CN103475407A - Method and system for debugging downlink channel of optical module based on EML (Equal Matrix Language) - Google Patents
Method and system for debugging downlink channel of optical module based on EML (Equal Matrix Language) Download PDFInfo
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Abstract
The invention discloses a method and a system for debugging a downlink channel of an optical module based on EML (Equal Matrix Language). The debugging method comprises: a debugging mainframe debugs the optical eye diagram template margin of the optical module to be debugged to locate the optical eye diagram template margin within a template margin specification, and if the debugging mainframe judges the optical channel cost of the optical module is within a channel cost specification and the bias current of the optical module is smaller than an upper specification limit, the debugging on the downlink channel of the optical module is finished; in at least one debugging process of the optical eye diagram template margin, the debugging mainframe adjusts the luminous power, the extinction ratio and the crossover point of the optical module to respective specification ranges, judges whether the optical eye diagram template margin is within the template margin specification, if so, the debugging mainframe finishes the debugging on the optical eye diagram template margin, and if not, the debugging mainframe debugs the optical eye diagram template margin for the next time after up-regulating the EVA (Virtual Effective Address) of the optical module for a unit amplitude. According to the technical scheme disclosed by the invention, the EVA is adjusted to locate the optical eye diagram template margin within the template margin specification so as to improve the yield of the optical module.
Description
Technical field
The present invention relates to fiber optic communication field, relate in particular to a kind of adjustment method and system of the optical module down channel based on EML.
Background technology
In recent years, along with the fast development of Fibre Optical Communication Technology, Networks of Fiber Communications is more and more universal, and market is also increasing to the demand of optical module in Networks of Fiber Communications, in order to meet the need of market, need to produce a large amount of optical modules.
Because the performance of optical module directly affects the communication performance of Networks of Fiber Communications, therefore, before each optical module dispatches from the factory, producer need to be debugged its performance, so that it meets various specifications.
For adopting EML(Electro-Absorption Modulators Laser, Electroabsorption Modulated Laser) as the optical module of transmitting illuminant, the light signal of launching due to EML (for example is often used for being grown distance, 40 kms, 80 kms etc.) optical communication, and the effects such as dispersion of optical fiber, can make light signal can produce the problem of optical path power penalty by optical fiber after the transmission of long distance, therefore, when the optical module down channel based on EML is debugged, be necessary the optical path power penalty of this optical module is debugged.
At present, the schematic diagram of the hardware system structure that the optical module down channel based on EML is debugged, as shown in Figure 1, can comprise: DCA(Digital Communication Analyzer, the digital communication analyzer) 101, BERT(Bit Error Ratio Tester, error rate tester) 102, standard optical module applicable 103, optical branching device 104, fixedly light decay 105, optical switch 106, short fiber 107, long optical fibers 108, adjustable light decay 109, debug host 110, optical module 111 to be debugged, the first bus signals conversion circuit 112, the second bus signals conversion circuit 113.
Wherein, optical module 111 to be debugged comprises EML and drive circuit thereof, and MCU(Micro Control Unit, micro-control unit); MCU for monitoring, obtain or send the status data of optical module to be debugged 111, or receive instruction and control optical module to be debugged 111 according to the instruction received, or by bus communication etc.
Debug host 110 is by USB(Universal Serial Bus, USB) with the first bus signals conversion circuit 112, be connected, the first bus signals conversion circuit 112 is by IIC(Inter-Integrated Circuit, mutual integrated circuit) bus is connected with the MCU in optical module 111 to be debugged; The first bus signals conversion circuit 112 is for changing mutually usb signal and iic bus signal.Debug host 110 is for communicating by letter with the MCU of optical module 111 to be debugged by signaling conversion circuit 112, and this communication process can comprise: debug host 110 sends instruction or data to MCU, or from the MCU reading out data; Thereby realize the control of 110 pairs of optical modules to be debugged 111 of debug host.Debug host 110 can be PC.
BERT102 is connected with the drive circuit of EML in optical module 111 to be debugged, and BERT102 sends the downlink electrical signal for the drive circuit of from the EML to optical module to be debugged 111.
The drive circuit of EML in optical module 111 to be debugged is connected with EML, is used to EML that bias current is provided, and the downlink electrical signal of reception is exported to EML;
EML in optical module 111 to be debugged exports for after converting the downlink electrical signal of reception to downlink optical signal; The wavelength of downlink optical signal can be 1550nm, and bit rate can be 10Gbps(Gigabits per sencond, kilomegabit per second).
EML in optical module 111 to be debugged communicates with the upstream ends light path of optical branching device 104, and optical branching device 104 for receiving downlink optical signal, and is exported after it is divided into to the first downlink optical signal and the second downlink optical signal.
A downstream end of optical branching device 104 communicates with the input light path of optical switch 106, optical switch 106 at least comprises two light pathes, be connected with respectively short fiber 107 and long optical fibers 108 in these two light pathes, the output of optical switch 106 can be by the ROSA(Receiver Optical Subassembly in adjustable light decay 109 and standard optical module applicable 103, optical fiber receive module) light path communicates;
The first downlink optical signal is received by the ROSA in standard optical module applicable 106 by optical switch 106 and adjustable light decay 109 successively, and the ROSA in standard optical module applicable 103 changes into the first downlink electrical signal for first downlink optical signal that will receive and exports to the limiting amplifier be connected with this ROSA.
Limiting amplifier in standard optical module applicable 103 is connected with BERT102; This limiting amplifier is exported to BERT102 after amplifying for the first downlink electrical signal that will receive, and BERT102, also for the first downlink electrical signal after the amplification according to receiving, records the optical path power penalty of optical module to be debugged 111.
Another downstream end of optical branching device 104 communicates with the DCA101 light path by fixing light decay 105; The second downlink optical signal is received by DCA101 by fixing light decay 105; DCA101 is for the second downlink optical signal according to receiving, the light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint that record optical module to be debugged 111.
Debug host 110 is connected with the second bus signals conversion circuit 113 by USB, and DCA101 and BERT102 are all by GPIB(General-Purpose Interface Bus, general-purpose interface bus) with the second bus signals conversion circuit 113, be connected; The second bus signals conversion circuit 113 is for changing mutually usb signal and GPIB signal.Debug host 110 is also for communicating by letter with BERT102 with DCA101 respectively by the second bus signals conversion circuit 113, and this communication process can comprise: debug host 110 obtains light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint of testing the optical module to be debugged 111 obtained from DCA101; Debug host 110 obtains the optical path power penalty of testing the optical module to be debugged 111 obtained from BERT102.
The adjustment method that optical module to be debugged 111 down channels are carried out, as shown in Figure 2, concrete steps comprise flow process:
S200: the optical module 111 that debug host 110 initialization are to be debugged.
Particularly, debug host 110 communicates with the MCU of optical module 111 to be debugged, by MCU, the relevant parameter in optical module to be debugged 111 is arranged: the bias current I that EML is set
biasinitial value be I
bias0; The EA(Electro-absorption of EML is set, electric absorption) voltage V
eAvalue be V
eA0; APC(Auto Power Control is set, and automated power is controlled) initial value of register value is APC
0, MOD(Modulaion being set, modulation) and the initial value of register value is MOD
0, CP(Crossing point being set, crosspoint) and the initial value of register value is CP
0.
And debug host 110 arranges the bound of the relevant parameter of optical module to be debugged 111 in this locality: bias current I is set
biasupper specification limit be I
biasmax, specification lower limit and upper specification limit that the APC register value is set are respectively APC
minand APC
max, specification lower limit and upper specification limit that the MOD register value is set are respectively MOD
minand MOD
max, specification lower limit and the upper specification limit of CP register value are respectively CP
minand CP
max.
Wherein, APC register value, MOD register value and CP register value are respectively used to adjust luminous power, extinction ratio and the crosspoint of optical module to be debugged 111.
S201: debug host 110 is by the APC register value in the MCU that adjusts successively optical module to be debugged 111, MOD register value and CP register value so that the luminous power of optical module to be debugged 111 in specification (herein referred to as the luminous power specification) scope of luminous power, extinction ratio in specification (herein referred to as the extinction ratio specification) scope of extinction ratio and crosspoint in specification (herein referred to as the crosspoint specification) scope in crosspoint; Debug host 110 judges that luminous power, extinction ratio and crosspoint are whether respectively in specification limit separately, if perform step S202; If not, determine that optical module 111 to be debugged is defective, process ends.
Particularly, debug host 110 use dichotomies are adjusted luminous power that the value of APC register makes optical module to be debugged 111 in the luminous power specification, if debug host 110 is judged the value of APC register, have reached APC
minperhaps APC
max, and the luminous power of the optical module to be debugged 111 that debug host 110 obtains from DCA101 is still in the luminous power specification, debug host 110 determines that optical module 111 to be debugged is defective, process ends; Otherwise,
The value of adjusting the MOD register with dichotomy makes the extinction ratio of optical module to be debugged 111 meet the extinction ratio specification, if debug host 110 is judged the value of MOD register, has reached MOD
minperhaps MOD
max, and the extinction ratio of the optical module to be debugged 111 that debug host 110 obtains from DCA101 is still in the extinction ratio specification, debug host 110 determines that optical module 111 to be debugged is defective, process ends; Otherwise,
The value of adjusting the CP register with dichotomy makes the crosspoint of optical module to be debugged 111 meet the crosspoint specification, if debug host 110 is judged the value of CP register, has reached CP
minperhaps CP
max, and in Reng Bu crosspoint, the crosspoint specification of the optical module to be debugged 111 that debug host 110 obtains from DCA101, debug host 110 determines that optical module 111 to be debugged is defective, process ends; Otherwise,
DCA101 tests luminous power, extinction ratio, the crosspoint of optical module to be debugged 111; Debug host 110 judges that the luminous power, extinction ratio, crosspoint of the optical module to be debugged 111 that DCA101 records are whether respectively in specification limit separately; If perform step S202, otherwise determine that optical module 111 to be debugged is defective, process ends.
Wherein, the luminous power specification of optical module to be debugged, extinction ratio specification and crosspoint specification be those skilled in the art rule of thumb or historical data etc. set in advance and be stored in debug host 110.
S202: debug host 110 judges that the light eye pattern mask allowance of the optical module to be debugged 111 that DCA101 records is whether in the specification (herein referred to as template allowance specification) of light eye pattern mask allowance: if perform step S203; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
Wherein, the template allowance specification of optical module to be debugged be those skilled in the art rule of thumb or historical data etc. set in advance and be stored in debug host 110.
S203: debug host 110 judges that the optical path power penalty of the optical module to be debugged 111 that BERT102 records is whether in the specification (herein referred to as passage cost specification) of optical path power penalty: if perform step S204; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
Wherein, the passage cost specification of optical module to be debugged be those skilled in the art rule of thumb or historical data etc. set in advance and be stored in debug host 110.
S204: the I of the EML the optical module to be debugged 111 that debug host 110 judgements are obtained from MCU
biaswhether be less than I
biasmaxif:, determine that optical module 111 down channels to be debugged are qualified, process ends; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
Adopt existing adjustment method to be debugged the optical module down channel, often occur that optical module is judged as underproof phenomenon, cause the rate of finished products of optical module lower.
Summary of the invention
For the defect of above-mentioned prior art existence, the invention provides a kind of adjustment method and system of the optical module down channel based on EML, can reduce optical module and be judged as underproof phenomenon, thus the rate of finished products of raising optical module.
Technical scheme of the present invention provides a kind of adjustment method of the optical module down channel based on EML from an aspect, comprising:
Debug host is debugged and is made it in template allowance specification the light eye pattern mask allowance of optical module to be debugged, if the optical path power penalty that further judges described optical module is in passage cost specification and the bias current I of the EML in described optical module
biasbe less than its upper specification limit I
biasmax, complete the debugging to described optical module down channel;
Wherein, described smooth eye pattern mask allowance is carried out in debug process at least one times: described debug host is successively adjusted to the luminous power of described optical module, extinction ratio and crosspoint in specification limit separately, judges that afterwards described smooth eye pattern mask allowance is whether in template allowance specification; If finish the debugging to described smooth eye pattern mask allowance; If not, to the MCU in described optical module to be debugged, send EA voltage and raise instruction, described MCU raises instruction by the EA voltage V of the EML in described optical module according to the EA voltage received
eAafter raising unit amplitude, if described debug host is determined described V
eAin the EV voltage specification, described smooth eye pattern mask allowance is debugged next time; Described V
eAinitial value be V
eA0.
Further, after in described debug host, the light eye pattern mask allowance of optical module to be debugged being debugged and making it in template allowance specification, also comprise:
If described debug host is judged the optical path power penalty of described optical module not in passage cost specification, further judge described I
biaswhether be less than described I
biasmax, and judge described V
eAwhether be not more than described V
eA0; If be, be, after described debug host is debugged and made it in passage cost specification the optical path power penalty of described optical module, if judge described I
biasbe less than described I
biasmax, complete the debugging to described optical module down channel;
Wherein, in the debug process at least one times that described debug host is carried out described optical path power penalty: described debug host sends EA voltage to described MCU and lowers instruction, makes described MCU lower instruction by described V according to the EA voltage received
eAlower unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, described smooth eye pattern mask allowance is carried out to debugging at least one times; Afterwards, described debug host judges that described optical path power penalty is whether in passage cost specification; If finish the debugging to described optical path power penalty; If not, further judging described I
biasbe less than described I
biasmaxand described V
eAbe not more than described V
eA0after, described debug host is debugged described optical path power penalty next time.
Further, the optical path power penalty of judging described optical module in described debug host in passage cost specification after, also comprise:
If described debug host is judged described I
biasbe not less than described I
biasmax, described debug host is to described I
biascarry out debugging at least one times, to described I
biasa debug process in:
Described debug host sends EA voltage to the MCU in described optical module and raises instruction, makes described MCU raise instruction by described V according to the EA voltage received
eAraise unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, after further adjusting in specification limit separately by the luminous power of described optical module, extinction ratio, crosspoint, light eye pattern mask allowance and optical path power penalty successively, further judge described I
biaswhether be less than described I
biasmax; If finish described I
biasdebugging; If not, to described I
biasdebug next time.
Preferably, in described debug host to described I
biasin the debug process at least one times of carrying out, or also comprise in the debug process at least one times that described smooth eye pattern mask allowance is carried out:
If described debug host is at APC
minto APC
maxadjust the APC register value of described optical module in scope, and the luminous power that can not make described optical module is in the luminous power specification, or
At MOD
minto MOD
maxadjust the MOD register value of described optical module in scope, and the extinction ratio that can not make described optical module is in the extinction ratio specification, or
At CP
minto CP
maxadjust the CP register value of described optical module in scope, and the crosspoint that can not make described optical module is in the specification of crosspoint; Judge that described optical module is defective;
Wherein, described APC
minwith described APC
maxbe respectively specification lower limit and the upper specification limit of predefined APC register value; Described MOD
minwith described MOD
maxbe respectively specification lower limit and the upper specification limit of predefined MOD register value; Described CP
minwith described CP
maxbe respectively specification lower limit and the upper specification limit of predefined CP register value.
Further, raise instruction by the EA voltage V of the EML in described optical module at described MCU according to the EA voltage received
eAafter raising unit amplitude, or lower instruction by described V at described MCU according to the EA voltage received
eAafter lowering unit amplitude, also comprise:
If described debug host is determined described V
eAnot in described EV voltage specification, determine that described optical module is defective.
Further, if described debug host judges that the optical path power penalty of described optical module, not in passage cost specification, also comprises:
If described debug host is further judged described I
biasbe not less than described I
biasmax, or described V
eAbe greater than described V
eA0, determine that described optical module is defective.
Further, judge described I in described debug host
biasbe not less than described I
biasmaxafterwards, also comprise:
If described debug host is judged described smooth eye pattern mask allowance not in template allowance specification, or described optical path power penalty determines that described optical module is defective not in passage cost specification.
Technical scheme of the present invention also provides a kind of debug system of the optical module down channel based on EML according to another aspect, it is characterized in that, comprising: debug host, the first bus signals conversion circuit, optical module, the second bus signals conversion circuit, digital communication analyzer DCA, error rate tester BERT, optical branching device, optical switch and standard optical module applicable to be debugged;
Wherein, described debug host is connected with described the first bus signals conversion circuit by general-purpose serial bus USB, MCU in described optical module to be debugged is connected with described the first bus signals conversion circuit by mutual integrated circuit iic bus, and described the first bus signals conversion circuit is for changing usb signal and iic bus signal mutually;
Described debug host is connected with described the second bus signals conversion circuit by USB, described DCA all is connected with described the second bus signals conversion circuit by general-purpose interface bus GPIB with described BERT, and described the second bus signals conversion circuit is for changing usb signal and GPIB signal mutually;
Described BERT sends the downlink electrical signal for the drive circuit of from the EML to described optical module to be debugged;
The drive circuit of EML in described optical module to be debugged is connected with described EML, is used to described EML that bias current is provided, and the downlink electrical signal of reception is exported to described EML;
EML in described optical module to be debugged exports for after converting described downlink electrical signal to downlink optical signal;
Described optical branching device is used for receiving described downlink optical signal, and exports after it is divided into to the first downlink optical signal and the second downlink optical signal;
Described the first downlink optical signal is received by the ROSA in described standard optical module applicable by described optical switch, ROSA in described standard optical module applicable changes into the first downlink electrical signal for first downlink optical signal that will receive and exports to the limiting amplifier be connected with described ROSA, described limiting amplifier is exported to described BERT after amplifying for the first downlink electrical signal that will receive, described BERT is also for the first downlink electrical signal after the amplification according to receiving, and records the optical path power penalty of described optical module to be debugged;
Described the second downlink optical signal is received by described DCA, and described DCA is for the second downlink optical signal according to receiving, and records light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint of described optical module to be debugged;
Described debug host, debug and make it in template allowance specification for the light eye pattern mask allowance of the optical module described to be debugged to obtaining from described DCA, if the bias current I of the EML the optical module described to be debugged that the optical path power penalty of the optical module described to be debugged that further judgement is obtained from described BERT obtains in passage cost specification and from described MCU
biasbe less than its upper specification limit I
biasmax, complete the debugging to described optical module down channel to be debugged; Wherein, in the debug process at least one times that described smooth eye pattern mask allowance is carried out: described debug host is adjusted to luminous power, extinction ratio and the crosspoint of described optical module to be debugged in specification limit separately successively, judges that afterwards described smooth eye pattern mask allowance is whether in template allowance specification; If finish the debugging to described smooth eye pattern mask allowance; If not, to the MCU in described optical module to be debugged, send EA voltage and raise instruction, described MCU raises instruction by the EA voltage V of the EML in described optical module to be debugged according to the EA voltage received
eAafter raising unit amplitude, if described debug host is determined described V
eAin the EV voltage specification, described smooth eye pattern mask allowance is debugged next time; Described V
eAinitial value be V
eA0.
Further, if described debug host also for the optical path power penalty of judging described optical module not in passage cost specification, the further described I of judgement
biaswhether be less than described I
biasmax, and judge described V
eAwhether be not more than described V
eA0; If be, be, after described debug host is debugged and made it in passage cost specification the optical path power penalty of described optical module, if judge described I
biasbe less than described I
biasmax, complete the debugging to described optical module down channel; Wherein, in the debug process at least one times that described debug host is carried out described optical path power penalty: described debug host sends EA voltage to described MCU and lowers instruction, makes described MCU lower instruction by described V according to the EA voltage received
eAlower unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, described smooth eye pattern mask allowance is carried out to debugging at least one times; Afterwards, described debug host judges that described optical path power penalty is whether in passage cost specification; If finish the debugging to described optical path power penalty; If not, further judging described I
biasbe less than described I
biasmaxand described V
eAbe not more than described V
eA0after, described debug host is debugged described optical path power penalty next time.
Further, if described debug host also for judging described I
biasbe not less than described I
biasmax, described debug host is to described I
biascarry out debugging at least one times, to described I
biasa debug process in:
Described debug host sends EA voltage to the MCU in described optical module and raises instruction, makes described MCU raise instruction by described V according to the EA voltage received
eAraise unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, after further adjusting in specification limit separately by the luminous power of described optical module, extinction ratio, crosspoint, light eye pattern mask allowance and optical path power penalty successively, further judge described I
biaswhether be less than described I
biasmax; If finish described I
biasdebugging; If not, to described I
biasdebug next time.
Technical scheme of the present invention, in the process of the optical module down channel of debugging based on EML, for the light eye pattern mask allowance optical module in template allowance specification not, by adjusting the EA voltage V of EML
eAcan be so that the light eye pattern mask allowance of this optical module, in template allowance specification, can reduce this optical module and be judged as underproof phenomenon, thus the rate of finished products of the optical module based on EML improved.
Further, technical scheme of the present invention, in the process of the optical module down channel of debugging based on EML, for light eye pattern mask allowance in template allowance specification but the optical path power penalty optical module in passage cost specification not, can be by adjusting the V of the EML in this optical module
eAcan so that the light eye pattern mask allowance of this optical module in template allowance specification, the optical path power penalty of this optical module is in passage cost specification; Perhaps for light eye pattern mask allowance in template allowance specification and optical path power penalty in passage cost specification, but the bias current I of EML
biasbe not less than I
biasmaxoptical module, can be by adjusting the V of the EML in this optical module
eAcan so that the light eye pattern mask allowance of this optical module in template allowance specification, the optical path power penalty of this optical module is in passage cost specification, and the I of the EML in this optical module
biasbe less than I
biasmaxthereby, the further rate of finished products that improves the optical module based on EML.
The accompanying drawing explanation
The schematic diagram that Fig. 1 is hardware system structure that the optical module down channel based on EML is debugged;
The flow chart that the optical module down channel to be debugged that Fig. 2 is the prior art scheme is debugged;
The flow chart that the optical module down channel to be debugged that Fig. 3 is the embodiment of the present invention is debugged.
Embodiment
For making purpose of the present invention, technical scheme and advantage clearer, referring to accompanying drawing and enumerate preferred embodiment, the present invention is described in more detail.Yet, it should be noted that, many details of listing in specification are only in order to make the reader, to one or more aspects of the present invention, a thorough understanding be arranged, even if do not have these specific details also can realize these aspects of the present invention.
The terms such as " module " used in this application, " system " are intended to comprise the entity relevant to computer, such as but not limited to hardware, firmware, combination thereof, software or executory software.For example, module can be, but be not limited in: the thread of the process of moving on processor, processor, object, executable program, execution, program and/or computer.For instance, the application program of moving on computing equipment and this computing equipment can be modules.One or more modules can be positioned at an executory process and/or thread, and module also can and/or be distributed on a computer between two or more computers.
The present inventor analyzes the existing process that the optical module down channel is debugged, find in whole debug process, the value of the EA voltage of the EML in optical module to be debugged is fixed value, for example, and the reference value that the value of EA voltage provides for an empirical value or EML supplier.But, when the consistency of EML is not good or with the actual value of the EA voltage of EML coupling and reference value deviation that EML supplier provides when larger, tend to cause optical module to be judged as in existing debug process defective, thereby cause the optical module rate of finished products lower.
The present inventor considers, if there is a kind of method can adjust the value of the EA voltage of EML in optical module, likely improves the rate of finished products of optical module.The present inventor further contemplates, adjust the value of the EA voltage of optical module, can have influence on light eye pattern mask allowance, optical path power penalty, luminous power, extinction ratio and the crosspoint of this optical module simultaneously, be necessary these parameters of this optical module are tested or debugged.
Introduce in detail technical scheme of the present invention below in conjunction with accompanying drawing.
The hardware system structure that the optical module down channel is debugged of the embodiment of the present invention, identical with the system architecture shown in earlier figures 1, specifically comprise: DCA(Digital Communication Analyzer, the digital communication analyzer) 101, BERT(Bit Error Ratio Tester, error rate tester) 102, standard optical module applicable 103, optical branching device 104, optical switch 106, short fiber 107, long optical fibers 108, debug host 110, optical module 111, the first bus signals conversion circuit 112, the second bus signals conversion circuit 113 to be debugged; Further also can comprise: fixedly light decay 105, adjustable light decay 109.
Wherein, optical module 111 to be debugged comprises EML(Electro-Absorption Modulators Laser, Electroabsorption Modulated Laser) and drive circuit, and MCU(Micro Control Unit, micro-control unit); MCU for monitoring, obtain or send the status data of optical module to be debugged 111, or receive instruction and control optical module to be debugged 111 according to the instruction received, or by bus communication etc.
Debug host 110 is by USB(Universal Serial Bus, USB) with the first bus signals conversion circuit 112, be connected, the first bus signals conversion circuit 112 is by IIC(Inter-Integrated Circuit, mutual integrated circuit) bus is connected with the MCU in optical module 111 to be debugged; The first bus signals conversion circuit 112 is for changing mutually usb signal and iic bus signal.Debug host 110 is for communicating by letter with the MCU of optical module 111 to be debugged by signaling conversion circuit 112, and this communication process can comprise: debug host 110 sends instruction or data to MCU, or from the MCU reading out data; Thereby realize the control of 110 pairs of optical modules to be debugged 111 of debug host.Debug host 110 can be PC.
BERT102 is connected with the drive circuit of EML in optical module 111 to be debugged, and BERT102 sends the downlink electrical signal for the drive circuit of from the EML to optical module to be debugged 111.
The drive circuit of EML in optical module 111 to be debugged is connected with EML, is used to EML that bias current is provided, and the downlink electrical signal of reception is exported to EML;
EML in optical module 111 to be debugged exports for after converting the downlink electrical signal of reception to downlink optical signal; The wavelength of downlink optical signal can be 1550nm, and bit rate can be 10Gbps(Gigabits per sencond, kilomegabit per second).
EML in optical module 111 to be debugged communicates with the upstream ends light path of optical branching device 104, and optical branching device 104 for receiving downlink optical signal, and is exported after it is divided into to the first downlink optical signal and the second downlink optical signal.
A downstream end of optical branching device 104 communicates with the input light path of optical switch 106, optical switch 106 at least comprises two light pathes, be connected with respectively short fiber 107 and long optical fibers 108 in these two light pathes, the output of optical switch 106 can be by the ROSA(Receiver Optical Subassembly in adjustable light decay 109 and standard optical module applicable 103, optical fiber receive module) light path communicates;
The first downlink optical signal is received by the ROSA in standard optical module applicable 106 by optical switch 106 and adjustable light decay 109 successively, and the ROSA in standard optical module applicable 103 changes into the first downlink electrical signal for first downlink optical signal that will receive and exports to the limiting amplifier be connected with this ROSA.
Limiting amplifier in standard optical module applicable 103 is connected with BERT102; This limiting amplifier is exported to BERT102 after amplifying for the first downlink electrical signal that will receive, and BERT102, also for the first downlink electrical signal after the amplification according to receiving, records the optical path power penalty of optical module to be debugged 111; And receive instruction and the optical path power penalty of optical module 111 to be debugged according to the instruction testing received.
Another downstream end of optical branching device 104 communicates with the DCA101 light path by fixing light decay 105; The second downlink optical signal is received by DCA101 by fixing light decay 105; DCA101 is for the second downlink optical signal according to receiving, the light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint that record optical module to be debugged 111; DCA101 is also for receiving instruction and light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint of optical module 111 to be debugged according to the instruction testing received.
Debug host 110 is connected with the second bus signals conversion circuit 113 by USB, and DCA101 and BERT102 are all by GPIB(General-Purpose Interface Bus, general-purpose interface bus) with the second bus signals conversion circuit 113, be connected; The second bus signals conversion circuit 113 is for changing mutually usb signal and GPIB signal.Debug host 110 is also for communicating by letter with BERT102 with DCA101 respectively by the second bus signals conversion circuit 113, and this communication process can comprise: debug host 110 obtains light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint of testing the optical module to be debugged 111 obtained from DCA101; Debug host 110 obtains the optical path power penalty of testing the optical module to be debugged 111 obtained from BERT102; Perhaps debug host 110 sends instruction to DCA101; Perhaps debug host 110 sends instruction to BERT102; Thereby realize the control of 110 couples of DCA101 of debug host and BERT102.
The adjustment method of the optical module down channel based on EML that the embodiment of the present invention provides, as shown in Figure 3, concrete steps comprise flow process:
S300: the optical module 111 that debug host 110 initialization are to be debugged.
Particularly, debug host 110 communicates with the MCU of optical module 111 to be debugged, by MCU, the relevant parameter in optical module to be debugged 111 is arranged: the bias current I that EML is set
biasinitial value be I
bias0, the EA voltage V of EML is set
eAinitial value be V
eA0, the initial value that the APC register is set is APC
0, the initial value that the MOD register is set is MOD
_ 0, the initial value that the CP register is set is CP
0.
And debug host 110 arranges the bound of the relevant parameter of optical module to be debugged 111 in this locality: bias current I is set
biasupper specification limit be I
biasmax; EA voltage V is set
eAspecification limit lower limit and upper specification limit be respectively V
eAminand V
eAmax; Specification lower limit and upper specification limit that the APC register is set are respectively APC
minand APC
max, specification lower limit and upper specification limit that the MOD register is set are respectively MOD
minand MOD
max, specification lower limit and upper specification limit that the CP register is set are respectively CP
minand CP
max.
Wherein, the value of the value of the value of APC register, MOD register and CP register is respectively used to adjust luminous power, extinction ratio and the crosspoint of optical module to be debugged 111.
S301: debug host 110 is by the APC register value in the MCU that adjusts successively optical module to be debugged 111, MOD register value and CP register value, so that the luminous power of optical module to be debugged 111, extinction ratio and crosspoint are respectively in specification limit separately; Debug host 110 judges that luminous power, extinction ratio and crosspoint are whether respectively in specification limit separately, if perform step S302; If not, determine that optical module 111 to be debugged is defective, process ends.
Particularly, debug host 110 use dichotomies are adjusted luminous power that the value of APC register makes optical module to be debugged 111 in the luminous power specification, if debug host 110 is judged the value of APC register, have reached APC
minperhaps APC
max, and the luminous power of the optical module to be debugged 111 that debug host 110 obtains from DCA101 is still in the luminous power specification, debug host 110 determines that optical module 111 to be debugged is defective, process ends; Otherwise,
The value of adjusting the MOD register with dichotomy makes the extinction ratio of optical module to be debugged 111 meet the extinction ratio specification, if debug host 110 is judged the value of MOD register, has reached MOD
minperhaps MOD
max, and the extinction ratio of the optical module to be debugged 111 that debug host 110 obtains from DCA101 is still in the extinction ratio specification, debug host 110 determines that optical module 111 to be debugged is defective, process ends; Otherwise,
The value of adjusting the CP register with dichotomy makes the crosspoint of optical module to be debugged 111 meet the crosspoint specification, if debug host 110 is judged the value of CP register, has reached CP
minperhaps CP
max, and in Reng Bu crosspoint, the crosspoint specification of the optical module to be debugged 111 that debug host 110 obtains from DCA101, debug host 110 determines that optical module 111 to be debugged is defective, process ends; Otherwise,
DCA101 tests luminous power, extinction ratio, the crosspoint of optical module to be debugged 111; Debug host 110 judges that the luminous power, extinction ratio, crosspoint of the optical module to be debugged 111 that DCA101 records are whether respectively in specification limit separately; If perform step S302, otherwise determine that optical module 111 to be debugged is defective, process ends.
Wherein, the luminous power specification of optical module to be debugged, extinction ratio specification and crosspoint specification be those skilled in the art rule of thumb or historical data etc. set in advance and be stored in debug host 110.
S302: debug host 110 judges that the light eye pattern mask allowance of the optical module to be debugged 111 that DCA101 records is whether in template allowance specification: if not, to the MCU in optical module to be debugged 111, send EV voltage and raise instruction, make MCU raise instruction by the V of the EML in optical module to be debugged 111 according to the EV voltage received
eAraise unit amplitude, perform step afterwards S303; If perform step S304.
Wherein, the template allowance specification of optical module to be debugged be those skilled in the art rule of thumb or historical data etc. set in advance and be stored in debug host 110.
S303: debug host 110 judges the V of the EML in optical module 111 to be debugged
eAwhether in the VE voltage specification: if jump to step S301; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
S304: debug host 110 judges that the optical path power penalty of the optical module to be debugged 111 that BERT102 records is whether in passage cost specification: if not, perform step step 305; If perform step S306.
Particularly, if the first downlink optical signal is received and convert to the first downlink electrical signal by the short fiber 107 in optical switch 106 by standard optical module applicable 103, BERT102 records the receiving sensitivity of standard optical module applicable 103 corresponding to short fiber 107 according to this first downlink electrical signal; If the first downlink optical signal is received and convert to the first downlink electrical signal by the long optical fibers 108 in optical switch 106 by standard optical module applicable 103, BERT102 records the receiving sensitivity of standard optical module applicable 103 corresponding to long optical fibers 108 according to this first downlink electrical signal; After BERT102 calculates the difference between two receiving sensitivities that record, the difference between the receiving sensitivity calculated is as the optical path power penalty of optical module to be debugged 111.
Debug host 110 judges that the optical path power penalty of optical module to be debugged 111 of BERT102 measuring and calculating is whether in passage cost specification: if not, perform step step 305; If perform step S306.
The passage cost specification of optical module to be debugged be those skilled in the art rule of thumb or historical data etc. set in advance and be stored in debug host 110.
S305: the I of the EML the optical module to be debugged 111 that debug host 110 judgements are obtained from MCU
biaswhether be less than I
biasmax, and the V of the EML the optical module to be debugged 111 obtained from MCU
eAwhether be not more than V
eA0if: all, to the MCU in optical module to be debugged 111, send EV voltage and lower instruction, make MCU lower instruction by the V of the EML in optical module to be debugged 111 according to the EV voltage received
eAlower unit amplitude, jump to afterwards step S303; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
S306: the I of the EML the optical module to be debugged 111 that debug host 110 judgements are obtained from MCU
biaswhether be less than I
biasmaxif:, determine that optical module 111 down channels to be debugged are qualified, process ends; Otherwise, execution step S307.
S307: debug host 110 sends EV voltage to the MCU in optical module to be debugged 111 and raises instruction, makes MCU raise instruction by the V of the EML in optical module to be debugged 111 according to the EV voltage received
eAraise unit amplitude.
S308: debug host 110 judges the V of the EML in optical module 111 to be debugged
eAwhether in specification, if carry out next step S309; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
S309: debug host 110 is by the APC register value in the MCU that adjusts successively optical module to be debugged 111, MOD register value and CP register value, so that the luminous power of optical module to be debugged 111, extinction ratio and crosspoint are respectively in specification limit separately; Debug host 110 judges that luminous power, extinction ratio and crosspoint are whether respectively in specification limit separately, if perform step S310; If not, determine that optical module 111 to be debugged is defective, process ends.
Concrete adjustment method is identical with the adjustment method of step S301, repeats no more herein.
S310: debug host 110 judges that the light eye pattern mask allowance of the optical module to be debugged 111 that DCA101 records is whether in template allowance specification: if, perform step S311, otherwise, determine that optical module to be debugged 111 is defective, process ends.
S311: debug host 110 judges that the optical path power penalty of the optical module to be debugged 111 that BERT102 records is whether in passage cost specification: if jump to step S306; Otherwise, determine that optical module to be debugged 111 is defective, process ends.
The method of optical path power penalty that BERT102 calculates optical module to be debugged 111 is identical with the measuring method in step S304, repeats no more herein.
Technical scheme of the present invention, in the process of the optical module down channel of debugging based on EML, for the light eye pattern mask allowance optical module in template allowance specification not, by adjusting the EA voltage V of EML
eAcan be so that the light eye pattern mask allowance of this optical module, in template allowance specification, can reduce this optical module and be judged as underproof phenomenon, thus the rate of finished products of the optical module based on EML improved.
Further, technical scheme of the present invention, in the process of the optical module down channel of debugging based on EML, for light eye pattern mask allowance in template allowance specification but the optical path power penalty optical module in passage cost specification not, can be by adjusting the V of the EML in this optical module
eAcan so that the light eye pattern mask allowance of this optical module in template allowance specification, the optical path power penalty of this optical module is in passage cost specification; Perhaps for light eye pattern mask allowance in template allowance specification and optical path power penalty in passage cost specification, but the bias current I of EML
biasbe not less than I
biasmaxoptical module, can be by adjusting the V of the EML in this optical module
eAcan so that the light eye pattern mask allowance of this optical module in template allowance specification, the optical path power penalty of this optical module is in passage cost specification, and the I of the EML in this optical module
biasbe less than I
biasmaxthereby, the further rate of finished products that improves the optical module based on EML.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (10)
1. the adjustment method of the optical module down channel based on Electroabsorption Modulated Laser EML, is characterized in that, comprising:
Debug host is debugged and is made it in template allowance specification the light eye pattern mask allowance of optical module to be debugged, if the optical path power penalty that further judges described optical module is in passage cost specification and the bias current I of the EML in described optical module
biasbe less than its upper specification limit I
biasmax, complete the debugging to described optical module down channel;
Wherein, in the debug process at least one times that described smooth eye pattern mask allowance is carried out: described debug host is adjusted to the luminous power of described optical module, extinction ratio and crosspoint in specification limit separately successively, judges that afterwards described smooth eye pattern mask allowance is whether in template allowance specification; If finish the debugging to described smooth eye pattern mask allowance; If not, to the MCU in described optical module to be debugged, send EA voltage and raise instruction, described MCU raises instruction by the EA voltage V of the EML in described optical module according to the EA voltage received
eAafter raising unit amplitude, if described debug host is determined described V
eAin the EV voltage specification, described smooth eye pattern mask allowance is debugged next time; Described V
eAinitial value be V
eA0.
2. the method for claim 1, is characterized in that, after in described debug host, the light eye pattern mask allowance of optical module to be debugged being debugged and making it in template allowance specification, also comprises:
If described debug host is judged the optical path power penalty of described optical module not in passage cost specification, further judge described I
biaswhether be less than described I
biasmax, and judge described V
eAwhether be not more than described V
eA0; If be, be, after described debug host is debugged and made it in passage cost specification the optical path power penalty of described optical module, if judge described I
biasbe less than described I
biasmax, complete the debugging to described optical module down channel;
Wherein, in the debug process at least one times that described debug host is carried out described optical path power penalty: described debug host sends EA voltage to described MCU and lowers instruction, makes described MCU lower instruction by described V according to the EA voltage received
eAlower unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, described smooth eye pattern mask allowance is carried out to debugging at least one times; Afterwards, described debug host judges that described optical path power penalty is whether in passage cost specification; If finish the debugging to described optical path power penalty; If not, further judging described I
biasbe less than described I
biasmaxand described V
eAbe not more than described V
eA0after, described debug host is debugged described optical path power penalty next time.
3. method as claimed in claim 2, is characterized in that, the optical path power penalty of judging described optical module in described debug host in passage cost specification after, also comprise:
If described debug host is judged described I
biasbe not less than described I
biasmax, described debug host is to described I
biascarry out debugging at least one times, to described I
biasa debug process in:
Described debug host sends EA voltage to the MCU in described optical module and raises instruction, makes described MCU raise instruction by described V according to the EA voltage received
eAraise unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, after further adjusting in specification limit separately by the luminous power of described optical module, extinction ratio, crosspoint, light eye pattern mask allowance and optical path power penalty successively, further judge described I
biaswhether be less than described I
biasmax; If finish described I
biasdebugging; If not, to described I
biasdebug next time.
4. described method as arbitrary as claim 1-3, is characterized in that, in described debug host to described I
biasin the debug process at least one times of carrying out, or also comprise in the debug process at least one times that described smooth eye pattern mask allowance is carried out:
If described debug host is at APC
minto APC
maxadjust the APC register value of described optical module in scope, and the luminous power that can not make described optical module is in the luminous power specification, or
At MOD
minto MOD
maxadjust the MOD register value of described optical module in scope, and the extinction ratio that can not make described optical module is in the extinction ratio specification, or
At CP
minto CP
maxadjust the CP register value of described optical module in scope, and the crosspoint that can not make described optical module is in the specification of crosspoint; Judge that described optical module is defective;
Wherein, described APC
minwith described APC
maxbe respectively specification lower limit and the upper specification limit of predefined APC register value; Described MOD
minwith described MOD
maxbe respectively specification lower limit and the upper specification limit of predefined MOD register value; Described CP
minwith described CP
maxbe respectively specification lower limit and the upper specification limit of predefined CP register value.
5. described method as arbitrary as claim 1-3, is characterized in that, at described MCU, according to the EA voltage received, raises instruction by the EA voltage V of the EML in described optical module
eAafter raising unit amplitude, or lower instruction by described V at described MCU according to the EA voltage received
eAafter lowering unit amplitude, also comprise:
If described debug host is determined described V
eAnot in described EV voltage specification, determine that described optical module is defective.
6. method as claimed in claim 2 or claim 3, is characterized in that, if described debug host judges that the optical path power penalty of described optical module, not in passage cost specification, also comprises:
If described debug host is further judged described I
biasbe not less than described I
biasmax, or described V
eAbe greater than described V
eA0, determine that described optical module is defective.
7. method as claimed in claim 3, is characterized in that, in described debug host, judges described I
biasbe not less than described I
biasmaxafterwards, also comprise:
If described debug host is judged described smooth eye pattern mask allowance not in template allowance specification, or described optical path power penalty determines that described optical module is defective not in passage cost specification.
8. the debug system of the optical module down channel based on Electroabsorption Modulated Laser EML, it is characterized in that, comprising: debug host, the first bus signals conversion circuit, optical module, the second bus signals conversion circuit, digital communication analyzer DCA, error rate tester BERT, optical branching device, optical switch and standard optical module applicable to be debugged;
Wherein, described debug host is connected with described the first bus signals conversion circuit by general-purpose serial bus USB, MCU in described optical module to be debugged is connected with described the first bus signals conversion circuit by mutual integrated circuit iic bus, and described the first bus signals conversion circuit is for changing usb signal and iic bus signal mutually;
Described debug host is connected with described the second bus signals conversion circuit by USB, described DCA all is connected with described the second bus signals conversion circuit by general-purpose interface bus GPIB with described BERT, and described the second bus signals conversion circuit is for changing usb signal and GPIB signal mutually;
Described BERT sends the downlink electrical signal for the drive circuit of from the EML to described optical module to be debugged;
The drive circuit of EML in described optical module to be debugged is connected with described EML, is used to described EML that bias current is provided, and the downlink electrical signal of reception is exported to described EML;
EML in described optical module to be debugged exports for after converting described downlink electrical signal to downlink optical signal;
Described optical branching device is used for receiving described downlink optical signal, and exports after it is divided into to the first downlink optical signal and the second downlink optical signal;
Described the first downlink optical signal is received by the ROSA in described standard optical module applicable by described optical switch, ROSA in described standard optical module applicable changes into the first downlink electrical signal for first downlink optical signal that will receive and exports to the limiting amplifier be connected with described ROSA, described limiting amplifier is exported to described BERT after amplifying for the first downlink electrical signal that will receive, described BERT is also for the first downlink electrical signal after the amplification according to receiving, and records the optical path power penalty of described optical module to be debugged;
Described the second downlink optical signal is received by described DCA, and described DCA is for the second downlink optical signal according to receiving, and records light eye pattern mask allowance, luminous power, extinction ratio and the crosspoint of described optical module to be debugged;
Described debug host, debug and make it in template allowance specification for the light eye pattern mask allowance of the optical module described to be debugged to obtaining from described DCA, if the bias current I of the EML the optical module described to be debugged that the optical path power penalty of the optical module described to be debugged that further judgement is obtained from described BERT obtains in passage cost specification and from described MCU
biasbe less than its upper specification limit I
biasmax, complete the debugging to described optical module down channel to be debugged; Wherein, in the debug process at least one times that described smooth eye pattern mask allowance is carried out: described debug host is adjusted to luminous power, extinction ratio and the crosspoint of described optical module to be debugged in specification limit separately successively, judges that afterwards described smooth eye pattern mask allowance is whether in template allowance specification; If finish the debugging to described smooth eye pattern mask allowance; If not, to the MCU in described optical module to be debugged, send EA voltage and raise instruction, described MCU raises instruction by the EA voltage V of the EML in described optical module to be debugged according to the EA voltage received
eAafter raising unit amplitude, if described debug host is determined described V
eAin the EV voltage specification, described smooth eye pattern mask allowance is debugged next time; Described V
eAinitial value be V
eA0.
9. debug system as claimed in claim 8, is characterized in that,
If described debug host also for the optical path power penalty of judging described optical module not in passage cost specification, the further described I of judgement
biaswhether be less than described I
biasmax, and judge described V
eAwhether be not more than described V
eA0; If be, be, after described debug host is debugged and made it in passage cost specification the optical path power penalty of described optical module, if judge described I
biasbe less than described I
biasmax, complete the debugging to described optical module down channel; Wherein, in the debug process at least one times that described debug host is carried out described optical path power penalty: described debug host sends EA voltage to described MCU and lowers instruction, makes described MCU lower instruction by described V according to the EA voltage received
eAlower unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, described smooth eye pattern mask allowance is carried out to debugging at least one times; Afterwards, described debug host judges that described optical path power penalty is whether in passage cost specification; If finish the debugging to described optical path power penalty; If not, further judging described I
biasbe less than described I
biasmaxand described V
eAbe not more than described V
eA0after, described debug host is debugged described optical path power penalty next time.
10. debug system as claimed in claim 9, is characterized in that,
If described debug host is also for judging described I
biasbe not less than described I
biasmax, described debug host is to described I
biascarry out debugging at least one times, to described I
biasa debug process in:
Described debug host sends EA voltage to the MCU in described optical module and raises instruction, makes described MCU raise instruction by described V according to the EA voltage received
eAraise unit amplitude; If described debug host is determined described V
eAin described EV voltage specification, after further adjusting in specification limit separately by the luminous power of described optical module, extinction ratio, crosspoint, light eye pattern mask allowance and optical path power penalty successively, further judge described I
biaswhether be less than described I
biasmax; If finish described I
biasdebugging; If not, to described I
biasdebug next time.
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