CN103576099B - LED lamp flicking testing system and implementation testing method thereof - Google Patents
LED lamp flicking testing system and implementation testing method thereof Download PDFInfo
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- CN103576099B CN103576099B CN201310326110.2A CN201310326110A CN103576099B CN 103576099 B CN103576099 B CN 103576099B CN 201310326110 A CN201310326110 A CN 201310326110A CN 103576099 B CN103576099 B CN 103576099B
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Abstract
The invention discloses an LED lamp flicking testing system and an implementation method thereof, and belongs to the technical field of testing. The LED lamp flicking testing system comprises a power source module, a sensor linear array unit, a signal front-end processing unit and calculating equipment. The sensor linear array unit is arranged at the top inside a curtain through a height adjustable support. The curtain is arranged at the upper portion of a conveying belt. The curtain and the conveying belt form a darkroom, and the sensor linear array unit is composed of illuminance sensors. The power source module provides power for the illuminance sensors, the signal front-end processing unit and the calculating equipment in the testing system, and ensures that each functional unit works normally. The sensor linear array unit is an array formed by the illuminance sensors which are high in flexibility and high in response speed.
Description
Technical field
The present invention relates to a kind of LED lamp flashes test system and its realizes method of testing, belong to technical field of measurement and test.
Background technology
Incandescent lamp, fluorescent lamp and Halogen lamp LED be all use AC-powered, particularly incandescent lamp tungsten filament generate heat after, power supply
Moment minor variations will not cause the change of incandescent light illumination, that is to say, that the moment minor variations of power supply will not cause white heat
The sense of vision flicker of lamp.And LED is powered with constant current source, the time response of LED, quickly power supply existed a little small
Change will cause the change of LED illuminance, so as to LED can produce scintillation.
It is currently to detect the method for testings pair such as special gyro with the Photometer for Flashing Light and stroboscopic of the continuous quick samplings of PR-110
Alternating arc lamp carries out stroboscopic test.But the Photometer for Flashing Light of the continuous quick samplings of PR-110 can only be carried out under AC conditions
The stroboscopic test and this test of light fixture is a test, for the stroboscopic of the LED of Constant Direct Current source driving is higher than PR-110
Sample frequency in the case of, the Photometer for Flashing Light of the continuous quick samplings of PR-110 cannot measure Constant Direct Current source drive it is lower
LED flashes, and cannot also carry out LED lamp face flicker test spatially.
Due to measuring the LED flicker under Constant Direct Current source drives at present, this problem brought is exactly a producer
The LED of one flicker can be put goods on the market as certified products, the eyes for being so certain to the user to LED bring wound
Evil.
The content of the invention
The present invention is directed to the proposition of problem above, and develops a kind of LED lamp and flash test system, and this practicality newly make use of
Linear array and movement detection method can conveniently carry out LED lamp face flicker test spatially, and efficiently solve
Current test system cannot test out the LED lamp flicker problem in the case where constant-current source drives.
The technological means of the present invention is as follows：
A kind of LED lamp flicker test system includes power module, sensor line style array element, signal front-end processing list
Unit, computing device；Sensor line style array element is arranged on the top inside described curtain by brackets with height-adjustable；Curtain
It is arranged on the top of conveyer belt；Curtain forms darkroom with conveyer belt.
Sensor line style array element is made up of illuminance sensor；Power module is for the illuminance in test system
Sensor, signal front-end processing unit and computing device provide electric energy, it is ensured that each functional unit energy normal work；
Sensor line style array element is the array formed by the illuminance sensor of high sensitivity, quick response, sensing
Device linear array unit can detect the ripple of constant current source and cause the extremely faint illuminance situation of change of LED lamp, and
And the optical signal for detecting is converted into into electric signal；
Signal front-end processing unit can be sampled to multiple signals and be converted analog signals into digital letter simultaneously
Number and parallel signal is changed into into serial signal transfer to computing device；
Curtain is to block extraneous illuminance to treat the illuminance generation impact for surveying LED lamp, it is ensured that the light in darkroom (209)
Illumination is the illuminance of LED lamp to be measured；
The installation direction of the sensor line style array element on brackets with height-adjustable and the transmission direction of conveyer belt
Illuminance sensor at vertical and darkroom centre is more than or equal to LED lamp to be measured directly vertically below apart from L
10R, R are LED lamp radius；
Computing device is that the illumination data signal of physical space is converted into picture signal and is stored to be sent to after record virtually
Instrument, when a lamp test is finished, virtual instrument shows the illumination and flashing state of LED lamp.
A kind of LED lamp flicker test system realizes that the method for test LED comprises the steps：
Row's illuminance sensor is fixed at A, the top centre inside darkroom, the illuminance for now fixing is passed
Sensor all works；
B, LED lamp to be measured is installed on a moving belt；
An illuminance sensor at the centre of top and LED to be measured directly vertically below inside C, guarantee darkroom
Have (205) is more than or equal to 10R apart from L, and R is LED lamp radius；
Whether D, detection curtain effectively block the impact of extraneous illuminance, if do not affected with regard to normal work；If
Impact is just eliminated the effects of the act；
LED lamp transport to be measured is evenly entered line flicker test by E, described conveyer belt to darkroom；
F, open system power supply, sensor line style array element all to the illuminance of the LED lamp to be measured on conveyer belt with
Higher sampling frequency is sampled, and gives signal front-end processing list into electric signal transmission by the optical signal rapid translating sampled
Unit, signal front-end processing unit the analog signal for sampling is converted into data signal and by parallel signal be changed into serial transmission to
The illumination data signal of physical space is converted into picture signal and to be stored be sent to Virtual instrument after record by computing device, computing device
Device, when a lamp test is finished, virtual instrument shows the illumination and flashing state of LED lamp, because conveyer belt evenly will
Light fixture moves to the other end from darkroom one end, then what illuminance sensor array element was detected be LED lamp spatially
Face illumination, i.e. this test system is effectively tested out in the case where constant-current source drives LED lamp flicker and easily carried out LED
Tool face flicker test spatially.
The principle and beneficial effect of the present invention：
1. this test system can test out the LED lamp in the case where constant-current source drives and flash in real time, and current nothing is solved well
Method knows LED/light source Real-Time Optical illumination situation of change this predicament, at the same filled up currently without it is a set of can real-time detection to
This blank of the test system of LED lamp flicker under constant-current source driving.
2. this test system is applicable not only to the point flicker test of conventional lamp, and can also conveniently carry out light fixture in space
On face flicker test.So as to comprehensively obtain the scintillation parameter of light fixture, for light fixture research and development, manufacture and process modification survey is provided
Trial work section.
3. the linear array unit of this test system can sample in synchronization to light fixture illuminance, realize sampling
Time synchronized, it is ensured that this test system has higher certainty of measurement.
4. the signal front-end processing unit of this test system by the parallel signal for sampling be converted into serial signal transfer to
Computing device, realizes simple system, easily realizes, so as to this test system manufacturing cost is relatively low using this serial process.
Description of the drawings
Fig. 1：A kind of LED lamp flashes test system structure block diagram；
Fig. 2：A kind of LED lamp flicker test is embodied as schematic diagram；
Fig. 3：LED lamp face flicker test design sketch spatially；
In Fig. 1 and Fig. 2：101st, power module, 102, sensor line style array element, 103, signal front-end processing unit,
The 104th, the computing device of virtual instrument is installed.201st, conveyer belt, 202, drive constant-current source, 203, LED base, 204, non-point
Bright LED lamp, 205, the LED lamp lighted, 206, ink discharge device, 207 and 208, curtain, 209, darkroom, 210, sensor
Linear array unit, 211, brackets with height-adjustable, 212, signal transmssion line, 213, signal front-end processing unit, 214, be provided with
The computing device of virtual instrument.
In Fig. 3：x：Sensor linear array orientation, y：Light fixture moving direction, z：Sensor linear array is away from ground
Height, 1：Sensor linear array, 2：The space face illumination that real-time detection is arrived, 3：LED lamp
Specific embodiment
In order to be better understood from the technique effect of the present invention, spy provides gray-scale map Fig. 3 to illustrate the technique effect of the present invention,
And also to preferably allow auditor to understand that the technique effect of the present invention is special provide gray-scale map Fig. 3 to illustrate the technology of the present invention
Effect.
The utility model is described further below in conjunction with the accompanying drawings：
Shown in Fig. 1：A kind of LED lamp flicker test system is included before power module, sensor line style array element, signal
End processing unit, computing device；Sensor line style array element is arranged on described curtain 207 by brackets with height-adjustable 211
With the top inside 208；Curtain 207 and 208 is arranged on the top of conveyer belt 201；Curtain 207 and 208 is formed with conveyer belt 201
Darkroom,
Sensor line style array element is made up of illuminance sensor；Power module is that the illuminance in test system is passed
Sensor, signal front-end processing unit and computing device are powered, it is ensured that each functional unit energy normal work；
Sensor line style array element is the array formed by the illuminance sensor of high sensitivity, quick response, sensing
Device linear array unit can detect the ripple of constant current source and cause the extremely faint illuminance situation of change of LED lamp, and
And the optical signal for detecting is converted into into electric signal；
Signal front-end processing unit can be sampled to multiple signals and be converted analog signals into digital letter simultaneously
Number and parallel signal is changed into into serial signal transfer to computing device；
Shown in Fig. 2：Curtain 207 and 208 is to block extraneous illuminance to treat the illuminance generation impact for surveying LED lamp, is protected
Illuminance in card darkroom 209 is the illuminance of LED lamp to be measured 205；Pickup wire on brackets with height-adjustable 211
The installation direction of type array element 210 is vertical with the transmission direction of conveyer belt and darkroom centre at illuminance sensor with
LED lamp to be measured 205 directly vertically below apart from L be more than or equal to 10R, R be LED lamp radius；Computing device is by physics
The illumination data signal in space is converted into picture signal and to store be sent to virtual instrument after record, when a lamp test is finished,
Virtual instrument shows the illumination and flashing state of LED lamp.
A kind of LED lamp flicker test system realizes that the method for test LED comprises the steps
Row's illuminance sensor, the illumination for now fixing are fixed at A, the top centre inside darkroom 209
Degree sensor all works；
B, LED lamp to be measured is installed on conveyer belt 201；
An illuminance sensor and LED to be measured directly vertically below at C, the guarantee inner tip centre of darkroom 209
Light fixture 205 apart from L be more than or equal to 10R, R be LED lamp radius；
Whether D, detection curtain 207 and 208 effectively block the impact of extraneous illuminance, if do not affected with regard to normal work
Make；Eliminate the effects of the act if having an impact；
LED lamp transport to be measured is evenly entered line flicker test by E, described conveyer belt 201 to darkroom 209；
F, open system power supply, sensor line style array element 210 is all to the LED lamp to be measured (205) on conveyer belt
Illuminance is sampled with higher sampling frequency, and gives signal front end into electric signal transmission by the optical signal rapid translating sampled
Processing unit 213,213 pairs of analog signals for sampling of signal front-end processing unit are converted into data signal and become parallel signal
It is serial transmission to computing device 214, the illumination data signal of physical space is converted into picture signal and is deposited by computing device 214
Virtual instrument is sent to after storage record, when a lamp test is finished, virtual instrument shows the illumination and flashing state of LED lamp,
Because light fixture is evenly moved to the other end by conveyer belt from darkroom one end, then illuminance sensor array element is detected
Be LED lamp face illumination spatially, i.e. this test system be effectively tested out constant-current source drive under LED lamp flash simultaneously
LED lamp face flicker test is spatially easily carried out.
Shown in Fig. 3：x：Sensor linear array orientation, y：Light fixture moving direction, z：Sensor linear array is away from ground
The height in face, 1：Sensor linear array, 2：The space face illumination that real-time detection is arrived, 3：LED lamp.Sensor is equidistant along x-axis
Arrangement, 2 is the planar illumination curve measured in real time when light fixture is moved by y-axis direction.Obtain this planar illumination curve procedures such as
Under：In the moving process from left to right of light fixture 3, sensor array element 1 will detect that the mobile illumination in the space of light fixture 3, when
Light fixture is most long with a distance from sensor array element 1 in high order end, and the illumination that sensor array element 1 is now detected is most
It is low, when light fixture 3 is moved from left to right, when moving to the underface of sensor array element 1 with a distance from sensor array element 1
Most short, as shown in figure 3, the illumination highest that sensor array element 1 is now detected, when continuing to move right, illumination continues again
Reduce.If whole process light fixture flicker free, it will obtain the planar illumination design sketch shown in Fig. 3.If there is flicker in light fixture,
The space face illumination 2 that sensor array element 1 is detected will occur fluctuation, so can in real time reflect the flicker feelings of light fixture
Condition, finally realizes the flicker test of LED lamp.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto,
Any those familiar with the art the invention discloses technical scope in, technology according to the present invention scheme and its
Inventive concept equivalent or change in addition, all should be included within the scope of the present invention.
Claims (1)
1. a kind of method that utilization LED lamp flicker test system realizes test LED, LED lamp flicker test system includes
Power module, sensor line style array element, signal front-end processing unit, computing device；Sensor line style array element (210)
The internal top of curtain (207 and 208) is arranged on by brackets with height-adjustable (211)；Curtain (207 and 208) is arranged on transmission
The top of band (201)；Curtain (207 and 208) forms darkroom with conveyer belt (201), and sensor line style array element (210) is by light
Illuminance transducer is constituted；Power module is that the illuminance sensor in test system, signal front-end processing unit and calculating are set
Available electricity, it is ensured that each functional unit energy normal work；Sensor line style array element (210) is by high sensitivity, quick sound
The array that the illuminance sensor answered is formed, sensor line style array element (210) can detect the ripple of constant current source and draw
The extremely faint illuminance situation of change of LED lamp is played, and the optical signal for detecting is converted into into electric signal；At signal front end
Reason unit can be sampled to multiple signals and be converted analog signals into data signal and be changed into parallel signal simultaneously
Serial signal transfer is to computing device；Curtain (207 and 208) is to block extraneous illuminance to treat the illuminance product for surveying LED lamp
It is raw to affect, it is ensured that the illuminance in darkroom (209) is the illuminance of LED lamp to be measured (205)；
The installation direction of sensor line style array element (210) on brackets with height-adjustable (211) and the biography of conveyer belt
Defeated direction is vertical and darkroom centre at illuminance sensor with LED lamp to be measured (205) directly vertically below apart from L
More than or equal to 10R, R is LED lamp radius；Computing device is that the illumination data signal of physical space is converted into into picture signal
And store record after be sent to virtual instrument, when a lamp test is finished, virtual instrument show LED lamp illumination and flicker feelings
Condition；
It is characterized in that：The method for realizing test LED, comprises the steps A, the top centre inside darkroom (209)
Place fixes row's illuminance sensor, and the illuminance sensor for now fixing all works；B, the installation on conveyer belt (201)
LED lamp to be measured；C, ensure an illuminance sensor at darkroom (209) inner tip centre and treating directly vertically below
That surveys LED lamp (205) is more than or equal to 10R apart from L, and R is LED lamp radius；Whether D, detection curtain (207 and 208) are effective
The impact of extraneous illuminance is blocked, if do not affected with regard to normal work；Eliminate the effects of the act if having an impact；E, described transmission
LED lamp transport to be measured is evenly entered line flicker test by band (201) to darkroom (209)；
F, open system power supply, sensor line style array element (210) is all to the light of the LED lamp to be measured (205) on conveyer belt
Illumination is sampled with sampling frequency, and gives signal front-end processing list into electric signal transmission by the optical signal rapid translating sampled
First (213), signal front-end processing unit (213) is converted into data signal and is changed into parallel signal to the analog signal for sampling
The illumination data signal of physical space is converted into picture signal simultaneously to computing device (214), computing device (214) by serial transmission
Virtual instrument is sent to after storage record, when a lamp test is finished, virtual instrument shows the illumination of LED lamp and flicker feelings
Condition, because light fixture is evenly moved to the other end by conveyer belt from darkroom one end, then sensor line style array element (210) is examined
What is measured is that LED lamp face illumination spatially, i.e. this test system are effectively tested out the LED lamp in the case where constant-current source drives
Flicker has simultaneously easily carried out LED lamp face flicker test spatially.
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104391140A (en) * | 2014-11-17 | 2015-03-04 | 杭州市质量技术监督检测院 | Height-adjustable lamp electromagnetic compatibility testing bracket |
| CN104330750B (en) * | 2014-11-20 | 2017-05-24 | 肖旭华 | Method and system for testing twinkling characteristics of LED (light emitting diode) light source and drive power source thereof |
| US9584704B2 (en) * | 2015-01-08 | 2017-02-28 | Gean Technology Co. Limited | Method for detecting electronic lighting flickering |
| CN107179514B (en) * | 2017-04-24 | 2019-08-20 | 歌尔股份有限公司 | Lamps and lanterns flash test method and system |
| CN107677319A (en) * | 2017-11-03 | 2018-02-09 | 广东工业大学 | A kind of LED test system |
| CN108267224A (en) * | 2018-01-24 | 2018-07-10 | 深圳中恒检测技术有限公司 | A kind of high-volume illumination photometer detection device and detection method |
| CN109342976A (en) * | 2018-11-14 | 2019-02-15 | 广东昇辉电子控股有限公司 | A kind of cluster of lamps, ornamental detection device |
| CN113188775B (en) * | 2021-07-02 | 2022-02-01 | 成都康拓兴业科技有限责任公司 | Aviation anticollision lamp flash frequency tester |
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| CN101566500A (en) * | 2008-04-23 | 2009-10-28 | 广州市光机电技术研究院 | Device and method for testing LED light source intensity space distribution characteristic |
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