CN103558225B - A kind of cmos image chip detecting method - Google Patents
A kind of cmos image chip detecting method Download PDFInfo
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- CN103558225B CN103558225B CN201310586530.4A CN201310586530A CN103558225B CN 103558225 B CN103558225 B CN 103558225B CN 201310586530 A CN201310586530 A CN 201310586530A CN 103558225 B CN103558225 B CN 103558225B
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Abstract
A kind of cmos image chip detecting method, comprises step: 1: provide a kind of cmos image chip test system, comprising: host computer, test board, light source, cmos image chip; 2: host computer setting dimmer command value, sends dimmer command to test board; 3: test board is by D/A control circui light-source brightness; 4: when light-source brightness starts to change, PC control cmos image chip output image is to test board; 5: host computer resets dimmer command value, repeat above-mentioned steps 2-4; 6: the view data collected is outputted to host computer by test board, host computer carries out image procossing after receiving view data; 7: host computer judges according to processing result image whether cmos image chip exists a little/line is bad.Cmos image sensor method of testing provided by the invention, by carrying out programmed control to light-source brightness change, realize program test and picture brightness change is synchronously carried out, the bad product that there is lighter Points And lines when change brightness of image also can realize program crawl completely.
Description
Technical field
The present invention relates to CMOS chip testing industry, particularly a kind of Novel CMOS picture chip detecting method.
Background technology
Existing method of testing is mainly divided into white light and full dark-state two kinds of environmental testings: under the test environment of white light, and host computer can capture the black color dots class/line badness in image, and realizes the judgement of bad product after obtaining view data; Under full dark-state, the coloured silk/bright spot in image also can crawledly arrive, and product also can be regarded as bad product.But in actual test process, the Points And lines that some are lighter can be there is, larger grey value difference is presented with the normal picture of surrounding in the brightness change procedure of image, to this lighter Points And lines, under white light and full dark-state, software and human eye are all difficult to identify, and under existing method of testing, upper computer software normally starts analysis chart picture under the complete white of image and complete dark state, the bad product that there is lighter Points And lines is caused effectively to be captured.
Summary of the invention
For above-mentioned problems of the prior art, the object of the invention is to the method for testing improveing existing cmos image sensor, effectively capture bad product.
In order to realize foregoing invention object, the technical solution used in the present invention is as follows:
A kind of cmos image chip detecting method, comprises the steps:
Step 1: a kind of cmos image chip test system is provided, comprises: host computer, test board, light source, cmos image chip;
Step 2: host computer setting dimmer command value, sends dimmer command to test board;
Step 3: test board is by D/A control circui light-source brightness;
Step 4: when light-source brightness starts to change, PC control cmos image chip output image is to test board;
Step 5: host computer resets dimmer command value, repeats above-mentioned steps 2-4;
Step 6: the view data collected is outputted to host computer by test board, host computer carries out image procossing after receiving view data;
Step 7: host computer judges according to processing result image whether cmos image chip exists a little/line is bad.
Preferably, in above-mentioned cmos image chip detecting method, be provided with one group of dimmer command value in the test procedure of described host computer, described dimmer command value is stepped change, is controlled the stepped change of light-source brightness by test board and D/A circuit realiration.
Preferably, in above-mentioned cmos image chip detecting method, described cmos image chip provide power supply by test board and with test board communication after, view data is sent to test board by parallel port or MIPI interface.
Preferably, in above-mentioned cmos image chip detecting method, described test board is USB test board, is driven by the test procedure of host computer, obtains view data and carries out graphical analysis further to view data.
Preferably, in above-mentioned cmos image chip detecting method, in described step 6, the view data packing that cmos image chip produces by USB test board, is sent to host computer according to usb protocol.
Use cmos image sensor method of testing provided by the invention, by carrying out programmed control to light-source brightness change, realize program test and picture brightness change synchronously carry out, the bad product that there is lighter Points And lines when changing brightness of image also can realize program completely and capture, break away from artificial eye recognition, also evade the result of determination difference because eye recognition brings.
Accompanying drawing explanation
Fig. 1 is a kind of illustrative diagram of cmos image chip detecting method.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with embodiment and accompanying drawing, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
In chip testing process, chip, can point/line in the output image of automatic straightening self bad by the hardware algorithm of self, the result of rectification be the point/line in image become very light.Correct and complete gradually by exporting at chip in a few two field picture process, and in several images of chip correcting process, feature when the bad relative rectification of point/line completes more obviously (point/line clearly).In original method of testing, host computer procedure waits for that chip self has been corrected rear just beginning and tested, and now, the point/line in image is bad very light, and it is bad very difficult that host computer procedure analyzes wherein very light point/line, only has and go to distinguish by human eye.
Cmos image chip detecting method provided by the present invention, host computer knows when the intensity of light source will change, know when chip starts automatic straightening simultaneously, the moment changed is started in the intensity of light source, gather immediately and analysis chart picture, the hardware of chip itself starts to do the remedial action to point/line according to light source change simultaneously, before chip self has been corrected, the obvious image of point/line in chip output image is also captured by host computer and analyzes, and host computer can be published picture the bad problems of point/line all in picture according to image identifying easily.
Figure 1 shows that a kind of cmos image chip detecting method, comprise step: (1) host computer sends dimmer command " 1 " to test board; (2) USB test board is by D/A circuit realiration light-source brightness " 2 "; (3) cmos image chip output image is to USB test board " 3 "; (4) host computer starts image procossing " 4 " after receiving view data; (5) step (1) ~ (4) are repeated, dimmer command value stepped change in step (1); (6) single chips test terminates.
In one more specifically embodiment, the method for testing of cmos image chip comprises the steps:
Step 1: a kind of cmos image chip test system is provided, comprises: host computer, test board, light source, cmos image chip;
Step 2: host computer setting dimmer command value, sends dimmer command to test board; Wherein, be provided with one group of dimmer command value in the test procedure of described host computer, described dimmer command value is stepped change, is controlled the stepped change of light-source brightness by test board and D/A circuit realiration;
Step 3: test board is by D/A control circui light-source brightness;
Step 4: when light-source brightness starts to change, PC control cmos image chip output image is to test board; Wherein, described cmos image chip provide power supply by test board and with test board communication after, view data is sent to test board by parallel port or MIPI interface;
Step 5: host computer resets dimmer command value, repeats above-mentioned steps 2-4;
Step 6: the view data collected is outputted to host computer by test board, host computer carries out image procossing after receiving view data; Wherein, described test board is USB test board, is driven by the test procedure of host computer, obtains view data to the further graphical analysis of view data; The view data packing that cmos image chip produces by USB test board, is sent to host computer according to usb protocol;
Step 7: host computer judges according to processing result image whether cmos image chip exists a little/line is bad.
The above embodiment only have expressed embodiments of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (4)
1. a cmos image chip detecting method, is characterized in that, comprises the steps:
Step 1: a kind of cmos image chip test system is provided, comprises: host computer, test board, light source, cmos image chip;
Step 2: host computer setting dimmer command value, send dimmer command to test board, wherein, in the test procedure of described host computer, be provided with one group of dimmer command value, described dimmer command value is stepped change, is controlled the stepped change of light-source brightness by test board and D/A circuit realiration;
Step 3: test board is by D/A control circui light-source brightness;
Step 4: when light-source brightness starts to change, PC control cmos image chip output image is to test board;
Step 5: host computer resets dimmer command value, repeats above-mentioned steps 2-4;
Step 6: the view data collected is outputted to host computer by test board, host computer carries out image procossing after receiving view data;
Step 7: host computer judges according to processing result image whether cmos image chip exists a little/line is bad.
2. cmos image chip detecting method according to claim 1, is characterized in that, described cmos image chip provide power supply by test board and with test board communication after, view data is sent to test board by parallel port or MIPI interface.
3. cmos image chip detecting method according to claim 2, is characterized in that, described test board is USB test board, is driven by the test procedure of host computer, obtains view data and carries out graphical analysis further to view data.
4. cmos image chip detecting method according to claim 3, is characterized in that, in described step 6, the view data packing that cmos image chip produces by USB test board, is sent to host computer according to usb protocol.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104458206A (en) * | 2014-12-08 | 2015-03-25 | 天津大学 | Labview-based image sensor testing system |
| CN104792795A (en) * | 2015-04-30 | 2015-07-22 | 无锡英斯特微电子有限公司 | Image testing method of optical mouse chip |
| CN106899844A (en) * | 2017-02-13 | 2017-06-27 | 张家港市欧微自动化研发有限公司 | A kind of cmos sensor test system |
| CN107191834A (en) * | 2017-06-22 | 2017-09-22 | 北京思比科微电子技术股份有限公司 | The light-source system tested for image chip |
| JP7215777B2 (en) * | 2019-11-19 | 2023-01-31 | 深▲せん▼市海譜納米光学科技有限公司 | Self-calibration method for tunable Fabry-Perot cavity and spectrum collection device with self-calibration function |
| CN116027181B (en) * | 2023-03-30 | 2023-07-18 | 浙江瑞测科技有限公司 | Parallel image processing device and method |
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| JP2009186447A (en) * | 2008-02-11 | 2009-08-20 | Toray Ind Inc | Inspection apparatus |
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| US6625558B1 (en) * | 1999-11-05 | 2003-09-23 | Zoran Corporation | Method and apparatus for testing CMOS image sensors |
| CN102749749A (en) * | 2011-04-18 | 2012-10-24 | 财团法人工业技术研究院 | Electro-optical adjusting apparatus, electro-optical detector and detection method thereof |
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Address after: 215411 No. 20, Jian Xiong Road, science and Education Town, Taicang, Suzhou, Jiangsu Patentee after: Howay semiconductor (Taicang) Co.,Ltd. Address before: 215411 No. 20, Jian Xiong Road, science and Education Town, Taicang, Suzhou, Jiangsu Patentee before: TAICANG SUPERPIX MICRO TECHNOLOGY CO.,LTD. |
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