CN103593272A - System and method for controlling motherboard function test - Google Patents
System and method for controlling motherboard function test Download PDFInfo
- Publication number
- CN103593272A CN103593272A CN201210292178.9A CN201210292178A CN103593272A CN 103593272 A CN103593272 A CN 103593272A CN 201210292178 A CN201210292178 A CN 201210292178A CN 103593272 A CN103593272 A CN 103593272A
- Authority
- CN
- China
- Prior art keywords
- uut
- functional test
- under
- operating system
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
Disclosed are a system and a method for controlling motherboard function test. The method includes respectively presetting function test items to be executed by a UUT (unit under test) in multiple operating systems, controlling the UUT to execute the preset function test in one operating system after the UUT enters one of the operating systems, judging whether the UUT passes the preset function tests in all the operating systems or not when the UUT passes the function test in one of the operating system, creating an identifier file in a storage of the UUT to identify that the UUT has past the preset function test in one of the operating systems when the UUT does not pass the preset function test in any one of the operating systems, and deleting the identifier file saved in the storage when the UUT passes the preset function tests in the multiple operating systems. By the system and the method, the UUT can be controlled effectively to execute function tests of various workstations.
Description
Technical field
The present invention relates to a kind of circuit board for testing function of main managing and control system and method.
Background technology
It is current when server master board is done to functional test, generally divide several production works station to carry out, for example, at INIT(Initialization) work station need carry out TPM (Trusted Platform Module, reliable platform module) performance test of the configuration such as safety chip, at FT(Function Test) work station need carry out as performance test of the functional accessories such as hard disk etc., it is the test event difference that do at different works station, and the test procedure of each required execution in work station is stored in respectively in different memory devices, also be that the tester at each work station is before testing, all need first equipment under test to be connected with the memory device of having stored this work station test procedure, concrete functional test is carried out in the start that again equipment under test powered on, if not yet reach this work station yet the tester at certain work station finds the testing process of this equipment under test in test process, tester shuts down again and dismantles the memory device of having stored this work station test procedure, obviously, this test mode has had influence on the production efficiency of factory to a great extent.
Summary of the invention
In view of above content, be necessary to provide a kind of circuit board for testing function of main managing and control system and method, effectively management and control equipment under test is carried out the functional test at each production work station.
Described circuit board for testing function of main managing and control system comprises: presetting module, for the functional test project that default equipment under test UUT will carry out respectively under a plurality of operating systems; Control module, carries out default functional test under described one of them operating system for controlling described UUT after entering one of them operating system as described UUT; Judge module, for when the functional test of described UUT by under described one of them operating system, judges that whether described UUT is by default functional test under All Jobs system; Creation module for when described UUT is not yet by under any one operating system during default functional test, creates an identification document to identify described UUT by the functional test under described one of them operating system in the storer of described UUT; And removing module, for when described UUT by described a plurality of operating systems under during default functional test, delete the identification document of storing in described storer.
Described circuit board for testing function of main management-control method comprises: foresee steps, the functional test project that default equipment under test UUT will carry out respectively under a plurality of operating systems; Control step, after described UUT enters one of them operating system, control described UUT and carry out default functional test under described one of them operating system; Determining step, when the functional test of described UUT by under described one of them operating system, judges that whether described UUT is by default functional test under All Jobs system; Foundation step when described UUT is not yet by under any one operating system during default functional test, creates an identification document to identify described UUT by the functional test under described one of them operating system in the storer of described UUT; And delete step, when described UUT by described a plurality of operating systems under during default functional test, delete the identification document of storing in described storer.
Compared to prior art, described circuit board for testing function of main managing and control system and method, effectively management and control equipment under test UUT carries out the functional test at each production work station, and tests in the lump the compatibility of described UUT to operating system when carrying out functional test.
Accompanying drawing explanation
Fig. 1 is the running environment figure of circuit board for testing function of main managing and control system of the present invention.
Fig. 2 is the functional block diagram of circuit board for testing function of main managing and control system of the present invention.
Fig. 3 is the process flow diagram of the preferred embodiment of circuit board for testing function of main management-control method of the present invention.
Main element symbol description
UUT | 100 |
BMC | 10 |
First memory | 20 |
|
30 |
|
40 |
|
50 |
Functional test managing and |
60 |
|
601 |
|
602 |
|
603 |
|
604 |
|
605 |
|
606 |
Following embodiment further illustrates the present invention in connection with above-mentioned accompanying drawing.
Embodiment
As shown in Figure 1, be the running environment figure of circuit board for testing function of main managing and control system of the present invention.In the present embodiment, UUT(Unit Under Test, equipment under test) the 100th, need carry out the server of circuit board for testing function of main, described UUT100 comprises by the connected BMC(Baseboard Management Controller of data bus, baseboard management controller) 10, first memory 20, BIOS(Basic Input Output System, Basic Input or Output System (BIOS)) 30 and processor 40, the firmware stores of described BMC10 is in described first memory 20, this first memory 20 can be EPROM(Erasable Programmable Read Only Memory, erasable and programmable read-only memory).In the present embodiment, described UUT100 is also connected with second memory 50, described second memory 50 can be hard disk, for memory function test managing and control system 60 sequencing codes, in the present embodiment, described functional test managing and control system 60 is carried out by described processor 40, the circuit board for testing function of main for UUT100 described in management and control at each production work station.It should be noted that, for testing the compatibility of described UUT100 to each operating system, conventionally the functional test at described each production work station of the required execution of described UUT100 can be separately positioned under different operating systems and carry out simultaneously.
For clearly demonstrating the present invention, the present embodiment with UUT100 described in described functional test managing and control system 60 management and control at INIT(Initialization) work station, a FT(Function Test) work station and the 2nd FT work station carry out functional test and illustrate.Described UUT100 need carry out for example TPM (Trusted Platform Module at described INIT work station, reliable platform module) performance test of the configuration such as safety chip, at a described FT work station, need carry out the preliminary functional test of hardware configuration, whether can normal boot-strap, need carry out the performance test of functional accessories such as hard disk, network interface card of hardware configuration at described the 2nd FT work station if for example testing described UUT100.
In the present embodiment, the default described UUT100 of described functional test managing and control system 60 is at DOS(Disk Operating System, disc operating system (DOS)) under operating system, carry out the test event at described INIT work station, and when the functional test of described UUT100 by described INIT work station, utilize IPMI(Intelligent Platform Management Interface, IPMI) order in described first memory 20, create an identification document for example INIT.INI file identify described UUT100 by the functional test at described INIT work station; Default described UUT100 carries out the test event at a described FT work station under Windows operating system, and when the functional test of described UUT100 by a described FT work station, utilize IPMI order in described first memory 20, create an identification document for example FT1.INI file identify described UUT100 by the functional test at a described FT work station; It is the test event at last work station that default described UUT100 carries out described the 2nd FT work station under Linux operating system, and when the functional test of described UUT100 by described last work station, deletes aforementioned created identification document.It should be noted that, the identification document creating can be null file, can only with the name of identification document, identify described UUT100 by the functional test at which work station.
For coordinating functional test managing and control system 60 of the present invention to complete the function that it provides, need in the firmware of BMC10, increase following function newly, when described UUT100 powers on while not starting shooting, which operating system described BMC10 need enter and carry out functional test while judging described UUT100 starting up according to the identification document of storing in described first memory 20, and according to this judged result when the described UUT100 starting up, order described BIOS30 to guide described UUT100 to enter corresponding operating system, also need newly-increased described BIOS30 to receive the order of described BMC10 and guide described UUT100 to enter the function of corresponding operating system here.
Specifically, for example described UUT100 need be by just carrying out the test event at a FT work station, by just carrying out the test at the 2nd FT work station after the functional test at a FT work station after the functional test at INIT work station.The testing sequence at described each work station according to described UUT100 so, when described first memory 20 is not stored any INI(Initialization File) described UUT100 not yet during the functional test by any work station during identification document, when described BMC10 judges described UUT100 starting up, need enter DOS operating system and carry out the test event at described NIT work station, and described BMC10 is set when described UUT100 starting up, orders described BIOS30 to guide described UUT100 to enter DOS operating system.
When the identification document of described first memory 20 storages only has INIT.INI file, when described BMC10 judges described UUT100 starting up, need enter Windows operating system and carry out the test event at a described FT work station, and described BMC10 is set when described UUT100 starting up, orders described BIOS30 to guide described UUT100 to enter Windows operating system; When the identification document of described first memory 20 storages is INIT.INI and FT1.INI file, when described BMC10 judges described UUT100 starting up, need enter Linux and carry out the test event at described the 2nd FT work station, and described BMC10 is set when described UUT100 starting up, orders described BIOS30 to guide described UUT100 to enter Linux operating system.
Consult shown in Fig. 2, described functional test managing and control system 60 comprises presetting module 601, control module 602, judge module 603, creation module 604, removing module 605 and shutdown module 606.The alleged module of the present invention has been the program segment of a specific function, about the function of each module, will in the process flow diagram of Fig. 3, specifically describe.
As shown in Figure 3, be the process flow diagram of the preferred embodiment of functional test managing and control system of the present invention.
Step S1, presetting module 601 is preset respectively the functional test project of the required execution of UUT100 under a plurality of operating systems.The functional test that the present embodiment need be carried out INIT work station, first and second FT work station with described UUT100 illustrates.For example the default described UUT100 of described presetting module 601 carries out the test event at described INIT work station under DOS operating system, as the performance test of the configurations such as TPM chip; Default described UUT100 carries out the test event at a FT work station under Windows operating system, and whether for example test described UUT100 can normal boot-strap; It is the test event at last work station that default described UUT100 carries out the 2nd FT work station under Linux operating system, as the performance test of the functional accessories such as hardware configuration hard disk, network interface card.
Step S2, powers on UUT100, BMC10 initialization the operating system that should enter while judging described UUT100 starting up according to the identification document of storing in first memory 20 after initialization completes in advance.For example when described first memory 20, not storing any identification document is described UUT100 not yet during the functional test by any work station, need enter the functional test that DOS operating system is carried out described INIT work station when described BMC10 judges described UUT100 starting up; When the identification document of described first memory 20 storages only has INIT.INI file, be described UUT100 during the functional test by described INIT work station, when described BMC10 judges described UUT100 starting up, need enter the test event that Windows operating system is carried out a described FT work station; When the identification document of described first memory 20 storages is INIT.INI and FT1.INI file, be described UUT100 during the functional test by described INIT work station and a FT work station, when described BMC10 judges described UUT100 starting up, need enter the test event that Linux operating system is carried out described the 2nd FT work station.
Step S3, by UUT100 start, described BMC10 orders BIOS30 to guide described UUT100 to enter corresponding operating system according to above-mentioned judged result when the described UUT100 starting up.
For example, for example, when at step S2, described BMC10 judges that described UUT100 need enter the functional test that DOS operating system is carried out described INIT work station, and described BMC10 is when described UUT100 starting up, and order BIOS30 guides described UUT100 to enter DOS operating system.And for example when step S2, described BMC10 judges that described UUT100 need enter the functional test that Windows operating system is carried out a described FT work station, described BMC10 is when described UUT100 starting up, and order BIOS30 guides described UUT100 to enter Windows operating system.For another example when step S2, described BMC10 judges that described UUT100 need enter the functional test that Linux operating system is carried out the 2nd FT work station, and described BMC10 is when described UUT100 starting up, and order BIOS30 guides described UUT100 to enter Linux operating system.
Step S4, control module 602 is controlled described UUT100 and is carried out default test event under the operating system of place.What for example under the guiding of described BIOS30, enter as described UUT100 is DOS operating system, and described control module 602 is controlled the test event that described UUT100 carries out default INIT work station under DOS operating system.Such as the performance test of controlling the configurations such as described UUT100 execution TMP chip.
Step S5, judge module 603 judges that whether described UUT100 is by the functional test under the operating system of place, if execution step S6, otherwise process ends.For example, when judge module 603 judgements show that described UUT100 carries out and passed through the test event at the INIT work station under described DOS operating system, perform step S6, otherwise process ends.
Step S6, judge module 603 further judge whether described UUT100 passes through default functional test under All Jobs system, if perform step S8, if not yet by performing step S7 under any one operating system during default functional test.For example, while having stored INIT.FLY and FT1.FLY identification document in first memory 20, the described UUT100 of judge module 603 judgement by the functional test at INIT work station under DOS operating system, the functional test at the functional test at the FT work station under Windows operating system and the 2nd FT work station under Linux operating system, be that described UUT100 is by default functional test under All Jobs system, under this condition, perform step S8, otherwise execution step S7.
In other embodiments, when described presetting module 601, preset respectively the functional test project that described UUT100 will carry out during in step S 1 under N operating system, judge module described in this step 603 also can judge whether described UUT100 has passed through the test under All Jobs system according to whether storing N-1 identification document in described first memory 20.
For example, when described presetting module 601 has been preset respectively functional test project respectively during in step S1 under N=3 operating system, as preset the functional test project at INIT work station under DOS operating system, under Windows operating system, preset the functional test project at a FT work station, under Linux operating system, preset the functional test project at the 2nd FT work station, in first memory 20, stored when INIT.INI and FT1.INI are N-1=2 identification document and can judge that described UUT100 is by default functional test under All Jobs system, under this condition, perform step S8, otherwise execution step S7.
Step S7, creation module 604 creates an identification document to identify described UUT100 by the functional test under the operating system of place in first memory 20, performs step S9 after establishment.For example, when described UUT100 has passed through the functional test at the INIT work station under the operating system DOS of place, but not during the functional test by under Windows and Linux operating system, described creation module 604 is utilized IPMI order in described first memory 20, to create an INIT.INI identification document to identify described UUT100, to have passed through the functional test at described INIT work station.
Step S8, removing module 605 is deleted the identification document of storing in described first memory 20.For example as described UUT100, passed through the functional test at INIT work station, first and second FT work station, described removing module 605 is deleted the INIT.INI that stores, FT1.INI identification document in described first memory 20.
Step S9, shutdown module 606 is shut down described UUT100 and points out user test result.For example when at step S5, judgement show that described UUT100 is by the functional test under DOS operating system, and described UUT100 can be shut down and point out UUT100 described in tester be not the test under DOS operating system by place operating system to described shutdown module 606.If described UUT100 has passed through default functional test under All Jobs system, described shutdown module 606 is shut down described UUT100 and is pointed out UUT100 described in tester to pass through the functional test at all works station, reminds tester's power-off etc.
From whole flow performing step of the present invention, can find out, the present invention is arranged on the functional test project at each work station of the required execution of described UUT100 under different operating systems and carries out, on the one hand, described UUT100 has realized the compatibility test to different work system when carrying out functional test, on the other hand, it is in the second memory 50 in the present embodiment that the present invention has been incorporated into a storer by the test procedure of each required execution in work station, test procedure compared to each work station of the prior art is placed on respectively in different memory, saved the quantity of required storer, under the prerequisite that required tool is plugged when tester tests each work station of described UUT100 in addition, when described UUT100 passed through a certain work station functional test after, tester only need re-power described UUT100 and start shooting and can carry out the functional test at next work station, and without more described UUT100 being transferred to the tester at next work station to process, this method of testing also can be saved the test duration.
Finally it should be noted that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although the present invention is had been described in detail with reference to preferred embodiment, those of ordinary skill in the art is to be understood that, can modify or be equal to replacement technical scheme of the present invention, and not depart from the spirit and scope of technical solution of the present invention.
Claims (10)
1. a circuit board for testing function of main managing and control system, is characterized in that, this system comprises:
Presetting module, for the functional test project that default equipment under test UUT will carry out respectively under a plurality of operating systems;
Control module, carries out default functional test under described one of them operating system for controlling described UUT after entering one of them operating system as described UUT;
Judge module, for when the functional test of described UUT by under described one of them operating system, judges that whether described UUT is by default functional test under All Jobs system;
Creation module for when described UUT is not yet by under any one operating system during default functional test, creates an identification document to identify described UUT by the functional test under described one of them operating system in the storer of described UUT; And
Removing module, for when described UUT by described a plurality of operating systems under during default functional test, delete the identification document of storing in described storer.
2. circuit board for testing function of main managing and control system as claimed in claim 1, is characterized in that, also comprises a shutdown module, when having completed the functional test under the operating system of place as described UUT, described UUT is shut down and point out tester test result.
3. circuit board for testing function of main managing and control system as claimed in claim 1, it is characterized in that, when described UUT powers on while not starting shooting, the operating system that the baseboard management controller BMC of described UUT need enter while judging described UUT start according to the identification document of storing in described storer, and according to described judged result order basic input-output system BIOS, guide this UUT to enter corresponding operating system when this UUT starting up.
4. circuit board for testing function of main managing and control system as claimed in claim 1, is characterized in that, described judge module judges that according to the identification document of storing in described storer whether described UUT is by default functional test under All Jobs system.
5. circuit board for testing function of main managing and control system as claimed in claim 4, it is characterized in that, when described presetting module has been preset respectively the functional test project that UUT will carry out under N operating system, if store N-1 identification document in described storer, described judge module judges that described UUT has passed through the test under All Jobs system.
6. a circuit board for testing function of main management-control method, is characterized in that, the method comprises:
Foresee steps, the functional test project that default equipment under test UUT will carry out respectively under a plurality of operating systems;
Control step, after described UUT enters one of them operating system, control described UUT and carry out default functional test under described one of them operating system;
Determining step, when the functional test of described UUT by under described one of them operating system, judges that whether described UUT is by default functional test under All Jobs system;
Foundation step when described UUT is not yet by under any one operating system during default functional test, creates an identification document to identify described UUT by the functional test under described one of them operating system in the storer of described UUT; And
Delete step, when described UUT by described a plurality of operating systems under during default functional test, delete the identification document of storing in described storer.
7. circuit board for testing function of main management-control method as claimed in claim 6, is characterized in that, also comprises a shutdown procedures, when described UUT has completed the functional test under the operating system of place, described UUT is shut down and point out tester test result.
8. circuit board for testing function of main management-control method as claimed in claim 6, it is characterized in that, when described UUT powers on while not starting shooting, the operating system that the baseboard management controller BMC of described UUT need enter while judging described UUT start according to the identification document of storing in described storer, and according to described judged result order basic input-output system BIOS, guide this UUT to enter corresponding operating system when this UUT starting up.
9. circuit board for testing function of main management-control method as claimed in claim 6, is characterized in that, described determining step is to judge that according to the identification document of storing in described storer whether described UUT is by default functional test under All Jobs system.
10. circuit board for testing function of main management-control method as claimed in claim 9, it is characterized in that, when having preset respectively the functional test project that UUT will carry out under N operating system in described foresee steps, if store N-1 identification document in described storer, described determining step judges that described UUT has passed through the test under All Jobs system.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210292178.9A CN103593272A (en) | 2012-08-16 | 2012-08-16 | System and method for controlling motherboard function test |
TW101130071A TW201409226A (en) | 2012-08-16 | 2012-08-20 | System and method for controlling motherboard for functional test |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210292178.9A CN103593272A (en) | 2012-08-16 | 2012-08-16 | System and method for controlling motherboard function test |
Publications (1)
Publication Number | Publication Date |
---|---|
CN103593272A true CN103593272A (en) | 2014-02-19 |
Family
ID=50083424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210292178.9A Pending CN103593272A (en) | 2012-08-16 | 2012-08-16 | System and method for controlling motherboard function test |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN103593272A (en) |
TW (1) | TW201409226A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106598564A (en) * | 2016-10-24 | 2017-04-26 | 郑州云海信息技术有限公司 | Method for implementing BIOS capable of self-adapting to different main boards, BIOS, and main board |
-
2012
- 2012-08-16 CN CN201210292178.9A patent/CN103593272A/en active Pending
- 2012-08-20 TW TW101130071A patent/TW201409226A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106598564A (en) * | 2016-10-24 | 2017-04-26 | 郑州云海信息技术有限公司 | Method for implementing BIOS capable of self-adapting to different main boards, BIOS, and main board |
Also Published As
Publication number | Publication date |
---|---|
TW201409226A (en) | 2014-03-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN110765026B (en) | Automatic test method, device, storage medium and equipment | |
CN107423174B (en) | Server configuration information testing method and device and storage medium | |
US8635484B2 (en) | Event based correlation of power events | |
US8943302B2 (en) | Method of flashing bios using service processor and computer system using the same | |
CN103324495A (en) | Method and system for data center server boot management | |
CN109933504B (en) | Hard disk delay test method, device, terminal and storage medium | |
US9542304B1 (en) | Automated operating system installation | |
CN103995500A (en) | Controller, information processing apparatus, and program | |
CN103257922B (en) | A kind of method of quick test BIOS and OS interface code reliability | |
CN112068852A (en) | Method, system, equipment and medium for installing open source software based on domestic server | |
CN104993974A (en) | Detection method for identifying equipment working state, and upper computer | |
CN111190823A (en) | UI automation test method, electronic device and computer readable storage medium | |
CN110569154B (en) | Chip interface function testing method, system, terminal and storage medium | |
US20140164845A1 (en) | Host computer and method for testing sas expanders | |
CN114117973A (en) | Logic synthesis method, device and storage medium | |
CN114584498B (en) | Gateway equipment power-on and power-off test method, device, equipment, system and product | |
CN114115724A (en) | Solid state disk safe erasing method and device | |
CN105224453A (en) | The automatic test approach of system compatibility and device | |
CN103593272A (en) | System and method for controlling motherboard function test | |
CN101452417B (en) | Monitor method and monitor device thereof | |
CN114138587B (en) | Method, device and equipment for verifying reliability of server power firmware upgrade | |
CN115757099A (en) | Automatic test method and device for platform firmware protection recovery function | |
CN107135120B (en) | Automatic test method and device for HPC cluster | |
CN115981940A (en) | Storage server testing method and device, electronic equipment and medium | |
EP2829974A2 (en) | Memory dump method, information processing apparatus and program |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20140219 |