CN103513065A - Testing jig - Google Patents
Testing jig Download PDFInfo
- Publication number
- CN103513065A CN103513065A CN201210220983.0A CN201210220983A CN103513065A CN 103513065 A CN103513065 A CN 103513065A CN 201210220983 A CN201210220983 A CN 201210220983A CN 103513065 A CN103513065 A CN 103513065A
- Authority
- CN
- China
- Prior art keywords
- contact pin
- measurement jig
- reference point
- wires
- point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
A testing jig comprises a body, two contact pins and two wires. Two containing holes are formed in a first surface of the body. The first end of each contact pin is contained inside one containing hole. The first end of each wire is electrically connected with the first end of one contact pin, the other ends of the two wires are used for being welded with a testing point of a device to be tested and a reference point of the device to be test respectively, and the second end of each contact pin is used for leading out signals of the testing point of the device to be tested and signals of the reference point of the device to be tested. A positive electrode probe of the testing jig and the positive electrode of a voltmeter are connected with the testing point through one wire and one contact pin, and therefore the testing accuracy is effectively improved.
Description
Technical field
The present invention relates to a kind of measurement jig, particularly a kind of measurement jig for test memory bar electrical specification.
Background technology
When now the electrical specification of memory chip is tested, need tester holding oscillographic anodal probe to be connected with a test point, also need holding oscillographic negative pole probe to be connected with a reference point.Meanwhile, also need the positive pole of a voltage table and negative pole to be connected to respectively this test point and reference point, to obtain the voltage of this test point and reference point.Yet if this test point and reference point is distant, user needs both hands holding respectively a probe, when needs adjusting instrument, user cannot vacate hand and debug, and then makes troubles to test.In addition, because a test point needs to be connected with the positive pole of this positive pole probe and this voltage table simultaneously, a reference point needs to be connected with the negative pole of this negative pole probe and this voltage table simultaneously, and the contact area of general test point or reference point is less, thereby likely when test, because cannot fully contacting, cause test result inaccurate.
Summary of the invention
In view of above content, be necessary to provide a kind of measurement jig of convenient test.
A kind of measurement jig comprises:
One body, the first surface of this body is provided with two accepting holes;
Two contact pins, the first end of each contact pin is contained in an accepting hole;
Two wires, the first end of each root wire is electrical connected with the first end of a contact pin respectively, the other end of two wires is respectively used to test point and the reference point welding with device to be measured, and the second end of each contact pin is for deriving the signal of the test point of device to be measured and reference point.
Above-mentioned measurement jig is by being connected two probes of probe respectively with this two contact pin, two terminals of voltage table are connected with this two contact pin simultaneously, have avoided connecting the terminals of probe and voltage table simultaneously and causing the inaccurate deficiency of test result on compared with little test point in this contact area.
Accompanying drawing explanation
Fig. 1 is the structural drawing of the better embodiment of measurement jig of the present invention.
Fig. 2 is the use constitutional diagram of measurement jig of the present invention.
Main element symbol description
| |
10 |
| |
100 |
| |
102 |
| |
103 |
| Accepting |
104 |
| |
105 |
| |
107 |
| |
106 |
| |
20 |
| |
108 |
| |
109 |
Following embodiment further illustrates the present invention in connection with above-mentioned accompanying drawing.
Embodiment
Please refer to Fig. 1, measurement jig 10 of the present invention is for the electrical specification of a memory bar is tested, and the better embodiment of described measurement jig 10 comprises a body 100, a junction 108, a pair of card base 102 and some wires 103.
This junction 108 comprises two contact pins 105.The shape of each contact pin 105 is Z-shaped, and forms kink 109 in the central authorities of contact pin, and the first end of each contact pin 105 is provided with screw thread 107, the second ends for being connected with probe.
This body 100 is made by insulating material.The upper surface of this body 100 offers two circular accepting holes 104, is provided with the metalwork 106 of hollow in each accepting hole 104, and the inwall of this metalwork 106 is provided with screw thread.During installation, the screw thread of this contact pin 105 matches contact pin 105 is arranged on this body 100 with the screw thread 107 of this metalwork 106.Rotate this two contact pin 105, the relative distance between adjustable two contact pins 105, and then make this measurement jig 10 can external dissimilar probe.
The lower surface of this body 100 is provided with two wires 103.These two wire 103 one end respectively with two accepting holes 104 in metalwork 106 be electrically connected.The other end of these two wires 103 is that free end can be connected with a test point and a reference point on memory bar to be measured respectively.
This is arranged at the lower surface of this body 100 to card base 102.
Please refer to Fig. 2, during test, this body 100 is placed in to this memory bar 20 top, and make the plate body of these two card bases, 102 these memory bars 20 of clamping, thereby this measurement jig 10 is fixed with memory bar 20 to be measured.The free end of these two wires 103 is welded with this test point and this reference point respectively, rotate this two contact pin 105, regulate the relative distance between two contact pins 105, two probes contact with the second end of this two contact pin 105 respectively, and two terminals of a voltage table are contacted with the kink 109 of this contact pin 105 respectively, can test the electrical specification of this memory bar 20.
According to different testing requirements, when as wider in the grip part when probe, can by regulate two contact pins 105 between relative distance, then be connected with this two contact pin 105 respectively, so make this measurement jig 10 can external dissimilar probe.
Above-mentioned measurement jig is by contacting two probes of probe respectively with this two contact pin 105, two terminals of voltage table are connected with this two contact pin 105 simultaneously, and then avoid connecting the terminals of this probe and this voltage table simultaneously and causing the inaccurate deficiency of test result on compared with little test point in this contact area.In addition, by this, card base 102 is fixed on this measurement jig 10 on this memory bar 20, and without manually controlling testing tool, and then improved the convenience of test., by being arranged at the screw thread 109 of first end and the screw thread of metalwork 106 in this accepting hole 104 of this contact pin 105, match meanwhile, by regulating the relative distance between two contact pins 105, make this measurement jig 10 can external dissimilar probe.
Claims (4)
1. a measurement jig comprises:
One body, the first surface of this body is provided with two accepting holes;
Two contact pins, the first end of each contact pin is contained in an accepting hole;
Two wires, the first end of each root wire is electrical connected with the first end of a contact pin respectively, the other end of two wires is respectively used to test point and the reference point welding with device to be measured, and the second end of each contact pin is for deriving the signal of the test point of device to be measured and reference point.
2. measurement jig as claimed in claim 1, it is characterized in that: the metalwork that is provided with a hollow in each accepting hole of this body, the inwall of this metalwork is provided with screw thread, and the first end of each contact pin is provided with the external thread that the screw thread on the inwall with this metalwork matches.
3. measurement jig as claimed in claim 1, is characterized in that: the second surface of this body is provided with a pair of card base, and this is used for this measurement jig to be fixed on this device to be measured to card base.
4. the measurement jig as described in claim 1 or 2 or 3, is characterized in that: each contact pin is Z-shaped, and the central authorities of each contact pin form a kink, to connect the terminals of this voltage table.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210220983.0A CN103513065A (en) | 2012-06-29 | 2012-06-29 | Testing jig |
| TW101125594A TW201400830A (en) | 2012-06-29 | 2012-07-16 | Test apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210220983.0A CN103513065A (en) | 2012-06-29 | 2012-06-29 | Testing jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103513065A true CN103513065A (en) | 2014-01-15 |
Family
ID=49896111
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210220983.0A Pending CN103513065A (en) | 2012-06-29 | 2012-06-29 | Testing jig |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN103513065A (en) |
| TW (1) | TW201400830A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109545270A (en) * | 2018-11-28 | 2019-03-29 | 郑州云海信息技术有限公司 | A kind of memory test jig, application method and winding displacement jump cap |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2336356Y (en) * | 1998-05-09 | 1999-09-01 | 中国科学院长春应用化学研究所 | Reference electrode of fuel battery |
| DE102005002876A1 (en) * | 2005-01-21 | 2006-08-17 | Groupinox Gmbh | Shut-off device has insert groove and support element extending into insert groove and intervening to retain inlaid sealing element and passage housing is present whose walls delimit passage channel |
| CN200997451Y (en) * | 2006-12-11 | 2007-12-26 | 长沙威胜电子有限公司 | Wiring terminal |
| CN201037860Y (en) * | 2007-04-23 | 2008-03-19 | 比亚迪股份有限公司 | Battery testing device |
| CN101661079A (en) * | 2009-09-07 | 2010-03-03 | 苏州瀚瑞微电子有限公司 | Testing method and special fixture of circuit board |
| CN202230177U (en) * | 2011-09-23 | 2012-05-23 | 深圳市创益科技发展有限公司 | Testing device for dark resistance of solar cell |
-
2012
- 2012-06-29 CN CN201210220983.0A patent/CN103513065A/en active Pending
- 2012-07-16 TW TW101125594A patent/TW201400830A/en unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2336356Y (en) * | 1998-05-09 | 1999-09-01 | 中国科学院长春应用化学研究所 | Reference electrode of fuel battery |
| DE102005002876A1 (en) * | 2005-01-21 | 2006-08-17 | Groupinox Gmbh | Shut-off device has insert groove and support element extending into insert groove and intervening to retain inlaid sealing element and passage housing is present whose walls delimit passage channel |
| CN200997451Y (en) * | 2006-12-11 | 2007-12-26 | 长沙威胜电子有限公司 | Wiring terminal |
| CN201037860Y (en) * | 2007-04-23 | 2008-03-19 | 比亚迪股份有限公司 | Battery testing device |
| CN101661079A (en) * | 2009-09-07 | 2010-03-03 | 苏州瀚瑞微电子有限公司 | Testing method and special fixture of circuit board |
| CN202230177U (en) * | 2011-09-23 | 2012-05-23 | 深圳市创益科技发展有限公司 | Testing device for dark resistance of solar cell |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109545270A (en) * | 2018-11-28 | 2019-03-29 | 郑州云海信息技术有限公司 | A kind of memory test jig, application method and winding displacement jump cap |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201400830A (en) | 2014-01-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20140115 |