CN103592148A - Reliability testing table for multistage tandem chip removing devices - Google Patents

Reliability testing table for multistage tandem chip removing devices Download PDF

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Publication number
CN103592148A
CN103592148A CN201310552070.3A CN201310552070A CN103592148A CN 103592148 A CN103592148 A CN 103592148A CN 201310552070 A CN201310552070 A CN 201310552070A CN 103592148 A CN103592148 A CN 103592148A
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chip
chip cleaner
cleaner
cleaners
crumb
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CN103592148B (en
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陈菲
杨兆军
段炜
何佳龙
田海龙
王松
蒋敬仁
焦大蒙
马宇鹏
张良
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Jilin University
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Jilin University
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Abstract

The invention discloses a testing device applied to the fields of the reliability of numerically-controlled machine tool chip removing devices and relates to a reliability testing table for multistage tandem chip removing devices. The reliability testing table is mainly composed of a circulating chip removing mechanism, a state detection alarm mechanism and a speed changing automatic control mechanism. The circulating chip removing mechanism is composed of a supporting frame fixed on horizontal iron, more than two chip removing devices fixed on the horizontal iron or the supporting frame, and a chip collecting device fixed on the supporting frame. The state detection alarm mechanism is composed of a light curtain sensor, a vibration sensor, an A/D card and a signal amplifier. The speed changing automatic control mechanism is composed of an upper industrial control computer, a lower programmable logic controller (PLC), a frequency changer, a control cabinet and a control panel arranged in the control cabinet. The reliability testing table for the multistage tandem chip removing devices can simulate different working conditions, is capable of alarming failures, can conduct reliability loading tests on chip removing devices different in model and number as long as an installing part is adjusted, and has flexibility and universality.

Description

Plural serial stage tandem type chip cleaner reliability test bench
Technical field
The present invention relates to a kind of test unit that is applied to numerically-controlled machine chip cleaner reliability field, or rather, the present invention relates to a kind ofly can to realize speed change to chain slat type chip cleaner, variable load loads and carry out a kind of plural serial stage tandem type chip cleaner reliability test bench of fail-test.
Background technology
Numerically-controlled machine is the basis of improving national manufacture level and equipment, is the important symbol of weighing an industrial flourishing level of country, overall national strength.The device that chip cleaner is generally equipped with as numerically-controlled machine, it is simple in structure but have aborning important effect, once chip cleaner breaks down, will produce larger negative effect to production work.In recent years, along with the development of a series of digitizing manufacturing equipments such as precision machine tool, high-grade, digitally controlled machine tools, chip cleaner had caused the attention of more and more function host manufacturer.Statistics in recent years shows, domestic chip cleaner overall productivity increases for years, but it easily sends out fault, fluctuation of service, all the time perplexing main frame production firm, study carefully its main cause, domestic chip cleaner quality is uneven, and wherein the reliability of product and stability are the maximum bottlenecks of restriction chip cleaner development.
In country's " high-grade numerical control and basic manufacturing equipment " scientific and technological great special project, about first of the research of common technology, be exactly " reliability design and performance test technology ", requirement provides can be for reliability design and the test method of scale.Even to this day, chip cleaner is as one of configuration of main numerically-controlled machine, and most lathe manufacturing enterprise does not all have its reliability test or testing table.The present invention is according to the actual applying working condition of chip cleaner, proposed a kind ofly by frequency converter, chip cleaner to be realized to speed change and load, by picking sensor, carry out fault detect, and carried out the testing table of fail-test.By this testing table, chip cleaner is carried out to fail-test, for Cnc ReliabilityintelligeNetwork Network increases and reliability assessment provides basic fault data, be also conducive on the other hand Machine Tool Enterprises and choose suitable chip removal speed on the one hand, optimize the chip removal performance of lathe.
Summary of the invention
Technical matters to be solved by this invention is that current chip cleaner reliability test can not be tested many chip cleaners simultaneously, and the test period is long, cannot simulate actual applying working condition, can not carry out the fail-test of speed change, random duration, variable load loading.The invention provides and a kind ofly can realize that transmission speed is adjustable, loaded load is variable, the test of random duration and fault detect, and can carry out the testing table of plural serial stage tandem type chip cleaner fail-test.
For solving the problems of the technologies described above, the present invention adopts following technical scheme to realize, and accompanying drawings is as follows:
A kind of plural serial stage tandem type chip cleaner reliability test bench, mainly by circulation chip removal mechanism, state-detection alarm mechanism and speed change automatic controls, formed, described circulation chip removal mechanism by being fixed on the bracing frame of ground on black iron 4, be fixed on two above chip cleaners on ground black iron 4 or bracing frame and the crumb loading device 7 being fixed on bracing frame forms;
The chip cleaner chip removal carrier bar of first chip cleaner is over against the crumb loading device crumb mouth 27 of crumb loading device 7, and the chip cleaner crumb mouth of last chip cleaner is over against the crumb loading device crumb inlet 26 of crumb loading device 7; Remove the chip cleaner crumb mouth of last chip cleaner outside the crumb loading device crumb inlet 26 of crumb loading device 7, the chip cleaner crumb mouth of all the other chip cleaners is over against the chip cleaner chip removal carrier bar of next chip cleaner;
Described state-detection alarm mechanism is comprised of picking sensor, vibration transducer, A/D card and signal amplifier; Described picking sensor and vibration transducer are all fixed on chip cleaner;
Described speed change automatic controls by switch board 14, be arranged on the control panel 15 in switch board 14, upper industrial computer, the next Programmable Logic Controller PLC, frequency converter and form; Upper industrial computer, the next Programmable Logic Controller PLC and frequency converter are all fixed on control panel 15;
On bracing frame or on ground black iron 4, be provided with front support piece and rear support piece; On front support piece and rear support piece, fixedly mount fixedly angle steel; Fixedly angle steel is provided with strip hole, for regulating the front and back position of chip cleaner.
Picking sensor described in technical scheme is connected with the down direction of the next Programmable Logic Controller PLC, and described vibration transducer is connected with upper industrial computer by signal amplifier, A/D card;
The up direction of described the next Programmable Logic Controller PLC and upper industrial computer communication, the down direction of the next Programmable Logic Controller PLC is connected with frequency converter rotating speed control interface, and main circuit of converter output terminal is connected with the power interface of chip cleaner motor.
Bracing frame described in technical scheme is made as 12, No. 3 bracing frames 3 of 1, No. 2 bracing frames of No. 1 bracing frame;
Described chip cleaner is made as 10, No. 3 chip cleaners 11 of 2, No. 2 chip cleaners of No. 1 chip cleaner; 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11 are separately fixed on ground 4, No. 1 bracing frame 1 of black iron and No. 2 bracing frames 12;
Described crumb loading device 7 is fixed on No. 3 bracing frames 3.
The piece of front support described in technical scheme and rear support are three; Described fixedly angle steel is six covers.
The crumb loading device crumb mouth 27 of No. 1 chip cleaner 2 No. 1 chip cleaner crumb mouth 20 described in technical scheme over against No. 1 chip cleaner chip removal carrier bar 23 of 24, No. 1 chip cleaners 2 of No. 2 chip cleaner chip removal carrier bars of No. 2 chip cleaners 10 over against crumb loading device 7; No. 2 chip cleaner crumb mouths 21 of described No. 2 chip cleaners 10 are over against No. 3 chip cleaner chip removal carrier bars 25 of No. 3 chip cleaners 11; No. 3 chip cleaner crumb mouths 22 of described No. 3 chip cleaners 11 are over against the crumb loading device crumb inlet 26 of crumb loading device 7; No. 2 chip cleaner 10 is placed perpendicular to No. 1 chip cleaner 2, and No. 3 chip cleaner 11 is placed perpendicular to No. 2 chip cleaners 10.
Picking sensor described in technical scheme is fixed on picking sensor support, is made as three covers, is separately fixed in the same position of 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11; Described vibration transducer is fixed on vibration transducer support, is made as three covers, is separately fixed in the same position of 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11.
Compared with prior art the invention has the beneficial effects as follows:
1. plural serial stage tandem type chip cleaner reliability test bench of the present invention, adopts crumb loading device to carry out variable load loading to chip cleaner, thus the load that simulation is born in actual chip removal process.By underproof three chip cleaners are carried out to the fail-test of Reality simulation operating mode simultaneously, accelerate to expose and excite product bug, for reliability growth and the assessment of product provides practical basic data.
2. plural serial stage tandem type chip cleaner reliability test bench of the present invention, can be realized the speed change of chip cleaner is transmitted by frequency converter, can, by combining with variable load, different operating modes be simulated.
3. plural serial stage tandem type chip cleaner reliability test bench of the present invention, can carry out fault alarm to the stifled bits of chip cleaner by picking sensor is installed on chip cleaner; Can read chip cleaner current of electric and gather vibration signal by vibration transducer by frequency converter, realize the fault pre-alarming to chip cleaner.
4. plural serial stage tandem type chip cleaner reliability test bench of the present invention only need be adjusted installing component for the chip cleaner of different model, varying number and just can carry out reliability load test to it, has embodied dirigibility and the versatility of this experiment table.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the present invention is further illustrated:
Fig. 1 is the axonometric projection graph of plural serial stage tandem type chip cleaner reliability test bench running status of the present invention;
Fig. 2 is the control principle block diagram of plural serial stage tandem type chip cleaner reliability test bench of the present invention;
Fig. 3 is the picking sensor support of plural serial stage tandem type chip cleaner reliability test bench of the present invention;
Fig. 4 is the vibration transducer support of plural serial stage tandem type chip cleaner reliability test bench of the present invention.
In figure: No. 1.1 bracing frames, No. 2.1 chip cleaners, No. 3.3 bracing frames, 4. black iron, 5. crumb loading device chip removal mouth arm-tie, 6. picking sensor, 7. crumb loading device, 8. rear support piece, 9. vibration transducer, 10.2 number chip cleaner, 11.3 number chip cleaner, 12.2 number bracing frame, 13. front support pieces, 14. electrical control cubicles, 15. control panels, 16. fixing angle steel, 17. picking sensor supports, 18. vibration transducer supports, 19. cuttings liquid spouts, No. 20.1 chip cleaner crumb mouths, No. 21.2 chip cleaner crumb mouths, No. 22.3 chip cleaner crumb mouths, No. 23.1 chip cleaner chip removal carrier bars, No. 24.2 chip cleaner chip removal carrier bars, No. 25.3 chip cleaner chip removal carrier bars, 26. crumb loading device crumb inlets, 27. crumb loading device crumb mouths.
Embodiment
Below in conjunction with accompanying drawing, the present invention is explained in detail:
Consult Fig. 1, described plural serial stage tandem type chip cleaner reliability test bench (the present embodiment will adopt three plural serial stage tandem type chip cleaner reliability test bench that chip cleaner is in series) comprises circulation chip removal mechanism, state-detection alarm mechanism and speed change automatic controls.
One, circulation chip removal mechanism
Described circulation chip removal mechanism comprise 10, No. 3 chip cleaners 11 of 2, No. 2 chip cleaners of No. 1 chip cleaner, 12, No. 3 bracing frames 3 of 1, No. 2 bracing frames of 7, No. 1 bracing frame of crumb loading device, black iron 4, front support piece (3), rear support piece (3), fixing angle steel (6 covers, comprise bolt, nut, spring washer); 1, No. 2 bracing frames 12 of No. 1 bracing frame, front support piece and rear support piece are all installed respectively on black iron 4; Fixedly angle steel is fixed in the concave surface of front support piece and rear support piece by bolt;
Described front support piece and rear support piece section Cheng Shuan " recessed " type, front support piece and rear support piece recess are provided with installs the fixedly threaded hole of angle steel, and the bottom surface of front support piece and rear support piece is provided with the threaded hole being fixedly connected with ground black iron 4 with 1, No. 2 bracing frames 12 of No. 1 bracing frame respectively; Described fixedly angle steel simultaneously has strip hole, can regulate the front and back position of No. 1 chip cleaner, No. 2 chip cleaners and No. 3 chip cleaners by strip hole, and fixedly angle steel is fixed in the concave surface of front support piece and rear support piece by bolt;
Front support piece 13 and the rear support piece 8 of take on No. 2 bracing frames 12 are example, other No. 1 bracing frame 1, the front support piece on black iron 4 identical with rear support piece 8 structures with the front support piece 13 on No. 2 bracing frames 12 with rear support piece, front support piece 13 and rear support piece 8 section Cheng Shuan " recessed " types, front support piece 13 recesses are provided with installs the fixedly threaded hole of angle steel 16, the recess of rear support piece 8 is also provided with installs the fixedly threaded hole of angle steel, and the bottom surface of front support piece 13 and rear support piece 8 is provided with the threaded hole being fixedly connected with No. 2 bracing frames 12; On fixedly angle steel 16 on front support piece 13 and the fixedly angle steel on rear support piece 8, all have strip hole, can regulate the front and back position of No. 3 chip cleaners 11 by strip hole, fixedly angle steel 16 is fixed in the concave surface of front support piece 13 by bolt; Fixedly angle steel on rear support piece 8 is fixed in the concave surface of rear support piece 8 by bolt;
1, No. 2 bracing frames 12 of No. 1 bracing frame and No. 3 bracing frames 3 adopt T-shaped bolt to be fixed on ground black iron 4 by bottom mounting hole separately; 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11 are placed on respectively on ground 4, No. 1 bracing frame 1 of black iron and No. 2 bracing frames 12, by the strip hole on fixing angle steel, regulate the front and back position of 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11, after determining position, by joining the mode of brill, by No. 2 chip cleaners 10 with No. 3 chip cleaners 11 are separately fixed at No. 1 bracing frame 1 and 12, No. 1 chip cleaners 2 of No. 2 bracing frames are bolted on ground black iron 4 by T-shaped; Crumb loading device 7 is bolted on No. 3 bracing frames 3.
No. 1 chip cleaner 2 is fixed on ground black iron 4, the crumb loading device crumb mouth 27 over against 24, No. 1 chip cleaner chip removal carrier bars 23 of No. 2 chip cleaner chip removal carrier bars of No. 2 chip cleaners 10 over against crumb loading device 7, No. 1 chip cleaner crumb mouth 20; No. 2 chip cleaner 10 is fixed on No. 1 bracing frame 1, and No. 2 chip cleaner crumb mouths 21 of No. 2 chip cleaners 10 are over against No. 3 chip cleaner chip removal carrier bars 25 of No. 3 chip cleaners 11; No. 3 chip cleaner 11 is fixed on No. 2 bracing frames 12, and No. 3 chip cleaner crumb mouths 22 of No. 3 chip cleaners 11 are over against the crumb loading device crumb inlet 26 of crumb loading device 7; No. 2 chip cleaner 10 is placed perpendicular to No. 1 chip cleaner 2, and No. 3 chip cleaner 11 is placed perpendicular to No. 2 chip cleaners 10.
Two, state-detection alarm mechanism
Consult Fig. 2, described state-detection alarm mechanism is comprised of A/D card, signal amplifier, vibration (acceleration) sensor (three) and picking sensor (three).
Consult Fig. 3, the fixedly chute that described picking sensor (adopting model LSL24-10F-2-J in embodiment) carries by picking sensor is fixed on picking sensor support, and three same light curtain sensor supports are separately fixed in the same position of 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11 by bolt.
Take that to be fixed on No. 1 picking sensor support on chip cleaner 2 be example, in picking sensor 6(embodiment, adopting model LSL24-10F-2-J) the fixedly chute that carries by picking sensor 6 is fixed on picking sensor support 17, and picking sensor 6 is identical with the picking sensor being fixed on the picking sensor support of No. 2 chip cleaners 10 and No. 3 chip cleaners 11.
Consult Fig. 4, described vibration transducer (adopting model C M3502 in embodiment) is fixed on vibration transducer support 18 by the mounting hole on vibration transducer 9, and three same vibration sensors supports 18 are separately fixed in the same position of 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11 by bolt.
Take that to be fixed on No. 3 vibration transducer supports on chip cleaner 11 be example, in vibration transducer 9(embodiment, adopt model C M3502) by the mounting hole on vibration transducer 9, be fixed on vibration transducer support 18, vibration transducer 9 is identical with the vibration transducer being fixed on the vibration transducer support of No. 1 chip cleaner 2 and No. 2 chip cleaners 10.
Each chip cleaner is provided with in an identical manner a picking sensor and vibration transducer on identical position.
Described picking sensor is connected with the down direction of the next Programmable Logic Controller PLC, and described vibration transducer is connected with upper industrial computer by signal amplifier, A/D card.
After having vibration transducer that signal is amplified by signal amplifier on the one hand in loading procedure, feed back to upper industrial computer, when the eigenwert of the feedback signal through routine processes surpasses preset value, system can be shut down, be reported to the police; Picking sensor and inverter current detection module and the next Programmable Logic Controller PLC carry out communication on the one hand, realize two closed-loop controls.
Three, speed change automatic controls
Described speed change automatic controls is comprised of upper industrial computer, the next Programmable Logic Controller PLC, frequency converter, switch board 14 and control panel 15.Described control panel 15 is arranged in switch board 4 by bolt, and described the next Programmable Logic Controller PLC, frequency converter, upper industrial computer are fixed on control panel 15; The up direction of the next Programmable Logic Controller PLC and upper industrial computer communication, down direction is connected with frequency converter rotating speed control interface, and main circuit of converter output terminal is connected with the power interface of chip cleaner motor.In the present embodiment, 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11 respectively have a chip cleaner motor, are respectively No. 1 chip cleaner motor, No. 2 chip cleaner motors and No. 3 chip cleaner motors.
It is to be worked out by VB that upper industrial computer is controlled interface, controlling selected working time and test parameters on interface, by RS232C, carry out serial communication with the next Programmable Logic Controller PLC, the next Programmable Logic Controller PLC opens, stops and rotating by Frequency Converter Control chip cleaner motor, and the parameter such as chip removal transmission speed, working time can be controlled on interface at upper industrial computer VB and arranges; The present invention has also designed crumb loading device chip removal mouth arm-tie 5 that can push-and-pull, can control crumb loading device 7 chip removal speed speeds, thereby simulates different actual conditions.
The principle of work of plural serial stage tandem type chip cleaner reliability test bench:
Consult Fig. 1, in figure, provided by three chip cleaners and a crumb loading device and formed a set of circulation chip removal system, and monitoring device carries out the schematic diagram of fail-test in addition.First according to the lathe operating mode of testing requirements or simulation, crumb loading device chip removal mouth arm-tie 5 is pulled to appropriate location, then according to the smear metal type of simulated actual condition, open and close cuttings liquid spout, 2, No. 2 chip cleaners 10 of No. 1 chip cleaner and No. 3 chip cleaners 11 all have cuttings liquid spout, as the cuttings liquid spout 19 on No. 3 chip cleaners 11.Then at upper industrial computer VB, control on interface and correlation parameter is set by RS232C port and the next Programmable Logic Controller PLC communication, by the running of No. 1 chip cleaner motor of Frequency Converter Control, No. 2 chip cleaner motors and No. 3 chip cleaner motors, carry out the circulation chip removal process of determining rotating speed, fixing time, and then realize the fail-test to chip cleaner.In process of the test, the signal that vibration transducer (three) detects by signal amplifier, amplify and A/D card conversion after feed back to upper industrial computer, carry out closed-loop control; The signal that picking sensor (three) detects directly feeds back in the next Programmable Logic Controller PLC, blocks up bits protection and Real-Time Monitoring, if the fault of detecting, system can be shut down, be reported to the police.
Plural serial stage tandem type chip cleaner reliability test bench of the present invention is when carrying out fail-test to chip cleaner, first according to the lathe operating mode of testing requirements or simulation, crumb loading device chip removal mouth arm-tie 5 is pulled to appropriate location, then on upper industrial computer VB control interface, the chip cleaner parameter of electric machine is set and controls parameter, by RS232C serial communication, control the next Programmable Logic Controller PLC, realize the running of chip cleaner motor, after load fail-test.
Embodiment described in the present invention can understand and apply the invention for the ease of these those skilled in the art, the present invention is a kind of embodiment of optimization, a kind of preferably concrete technical scheme in other words conj.or perhaps, it is only applicable to of the same type in certain limit, the fail-test of the chip cleaner of varying number, dissimilar outside scope, the fail-test of the chip cleaner of varying number, basic technical scheme is constant, but the specifications and models of its parts used will change thereupon, as vibration transducer and picking sensor etc., therefore the invention is not restricted to implement the description of this kind of more specific technical scheme.If relevant technician in the situation that adhering to basic technical scheme of the present invention, make do not need through the equivalent structure of creative work change or various modification all in protection scope of the present invention.

Claims (7)

1. a plural serial stage tandem type chip cleaner reliability test bench, is mainly comprised of circulation chip removal mechanism, state-detection alarm mechanism and speed change automatic controls, it is characterized in that:
Described circulation chip removal mechanism by being fixed on bracing frame on ground black iron (4), be fixed on two above chip cleaners on ground black iron (4) or bracing frame and the crumb loading device (7) being fixed on bracing frame forms;
The chip cleaner chip removal carrier bar of first chip cleaner is over against the crumb loading device crumb mouth (27) of crumb loading device (7), and the chip cleaner crumb mouth of last chip cleaner is over against the crumb loading device crumb inlet (26) of crumb loading device (7); Remove the chip cleaner crumb mouth of last chip cleaner outside the crumb loading device crumb inlet (26) of crumb loading device (7), the chip cleaner crumb mouth of all the other chip cleaners is over against the chip cleaner chip removal carrier bar of next chip cleaner;
Described state-detection alarm mechanism is comprised of picking sensor, vibration transducer, A/D card and signal amplifier; Described picking sensor and vibration transducer are all fixed on chip cleaner;
Described speed change automatic controls is comprised of switch board (14), the control panel (15), upper industrial computer, the next Programmable Logic Controller PLC and the frequency converter that are arranged in switch board (14); Upper industrial computer, the next Programmable Logic Controller PLC and frequency converter are all fixed on control panel (15).
2. a kind of plural serial stage tandem type chip cleaner reliability test bench according to claim 1, is characterized in that: on bracing frame or on ground black iron (4), be provided with front support piece and rear support piece; On front support piece and rear support piece, fixedly mount fixedly angle steel; Fixedly angle steel is provided with strip hole, for regulating the front and back position of chip cleaner.
3. a kind of plural serial stage tandem type chip cleaner reliability test bench according to claim 1, is characterized in that:
Described picking sensor is connected with the down direction of the next Programmable Logic Controller PLC, and described vibration transducer is connected with upper industrial computer by signal amplifier, A/D card;
The up direction of described the next Programmable Logic Controller PLC and upper industrial computer communication, the down direction of the next Programmable Logic Controller PLC is connected with frequency converter rotating speed control interface, and main circuit of converter output terminal is connected with the power interface of chip cleaner motor.
4. a kind of plural serial stage tandem type chip cleaner reliability test bench according to claim 1, is characterized in that: support frame as described above is made as No. 1 bracing frame (1), No. 2 bracing frames (12), No. 3 bracing frames (3);
Described chip cleaner is made as No. 1 chip cleaner (2), No. 2 chip cleaners (10), No. 3 chip cleaners (11); No. 1 chip cleaner (2), No. 2 chip cleaners (10) and No. 3 chip cleaners (11) are separately fixed on ground black iron (4), No. 1 bracing frame (1) and No. 2 bracing frames (12);
Described crumb loading device (7) is fixed on No. 3 bracing frames (3).
5. a kind of plural serial stage tandem type chip cleaner reliability test bench according to claim 2, is characterized in that: described front support piece and rear support are three; Described fixedly angle steel is six covers.
6. a kind of plural serial stage tandem type chip cleaner reliability test bench according to claim 4, is characterized in that:
No. 1 chip cleaner crumb mouth (20) of described No. 1 chip cleaner (2) is over against No. 2 chip cleaner chip removal carrier bars (24) of No. 2 chip cleaners (10), and No. 1 chip cleaner chip removal carrier bar (23) of No. 1 chip cleaner (2) is over against the crumb loading device crumb mouth (27) of crumb loading device (7); No. 2 chip cleaner crumb mouths (21) of described No. 2 chip cleaners (10) are over against No. 3 chip cleaner chip removal carrier bars (25) of No. 3 chip cleaners (11); No. 3 chip cleaner crumb mouths (22) of described No. 3 chip cleaners (11) are over against the crumb loading device crumb inlet (26) of crumb loading device (7); No. 2 chip cleaners (10) are placed perpendicular to No. 1 chip cleaner (2), and No. 3 chip cleaners (11) are placed perpendicular to No. 2 chip cleaners (10).
7. a kind of plural serial stage tandem type chip cleaner reliability test bench according to claim 1, is characterized in that:
Described picking sensor is fixed on picking sensor support, is made as three covers, is separately fixed in the same position of No. 1 chip cleaner (2), No. 2 chip cleaners (10) and No. 3 chip cleaners (11); Described vibration transducer is fixed on vibration transducer support, is made as three covers, is separately fixed in the same position of No. 1 chip cleaner (2), No. 2 chip cleaners (10) and No. 3 chip cleaners (11).
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Publication number Priority date Publication date Assignee Title
CN104400562A (en) * 2014-11-13 2015-03-11 吉林大学 Chip plugging detection device for chain plate type chip remover
CN105912842A (en) * 2016-04-05 2016-08-31 吉林大学 Testing method of incipient failure removal for machining center
CN107717614A (en) * 2017-11-16 2018-02-23 沈阳机床(东莞)智能装备有限公司 A kind of more chip removal device cascaded structures and chip removal method
CN110926792A (en) * 2020-01-14 2020-03-27 吉林大学 Multi-working-condition loaded reliability test device and method for cutting fluid centralized filtering system
CN110926792B (en) * 2020-01-14 2021-01-26 吉林大学 Multi-working-condition loaded reliability test device and method for cutting fluid centralized filtering system
CN115156982A (en) * 2022-07-06 2022-10-11 吉林大学 Blockage chip removing type chip removal device and reliability test method thereof
CN115156982B (en) * 2022-07-06 2024-02-13 吉林大学 Chip blocking removal device and reliability test method thereof

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