CN103412170A - Laser threshold current testing method and device thereof - Google Patents
Laser threshold current testing method and device thereof Download PDFInfo
- Publication number
- CN103412170A CN103412170A CN2013102871074A CN201310287107A CN103412170A CN 103412170 A CN103412170 A CN 103412170A CN 2013102871074 A CN2013102871074 A CN 2013102871074A CN 201310287107 A CN201310287107 A CN 201310287107A CN 103412170 A CN103412170 A CN 103412170A
- Authority
- CN
- China
- Prior art keywords
- ith
- current
- value
- threshold
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The invention discloses a laser threshold current testing method and also discloses a laser threshold current testing device. According to the laser threshold current testing method and the laser threshold current testing device provided by the invention, through a method of setting threshold comparison, a threshold current testing error problem caused by testing environment noise interference, laser device nonlinearity and testing equipment performance in a laser threshold current testing is solved, the correct laser threshold current can be determined, thus the testing efficiency and the good product rate are greatly improved, the requirements of the testing environment and testing equipment are reduced, and the method and the device have a very high practical value.
Description
Technical field
The invention belongs to the optical fiber communication technology field, relate to a kind of laser threshold current method of testing and device.
Background technology
The laser threshold current method of testing of having used at present, comprise fitting a straight line testing algorithm, two-part fitting a straight line testing algorithm and secondary differentiate testing algorithm, all can not avoid because the test environment noise, non-linear and the proving installation self performance of laser device and the laser threshold current test errors that causes can not be determined correct laser threshold current.
Summary of the invention
The object of the invention is to, for above-mentioned the deficiencies in the prior art, a kind of laser threshold current method of testing and device are provided, solve in the laser threshold current test because the test environment noise the non-linear and proving installation self performance of laser device and the threshold current test errors problem that causes; And provide the correct laser threshold current of determining.
For achieving the above object, the technical scheme that the present invention takes is: a kind of laser threshold current method of testing is provided, it is characterized in that, comprise the following steps:
S1, reception laser power and current data;
Laser power and current data that S2, basis receive, obtain the PI matched curve;
S3, employing secondary method of derivation obtain threshold current Ith;
S4, according to the PI matched curve, obtain the measured light power P wk-real that (Ith+ △) is corresponding; △ is arbitrary setting value;
S5, based on point (Ith, P in the PI matched curve
Ith) and the PI matched curve on non-zero slope between arbitrary linear zone, generate calculated curve;
S6, from the calculated curve generated, read the calculating luminous power that (Ith+ △) is corresponding and calculate luminous power Pwk-cal;
S7, according to the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal whether in the threshold value scope of setting, whether th correct with the decision threshold electric current I; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is not more than the threshold value of setting, threshold current Ith is correct; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect.
Described S3 adopts secondary method of derivation acquisition threshold current Ith step further to comprise following sub-step:
S31, the PI matched curve obtained is carried out to the secondary differentiate obtain secondary differentiate curve;
S32, to get current value corresponding to maximal value on secondary differentiate curve be threshold current Ith.
In described S7, if the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect, also further comprising the steps: judge in the current data received and have at least one interference current value; After the laser power that receives and current data, getting rid of interference current value and corresponding stray light power, return to step S2.
A kind of laser threshold current proving installation, is characterized in that, comprising:
Receiving trap, receive laser power and current data;
The match device, according to the laser power received and current data, obtain the PI matched curve;
Deriving means, adopt the secondary method of derivation to obtain threshold current Ith;
The first reading device, according to the PI matched curve, obtain the measured light power P wk-real that (Ith+ △) is corresponding; △ is arbitrary setting value;
Generating apparatus, based on point (Ith, the P in the PI matched curve
Ith) and the PI matched curve on non-zero slope between arbitrary linear zone, generate calculated curve;
The second reading device, read from the calculated curve generated the calculating luminous power Pwk-cal that (Ith+ △) is corresponding;
Decision maker, whether in the threshold value scope of setting, whether th is correct with the decision threshold electric current I according to the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is not more than the threshold value of setting, threshold current Ith is correct; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect.
Described generating apparatus comprises:
Calculation element, carry out the secondary differentiate to the PI matched curve obtained and obtain secondary differentiate curve;
Setting device, getting current value corresponding to maximal value on secondary differentiate curve is threshold current Ith.
Described decision maker also comprises return mechanism, if the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect, judges in the current data received and has at least one interference current value; After the laser power that receives and current data, getting rid of interference current value and corresponding stray light power, return to the match device.
Terminological interpretation:
When current value was very little, laser output power did not have substantially, and increased electric current, still not output; When electric current increased to some value Ith, luminous power output started to occur, and along with electric current increases, its value approximately linear increases; This Ith just is called threshold current.
Laser threshold current method of testing provided by the invention and device have following beneficial effect,
1,, by thresholding method relatively is set, the non-linear and performance of testing apparatus of laser device own and the threshold current test errors problem that causes have been solved in the laser threshold current test because the test environment noise;
2, correct laser threshold current be can determine, thereby testing efficiency and yields greatly improved;
3, reduced the requirement to test environment and testing apparatus;
4, has very high practical value.
The accompanying drawing explanation
Fig. 1 schematically shows laser threshold current method of testing overview flow chart;
Fig. 2 schematically shows according to the more detailed part process flow diagram of the laser threshold current method of testing of an embodiment of the application;
Fig. 3 schematically shows the structural representation according to the laser threshold current proving installation of an embodiment of the application;
Fig. 4 schematically shows the schematic diagram according to the laser threshold current test effect of an embodiment of the application;
Fig. 5 schematically shows the secondary differentiate curve according to the PI matched curve of an embodiment of the application.
In these accompanying drawings, mean same or analogous part with identical reference number.
Embodiment
Below in conjunction with embodiment, the present invention is described in detail, but they are not to further restriction of the present invention.
Fig. 1 schematically shows laser threshold current method of testing overview flow chart; Comprise the following steps:
In step S1, receive laser power and current data; Laser power and current data are to utilize reometer and the light power meter data that the measuring semiconductor laser instrument obtains under the environment of constant temperature (25 ℃);
In step S2, according to the laser power received and current data, obtain the PI matched curve; The mode that obtains the PI matched curve is a lot, can be to obtain by Lorentz fit, also can obtain by match modes such as Gauss curve fitting, least square fitting, Lagrange's interpolation, Newton iteration method, interval dichotomies;
For example, table 1 has provided electric current and laser optical power data.
Table 1 electric current and luminous power data:
| Electric current/mA | Luminous power/μ W | Electric current/mA | Luminous power/μ W |
| 1.025 | 0 | 6.497 | 30.832 |
| 2.068 | 2.999 | 9.512 | 115.345 |
| 2.546 | 4.699 | 10.058 | 174.582 |
| 3.033 | 6.668 | 10.574 | 337.287 |
| 3.510 | 8.831 | 11.061 | 931.108 |
| 3.986 | 11.220 | 12.25 | 2238.7225 |
| 4.528 | 14.355 | 14.58 | 4905.9434 |
| 5.074 | 17.947 | 16.79 | 7435.7967 |
| 5.565 | 21.777 | 18.12 | 8958.2876 |
| 6.056 | 26.182 | 21.34 | 12644.3182 |
| 7.048 | 37.931 | 24.56 | 16330.3488 |
| 7.530 | 45.499 | 27.36 | 19535.5928 |
| 8.040 | 55.847 | 29.18 | 21619.0014 |
| 8.526 | 68.865 | 30.89 | 23576.4897 |
| 9.027 | 87.498 | 33.61 | 26690.1553 |
According to the data in table 1, by Lorentz (Lorentzian) approximating method, obtain matched curve, matched curve is (Fig. 4 schematically shows the schematic diagram according to the laser threshold current test effect of an embodiment of the application, and wherein solid dot is scribed ss the PI matched curve) as shown in Figure 4.
In step S3, adopt the secondary method of derivation to obtain threshold current Ith.
Fig. 2 schematically shows according to the more detailed part process flow diagram of the laser threshold current method of testing of an embodiment of the application;
In step S31, the PI matched curve obtained is carried out to the secondary differentiate and obtain secondary differentiate curve;
For example, to above-mentioned PI matched curve, carry out the secondary differentiate curve that the secondary differentiate obtains, secondary differentiate curve is (Fig. 5 schematically shows the secondary differentiate curve according to the PI matched curve of an embodiment of the application) as shown in Figure 5.
In step S32, getting current value corresponding to maximal value on secondary differentiate curve is threshold current Ith;
For example, as shown in Figure 5, on secondary differentiate curve, current value corresponding to maximal value is I=10.89mA to secondary differentiate curve; And supposition threshold current Ith=10.89mA.
In step S4, according to the PI matched curve, obtain the measured light power P wk-real that (Ith+ △) is corresponding; △ is arbitrary setting value; △ can be 20mA or 14mA;
Ith=10.89mA for example; △=20mA, (the measured light power P wk-real=23567.49 μ W that Ith+ △=30.89mA) is corresponding in the PI matched curve.
In step S5, based on point (Ith, the P in the PI matched curve
Ith) and the PI matched curve on non-zero slope between arbitrary linear zone, generate calculated curve (Fig. 4 schematically shows the schematic diagram according to the laser threshold current test effect of an embodiment of the application, and wherein hollow dots is scribed ss the calculated curve of generation).
For example, drawn point (Ith, P by the PI matched curve
Ith) be (10.89,626.12), can get point (Ith, P
Ith) after the non-zero slope of the range of linearity, as the equation between the linear zone after point (10.89,626.12) in the PI matched curve, be P=1144.73I-11784.22; Slope is 1144.73; Based on point (10.89,626.12) and slope 1144.73, the calculated curve equation of generation is P=1144.73I-11839.99.
In step S6, read from the calculated curve generated the calculating luminous power Pwk-cal that (Ith+ △) is corresponding;
For example, the calculated curve equation is P=1144.73I-11839.99; The calculating luminous power Pwk-cal that on curve, (Ith+ △) is corresponding is 23520.72 μ W.
In step S7, whether in the threshold value scope of setting, whether decision threshold electric current I th is correct according to the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is not more than the threshold value of setting, threshold current Ith is correct; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect; If threshold current Ith is incorrect, judges in the current data received and have at least one interference current value; After the laser power that receives and current data, getting rid of interference current value and corresponding stray light power, return to step S2.So repeat, from the current data received, getting rid of at least one interference current value, (can suppose that getting near the current data of current value corresponding to maximal value on secondary differentiate curve is interference current at every turn, measurement current data as current value front corresponding to maximal value on secondary differentiate curve or back), until find correct Ith; If, until the current value in the current data received has all been got rid of, do not find yet correct Ith, show current test errors, need to retest.The interference current value can be at least one in the current data received.
Threshold value (meaning with δ here) can be the value of being set according to the model of laser instrument by laser instrument manufacturer; This threshold value can be the empirical value of determining according to laser instrument model, the laser instrument degree of wear.
Under desirable state, threshold delta can equal zero.
Fig. 4 schematically shows the schematic diagram according to the laser threshold current test effect of an embodiment of the application; In this embodiment, Ith=10.89mA, △=20mA, (the measured light power P wk-real=23567.49 μ W that Ith+ △=30.89mA) is corresponding.Based on point (10.89,626.12) and slope 1144.73, the calculated curve equation of generation is P=1144.73I-11839.99; The calculating luminous power Pwk-cal that on curve, (Ith+ △) is corresponding is 23520.72 μ W.∣ Pwk-real – Pwk-cal ∣=46.77<δ (δ=50); 10.89mA be threshold current Ith;
If 10.89mA is not threshold current Ith, set in the current data received, be positioned at the current value 11.061mA after Ith on secondary differentiate curve and be set as the interference current value.Said process again after excluding interference current value and corresponding stray light power the laser power that receives and current data.
Fig. 3 schematically shows the structural representation according to the laser threshold current proving installation 100 of an embodiment of the application; This laser threshold current proving installation 100 comprises: receiving trap 101 receives laser power and current data; Match device 102, according to the laser power received and current data, obtain the PI matched curve; Deriving means 103, adopt the secondary method of derivation to obtain threshold current Ith; The first reading device 104, according to the PI matched curve, obtain the measured light power P wk-real that (Ith+ △) is corresponding; △ is arbitrary setting value; Generating apparatus 105, based on point (Ith, the P in the PI matched curve
Ith) and the PI matched curve on non-zero slope between arbitrary linear zone, generate calculated curve; The second reading device 106, read from the calculated curve generated the calculating luminous power Pwk-cal that (Ith+ △) is corresponding; Decision maker 107, whether in the threshold value scope of setting, whether th is correct with the decision threshold electric current I according to the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is not more than the threshold value of setting, threshold current Ith is correct; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect.
Above-mentioned generating apparatus 103 further comprises: calculation element, carry out the secondary differentiate to the PI matched curve obtained; Setting device, getting current value corresponding to second derivative maximal value is threshold current Ith.
Above-mentioned decision maker 107 also comprises return mechanism, if the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect, judges in the received current data and has at least one interference current value; After the laser power that receives and current data, getting rid of interference current value and corresponding stray light power, return to the match device.
The foregoing is only the application's embodiment, be not limited to the application, for a person skilled in the art, the application can be by various modifications and variations.All within the application's spirit and principle, any modification of doing, be equal to replacement, improvement etc., within all should being included in the application's claim scope.
Claims (6)
1. a laser threshold current method of testing, is characterized in that, comprises the following steps:
S1, reception laser power and current data;
Laser power and current data that S2, basis receive, obtain the PI matched curve;
S3, employing secondary method of derivation obtain threshold current Ith;
S4, according to the PI matched curve, obtain the measured light power P wk-real that (Ith+ △) is corresponding; △ is arbitrary setting value;
S5, based on point (Ith, P in the PI matched curve
Ith) and the PI matched curve on non-zero slope between arbitrary linear zone, generate calculated curve;
S6, from the calculated curve generated, read the calculating luminous power that (Ith+ △) is corresponding and calculate luminous power Pwk-cal;
S7, according to the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal whether in the threshold value scope of setting, whether th correct with the decision threshold electric current I; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is not more than the threshold value of setting, threshold current Ith is correct; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect.
2. laser threshold current method of testing according to claim 1, is characterized in that, described S3 adopts secondary method of derivation acquisition threshold current Ith step further to comprise following sub-step:
S31, the PI matched curve obtained is carried out to the secondary differentiate obtain secondary differentiate curve;
S32, to get current value corresponding to maximal value on secondary differentiate curve be threshold current Ith.
3. laser threshold current method of testing according to claim 2, it is characterized in that, in described S7, if the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect, also further comprising the steps: judge in the current data received and have at least one interference current value; After the laser power that receives and current data, getting rid of interference current value and corresponding stray light power, return to step S2.
4. a laser threshold current proving installation, is characterized in that, comprising:
Receiving trap, receive laser power and current data;
The match device, according to the laser power received and current data, obtain the PI matched curve;
Deriving means, adopt the secondary method of derivation to obtain threshold current Ith;
The first reading device, according to the PI matched curve, obtain the measured light power P wk-real that (Ith+ △) is corresponding; △ is arbitrary setting value;
Generating apparatus, based on point (Ith, the P in the PI matched curve
Ith) and the PI matched curve on non-zero slope between arbitrary linear zone, generate calculated curve;
The second reading device, read from the calculated curve generated the calculating luminous power Pwk-cal that (Ith+ △) is corresponding;
Decision maker, whether in the threshold value scope of setting, whether th is correct with the decision threshold electric current I according to the measured light power P wk-real absolute value poor with calculating luminous power Pwk-cal; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is not more than the threshold value of setting, threshold current Ith is correct; If the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect.
5. laser threshold current proving installation according to claim 4, is characterized in that, described generating apparatus comprises:
Calculation element, carry out the secondary differentiate to the PI matched curve obtained and obtain secondary differentiate curve;
Setting device, getting current value corresponding to maximal value on secondary differentiate curve is threshold current Ith.
6. laser threshold current proving installation according to claim 4, it is characterized in that, described decision maker also comprises return mechanism, if the absolute value that measured light power P wk-real is poor with calculating luminous power Pwk-cal is greater than the threshold value of setting, threshold current Ith is incorrect, judges in the current data received and has at least one interference current value; After the laser power that receives and current data, getting rid of interference current value and corresponding stray light power, return to the match device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013102871074A CN103412170A (en) | 2013-07-09 | 2013-07-09 | Laser threshold current testing method and device thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013102871074A CN103412170A (en) | 2013-07-09 | 2013-07-09 | Laser threshold current testing method and device thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103412170A true CN103412170A (en) | 2013-11-27 |
Family
ID=49605196
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2013102871074A Pending CN103412170A (en) | 2013-07-09 | 2013-07-09 | Laser threshold current testing method and device thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103412170A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105891692A (en) * | 2016-02-23 | 2016-08-24 | 青岛海信宽带多媒体技术有限公司 | Laser chip P-I curve kink test method and device |
| CN106324469A (en) * | 2016-09-30 | 2017-01-11 | 深圳新飞通光电子技术有限公司 | Multiplex PIV (peak inverse voltage) testing system suitable for optical transmitter module and testing method of multiplex PIV testing system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1117136A (en) * | 1995-08-11 | 1996-02-21 | 吉林大学 | Detecting and analysing method and apparatus for reliability of semiconductor laser |
| CN101672889A (en) * | 2009-08-19 | 2010-03-17 | 哈尔滨工业大学 | Device and method for detecting characteristics of pulse type semiconductor laser |
-
2013
- 2013-07-09 CN CN2013102871074A patent/CN103412170A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1117136A (en) * | 1995-08-11 | 1996-02-21 | 吉林大学 | Detecting and analysing method and apparatus for reliability of semiconductor laser |
| CN101672889A (en) * | 2009-08-19 | 2010-03-17 | 哈尔滨工业大学 | Device and method for detecting characteristics of pulse type semiconductor laser |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105891692A (en) * | 2016-02-23 | 2016-08-24 | 青岛海信宽带多媒体技术有限公司 | Laser chip P-I curve kink test method and device |
| CN105891692B (en) * | 2016-02-23 | 2019-01-01 | 青岛海信宽带多媒体技术有限公司 | A kind of laser chip P-I kink of a curve test method and device |
| CN106324469A (en) * | 2016-09-30 | 2017-01-11 | 深圳新飞通光电子技术有限公司 | Multiplex PIV (peak inverse voltage) testing system suitable for optical transmitter module and testing method of multiplex PIV testing system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105223481A (en) | Based on the partial-discharge ultrahigh-frequency signal initial time defining method of difference energy function | |
| CN105224002A (en) | Radio system temperature compensation, device and mobile terminal | |
| CN103441962A (en) | OFDM system impulse interference restraining method based on compression sensing | |
| CN104464247A (en) | Method for reducing time synchronization error of public network of concentrator | |
| WO2015023821A1 (en) | Method and apparatus for monitoring maximum power point tracking | |
| CN103543426A (en) | Interpolating compensation method for each-band calibration of network analyzer | |
| CN103412170A (en) | Laser threshold current testing method and device thereof | |
| CN103529096B (en) | Partial pressure of oxygen sensor signal processing circuit | |
| CN104049151A (en) | High-power microwave radiation field measuring method and device based on comparison method | |
| CN103529422A (en) | Direct current electric energy meter detection device | |
| CN110146012B (en) | Semiconductor laser nonlinear frequency modulation pre-correction method | |
| CN106066785B (en) | A kind of real random number generator accumulated jitter estimation method based on ring oscillator | |
| CN104296661B (en) | Absolute grating scale absolute signal Concordance method | |
| CN204272138U (en) | A kind of eye pattern testing apparatus of high speed signal | |
| CN106053936A (en) | Method and system for acquiring instantaneous frequency of electrical signal | |
| CN106355029B (en) | A kind of method that distribution system key measures decoupling Fast Identification | |
| CN107576866A (en) | It is a kind of to approach sparse reconstruct and the method for distinguishing multiple harmonic sources of interior point method based on smooth | |
| CN103177392A (en) | Correlation method in steel coil length process | |
| CN109946607A (en) | A kind of calibration system and method for DC charging motor calibrating installation | |
| US20150189709A1 (en) | Stability of an optical source in an optical network test instrument | |
| Li et al. | Two-stage fault section location for distribution networks based on compressed sensing with estimated voltage measurements | |
| CN103926021A (en) | Method for determining electron temperature of plasma | |
| CN102854522A (en) | Nuclear radiation pulse baseline estimation method based on dual-forgotten Kalman filtering | |
| Acurio et al. | Design and Implementation of a Machine Learning State Estimation Model for Unobservable Microgrids | |
| CN103424185A (en) | Detecting system and method of automatically correcting errors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20131127 |