CN103487960B - Grating substrate method for detecting short circuit - Google Patents
Grating substrate method for detecting short circuit Download PDFInfo
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- CN103487960B CN103487960B CN201310495913.0A CN201310495913A CN103487960B CN 103487960 B CN103487960 B CN 103487960B CN 201310495913 A CN201310495913 A CN 201310495913A CN 103487960 B CN103487960 B CN 103487960B
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- electrode
- short circuit
- longitudinal rail
- bar
- grating substrate
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/292—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection by controlled diffraction or phased-array beam steering
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/30—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 grating
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The present invention relates to display technique field, disclose a kind of grating substrate method for detecting short circuit, comprise step: to every bar first electrode application voltage on grating substrate, every bar second electrode is not powered up, adopt probe along the rectilinear movement at the second electrode place, detect the voltage of described second electrode; Judge whether the voltage max on every bar second electrode is greater than predetermined threshold, if be greater than, then determine and the first electric pole short circuit.The present invention is by electricity probe in detecting to which two the first electrodes and the second electric pole short circuit, and the grating substrate achieved electrode incline is arranged carries out short-circuit detecting and locates, and feeding back the particular location of poor short circuit in time, thus improves product line yield and benefit.
Description
Technical field
The present invention relates to display technique field, particularly a kind of grating substrate method for detecting short circuit.
Background technology
Be applied at present in the Grating Design of bore hole 3D, grating fringe is obliquely installed relative to a row or column pixel of display panel, as the 80.54 ° of angles that tilt.A kind of liquid crystal grating as shown in Figure 1, comprises the first grating substrate 1, second grating substrate 2 and liquid crystal between the two 3.First grating substrate 1 is formed with some the first electrode 4 and the second electrodes 5 be arranged alternately, and the first electrode 4 and the second electrode 5 are strip, alignment plane figure as shown in Figure 2, first electrode 4 and the distribution situation of the second electrode 5 on the first grating substrate 1, both be obliquely installed, angle of inclination is α.The first all electrodes 4 links together (signal wire corresponding with the first electrode 4 by via hole 7 connects), and the second all electrodes 5 links together (signal wire corresponding with the second electrode 5 by via hole 8 connects).Second grating substrate 3 is formed with the 3rd electrode 6(plate electrode).Above-mentioned first electrode 4, second electrode 5 and the 3rd electrode 6 all adopt ITO(IndiumTinOxide usually) material making.During work (for normal white mode), the first identical voltage is applied to the first electrode 4 and the 3rd electrode 6, second voltage different from the first voltage is applied to the second electrode 5, makes the liquid crystal 3 of the second electrode 5 corresponding region deflect into this region light tight, thus form the striped that is in the light.In like manner, the first identical voltage is applied to the second electrode 5 and the 3rd electrode 6, second voltage different from the first voltage is applied to the first electrode 4, make the liquid crystal 3 of the first electrode 4 corresponding region deflect into this region light tight, thus form the striped that is in the light.
On the first grating substrate 1, second electrode 5 level interval adjacent with it due to a certain bar first electrode 4 is very little relative to the width of the first electrode 4 or the second electrode 5, be easy to be short-circuited in manufacturing process, if detect short-circuit conditions not in time, product can be caused bad, produce line yield and efficiency low.Drive the guide rail of probe movement to comprise the cross slide way parallel with grid line and the longitudinal rail parallel with data line in existing array substrate detection equipment, cross slide way and longitudinal rail are mutually vertical.Can be arranged on longitudinal rail by probe, longitudinal rail transversely guide rail moves to locate a data line, and probe moves on long rails, to detect the voltage on every bar data line; In like manner, can be arranged on cross slide way by probe, cross slide way longitudinally guide rail moves to locate a grid line, and probe moves on cross track, to detect the voltage on every bar grid line.Because in grating substrate, the first electrode 4 and the second electrode 5 are obliquely installed, cross slide way and longitudinal rail all cannot make probe along the first electrode 4 and the second electrode 5 inclination movement, therefore cannot detect both short-circuit conditions.
Summary of the invention
(1) technical matters that will solve
The technical problem to be solved in the present invention is: how to carry out short-circuit detecting to the grating substrate that electrode incline is arranged.
(2) technical scheme
For solving the problems of the technologies described above, the invention provides a kind of grating substrate method for detecting short circuit, comprising step:
To every bar first electrode application voltage on grating substrate, every bar second electrode is not powered up, adopt probe along the rectilinear movement at the second electrode place, detect the voltage of described second electrode;
Judge whether the voltage max on every bar second electrode is greater than predetermined threshold, if be greater than, then determine and the first electric pole short circuit.
Wherein, for every bar second electrode, probe is adopted to comprise along the concrete mode of the rectilinear movement at the second electrode place:
The longitudinal rail of array substrate detection equipment is set, makes the straight line at the straight line at described longitudinal rail place and the second electrode place in same direction;
Drive longitudinal rail mobile to locate each second electrode on cross slide way, drive probe to move on described longitudinal rail, to detect the voltage of every bar second electrode.
Wherein, for every bar second electrode, probe is adopted to comprise along the concrete mode of the rectilinear movement at the second electrode place:
Drive the longitudinal rail of array substrate detection equipment to move on cross slide way, drive probe to move on longitudinal rail simultaneously, make the track of probe be the straight line at described second electrode place.
Wherein, described predetermined threshold is 30% ~ 50% of the first electrode application voltage.
Wherein, after determining the second electrode with the first electric pole short circuit, also comprise: optical lens is moved along the gap between first electrode and the second electrode of short circuit, the image in the gap gathered between the first electrode of short circuit and the second electrode and the standard picture preset are contrasted, if different from the image of respective regions in described standard picture at the image of certain area in the image in the gap collected, then short circuit, thus determine that location of short circuit is described certain area position.
Wherein, optical lens is made to comprise along the concrete mode of the gap movement between first electrode and the second electrode of short circuit:
The longitudinal rail of array substrate detection equipment is set, makes the straight line at the straight line at described longitudinal rail place and the second electrode place in same direction;
Drive longitudinal rail mobile with the gap between the first electrode of localize short circuits and the second electrode on cross slide way, drive optical lens to move on described longitudinal rail.
Wherein, optical lens is made to comprise along the concrete mode of the gap movement between first electrode and the second electrode of short circuit:
Drive the longitudinal rail of array substrate detection equipment to move on cross slide way, drive optical lens to move on longitudinal rail simultaneously, described optical lens is moved along the gap between first electrode and the second electrode of short circuit.
(3) beneficial effect
The present invention is moved by second electrode incline of electricity probe along grating substrate, which two the first electrodes and the second electric pole short circuit detected, the grating substrate achieved electrode incline is arranged carries out short-circuit detecting to navigate to the second electrode of short circuit, and feed back the position of poor short circuit in time, thus improve product line yield and benefit.
Accompanying drawing explanation
Fig. 1 is the schematic cross-section of liquid crystal grating of the present invention;
Fig. 2 is the floor map of liquid crystal grating of the present invention;
Fig. 3 is grating substrate method for detecting short circuit process flow diagram of the present invention;
Fig. 4 be liquid crystal grating of the present invention grating substrate on the schematic diagram of the first electrode and the non-short circuit of the second electrode;
Fig. 5 be liquid crystal grating of the present invention grating substrate on the schematic diagram of the first electrode and the second electric pole short circuit.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples for illustration of the present invention, but are not used for limiting the scope of the invention.
As shown in Figure 3, the grating substrate method for detecting short circuit that the present embodiment provides comprises:
Step S310, to every bar first electrode application voltage on grating substrate, does not power up for every bar second electrode, adopts probe along the rectilinear movement at the second electrode place, detects the voltage of described second electrode;
As shown in Figure 2, applying voltage to every bar first electrode 4 on grating substrate, can be that the first electrode 4 applies voltage by the lead-in wire of Fig. 2 medial end portions.While powering up the first electrode 4, for every bar second electrode 5, probe is adopted to detect the voltage of the second electrode 5 along the rectilinear movement at the second electrode 5 place.Due to transparency electrode ITO resistance, maximum at the voltage of short circuit place, away from short circuit place more, voltage is less, from short circuit the second electrode 5 more away from the voltage of the second electrode 5 of non-short circuit less.Detect the voltage of every bar second electrode 5 by root, the maximum voltage value of every bar second electrode 5 can be recorded.
In the present embodiment, for every bar second electrode 5, adopt probe following two kinds of any one modes can be adopted to realize along the concrete mode of the rectilinear movement at the second electrode 5 place:
Mode one:
The longitudinal rail of array substrate detection equipment is set, namely improves the longitudinal rail of array substrate detection equipment, make the straight line at the straight line at longitudinal rail place and the second electrode 5 place in same direction.Drive longitudinal rail mobile to locate each second electrode 5 on cross slide way, drive probe to move on longitudinal rail, to detect the voltage of every bar second electrode 5.
Mode two:
The driver of cross slide way and longitudinal rail can be improved, cross slide way and longitudinal rail can be moved simultaneously, longitudinal rail is driven to move on cross slide way, drive probe to move on longitudinal rail simultaneously, the track of probe is made to be the straight line at the second electrode 5 place, to detect the voltage of every bar second electrode 5.
Step S320, judges whether the voltage max on every bar second electrode is greater than predetermined threshold, if be greater than, then determines and the first electric pole short circuit.The voltage detected can represent by the form of numerical value, also can adopt the checkout equipment of array base palte that voltage signal is converted to visual pattern at display end, as: bright line (and on detection arrays substrate between grid line or data line the situation of short circuit identical).The scope of this predetermined threshold can set according to actual conditions, and because the graphics shape of short circuit place is different, resistance is just different, resistance is larger, and the voltage of short circuit place of the second electrode 5 of short circuit is less, otherwise, resistance is less, and the voltage of short circuit place of the second electrode 5 of short circuit is larger.In order to make the situation of short circuit can detect as far as possible, ensure again the accuracy detected, predetermined threshold is 30% ~ 50% of the first electrode application voltage.
The method of the present embodiment is moved by second electrode incline of electricity probe along grating substrate, which two the first electrodes and the second electric pole short circuit detected, the grating substrate achieved electrode incline is arranged carries out short-circuit detecting to navigate to the second electrode of short circuit, and feed back the position of poor short circuit in time, thus improve product line yield and benefit.
In order to realize locating more accurately location of short circuit, determine with the second electrode 5 of the first electrode 4 short circuit after, also comprise: optical lens is moved along the gap between first electrode 4 and the second electrode 5 of short circuit, the image in the gap gathered between the first electrode 4 of short circuit and the second electrode 5 and the standard picture preset are contrasted, as the standard picture contrast in Fig. 4, if the image in the gap collected is different from the image of respective regions in described standard picture at the image of certain area, and in certain area, be filled with the electrode material of the first electrode 4 or the second electrode 5, make both be communicated with, then short circuit, short circuit image as shown in Figure 5, thus determine location of short circuit.Empty wire frame representation location of short circuit in Fig. 5, namely during non-short circuit, whole piece gap there will not be the tie point of the first electrode 4 and the second electrode 5.The coordinate position collecting short circuit place is returned to the checkout equipment of array base palte by optical lens, thus obtains the accurate location of short circuit.
Make optical lens following two kinds of any one modes can be adopted to realize along the mode of the gap movement between first electrode 4 and the second electrode 5 of short circuit:
Mode one:
The longitudinal rail of array substrate detection equipment is set, namely improves the longitudinal rail of array substrate detection equipment, make the straight line at the straight line at longitudinal rail place and the second electrode 5 place in same direction.Drive longitudinal rail mobile with the gap between the first electrode 4 of localize short circuits and the second electrode 5 on cross slide way, drive probe to move on longitudinal rail, to gather the image in gap.
Mode two:
The driver of cross slide way and longitudinal rail can be improved, cross slide way and longitudinal rail can be moved simultaneously, longitudinal rail is driven to move on cross slide way, drive optical lens to move on longitudinal rail simultaneously, described optical lens is moved along the gap between first electrode 4 and the second electrode 5 of short circuit, to gather the image in gap.
In the present embodiment, also utilize optical lens to carry out image acquisition to the gap between the first electrode 4 of short circuit and the second electrode 5, and with the image ratio of standard comparatively, thus accurately located the particular location of the first electrode 4 and the second electrode 5 short circuit.
Above embodiment is only for illustration of the present invention; and be not limitation of the present invention; the those of ordinary skill of relevant technical field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all equivalent technical schemes also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.
Claims (7)
1. a grating substrate method for detecting short circuit, is characterized in that, comprises step:
To every bar first electrode application voltage on grating substrate, every bar second electrode is not powered up, adopt probe along the rectilinear movement at the second electrode place, detect the voltage of described second electrode;
Judge whether the voltage max on every bar second electrode is greater than predetermined threshold, if be greater than, then determine and the first electric pole short circuit;
Utilize optical lens to carry out image acquisition to the gap between the first electrode of short circuit and the second electrode, and with the image ratio of standard comparatively, thus the particular location of accurately location the first electrode and the second electric pole short circuit.
2. grating substrate method for detecting short circuit as claimed in claim 1, is characterized in that, for every bar second electrode, adopts probe to comprise along the concrete mode of the rectilinear movement at the second electrode place:
The longitudinal rail of array substrate detection equipment is set, makes the straight line at the straight line at described longitudinal rail place and the second electrode place in same direction;
Drive longitudinal rail mobile to locate each second electrode on cross slide way, drive probe to move on described longitudinal rail, to detect the voltage of every bar second electrode.
3. grating substrate method for detecting short circuit as claimed in claim 1, is characterized in that, for every bar second electrode, adopts probe to comprise along the concrete mode of the rectilinear movement at the second electrode place:
Drive the longitudinal rail of array substrate detection equipment to move on cross slide way, drive probe to move on longitudinal rail simultaneously, make the track of probe be the straight line at described second electrode place.
4. grating substrate method for detecting short circuit as claimed in claim 1, it is characterized in that, described predetermined threshold is 30% ~ 50% of the first electrode application voltage.
5. the grating substrate method for detecting short circuit according to any one of Claims 1 to 4, it is characterized in that, after determining the second electrode with the first electric pole short circuit, also comprise: optical lens is moved along the gap between first electrode and the second electrode of short circuit, the image in the gap gathered between the first electrode of short circuit and the second electrode and the standard picture preset are contrasted, if different from the image of respective regions in described standard picture at the image of certain area in the image in the gap collected, then short circuit, thus determine that location of short circuit is described certain area position.
6. grating substrate method for detecting short circuit as claimed in claim 5, is characterized in that, optical lens is comprised along the concrete mode of the gap movement between first electrode and the second electrode of short circuit:
The longitudinal rail of array substrate detection equipment is set, makes the straight line at the straight line at described longitudinal rail place and the second electrode place in same direction;
Drive longitudinal rail mobile with the gap between the first electrode of localize short circuits and the second electrode on cross slide way, drive optical lens to move on described longitudinal rail.
7. grating substrate method for detecting short circuit as claimed in claim 5, is characterized in that, optical lens is comprised along the concrete mode of the gap movement between first electrode and the second electrode of short circuit:
Drive the longitudinal rail of array substrate detection equipment to move on cross slide way, drive optical lens to move on longitudinal rail simultaneously, described optical lens is moved along the gap between first electrode and the second electrode of short circuit.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310495913.0A CN103487960B (en) | 2013-10-21 | 2013-10-21 | Grating substrate method for detecting short circuit |
| PCT/CN2014/079280 WO2015058528A1 (en) | 2013-10-21 | 2014-06-05 | Short circuit detection method for optical grating substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310495913.0A CN103487960B (en) | 2013-10-21 | 2013-10-21 | Grating substrate method for detecting short circuit |
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| Publication Number | Publication Date |
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| CN103487960A CN103487960A (en) | 2014-01-01 |
| CN103487960B true CN103487960B (en) | 2016-01-06 |
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| CN201310495913.0A Active CN103487960B (en) | 2013-10-21 | 2013-10-21 | Grating substrate method for detecting short circuit |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103487960B (en) * | 2013-10-21 | 2016-01-06 | 京东方科技集团股份有限公司 | Grating substrate method for detecting short circuit |
| CN104122689A (en) * | 2014-07-29 | 2014-10-29 | 深圳市华星光电技术有限公司 | Testing device and testing method of testing device |
| CN104237725B (en) * | 2014-09-04 | 2017-03-29 | 京东方科技集团股份有限公司 | A kind of method of the position of the short dot in determination grating device |
| CN108469694B (en) * | 2018-02-07 | 2020-12-25 | 深圳市华星光电半导体显示技术有限公司 | Method for positioning poor position of horizontal bright line generated by TFT LCD display panel |
| CN113092978A (en) * | 2021-04-06 | 2021-07-09 | 苏州通富超威半导体有限公司 | Testing component and testing method for short circuit failure positioning of electronic component |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1511262A (en) * | 2001-05-24 | 2004-07-07 | Oht��ʽ���� | Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP3150866B2 (en) * | 1995-03-02 | 2001-03-26 | シャープ株式会社 | Signal applying device for display panel inspection |
| JP2001296326A (en) * | 2000-04-18 | 2001-10-26 | Odp:Kk | Method and apparatus for inspection of defect |
| CN103487960B (en) * | 2013-10-21 | 2016-01-06 | 京东方科技集团股份有限公司 | Grating substrate method for detecting short circuit |
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2013
- 2013-10-21 CN CN201310495913.0A patent/CN103487960B/en active Active
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- 2014-06-05 WO PCT/CN2014/079280 patent/WO2015058528A1/en active Application Filing
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1511262A (en) * | 2001-05-24 | 2004-07-07 | Oht��ʽ���� | Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium |
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| Publication number | Publication date |
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| WO2015058528A1 (en) | 2015-04-30 |
| CN103487960A (en) | 2014-01-01 |
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