CN103323793A - A LED light source accelerated life testing system and method - Google Patents
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Abstract
Description
技术领域 technical field
本发明涉及一种加速寿命测试的系统和方法,更具体地说,涉及一种LED光源加速寿命测试系统及方法。The present invention relates to a system and method for accelerated life testing, more specifically, to a system and method for accelerated life testing of LED light sources.
背景技术 Background technique
随着科技的高速发展,照明用电占社会总电量消耗的比例越来越大,提高照明效率、节约能源已经成为缓解用电紧张的重要手段,半导体LED素有“绿色能源”之称,也作为绿色环保能源之一,不仅节能环保,而且还有寿命长、光效高的优点,当然LED也广受各个行业领域的关注,这样LED寿命当然也是衡量其质量的重要指标,但是传统的LED光源寿命测试方法是在正常使用状态下做长期寿命测试,直到LED损坏或许光通量严重衰减低于50%为止,正常LED的寿命可达到上万小时,这样测试效率低下,增长了产品的研发周期,而且浪费大量的人力和物力。With the rapid development of science and technology, lighting electricity accounts for an increasing proportion of the total electricity consumption of the society. Improving lighting efficiency and saving energy have become important means to alleviate the shortage of electricity. Semiconductor LEDs are known as "green energy" and are also As one of the green and environmentally friendly energy sources, it is not only energy-saving and environmentally friendly, but also has the advantages of long life and high luminous efficiency. Of course, LED is also widely concerned in various industries, so the life of LED is of course an important indicator to measure its quality, but the traditional LED The light source life test method is to do a long-term life test under normal use until the LED is damaged or the luminous flux is seriously attenuated below 50%. The life of a normal LED can reach tens of thousands of hours. This test is inefficient and increases the product development cycle. And waste a lot of manpower and material resources.
发明内容 Contents of the invention
本发明要解决的技术问题在于,针对现有技术的上述缺陷,提供一种LED光源加速寿命测试系统及方法。The technical problem to be solved by the present invention is to provide a LED light source accelerated life testing system and method for the above defects of the prior art.
本发明解决其技术问题所采用的技术方案是:构造一种LED光源加速寿命测试系统,包括The technical solution adopted by the present invention to solve the technical problem is: to construct a LED light source accelerated life testing system, including
样品分组装置,用于将N个样品等分为多个组,并将所述多个组中的一组设为常规组,其余组设为对照组;A sample grouping device, which is used to equally divide N samples into multiple groups, and set one of the multiple groups as a routine group, and the remaining groups as a control group;
第一结温测试装置,用于测试所述常规组样品在常温下的结温;The first junction temperature testing device is used to test the junction temperature of the conventional group of samples at normal temperature;
加温装置,用于给各所述对照组加温;A heating device, used to heat each of the control groups;
第二结温测试装置,用于测试各所述对照组样品在加温状态下的结温;The second junction temperature testing device is used to test the junction temperature of each control group sample in a heated state;
寿命测算装置,用于计算置信度、以及各所述对照组分别在加温状态下的LED寿命;A life-span calculation device, used to calculate the confidence level and the LED life-span of each control group under heating conditions;
加温测试装置,基于所述测算装置计算出的置信度和各所述对照组在加温状态下的LED寿命,获得所述LED光源在常温下的寿命。The heating test device obtains the lifespan of the LED light source at normal temperature based on the confidence calculated by the measuring and calculating device and the LED lifespan of each control group in a heated state.
本发明所述的LED光源加速寿命测试系统,其中,所述加温装置给各所述对照组加温的温度均要小于所述常规组样品在常温下的结温。In the LED light source accelerated life testing system of the present invention, the heating temperature of each of the control groups by the heating device is lower than the junction temperature of the conventional group of samples at normal temperature.
本发明所述的LED光源加速寿命测试系统,其中,所述寿命测算装置包括The LED light source accelerated life testing system according to the present invention, wherein, the life measuring device includes
置信度测算模块,用于计算置信度;Confidence measurement module, used to calculate confidence;
寿命测算模块,用于计算各所述对照组在加温状态下的LED寿命。The life-span calculation module is used to calculate the LED life-span of each control group under the heating state.
本发明所述的LED光源加速寿命测试系统,其中,所述样品数量N大于或等于15。In the LED light source accelerated life testing system of the present invention, the number N of samples is greater than or equal to 15.
本发明解决其技术问题采用的另一技术方案为:提出一种LED光源加速寿命测试方法,包括以下步骤:Another technical solution adopted by the present invention to solve the technical problem is to propose a method for testing the accelerated life of an LED light source, which includes the following steps:
S100、将N个样品等分为多个组,并将所述多个组中的其中一组设为常规组,其余组设为对照组;S100. Divide the N samples into multiple groups, and set one of the multiple groups as a routine group, and the remaining groups as a control group;
S200、测试所述常规组样品在常温下的结温;S200. Test the junction temperature of the conventional group samples at normal temperature;
S300、分别给各所述对照组加温;S300, warming each of the control groups respectively;
S400、测试各所述对照组样品在加温状态下的结温S400. Test the junction temperature of each control group sample in a heated state
S500、计算置信度、以及各所述对照组分别在加温状态下的寿命值;S500, calculating the confidence level, and the lifespan value of each control group under the heating state;
S600、基于所述置信度和各所述对照组分别在加温状态下的寿命值,获得LED光源在常温下的寿命。S600. Obtain the lifetime of the LED light source at normal temperature based on the confidence and the lifetime values of each of the control groups in a heated state.
本发明所述的LED光源加速寿命测试方法,其中,各所述对照组的加温温度均小于所述常规组样品在常温下的结温。In the accelerated life testing method of the LED light source of the present invention, the heating temperature of each of the control groups is lower than the junction temperature of the conventional group of samples at normal temperature.
本发明所述的LED光源加速寿命测试方法,其中,所述常规组样品在常温下的结温满足:The LED light source accelerated life testing method of the present invention, wherein, the junction temperature of the conventional group of samples at room temperature satisfies:
Tj=Tc+W×Rj-c+273,T j =T c +W×R jc +273,
其中Tc为LED光源在常温下的温度,Rj-c为LED光源的热阻系数,W=导通电压×工作电流。Where T c is the temperature of the LED light source at room temperature, R jc is the thermal resistance coefficient of the LED light source, W = conduction voltage × operating current.
本发明所述的LED光源加速寿命测试方法,其中,所述对照组样品在加温状态下的结温满足:The LED light source accelerated life test method according to the present invention, wherein, the junction temperature of the control group sample in the heated state satisfies:
TD=TCD+W×Rj-c+273,T D =T CD +W×R jc +273,
其中,TCD为该对照组的LED光源在加温状态下的温度,Rj-c为LED光源的热阻系数,W=导通电压×工作电流。Wherein, T CD is the temperature of the LED light source of the control group in the heated state, R jc is the thermal resistance coefficient of the LED light source, W=conducting voltage×operating current.
本发明所述的LED光源加速寿命测试方法,其中,每一所述对照组在加温状态下的寿命值满足The LED light source accelerated life test method of the present invention, wherein, the life value of each control group under the heating state satisfies
其中,Pt=P0×0.7,P0为所述对照组的初始光通量,t为所述对照组在该温度点下的加电工作时间。Wherein, P t =P 0 ×0.7, P 0 is the initial luminous flux of the control group, and t is the power-on working time of the control group at this temperature point.
本发明所述的LED光源加速寿命测试方法,其中,所述样品数量N为15,将其中5个样品设为所述常规组,其余10个等分为两组并设为所述对照组,则所述置信度The LED light source accelerated life testing method of the present invention, wherein, the number of samples N is 15, 5 of which are set as the conventional group, and the remaining 10 are equally divided into two groups and set as the control group, then the confidence
所述LED光源在常温下的寿命值The life value of the LED light source at room temperature
其中,Tmou1与Tmou2分别为两个所述对照组在加温状态下的结温,Tj为所述常规组样品在常温下的结温。in, T mou1 and T mou2 are the junction temperatures of the two control groups in the heated state, respectively, and T j is the junction temperature of the conventional group samples at normal temperature.
实施本发明的LED光源加速寿命测试系统及方法,具有以下有益效果:本方法在保持驱动电源失效机理不变的条件下,通过提高其工作温度应力的方法来加速失效发现其潜在的缺陷,并根据阿氏加速理论中的加速寿命试验模型及引入置信度推断出其在正常温度应力水平下寿命,比传统的设计和试验以快得多的速度使产品达到在设计和工艺上成熟,从而缩短研制过程总时间,得以早日投放市场,抢占市场份额,产品设计和工艺成熟快,产品研制和生产成本更低。Implementing the LED light source accelerated life testing system and method of the present invention has the following beneficial effects: under the condition that the failure mechanism of the driving power supply remains unchanged, the method accelerates the failure to find its potential defects by increasing its working temperature stress, and According to the accelerated life test model in the Alfred acceleration theory and the introduction of confidence, it is inferred that its life under normal temperature stress level is much faster than the traditional design and test to make the product mature in design and process, thus shortening the life of the product. The total time of the development process can be put on the market as soon as possible, and the market share can be seized. The product design and process mature quickly, and the product development and production costs are lower.
附图说明 Description of drawings
下面将结合附图及实施例对本发明作进一步说明,附图中:The present invention will be further described below in conjunction with accompanying drawing and embodiment, in the accompanying drawing:
图1是本发明一种LED光源加速寿命测试方法的流程图。Fig. 1 is a flow chart of an accelerated life testing method for an LED light source according to the present invention.
具体实施方式 Detailed ways
在本发明的优选实施例中,该LED光源加速寿命测试系统,包括样品分组装置、第一结温测试装置、加温装置、第二结温测试装置、测算装置以及加温测试装置。In a preferred embodiment of the present invention, the LED light source accelerated life testing system includes a sample grouping device, a first junction temperature testing device, a heating device, a second junction temperature testing device, a measuring device and a heating testing device.
样品分组装置将N个样品等分为多个组,并将多个组中的一组设为常规组,其余组设为对照组。常规组和对照组的区分可以采用一些常规的方法来实现,例如打标记的方法。本实施例中所述样品为LED光源。The sample grouping device divides the N samples into multiple groups, and sets one of the multiple groups as a routine group, and the rest of the groups as a control group. The distinction between the routine group and the control group can be achieved using some conventional methods, such as marking. The samples described in this embodiment are LED light sources.
第一结温测试装置用于测试常规组样品的结温,其是通过将样品的铝基板接热电偶加热来实现,其中结温是指处于电子设备中实际半导体芯片(晶圆、裸片)的最高温度,它通常高于外壳温度和器件表面温度。测试常规组样品的结温的目的是为了选取接下来进行加速测试的测试温度,该测试温度不得高于样品在常温下的结温。The first junction temperature testing device is used to test the junction temperature of the conventional group of samples, which is achieved by heating the aluminum substrate of the sample with a thermocouple, where the junction temperature refers to the actual semiconductor chip (wafer, bare chip) in the electronic device The maximum temperature, which is usually higher than the case temperature and device surface temperature. The purpose of testing the junction temperature of the conventional group of samples is to select the test temperature for the next accelerated test, and the test temperature should not be higher than the junction temperature of the sample at normal temperature.
加温装置给各对照组样品加温,使各对照组样品在高于常温的温度下工作一定的时长。The heating device heats the samples of each control group, so that the samples of each control group work at a temperature higher than normal temperature for a certain period of time.
第二结温测试装置用于测试各个对照组样品在加温状态下的结温;The second junction temperature testing device is used to test the junction temperature of each control group sample in a heated state;
测算装置计算各对照组分别在加温状态下的LED寿命,然后根据各对照组样品在加温状态下的LED寿命值推算出置信度的值,该置信度也叫活化能。The calculation device calculates the lifespan of the LEDs of each control group in the heating state, and then calculates the value of the confidence level according to the LED lifespan value of the samples of each control group in the heating state, and the confidence level is also called activation energy.
加温测试装置基于上述测算装置计算出的置信度和各对照组样品在加温状态下的LED寿命,进一步获得所述LED光源在常温下的寿命。The heating test device further obtains the lifespan of the LED light source at normal temperature based on the confidence calculated by the above-mentioned measuring device and the LED lifespan of each control group sample in a heated state.
值得注意的是,上述加温装置给各对照组样品加温的温度在高于常温的同时还要小于常规组样品在常温下的结温。It is worth noting that the temperature at which the above-mentioned heating device heats the samples of each control group is higher than normal temperature and at the same time lower than the junction temperature of the samples of the conventional group at normal temperature.
优选地,上述测算装置可进一步包括用于计算各所述对照组样品在加温状态下的LED寿命的寿命测算模块、以及用于计算置信度的置信度测算模块。且为了提高测试的准确性,同时进一步减少测试的时间,上述测试样品的数量N应当大于或等于15。Preferably, the above calculation device may further include a life calculation module for calculating the LED life of each control group sample in a heated state, and a confidence calculation module for calculating the confidence. And in order to improve the accuracy of the test and further reduce the test time, the number N of the above test samples should be greater than or equal to 15.
在本发明的另一优选实施例中:构造了一种LED光源加速寿命测试方法,包括以下步骤:In another preferred embodiment of the present invention: a LED light source accelerated life testing method is constructed, comprising the following steps:
S100、将N个样品等分为多个组,并将所述多个组中的其中一组设为常规组,其余组设为对照组,在本实施例中,所述样品为LED光源;S100. Divide the N samples into multiple groups, and set one of the multiple groups as a conventional group, and the remaining groups as a control group. In this embodiment, the samples are LED light sources;
S200、测试所述常规组样品在常温下的结温;S200. Test the junction temperature of the conventional group samples at normal temperature;
S300、分别给各所述对照组样品加温;S300, respectively heating the samples of the control group;
S400、测试各对照组样品在加温状态下的结温;S400, testing the junction temperature of each control group sample in a heated state;
S500、计算置信度、以及各对照组样品分别在加温状态下的寿命值;S500, calculation confidence, and life values of each control group sample under heating state;
S600、基于所述置信度和各所述对照组样品分别在加温状态下的寿命值,获得LED光源在常温下的寿命。S600. Obtain the lifetime of the LED light source at normal temperature based on the confidence and the lifetime values of each of the control samples in a heated state.
值得注意的是,上述各对照组样品的加温温度均小于常规组样品在常温下的结温。且常规组样品在常温下的结温满足:Tj=Tc+W×Rj-c+273,其中Tc为LED光源在常温下的温度,Rj-c为LED光源的热阻系数,通常由LED光源的生产厂家提供,W=导通电压×工作电流。It is worth noting that the heating temperatures of the above-mentioned control group samples are all lower than the junction temperature of the conventional group samples at room temperature. And the junction temperature of the conventional group of samples at room temperature satisfies: T j =T c +W×R jc +273, where T c is the temperature of the LED light source at room temperature, and R jc is the thermal resistance coefficient of the LED light source, which is usually determined by the LED Provided by the manufacturer of the light source, W = conduction voltage × operating current.
此外,该LED光源加速寿命测试方法还包括测试各对照组样品的初始光通量的步骤。根据测得的初始光通量,可以采用以下公式获得每一个对照组在加温状态下的寿命值满足In addition, the LED light source accelerated life test method also includes the step of testing the initial luminous flux of each control group sample. According to the measured initial luminous flux, the following formula can be used to obtain the lifetime value of each control group in the heating state satisfying
其中,Pt=P0×0.7,也就是对照组样品在光通量衰减到70%时的值,P0为该对照组样品的初始光通量,t为该对照组样品在该温度点下的加电工作时间。Among them, P t =P 0 ×0.7, that is, the value of the control sample when the luminous flux decays to 70%, P 0 is the initial luminous flux of the control sample, and t is the electrification of the control sample at this temperature point operating hours.
对照组样品在加温状态下的结温满足:The junction temperature of the control sample in the heated state satisfies:
TD=TCD+W×Rj-c+273,T D =T CD +W×R jc +273,
假如,本发明优选实施例中的样品数量N为15,并将其中5个样品设为常规组,其余10个等分为两组并设为对照组,则置信度可以通过以下公式获得:If, the number of samples N in the preferred embodiment of the present invention is 15, and wherein 5 samples are set as the conventional group, and the remaining 10 are equally divided into two groups and set as the control group, then the degree of confidence can be obtained by the following formula:
进而,LED光源在常温下的寿命值可以由公式:Furthermore, the lifetime value of the LED light source at room temperature can be calculated by the formula:
其中,Tmou1与Tmou2分别为两个对照组样品在加温状态下的结温,Tj为常规组样品在常温下的结温。in, T mou1 and T mou2 are the junction temperatures of the two control samples in the heated state, respectively, and T j is the junction temperature of the routine group samples at room temperature.
下面通过一个例子来对上述LED光源加速寿命测试方法作更为详细的阐述:The following is an example to explain the above-mentioned LED light source accelerated life test method in more detail:
某型号LED光源加速寿命测试,取LED光源样品15件,将其等分为三组,令1-5#为常规组,6-10#和11-15#为对照组。其中,6-11#的环境温度是114度,11-15#的环境温度是132度。用1-5#样品测试出LED光源在常温下的结温,并且测试出在该结温下样品光通量的衰减量,实际测试结果为样品光通量衰减率基本上没有衰减。因此将环境温度增至114度和132度分别对两组对照组样品进行测试,其是通过控制布探头测试温箱温度分别在114度和132度下,保证温箱温度均匀均衡,在温箱内工作一定时间后测试其参数如下:For the accelerated life test of a certain type of LED light source, 15 LED light source samples were taken and divided into three groups, 1-5# was the normal group, 6-10# and 11-15# were the control group. Among them, the ambient temperature of 6-11# is 114 degrees, and the ambient temperature of 11-15# is 132 degrees. Use 1-5# samples to test the junction temperature of the LED light source at room temperature, and test the attenuation of the luminous flux of the sample at this junction temperature. The actual test result shows that the attenuation rate of the luminous flux of the sample basically has no attenuation. Therefore, the ambient temperature was increased to 114 degrees and 132 degrees to test the samples of the two groups of control groups respectively. It was to test the temperature of the incubator at 114 degrees and 132 degrees respectively by controlling the cloth probe to ensure that the temperature of the incubator was even and balanced. After working for a certain period of time, test its parameters as follows:
常规组,实际测试出光通量衰减率基本上没有衰减,其数据如下:In the conventional group, the actual test shows that the luminous flux attenuation rate basically has no attenuation, and the data are as follows:
增至下列温度进行测试,通过布探头测试温箱温度分别在114度和132度下,保证温箱温度均匀均衡,在温箱内工作一定时间后测试其参数如下:Increase to the following temperature for testing, and test the temperature of the incubator at 114 degrees and 132 degrees through cloth probes to ensure that the temperature of the incubator is even and balanced. After working in the incubator for a certain period of time, test its parameters as follows:
1、6-11#,环境温度114度,工作了255小时,工作无异常;光通量测试结果如下:1. 6-11#, the ambient temperature is 114 degrees, and it has been working for 255 hours without abnormality; the luminous flux test results are as follows:
2、在环境温度132度,工作了263小时,工作无异常;光通量测试结果如下:2. After working for 263 hours at an ambient temperature of 132 degrees, there is no abnormality in the work; the luminous flux test results are as follows:
3、衰减到70%的值3. Decay to 70% of the value
综上数据可以得出:LED光源在常温25度环境中的使用寿命在7.7万小时。Based on the above data, it can be concluded that the service life of the LED light source is 77,000 hours in an environment with a normal temperature of 25 degrees.
上述LED光源加速寿命测试方法能够在保持驱动电源失效机理不变的条件下,通过提高其工作温度应力的方法来加速失效发现其潜在的缺陷,并根据阿氏加速理论中的加速寿命试验模型及引入置信度推断出其在正常温度应力水平下寿命,比传统的设计和试验以快得多的速度使产品达到在设计和工艺上成熟,从而缩短研制过程总时间,得以早日投放市场,抢占市场份额,产品设计和工艺成熟快,产品研制和生产成本更低。The above-mentioned LED light source accelerated life test method can accelerate the failure to find its potential defects by increasing its working temperature stress under the condition of keeping the failure mechanism of the driving power supply unchanged, and according to the accelerated life test model and Introduce confidence to deduce its life under normal temperature stress level, make the product mature in design and process much faster than traditional design and test, thereby shortening the total time of the development process, so that it can be put on the market as soon as possible and seize the market Share, product design and process mature quickly, product development and production costs are lower.
以上实施例只为说明本发明的技术构思及特点,其目的在于让熟悉此项技术的人士能够了解本发明的内容并据此实施,并不能限制本发明的保护范围。凡跟本发明权利要求范围所做的均等变化与修饰,均应属于本发明权利要求的涵盖范围。The above embodiments are only to illustrate the technical conception and characteristics of the present invention. The purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly, and cannot limit the protection scope of the present invention. All equivalent changes and modifications made in accordance with the scope of the claims of the present invention shall fall within the scope of the claims of the present invention.
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