CN103323793A - System and method for testing accelerated life of LED light source - Google Patents
System and method for testing accelerated life of LED light source Download PDFInfo
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Abstract
The invention relates to a system and method for testing the accelerated life of an LED light source. The system comprises a sample grouping device, a first junction temperature testing device, a heating device, a second junction temperature testing device, a life measuring and calculating device and a heating testing device. Under the condition that the failure mechanism of a driving power supply is not changed, failures are accelerated to find the potential defects of the LED light source through the method of improving the working temperature stress of the LED light source, the service life of the LED light source under a normal temperature stress level is concluded according to an accelerated life test model in an Arrhenius acceleration theory by introducing a confidence coefficient, products are made to be mature in design and process at a speed much higher than that of a traditional design and test, and therefore the total time of a developing process is shortened, the LED light source is made to be capable of being launched early to grab market shares, the product design and process is fast mature, and the developing and manufacturing cost of products is lower.
Description
Technical Field
The invention relates to a system and a method for accelerated life test, in particular to a system and a method for accelerated life test of an LED light source.
Background
With the rapid development of science and technology, the proportion of lighting electricity consumption to the total electricity consumption of the society is larger and larger, the improvement of lighting efficiency and the energy conservation become important means for relieving the shortage of electricity consumption, a semiconductor LED is called as green energy and also serves as one of green and environment-friendly energy, the semiconductor LED not only saves energy and protects environment, but also has the advantages of long service life and high light efficiency, and certainly the LED is widely concerned by various industry fields, so that the service life of the LED is also an important index for measuring the quality of the LED, but the traditional LED light source service life testing method is to carry out long-term service life testing under a normal use state until the LED is damaged or the luminous flux is seriously attenuated to be lower than 50%, the service life of a normal LED can reach ten thousands of hours, so that the testing efficiency is low, the research and development cycle of products is prolonged, and.
Disclosure of Invention
The present invention provides a system and a method for testing an accelerated lifetime of an LED light source, aiming at the above-mentioned defects in the prior art.
The technical scheme adopted by the invention for solving the technical problems is as follows: an accelerated life test system of LED light source is composed of
A sample grouping means for equally dividing the N samples into a plurality of groups, and setting one of the plurality of groups as a normal group and the remaining groups as a control group;
the first junction temperature testing device is used for testing the junction temperature of the conventional group of samples at normal temperature;
a heating device for heating each control group;
the second junction temperature testing device is used for testing the junction temperature of each comparison group sample in a heating state;
the service life measuring and calculating device is used for calculating the confidence coefficient and the service life of the LED of each comparison group in the heating state;
and the heating test device is used for obtaining the service life of the LED light source at normal temperature based on the confidence coefficient calculated by the measuring and calculating device and the LED service life of each comparison group in the heating state.
The accelerated life test system for the LED light source, disclosed by the invention, is characterized in that the temperature for heating each comparison group by the heating device is less than the junction temperature of the samples of the conventional group at normal temperature.
The invention discloses an accelerated life test system of an LED light source, wherein a life measuring device comprises
The confidence measure and calculation module is used for calculating the confidence;
and the service life measuring and calculating module is used for calculating the service life of the LED of each comparison group in the heating state.
The LED light source accelerated life test system is characterized in that the number N of the samples is greater than or equal to 15.
The other technical scheme adopted by the invention for solving the technical problem is as follows: the accelerated life test method of the LED light source comprises the following steps:
s100, equally dividing the N samples into a plurality of groups, setting one group of the groups as a conventional group, and setting the rest groups as a control group;
s200, testing the junction temperature of the conventional group of samples at normal temperature;
s300, respectively heating each control group;
s400, testing the junction temperature of each control group sample in a heating state
S500, calculating confidence coefficient and life value of each comparison group in a heating state;
s600, obtaining the service life of the LED light source at normal temperature based on the confidence coefficient and the service life value of each comparison group in the heating state.
According to the accelerated life test method of the LED light source, the heating temperature of each comparison group is smaller than the junction temperature of the conventional group sample at normal temperature.
The accelerated life test method of the LED light source, provided by the invention, is characterized in that the junction temperature of the conventional group of samples at normal temperature meets the following requirements:
Tj＝Tc+W×Rj-c+273，
wherein T iscIs the temperature of the LED light source at normal temperature, Rj-cThe thermal resistivity of an LED light source is W, i.e., on voltage × operating current.
The invention discloses an accelerated life test method of an LED light source, wherein the junction temperature of a comparison group sample in a heating state meets the following requirements:
TD＝TCD+W×Rj-c+273，
wherein, TCDTemperature, R, of the LED light source of the control group in the warmed-up statej-cThe thermal resistivity of an LED light source is W, i.e., on voltage × operating current.
The accelerated life test method of the LED light source, provided by the invention, is characterized in that the life value of each comparison group in a heating state meets the requirement
Wherein, Pt＝P0×0.7，P0The initial luminous flux of the control group and t is the power-on working time of the control group at the temperature point.
The LED light source accelerated life testing method is characterized in that the number N of the samples is 15, 5 samples are set as the conventional group, the other 10 samples are equally divided into two groups and set as the control group, and then the confidence coefficient is obtained
The service life value of the LED light source at normal temperature
Wherein,Tmou1and Tmou2Respectively the junction temperatures, T, of the two control groups in the heating statejIs the junction temperature of the samples of the conventional group at normal temperature.
The system and the method for testing the accelerated service life of the LED light source have the following beneficial effects: the method accelerates the failure to find potential defects by improving the working temperature stress of the driving power supply under the condition of keeping the failure mechanism of the driving power supply unchanged, deduces the service life of the driving power supply under the normal temperature stress level according to an accelerated service life test model in the attritor acceleration theory and the introduced confidence coefficient, and leads the product to be mature on design and process at a much higher speed than the traditional design and test, thereby shortening the total time of the development process, putting the product on the market early, seizing the market share, realizing fast product design and process maturation and lowering the product development and production cost.
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The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a flow chart of an accelerated life testing method of an LED light source according to the present invention.
Detailed Description
In a preferred embodiment of the present invention, the system for testing the accelerated lifetime of the LED light source includes a sample grouping device, a first junction temperature testing device, a heating device, a second junction temperature testing device, a calculating device, and a heating testing device.
The sample grouping device equally divides the N samples into a plurality of groups, and sets one of the plurality of groups as a normal group and the remaining groups as a control group. The distinction between the conventional group and the control group can be achieved by some conventional methods, such as labeling. In this embodiment, the sample is an LED light source.
The first junction temperature testing device is used for testing the junction temperature of a conventional group of samples, and is realized by connecting an aluminum substrate of the sample with a thermocouple for heating, wherein the junction temperature refers to the highest temperature of an actual semiconductor chip (wafer and bare chip) in electronic equipment, and is generally higher than the temperature of a shell and the surface temperature of a device. The purpose of testing the junction temperature of the samples of the conventional set is to select a test temperature for the subsequent accelerated test, which should not be higher than the junction temperature of the samples at normal temperature.
The heating device heats the samples of the control groups, so that the samples of the control groups work for a certain time at the temperature higher than the normal temperature.
The second junction temperature testing device is used for testing the junction temperature of each control group sample under the heating state;
the measuring and calculating device calculates the service life of each control group of LEDs respectively in the heating state, and then calculates the value of confidence coefficient according to the service life value of each control group of samples in the heating state, wherein the confidence coefficient is also called activation energy.
The heating test device further obtains the service life of the LED light source at normal temperature based on the confidence coefficient calculated by the measuring and calculating device and the service life of the LED of each control group sample in the heating state.
It is worth noting that the temperature for heating the samples in the control group by the heating device is higher than the normal temperature and is also lower than the junction temperature of the samples in the conventional group at the normal temperature.
Preferably, the estimation device may further include a lifetime estimation module for calculating the lifetime of the LED in the heating state of each of the control group samples, and a confidence estimation module for calculating confidence. And in order to improve the accuracy of the test while further reducing the time of the test, the number N of the above-mentioned test samples should be greater than or equal to 15.
In another preferred embodiment of the invention: an accelerated life test method of an LED light source is constructed, and comprises the following steps:
s100, equally dividing N samples into a plurality of groups, setting one group of the groups as a conventional group, and setting the rest groups as a control group, wherein in the embodiment, the samples are LED light sources;
s200, testing the junction temperature of the conventional group of samples at normal temperature;
s300, respectively heating the samples of the control groups;
s400, testing the junction temperature of each control group sample in a heating state;
s500, calculating confidence coefficient and life value of each control group sample in a heating state;
s600, obtaining the service life of the LED light source at normal temperature based on the confidence coefficient and the service life value of each comparison group sample in the heating state.
It is noted that the temperature of the samples in the control group is lower than the junction temperature of the samples in the conventional group at normal temperature. And the junction temperature of the samples in the conventional group at normal temperature meets the following requirements: t isj＝Tc+W×Rj-c+273 wherein TcIs the temperature of the LED light source at normal temperature, Rj-cThe thermal resistivity of an LED light source is generally provided by a manufacturer of the LED light source, and W is the on-voltage × the operating current.
In addition, the accelerated life test method of the LED light source also comprises the step of testing the initial luminous flux of each control group sample. According to the measured initial luminous flux, the following formula can be adopted to obtain the service life value of each control group in the heating state
Wherein, Pt＝P0X 0.7, i.e. the value of the control sample at which the luminous flux decays to 70%, P0The initial luminous flux of the control sample, and t is the power-on working time of the control sample at the temperature point.
The junction temperature of the control group samples in the heating state meets the following conditions:
TD＝TCD+W×Rj-c+273，
if the number of samples N in the preferred embodiment of the present invention is 15 and 5 of them are set as a normal group and the remaining 10 are equally divided into two groups and set as a control group, the confidence can be obtained by the following formula:
furthermore, the life value of the LED light source at normal temperature can be represented by the formula:
Wherein,
Tmou1and Tmou2The junction temperatures T of the samples of the two control groups in the heating state are respectivelyjThe junction temperature of the samples in the conventional group at normal temperature.
The accelerated lifetime testing method for the LED light source is described in more detail by an example as follows:
and (3) carrying out accelerated life test on a certain type of LED light source, namely taking 15 LED light source samples, equally dividing the LED light source samples into three groups, wherein 1-5# is a conventional group, and 6-10# and 11-15# are control groups. The ambient temperature of # 6 to # 11 was 114 degrees, and the ambient temperature of # 11 to # 15 was 132 degrees. The junction temperature of the LED light source at normal temperature is tested by using the No. 1-5 sample, the attenuation of the luminous flux of the sample at the junction temperature is tested, and the actual test result shows that the attenuation rate of the luminous flux of the sample is not substantially attenuated. Therefore, the environmental temperature is increased to 114 ℃ and 132 ℃ to respectively test the two groups of control group samples, the temperature of the incubator is ensured to be uniform and balanced by controlling the temperature of the probe test incubator to be respectively 114 ℃ and 132 ℃, and the following parameters are tested after the incubator works for a certain time:
conventional group, the luminous flux decay rate was actually tested to be substantially free of decay, and the data is as follows:
increasing the temperature to the following temperature for testing, testing the temperature of the incubator at 114 ℃ and 132 ℃ through a cloth probe, ensuring the temperature of the incubator to be uniform and balanced, and testing the following parameters after working in the incubator for a certain time:
1. 6-11#, the ambient temperature is 114 ℃, the work time is 255 hours, and the work is abnormal; the luminous flux test results were as follows:
2. at the ambient temperature of 132 ℃, 263 hours of operation, no abnormity occurs in the operation; the luminous flux test results were as follows:
3. decay to a value of 70%
The data can be summarized as follows: the service life of the LED light source in a normal-temperature 25-DEG C environment is 7.7 ten thousand hours.
The accelerated life test method for the LED light source can accelerate the failure and discover potential defects of the LED light source by improving the working temperature stress of the LED light source under the condition of keeping the failure mechanism of the driving power source unchanged, the service life of the LED light source under the normal temperature stress level is deduced according to an accelerated life test model in the Ardisia acceleration theory and the introduced confidence, and compared with the traditional design and test, the accelerated life test method for the LED light source enables the product to be mature in design and process at a much higher speed, so that the total time of the development process is shortened, the LED light source can be put on the market early, the market share is seized, the product design and process are mature quickly, and the product development.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and are intended to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the scope of the present invention. All equivalent changes and modifications made within the scope of the claims of the present invention should be covered by the claims of the present invention.
Claims (10)
1. An accelerated life test system for LED light sources, comprising:
a sample grouping means for equally dividing the N samples into a plurality of groups, and setting one of the plurality of groups as a normal group and the remaining groups as a control group;
the first junction temperature testing device is used for testing the junction temperature of the conventional group of samples at normal temperature;
the heating device is used for heating each control group sample;
the second junction temperature testing device is used for testing the junction temperature of each comparison group sample in a heating state;
the service life measuring and calculating device is used for calculating the confidence coefficient and the service life of the LED of each comparison group sample in the heating state;
and the heating test device is used for obtaining the service life of the LED light source at normal temperature based on the confidence coefficient calculated by the measuring and calculating device and the LED service life of each comparison group sample in a heating state.
2. The system for accelerated life testing of LED light sources of claim 1, wherein the temperature of the warming device for warming each of the control group samples is less than the junction temperature of the regular group samples at room temperature.
3. The accelerated life test system of LED light source of claim 1, wherein said life estimation device comprises
The confidence measure and calculation module is used for calculating the confidence;
and the service life measuring and calculating module is used for calculating the service life of the LED of each comparison group sample in the heating state.
4. The LED light source accelerated lifetime testing system of claim 1, wherein the sample number N is greater than or equal to 15.
5. An accelerated life test method for an LED light source is characterized by comprising the following steps:
s100, equally dividing the N samples into a plurality of groups, setting one group of the groups as a conventional group, and setting the rest groups as a control group;
s200, testing the junction temperature of the conventional group of samples at normal temperature;
s300, respectively heating the samples of the control groups;
s400, testing the junction temperature of each control group sample in a heating state
S500, calculating confidence coefficient and the service life value of each comparison group sample in a heating state;
s600, obtaining the service life of the LED light source at normal temperature based on the confidence coefficient and the service life value of each comparison group sample in the heating state.
6. The method for accelerated life test of LED light source according to claim 5, wherein the temperature of heating of each control group sample is less than the junction temperature of the conventional group sample at normal temperature.
7. The accelerated life test method of the LED light source according to claim 5, wherein the junction temperature of the conventional group of samples at normal temperature satisfies:
Tj＝Tc+W×Rj-c+273，
wherein T iscIs the temperature of the LED light source at normal temperature, Rj-cThe thermal resistivity of an LED light source is W, i.e., on voltage × operating current.
8. The accelerated life test method of the LED light source according to claim 5, wherein the junction temperature of the control group sample under the heating state satisfies the following conditions:
TD＝TCD+W×Rj-c+273，
wherein, TCDTemperature, R, of the LED light source of the control group in the warmed-up statej-cThe thermal resistivity of an LED light source is W, i.e., on voltage × operating current.
9. The accelerated life test method of LED light source according to claim 5, wherein the life value of each control group in the heating state is satisfied
Wherein, Pt＝P0×0.7，P0The initial luminous flux of the control group and t is the power-on working time of the control group at the temperature point.
10. The method according to claim 6, wherein the number N of the samples is 15, and 5 samples are set as the regular group, and the remaining 10 samples are equally divided into two groups and set as the control group, then the confidence is determined
The service life value of the LED light source at normal temperature
Wherein,
Tmou1and Tmou2Respectively the life values, T, of the two samples of the control group in the heating statejIs the junction temperature of the samples of the conventional group at normal temperature.
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| CN105785282A (en) * | 2016-03-21 | 2016-07-20 | 上海时代之光照明电器检测有限公司 | Method for detecting claimed service life of LED lamp |
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Application publication date: 20130925 |