CN103529252A - Direct plug-in universal electrical connecting device - Google Patents
Direct plug-in universal electrical connecting device Download PDFInfo
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- CN103529252A CN103529252A CN201310491930.7A CN201310491930A CN103529252A CN 103529252 A CN103529252 A CN 103529252A CN 201310491930 A CN201310491930 A CN 201310491930A CN 103529252 A CN103529252 A CN 103529252A
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Abstract
The invention provides a direct plug-in universal electrical connecting device, which is used for connecting equipment to be tested and testing equipment. The device comprises a testing interface board, a final testing universal interface board and at least one signal transmission board, wherein the testing interface board is connected with the testing equipment; the final testing universal interface board is connected with the equipment to be tested; the at least one signal transmission board is connected between the testing interface board and the final testing universal interface board, and comprises signal wiring layers and shielding and isolating layers which are arranged at intervals. The direct plug-in universal electrical connecting device provided by the invention has the advantages that when the device is matched with a corresponding dual-port connecting method, coaxial cables are not used for connecting a signal source and a plug board, the cost is saved, the testing signal quality can be improved, the variety switching becomes quicker, the firmness and the durability of the final testing plug board are improved and the high-temperature and low-temperature testing capability is improved.
Description
Technical field
The present invention relates to a kind of connecting interface in semiconductor test field, especially relate to a kind of direct insertion General Electric coupling arrangement.
Background technology
General-purpose chip tester (Tester) is generally divided into direct crimping form and coaxial connection mode with the signaling interface that is connected of measured device.By these two kinds of modes, the electric signal transmission of test use is surveyed with on socket to whole, thereby form electric path with measured device, tested.Wherein the coaxial connection mode of the second is by the concentric cable with signal shielding layer, and the signal of tester output is connected to and surveys eventually socket.Along with the raising of test frequency, the quality of concentric cable has just determined the quality of test signal.Meanwhile, conventionally chip testing is more with number of channels, if multi-chip with the words of surveying will with risings that be directly proportional of same quantitation, for example, twoly generally can reach 300 cables during with survey.Thus, the purchase cost of concentric cable also becomes very high.
Test interface plate, or be called production board, output board etc., be generally the electric interfaces towards measured device that testing apparatus provides, the socket of surveying eventually, it provides the socket that meets measured device packing forms, by the wiring of this socket inside, the signal of the board of self-test is in the future connected on the pin or soldered ball of measured device.Concentric cable is connecting test interface board and socket.
Test and feedback signal have in the process of this cable internal transmission to be disturbed and loss, and the antijamming capability of the length of cable and design itself has just determined the waveform quality of whole tester output.For the different product of adaptation, must combine and design corresponding socket by each customed different signal link.Therefore,, in the testing cost of a certain product, have and consumed greatly on customization concentric cable.When test is for multi-chip is simultaneously-measured time, the cost of this part rises straight line.
Summary of the invention
In order to solve at least one problem of mentioning in background technology, the invention provides the direct insertion General Electric coupling arrangement that a kind of signal quality cost-saving and that make to transmit is improved.
To achieve these goals, the present invention proposes a kind of direct insertion General Electric coupling arrangement, for connecting Devices to test and testing apparatus, comprising: test interface plate, connects described testing apparatus; Survey eventually Universal interface board, connect described Devices to test; At least one signal transmission board, is connected to described test interface plate and described survey eventually between Universal interface board, and described signal transmission board comprises signal wiring layer and the shielding separation layer arranging with described signal wiring layer space.
Optionally, also comprise strengthening fixed support, described strengthening fixed support is between described test interface plate and the described Universal interface board of survey eventually.
Optionally, described test interface plate comprises a universal test socket.
Optionally, between described test interface plate and the described Universal interface board of survey eventually, a power channel is set, described power channel and the isolation of described signal wiring layer.
Optionally, a plurality of described signal transmission board is arranged in parallel.
Optionally, described signal transmission board also comprises standard interface framework, and a plurality of signal pin connectors are set in described standard interface framework.
Optionally, the distance between adjacent described signal pin plug-in unit equates.
The useful technique effect of the direct insertion General Electric of the present invention coupling arrangement is: the direct insertion General Electric of the present invention coupling arrangement coordinates corresponding dual-port connected mode, avoided use concentric cable to connect signal source and socket, cost-saving, can also improve test signal quality, make to switch kind faster, survey eventually by socket firm and durable degree and improve, improve high low temperature power of test.
Accompanying drawing explanation
Fig. 1 is the structural representation of the direct insertion General Electric of the present invention coupling arrangement.
Fig. 2 is the structural representation of signal transmission board in the direct insertion General Electric of the present invention coupling arrangement.
Fig. 3 is signal transmission board interlayer wiring design diagram.
Embodiment
Below, the present invention is described in further detail for 1-3 by reference to the accompanying drawings.
The present invention proposes a kind of direct insertion General Electric coupling arrangement, for connecting Devices to test and testing apparatus, comprising: test interface plate 10, connects described testing apparatus; Survey eventually Universal interface board 12, connect described Devices to test; At least one signal transmission board 15, is connected to described test interface plate 10 and described survey eventually between Universal interface board 12, and described signal transmission board 15 comprises signal wiring layer 22 and the shielding separation layer 23 arranging with described signal wiring layer 22 spaces.
Signal transmission board of the present invention can select one or polylith to be used in conjunction with in customization.When switching kind, can also select the signal transmission board of different connected modes, adaptive different product, makes the socket hardware of same set of customization can use different product demands and gets on.For example, product A can be selected the signal transmission board of 1,3,5,7 numberings; Product B can be selected the signal transmission board of 1,2,3,4 numberings.Further save testing cost, and facilitated different product to switch.
At described test interface plate 10 and described survey eventually between Universal interface board 12, be provided with strengthening fixed support 13, strengthening fixed support 13 is not subjected to displacement described test interface plate 10 and the described Universal interface board 12 of surveying eventually each other.
At described test interface plate 10, also comprise a universal test socket, signal transmission board 15 inside are connected to test jack by all signals, this test jack can be in the situation that the different product pin function of like products packing forms be different, the design of signal transmission board 15 and select just can adaptive all test products under changing.
Between described test interface plate 10 and the described Universal interface board 12 of survey eventually, a power channel 14 is set, described power channel 14 and 22 isolation of described signal wiring layer.
In the present embodiment, a plurality of described signal transmission boards 15 are arranged in parallel, described signal transmission board 15 also comprises standard interface framework 21, and in described standard interface framework, 21 arrange a plurality of signal pin connectors 20, and the distance between adjacent described signal pin plug-in unit 20 equates.
Fig. 2 is the diagrammatic cross-section of signal transmission board, and the high design of its outside length and width need to be mated design with the size of Universal interface board and General-purpose socket board.This signal transmission board inner lead is not limited to up and down straight-through form, at PCB interlayer, does shielding process, in individual layer, signal routing and shield wiring apart from one another by, signals layer is introduced in the standard socket framework of upper and lower 2 sides, is connected with signal pin connector.This connector can be done good electrical with outside and be connected.Change upper and lower wire laying mode, be just equal to the hardware configuration that has changed testing tool output channel, coordinate the different product that just can be fitted to same package with corresponding software set.
In Fig. 3, signals layer solid conductor, conductively-closed separation layer surrounds, and all shielding separation layers are at two-terminal-grounding.With regard to single signal transmssion line, connect up, as consistent in concentric cable internal transmission, signal is protected conductively-closed layer.Certainly, shield technology during wiring has many, and the design implements to be not limited to this type shielding mode.Be different from coaxial cable connected mode, this kind of signal transduction pathway is short, and screen layer can customize and add multilayer so that enhanced signal quality, transfer impedance can be when design coupling.Therefore, the waveform quality that adopts signal transmission board of the present invention to export, will surmount coaxial cable, can significantly reduce testing cost simultaneously.
Although the present invention discloses as above with preferred embodiment, so it is not in order to limit the present invention.In technical field of the present invention, have and conventionally know the knowledgeable, without departing from the spirit and scope of the present invention, when being used for a variety of modifications and variations.Therefore, protection scope of the present invention is when being as the criterion depending on claims person of defining.
Claims (7)
1. a direct insertion General Electric coupling arrangement, for connecting Devices to test and testing apparatus, is characterized in that, comprising: test interface plate, connects described testing apparatus; Survey eventually Universal interface board, connect described Devices to test; At least one signal transmission board, is connected to described test interface plate and described survey eventually between Universal interface board, and described signal transmission board comprises signal wiring layer and the shielding separation layer arranging with described signal wiring layer space.
2. direct insertion General Electric according to claim 1 coupling arrangement, is characterized in that: also comprise strengthening fixed support, described strengthening fixed support is between described test interface plate and the described Universal interface board of survey eventually.
3. direct insertion General Electric according to claim 1 coupling arrangement, is characterized in that: described test interface plate comprises a universal test socket.
4. direct insertion General Electric according to claim 1 coupling arrangement, is characterized in that: between described test interface plate and the described Universal interface board of survey eventually, a power channel is set, described power channel and the isolation of described signal wiring layer.
5. direct insertion General Electric according to claim 1 coupling arrangement, is characterized in that: a plurality of described signal transmission boards are arranged in parallel.
6. direct insertion General Electric according to claim 1 coupling arrangement, is characterized in that: described signal transmission board also comprises standard interface framework, and a plurality of signal pin connectors are set in described standard interface framework.
7. direct insertion General Electric according to claim 6 coupling arrangement, is characterized in that: the distance between adjacent described signal pin plug-in unit equates.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310491930.7A CN103529252B (en) | 2013-10-18 | 2013-10-18 | Direct plug-in universal electrical attachment means |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310491930.7A CN103529252B (en) | 2013-10-18 | 2013-10-18 | Direct plug-in universal electrical attachment means |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103529252A true CN103529252A (en) | 2014-01-22 |
| CN103529252B CN103529252B (en) | 2016-09-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310491930.7A Active CN103529252B (en) | 2013-10-18 | 2013-10-18 | Direct plug-in universal electrical attachment means |
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| CN (1) | CN103529252B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110702954A (en) * | 2019-11-05 | 2020-01-17 | 汉斯自动化科技(江苏)有限公司 | Direct insertion type power semiconductor module test fixture |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1248063A (en) * | 1998-07-30 | 2000-03-22 | 英泰斯特爱皮有限公司 | Device for connection of test head and probe board in substrate-testing system |
| US6443784B1 (en) * | 1999-09-24 | 2002-09-03 | Gunsei Kimoto | Contact and contact assembly using the same |
| EP1512977A2 (en) * | 1996-10-29 | 2005-03-09 | Agilent Technologies Inc. (a Delaware Corporation) | Loaded-board, guided-probe test fixture |
| JP2007086044A (en) * | 2005-09-19 | 2007-04-05 | Isao Kimoto | Prober device, and probe assembly used therefor |
| US20080116920A1 (en) * | 2006-11-14 | 2008-05-22 | Gunsei Kimoto | Coordinate Transformation Device For Electrical Signal Connection |
| CN101583880A (en) * | 2007-03-20 | 2009-11-18 | 日本麦可罗尼克斯股份有限公司 | Electrical connection device |
-
2013
- 2013-10-18 CN CN201310491930.7A patent/CN103529252B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1512977A2 (en) * | 1996-10-29 | 2005-03-09 | Agilent Technologies Inc. (a Delaware Corporation) | Loaded-board, guided-probe test fixture |
| CN1248063A (en) * | 1998-07-30 | 2000-03-22 | 英泰斯特爱皮有限公司 | Device for connection of test head and probe board in substrate-testing system |
| US6443784B1 (en) * | 1999-09-24 | 2002-09-03 | Gunsei Kimoto | Contact and contact assembly using the same |
| JP2007086044A (en) * | 2005-09-19 | 2007-04-05 | Isao Kimoto | Prober device, and probe assembly used therefor |
| US20080116920A1 (en) * | 2006-11-14 | 2008-05-22 | Gunsei Kimoto | Coordinate Transformation Device For Electrical Signal Connection |
| CN101583880A (en) * | 2007-03-20 | 2009-11-18 | 日本麦可罗尼克斯股份有限公司 | Electrical connection device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110702954A (en) * | 2019-11-05 | 2020-01-17 | 汉斯自动化科技(江苏)有限公司 | Direct insertion type power semiconductor module test fixture |
| CN110702954B (en) * | 2019-11-05 | 2022-09-02 | 汉斯自动化科技(江苏)有限公司 | Direct insertion type power semiconductor module test fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103529252B (en) | 2016-09-28 |
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