CN103424602B - Based on the secondary winding current testing circuit of source drive - Google Patents
Based on the secondary winding current testing circuit of source drive Download PDFInfo
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Abstract
The invention discloses a kind of secondary winding current testing circuit based on source drive, this circuit is by employing first voltage sample network, second voltage sample network, minimum voltage testing circuit, the circuit of the composition such as control module and signaling module instead of the auxiliary winding in the inverse-excitation type switch power-supply system of existing primary side feedback, the structures such as feedback resistive network, achieve without the need to auxiliary winding, the circuit structures such as feedback resistive network can obtain the current over-zero dot information of secondary winding in switch power supply system and the peak current information of armature winding, finally, while help switch power supply system exports constant average current signal, reduce the cost of existing power supply system and reduce the size of existing power supply system.
Description
Technical field
The present invention relates to a kind of secondary winding current testing circuit, particularly relate to a kind of secondary winding current testing circuit based on source drive.
Background technology
At present, inverse-excitation type (flyback) ac-dc conversion (AC-DC) switch power supply system of little wattage is a kind of general three terminal regulator integrated circuit by traditional use optocoupler and 431(431 just gradually) primary side control framework and control framework transition to primary side.Primary side controls framework by auxiliary winding feedback primary side information, does not need the primary side feedback device such as optocoupler and 431.Fig. 1 is the inverse-excitation type switch power-supply system of existing primary side feedback, and the constant current that this power-supply system can be used for LED drives.Switch power supply system in Fig. 1 comprises: rectifier bridge 101; Input capacitance 102; Absorbing circuit 104; The transformer 105 be made up of armature winding 106, auxiliary winding 107 and secondary winding 108; Secondary commutation diode 109; Output capacitance 110; LED load 111; Controller circuitry 103; Switching tube 112; Sampling resistor 113.
As shown in Figure 1, first input ac voltage is transformed into the voltage of approximate DC through the full-bridge rectification of described rectifier bridge 101 and input capacitance 102, the drain electrode of described switching tube 112 connects the armature winding 106 of described transformer 105, and the grid of described switching tube 112 switches between turn-on and turn-off with certain frequency and dutycycle under the control of described controller circuitry 103.When described switching tube 112 conducting, energy is stored in the armature winding 106 of described transformer 105; When described switching tube 112 turns off, the energy be stored in armature winding 106 is transferred in the output load of transformer secondary, thus achieves the conversion of power.
Further, in the switch power supply system shown in Fig. 1, need for described LED load 111 provides a constant output current had nothing to do with load voltage.Current, usual the adopted technical scheme of inverse-excitation type switch power-supply system that primary side controls is: the feedback network consisted of described auxiliary winding 107, first feedback resistance 114 and the second feedback resistance 115 obtains the current over-zero dot information of the described secondary winding 108 of transformer, meanwhile, the peak current information of described armature winding 106 is detected by described sampling resistor 113.Like this, go modulation (PWM) to export pulse using aforementioned two information as the input signal of described controller circuitry 103, thus control the constant current output of output current.Fig. 2 shows the first signal 124 in Fig. 1, the logic relation picture between secondary signal 121 and the 3rd signal 123.
But, although said system is simpler than traditional optocoupler secondary side feedback system, but still need extra auxiliary winding, feedback resistive network and a commutation diode realize feedback and power to control chip, this adds cost and the size of power-supply system undoubtedly.
Summary of the invention
Technical matters to be solved by this invention is, a kind of secondary winding current testing circuit based on source drive is provided, this current detection circuit can obtain the current over-zero dot information of secondary winding in switch power supply system and the peak current information of armature winding without the need to auxiliary winding, feedback resistive network etc., and the final switch power supply system that helps realizes exporting constant average current signal.
For solving the problems of the technologies described above, the technical solution used in the present invention is: a kind of secondary winding current testing circuit based on source drive, and this circuit comprises: starting resistance, power supply electric capacity, stabilivolt, clamping circuit, first voltage sample network, second voltage sample network, minimum voltage testing circuit, described minimum voltage testing circuit comprises the first port, the second port, the 3rd port, the 4th port, five-port and the 6th port, comparer, signaling module, the 7th port that described signaling module comprises, the 8th port, the 9th port, the tenth port and the tenth Single port, control module, described control module comprises the tenth Two-port netwerk, the 13 port, the 14 port and the tenth five-port, driven MOS pipe, primary current sampling resistor, wherein, described starting resistance and power supply capacitances in series after in parallel with outside input capacitance, the P pole of described stabilivolt is connected to the earth terminal of described power supply electric capacity, the N pole of described stabilivolt is connected to the ungrounded end of described power supply electric capacity respectively, the grid of external power metal-oxide-semiconductor and one end of clamping circuit, one end of described first voltage sample network is connected to the source electrode of described external power metal-oxide-semiconductor respectively, the other end of clamping circuit and one end of the second voltage sample network, the other end of described first voltage sample network is connected to the first port of described minimum voltage testing circuit, second port of described minimum voltage testing circuit is connected to the first input end of comparer, the other end of described second voltage sample network is connected to the second input end of described comparer, described comparer exports described 14 port to, described tenth five-port is connected to the source electrode of described driven MOS pipe and one end of primary current sampling resistor respectively, the other end ground connection of described primary current sampling resistor, described tenth Two-port netwerk is connected to the grid of described driven MOS pipe, the drain electrode of described driven MOS pipe is connected to the source electrode of described external power metal-oxide-semiconductor, described 13 port is connected to described tenth Single port, described tenth port is connected to described 3rd port, described 9th port is connected to described 4th port, described 8th port is connected to described five-port, described 7th port is connected to described 6th port.
Further, the external circuit of the described secondary winding current testing circuit based on source drive also comprises: outside rectifier bridge; Outside input capacitance; Outside absorbing circuit; The external transformer be made up of armature winding and secondary winding; External secondary commutation diode; External output capacitance; External power metal-oxide-semiconductor; Wherein, external communication electric signal is after described outside rectifier bridge, successively through described outside input capacitance and armature winding, the drain electrode of described external power metal-oxide-semiconductor is connected to after described outside absorbing circuit is in parallel with described armature winding, described secondary winding, external secondary commutation diode and external output capacitance form a loop, one end of described secondary winding is extremely connected with the P of external secondary commutation diode, and another termination of described secondary winding exports ground.
Further, as a kind of alternate embodiment, the external circuit of the described secondary winding current testing circuit based on source drive comprises: outside rectifier bridge; Outside input capacitance; Outside fly-wheel diode; External inductors; External output capacitance, external power metal-oxide-semiconductor; Wherein, described outside rectifier bridge is in parallel with described outside input capacitance, the ungrounded end of described outside input capacitance is connected to the N pole of described outside fly-wheel diode and one end of external output capacitance respectively, the P pole of described outside fly-wheel diode is connected to the drain electrode of described external power metal-oxide-semiconductor, the other end of described external output capacitance is connected to one end of described external inductors, and the other end of described external inductors is connected to the P pole of described outside fly-wheel diode.
Further, the external circuit of the described secondary winding current testing circuit based on source drive all also comprises: external LED load, and described external LED load is in parallel with described external output capacitance.
Further, described based in the secondary winding current testing circuit of source drive, described clamping circuit is made up of the first diode and the first resistant series.
Further, described based in the secondary winding current testing circuit of source drive, described first voltage sample network is made up of the second resistance and the 3rd resistant series.
Further, described based in the secondary winding current testing circuit of source drive, described second voltage sample network is made up of the 4th resistance and the 5th resistant series.
Further, described based in the secondary winding current testing circuit of source drive, described signaling module comprises: current source, the first switch, the first electric capacity or door, the first not gate, the second not gate, the 3rd not gate, the first monostable circuit, the second monostable circuit and triple monostable circuit, wherein, one end of described current source is connected with the first reference voltage, the other end of described current source is connected to one end of described first switch respectively, one end of first electric capacity and the input end of the first not gate, the other end ground connection of described first switch and the first electric capacity, the input signal of described tenth Single port enters described or door together with the output of the first not gate, described or door exports the input end of described 7th port and the second not gate respectively to, described second not gate exports one end of the first monostable circuit to, the described first monostable circuit other end exports described 8th port to, described tenth Single port is connected to the grid of described first switch and one end of described second monostable circuit respectively, the other end of described second monostable circuit is connected to described 9th port and the input end with the 3rd not gate respectively, described 3rd not gate exports one end of described triple monostable circuit to, the other end of described triple monostable circuit exports described tenth port to.
Further, described based in the secondary winding current testing circuit of source drive, described minimum voltage testing circuit comprises: the 6th resistance, second switch, the 3rd switch, the 4th switch, the 5th switch, the second electric capacity, the 3rd electric capacity, P channel MOS tube, operational amplifier, wherein, one end of described 6th resistance is connected with the second reference voltage, the other end of described 6th resistance is connected to one end of described second switch, the other end of described second switch is connected to positive input terminal and first port of described operational amplifier respectively, the grid of described second switch is connected to described 6th port, one end of described second electric capacity is connected with described second reference voltage, the other end of described second electric capacity is connected to the source electrode of described P channel MOS tube and the negative input end of described operational amplifier respectively, the output terminal of described operational amplifier is connected to the grid of described P channel MOS tube, the grounded drain of described P channel MOS tube, one end of described 3rd switch is connected with described second reference voltage, the grid of described 3rd switch is connected to described five-port, the other end of described 3rd switch is connected to the negative input end of described operational amplifier and one end of described 4th switch respectively, the grid of described 4th switch is connected to described 3rd port, the other end of described 4th switch is connected to one end of described 3rd electric capacity respectively, one end of second port and the 5th switch, the other end ground connection of described 3rd electric capacity, the grid of described 5th switch is connected to described 4th port, the other end ground connection of described 5th switch.
Further, described based in the secondary winding current testing circuit of source drive, described control module in start time export control signal make described driven MOS pipe and external power metal-oxide-semiconductor open-minded, when the voltage of elementary current sampling resistor reaches predetermined threshold value, described control module exports control signal and described driven MOS pipe and external power metal-oxide-semiconductor is turned off; The moment that upset occurs for the Output rusults of described comparer is the current zero-crossing point of secondary winding, and what described control module controlled described driven MOS pipe and external power metal-oxide-semiconductor according to the average current of external LED load opens the moment.
Advantage of the present invention is, the present invention is based in the secondary winding current testing circuit of source drive, by adopting the first voltage sample network, second voltage sample network, minimum voltage testing circuit, the circuit of the composition such as control module and signaling module instead of the auxiliary winding in the inverse-excitation type switch power-supply system of existing primary side feedback, the structures such as feedback resistive network, achieve without the need to auxiliary winding, the circuit structures such as feedback resistive network can obtain the current over-zero dot information of secondary winding in switch power supply system and the peak current information of armature winding, finally, while help switch power supply system exports constant average current signal, reduce the cost of existing power supply system and and reduce the size of existing power supply system.
Accompanying drawing explanation
Fig. 1 is the inverse-excitation type switch power-supply system of existing primary side feedback;
The logical relation schematic diagram that Fig. 2 is circuit shown in Fig. 1;
Fig. 3 is the circuit diagram of the inverse-excitation type switch power-supply system comprising the secondary winding current testing circuit that the present invention is based on source drive;
Fig. 4 is the circuit diagram of clamping circuit in the secondary winding current testing circuit that the present invention is based on source drive;
Fig. 5 is the circuit diagram of the first voltage sample network in the secondary winding current testing circuit that the present invention is based on source drive;
Fig. 6 is the circuit diagram of the second voltage sample network in the secondary winding current testing circuit that the present invention is based on source drive;
The logical relation schematic diagram that Fig. 7 is circuit shown in Fig. 3;
Fig. 8 is the circuit diagram of signaling module in the secondary winding current testing circuit that the present invention is based on source drive;
The logical relation schematic diagram that Fig. 9 is circuit shown in Fig. 8;
Figure 10 is the circuit diagram of minimum voltage testing circuit in the secondary winding current testing circuit that the present invention is based on source drive;
The logical relation schematic diagram that Figure 11 is circuit shown in Figure 10;
Figure 12 is the circuit diagram of another embodiment buck Unisolated switch power-supply system comprising the secondary winding current testing circuit that the present invention is based on source drive.
Embodiment
For disclosing technical scheme of the present invention further, be hereby described with reference to the accompanying drawings embodiments of the present invention:
Fig. 1 is the inverse-excitation type switch power-supply system of existing primary side feedback; Fig. 3 is the circuit diagram of the inverse-excitation type switch power-supply system comprising the secondary winding current testing circuit that the present invention is based on source drive.As shown in figures 1 and 3, of the present inventionly to be contemplated that: utilize the secondary winding current testing circuit that the present invention is based on source drive to replace described controller circuitry 103 in the inverse-excitation type switch power-supply system of existing primary side feedback and auxiliary winding 107, thus realize can obtaining the current over-zero dot information of secondary winding in switch power supply system and the peak current information of armature winding without the need to circuit structures such as auxiliary winding, feedback resistive networks, the final switch power supply system that helps exports constant average current signal.
[the first embodiment] Fig. 3 is the circuit diagram of the inverse-excitation type switch power-supply system for comprising the secondary winding current testing circuit that the present invention is based on source drive.The secondary winding current testing circuit that the present invention is based on source drive comprises: starting resistance 303, power supply electric capacity 304, stabilivolt 305, clamping circuit 321, first voltage sample network 322, second voltage sample network 323, minimum voltage testing circuit 325, described minimum voltage testing circuit 325 comprises the first port, the second port, the 3rd port, the 4th port, five-port and the 6th port, comparer 326, signaling module 327, the 7th port that described signaling module 327 comprises, the 8th port, the 9th port, the tenth port and the tenth Single port, control module 328, described control module 328 comprises the tenth Two-port netwerk, the 13 port, the 14 port and the tenth five-port, driven MOS pipe 315, primary current sampling resistor 316, wherein, described starting resistance 303 and power supply electric capacity 304 are in parallel with outside input capacitance 302 after connecting, the P pole of described stabilivolt 305 is connected to the earth terminal of described power supply electric capacity 304, the N pole of described stabilivolt 305 is connected to the ungrounded end of described power supply electric capacity 304 respectively, the grid of external power metal-oxide-semiconductor 313 and one end of clamping circuit 321, one end of described first voltage sample network 322 is connected to the source electrode of described external power metal-oxide-semiconductor 313 respectively, the other end of clamping circuit 321 and one end of the second voltage sample network 323, the other end of described first voltage sample network 322 is connected to the first port of described minimum voltage testing circuit 325, second port of described minimum voltage testing circuit 325 is connected to the first input end of comparer 326, the other end of described second voltage sample network 323 is connected to the second input end of described comparer 326, described comparer 326 exports described 14 port to, described tenth five-port is connected to the source electrode of described driven MOS pipe 315 and one end of primary current sampling resistor 316 respectively, the other end ground connection of described primary current sampling resistor 316, described tenth Two-port netwerk is connected to the grid of described driven MOS pipe 315, the drain electrode of described driven MOS pipe 315 is connected to the source electrode of described external power metal-oxide-semiconductor 313, described 13 port is connected to described tenth Single port, described tenth port is connected to described 3rd port, described 9th port is connected to described 4th port, described 8th port is connected to described five-port, described 7th port is connected to described 6th port.
In Fig. 3 except comprise the present invention is based on source drive secondary winding current testing circuit except, further comprises some existing peripheral circuits, this peripheral circuit comprises: outside rectifier bridge 301, outside input capacitance 302, outside absorbing circuit 306, the external transformer 307 be made up of armature winding 308 and secondary winding 309, external secondary commutation diode 310, external output capacitance 311, external power metal-oxide-semiconductor 313, external LED load 312, wherein, external communication electric signal is after described outside rectifier bridge 301, successively through described outside input capacitance 302 and armature winding 308, the drain electrode of described external power metal-oxide-semiconductor 313 is connected to after described outside absorbing circuit 306 is in parallel with described armature winding 308, described secondary winding 309, external secondary commutation diode 310 and external output capacitance 311 form a loop, one end of described secondary winding 309 is extremely connected with the P of external secondary commutation diode 310, another termination of described secondary winding 309 exports ground, the N pole of described secondary commutation diode 310 is connected with one end of described output capacitance 311, described output capacitance 311 other end ground connection, described external LED load 312 is in parallel with described external output capacitance 311.Simultaneously, the commutating voltage of described outside input capacitance 302 is connected with one end of described starting resistance 303, described starting resistance 303 other end is extremely connected with the N of stabilivolt 305 with the grid of described power supply electric capacity 304 one end, external power metal-oxide-semiconductor 313 respectively, the other end of described power supply electric capacity 304 and the P pole ground connection of stabilivolt 305.
In circuit shown in Fig. 3, described first voltage sample network 322 one end is connected with the drain electrode of described driven MOS pipe 315, for detecting the drain voltage waveform of described driven MOS pipe 315; Described second voltage sample network 323 one end is connected with the drain electrode of described driven MOS pipe 315, for detecting the drain voltage waveform of described driven MOS pipe 315; Described minimum voltage testing circuit 325 accepts 4 tunnel control signals of described signaling module 327 simultaneously, and output signal 334 and enter comparer 326, the output signal 338 of described second voltage sample network 323 enters described comparer 326, described comparer 326 outputs signal 342 and enters described control module 328, the overturn point of described comparer 326 is exactly the degaussing time point of external transformer 307, also be the zero crossing of the current signal 344 of external secondary winding 309 simultaneously, the namely ON time signal of described external secondary commutation diode 310.
Course of action shown in Fig. 3 during circuit working is as follows: described control module 328 in start time export control signal make described driven MOS pipe 315 and external power metal-oxide-semiconductor 313 open-minded, when the voltage of described primary current sampling resistor 316 reaches predetermined threshold value, described control module 328 exports control signal and described driven MOS pipe 315 and external power metal-oxide-semiconductor 313 is turned off; The moment that upset occurs for the Output rusults of described comparer 326 is the current zero-crossing point of secondary winding 309, and what described control module 328 controlled described driven MOS pipe 315 and external power metal-oxide-semiconductor 313 according to the average current of external LED load 312 opens the moment.Particularly, as shown in Figure 3, described control module 328 exports the grid of modulation signal 336 to described driven MOS pipe 315, to control the turn-on and turn-off of described driven MOS pipe 315; Meanwhile, described control module 328 exports control signal 335 and enters described signaling module 327, and described signaling module 327 exports 4 tunnel control signals, enters described minimum voltage testing circuit 325.Wherein, described control signal 335 and modulation signal 336 are with frequency same-phase, modulation signal 336 is that control signal 335 have passed through driving circuit and generates, and be specifically designed to and control described driven MOS pipe 315, and described control signal 335 is the control signals entering described signaling module 327.Circuit of the present invention is when starting, it is high level that described control module 328 exports described modulation signal 336, described driven MOS pipe 315 and external power metal-oxide-semiconductor 313 open-minded, electric current in the armature winding 308 of described external transformer 307 linearly rises, when the voltage of described primary current sampling resistor 316 reaches predetermined threshold value, the modulation signal 336 that described control module 328 exports becomes low level, described driven MOS pipe 315 and external power metal-oxide-semiconductor 313 also turn off, the voltage signal 340 that described external power metal-oxide-semiconductor 313 drains is due to the flyback excitation effect of described external transformer 307, unexpected rising, but its maximum voltage is subject to the clamper of described outside absorbing circuit 306, due to stray capacitance 314 coupling between the drain electrode of described external power metal-oxide-semiconductor 313 and source electrode, the drain voltage signal 331 of described driven MOS pipe 315 also can raise, but its maximum voltage by the clamper of described clamping circuit 321 to voltage 330, after the described external transformer 307 degaussing time terminates, due to the resonance of the inductance of described armature winding 308 and the stray capacitance 314 of described external power metal-oxide-semiconductor 313, the voltage signal 340 that described external power metal-oxide-semiconductor 313 drains can vibrate, now the drain voltage signal 331 of described driven MOS pipe 315 also can vibrate.Signal 331 is by after described first voltage sample network 322, become signal 332, the minimum point voltage of described minimum voltage sample circuit 325 sampled signal 332 vibration, and export minimum voltage signal 334, described signal 331 is by after the second voltage sample network 323, become signal 338, described signal 338 enters described comparer 326 together with signal 334, the low and high level upset moment of the output signal 342 of described comparer 326 is exactly the moment terminated the described external transformer 307 degaussing time, the namely current signal 344 zero crossing moment of the secondary winding 309 of described external transformer 307, the namely ON time signal of described external secondary commutation diode 310, this information enters described control module 328, as calculated, what export next cycle opens signal 336.Finally, first described control module 328 is steady state value by controlling the peak point current of armature winding, is secondly a particular expression formula by the control ON time of described secondary commutation diode 310 and the ratio of switch periods, exportable constant average current signal.
Fig. 4 is the circuit diagram of clamping circuit in the secondary winding current testing circuit that the present invention is based on source drive; Fig. 5 is the circuit diagram of the first voltage sample network in the secondary winding current testing circuit that the present invention is based on source drive; Fig. 6 is the circuit diagram of the second voltage sample network in the secondary winding current testing circuit that the present invention is based on source drive.As shown in the figure, described clamping circuit 321 is composed in series by the first diode 401 and the first resistance 402, two ends connection signal 330 and the signal 331 respectively of described clamping circuit 321; Described first voltage sample network 322 is composed in series by the second resistance 501 and the 3rd resistance 502, described second resistance 501 one end is connected to signal 331, the other end is connected to one end of signal 332 and the 3rd resistance 502 respectively, the other end ground connection of described 3rd resistance 502; Described second voltage sample network 323 is composed in series by the 4th resistance 601 and the 5th resistance 602, described 4th resistance 601 one end is connected to signal 331, the other end is connected to one end of signal 338 and the 5th resistance 602 respectively, the other end ground connection of described 5th resistance 602.
The logical relation schematic diagram that Fig. 7 is circuit shown in Fig. 3, there is shown modulation signal 336, signal 338, signal 334, logical relation between signal 343 and signal 344.
Fig. 8 is the circuit diagram of signaling module in the secondary winding current testing circuit that the present invention is based on source drive, and the signaling module in figure comprises: current source 801, first switch 802, first electric capacity 803 or door 805, first not gate 804, second not gate 806, the 3rd not gate 810, first monostable circuit 807, second monostable circuit 808 and triple monostable circuit 809, wherein, one end of described current source 801 is connected with the first reference voltage V ref1, the other end of described current source 801 is connected to one end of described first switch 802 respectively, one end of first electric capacity 803 and the input end of the first not gate 804, the other end ground connection of described first switch 802 and the first electric capacity 803, the input signal 335 of described tenth Single port enters described or door 805 together with the output of the first not gate 804, described or door 805 exports the input end of described 7th port and the second not gate 806 respectively to, described second not gate 806 exports one end of the first monostable circuit 807 to, described first monostable circuit 807 other end exports described 8th port to, described tenth Single port is connected to the grid of described first switch 802 and one end of described second monostable circuit 808 respectively, the other end of described second monostable circuit 808 is connected to described 9th port and the input end with the 3rd not gate 810 respectively, described 3rd not gate 810 exports one end of described triple monostable circuit 809 to, the other end of described triple monostable circuit 809 exports described tenth port to.
In Fig. 8, tenth Single port of described signaling module 327 input signal 335 enter described or door 805 and output signal 337 to described 7th port together with the output of described first not gate 804, described signal 337 enters described second not gate 806 simultaneously, and the output signal of described second not gate 806 enters described first monostable 807 and outputs signal 339 to described 8th port.Simultaneously, the input signal 335 of described signaling module 327 controls the turn-on and turn-off of described first switch 802, the input signal 335 of described signaling module 327 also enters described second monostable circuit 808 and outputs signal 340 to described 9th port, described signal 340 enters described 3rd not gate 810, the output signal of described 3rd not gate 810 enters described triple monostable circuit 809, and outputs signal 341 to described tenth port.
The logical relation schematic diagram that Fig. 9 is circuit shown in Fig. 8, there is shown modulation signal 336, signal 335, signal 337, signal 339, logical relation between signal 340 and signal 341.
Figure 10 is the circuit diagram of minimum voltage testing circuit in the secondary winding current testing circuit that the present invention is based on source drive, and figure comprises: the 6th resistance 1001, second switch 1002, the 3rd switch 1003, the 4th switch 1004, the 5th switch 1005, second electric capacity 1006, the 3rd electric capacity 1007, P channel MOS tube 1009, operational amplifier 1008, wherein, one end of described 6th resistance 1001 is connected with the second reference voltage V ref2, the other end of described 6th resistance 1001 is connected to one end of described second switch 1002, the other end of described second switch 1002 is connected to positive input terminal and first port of described operational amplifier 1008 respectively, the grid of described second switch 1002 is connected to described 6th port, one end of described second electric capacity 1006 is connected with described second reference voltage V ref2, the other end of described second electric capacity 1006 is connected to the source electrode of described P channel MOS tube 1009 and the negative input end of described operational amplifier 1008 respectively, the output terminal of described operational amplifier 1008 is connected to the grid of described P channel MOS tube 1009, the grounded drain of described P channel MOS tube 1009, one end of described 3rd switch 1003 is connected with described second reference voltage V ref2, the grid of described 3rd switch 1003 is connected to described five-port, the other end of described 3rd switch 1003 is connected to the negative input end of described operational amplifier 1008 and one end of described 4th switch 1004 respectively, the grid of described 4th switch 1004 is connected to described 3rd port, the other end of described 4th switch 1004 is connected to one end of described 3rd electric capacity 1007 respectively, one end of second port and the 5th switch 1005, the other end ground connection of described 3rd electric capacity 1007, the grid of described 5th switch 1005 is connected to described 4th port, the other end ground connection of described 5th switch 1005.
In Figure 10, signal 337, signal 339, signal 341 and signal 340 control described second switch 1002, the 3rd switch 1003, the 4th switch 1004, the opening or turning off of the 5th switch 1005 respectively.Described signal 337 controls the conducting of described second switch 1002, the voltage of signal 332 is raised, is greater than the oscillating part voltage of signal 332, is unlikely to the sampling affecting minimum voltage; Described signal 339 controls described 3rd switch 1003 conducting, makes described signal 1010 before sampling, is reset to reference voltage V ref2; Described signal 341 controls described 4th switch 1004 conducting, and described signal 1010 is sampled on described 3rd electric capacity 1007, generates signal 334; Described signal 340 controls the 5th switch 1005 conducting, makes described signal 334 before sampling, is reset to zero potential.In addition, described operational amplifier 1008, second electric capacity 1006, P channel MOS tube 1009 forms minimum voltage sampling hold circuit, the minimum voltage of described signal 332 of sampling, and remain on described second electric capacity 1006 and one end of the source electrode tie point of P channel MOS tube 1009, be signal 1010.
The logical relation schematic diagram that Figure 11 is circuit shown in Figure 10, there is shown signal 337, signal 339, signal 332, signal 1010, signal 340, logical relation between signal 341 and signal 334.
[the second embodiment] Figure 12 is the circuit diagram of another embodiment comprising the secondary winding current testing circuit that the present invention is based on source drive, and figure comprises: outside rectifier bridge 301; Outside input capacitance 302; Outside fly-wheel diode 360; External inductors 350; External output capacitance 311, external power metal-oxide-semiconductor 313; Wherein, described outside rectifier bridge 301 is in parallel with described outside input capacitance 302, the ungrounded end of described outside input capacitance 302 is connected to the N pole of described outside fly-wheel diode 360 and one end of external output capacitance 311 respectively, the P pole of described outside fly-wheel diode 360 is connected to the drain electrode of described external power metal-oxide-semiconductor 313, the other end of described external output capacitance 311 is connected to one end of described external inductors 350, and the other end of described external inductors 350 is connected to the P pole of described outside fly-wheel diode 360.
The second embodiment of the present invention is similar with the first embodiment of the present invention.Difference is, the first embodiment is the framework based on inverse excitation type converter, and the second embodiment is the framework based on buck converter, is a kind of LED constant-current driver of non-isolated.
Particularly, the second embodiment of the present invention and the first embodiment of the present invention different on circuit structure, described external transformer 307 is replaced by external inductors 350, and described external secondary commutation diode 310 is replaced by described outside fly-wheel diode 360.
Secondly, they are different in connected mode, difference is that the drain electrode of described external power metal-oxide-semiconductor 313 is connected with one end of described external inductors 350 with the P pole of described outside fly-wheel diode 360 respectively, the N pole of described outside fly-wheel diode 360 is connected with the ungrounded end of described outside input capacitance 302, one end of described external output capacitance 311 is extremely connected with the N of outside fly-wheel diode 360, and the other end of described external output capacitance 311 is connected with the other end of described inductance 350.
In sum, compared with prior art, the present invention detects the current zero-crossing point signal of secondary winding without the need to auxiliary winding, just can realize the object of constant output current.When not reducing circuit performance, the cost of whole circuit significantly can be reduced.
More than by description of listed embodiment, the basic ideas and basic principles of the present invention are set forth.But the present invention is never limited to above-mentioned listed embodiment, every equivalent variations, the improvement done based on technical scheme of the present invention and deliberately become of inferior quality behavior, all should belong to protection scope of the present invention.
Claims (10)
1. based on a secondary winding current testing circuit for source drive, it is characterized in that, this circuit comprises: starting resistance (303), power supply electric capacity (304), stabilivolt (305), clamping circuit (321), first voltage sample network (322), second voltage sample network (323), minimum voltage testing circuit (325), described minimum voltage testing circuit (325) comprises the first port, the second port, the 3rd port, the 4th port, five-port and the 6th port, comparer (326), signaling module (327), the 7th port that described signaling module (327) comprises, the 8th port, the 9th port, the tenth port and the tenth Single port, control module (328), described control module (328) comprises the tenth Two-port netwerk, the 13 port, the 14 port and the tenth five-port, driven MOS pipe (315), primary current sampling resistor (316), wherein, described starting resistance (303) and power supply electric capacity (304) are in parallel with outside input capacitance (302) after connecting, the P pole of described stabilivolt (305) is connected to the earth terminal of described power supply electric capacity (304), the N pole of described stabilivolt (305) is connected to the ungrounded end of described power supply electric capacity (304) respectively, the grid of external power metal-oxide-semiconductor (313) and one end of clamping circuit (321), one end of described first voltage sample network (322) is connected to the source electrode of described external power metal-oxide-semiconductor (313) respectively, the other end of clamping circuit (321) and one end of the second voltage sample network (323), the other end of described first voltage sample network (322) is connected to the first port of described minimum voltage testing circuit (325), second port of described minimum voltage testing circuit (325) is connected to the first input end of comparer (326), the other end of described second voltage sample network (323) is connected to the second input end of described comparer (326), described comparer (326) exports described 14 port to, described tenth five-port is connected to the source electrode of described driven MOS pipe (315) and one end of primary current sampling resistor (316) respectively, the other end ground connection of described primary current sampling resistor (316), described tenth Two-port netwerk is connected to the grid of described driven MOS pipe (315), the drain electrode of described driven MOS pipe (315) is connected to the source electrode of described external power metal-oxide-semiconductor (313), described 13 port is connected to described tenth Single port, described tenth port is connected to described 3rd port, described 9th port is connected to described 4th port, described 8th port is connected to described five-port, described 7th port is connected to described 6th port.
2. the secondary winding current testing circuit based on source drive according to claim 1, it is characterized in that, this circuit also comprises: outside rectifier bridge (301), outside input capacitance (302), outside absorbing circuit (306), the external transformer (307) be made up of armature winding (308) and secondary winding (309), external secondary commutation diode (310), external output capacitance (311), external power metal-oxide-semiconductor (313), wherein, external communication electric signal is after described outside rectifier bridge (301), successively through described outside input capacitance (302) and armature winding 308, the drain electrode of described external power metal-oxide-semiconductor (313) is connected to after described outside absorbing circuit (306) is in parallel with described armature winding 308, described secondary winding (309), external secondary commutation diode (310) and external output capacitance (311) form a loop, one end of described secondary winding (309) is extremely connected with the P of external secondary commutation diode (310), another termination of described secondary winding (309) exports ground.
3. the secondary winding current testing circuit based on source drive according to claim 1, it is characterized in that, this circuit also comprises: outside rectifier bridge (301), outside input capacitance (302), outside fly-wheel diode (360), external inductors (350), external output capacitance (311), external power metal-oxide-semiconductor (313), wherein, described outside rectifier bridge (301) is in parallel with described outside input capacitance (302), the ungrounded end of described outside input capacitance (302) is connected to the N pole of described outside fly-wheel diode (360) and one end of external output capacitance (311) respectively, the P pole of described outside fly-wheel diode (360) is connected to the drain electrode of described external power metal-oxide-semiconductor (313), the other end of described external output capacitance (311) is connected to one end of described external inductors (350), the other end of described external inductors (350) is connected to the P pole of described outside fly-wheel diode (360).
4. the secondary winding current testing circuit based on source drive according to Claims 2 or 3, it is characterized in that, this circuit also comprises: external LED load (312), and described external LED load (312) is in parallel with described external output capacitance (311).
5. the secondary winding current testing circuit based on source drive according to claim 1, is characterized in that, described clamping circuit (321) is composed in series by the first diode (401) and the first resistance (402).
6. the secondary winding current testing circuit based on source drive according to claim 1, is characterized in that, described first voltage sample network (322) is composed in series by the second resistance (501) and the 3rd resistance (502).
7. the secondary winding current testing circuit based on source drive according to claim 1, is characterized in that, described second voltage sample network (323) is composed in series by the 4th resistance (601) and the 5th resistance (602).
8. the secondary winding current testing circuit based on source drive according to claim 1, it is characterized in that, described signaling module (327) comprising: current source (801), the first switch (802), the first electric capacity (803) or door (805), the first not gate (804), the second not gate (806), the 3rd not gate (810), the first monostable circuit (807), the second monostable circuit (808) and triple monostable circuit (809); wherein, one end of described current source (801) is connected with the first reference voltage (Vref1), the other end of described current source (801) is connected to one end of described first switch (802) respectively, one end of first electric capacity (803) and the input end of the first not gate (804), the other end ground connection of described first switch (802) and the first electric capacity (803), the input signal (335) of described tenth Single port and the output of the first not gate (804) enter described or door (805) together, described or door (805) exports the input end of described 7th port and the second not gate (806) respectively to, described second not gate (806) exports one end of the first monostable circuit (807) to, described first monostable circuit (807) other end exports described 8th port to, described tenth Single port is connected to the grid of described first switch (802) and one end of described second monostable circuit (808) respectively, the other end of described second monostable circuit (808) is connected to the input end of described 9th port and the 3rd not gate (810) respectively, described 3rd not gate (810) exports one end of described triple monostable circuit (809) to, the other end of described triple monostable circuit (809) exports described tenth port to.
9. the secondary winding current testing circuit based on source drive according to claim 1, it is characterized in that, described minimum voltage testing circuit (325) comprising: the 6th resistance (1001), second switch (1002), the 3rd switch (1003), the 4th switch (1004), the 5th switch (1005), the second electric capacity (1006), the 3rd electric capacity (1007), P channel MOS tube (1009), operational amplifier (1008), wherein, one end of described 6th resistance (1001) is connected with the second reference voltage (Vref2), the other end of described 6th resistance (1001) is connected to one end of described second switch (1002), the other end of described second switch (1002) is connected to positive input terminal and first port of described operational amplifier (1008) respectively, the grid of described second switch (1002) is connected to described 6th port, one end of described second electric capacity (1006) is connected with described second reference voltage (Vref2), the other end of described second electric capacity (1006) is connected to the source electrode of described P channel MOS tube (1009) and the negative input end of described operational amplifier (1008) respectively, the output terminal of described operational amplifier (1008) is connected to the grid of described P channel MOS tube (1009), the grounded drain of described P channel MOS tube (1009), one end of described 3rd switch (1003) is connected with described second reference voltage (Vref2), the grid of described 3rd switch (1003) is connected to described five-port, the other end of described 3rd switch (1003) is connected to the negative input end of described operational amplifier (1008) and one end of described 4th switch (1004) respectively, the grid of described 4th switch (1004) is connected to described 3rd port, the other end of described 4th switch (1004) is connected to one end of described 3rd electric capacity (1007) respectively, one end of second port and the 5th switch (1005), the other end ground connection of described 3rd electric capacity (1007), the grid of described 5th switch (1005) is connected to described 4th port, the other end ground connection of described 5th switch (1005).
10. the secondary winding current testing circuit based on source drive according to claim 1, it is characterized in that, described control module (328) in start time export control signal make described driven MOS pipe (315) and external power metal-oxide-semiconductor (313) open-minded, when the voltage of elementary current sampling resistor (316) reaches predetermined threshold value, described control module (328) exports control signal and described driven MOS pipe (315) and external power metal-oxide-semiconductor (313) is turned off; The moment that upset occurs for the Output rusults of described comparer (326) is the current zero-crossing point of secondary winding (309), and what described control module (328) controlled described driven MOS pipe (315) and external power metal-oxide-semiconductor (313) according to the average current of external LED load (312) opens the moment.
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| CN103731049B (en) * | 2013-12-13 | 2017-05-31 | 上海新进半导体制造有限公司 | Current zero-crossing point detects circuit and method, drive circuit and method, Switching Power Supply |
| CN103715872B (en) * | 2014-01-03 | 2017-01-11 | 深圳市金宏威技术股份有限公司 | Power supply and pulse width modulation generating method and device |
| CN103929849B (en) * | 2014-03-26 | 2016-05-25 | 无锡市晶源微电子有限公司 | Isolation led drive circuit |
| CN104319983B (en) * | 2014-09-29 | 2017-09-29 | 矽力杰半导体技术(杭州)有限公司 | A kind of source driving method, drive circuit and Switching Power Supply being used in Switching Power Supply |
| CN104360143B (en) * | 2014-12-04 | 2017-08-08 | 杰华特微电子（杭州）有限公司 | Current zero-crossing point detects circuit and method, load voltage detection circuit and method |
| CN107612107A (en) * | 2017-08-23 | 2018-01-19 | 成都芯源系统有限公司 | Power supply voltage generating circuit and integrated circuit thereof |
| CN111385937B (en) * | 2019-11-20 | 2021-11-30 | 宁波凯耀电器制造有限公司 | Miniaturized intelligent lamp |
| CN114002493B (en) * | 2021-11-01 | 2023-10-24 | 广东省大湾区集成电路与系统应用研究院 | Neutral point voltage detection circuit of motor |
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Effective date of registration: 20151203 Address after: Suzhou City, Jiangsu province 215000 Industrial Park Suzhou Xinping Street No. 388 Suzhou innovation park off the 23 building 3 layer 09, 10 unit Applicant after: Suzhou Zhipu Xinlian Electronic Technology Co., Ltd. Address before: 101, room 1, building 108, East 210046, Gan Hua Street, Yao Road, Qixia District, Jiangsu, Nanjing Applicant before: Nanjing Aikefu Electronic Technology Co., Ltd. |
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Address after: Suzhou City, Jiangsu province 215000 Industrial Park Suzhou Xinping Street No. 388 Suzhou innovation park off the 23 building 3 layer 09, 10 unit Patentee after: SUZHOU INTELLI-CHIPLINK ELECTRONICS TECHNOLOGY CO., LTD. Address before: Suzhou City, Jiangsu province 215000 Industrial Park Suzhou Xinping Street No. 388 Suzhou innovation park off the 23 building 3 layer 09, 10 unit Patentee before: Suzhou Zhipu Xinlian Electronic Technology Co., Ltd. |