CN103454522A - Electronic replacement part technology state automatic detection system and method based on PXI bus - Google Patents

Electronic replacement part technology state automatic detection system and method based on PXI bus Download PDF

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Publication number
CN103454522A
CN103454522A CN2013103420452A CN201310342045A CN103454522A CN 103454522 A CN103454522 A CN 103454522A CN 2013103420452 A CN2013103420452 A CN 2013103420452A CN 201310342045 A CN201310342045 A CN 201310342045A CN 103454522 A CN103454522 A CN 103454522A
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China
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module
pin
pxi
spare part
automatic checkout
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CN2013103420452A
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CN103454522B (en
Inventor
王格芳
张东
陈国顺
牛刚
吕艳梅
夏明飞
韩宁
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Ordnance Technology Research Institute of General Armament Department of Chinese PLA
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Ordnance Technology Research Institute of General Armament Department of Chinese PLA
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Abstract

The invention discloses an electronic replacement part technology state automatic detection system based on a PXI bus. The replacement part technology state automatic detection system based on the PXI bus comprises a controller with automatic detection system software, a PXI system, a VPC connector, an adaptor, a keyboard connected with the controller and a displayer, wherein the PXI system is formed by a PXI case and more than two PXI modules inserted into corresponding inserting grooves of the PXI case; the adaptor comprises a system self-test adaptor; the controller is connected with the PXI case through the PXI bus; signal ends of all PXI modules are connected with the self-test adaptor or a special test adaptor through the VPC connector; the system self-test adaptor comprises a standard current source, a standard resistor R, a reference source circuit, a square-wave generator, a signal route N1, a signal route N2, a signal route N3, a first copper foil short-circuit wire, a second copper foil short-circuit wire, a third copper foil short-circuit wire, a fourth copper foil short-circuit wire and a fifth copper foil short-circuit wire. The replacement part technology state automatic detection system based on the PXI bus has the advantages that due to the adoption of the adaptor, separating performance of an electronic replacement part to be tested and a PXI port is good, the system has good universality and expansibility, polytypic signals can be tested, and detection automation degree is high.

Description

Electronics spare part state of the art automatic checkout system and method based on the PXI bus
Technical field
The present invention relates to a kind of electronics spare part state of the art automatic checkout system and method based on the PXI bus, applicable detected object is mainly the various intermediate frequencies of electronics, low-frequency electronic spare part.
Background technology
Along with the raising of production technology and technological level, the various circuit boards with advanced technologies such as high density, Advanced Packagings are more and more, to the test of circuit board, also require more and more higher.In circuit board testing in the past, adopt fixture to form test network always or, by the method for welding testing weld pad on the circuit board node, in test process, require the various circuit probes of tester's manual operation to be tested.Adopt this traditional method to build circuit board testing system, the construction cycle is long, efficiency is low, cost is high, easily make mistakes.
The deficiency that existing electronics spare part Auto-Test System exists:
1.TPS(test program set) performance history is loaded down with trivial details, workload is large, and the test procedure dependence of developing is strong, portable poor;
2.TPS development difficulty is larger, high to developer's technical requirement.
3. the test adapter versatility is poor, and different measurands are often needed to adaptor plate corresponding to special exploitation, causes that testing efficiency is low and cost is higher.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of electronics spare part state of the art automatic checkout system and method based on the PXI bus.
The present invention adopts following technical scheme:
The present invention includes controller, PXI system, VPC connector, adapter, the keyboard be connected with controller, display that automatic checkout system software is installed; Described PXI system is comprised of PXI cabinet and the PXI module that inserts in respectively associated socket in the PXI cabinet more than 2; Described adapter comprises the System self-test adapter; Described controller is connected by the PXI bus with the PXI cabinet; The signal end of described each PXI module is connected with self-test adapter through the VPC connector;
Described System self-test adapter comprises normalized current source, measuring resistance R, reference source circuit, square-wave generator, signal router N1-N3 and the first to the 5th Copper Foil short-circuit line;
The output terminal COM in described normalized current source connects VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The input end I1 of the D1 termination signal router N1 of described measuring resistance R, the output terminal O4 of the D2 termination signal router N2 of described measuring resistance R; The output terminal REF of described reference source circuit connects respectively the input end I5 of signal router N2 and VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The input end I2 of described signal router N1 meets the input end I4 of signal router N2, connects the simulating signal generation module output terminal of described electronics spare part state of the art automatic checkout system through VPC connector the 2nd groove of described electronics spare part state of the art automatic checkout system simultaneously; The output terminal O1 of described signal router N1 connects VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The output terminal O2 of described signal router N1 meets the input end I3 of described signal router N2; The output terminal O3 of described signal router N2 connects the multi-functional DAQ module of described electronics spare part state of the art automatic checkout system through VPC connector the 3rd groove of described electronics spare part state of the art automatic checkout system; VPC connector the 1st groove output terminal of described electronics spare part state of the art automatic checkout system connects respectively the respective input of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system; The input end of the output termination digital multimeter module of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system;
The output terminal W0 of described square-wave generator meets the input end I6 of signal router N3; The output terminal W1 of described square-wave generator connects the first dynamic signal acquisition module input through VPC connector the 8th groove, the first universal switch module of described electronics spare part state of the art automatic checkout system successively; The output terminal W2 of described square-wave generator connects the second dynamic signal acquisition module input through VPC connector the 9th groove, the second universal switch module of described electronics spare part state of the art automatic checkout system successively;
The input end I7 of described signal router N3 divides two branch roads, wherein a branch road is successively through VPC connector the 6th groove of described electronics spare part state of the art automatic checkout system, the output terminal that the 3rd intermediate frequency switch module connects the first virtual arbitrary waveform generator module, and another branch road is successively through VPC connector the 7th groove of described electronics spare part state of the art automatic checkout system, the output terminal that the 4th intermediate frequency switch module connects the second virtual arbitrary waveform generator module; The output terminal O5 of described signal router N3 divides two branch roads, wherein a branch road is successively through VPC connector the 4th groove of described electronics spare part state of the art automatic checkout system, the input end that the first intermediate frequency switch module connects the first Digital Oscillograph Module, and another branch road is successively through VPC connector the 5th groove of described electronics spare part state of the art automatic checkout system, the input end that the second intermediate frequency switch module connects the second Digital Oscillograph Module;
The first end of described the first Copper Foil short-circuit line is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and two-way connection of digital I/O module corresponding end of described electronics spare part state of the art automatic checkout system, and the second end of described the first Copper Foil short-circuit line is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and two-way connection of digital I/O module corresponding end of described electronics spare part state of the art automatic checkout system; Described the second Copper Foil short-circuit line first end is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and optics isolation digital input module two-way connection of corresponding end of described electronics spare part state of the art automatic checkout system, and described second Copper Foil short-circuit line the second end is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and optics isolation digital input module two-way connection of corresponding end of described electronics spare part state of the art automatic checkout system;
The first end of described the 3rd Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the H of the CAN1 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The second end of described the 3rd Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the H of the CAN2 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The first end of described the 4th Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the L of the CAN1 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The second end of described the 4th Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the L of the CAN2 of the CAN interface module of described electronics spare part state of the art automatic checkout system;
The first end of described the 5th Copper Foil short-circuit line meets the RS232 serial interface module transmitting terminal TX of described electronics spare part state of the art automatic checkout system through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system, the second end of described the 5th Copper Foil short-circuit line meets the receiving end RX of the RS232 serial interface module of described electronics spare part state of the art automatic checkout system through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system;
The control end of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system, the control end of digital multimeter module, the control end of simulating signal generation module, the control end of multi-functional DAQ module, the control end of the first to second virtual arbitrary waveform generator module, the control end of the first to second Digital Oscillograph Module, the control end of first to fourth intermediate frequency switch module, the control end of first to fourth universal switch module, the control end of the first to second dynamic signal acquisition module, the control of numeral I/O module, the control end of optics isolation digital input module, the control end of the control end of CAN interface module and RS232 serial interface module respectively with two-way connection of controller corresponding port of described electronics spare part state of the art automatic checkout system.
Described adapter also comprises the dedicated test adapter be complementary with tested electronics spare part, the test signal port of described dedicated test adapter is connected with the corresponding port of tested electronics spare part, and the communication port of described dedicated test adapter is connected with the VPC connector.
Described reference source circuit comprises reference source chip U1, amplifier U2, resistance R 1 and capacitor C 1-C2;
Input end 2 pin of described reference source chip U1 are through connect+12V of resistance R 1 direct supply; Output terminal 6 pin of described reference source chip U1 connect in-phase input end 3 pin of amplifier U2; Inverting input 2 pin of described amplifier U2 connect output terminal 1 pin of amplifier U2, the output terminal REF that output terminal 1 pin of described amplifier U2 is reference source circuit;
Described capacitor C 1 is connected between input end 2 pin and ground of reference source chip U1; Described capacitor C 2 is connected between output terminal 6 pin and ground of reference source chip U1; The 4 pin ground connection of described reference source chip U1; Connect+12V of the power end 8 pin direct supply of described amplifier U2; Connect-12V of the power end 4 pin direct supply of described amplifier U2.
Described square-wave generator comprises integrated package U3, crystal oscillator Y1, resistance R 2-R6 and capacitor C 3-C4; 11 pin of described integrated package U3 connect 8 pin of integrated package U3 successively through crystal oscillator Y1, capacitor C 4; Described resistance R 2 is in parallel with crystal oscillator Y1; Described capacitor C 3 is connected between 11 pin and 8 pin of integrated package U3; Described resistance R 3 is connected between 10 pin of the node of crystal oscillator Y1 and capacitor C 2 and integrated package U3; Connect+12V of the 16 pin direct supply of described integrated package U3; 12 pin of described integrated package U3 and the equal ground connection of 8 pin; 4 pin of described integrated package U3 meet the output terminal W0 of square-wave generator through resistance R 4; 5 pin of described integrated package U3 meet the output terminal W1 of square-wave generator through resistance R 5; 6 pin of described integrated package U3 meet the output terminal W2 of square-wave generator through resistance R 6.
Described normalized current source comprises amplifier U4, resistance R 9-R14; Described amplifier U4 comprises U4A unit and U4B unit;
In-phase input end 3 pin of described U4A unit divide two branch roads, and wherein a branch road is through connect+5V of resistance R 13 direct supply, and another branch road connects output terminal 7 pin of U4B unit through resistance R 12; Inverting input 2 pin of described U4A unit divide two branch roads, and wherein a branch road connects output terminal 1 pin of U4A unit through resistance R 10, and another branch road is through resistance R 9 ground connection; Output terminal 1 pin of described U4A unit meets the output terminal COM in described normalized current source successively through resistance R 11, R14;
In-phase input end 5 pin of described U4B unit connect the node of described resistance R 11 and R14; Inverting input 6 pin of described U4B unit connect output terminal 7 pin of U4B unit; Connect+12V of the 8 pin direct supply of described amplifier U4B; Connect-12V of the 4 pin direct supply of described amplifier U4B.
Described signal route N1 comprises U5A unit, capacitor C 5, resistance R 15-R18 and the relay J 1 of amplifier U5; Between described resistance R 15 and be connected on+24V direct supply after resistance R 17 is connected and ground; In-phase input end 3 pin of the U5A unit of described amplifier U5 connect the node of described resistance R 15 and resistance R 17; Described resistance R 16 be connected between the input end I2 and ground of described signal route N1 after resistance R 18 is connected; Inverting input 2 pin of the U5A unit of described amplifier U5 connect the node of described resistance R 16 and resistance R 18; U5A unit connect+24V of the 8 pin direct supply of described amplifier U5; Between described capacitor C 5 be connected on+24V direct supply and ground; 4 pin ground connection of the U5A unit of described amplifier U5;
Between U5A unit output terminal 1 pin of the coil of described relay J 1 be connected on+24V direct supply and described amplifier U5; Swing arm 1 pin of described relay J 1 meets the output terminal O1 of described signal route N1; Swing arm 2 pin of described relay J 1 meet the output terminal O2 of described signal route N1; Stationary contact 3 pin of described relay J 1 meet described signal route N1 input end I2; Moving contact 4 pin of described relay J 1 are unsettled; Stationary contact 5 pin of described electrical equipment J1 meet the input end I1 of described signal route N1; Moving contact 6 pin of described relay J 1 meet the input end I2 of described signal route N1;
Described signal route N2 comprises U5B unit, resistance R 19-R22 and the relay J 2 of amplifier U5; Between described resistance R 19 and be connected on+24V direct supply after resistance R 21 is connected and ground; In-phase input end 5 pin of the U5B unit of described amplifier U5 connect the node of described resistance R 19 and resistance R 21; Described resistance R 20 be connected between the input end I4 and ground of described signal route N2 after resistance R 22 is connected; Inverting input 6 pin of the U5B unit of described amplifier U5 connect the node of described resistance R 20 and resistance R 22;
Between U5B unit output terminal 7 pin of the coil of described relay J 2 be connected on+24V direct supply and described amplifier U5; Swing arm 1 pin of described relay J 2 meets the output terminal O3 of described signal route N2; Swing arm 2 pin of described relay J 2 meet the output terminal O4 of described signal route N2; Stationary contact 3 pin of described relay J 2 are unsettled; The moving contact 4 pin ground connection of described relay J 2; Stationary contact 5 pin of described relay J 2 meet the input end I5 of described signal route N2; Moving contact 6 pin of described relay J 2 meet the input end I6 of described signal route N2.
Described signal route N3 comprises amplifier U6B, resistance R 23-R26, capacitor C 6 and relay J 3; Between described resistance R 23 and be connected on+24V direct supply after resistance R 25 is connected and ground; In-phase input end 5 pin of described amplifier U6B connect the node of described resistance R 23 and resistance R 25; Described resistance R 24 be connected between the input end I7 and ground of described signal route N3 after resistance R 26 is connected; Inverting input 6 pin of described amplifier U6B connect the node of described resistance R 24 and resistance R 26; Connect+24V of the 8 pin direct supply of described amplifier U6B; Between described capacitor C 7 be connected on+24V direct supply and ground; The power end 4 pin ground connection of described amplifier U6B;
Between output terminal 7 pin of the coil of described relay J 3 be connected on+24V direct supply and described amplifier U6B; Swing arm 1 pin of described relay J 3 meets the output terminal O5 of described signal route N3; Swing arm 2 pin of described relay J 3 are unsettled; Stationary contact 3 pin of described relay J 3 are unsettled; Moving contact 4 pin of described relay J 3 meet the input end I6 of described signal route N3; Stationary contact 5 pin of described relay J 3 are unsettled; Moving contact 6 pin of described relay J 3 meet the input end I7 of described signal route N3.
Described PXI module comprises 1 digital I/O module NI PXI-6509, 1 multi-functional DAQ module NI PXI-6259, 1 simulating signal generation module NI PXI-6733, 1 high voltage multiplexer module NI PXI-2527, 1 universal switch module NI PXI-2576, 1 intermediate frequency switch module NI PXI-2593, 1 digitizer/oscillograph module NI PXI-5152, each 1 of virtual arbitrary waveform generator module NI PXI-5441 and NI PXI-5412, 1 digital multimeter module NI PXI-4070, 1 dynamic signal acquisition module NI PXI-4461, 2 interface controller module NI PXI-PCI-8331, 1 RS232 serial interface module NI PXI-8430/4, 1 CAN interface module NI PXI-8511/2 and 3 optics isolation digital input module NI SCXI-1162, described controller is for grinding magnificent IPC-610H industrial computer, described PXI cabinet comprises 14 slot 3U PXI cabinets and with the PXI cabinet of integrated SCXI, the model of described reference source chip U1 is ADR425AR, the model of described amplifier U2 is AD8512AR, the model of described integrated package U3 is CD4060BCM, the model of described amplifier U4 is AD8512AR, the model of described amplifier U5 is LM293, the model of described amplifier U6B is LM293, the model of described relay J 1-J3 is HF4/5-G6K-2P.
The implementation method of the described electronics spare part state of the art automatic checkout system based on the PXI bus is characterized in that:
(1) the automatic checkout system software based on the exploitation of LabVIEW virtual instrument software is housed on described controller;
Described automatic checkout system software comprises test diagnosis system master routine, testing and diagnosing operation platform, detects and diagnose development platform, online help module, System self-test module, system management module, detection diagnostic data library module, test and diagnostic procedure set, detection interface, supplementary information document storehouse; Described test diagnosis system master routine is controlled and is dispatched described testing and diagnosing operation platform, detects diagnosis development platform, online help module, System self-test module, system management module;
Described detection diagnostic data base comprises Detection task database, Fault Diagnosis Database, User Information Database;
Described detection diagnosis operation platform comprises universal measurement subroutine, test assignment execution subroutine, fault diagnosis subroutine and information inquiry subroutine; Described universal measurement subroutine, by calling the use of described detection interface simulation conventional desktop surveying instrument, makes system possess the function of traditional discrete surveying instrument; Described test assignment execution subroutine is for different tested electronics spare parts, in conjunction with the dedicated test adapter, automatically load described detection and diagnostic routine collection according to corresponding document name that in described detection diagnostic data base, the Detection task database provides and file path, described detection and diagnostic routine collection call respective function in described detection interface and complete the state-detection of tested electronics spare part and draw last test result; Described fault diagnosis subroutine is for different tested electronics spare parts, in conjunction with the dedicated test adapter, automatically load described detection and diagnostic routine collection according to corresponding document name and file path that in described detection diagnostic data base, Fault Diagnosis Database provides, described detection and diagnostic routine collection call respective function in described detection interface, in modes such as word, pictures, guide the user to carry out fault detection and location; Described information inquiry module is positioned at the technical information of the electronics spare part in supplementary information document storehouse for inquiry;
Described detection diagnosis development platform comprises test assignment exploitation subroutine, fault diagnosis exploitation subroutine; Described test assignment exploitation subroutine for testing process import and export, testing process description, test interface customization, testing process exploitation, testing process emulation, testing process editor, testing process according to design, by the detected electrons spare part, required information stores in the Detection task database detected in diagnostic data base, generate the dedicated test procedure set, and specify filename and the path of autotest, fault diagnosis data and repair message in described detection diagnostic data base; Described fault diagnosis exploitation subroutine for newly-built, revise and delete electronics spare part fault diagnosis project and information, editor's diagnostic flow chart, the method that electronics spare part fault is got rid of stores in the Fault Diagnosis Database detected in diagnostic data base, generates special-purpose fault diagnostic program collection;
Described system management module is for user authority management, Password Management, record management; Described System self-test module is for carrying out self check to the function of PXI cabinet, each PXI module; Described online help module is for providing the information that is positioned at supplementary information document storehouse " detection diagnosis operation platform utilization instructions " and " detecting diagnosis development platform operation instructions " and system version;
Described detection diagnostic data base is used to described detection diagnosis operation platform that file path and the filename of autotest, fault diagnosis data and the repair message of tested electronics spare part is provided;
The various instrument and equipment Driver Libraries of described detection interface shielding harness bottom, for controlling described system hardware driver; According to the function performance attribute can be divided into by resource distribution class, excitation input class, measure response class and analyzing and processing class totally four large class functions form;
(2) concrete steps of described implementation method are as follows:
Step1: tested electronics spare part circuit analysis;
Step2: distribute and detect resource, design detection method;
Step3: detecting diagnosis developing platform operation interface;
Step4: in detection diagnosis development platform, write testing process;
Step5: connected system self-test adapter and VPC connector, carry out self check to the PXI system;
Step6: described VPC connector is connected with the corresponding interface of dedicated test adapter, and the detection streamer interface of described dedicated test adapter is connected with tested electronics spare part, completes being connected of this detection system and tested electronics spare part.
Detect the concrete steps of diagnosing the operation platform operating software to carry out detection automatically in the implementation method of the described electronics spare part state of the art automatic checkout system based on the PXI bus as follows:
Step6-1: select test assignment;
Step6-2: determine whether to start to carry out test, start if determine, be connected to the detection diagnostic data base, load testing process;
Step6-3: prompting operation step;
Step6-4: call and detect respective function in interface, control the PXI instrument and carry out corresponding operating;
Step6-5: show and detect data;
Step6-6: reach a conclusion.
Good effect of the present invention is as follows:
1. the core of testing apparatus is to adopt PXI modular instrument system, by selecting various PXI modules to realize generation and the acquisition function of various common voltage, electric current, switching value, owing to having adopted this design of adapter, make tested electronics spare part and PXI interface separation property good, not only facilitated designing and developing of dedicated test adapter, the good Universal and scalability that also made system possess;
Perfect function, friendly interface, simple to operate, visualization is high, reduced the difficulty of TPS exploitation, improved testing efficiency;
3. the detectable signal type is many, detects automaticity high.
4. having self-test adapter can be just more true and reliable to the test of measurand and fault diagnosis, localization of fault, take full advantage of the hardware resource of Auto-Test System itself, only increasing a small amount of adjunct circuit, be to complete its self-checking function in the situation of self-test adapter, simple in structure, reliability is high, has realized detection and fault isolation to this Auto-Test System, has ensured the accuracy of test.
The accompanying drawing explanation
Fig. 1 is structural principle block diagram of the present invention.
Fig. 2 is theory diagram of the present invention.
Fig. 3 is reference source circuit schematic diagram of the present invention.
Fig. 4 is square-wave generator circuit schematic diagram of the present invention.
Fig. 5 is normalized current source circuit schematic diagram of the present invention.
Fig. 6 is signal router N1-N2 circuit theory diagrams of the present invention.
Fig. 7 is signal router N3 circuit theory diagrams of the present invention.
The process flow diagram that Fig. 8 is method of testing of the present invention.
Fig. 9 is the process flow diagram that the present invention detects the diagnosis action command.
Figure 10 is the process flow diagram that the present invention detects diagnosis exploitation order.
Embodiment
Below in conjunction with accompanying drawing 1-accompanying drawing 10 and embodiment, the present invention will be further described:
The present invention includes controller, PXI system, VPC connector, adapter, the keyboard be connected with controller, display that automatic checkout system software is installed; Described PXI system is comprised of PXI cabinet and the PXI module that inserts in respectively associated socket in the PXI cabinet more than 2; Described adapter comprises the System self-test adapter; Described controller is connected by the PXI bus with the PXI cabinet; The signal end of described each PXI module is connected with self-test adapter through the VPC connector;
Described System self-test adapter comprises normalized current source, measuring resistance R, reference source circuit, square-wave generator, signal router N1-N3 and the first to the 5th Copper Foil short-circuit line;
The output terminal COM in described normalized current source connects VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The input end I1 of the D1 termination signal router N1 of described measuring resistance R, the output terminal O4 of the D2 termination signal router N2 of described measuring resistance R; The output terminal REF of described reference source circuit connects respectively the input end I5 of signal router N2 and VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The input end I2 of described signal router N1 meets the input end I4 of signal router N2, connects the simulating signal generation module output terminal of described electronics spare part state of the art automatic checkout system through VPC connector the 2nd groove of described electronics spare part state of the art automatic checkout system simultaneously; The output terminal O1 of described signal router N1 connects VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The output terminal O2 of described signal router N1 meets the input end I3 of described signal router N2; The output terminal O3 of described signal router N2 connects the multi-functional DAQ module of described electronics spare part state of the art automatic checkout system through VPC connector the 3rd groove of described electronics spare part state of the art automatic checkout system; VPC connector the 1st groove output terminal of described electronics spare part state of the art automatic checkout system connects respectively the respective input of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system; The input end of the output termination digital multimeter module of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system;
The output terminal W0 of described square-wave generator meets the input end I6 of signal router N3; The output terminal W1 of described square-wave generator connects the first dynamic signal acquisition module input through VPC connector the 8th groove, the first universal switch module of described electronics spare part state of the art automatic checkout system successively; The output terminal W2 of described square-wave generator connects the second dynamic signal acquisition module input through VPC connector the 9th groove, the second universal switch module of described electronics spare part state of the art automatic checkout system successively;
The input end I7 of described signal router N3 divides two branch roads, wherein a branch road is successively through VPC connector the 6th groove of described electronics spare part state of the art automatic checkout system, the output terminal that the 3rd intermediate frequency switch module connects the first virtual arbitrary waveform generator module, and another branch road is successively through VPC connector the 7th groove of described electronics spare part state of the art automatic checkout system, the output terminal that the 4th intermediate frequency switch module connects the second virtual arbitrary waveform generator module; The output terminal O5 of described signal router N3 divides two branch roads, wherein a branch road is successively through VPC connector the 4th groove of described electronics spare part state of the art automatic checkout system, the input end that the first intermediate frequency switch module connects the first Digital Oscillograph Module, and another branch road is successively through VPC connector the 5th groove of described electronics spare part state of the art automatic checkout system, the input end that the second intermediate frequency switch module connects the second Digital Oscillograph Module;
The first end of described the first Copper Foil short-circuit line is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and two-way connection of digital I/O module corresponding end of described electronics spare part state of the art automatic checkout system, and the second end of described the first Copper Foil short-circuit line is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and two-way connection of digital I/O module corresponding end of described electronics spare part state of the art automatic checkout system; Described the second Copper Foil short-circuit line first end is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and optics isolation digital input module two-way connection of corresponding end of described electronics spare part state of the art automatic checkout system, and described second Copper Foil short-circuit line the second end is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and optics isolation digital input module two-way connection of corresponding end of described electronics spare part state of the art automatic checkout system;
The first end of described the 3rd Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the H of the CAN1 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The second end of described the 3rd Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the H of the CAN2 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The first end of described the 4th Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the L of the CAN1 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The second end of described the 4th Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the L of the CAN2 of the CAN interface module of described electronics spare part state of the art automatic checkout system;
The first end of described the 5th Copper Foil short-circuit line meets the RS232 serial interface module transmitting terminal TX of described electronics spare part state of the art automatic checkout system through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system, the second end of described the 5th Copper Foil short-circuit line meets the receiving end RX of the RS232 serial interface module of described electronics spare part state of the art automatic checkout system through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system;
The control end of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system, the control end of digital multimeter module, the control end of simulating signal generation module, the control end of multi-functional DAQ module, the control end of the first to second virtual arbitrary waveform generator module, the control end of the first to second Digital Oscillograph Module, the control end of first to fourth intermediate frequency switch module, the control end of first to fourth universal switch module, the control end of the first to second dynamic signal acquisition module, the control of numeral I/O module, the control end of optics isolation digital input module, the control end of the control end of CAN interface module and RS232 serial interface module respectively with two-way connection of controller corresponding port of described electronics spare part state of the art automatic checkout system.
Described adapter also comprises the dedicated test adapter be complementary with tested electronics spare part, the test signal port of described dedicated test adapter is connected with the corresponding port of tested electronics spare part, and the communication port of described dedicated test adapter is connected with the VPC connector.
Described reference source circuit comprises reference source chip U1, amplifier U2, resistance R 1 and capacitor C 1-C2;
Input end 2 pin of described reference source chip U1 are through connect+12V of resistance R 1 direct supply; Output terminal 6 pin of described reference source chip U1 connect in-phase input end 3 pin of amplifier U2; Inverting input 2 pin of described amplifier U2 connect output terminal 1 pin of amplifier U2, the output terminal REF that output terminal 1 pin of described amplifier U2 is reference source circuit;
Described capacitor C 1 is connected between input end 2 pin and ground of reference source chip U1; Described capacitor C 2 is connected between output terminal 6 pin and ground of reference source chip U1; The 4 pin ground connection of described reference source chip U1; Connect+12V of the power end 8 pin direct supply of described amplifier U2; Connect-12V of the power end 4 pin direct supply of described amplifier U2.
Described square-wave generator comprises integrated package U3, crystal oscillator Y1, resistance R 2-R6 and capacitor C 3-C4; 11 pin of described integrated package U3 connect 8 pin of integrated package U3 successively through crystal oscillator Y1, capacitor C 4; Described resistance R 2 is in parallel with crystal oscillator Y1; Described capacitor C 3 is connected between 11 pin and 8 pin of integrated package U3; Described resistance R 3 is connected between 10 pin of the node of crystal oscillator Y1 and capacitor C 2 and integrated package U3; Connect+12V of the 16 pin direct supply of described integrated package U3; 12 pin of described integrated package U3 and the equal ground connection of 8 pin; 4 pin of described integrated package U3 meet the output terminal W0 of square-wave generator through resistance R 4; 5 pin of described integrated package U3 meet the output terminal W1 of square-wave generator through resistance R 5; 6 pin of described integrated package U3 meet the output terminal W2 of square-wave generator through resistance R 6.
Described normalized current source comprises amplifier U4, resistance R 9-R14; Described amplifier U4 comprises U4A unit and U4B unit;
In-phase input end 3 pin of described U4A unit divide two branch roads, and wherein a branch road is through connect+5V of resistance R 13 direct supply, and another branch road connects output terminal 7 pin of U4B unit through resistance R 12; Inverting input 2 pin of described U4A unit divide two branch roads, and wherein a branch road connects output terminal 1 pin of U4A unit through resistance R 10, and another branch road is through resistance R 9 ground connection; Output terminal 1 pin of described U4A unit meets the output terminal COM in described normalized current source successively through resistance R 11, R14;
In-phase input end 5 pin of described U4B unit connect the node of described resistance R 11 and R14; Inverting input 6 pin of described U4B unit connect output terminal 7 pin of U4B unit; Connect+12V of the 8 pin direct supply of described amplifier U4B; Connect-12V of the 4 pin direct supply of described amplifier U4B.
Described signal route N1 comprises U5A unit, capacitor C 5, resistance R 15-R18 and the relay J 1 of amplifier U5; Between described resistance R 15 and be connected on+24V direct supply after resistance R 17 is connected and ground; In-phase input end 3 pin of the U5A unit of described amplifier U5 connect the node of described resistance R 15 and resistance R 17; Described resistance R 16 be connected between the input end I2 and ground of described signal route N1 after resistance R 18 is connected; Inverting input 2 pin of the U5A unit of described amplifier U5 connect the node of described resistance R 16 and resistance R 18; U5A unit connect+24V of the 8 pin direct supply of described amplifier U5; Between described capacitor C 5 be connected on+24V direct supply and ground; 4 pin ground connection of the U5A unit of described amplifier U5;
Between U5A unit output terminal 1 pin of the coil of described relay J 1 be connected on+24V direct supply and described amplifier U5; Swing arm 1 pin of described relay J 1 meets the output terminal O1 of described signal route N1; Swing arm 2 pin of described relay J 1 meet the output terminal O2 of described signal route N1; Stationary contact 3 pin of described relay J 1 meet described signal route N1 input end I2; Moving contact 4 pin of described relay J 1 are unsettled; Stationary contact 5 pin of described electrical equipment J1 meet the input end I1 of described signal route N1; Moving contact 6 pin of described relay J 1 meet the input end I2 of described signal route N1;
Described signal route N2 comprises U5B unit, resistance R 19-R22 and the relay J 2 of amplifier U5; Between described resistance R 19 and be connected on+24V direct supply after resistance R 21 is connected and ground; In-phase input end 5 pin of the U5B unit of described amplifier U5 connect the node of described resistance R 19 and resistance R 21; Described resistance R 20 be connected between the input end I4 and ground of described signal route N2 after resistance R 22 is connected; Inverting input 6 pin of the U5B unit of described amplifier U5 connect the node of described resistance R 20 and resistance R 22;
Between U5B unit output terminal 7 pin of the coil of described relay J 2 be connected on+24V direct supply and described amplifier U5; Swing arm 1 pin of described relay J 2 meets the output terminal O3 of described signal route N2; Swing arm 2 pin of described relay J 2 meet the output terminal O4 of described signal route N2; Stationary contact 3 pin of described relay J 2 are unsettled; The moving contact 4 pin ground connection of described relay J 2; Stationary contact 5 pin of described relay J 2 meet the input end I5 of described signal route N2; Moving contact 6 pin of described relay J 2 meet the input end I6 of described signal route N2.
Described signal route N3 comprises amplifier U6B, resistance R 23-R26, capacitor C 6 and relay J 3; Between described resistance R 23 and be connected on+24V direct supply after resistance R 25 is connected and ground; In-phase input end 5 pin of described amplifier U6B connect the node of described resistance R 23 and resistance R 25; Described resistance R 24 be connected between the input end I7 and ground of described signal route N3 after resistance R 26 is connected; Inverting input 6 pin of described amplifier U6B connect the node of described resistance R 24 and resistance R 26; Connect+24V of the 8 pin direct supply of described amplifier U6B; Between described capacitor C 7 be connected on+24V direct supply and ground; The power end 4 pin ground connection of described amplifier U6B;
Between output terminal 7 pin of the coil of described relay J 3 be connected on+24V direct supply and described amplifier U6B; Swing arm 1 pin of described relay J 3 meets the output terminal O5 of described signal route N3; Swing arm 2 pin of described relay J 3 are unsettled; Stationary contact 3 pin of described relay J 3 are unsettled; Moving contact 4 pin of described relay J 3 meet the input end I6 of described signal route N3; Stationary contact 5 pin of described relay J 3 are unsettled; Moving contact 6 pin of described relay J 3 meet the input end I7 of described signal route N3.
Described PXI module comprises 1 digital I/O module NI PXI-6509, 1 multi-functional DAQ module NI PXI-6259, 1 simulating signal generation module NI PXI-6733, 1 high voltage multiplexer module NI PXI-2527, 1 universal switch module NI PXI-2576, 1 intermediate frequency switch module NI PXI-2593, 1 digitizer/oscillograph module NI PXI-5152, each 1 of virtual arbitrary waveform generator module NI PXI-5441 and NI PXI-5412, 1 digital multimeter module NI PXI-4070, 1 dynamic signal acquisition module NI PXI-4461, 2 interface controller module NI PXI-PCI-8331, 1 RS232 serial interface module NI PXI-8430/4, 1 CAN interface module NI PXI-8511/2 and 3 optics isolation digital input module NI SCXI-1162, described controller is for grinding magnificent IPC-610H industrial computer, described PXI cabinet comprises 14 slot 3U PXI cabinets and with the PXI cabinet of integrated SCXI, the model of described reference source chip U1 is ADR425AR, the model of described amplifier U2 is AD8512AR, the model of described integrated package U3 is CD4060BCM, the model of described amplifier U4 is AD8512AR, the model of described amplifier U5 is LM293, the model of described amplifier U6B is LM293, the model of described relay J 1-J3 is HF4/5-G6K-2P.
The implementation method of the described electronics spare part state of the art automatic checkout system based on the PXI bus is characterized in that:
(1) the automatic checkout system software based on the exploitation of LabVIEW virtual instrument software is housed on described controller;
Described automatic checkout system software comprises test diagnosis system master routine, testing and diagnosing operation platform, detects and diagnose development platform, online help module, System self-test module, system management module, detection diagnostic data library module, test and diagnostic procedure set, detection interface, supplementary information document storehouse; Described test diagnosis system master routine is controlled and is dispatched described testing and diagnosing operation platform, detects diagnosis development platform, online help module, System self-test module, system management module;
Described detection diagnostic data base comprises Detection task database, Fault Diagnosis Database, User Information Database;
Described detection diagnosis operation platform comprises universal measurement subroutine, test assignment execution subroutine, fault diagnosis subroutine and information inquiry subroutine; Described universal measurement subroutine, by calling the use of described detection interface simulation conventional desktop surveying instrument, makes system possess the function of traditional discrete surveying instrument; Described test assignment execution subroutine is for different tested electronics spare parts, in conjunction with the dedicated test adapter, automatically load described detection and diagnostic routine collection according to corresponding document name that in described detection diagnostic data base, the Detection task database provides and file path, described detection and diagnostic routine collection call respective function in described detection interface and complete the state-detection of tested electronics spare part and draw last test result; Described fault diagnosis subroutine is for different tested electronics spare parts, in conjunction with the dedicated test adapter, automatically load described detection and diagnostic routine collection according to corresponding document name and file path that in described detection diagnostic data base, Fault Diagnosis Database provides, described detection and diagnostic routine collection call respective function in described detection interface, in modes such as word, pictures, guide the user to carry out fault detection and location; Described information inquiry module is positioned at the technical information of the electronics spare part in supplementary information document storehouse for inquiry;
Described detection diagnosis development platform comprises test assignment exploitation subroutine, fault diagnosis exploitation subroutine; Described test assignment exploitation subroutine for testing process import and export, testing process description, test interface customization, testing process exploitation, testing process emulation, testing process editor, testing process according to design, by the detected electrons spare part, required information stores in the Detection task database detected in diagnostic data base, generate the dedicated test procedure set, and specify filename and the path of autotest, fault diagnosis data and repair message in described detection diagnostic data base; Described fault diagnosis exploitation subroutine for newly-built, revise and delete electronics spare part fault diagnosis project and information, editor's diagnostic flow chart, the method that electronics spare part fault is got rid of stores in the Fault Diagnosis Database detected in diagnostic data base, generates special-purpose fault diagnostic program collection;
Described system management module is for user authority management, Password Management, record management; Described System self-test module is for carrying out self check to the function of PXI cabinet, each PXI module; Described online help module is for providing the information that is positioned at supplementary information document storehouse " detection diagnosis operation platform utilization instructions " and " detecting diagnosis development platform operation instructions " and system version;
Described detection diagnostic data base is used to described detection diagnosis operation platform that file path and the filename of autotest, fault diagnosis data and the repair message of tested electronics spare part is provided;
The various instrument and equipment Driver Libraries of described detection interface shielding harness bottom, for controlling described system hardware driver; According to the function performance attribute can be divided into by resource distribution class, excitation input class, measure response class and analyzing and processing class totally four large class functions form;
(2) concrete steps of described implementation method are as follows:
Step1: tested electronics spare part circuit analysis;
Step2: distribute and detect resource, design detection method;
Step3: detecting diagnosis developing platform operation interface;
Step4: in detection diagnosis development platform, write testing process;
Step5: connected system self-test adapter and VPC connector, carry out self check to the PXI system;
Step6: described VPC connector is connected with the corresponding interface of dedicated test adapter, and the detection streamer interface of described dedicated test adapter is connected with tested electronics spare part, completes being connected of this detection system and tested electronics spare part.
Detect the concrete steps of diagnosing the operation platform operating software to carry out detection automatically in the implementation method of the described electronics spare part state of the art automatic checkout system based on the PXI bus as follows:
Step6-1: select test assignment;
Step6-2: determine whether to start to carry out test, start if determine, be connected to the detection diagnostic data base, load testing process;
Step6-3: prompting operation step;
Step6-4: call and detect respective function in interface, control the PXI instrument and carry out corresponding operating;
Step6-5: show and detect data;
Step6-6: reach a conclusion.The course of work of the present invention is as follows:
Take communication board as example, the analysis circuit schematic diagram, the communication board main line is divided into:
1. circuit between audio frequency 1+ and audio frequency 2+;
2. circuit between audio frequency 1+ and audio frequency 3+;
3. circuit between audio frequency 2+ and audio frequency 3+;
4. circuit between audio frequency 1+ and audio frequency 1-;
5. circuit between audio frequency 2+ and audio frequency 2-;
6. circuit between audio frequency 3+ and audio frequency 3-;
7. Tel-2 signal input, audio frequency 4+ and 4-signal output apparatus;
8. audio frequency 4+ and the input of audio frequency 4-signal, the Tel-3 signal output apparatus.
Take " circuit between audio frequency 1+ and audio frequency 2+ " be example, detecting step is as follows:
(1) desired signal type and quantity during in conjunction with the circuit theory diagrams analytical electron spare part circuit working principle of tested electronics spare part and work thereof.
Control signal comprises: 74HC245 enable signal, 74HC245 input signal, 74HC373 latch signal (totally 10 road I/O type signals) and audio frequency 1+ input signal (frequency is 1KHZ, the sine wave signal that peak-to-peak value is 1V).
Collection signal comprises: audio frequency 2+ output signal (waveform signal corresponding with audio frequency 1+).
(2) distribute and detect resource, design detection method
According to the circuit analysis result of tested electronics spare part, for Detection task distributes the board resource and designs detection method, take " circuit between audio frequency 1+ and audio frequency 2+ " be example, allocation result is as follows:
1) utilize I/O class board 10 paths to provide the I/O pumping signal for the latch signal that 74HC245 Enable Pin, 74HC245 input end, 74HC373 latch end.
2) utilizing the signal source card is 1KHZ for audio frequency 1+ incoming frequency, the sine wave signal that peak-to-peak value is 1V.
3) audio frequency 2+ output signal is linked into to the oscillograph card and completes waveform acquisition.
(3) detect interface
The test assignment exploitation subroutine that detects the diagnosis development platform according to information utilizations such as Detection task title, resource type, board detection position, judgements as a result designs friendly graphic interface, and the interface information designed is saved in the Detection task database that detects diagnostic data base, be convenient to testing result and user interactions.
(4) testing process is write
The test assignment exploitation subroutine that the information utilizations such as testing process order, board resource information, signal input/output state, operation indicating content is detected to the diagnosis development platform according to the detection method designed is write the Detection task flow process, and is saved in the Detection task database that detects diagnostic data base.
(5) the own self check of system
Described VPC connector is connected with the System self-test adapter, the operation automatic testing software, to being that the performance of PXI system itself is detected, detect PXI cabinet and PXI module, guarantee that system main hardware equipment is in normal operating conditions when start detection diagnosis operation platform.
(6) connect the dedicated test adapter, start automatically to detect
Described VPC connector is connected with the corresponding interface of dedicated test adapter, and the detection streamer interface of described dedicated test adapter is connected with tested electronics spare part.Complete being connected of this detection system and tested electronics spare part.
Utilize the test assignment execution subroutine that detects the diagnosis operation platform to complete Detection task and automatically detect, and generate testing result.
The concrete manner of execution of the present invention and principle of work are described below:
Operation detects the test assignment execution subroutine of diagnosis operation platform.
Select " circuit between audio frequency 1+ and audio frequency 2+ " Detection task, open and carry out.
Test assignment execution subroutine module detects the Detection task database of diagnostic data base and load testing process and each node job information of specifying Detection task from the Detection task database from being dynamically connected, form flow process element chained list.
Carry out the defined function of each element in flow process element chained list, the operation detection interface, complete the Detection task measuring ability by the input of hardware Labcard driver programmed control PXI board, output signal.
Testing result drawn after Treatment Analysis to test result and be shown on the Detection task interface.
The specific works process of described self-test adapter is as follows:
Described digital multimeter module NI PXI-4070 gathers the output signal in normalized current source, and whether checking digital multimeter module NI PXI-4070 measures function of current normal.If it is consistent with the current value of normalized current source circuit output that the display be connected with controller shows numeral, digital multimeter module NI PXI-4070 measurement function of current is normal; Otherwise display shows digital multimeter module NI PXI-4070 measuring resistance fault.
Described digital multimeter module NI PXI-4070 gathers described measuring resistance R resistance, and whether checking digital multimeter module NI PXI-4070 measuring resistance function is normal.If it is consistent with the resistance of measuring resistance R that the display be connected with controller shows numeral, digital multimeter module NI PXI-4070 measuring resistance function is normal; Otherwise display shows that digital multimeter module NI PXI-4070 measures current failure.
Described digital multimeter module NI PXI-4070 gathers described reference source generative circuit generation+5V voltage signal, and whether checking digital multimeter module NI PXI-4070 measuring voltage function is normal.If the display be connected with controller shows that numeral and the generation of reference source generative circuit+the 5V voltage signal values is consistent, digital multimeter module NI PXI-4070 measuring voltage function is normal; Otherwise display shows digital multimeter module NI PXI-4070 measuring voltage fault.
Described digital multimeter module NI PXI-4070 gathers described simulating signal generation module NI PXI-6723(DA card) voltage signal of output, checking simulating signal generation module NI PXI-6723(DA card) whether the output voltage function normal.If display displayed value and simulating signal generation module NI PXI-6723(DA card) voltage signal values of output is consistent, simulating signal generation module NI PXI-6723(DA card) the output voltage function is normal; Otherwise, display display simulation signal generating module NI PXI-6723(DA card) and the output voltage functional fault.
Described multi-functional DAQ module NI PXI-6259(AD card) gather that the reference source generative circuit produces+the 5V voltage signal, verify multi-functional DAQ module NI PXI-6259(AD card) whether function normal.If the display be connected with controller shows numeral and is+5V, multi-functional DAQ module NI PXI-6259(AD card) normal; Otherwise display shows multi-functional DAQ module NI PXI-6259(AD card) the measurement fault.
If described multi-functional DAQ module NI PXI-6259(AD card) normal, by simulating signal generation module NI PXI-6723(DA card) signal output to multi-functional DAQ module NI PXI-6259(AD card), checking simulating signal generation module NI PXI-6723(DA card) whether function normal.If the display be connected with controller shows numeral and simulating signal generation module NI PXI-6723(DA card) output valve is consistent, multi-functional DAQ module NI PXI-6259(AD card) normal; Otherwise display shows multi-functional DAQ module NI PXI-6259(AD card) the measurement fault.
Described oscillograph module NI PXI-5152-1 gathers the output terminal WAVE0 signal (square wave of 4kHz) of described square wave generative circuit, and whether checking oscillograph module NI PXI-5152-1 function is normal.If the waveform that the display be connected with controller shows and the output terminal WAVE0 signal (square wave of 4kHz) of square wave generative circuit are consistent, oscillograph module NI PXI-5152-1 is normal; Otherwise display shows oscillograph module NI PXI-5152-1 fault.
Described oscillograph module NI PXI-5152-1 gathers described virtual arbitrary waveform generator module NI PXI-5412 output signal, and whether checking virtual arbitrary waveform generator module NI PXI-5412 function is normal.If the waveform of the waveform that the display be connected with controller shows and virtual arbitrary waveform generator module NI PXI-5412 output is consistent, virtual arbitrary waveform generator module NI PXI-5412 is normal; Otherwise display shows virtual arbitrary waveform generator module NI PXI-5412 fault.
Described oscillograph module NI PXI-5152-1 gathers described virtual arbitrary waveform generator module NI PXI-5441 output signal, and whether checking virtual arbitrary waveform generator module NI PXI-5441 function is normal.If the waveform of the waveform that the display be connected with controller shows and virtual arbitrary waveform generator module NI PXI-5441 output is consistent, virtual arbitrary waveform generator module NI PXI-5441 is normal; Otherwise display shows virtual arbitrary waveform generator module NI PXI-5441 fault.
Described oscillograph module NI PXI-5152-2 gathers the output terminal WAVE0 signal (square wave of 4kHz) of described square wave generative circuit, and whether checking oscillograph module NI PXI-5152-2 function is normal.If the waveform that the display be connected with controller shows and the output terminal WAVE0 signal (square wave of 4kHz) of square wave generative circuit are consistent, oscillograph module NI PXI-5152-2 is normal; Otherwise display shows oscillograph module NI PXI-5152-2 fault.
Described oscillograph module NI PXI-5152-2 gathers described virtual arbitrary waveform generator module NI PXI-5412 output signal, and whether checking oscillograph module NI PXI-5152-2 function is normal.If the waveform that the display be connected with controller shows and the waveform of virtual arbitrary waveform generator module NI PXI-5412 output signal are consistent, oscillograph module NI PXI-5152-2 is normal; Otherwise display shows oscillograph module NI PXI-5152-2 fault.
Described oscillograph module NI PXI-5152-2 gathers described virtual arbitrary waveform generator module NI PXI-5441 output signal, and whether checking oscillograph module NI PXI-5152-2 function is normal.If the waveform that the display be connected with controller shows and the waveform of virtual arbitrary waveform generator module NI PXI-5441 output signal are consistent, oscillograph module NI PXI-5152-2 is normal; Otherwise, display newspaper oscillograph module NI PXI-5152-2 fault.
Describedly meet the output signal WAVE1 that dynamic signal acquisition module NI PXI-4461-1 gathers described square wave generative circuit, whether checking connects dynamic signal acquisition module NI PXI-4461-1 function normal.If the waveform of the waveform that the display be connected with controller shows and the output signal WAVE1 of described square wave generative circuit is consistent, dynamic signal acquisition module NI PXI-4461-1 is normal; Otherwise, display newspaper dynamic signal acquisition module NI PXI-4461-1 fault.
Describedly meet the output signal WAVE2 that dynamic signal acquisition module NI PXI-4461-2 gathers described square wave generative circuit, whether checking connects dynamic signal acquisition module NI PXI-4461-2 function normal.If the waveform of the waveform that the display be connected with controller shows and the output signal WAVE2 of described square wave generative circuit is consistent, dynamic signal acquisition module NI PXI-4461-2 is normal; Otherwise, display newspaper dynamic signal acquisition module NI PXI-4461-2 fault.
Described digital I/O module NI PXI-6509, multi-functional DAQ module NI PXI-6259, simulating signal generation module NI PXI-6723, high voltage multiplexer module NI PXI-2527, universal switch module NI PXI-2576, intermediate frequency switch module NI PXI-2593, digitizer/oscillograph module NI PXI-5152, virtual arbitrary waveform generator module NI PXI-5441, virtual arbitrary waveform generator module NI PXI-5412, digital multimeter module NI PXI-4070, dynamic signal acquisition module NI PXI-4461, RS232 serial interface module NI PXI-8430, CAN interface module NI PXI-8511, optics isolation digital input module NI SCXI-1162 is the automatic checkout system software control in controlled device all.
Take 6509 as example, one of them passage of 6509 is made as to output, output high level or low level, another passage is made as input, and gather the low and high level signal of output channel output, and compare with it, if consistent explanation is normal, otherwise the explanation fault.If, after normal, change the passage that is made as output into input, change the passage that is made as input into output, again gather relatively, if consistent explanation is normal, otherwise the explanation fault.
Serial ports 8430 courses of work: by the sending and receiving short circuit of serial ports, internal loopback.Whether send a string data, observe after receiving and the data consistent sent, if unanimously be qualified, otherwise be fault.
CAN card 8511 courses of work: by the CANH short circuit of CAN1 and CAN2, the CANL short circuit, CAN1 sends a string data, and CAN2 receives data, observes consistent that whether data receive send with CAN1, if unanimously be qualified, otherwise is fault.

Claims (10)

1. the electronics spare part state of the art automatic checkout system based on the PXI bus, is characterized in that comprising controller, PXI system, VPC connector, adapter, the keyboard be connected with controller, display that automatic checkout system software is installed; Described PXI system is comprised of PXI cabinet and the PXI module that inserts in respectively associated socket in the PXI cabinet more than 2; Described adapter comprises the System self-test adapter; Described controller is connected by the PXI bus with the PXI cabinet; The signal end of described each PXI module is connected with self-test adapter through the VPC connector;
Described System self-test adapter comprises normalized current source, measuring resistance R, reference source circuit, square-wave generator, signal router N1-N3 and the first to the 5th Copper Foil short-circuit line;
The output terminal COM in described normalized current source connects VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The input end I1 of the D1 termination signal router N1 of described measuring resistance R, the output terminal O4 of the D2 termination signal router N2 of described measuring resistance R; The output terminal REF of described reference source circuit connects respectively the input end I5 of signal router N2 and VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The input end I2 of described signal router N1 meets the input end I4 of signal router N2, connects the simulating signal generation module output terminal of described electronics spare part state of the art automatic checkout system through VPC connector the 2nd groove of described electronics spare part state of the art automatic checkout system simultaneously; The output terminal O1 of described signal router N1 connects VPC connector the 1st groove respective input of described electronics spare part state of the art automatic checkout system; The output terminal O2 of described signal router N1 meets the input end I3 of described signal router N2; The output terminal O3 of described signal router N2 connects the multi-functional DAQ module of described electronics spare part state of the art automatic checkout system through VPC connector the 3rd groove of described electronics spare part state of the art automatic checkout system; VPC connector the 1st groove output terminal of described electronics spare part state of the art automatic checkout system connects respectively the respective input of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system; The input end of the output termination digital multimeter module of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system;
The output terminal W0 of described square-wave generator meets the input end I6 of signal router N3; The output terminal W1 of described square-wave generator connects the first dynamic signal acquisition module input through VPC connector the 8th groove, the first universal switch module of described electronics spare part state of the art automatic checkout system successively; The output terminal W2 of described square-wave generator connects the second dynamic signal acquisition module input through VPC connector the 9th groove, the second universal switch module of described electronics spare part state of the art automatic checkout system successively;
The input end I7 of described signal router N3 divides two branch roads, wherein a branch road is successively through VPC connector the 6th groove of described electronics spare part state of the art automatic checkout system, the output terminal that the 3rd intermediate frequency switch module connects the first virtual arbitrary waveform generator module, and another branch road is successively through VPC connector the 7th groove of described electronics spare part state of the art automatic checkout system, the output terminal that the 4th intermediate frequency switch module connects the second virtual arbitrary waveform generator module; The output terminal O5 of described signal router N3 divides two branch roads, wherein a branch road is successively through VPC connector the 4th groove of described electronics spare part state of the art automatic checkout system, the input end that the first intermediate frequency switch module connects the first Digital Oscillograph Module, and another branch road is successively through VPC connector the 5th groove of described electronics spare part state of the art automatic checkout system, the input end that the second intermediate frequency switch module connects the second Digital Oscillograph Module;
The first end of described the first Copper Foil short-circuit line is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and two-way connection of digital I/O module corresponding end of described electronics spare part state of the art automatic checkout system, and the second end of described the first Copper Foil short-circuit line is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and two-way connection of digital I/O module corresponding end of described electronics spare part state of the art automatic checkout system; Described the second Copper Foil short-circuit line first end is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and optics isolation digital input module two-way connection of corresponding end of described electronics spare part state of the art automatic checkout system, and described second Copper Foil short-circuit line the second end is through VPC connector the 10th groove of described electronics spare part state of the art automatic checkout system and optics isolation digital input module two-way connection of corresponding end of described electronics spare part state of the art automatic checkout system;
The first end of described the 3rd Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the H of the CAN1 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The second end of described the 3rd Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the H of the CAN2 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The first end of described the 4th Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the L of the CAN1 of the CAN interface module of described electronics spare part state of the art automatic checkout system; The second end of described the 4th Copper Foil short-circuit line is held two-way the connection through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system with the L of the CAN2 of the CAN interface module of described electronics spare part state of the art automatic checkout system;
The first end of described the 5th Copper Foil short-circuit line meets the RS232 serial interface module transmitting terminal TX of described electronics spare part state of the art automatic checkout system through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system, the second end of described the 5th Copper Foil short-circuit line meets the receiving end RX of the RS232 serial interface module of described electronics spare part state of the art automatic checkout system through VPC connector the 11st groove of described electronics spare part state of the art automatic checkout system;
The control end of the high voltage multiplexer module of described electronics spare part state of the art automatic checkout system, the control end of digital multimeter module, the control end of simulating signal generation module, the control end of multi-functional DAQ module, the control end of the first to second virtual arbitrary waveform generator module, the control end of the first to second Digital Oscillograph Module, the control end of first to fourth intermediate frequency switch module, the control end of first to fourth universal switch module, the control end of the first to second dynamic signal acquisition module, the control of numeral I/O module, the control end of optics isolation digital input module, the control end of the control end of CAN interface module and RS232 serial interface module respectively with two-way connection of controller corresponding port of described electronics spare part state of the art automatic checkout system.
2. the electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 1, it is characterized in that described adapter also comprises the dedicated test adapter be complementary with tested electronics spare part, the test signal port of described dedicated test adapter is connected with the corresponding port of tested electronics spare part, and the communication port of described dedicated test adapter is connected with the VPC connector.
3. a kind of electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 1, it is characterized in that: described reference source circuit comprises reference source chip U1, amplifier U2, resistance R 1 and capacitor C 1-C2;
Input end 2 pin of described reference source chip U1 are through connect+12V of resistance R 1 direct supply; Output terminal 6 pin of described reference source chip U1 connect in-phase input end 3 pin of amplifier U2; Inverting input 2 pin of described amplifier U2 connect output terminal 1 pin of amplifier U2, the output terminal REF that output terminal 1 pin of described amplifier U2 is reference source circuit;
Described capacitor C 1 is connected between input end 2 pin and ground of reference source chip U1; Described capacitor C 2 is connected between output terminal 6 pin and ground of reference source chip U1; The 4 pin ground connection of described reference source chip U1; Connect+12V of the power end 8 pin direct supply of described amplifier U2; Connect-12V of the power end 4 pin direct supply of described amplifier U2.
4. a kind of electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 3, it is characterized in that: described square-wave generator comprises integrated package U3, crystal oscillator Y1, resistance R 2-R6 and capacitor C 3-C4; 11 pin of described integrated package U3 connect 8 pin of integrated package U3 successively through crystal oscillator Y1, capacitor C 4; Described resistance R 2 is in parallel with crystal oscillator Y1; Described capacitor C 3 is connected between 11 pin and 8 pin of integrated package U3; Described resistance R 3 is connected between 10 pin of the node of crystal oscillator Y1 and capacitor C 2 and integrated package U3; Connect+12V of the 16 pin direct supply of described integrated package U3; 12 pin of described integrated package U3 and the equal ground connection of 8 pin; 4 pin of described integrated package U3 meet the output terminal W0 of square-wave generator through resistance R 4; 5 pin of described integrated package U3 meet the output terminal W1 of square-wave generator through resistance R 5; 6 pin of described integrated package U3 meet the output terminal W2 of square-wave generator through resistance R 6.
5. a kind of electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 4, it is characterized in that: described normalized current source comprises amplifier U4, resistance R 9-R14; Described amplifier U4 comprises U4A unit and U4B unit;
In-phase input end 3 pin of described U4A unit divide two branch roads, and wherein a branch road is through connect+5V of resistance R 13 direct supply, and another branch road connects output terminal 7 pin of U4B unit through resistance R 12; Inverting input 2 pin of described U4A unit divide two branch roads, and wherein a branch road connects output terminal 1 pin of U4A unit through resistance R 10, and another branch road is through resistance R 9 ground connection; Output terminal 1 pin of described U4A unit meets the output terminal COM in described normalized current source successively through resistance R 11, R14;
In-phase input end 5 pin of described U4B unit connect the node of described resistance R 11 and R14; Inverting input 6 pin of described U4B unit connect output terminal 7 pin of U4B unit; Connect+12V of the 8 pin direct supply of described amplifier U4B; Connect-12V of the 4 pin direct supply of described amplifier U4B.
6. a kind of electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 5, it is characterized in that: described signal route N1 comprises U5A unit, capacitor C 5, resistance R 15-R18 and the relay J 1 of amplifier U5; Between described resistance R 15 and be connected on+24V direct supply after resistance R 17 is connected and ground; In-phase input end 3 pin of the U5A unit of described amplifier U5 connect the node of described resistance R 15 and resistance R 17; Described resistance R 16 be connected between the input end I2 and ground of described signal route N1 after resistance R 18 is connected; Inverting input 2 pin of the U5A unit of described amplifier U5 connect the node of described resistance R 16 and resistance R 18; U5A unit connect+24V of the 8 pin direct supply of described amplifier U5; Between described capacitor C 5 be connected on+24V direct supply and ground; 4 pin ground connection of the U5A unit of described amplifier U5;
Between U5A unit output terminal 1 pin of the coil of described relay J 1 be connected on+24V direct supply and described amplifier U5; Swing arm 1 pin of described relay J 1 meets the output terminal O1 of described signal route N1; Swing arm 2 pin of described relay J 1 meet the output terminal O2 of described signal route N1; Stationary contact 3 pin of described relay J 1 meet described signal route N1 input end I2; Moving contact 4 pin of described relay J 1 are unsettled; Stationary contact 5 pin of described electrical equipment J1 meet the input end I1 of described signal route N1; Moving contact 6 pin of described relay J 1 meet the input end I2 of described signal route N1;
Described signal route N2 comprises U5B unit, resistance R 19-R22 and the relay J 2 of amplifier U5; Between described resistance R 19 and be connected on+24V direct supply after resistance R 21 is connected and ground; In-phase input end 5 pin of the U5B unit of described amplifier U5 connect the node of described resistance R 19 and resistance R 21; Described resistance R 20 be connected between the input end I4 and ground of described signal route N2 after resistance R 22 is connected; Inverting input 6 pin of the U5B unit of described amplifier U5 connect the node of described resistance R 20 and resistance R 22;
Between U5B unit output terminal 7 pin of the coil of described relay J 2 be connected on+24V direct supply and described amplifier U5; Swing arm 1 pin of described relay J 2 meets the output terminal O3 of described signal route N2; Swing arm 2 pin of described relay J 2 meet the output terminal O4 of described signal route N2; Stationary contact 3 pin of described relay J 2 are unsettled; The moving contact 4 pin ground connection of described relay J 2; Stationary contact 5 pin of described relay J 2 meet the input end I5 of described signal route N2; Moving contact 6 pin of described relay J 2 meet the input end I6 of described signal route N2.
7. a kind of electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 6, it is characterized in that: described signal route N3 comprises amplifier U6B, resistance R 23-R26, capacitor C 6 and relay J 3; Between described resistance R 23 and be connected on+24V direct supply after resistance R 25 is connected and ground; In-phase input end 5 pin of described amplifier U6B connect the node of described resistance R 23 and resistance R 25; Described resistance R 24 be connected between the input end I7 and ground of described signal route N3 after resistance R 26 is connected; Inverting input 6 pin of described amplifier U6B connect the node of described resistance R 24 and resistance R 26; Connect+24V of the 8 pin direct supply of described amplifier U6B; Between described capacitor C 7 be connected on+24V direct supply and ground; The power end 4 pin ground connection of described amplifier U6B;
Between output terminal 7 pin of the coil of described relay J 3 be connected on+24V direct supply and described amplifier U6B; Swing arm 1 pin of described relay J 3 meets the output terminal O5 of described signal route N3; Swing arm 2 pin of described relay J 3 are unsettled; Stationary contact 3 pin of described relay J 3 are unsettled; Moving contact 4 pin of described relay J 3 meet the input end I6 of described signal route N3; Stationary contact 5 pin of described relay J 3 are unsettled; Moving contact 6 pin of described relay J 3 meet the input end I7 of described signal route N3.
8. a kind of electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 7, it is characterized in that: described PXI module comprises 1 digital I/O module NI PXI-6509, 1 multi-functional DAQ module NI PXI-6259, 1 simulating signal generation module NI PXI-6733, 1 high voltage multiplexer module NI PXI-2527, 1 universal switch module NI PXI-2576, 1 intermediate frequency switch module NI PXI-2593, 1 digitizer/oscillograph module NI PXI-5152, each 1 of virtual arbitrary waveform generator module NI PXI-5441 and NI PXI-5412, 1 digital multimeter module NI PXI-4070, 1 dynamic signal acquisition module NI PXI-4461, 2 interface controller module NI PXI-PCI-8331, 1 RS232 serial interface module NI PXI-8430/4, 1 CAN interface module NI PXI-8511/2 and 3 optics isolation digital input module NI SCXI-1162, described controller is for grinding magnificent IPC-610H industrial computer, described PXI cabinet comprises 14 slot 3U PXI cabinets and with the PXI cabinet of integrated SCXI, the model of described reference source chip U1 is ADR425AR, the model of described amplifier U2 is AD8512AR, the model of described integrated package U3 is CD4060BCM, the model of described amplifier U4 is AD8512AR, the model of described amplifier U5 is LM293, the model of described amplifier U6B is LM293, the model of described relay J 1-J3 is HF4/5-G6K-2P.
9. the implementation method of the electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 1 is characterized in that:
(1) the automatic checkout system software based on the exploitation of LabVIEW virtual instrument software is housed on described controller;
Described automatic checkout system software comprises test diagnosis system master routine, testing and diagnosing operation platform, detects and diagnose development platform, online help module, System self-test module, system management module, detection diagnostic data library module, test and diagnostic procedure set, detection interface, supplementary information document storehouse; Described test diagnosis system master routine is controlled and is dispatched described testing and diagnosing operation platform, detects diagnosis development platform, online help module, System self-test module, system management module;
Described detection diagnostic data base comprises Detection task database, Fault Diagnosis Database, User Information Database;
Described detection diagnosis operation platform comprises universal measurement subroutine, test assignment execution subroutine, fault diagnosis subroutine and information inquiry subroutine; Described universal measurement subroutine, by calling the use of described detection interface simulation conventional desktop surveying instrument, makes system possess the function of traditional discrete surveying instrument; Described test assignment execution subroutine is for different tested electronics spare parts, in conjunction with the dedicated test adapter, automatically load described detection and diagnostic routine collection according to corresponding document name that in described detection diagnostic data base, the Detection task database provides and file path, described detection and diagnostic routine collection call respective function in described detection interface and complete the state-detection of tested electronics spare part and draw last test result; Described fault diagnosis subroutine is for different tested electronics spare parts, in conjunction with the dedicated test adapter, automatically load described detection and diagnostic routine collection according to corresponding document name and file path that in described detection diagnostic data base, Fault Diagnosis Database provides, described detection and diagnostic routine collection call respective function in described detection interface, in modes such as word, pictures, guide the user to carry out fault detection and location; Described information inquiry module is positioned at the technical information of the electronics spare part in supplementary information document storehouse for inquiry;
Described detection diagnosis development platform comprises test assignment exploitation subroutine, fault diagnosis exploitation subroutine; Described test assignment exploitation subroutine for testing process import and export, testing process description, test interface customization, testing process exploitation, testing process emulation, testing process editor, testing process according to design, by the detected electrons spare part, required information stores in the Detection task database detected in diagnostic data base, generate the dedicated test procedure set, and specify filename and the path of autotest, fault diagnosis data and repair message in described detection diagnostic data base; Described fault diagnosis exploitation subroutine for newly-built, revise and delete electronics spare part fault diagnosis project and information, editor's diagnostic flow chart, the method that electronics spare part fault is got rid of stores in the Fault Diagnosis Database detected in diagnostic data base, generates special-purpose fault diagnostic program collection;
Described system management module is for user authority management, Password Management, record management; Described System self-test module is for carrying out self check to the function of PXI cabinet, each PXI module; Described online help module is for providing the information that is positioned at supplementary information document storehouse " detection diagnosis operation platform utilization instructions " and " detecting diagnosis development platform operation instructions " and system version;
Described detection diagnostic data base is used to described detection diagnosis operation platform that file path and the filename of autotest, fault diagnosis data and the repair message of tested electronics spare part is provided;
The various instrument and equipment Driver Libraries of described detection interface shielding harness bottom, for controlling described system hardware driver; According to the function performance attribute can be divided into by resource distribution class, excitation input class, measure response class and analyzing and processing class totally four large class functions form;
(2) concrete steps of described implementation method are as follows:
Step1: tested electronics spare part circuit analysis;
Step2: distribute and detect resource, design detection method;
Step3: detecting diagnosis developing platform operation interface;
Step4: in detection diagnosis development platform, write testing process;
Step5: connected system self-test adapter and VPC connector, carry out self check to the PXI system;
Step6: described VPC connector is connected with the corresponding interface of dedicated test adapter, and the detection streamer interface of described dedicated test adapter is connected with tested electronics spare part, completes being connected of this detection system and tested electronics spare part.
10. the implementation method of the electronics spare part state of the art automatic checkout system based on the PXI bus according to claim 9 is characterized in that described detection diagnosis operation platform operating software carries out the concrete steps that automatically detect as follows:
Step6-1: select test assignment;
Step6-2: determine whether to start to carry out test, start if determine, be connected to the detection diagnostic data base, load testing process;
Step6-3: prompting operation step;
Step6-4: call and detect respective function in interface, control the PXI instrument and carry out corresponding operating;
Step6-5: show and detect data;
Step6-6: reach a conclusion.
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Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103697928A (en) * 2013-12-25 2014-04-02 北京航天测控技术有限公司 Instrument calibration method and device
CN104133139A (en) * 2014-07-30 2014-11-05 成都天奥测控技术有限公司 Multifunctional PXI module integration testing instrument and testing method thereof
CN104280638A (en) * 2014-10-14 2015-01-14 成都天奥测控技术有限公司 Multifunctional synchronous testing device
CN104764944A (en) * 2014-12-12 2015-07-08 陕西海泰电子有限责任公司 Portable multifunctional tester integrated with display screen
CN106872828A (en) * 2017-03-16 2017-06-20 中国人民解放军军械工程学院 The portable device for fast detecting of vehicle the synthetical electronics information system
CN107064781A (en) * 2017-06-26 2017-08-18 北方电子研究院安徽有限公司 A kind of simple resistor network automatic test approach
CN107526020A (en) * 2017-07-24 2017-12-29 清华大学 A kind of automatic checkout system of the acoustic logging signal acquisition circuit based on SoC
CN108732443A (en) * 2018-05-21 2018-11-02 湖北三江航天万峰科技发展有限公司 A kind of Auto-Test System and method based on Linux
CN108776295A (en) * 2018-06-06 2018-11-09 北京中航科电测控技术股份有限公司 A kind of efficient ETAP automatization test systems
CN109188249A (en) * 2018-09-27 2019-01-11 国核自仪系统工程有限公司 Nuclear power station security level I&C system board automatic testing equipment
CN109298317A (en) * 2018-10-13 2019-02-01 国营芜湖机械厂 A kind of Intelligent test device and its test method of middle low-frequency channel
CN109379262A (en) * 2018-09-30 2019-02-22 天津市英贝特航天科技有限公司 A kind of the double-redundancy CAN bus communication card and method of PCIe interface
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CN110989754A (en) * 2019-11-26 2020-04-10 北京振兴计量测试研究所 High-voltage signal generating device based on PXI bus
CN112798036A (en) * 2021-04-13 2021-05-14 立臻科技(昆山)有限公司 Testing device based on short circuit triggering and in-place detection method
CN116182929A (en) * 2023-03-27 2023-05-30 中国人民解放军32181部队 Metering adapter of motor-driven calibration vehicle

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
CN201072597Y (en) * 2007-07-06 2008-06-11 上海凯迪克航空工程技术有限公司 Automatic detection instrument for aviation electronic flight instrument
CN101354420A (en) * 2008-09-10 2009-01-28 天津大学 System for detecting programmed control distance-changing accidental resonance square wave
CN102147619A (en) * 2011-03-02 2011-08-10 天津清源电动车辆有限责任公司 Virtual instrument-based motor control automatic testing system and method for electric automobile

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
CN201072597Y (en) * 2007-07-06 2008-06-11 上海凯迪克航空工程技术有限公司 Automatic detection instrument for aviation electronic flight instrument
CN101354420A (en) * 2008-09-10 2009-01-28 天津大学 System for detecting programmed control distance-changing accidental resonance square wave
CN102147619A (en) * 2011-03-02 2011-08-10 天津清源电动车辆有限责任公司 Virtual instrument-based motor control automatic testing system and method for electric automobile

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
冯锡智等: "基于VXI总线的通用自动测试系统", 《火力与指挥控制》 *
扶碧波: "基于PXI虚拟仪器测试诊断系统", 《电子测量技术》 *

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