CN103336147A - High-frequency vibration clamp device for scanning ion conductance microscope - Google Patents
High-frequency vibration clamp device for scanning ion conductance microscope Download PDFInfo
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- CN103336147A CN103336147A CN2013102637630A CN201310263763A CN103336147A CN 103336147 A CN103336147 A CN 103336147A CN 2013102637630 A CN2013102637630 A CN 2013102637630A CN 201310263763 A CN201310263763 A CN 201310263763A CN 103336147 A CN103336147 A CN 103336147A
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- dither
- clamper
- microscopical
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- ion electricity
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Abstract
The invention discloses a high-frequency vibration clamp device for a scanning ion conductance microscope. The clamp device comprises a tubular clamp sleeve for clamping a glass micropipette probe, wherein an annular flange is arranged outside the tubular clamp sleeve; the lower part of the annular flange is connected with an elastic element; the lower end of the elastic element is fixed to a fixing bottom plate; an annular piezoelectric ceramic piece is arranged on the upper surface of the annular flange; the annular piezoelectric ceramic piece is fixedly connected onto a fixing top plate; the fixing bottom plate is fixedly connected with the fixing top plate; the annular piezoelectric ceramic piece vibrates after being communicated with a drive circuit to drive the tubular clamp sleeve and the glass micropipette probe to generate a high-frequency vibration in the vertical direction. According to the clamp device, the independently driven annular piezoelectric ceramic piece is adopted and driven to vibrate for driving the glass micropipette probe to generate the high-frequency vibration in the vertical direction to generate an alternating-current feedback signal so as to effectively overcome the ionic current drift and increase the scanning speed.
Description
Technical field
The invention belongs to the scan ion electricity and lead the microscope imaging technical field, relate to a kind of scan ion electricity and lead microscopical dither clamper.
Background technology
The scan ion electricity is led microscope (Scanning ion conductance microscopy, SICM) as a member in the scanning probe microscopy family, be to be widely used in nano grade biological imaging (as the imaging of cardiac muscle cell, renal epithelial cell, neuron etc.) at present in the world, to study a kind of novel microscope of biological 26S Proteasome Structure and Function.The scan ion electricity is led microscope can carry out imaging contactless, harmless, nanometer resolution to tested sample under liquid physiological condition, do not require that simultaneously tested sample has electric conductivity, thereby have very outstanding advantage in the imaging field of active somatic cell.
The scan ion electricity is led one of subject matter that microscope exists in scanning process be the drift of gas current.The reason complexity that produces drift is various, and for example the evaporation of electrolytic solution causes the variation of ionic strength in the electrolytic cell, thermal drift, and the instability of silver/silver chloride electrode surface potential, the glass micro pipette is stopped up by the impurity in the electrolytic cell, and power supply status changes etc.Another subject matter is sweep velocity.The factor that influences sweep velocity has: the complexity of sample surface pattern, imaging size, imaging resolution (number of pixels that imaging is required), the translational speed of probe and track etc. during scanning.Because it is vertically mobile only to use a piezoelectric ceramics to drive probe in the prior art, make probe, piezoelectric ceramics and other annexes fixing as a whole, this makes the resonance frequency of piezoelectric ceramics be limited in about 1kHz, becomes the principal element that influences sweep velocity.In addition, improving the scan ion electricity and lead microscopical imaging capability, namely can carry out imaging to the surface of various complexities, also is an important problems.
In order to solve the gas current drifting problem, improve sweep velocity and scan ion electricity and lead microscopical imaging capability, researchers constantly develop and the multiple method of utilizing FEEDBACK CONTROL to regulate the probe motion track, are called for short scan pattern (scanning mode).Document (1) Hansma P K, Drake B, et al, The scanning ion-conductance microscope, Science, 1989,243 (4891): 641-643 is that the scan ion electricity is led the sign that microscope is born, employing be DC mode (DC mode), DC mode is easy to generate the gas current drift, and be not suitable for the very big sample of surface elevation fluctuating, very easily cause the probe fracture; Document (2) Shevchuk A I, Gorelik J, Eet al.Simultaneous measurement of Ca2+and cellular dynamics:Combined scanning ion conductance and optical microscopy to study contracting cardiac myocytes.Biophysical Journal, 2001,81 (3): 1759-1764. has proposed AC mode (AC mode), AC mode is fed back with AC signal, can effectively overcome the drift of gas current, and response speed is than fast with direct current signal feedback, but this pattern only is applicable to the rise and fall sample of less or intermediate complex of surface elevation; Document (3) Novak P, Li C, et al.Nanoscale live-cell imaging using hopping probe ion conductance microscopy.Nature Methods, 2009, proposed dancing mode (Hopping mode) at 6 (12): 935., the imaging capability of dancing mode is the strongest, namely can carry out imaging by the very big sample of his-and-hers watches face height relief, but sweep velocity is relatively slow, and because use the direct current signal feedback, so pixel of every detection must upgrade once with reference to gas current, otherwise is easy to produce dc shift; Document (4) Zhukov A, Richards O, et al.A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging.Ultramicroscopy, 2012,121:1-7. proposed the FSICM pattern, its sweep velocity is exceedingly fast, and can obtain a large amount of pixels, but it is comparatively smooth that FSICM only is applicable to the surface, and have a large amount of suitable with the probe tip internal diameter size or littler characteristic imagings, along with the increase of single file sweep limit, the gas current drift phenomenon will be more remarkable simultaneously.
By above-mentioned document as can be known, AC mode can effectively overcome the drift of gas current, and dancing mode can carry out imaging to the very big sample of surperficial height relief, and the resonance frequency that drives the piezoelectric ceramics of probe motion is the key factor of restriction sweep velocity.The described method of above-mentioned document all is to study from the scan pattern aspect of probe singlely, pays close attention to less to the physical construction design aspect.
Summary of the invention
The problem that the present invention solves is to provide a kind of scan ion electricity to lead microscopical dither clamper, lead the gas current drifting problem that microscope occurs to solve the scan ion electricity in scanning process, improve the scan ion electricity simultaneously and lead microscopical sweep velocity and imaging capability.
The present invention is achieved through the following technical solutions:
A kind of scan ion electricity is led microscopical dither clamper, the tubulose retaining sleeve that comprises clamping glass micro pipette probe, described tubulose retaining sleeve outside is provided with annular flange flange, and the annular flange flange below is connected with flexible member, and the flexible member lower end is fixed on the fixed base plate; The upper surface of described annular flange flange is placed with the ring piezoelectric potsherd, and the ring piezoelectric potsherd is fixedly connected on fixedly on the top board, and fixed base plate is fixedlyed connected with fixing top board; The ring piezoelectric potsherd is communicated with after vibration with driving circuit, drives tubulose retaining sleeve and glass micro pipette probe and makes dither in the vertical direction.
After described glass micro pipette probe was made dither in the vertical direction, it was AC signal that the scan ion electricity is led the signal that microscopical data acquisition unit receives.
Described data acquisition unit is gathered AC signal by micro current amplifier.
Described dither clamper is fixed on the Z-direction piezoelectric ceramics, and the Z-direction piezoelectric ceramics can be regulated the movement in vertical direction of glass micro pipette probe with after controller is communicated with.
Regulate vibration frequency and the amplitude of glass micro pipette probe by the excited frequency of regulating annular piezoelectric ceramic piece.
The inwall of described tubulose retaining sleeve also is attached with elastic coating.
Resonance frequency with described dither clamper maximizes as objective function, with the parameters of basic dimensions of described tubulose retaining sleeve and material parameter as variable, after being optimized analysis by limited element analysis technique, can determine the dimensional parameters of tubulose retaining sleeve and the optimal value of material parameter.
Described fixedly top board is connected by bolt, nut with fixed base plate.
Compared with prior art, the present invention has following beneficial technical effects:
Scan ion electricity provided by the invention is led microscopical dither clamper, carry out Optimization of Mechanical Design by the clamp structure to glass micro pipette probe, and the independent ring piezoelectric potsherd that drives of employing, drive annular piezoelectric ceramic piece generation vibration and drive glass micro pipette probe and make dither in the vertical direction, can produce the interchange feedback signal, shorten data acquisition time simultaneously, thereby effectively overcome gas current drift, and help to improve the scan ion electricity and lead microscopical sweep velocity and imaging capability.
With respect to the jump scanning pattern that adopts the direct current signal feedback, the present invention can more effectively overcome the drift phenomenon of gas current.
Further, scan ion electricity provided by the invention is led microscopical dither clamper, can also connect the Z-direction piezoelectric ceramics, ring piezoelectric pottery and two blocks of piezoelectric ceramics of Z-direction piezoelectric ceramics have so just been adopted, be respectively applied to drive the dither of probe and the movement of probe vertical direction, effectively improved the sweep velocity of probe, made the scan ion electricity lead the imaging capability that microscope has the jump scanning pattern simultaneously.
And the present invention can also lead Optimization of Mechanical Design theory, limited element analysis technique microscopical scan pattern with the scan ion electricity and have complementary advantages, on the basis of the superperformance that keeps prior art, further improved the scan ion electricity and led microscopical combination property, and not with serious sacrifice in a certain respect performance be the cost lifting of performance on the other hand of going to covet.
Can also be with the maximization of the resonance frequency of described dither clamper as objective function, as design variable, be optimized analysis with the parameters of basic dimensions of described dither clamper and material parameter; Like this with Optimization of Mechanical Design theory, limited element analysis technique with the scan ion electricity lead microscopical ac sweep pattern, the jump scanning pattern is had complementary advantages, co-design, the dither clamper that just can be optimized.
Description of drawings
Fig. 1 leads the structural representation (axonometric drawing) of microscopical dither clamper for the scan ion electricity, for the clear inner structure that shows the dither clamper, cuts open except 1/4th around its central symmetry axis.
Among the figure: 1 is the tubulose retaining sleeve, and 2 is glass micro pipette probe, and 3 is elastic coating, and 4 is annular flange flange, and 5 is flexible member, and 6 is fixed base plate, and 7 is the ring piezoelectric potsherd, and 8 are fixing top board, and 9 is bolt, and 10 is nut, and 11 is the Z-direction piezoelectric ceramics.
Embodiment
The present invention is described in further detail below in conjunction with specific embodiment, and the explanation of the invention is not limited.
Referring to Fig. 1, a kind of scan ion electricity is led microscopical dither clamper, comprises the tubulose retaining sleeve 1 of clamping glass micro pipette probe 2, and described tubulose retaining sleeve 1 outside is provided with annular flange flange 4, annular flange flange 4 belows are connected with flexible member 5, and flexible member 5 lower ends are fixed on the fixed base plate 6; The upper surface of described annular flange flange 4 is placed with ring piezoelectric potsherd 7, and ring piezoelectric potsherd 7 is fixedly connected on the top that fixing top board 8(is arranged on ring piezoelectric potsherd 7) on, fixed base plate 6 is fixedlyed connected with fixing top board 8; Ring piezoelectric potsherd 7 is communicated with after vibration with driving circuit, drives tubulose retaining sleeve 1 and glass micro pipette probe 2 and makes dither in the vertical direction, to produce AC signal, drifts about, improves sweep velocity thereby effectively overcome gas current.
And after glass micro pipette probe 2 was made dither in the vertical direction, it was AC signal that the scan ion electricity is led the signal that microscopical data acquisition unit receives.Described data acquisition unit is gathered AC signal by micro current amplifier.
Described dither clamper is fixed on the Z-direction piezoelectric ceramics 11, Z-direction piezoelectric ceramics 11 is with after controller is communicated with, can be used for regulating glass micro pipette probe 2 movement in vertical direction, make the scan ion electricity lead the imaging capability that microscope has the jump scanning pattern.
Can regulate vibration frequency and the amplitude of glass micro pipette probe 2 by the excited frequency of regulating annular piezoelectric ceramic piece 7.
Concrete, the inwall of described tubulose retaining sleeve 1 also is attached with elastic coating 3, is used for providing clamping force.
Described flexible member 5 is used for supporting described annular flange flange 4, can be spring or other resilient materials, and flexible member 5 can be used for regulating the system stiffness of dither clamper on the one hand, can hold cover for tubulation clamp on the other hand restoring force is provided.
Described fixedly top board 8 is connected by bolt 9, nut 10 with fixed base plate 6.
Resonance frequency with described dither clamper maximizes as objective function, with the parameters of basic dimensions of described tubulose retaining sleeve 1 and material parameter as design variable, after being optimized analysis by limited element analysis technique, can determine the dimensional parameters of tubulose retaining sleeve 1 and the optimal value of material parameter.
Concrete, utilize the optimal design module (Design Explorer module) of ANSYS, import the 3-D geometric model of dither clamper, the parameters of basic dimensions of input tubulose retaining sleeve and the variation range of material parameter, as objective function, be optimized the optimal value that just can obtain each parameter after the analysis with the maximization of the resonance frequency of described dither clamper.
Claims (8)
1. a scan ion electricity is led microscopical dither clamper, it is characterized in that, the tubulose retaining sleeve (1) that comprises clamping glass micro pipette probe (2), described tubulose retaining sleeve (1) outside is provided with annular flange flange (4), annular flange flange (4) below is connected with flexible member (5), and flexible member (5) lower end is fixed on the fixed base plate (6); The upper surface of described annular flange flange (4) is placed with ring piezoelectric potsherd (7), and ring piezoelectric potsherd (7) is fixedly connected on fixedly on the top board (8), and fixed base plate (6) is fixedlyed connected with fixing top board (8); Ring piezoelectric potsherd (7) is communicated with after vibration with driving circuit, drives tubulose retaining sleeve (1) and glass micro pipette probe (2) and makes dither in the vertical direction.
2. scan ion electricity as claimed in claim 1 is led microscopical dither clamper, it is characterized in that, after glass micro pipette probe (2) was made dither in the vertical direction, it was AC signal that the scan ion electricity is led the signal that microscopical data acquisition unit receives.
3. scan ion electricity as claimed in claim 2 is led microscopical dither clamper, it is characterized in that, described data acquisition unit is gathered AC signal by micro current amplifier.
4. scan ion electricity as claimed in claim 1 is led microscopical dither clamper, it is characterized in that, described dither clamper is fixed on the Z-direction piezoelectric ceramics (11), Z-direction piezoelectric ceramics (11) can be regulated glass micro pipette probe (2) movement in vertical direction with after controller is communicated with.
5. scan ion electricity as claimed in claim 1 is led microscopical dither clamper, it is characterized in that, regulates vibration frequency and the amplitude of glass micro pipette probe (2) by the excited frequency of regulating annular piezoelectric ceramic piece (7).
6. scan ion electricity as claimed in claim 1 is led microscopical dither clamper, it is characterized in that, the inwall of described tubulose retaining sleeve (1) also is attached with elastic coating (3).
7. scan ion electricity as claimed in claim 1 is led microscopical dither clamper, it is characterized in that, resonance frequency with described dither clamper maximizes as objective function, with (1) parameters of basic dimensions of described tubulose retaining sleeve and material parameter as design variable, after being optimized analysis by limited element analysis technique, can determine the dimensional parameters of tubulose retaining sleeve (1) and the optimal value of material parameter.
8. scan ion electricity as claimed in claim 1 is led microscopical dither clamper, it is characterized in that, described fixedly top board (8) is connected by bolt (9), nut (10) with fixed base plate (6).
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| CN201310263763.0A CN103336147B (en) | 2013-06-27 | 2013-06-27 | High-frequency vibration clamp device for scanning ion conductance microscope |
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| CN201310263763.0A CN103336147B (en) | 2013-06-27 | 2013-06-27 | High-frequency vibration clamp device for scanning ion conductance microscope |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104155479A (en) * | 2014-07-15 | 2014-11-19 | 大连理工大学 | Probe frame for modular scanning probe microscope |
| CN105445499A (en) * | 2015-12-16 | 2016-03-30 | 四川大学 | Scanning ion conductance microscopy glass probe clamping and illuminating device |
| CN105842485A (en) * | 2016-03-21 | 2016-08-10 | 西安交通大学 | Dual-probe scanning ionic conductive microscope system based on balance bridge and imaging method thereof |
| CN107015031A (en) * | 2017-05-22 | 2017-08-04 | 西安交通大学 | Dither objective table and SICM systems and scan method based on the objective table |
| CN110530942A (en) * | 2019-07-31 | 2019-12-03 | 西安交通大学 | A kind of clamping of electrochemistry experiment bench microprobe and fixed device |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104155479A (en) * | 2014-07-15 | 2014-11-19 | 大连理工大学 | Probe frame for modular scanning probe microscope |
| CN104155479B (en) * | 2014-07-15 | 2016-08-17 | 大连理工大学 | Modular scanning probe microscopy probe carriage |
| CN105445499A (en) * | 2015-12-16 | 2016-03-30 | 四川大学 | Scanning ion conductance microscopy glass probe clamping and illuminating device |
| CN105445499B (en) * | 2015-12-16 | 2017-11-24 | 四川大学 | Scan the clamping of Ion Conductance Microscope glass probe and lighting device |
| CN105842485A (en) * | 2016-03-21 | 2016-08-10 | 西安交通大学 | Dual-probe scanning ionic conductive microscope system based on balance bridge and imaging method thereof |
| CN105842485B (en) * | 2016-03-21 | 2019-01-18 | 西安交通大学 | Double probe scanning Ion Conductance Microscope systems and its imaging method based on balanced bridge |
| CN107015031A (en) * | 2017-05-22 | 2017-08-04 | 西安交通大学 | Dither objective table and SICM systems and scan method based on the objective table |
| CN110530942A (en) * | 2019-07-31 | 2019-12-03 | 西安交通大学 | A kind of clamping of electrochemistry experiment bench microprobe and fixed device |
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| CN103336147B (en) | 2015-05-27 |
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