星达科技发展有限公司 | Normal emissivity detecting equipment |
CN203011815U (en) * | 2013-01-16 | 2013-06-19 | 锦州阳光气象科技有限公司 | Material normal emission ratio test system |
Non-Patent Citations (3)
Title |
---|
于洋 等: "中温法向发射率测试方法研究", 《中国空间科学学会空间材料专业委员会2009学术交流会》, 31 December 2009 (2009-12-31), pages 288 - 292 * |
刘宝明 等: "材料法向光谱发射率测定装置", 《计量学报》, vol. 7, no. 3, 31 July 1986 (1986-07-31), pages 204 - 210 * |
原遵东 等: "材料光谱发射率精密测量装置", 《仪器仪表学报》, vol. 29, no. 8, 31 August 2008 (2008-08-31), pages 1660 - 1664 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109521039A (en) * | 2018-11-21 | 2019-03-26 | 哈尔滨工业大学 | The vacuum plant and method of the print heater of solid material high temperature emissive rate measurement |
Also Published As
Publication number | Publication date |
---|---|
CN103604829B (en) | 2016-05-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102830064B (en) | Middle/high-temperature infrared emissivity testing device | |
CN102042993B (en) | System for measuring normal spectral emissivity of high-temperature material | |
CN102565116A (en) | Device for measuring normal spectral emissivity of non-transparent material | |
CN103675019B (en) | A kind of method of thermal infrared imager Quick Measurement material surface emissivity by virtue | |
CN106770440B (en) | A kind of Ceramic Balls bed efficient thermal conductivity test platform | |
CN109682499B (en) | Constant temperature electric measurement device for temperature measurement verification device and constant temperature control method | |
CN105758208B (en) | High-temperature heat treatment non-contact temperature uniformity detection system and its detection method | |
CN203688472U (en) | Device for testing normal emissivity of solar selective coating | |
CN104764713A (en) | Terahertz transient thermal imaging detection and tomographic imaging system and method | |
US20120235041A1 (en) | Absolute cavity pyrgeometer | |
CN103604829B (en) | Solar selective coat normal emittance test macro and method of testing | |
CN202994636U (en) | Middle/high-temperature infrared emissivity testing device | |
CN202854290U (en) | Thermoelectric performance measuring apparatus | |
CN110207829B (en) | Measurement method for simultaneously obtaining material temperature and spectral direction emissivity based on infrared spectrometer | |
Wei et al. | The research on compensation algorithm of infrared temperature measurement based on intelligent sensors | |
CN105929872A (en) | Temperature control device and method for medium temperature surface radiation source | |
El-Baz et al. | High-resolution dataset for building energy management systems applications | |
CN212030747U (en) | Detection system of infrared thermal imaging equipment | |
CN109507222B (en) | Method for continuously measuring spectral emissivity of material in high-temperature direction | |
Zhang et al. | A spectral emissivity measurement facility for solar absorbing coatings | |
CN103196840B (en) | System for testing high-temperature spectral emissivity of materials based on effective radiation | |
CN102175509B (en) | Ultraviolet pretreatment testing device for solar panel | |
CN105136288A (en) | Solar simulator irradiance real-time monitoring device under vacuum low-temperature condition and method thereof | |
CN108981923A (en) | The device and method of optical element surface temperature rise under on-line measurement continuous wave laser action | |
CN107655833B (en) | Method and system for measuring high-temperature hemispherical emissivity of low-thermal-conductivity non-conductor material |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160511 |
|
CF01 | Termination of patent right due to non-payment of annual fee |