CN103364644A - Method for eliminating baseline drift of probe output voltage signal - Google Patents
Method for eliminating baseline drift of probe output voltage signal Download PDFInfo
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- CN103364644A CN103364644A CN2013103175427A CN201310317542A CN103364644A CN 103364644 A CN103364644 A CN 103364644A CN 2013103175427 A CN2013103175427 A CN 2013103175427A CN 201310317542 A CN201310317542 A CN 201310317542A CN 103364644 A CN103364644 A CN 103364644A
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Abstract
The invention discloses a method for eliminating baseline drift of probe output voltage signal. The method comprises the following steps of: performing pre-sampling on the probe output voltage signal under the condition that a probe has no input signal to obtain pre-sampling waveform of the probe output voltage signal; measuring a to-be-measured transient electromagnetic field by the probe after performing pre-sampling, performing measurement sampling on the probe output voltage signal to obtain the measurement sampling waveform of the probe output voltage signal; integrating the pre-sampling waveform and the measurement sampling waveform to obtain the integrated pre-sampling waveform and measurement sampling waveform; performing linear fitting on the integrated pre-sampling waveform and measurement sampling waveform to obtain a linear fitting straight line; and subtracting the linear fitting straight line from the integrated measurement sampling waveform to obtain the real waveform of the to-be-measured transient electromagnetic field. The method can effectively eliminate the baseline drift of the probe output voltage signal, thereby lowering measurement error to the transient electromagnetic field.
Description
Technical field
The present invention relates to the signal processing technology field, particularly a kind of method of eliminating probe output voltage signal baseline wander, the method is applicable to the D-dot probe.
Background technology
The D-dot probe usually is used for measuring transient electromagnetic field.When using D-dot probe measurement transient electromagnetic field, usually need to carry out Integral Processing to the voltage signal of D-dot probe output, to obtain the waveform of transient electromagnetic field to be measured.
In the prior art, the method for the voltage signal of D-dot probe output being carried out Integral Processing comprises RC circuit method and numerical integrating.
The shortcoming that the voltage signal that adopts the hardware integrator method that the D-dot probe is exported carries out Integral Processing is: when the voltage signal of D-dot probe output is weak, because the attenuation of RC circuit, causing the RC circuit to send to oscillographic voltage signal after Integral Processing can't be by oscilloscope display.
Numerical integrating can overcome the shortcoming of above-mentioned hardware integrator method.One of numerical integrating is, with oscillograph the voltage signal of D-dot probe output is measured first, then the voltage signal that utilizes the built-in integral operation module of oscillograph that the D-dot probe is exported carries out Integral Processing, and oscillograph demonstrates the waveform of the voltage signal of the D-dot probe output after the Integral Processing again.Two of numerical integrating is, the voltage signal of exporting with oscilloscope measurement D-dot probe first, then oscillograph sends to computing machine with the voltage signal of D-dot probe output, the waveform of the voltage signal of the D-dot probe output after the voltage signal that computing machine is exported the D-dot probe again carries out Integral Processing and shows Integral Processing.But, when the voltage signal that adopts numerical integrating that the D-dot probe is exported carries out Integral Processing, because there is baseline wander in the voltage signal of D-dot probe output, cause the measuring error of transient electromagnetic field larger.
Be starved of a kind of method that can eliminate the baseline wander of probe output voltage signal.
Summary of the invention
The purpose of this invention is to provide a kind of method of eliminating the baseline wander of probe output voltage signal.
The method of elimination probe output voltage signal provided by the invention baseline wander comprises the steps:
In the situation that probe does not have input signal that the output voltage signal of probe is sampled in advance, obtain the pre-sample waveform of probe output voltage signal;
After pre-sampling, pop one's head in transient electromagnetic field to be measured is measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal;
Described pre-sample waveform and described measurement sample waveform are carried out Integral Processing, the pre-sample waveform after the acquisition Integral Processing and measurement sample waveform;
Pre-sample waveform after the described Integral Processing is carried out linear fit, obtain the linear fit straight line;
Deduct described linear fit straight line with the measurement sample waveform after the described Integral Processing, obtain the true waveform of transient electromagnetic field to be measured.
Preferably, described Integral Processing is for quadraturing to the time.
Preferably, the expression formula of described linear fit straight line is:
y=a+bt
The integrated value of the output voltage signal of probe when wherein, y is pre-sampling; T is the time; B is the slope of linear fit straight line; A is the intercept of linear fit straight line.
Preferably, described step " is popped one's head in after pre-sampling transient electromagnetic field to be measured is measured; the output voltage signal to probe is measured sampling; obtain the measurement sample waveform of probe output voltage signal ": pop one's head in after pre-sampling transient electromagnetic field to be measured is measured, when probe is measured transient electromagnetic field to be measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal.
Preferably, described step " is popped one's head in after pre-sampling transient electromagnetic field to be measured is measured; the output voltage signal to probe is measured sampling; obtain the measurement sample waveform of probe output voltage signal ": pop one's head in after pre-sampling transient electromagnetic field to be measured is measured, after probe is measured transient electromagnetic field to be measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal.
Preferably, described step " the pre-sample waveform after the described Integral Processing is carried out linear fit, obtain linear fit straight line " is: the pre-sample waveform after adopting least square method to described Integral Processing carries out linear fit, obtains the linear fit straight line.
Preferably, described step " deducts described linear fit straight line with the measurement sample waveform after the described Integral Processing; obtain the true waveform of transient electromagnetic field to be measured ": deduct the ordinate value of the point that equates with this abscissa value of described linear fit straight line with the ordinate value of each point of the measurement sample waveform after the described Integral Processing, obtain the true waveform of transient electromagnetic field to be measured.
The present invention has following beneficial effect:
Described method can effectively be eliminated the baseline wander of probe output voltage signal, thereby reduces the measuring error to transient electromagnetic field.
Description of drawings
The process flow diagram of the method for the elimination probe output voltage signal baseline wander that Fig. 1 provides for the embodiment of the invention;
Fig. 2 is the pre-sample waveform of probe output voltage signal and the schematic diagram of measurement test sample waveform;
Fig. 3 is the pre-sample waveform after the Integral Processing and the schematic diagram of measuring sample waveform;
Fig. 4 is the schematic diagram of linear fit straight line;
Fig. 5 is the schematic diagram of the true waveform of transient electromagnetic field to be measured.
Embodiment
Below in conjunction with drawings and Examples summary of the invention of the present invention is further described.
As shown in Figure 1, the method for elimination probe output voltage signal provided by the invention baseline wander comprises the steps:
S1: in the situation that probe does not have input signal that the output voltage signal of probe is sampled in advance, obtain the pre-sample waveform of probe output voltage signal; In the present embodiment, as shown in Figure 2, the output voltage signal of probe is sampled in advance to t1 constantly at moment t0, among Fig. 2 constantly t0 to the waveform of t1 constantly be pre-sample waveform;
S2: after pre-sampling, pop one's head in transient electromagnetic field to be measured is measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal; In the present embodiment, as shown in Figure 2, the output voltage signal of probe is measured sampling at moment t1 to t2 constantly, among Fig. 2 constantly t1 to the waveform of t2 constantly for measuring sample waveform;
S3: pre-sample waveform and measurement sample waveform are carried out Integral Processing, the pre-sample waveform after the acquisition Integral Processing and measurement sample waveform, as shown in Figure 3;
S4: the pre-sample waveform after the Integral Processing is carried out linear fit, obtain the linear fit straight line, as shown in Figure 4;
S5: deduct the linear fit straight line with the measurement sample waveform after the Integral Processing, obtain the true waveform of transient electromagnetic field to be measured, as shown in Figure 5.
In above-mentioned steps S2, when probe is measured transient electromagnetic field to be measured, the output voltage signal of probe is measured sampling, perhaps after probe is measured transient electromagnetic field to be measured, the output voltage signal of probe is measured sampling.
In above-mentioned steps S3, Integral Processing is for quadraturing to the time.
In above-mentioned steps S4, the expression formula of linear fit straight line is:
y=a+bt
Wherein, the integrated value of the output voltage signal of probe when y is pre-sampling, its unit is Vs; T is the time, and its unit is s; B is the slope of linear fit straight line; A is the intercept of linear fit straight line.Preferably, the pre-sample waveform after adopting least square method to Integral Processing carries out linear fit.
In above-mentioned steps S5, deduct the ordinate value of the point that equates with this abscissa value of linear fit straight line with the ordinate value of each point of the measurement sample waveform after the Integral Processing.
Should be appreciated that the above detailed description of technical scheme of the present invention being carried out by preferred embodiment is illustrative and not restrictive.Those of ordinary skill in the art is reading on the basis of instructions of the present invention and can make amendment to the technical scheme that each embodiment puts down in writing, and perhaps part technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (7)
1. a method of eliminating the baseline wander of probe output voltage signal is characterized in that, the method comprises the steps:
In the situation that probe does not have input signal that the output voltage signal of probe is sampled in advance, obtain the pre-sample waveform of probe output voltage signal;
After pre-sampling, pop one's head in transient electromagnetic field to be measured is measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal;
Described pre-sample waveform and described measurement sample waveform are carried out Integral Processing, the pre-sample waveform after the acquisition Integral Processing and measurement sample waveform;
Pre-sample waveform after the described Integral Processing is carried out linear fit, obtain the linear fit straight line;
Deduct described linear fit straight line with the measurement sample waveform after the described Integral Processing, obtain the true waveform of transient electromagnetic field to be measured.
2. the method for elimination probe output voltage signal according to claim 1 baseline wander is characterized in that, described Integral Processing is for quadraturing to the time.
3. the method for elimination probe output voltage signal according to claim 1 baseline wander is characterized in that, the expression formula of described linear fit straight line is:
y=a+bt
The integrated value of the output voltage signal of probe when wherein, y is pre-sampling; T is the time; B is the slope of linear fit straight line; A is the intercept of linear fit straight line.
4. the method for elimination according to claim 1 probe output voltage signal baseline wander, it is characterized in that, described step " is popped one's head in after pre-sampling transient electromagnetic field to be measured is measured; the output voltage signal to probe is measured sampling; obtain the measurement sample waveform of probe output voltage signal ": pop one's head in after pre-sampling transient electromagnetic field to be measured is measured, when probe is measured transient electromagnetic field to be measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal.
5. the method for elimination according to claim 1 probe output voltage signal baseline wander, it is characterized in that, described step " is popped one's head in after pre-sampling transient electromagnetic field to be measured is measured; the output voltage signal to probe is measured sampling; obtain the measurement sample waveform of probe output voltage signal ": pop one's head in after pre-sampling transient electromagnetic field to be measured is measured, after probe is measured transient electromagnetic field to be measured, the output voltage signal of probe is measured sampling, obtain the measurement sample waveform of probe output voltage signal.
6. the method for elimination according to claim 1 probe output voltage signal baseline wander, it is characterized in that, described step " is carried out linear fit to the pre-sample waveform after the described Integral Processing; obtain the linear fit straight line ": the pre-sample waveform after adopting least square method to described Integral Processing carries out linear fit, obtains the linear fit straight line.
7. the method for elimination according to claim 1 probe output voltage signal baseline wander, it is characterized in that, described step " deducts described linear fit straight line with the measurement sample waveform after the described Integral Processing; obtain the true waveform of transient electromagnetic field to be measured ": deduct the ordinate value of the point that equates with this abscissa value of described linear fit straight line with the ordinate value of each point of the measurement sample waveform after the described Integral Processing, obtain the true waveform of transient electromagnetic field to be measured.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105354006A (en) * | 2015-11-27 | 2016-02-24 | 中国科学院计算技术研究所 | Quick operation device and method of nonlinear function |
| CN112932475A (en) * | 2021-02-01 | 2021-06-11 | 武汉泰利美信医疗科技有限公司 | Method and device for calculating blood oxygen saturation, electronic equipment and storage medium |
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| JP2002372558A (en) * | 2001-06-15 | 2002-12-26 | Canon Inc | Electromagnetic wave measuring device |
| CN102185609A (en) * | 2011-03-01 | 2011-09-14 | 中国科学院等离子体物理研究所 | Method for deducting integration drift by using curve fitting |
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| JPH11108972A (en) * | 1997-10-02 | 1999-04-23 | Toshiba Corp | Power measuring instrument |
| JP2002372558A (en) * | 2001-06-15 | 2002-12-26 | Canon Inc | Electromagnetic wave measuring device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105354006A (en) * | 2015-11-27 | 2016-02-24 | 中国科学院计算技术研究所 | Quick operation device and method of nonlinear function |
| CN112932475A (en) * | 2021-02-01 | 2021-06-11 | 武汉泰利美信医疗科技有限公司 | Method and device for calculating blood oxygen saturation, electronic equipment and storage medium |
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