CN103454289A - 用于x射线探测和成像系统的双镜式探测光学部件 - Google Patents
用于x射线探测和成像系统的双镜式探测光学部件 Download PDFInfo
- Publication number
- CN103454289A CN103454289A CN2013103606377A CN201310360637A CN103454289A CN 103454289 A CN103454289 A CN 103454289A CN 2013103606377 A CN2013103606377 A CN 2013103606377A CN 201310360637 A CN201310360637 A CN 201310360637A CN 103454289 A CN103454289 A CN 103454289A
- Authority
- CN
- China
- Prior art keywords
- ray
- combination refractor
- bimirror
- refractor
- connection type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310360637.7A CN103454289B (zh) | 2013-08-19 | 2013-08-19 | 用于x射线探测和成像系统的双镜式探测光学部件 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310360637.7A CN103454289B (zh) | 2013-08-19 | 2013-08-19 | 用于x射线探测和成像系统的双镜式探测光学部件 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103454289A true CN103454289A (zh) | 2013-12-18 |
CN103454289B CN103454289B (zh) | 2015-08-19 |
Family
ID=49736895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310360637.7A Active CN103454289B (zh) | 2013-08-19 | 2013-08-19 | 用于x射线探测和成像系统的双镜式探测光学部件 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN103454289B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108417288A (zh) * | 2018-04-23 | 2018-08-17 | 浙江工业大学 | 一种微型化x射线阵列组合折射透镜集成组件的制作方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52115682A (en) * | 1976-03-24 | 1977-09-28 | Jeol Ltd | X-ray radiographic image taking apparatus |
US5351278A (en) * | 1992-03-09 | 1994-09-27 | Hitachi, Ltd. | X-ray tomography method and apparatus thereof |
WO2005018415A2 (en) * | 2003-08-20 | 2005-03-03 | Varian Medical Systems, Inc. | X-ray imaging system with automatic image resolution enhancement |
WO2011032210A1 (en) * | 2009-09-16 | 2011-03-24 | Monash University | Particle image velocimetry suitable for x-ray projection imaging |
CN203405424U (zh) * | 2013-08-19 | 2014-01-22 | 浙江工业大学 | 用于x射线探测和成像系统的双镜式探测光学部件 |
-
2013
- 2013-08-19 CN CN201310360637.7A patent/CN103454289B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52115682A (en) * | 1976-03-24 | 1977-09-28 | Jeol Ltd | X-ray radiographic image taking apparatus |
US5351278A (en) * | 1992-03-09 | 1994-09-27 | Hitachi, Ltd. | X-ray tomography method and apparatus thereof |
WO2005018415A2 (en) * | 2003-08-20 | 2005-03-03 | Varian Medical Systems, Inc. | X-ray imaging system with automatic image resolution enhancement |
WO2011032210A1 (en) * | 2009-09-16 | 2011-03-24 | Monash University | Particle image velocimetry suitable for x-ray projection imaging |
CN203405424U (zh) * | 2013-08-19 | 2014-01-22 | 浙江工业大学 | 用于x射线探测和成像系统的双镜式探测光学部件 |
Non-Patent Citations (2)
Title |
---|
乐孜纯等: "X射线长组合折射透镜的理论和实验研究", 《光学学报》, vol. 30, no. 9, 30 September 2010 (2010-09-30) * |
梁静秋等: "折射型X射线组合透镜研制进展", 《核技术》, vol. 31, no. 3, 31 March 2008 (2008-03-31) * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108417288A (zh) * | 2018-04-23 | 2018-08-17 | 浙江工业大学 | 一种微型化x射线阵列组合折射透镜集成组件的制作方法 |
Also Published As
Publication number | Publication date |
---|---|
CN103454289B (zh) | 2015-08-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR20050010835A (ko) | 대역 판을 포함하는 다중 영상화 시스템을 사용하는 원소특이성 x-선 형광 현미경 | |
US8699663B2 (en) | X-ray image photographing method and X-ray image photographing apparatus | |
JP5116014B2 (ja) | 小角広角x線測定装置 | |
JP3914052B2 (ja) | レーザー生成プラズマについての光学放出分光測定による元素分析装置 | |
CN103234987A (zh) | 一种时间分辨的多色单能x射线成像谱仪 | |
Gresil et al. | EVITA Project: Comparison between traditional non-destructive techniques and phase contrast X-ray imaging applied to aerospace carbon fibre reinforced polymer | |
Schroer et al. | PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III: interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector | |
CN108169790A (zh) | 一种掠入射x射线显微镜的强度标定方法 | |
Thiel et al. | Production of intense micrometer‐sized x‐ray beams with tapered glass monocapillaries | |
CN103021497A (zh) | 放射透镜 | |
Bjeoumikhov et al. | Capillary Optics in X‐Ray Analytics | |
CN103454290B (zh) | 一种x射线探测和成像系统的双镜式探测分析方法 | |
EP3161410B1 (de) | Messvorrichtung und verfahren zur vermessung von prüfobjekten | |
CN203405424U (zh) | 用于x射线探测和成像系统的双镜式探测光学部件 | |
CN103454289B (zh) | 用于x射线探测和成像系统的双镜式探测光学部件 | |
Kwon et al. | Precise measurement of inner diameter of mono-capillary optic using X-ray imaging technique | |
CN208188021U (zh) | 基于x射线阵列组合折射透镜的微束x射线荧光分析系统 | |
CN103454068B (zh) | 基于ccd探测的x射线组合折射透镜聚焦性能测试装置 | |
CN203587321U (zh) | 基于ccd探测的x射线组合折射透镜聚焦性能测试装置 | |
CN108459037B (zh) | 基于x射线阵列组合折射透镜的微束x射线荧光分析方法 | |
Kachatkou et al. | On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors | |
Kalbfleisch | A dedicated endstation for waveguide-based x-ray imaging | |
EP3845892B1 (en) | X-ray scattering apparatus | |
Li et al. | Energy-dispersive small-angle X-ray scattering with cone collimation using X-ray capillary optics | |
CN203587320U (zh) | X射线组合折射透镜聚焦性能测试装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20200831 Address after: Unit 2414-2416, main building, no.371, Wushan Road, Tianhe District, Guangzhou City, Guangdong Province Patentee after: GUANGDONG GAOHANG INTELLECTUAL PROPERTY OPERATION Co.,Ltd. Address before: The city Zhaohui six districts Chao Wang Road Hangzhou City, Zhejiang province 310014 18 Patentee before: ZHEJIANG University OF TECHNOLOGY Effective date of registration: 20200831 Address after: 223400 west of Binhai Road, north of HongRi Avenue and south of Nanjing Road, Lianshui Economic Development Zone, Huai'an City, Jiangsu Province Patentee after: Jiangsu Yier Heavy Industry Co.,Ltd. Address before: Unit 2414-2416, main building, no.371, Wushan Road, Tianhe District, Guangzhou City, Guangdong Province Patentee before: GUANGDONG GAOHANG INTELLECTUAL PROPERTY OPERATION Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Double mirror detection optical component for X-ray detection and imaging system Effective date of registration: 20211215 Granted publication date: 20150819 Pledgee: Jiangsu Yangtian Automation Technology Co.,Ltd. Pledgor: Jiangsu Yier Heavy Industry Co.,Ltd. Registration number: Y2021980015193 |
|
PE01 | Entry into force of the registration of the contract for pledge of patent right |