CN103336207A - Device and method for testing affect of pressure on capacity characteristic of chip ceramic capacitor - Google Patents
Device and method for testing affect of pressure on capacity characteristic of chip ceramic capacitor Download PDFInfo
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- CN103336207A CN103336207A CN2013102649159A CN201310264915A CN103336207A CN 103336207 A CN103336207 A CN 103336207A CN 2013102649159 A CN2013102649159 A CN 2013102649159A CN 201310264915 A CN201310264915 A CN 201310264915A CN 103336207 A CN103336207 A CN 103336207A
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- ceramic capacitor
- chip ceramic
- pressure
- pcb board
- lifting arm
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a device for testing the affect of pressure on the capacity characteristic of a chip ceramic capacitor. One end of the chip ceramic capacitor is perpendicularly welded to a PCB (Printed Circuit Board); the device comprises an upright column, a lifting arm capable of being driven to vertically move up and down on the upright column, a push-pull meter fixedly arranged at the end part of the lifting arm, a carrier board fixedly arranged under the push-pull meter and provided with a PCB limiting mechanism arranged thereon, and a capacitor capacity tester, wherein one end of the capacitor capacity tester is communicated with the welding pole of the chip ceramic capacitor via the PCB, and the other end of the capacitor capacity tester is communicated with the other pole of the chip ceramic capacitor. The chip ceramic capacitor is welded to the PCB and then is measured, the application environment and assembling detection environment of the chip ceramic capacitor can be effectively simulated, the effectiveness of the detection result is improved, meanwhile, pressure is exerted on the chip ceramic capacitor via the push-pull meter, and controllability and readability of the pressure can be achieved so as to facilitate measurement and improve convenience in application.
Description
Technical field
The present invention relates to field of mechanical technique, particularly relate to a kind of test pressure to the device and method of chip ceramic capacitor capacity characteristic influence.
Background technology
The electrical characteristics of producing last several roads technology in the chip ceramic capacitor technology and mainly be electric capacity detect, in automaticity increasingly mature today, capacity check mainly is that equipment detects automatically, in chip ceramic capacitor is detected automatically, two detection heads of equipment can with two end in contact of ceramic condenser, two of equipment detection heads will produce certain pressure at the electric capacity two ends like this, different equipment pressure is in different size, whether this pressure can exert an influence to the detection of chip ceramic capacitor, how many influence degrees is is not all known,, therefore press for and develop a kind of power that can detect to the apparatus and method of chip ceramic electrical characteristics influence.
Summary of the invention
The objective of the invention is at the technological deficiency that exists in the prior art, and the device and method of a kind of test pressure to the influence of chip ceramic capacitor capacity characteristic is provided.
For realizing that the technical scheme that purpose of the present invention adopts is:
A kind of test pressure is to the device of chip ceramic capacitor capacity characteristic influence, described chip ceramic capacitor one end vertically welds with pcb board, described device comprises column, can be driven the lifting arm that vertically moves up and down at described column, be fixedly installed on the pull and push dynamometer of lifting arm end, be fixedly installed on pull and push dynamometer below and it is provided with the support plate of pcb board position-limit mechanism, and capacitance tester, described capacitance tester one end is communicated with the described chip ceramic capacitor welding utmost point by described pcb board, and the other end is communicated with another utmost point of chip ceramic capacitor by lead.
Described lifting arm is driven by stepper motor and moves up and down.
Stepped side's groove of a plurality of concentric settings of described pcb board position-limit mechanism.
But be arranged on the lifting arm to described pull and push dynamometer left and right adjusting.
A kind of test pressure may further comprise the steps the method for chip ceramic capacitor capacity characteristic influence,
1) described chip ceramic capacitor is communicated with to realize that with capacitance tester capacitance tester is to the detection of chip ceramic capacitor capacity characteristic with the pcb board welding and with described PCB two outputs;
2) exert pressure at described chip ceramic capacitor top and record the capacitance tester registration of correspondence when applying this pressure;
3) increase force value and the corresponding capacitance tester registration of record at interval.
Compared with prior art, the invention has the beneficial effects as follows:
Chip ceramic capacitor is welded on the pcb board measures again, can effectively simulate its environment for use and assembling testing environment, improve the validity of testing result, utilize pull and push dynamometer that chip ceramic capacitor is carried out the application of force simultaneously, can realize controlled readable measurement, the raising ease of use be convenient to of pressure.Can be well embody relation between pressure and the electric capacity by the result, be convenient to aborning it be revised or contact force is controlled, guarantee the accurate operation of automatic production line, improve the quality of products and the integral product quality of stability.
Description of drawings
Figure 1 shows that measurement mechanism structural representation of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments the present invention is described in further detail.Should be appreciated that specific embodiment described herein only in order to explaining the present invention, and be not used in restriction the present invention.
As shown in Figure 1, test pressure of the present invention is to the device of chip ceramic capacitor capacity characteristic influence, comprise column 1, can be driven the lifting arm 2 that vertically moves up and down at described column, be fixedly installed on the pull and push dynamometer 3 of lifting arm end, be fixedly installed on support plate and the capacitance tester 4 of pull and push dynamometer below, wherein, the one-level of described chip ceramic capacitor 5 is vertically fixing with pcb board 6 welding, then described support plate is provided with the support plate of pcb board position-limit mechanism accordingly, binding post of described capacitance tester is communicated with described chip ceramic capacitor by described pcb board, and another binding post directly is communicated with another utmost point at patch capacitor top by lead.
Chip ceramic capacitor is welded on the pcb board measures again, can effectively simulate its environment for use and assembling testing environment, improve the validity of testing result, utilize pull and push dynamometer that chip ceramic capacitor is carried out the application of force simultaneously, can realize controlled readable measurement, the raising ease of use be convenient to of pressure.
As preferred version, described lifting arm is driven by stepper motor and moves up and down, and adopts step motor control can realize that the stable interval of the pull and push dynamometer application of force is adjustable, can guarantee the stability of pressure after the application of force simultaneously, improves the accuracy of measurement result.
As preferred version, stepped side's groove of a plurality of concentric settings of described pcb board position-limit mechanism, multistage groove type design can realize the pcb board location to different size, select the pcb board of different size specifications at different patch capacitors, more can fit its use and assembly environment guarantee that result data is reliable.
Simultaneously, but be arranged on the lifting arm to described pull and push dynamometer left and right adjusting, but should left and right adjusting can realize that the position of pull and push dynamometer is adjustable to guarantee that the contact of pull and push dynamometer just in time is pressed on the patch capacitor by the cooperation of elongated slot bolt or track slide block, guarantee normally carrying out of measurement.
Adopt the said apparatus test pressure to the method for chip ceramic capacitor capacity characteristic influence, may further comprise the steps,
1) described chip ceramic capacitor is communicated with to realize that with capacitance tester capacitance tester is to the detection of chip ceramic capacitor capacity characteristic with the pcb board welding and with described PCB two outputs;
2) exert pressure at described chip ceramic capacitor top and record the capacitance tester registration of correspondence when applying this pressure;
3) increase force value and the corresponding capacitance tester registration of record at interval.
Adopt this scheme to measure, can be well embody relation between pressure and the electric capacity by the result, be convenient to aborning it be revised or contact force is controlled, guarantee the accurate operation of automatic production line, improve the quality of products and the integral product quality of stability.
The above only is preferred implementation of the present invention; should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the principle of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (5)
1. a test pressure is to the device of chip ceramic capacitor capacity characteristic influence, it is characterized in that, described chip ceramic capacitor one end vertically welds with pcb board, described device comprises column, can be driven the lifting arm that vertically moves up and down at described column, be fixedly installed on the pull and push dynamometer of lifting arm end, be fixedly installed on pull and push dynamometer below and it is provided with the support plate of pcb board position-limit mechanism, and capacitance tester, described capacitance tester one end is communicated with the described chip ceramic capacitor welding utmost point by described pcb board, and the other end is communicated with another utmost point of chip ceramic capacitor by lead.
2. device as claimed in claim 1 is characterized in that, described lifting arm is driven by stepper motor and moves up and down.
3. device as claimed in claim 2 is characterized in that, stepped side's groove of a plurality of concentric settings of described pcb board position-limit mechanism.
4. device as claimed in claim 3 is characterized in that, but described pull and push dynamometer left and right adjusting be arranged on the lifting arm.
5. a test pressure is characterized in that the method that the chip ceramic capacitor capacity characteristic influences, may further comprise the steps,
1) described chip ceramic capacitor is communicated with to realize that with capacitance tester capacitance tester is to the detection of chip ceramic capacitor capacity characteristic with the pcb board welding and with described PCB two outputs;
2) exert pressure at described chip ceramic capacitor top and record the capacitance tester registration of correspondence when applying this pressure;
3) increase force value and the corresponding capacitance tester registration of record at interval.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013102649159A CN103336207A (en) | 2013-06-27 | 2013-06-27 | Device and method for testing affect of pressure on capacity characteristic of chip ceramic capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013102649159A CN103336207A (en) | 2013-06-27 | 2013-06-27 | Device and method for testing affect of pressure on capacity characteristic of chip ceramic capacitor |
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| Publication Number | Publication Date |
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| CN103336207A true CN103336207A (en) | 2013-10-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2013102649159A Pending CN103336207A (en) | 2013-06-27 | 2013-06-27 | Device and method for testing affect of pressure on capacity characteristic of chip ceramic capacitor |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103901304A (en) * | 2014-03-31 | 2014-07-02 | 天津三星电机有限公司 | Detection block pressure parameter uniformity detection device and method |
| CN106017269A (en) * | 2016-07-12 | 2016-10-12 | 苏州宏泉高压电容器有限公司 | High-voltage ceramic capacitor ceramic dielectric chip thickness detection device |
| CN114910827A (en) * | 2022-05-13 | 2022-08-16 | 滁州市技术监督检测中心 | Device for detecting the influence of locking on the capacitance of a variable capacitor |
Citations (5)
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| US20110004861A1 (en) * | 2009-07-03 | 2011-01-06 | Samsung Electronics Co., Ltd. | Method of designing a printed circuit board, and package test device having the printed circuit board |
| CN202018492U (en) * | 2011-02-23 | 2011-10-26 | 天津三星电机有限公司 | System for detecting and acquiring pressure resistant data of capacitor |
| CN202305064U (en) * | 2011-09-30 | 2012-07-04 | 厦门盈趣科技股份有限公司 | Elastic automatic tester |
| CN202599979U (en) * | 2012-01-19 | 2012-12-12 | 南昌欧菲光科技有限公司 | Tool for detecting performance of capacitive touch screen |
| CN203479922U (en) * | 2013-06-27 | 2014-03-12 | 天津三星电机有限公司 | Device for testing impact on capacity characteristics of SMD ceramic capacitor from pressure |
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2013
- 2013-06-27 CN CN2013102649159A patent/CN103336207A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110004861A1 (en) * | 2009-07-03 | 2011-01-06 | Samsung Electronics Co., Ltd. | Method of designing a printed circuit board, and package test device having the printed circuit board |
| CN202018492U (en) * | 2011-02-23 | 2011-10-26 | 天津三星电机有限公司 | System for detecting and acquiring pressure resistant data of capacitor |
| CN202305064U (en) * | 2011-09-30 | 2012-07-04 | 厦门盈趣科技股份有限公司 | Elastic automatic tester |
| CN202599979U (en) * | 2012-01-19 | 2012-12-12 | 南昌欧菲光科技有限公司 | Tool for detecting performance of capacitive touch screen |
| CN203479922U (en) * | 2013-06-27 | 2014-03-12 | 天津三星电机有限公司 | Device for testing impact on capacity characteristics of SMD ceramic capacitor from pressure |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103901304A (en) * | 2014-03-31 | 2014-07-02 | 天津三星电机有限公司 | Detection block pressure parameter uniformity detection device and method |
| CN106017269A (en) * | 2016-07-12 | 2016-10-12 | 苏州宏泉高压电容器有限公司 | High-voltage ceramic capacitor ceramic dielectric chip thickness detection device |
| CN114910827A (en) * | 2022-05-13 | 2022-08-16 | 滁州市技术监督检测中心 | Device for detecting the influence of locking on the capacitance of a variable capacitor |
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Application publication date: 20131002 |