CN103315763B - Method and device for normal correction of scanning data in imaging equipment - Google Patents

Method and device for normal correction of scanning data in imaging equipment Download PDF

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CN103315763B
CN103315763B CN201310279547.5A CN201310279547A CN103315763B CN 103315763 B CN103315763 B CN 103315763B CN 201310279547 A CN201310279547 A CN 201310279547A CN 103315763 B CN103315763 B CN 103315763B
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factor
counting rate
correction
correction data
different counting
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CN103315763A (en
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朱传伟
刘月
李明
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Shenyang Zhihe Medical Technology Co ltd
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Neusoft Medical Systems Co Ltd
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Abstract

An embodiment of the invention discloses a method and a device for normal correction of scanning data in imaging equipment. The method includes scanning a model and acquiring a plurality of groups of correction data; optionally combining the groups of correction data to obtain correction data combinations corresponding to different counting rates, thus obtaining correction data corresponding to the different counting rates; calculating normal correction factors under the different counting rates according to the correction data corresponding to the different counting rates; and correcting scanning data different in counting rate in the imaging equipment through the normal correction factors under the different counting rates. The method and the device according to the embodiment have the advantages that acquisition time of correction data can be shortened and the problem of image artifacts caused by mismatch of the counting rates is also avoided.

Description

Scan-data in imaging device is carried out to the method and apparatus of normalization correction
Technical field
The present invention relates to medical imaging technology field, particularly relate to the method and apparatus scan-data in imaging device being carried out to normalization correction.
Background technology
Nuclear medical imaging device is that current diagnosis provides strong instrument.PET and CT etc. are all Typical Representatives of nuclear medical imaging device, and wherein, PET and SPECT etc. belong to molecular function imaging device, and CT and MR etc. belong to anatomy imaging equipment.Generally can two kinds of modality imaging system be carried out integrated clinically at present, form the multi-modality imaging equipment such as PET/CT, PET/MR and SPECT/CT.Such as, the image that PET/CT multi-modality imaging equipment provides not only has anatomic information, also has molecular function information simultaneously, for medical clinic applications provides foundation more accurately.
For PET or PET/CT etc. with PET medical imaging devices for, it is mainly through detecting the ray sent from human body, through rebuilding the image obtaining reflecting human body each tissue metabolism situation.Imaging device is when detecting the ray that human body sends, affect by factors such as environment residing for detector geometry design, detector crystal type, detector, cause the number of rays of the actual reception of imaging device not identical with the number of rays of human-body emitting, therefore, before reconstruction image, need first to correct the scan-data that imaging device obtains, and normalization to correct be one of wherein important Data correction.
Usually, normalization corrects to be needed to carry out image data through long-time scanning, then calculates regular correction factor according to the data collected, corrects finally by the scan-data of regular correction factor to imaging device.In practical clinical, need before imaging device dispatches from the factory to correct once, and also need to correct once at interval of a period of time (such as, three months) after imaging device dispatches from the factory.Therefore, a major issue of carrying out normalization correction how to realize the acquisition time of minimizing correction data as far as possible while that normalization correcting.
At present, to PET or PET/CT etc. with the medical imaging devices of PET carry out known method that normalization corrects have direct method (also referred to as DN method) with based on becoming correction method (also referred to as CBN method).Wherein, DN method principle is simple, theoretic correction result is also the most accurate, but, in order to meet the requirement of DN method to calibration accuracy, need gather and add up a large amount of data, and then also just need to consume very long acquisition time, especially for 3D data acquisition scheme, need to consume a large amount of acquisition times, therefore, DN method does not have realistic feasibility.And CBN method significantly reduces data acquisition time, there is realistic feasibility.In clinical, PET or PET/CT etc. with the medical imaging devices of PET mainly adopt CBN method or its improve one's methods and carry out normalization and correct.
Realizing in process of the present invention, the present inventor finds that in prior art, at least there are the following problems: no matter be DN method or CBN method, at timing each time, in order to reduce data acquisition time, all that data by gathering under some counting rates calculate a regular correction factor, and only utilize the scan-data of this regular correction factor to various different counting rate to correct, there is the counting rate of regular correction factor and the unmatched problem of counting rate of scan-data, and then also can cause image artifacts problem because counting rate does not mate.
Summary of the invention
In order to solve the problems of the technologies described above, embodiments provide the method and apparatus scan-data in imaging device being carried out to normalization correction, with while the reduction correction data acquisition time, the image artifacts problem caused because counting rate does not mate is avoided to occur.
The embodiment of the invention discloses a kind of method of the scan-data in imaging device being carried out to normalization correction, comprising:
Scanning die body, and correction data is organized in collection more;
Each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate;
The regular correction factor under different counting rate is calculated according to the correction data of the different counting rate of described correspondence;
Corrected by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
Preferably, described each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate, comprising:
Each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, and there is overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate;
Or,
Each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, and there is not overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate.
Preferably, when each calibration cycle arrives, also comprise:
Scanning die body, and gather one group of correction data when previous calibration cycle;
Calculate when the regular correction factor in previous calibration cycle under different counting rate according to the correction data of the described correction data counting rate different from described correspondence when previous calibration cycle;
Carry out correction by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device to be then specially:
Corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Preferably, when according to correct based on composition CBN method calculate regular correction factor time, be cylinder die body by the die body scanned, the correction data of collection is cylinder mold sports school correction data, and the correction data of corresponding different counting rate is the cylinder mold sports school correction data of corresponding different counting rate.
Preferred further, the described correction data according to the different counting rate of described correspondence calculates the regular correction factor under different counting rate, comprising:
Utilize the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor with counting rate change in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor; According to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method.
Preferred further, when each calibration cycle arrives, also comprise:
Scanning cylinder die body, and gather one group of cylinder mold sports school correction data when previous calibration cycle;
The crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle is utilized to calculate when the crystal efficiency factor in previous calibration cycle under different counting rate;
According to Summing Factor cross section block side, the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Carry out correction by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device to be then specially:
Corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Or, further preferably, when each calibration cycle arrives, also comprise:
Scanning cylinder die body, and gather the cylinder mold sports school correction data in one group of current correction cycle;
When the crystal efficiency factor of the cylinder mold sports school correction data counting rate different from the correspondence calculated of previous calibration cycle, calculating are when the crystal efficiency factor in previous calibration cycle under different counting rate described in utilizing, and according to described when the crystal efficiency factor calculating in previous calibration cycle under different counting rate is when the cross section block side factor in previous calibration cycle under different counting rate;
According to the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate, the cross section block side factor and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Carry out correction by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device to be then specially:
Corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Preferably, described according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method, comprising:
Utilize the axial geometrical factor in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence;
Scanning rotating rod source die body, gathers one group of rotating rod source die body correction data, and utilizes the crystal interference factor in described rotating rod source die body correction data calculating CBN method and radial geometric factor;
According to CBN method, computing is carried out to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
Or, preferably, described according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method, comprising:
Scanning rotating rod source die body, gathers described rotating rod source die body correction data, and utilizes crystal interference factor, radial geometric factor and the axial geometrical factor in described rotating rod source die body correction data calculating CBN method;
According to CBN method, computing is carried out to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
The embodiment of the invention also discloses a kind of device scan-data in imaging device being carried out to normalization correction, comprising:
First data acquisition unit, for scanning die body, and correction data is organized in collection more;
Data combination unit, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate;
Normalization correction factor first computing unit, for calculating the regular correction factor under different counting rate according to the correction data of the different counting rate of described correspondence;
Correcting unit, for correcting by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
Preferably, described data combination unit comprises:
First combination subelement, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate;
Or,
Second combination subelement, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is not overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate.
Preferably, when each calibration cycle arrives, also comprise:
Second data scanning unit, for scanning die body, and gathers one group of correction data when previous calibration cycle;
Normalization correction factor second computing unit, calculates when the regular correction factor in previous calibration cycle under different counting rate according to the correction data of the correction data of described current period counting rate different from described correspondence;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Preferably, when according to correct based on composition CBN method calculate regular correction factor time, be cylinder die body by the die body scanned, the correction data of collection is cylinder mold sports school correction data, and the correction data of corresponding different counting rate is the cylinder mold sports school correction data of corresponding different counting rate.
Preferred further, described regular correction factor first computing unit comprises:
Counting rate factor of influence computation subunit, for utilizing the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor that change with counting rate in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor;
CBN method operator unit, for according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculates the regular correction factor under different counting rate according to CBN method.
Preferred further, when each calibration cycle arrives, also comprise:
Cylinder mold volume data collecting unit, for scanning cylinder die body, and gathers one group of cylinder mold sports school correction data when previous calibration cycle;
Time-concerning impact factor first timing updating block, calculates when the crystal efficiency factor in previous calibration cycle under different counting rate for utilizing the crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle;
CBN normalization correction factor computing unit, for according to Summing Factor cross section block side, the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Or, further preferably, when each calibration cycle arrives, also comprise:
Cylinder mold volume data collecting unit, for scanning cylinder die body, and gathers the cylinder mold sports school correction data in one group of current correction cycle;
Time-concerning impact factor second timing updating block, for utilizing the crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle, calculating when the crystal efficiency factor in previous calibration cycle under different counting rate, and calculate when the cross section block side factor in previous calibration cycle under different counting rate according to the described crystal efficiency factor worked as in previous calibration cycle under different counting rate;
Normalization correction factor the 3rd computing unit, for according to the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate, the cross section block side factor and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Preferably, described CBN method operator unit comprises:
First computation subunit, for utilizing the axial geometrical factor in the described cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence;
Second computation subunit, for scanning rotating rod source die body, gathers one group of rotating rod source die body correction data, and utilizes the crystal interference factor in described rotating rod source die body correction data calculating CBN method and radial geometric factor;
Operator unit, for carrying out computing according to CBN method to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
Preferably, described CBN method operator unit comprises:
3rd computation subunit, for scanning rotating rod source die body, gathers described rotating rod source die body correction data, and utilizes crystal interference factor, radial geometric factor and the axial geometrical factor in described rotating rod source die body correction data calculating CBN method;
Operator unit, for carrying out computing according to CBN method to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
As can be seen from the above-described embodiment, compared with prior art, the invention has the advantages that:
The correction data of the die body produced under being captured in coincidence correction pattern also splits it, the correction data in different time sections can be intercepted by data disassemble technique, and then the correction data that can obtain under different counting rate, finally calculate the regular correction factor under different counting rate based on the correction data under different counting rate, avoid the image artifacts problem caused because counting rate does not mate to occur.
Further, only need collection correction data, the correction data under different counting rate can be obtained, and without the need to gathering the correction data under different counting rate, also reduce the acquisition time of correction data.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects that the embodiment of the present invention one discloses;
Fig. 2 is a kind of schematic diagram coincidence correction type collection data being carried out to Data Division in the present invention;
Fig. 3 is another kind of schematic diagram coincidence correction type collection data being carried out to Data Division in the present invention;
Fig. 4 is another kind of schematic diagram coincidence correction type collection data being carried out to Data Division in the present invention;
Fig. 5 is a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects that the embodiment of the present invention two discloses;
Fig. 6 is a kind of method schematic diagram calculating regular correction factor in the present invention;
Fig. 7 is a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects that the embodiment of the present invention three discloses;
Fig. 8 is a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects that the embodiment of the present invention four discloses;
Fig. 9 is a kind of apparatus structure schematic diagram scan-data in imaging device being carried out to normalization correction that the invention process five discloses;
Figure 10 is a structural representation of the present invention's normalization correction factor first computing unit;
Figure 11 is that the another kind that the invention process five discloses carries out the regular apparatus structure schematic diagram corrected to the scan-data in imaging device.
Detailed description of the invention
Embodiments provide a kind of method and apparatus scan-data in imaging device being carried out to normalization correction.Its key problem in technology is, after scanning die body, gather and organize correction data more, to carry out combination in any to each group of correction data in many group correction datas, constantly to decay to from high activity at nucleic to produce the process of low-activity owing to organizing correction data more, therefore, the counting rate of the correction data of different group is that different (counting rate of each group of correction data gathered within the time period that high activity nucleic is corresponding is high, the counting rate of each group of correction data gathered within the time period that low-activity nucleic is corresponding is low), by the correction data in different time sections is carried out combination in any, the counting rate of the correction data after combination is different, namely, obtain the correction data under different counting rate, the regular correction factor under different counting rate is finally calculated based on the correction data under different counting rate.
For enabling above-mentioned purpose of the present invention, feature and advantage become apparent more, are described in detail the embodiment of the present invention below in conjunction with accompanying drawing.
Embodiment one
Refer to Fig. 1, its a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects disclosed for the embodiment of the present invention one, comprise the following steps:
Step 101: scanning die body, and correction data is organized in collection more;
With the medical imaging devices scanning die body with PET such as PET or PET/CT, can determine by the activity of the die body scanned according to the group number of the correction data gathered, generally, the group number gathered is more, higher by the activity of the die body scanned, the group number gathered is fewer, lower by the activity of the die body scanned.In addition, the type that the activity of die body also scans is relevant, generally, adopt 3-D scanning time by scanned die body activity ratio adopt two-dimensional scan time low by the activity scanning die body.
In technical solution of the present invention, preferably, in order to the correction data of more corresponding different counting rate can be obtained, need to gather and much organize correction data, therefore, adopt the die body of higher activity.As, if two-dimensional scan, by the activity of scanning die body preferably about 50 millicuries, if 3-D scanning, by the activity of scanning die body preferably about 30 millicuries.Step 102: each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate;
After the die body of the high activity of scanning, the many groups correction data collected as shown in Figure 2, constantly to decay to from high activity at nucleic to produce the process of low-activity owing to organizing correction data more, therefore, the counting rate of the correction data of different group is that different (counting rate of each group of correction data gathered within the time period that high activity nucleic is corresponding is high, the counting rate of each group of correction data gathered within the time period that low-activity nucleic is corresponding is low), by the correction data in different time sections is carried out combination in any, the counting rate of the correction data after combination is different, namely, obtain the correction data under different counting rate.　
Wherein, a kind of data assemblies mode is: each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate.Such as, as shown in Figure 2, the correction data of a rear combination all postpones certain hour section than the correction data of previous combination.　
It should be noted that, time period length corresponding to the correction data of technical solution of the present invention to each combination does not limit, and that is, the time period length that the correction data of each combination is corresponding can be identical, also can be different.Technical solution of the present invention does not also limit the overlap mode between the correction data of combination, such as, except overlap mode as shown in Figure 2, can also adopt overlap mode as shown in Figure 3.Meanwhile, the correction data that technical solution of the present invention does not limit all combinations yet only adopts same overlap mode, also can be adopt multiple overlap mode simultaneously.　
Another kind of data assemblies mode is: each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is not overlapping region between the correction data of every two adjacent combinations, obtain the correction data of corresponding different counting rate.Such as, as shown in Figure 4.
Also it should be noted that, when carrying out data assemblies, can combine according to the number of counting rate, and then make the number of combination identical with the number of counting rate, also the number of combination can be made to be greater than counting rate number, and then from all combinations, select incorporating aspects according to the number of counting rate again, make the number of the combination selected identical with the number of counting rate.
Step 103: calculate the regular correction factor under different counting rate according to the correction data of the different counting rate of described correspondence;
In technical solution of the present invention, when after the correction data obtaining corresponding different counting rate, can based on the correction data of the different counting rate of correspondence, according to the regular correction factor calculated under different counting rate of improving one's methods separately of existing DN method, CBN method and two kinds of methods.Technical solution of the present invention does not limit concrete computational process wherein.
Step 104: corrected by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
Technical solution of the present invention is also not specifically limited concrete trimming process, can with reference to various correcting mode of the prior art.
It should be noted that, can at any time implement once technique scheme of the present invention, thus realize once normalization and correct, before imaging device dispatches from the factory, or imaging device after putting into hospital and before use.Also can implement technical scheme of the present invention repeated multiple timesly, thus periodically realize normalization correction, at every turn before using at imaging device.And in common application, can implement once normalization before imaging device dispatches from the factory corrects, after imaging device dispatches from the factory, then regularly implement once normalization correct, in these cases, technical scheme of the present invention can be adopted to realize normalization and correct.Usually, regular correction factor can change in time, therefore, need regularly regular correction factor is upgraded, that is, at set intervals (as, a calibration cycle), just need Resurvey correction data, to upgrade regular correction factor.
When each calibration cycle arrives, the method for the present embodiment also comprises: scanning die body, and gathers one group of correction data when previous calibration cycle; Calculate when the regular correction factor in previous calibration cycle under different counting rate according to the correction data of the described correction data counting rate different from correspondence when previous calibration cycle; Then above-mentioned steps 104 is specially: corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
As can be seen from the above-described embodiment, compared with prior art, the invention has the advantages that:
After scanning die body, gather and organize correction data more, to carry out combination in any to each group of correction data in many group correction datas, and then the correction data that can obtain under different counting rate, finally calculate the regular correction factor under different counting rate based on the correction data under different counting rate, avoid the image artifacts problem caused because counting rate does not mate to occur.
Further, only need collection correction data, the correction data under different counting rate can be obtained, and without the need to gathering the correction data under different counting rate, also reduce data acquisition time.
Embodiment two
When technical solution of the present invention employing CBN method calculates the regular correction factor under different counting rate, be cylinder die body by the die body scanned in embodiment one, the correction data gathered is cylinder mold sports school correction data, and the correction data of corresponding different counting rate is the cylinder mold sports school correction data of corresponding different counting rate.
Refer to Fig. 5, its a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects disclosed for the embodiment of the present invention two, comprise the following steps:
Step 501: scanning cylinder die body, and gather Duo Zu cylinder mold sports school correction data;
In CBN method, the formula calculating regular correction factor is: NC uivj=ε uiε vjb ub vc uimodDc vjmodDd uvrkf uvg uvr, wherein, NC uivjregular correction factor, ε uiand ε vjthe crystal efficiency factor of detector, b uand b vthe axial segments side factor, c uimodDand c vjmodDthe cross section block side factor, d uvrkcrystal interference factor, f uvaxial geometrical factor, g uvrbe radial geometric factor, D is block detector cross section crystal number.
In each factor on the right of the equal sign of above-mentioned formula, the crystal efficiency factor is the factor with counting rate and time change, and Summing Factor axial segments side, the cross section block side factor is the factor changed with counting rate.That is, under different counting rates, the crystal efficiency factor, Summing Factor axial segments side, the cross section block side factor are also different.Therefore, the key calculating the regular correction factor under different counting rate is just how to calculate the crystal efficiency factor, Summing Factor axial segments side, the cross section block side factor that change with counting rate.
And in CBN method, in order to calculate above-mentioned formula equal sign on the right of each factor, need the correction data gathering different die body.Such as, the correction data of general collection rotating rod source die body is in order to calculate crystal interference factor and radial geometric factor, the correction data of general collection cylinder die body is in order to calculate the crystal efficiency factor, Summing Factor axial segments side, the cross section block side factor, the correction data that generally can gather rotating rod source die body, in order to calculate axial geometrical factor, also can gather the correction data of cylinder die body in order to calculate axial geometrical factor.
Based on above situation, in technical solution of the present invention, scanning cylinder die body, and then Duo Zu cylinder mold sports school correction data can be gathered, so that this correction data of step below calculates the crystal efficiency factor, Summing Factor axial segments side, the cross section block side factor with counting rate change in CBN method.
Step 502: each group of correction data in described Duo Zu cylinder mold sports school correction data is carried out combination in any, the counting rate that the correction data of each group is corresponding is different, obtains the correction data of corresponding different counting rate;
Anabolic process for cylinder mold sports school correction data can see the step 102 in embodiment one, and this repeats no more.
Step 503: utilize the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor with counting rate change in the cylinder mold sports school correction data calculating CBN method of corresponding different counting rate, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor;
Such as, according to prior art, the crystal efficiency factor can be modeled as: ε (RT)=ε intr(T) ε deadtime(R)
Wherein, ε (RT) is the crystal efficiency factor, ε intr(T) be the crystal intrinsic efficiency factor, ε deadtime(R) the crystal efficiency dead time factor, the crystal intrinsic efficiency factor only changes in time, and the crystal efficiency dead time factor only changes with counting rate.
And crystal efficiency dead time factor ε deadtime(R) can be modeled as by paralysis and non-palsy model:
ϵ deadtime ( R ) = exp ( - R × t p , axial 1 + R × t np , axial ) ( 1 + R × t np , axial ) ( 1 + R × t np , trans )
Wherein, t p, axialaxially paralyse the dead time, t np, axialthe axial non-paralysis dead time, t np, transbe the rank street facial paralysis paralysis dead time, and be all known system electronics circuitry parameter, R is counting rate.
Utilize the cylinder mold sports school correction data of corresponding different counting rate can calculate the crystal intrinsic efficiency factor ε of corresponding different counting rate intr(T) value, obviously, the ε of corresponding different counting rate intr(T) value is identical.Utilize above-mentioned formula can calculate the ε of corresponding different counting rate deadtime(R) value, obviously, the ε of corresponding different counting rate deadtime(R) value is different.Finally, according to ε intr(T) ε of value counting rate different from correspondence deadtime(R) value can calculate the crystal efficiency factor ε (RT) under different counting rate.
It should be noted that calculate crystal intrinsic efficiency factor ε owing to how to utilize cylinder mold sports school correction data intr(T), the process of Summing Factor axial segments side, the cross section block side factor belongs to prior art, therefore, in technical solution of the present invention, is no longer described in detail to this process.
Step 504: according to the crystal efficiency factor under described different counting rate, Mian Kuai side, Summing Factor rank street, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method;
As illustrated in step 501, in CBN method, crystal interference factor and radial geometric factor can be calculated by rotating rod source die body correction data, and axial geometrical factor both can be calculated by cylinder mold sports school correction data, also can be calculated by rotating rod source die body correction data.
Based on this, as shown in Figure 6, in the method calculating regular correction factor, when utilizing cylinder mold sports school correction data to calculate axial geometrical factor, the method specifically comprises:
Step 601: utilize the axial geometrical factor in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence;
The another kind of substitute mode of this step is, scanning cylinder die body, gathers one group of cylinder mold sports school correction data, and utilize this group cylinder mold sports school correction data to calculate axial geometrical factor.
Due to the factor that axial geometrical factor is not with counting rate change, therefore, from the cylinder mold sports school correction data of the different counting rate of correspondence, the cylinder mold sports school correction data of an a certain counting rate of correspondence can be selected arbitrarily, and utilize this correction data to calculate axial geometrical factor.Certainly, the correction data of each counting rate cylinder die body corresponding also can be utilized to calculate axial geometrical factor, and obviously, all axial geometrical factor calculated is all identical.
Step 602: scanning rotating rod source die body, adopts one group of rotating rod source die body correction data, and utilizes the crystal interference factor in described rotating rod source die body correction data calculating CBN method and radial geometric factor;
It should be noted that, axial geometrical factor is calculated owing to how to utilize cylinder mold sports school correction data, and the process how utilizing rotating rod source die body correction data to calculate crystal interference factor and radial geometric factor belongs to prior art, therefore, in technical solution of the present invention, no longer to the process how utilizing cylinder mold sports school correction data to calculate axial geometrical factor, and the process how utilizing rotating rod source die body correction data to calculate crystal interference factor and radial geometric factor is described in detail.
Step 603: according to CBN method, computing is carried out to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
The another kind of mode calculating regular correction factor utilizes rotating rod source die body correction data to calculate axial geometrical factor, that is, in above-mentioned steps 602, also utilize described rotating rod source die body correction data to calculate axial geometrical factor.
After having calculated regular correction factor in the manner described above, return in the flow process of normalization correction.
Step 505: corrected by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
As can be seen from the above-described embodiment, compared with prior art, the invention has the advantages that:
After scanning die body, gather and organize correction data more, to carry out combination in any to each group of correction data in many group correction datas, and then the correction data that can obtain under different counting rate, finally calculate the regular correction factor under different counting rate based on the correction data under different counting rate, avoid the image artifacts problem caused because counting rate does not mate to occur.
Further, only need collection correction data, the correction data under different counting rate can be obtained, and without the need to gathering the correction data under different counting rate, also reduce data acquisition time.
Embodiment three
If the regular correction factor under adopting CBN method to calculate different counting rate, be subject to the impact of the time dependent crystal efficiency factor, normalization correction factor also can change in time, therefore, also need to upgrade termly the regular correction factor under different counting rate, so that the regular correction factor under regularly utilizing different counting rate corrects data.The difference of the present embodiment and embodiment two is, comprises the step of the regular correction factor upgraded termly under different counting rate further.
Refer to Fig. 7, its a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects disclosed for the embodiment of the present invention three, the method specifically comprises:
Wherein, following steps 701-705 is applied to the link that first time calculates regular correction factor correction data, and specific implementation process see the step 501-504 in embodiment two, can repeat no more herein.
Step 701: scanning cylinder die body, and gather Duo Zu cylinder mold sports school correction data;
Step 702: each group of correction data in described Duo Zu cylinder mold sports school correction data is carried out combination in any, the counting rate that the correction data of each group is corresponding is different, obtains the correction data of corresponding different counting rate;
Step 703: utilize the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor with counting rate change in the cylinder mold sports school correction data calculating CBN method of corresponding different counting rate, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor;
Step 704: according to the crystal efficiency factor under described different counting rate, Mian Kuai side, Summing Factor rank street, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method;
Step 705: corrected by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
Wherein, following steps 706-709 to be applied in each calibration cycle the renewal of regular correction factor and the link of correction data, that is, the repeated execution of steps 706-709 when each calibration cycle arrives.
Step 706: scanning cylinder die body, and gather the cylinder mold sports school correction data in one group of current correction cycle;
Such as, be a calibration cycle with three months, every three months run-down cylinder die body, and gather one group of cylinder mold sports school correction data.
Step 707: the crystal efficiency factor utilizing the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle, calculates when the crystal efficiency factor in previous calibration cycle under different counting rate;
Wherein, the crystal efficiency factor can be modeled as: ε (RT)=ε intr(T) ε deadtime(R), the cylinder mold sports school correction data when previous calibration cycle is utilized can to calculate as the crystal intrinsic efficiency factor ε in previous calibration cycle intr(T) value, and the crystal intrinsic efficiency factor ε replacing previous calibration cycle intr(T) value, in an initial condition, replaces the crystal intrinsic efficiency factor ε calculated for the first time intr(T) value.ε under the different counting rates utilizing first time to calculate deadtime(R), finally can calculate when the crystal efficiency factor under counting rate different in previous calibration cycle.
Step 708: according to Summing Factor cross section block side, the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
For calculating in all factors of regular correction factor, the time dependent crystal efficiency factor can be calculated by above-mentioned steps 706 and 707, Summing Factor cross section block side, the axial segments side factor under different counting rate can be calculated by above-mentioned steps 701-703, the numerical value that crystal interference factor, axial geometrical factor and radial geometric factor also can directly adopt first time to calculate.According to CBN method, computing is carried out to the above-mentioned factor, the regular correction factor of corresponding different counting rate in different calibration cycle can be obtained.
Step 709: carry out regular calibration by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
As can be seen from the above-described embodiment, compared with prior art, the invention has the advantages that:
After scanning die body, gather and organize correction data more, to carry out combination in any to each group of correction data in many group correction datas, and then the correction data that can obtain under different counting rate, finally calculate the regular correction factor under different counting rate based on the correction data under different counting rate, avoid the image artifacts problem caused because counting rate does not mate to occur.
Further, only need collection correction data, the correction data under different counting rate can be obtained, and without the need to gathering the correction data under different counting rate, also reduce data acquisition time.
In addition, after imaging device dispatches from the factory, also upgrade the regular correction factor under different counting rate termly, regularly utilize the regular correction factor under different counting rate to correct data, make correction result more accurate.
Embodiment four
Consider that the cross section block side factor is calculated by the crystal efficiency factor, therefore, not only the crystal efficiency factor is time dependent, and equally, the cross section block side factor is also time dependent.That is, be subject to the time dependent crystal efficiency factor, the cross section block side factor, or both common impacts, regular correction factor all can change in time.The difference of the present embodiment and embodiment three is, during regular correction factor under the different counting rate of regular update, also needs the impact considering the cross section block side factor.
Refer to Fig. 8, its a kind of flow chart scan-data in imaging device being carried out to the method that normalization corrects disclosed for the embodiment of the present invention four, the method specifically comprises:
Wherein, following steps 801-805 is applied to the link that first time calculates regular correction factor correction data, and specific implementation process see the step 501-504 in embodiment two, can repeat no more herein.
Step 801: scanning cylinder die body, and gather Duo Zu cylinder mold sports school correction data;
Step 802: each group of correction data in described Duo Zu cylinder mold sports school correction data is carried out combination in any, the counting rate that the correction data of each group is corresponding is different, obtains the correction data of corresponding different counting rate;
Step 803: utilize Summing Factor cross section block side, the axial segments side factor with counting rate change in the cylinder mold sports school correction data calculating CBN method of corresponding different counting rate, obtain Summing Factor cross section block side, the axial segments side factor under different counting rate;
Step 804: according to Mian Kuai side, Summing Factor rank street, the axial segments side factor under described different counting rate, calculate the regular correction factor under different counting rate according to CBN method;
Step 805: corrected by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
Wherein, following steps 806-809 to be applied in each calibration cycle the renewal of regular correction factor and the link of correction data, that is, the repeated execution of steps 706-709 when each calibration cycle arrives.
Step 806: scanning cylinder die body, and gather the cylinder mold sports school correction data in one group of current correction cycle;
Step 807: the crystal efficiency factor utilizing the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle, calculate when the crystal efficiency factor in previous calibration cycle under different counting rate, and according to described when the crystal efficiency factor calculating in previous calibration cycle under different counting rate is when the cross section block side factor in previous calibration cycle under different counting rate;
Step 808: according to the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate, the cross section block side factor and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Step 809: carry out regular calibration by the scan-data of regular correction factor to the different counting rates of imaging device of different counting rate corresponding in different calibration cycle.
As can be seen from the above-described embodiment, compared with prior art, the invention has the advantages that:
After scanning die body, gather and organize correction data more, to carry out combination in any to each group of correction data in many group correction datas, and then the correction data that can obtain under different counting rate, finally calculate the regular correction factor under different counting rate based on the correction data under different counting rate, avoid the image artifacts problem caused because counting rate does not mate to occur.
Further, only need collection correction data, the correction data under different counting rate can be obtained, and without the need to gathering the correction data under different counting rate, also reduce data acquisition time.
In addition, after imaging device dispatches from the factory, also upgrade the regular correction factor under different counting rate termly, regularly utilize the regular correction factor under different counting rate to correct data, make correction result more accurate.
Embodiment five
With above-mentioned a kind of to carry out the method that corrects of normalization to the scan-data in imaging device corresponding, the embodiment of the present invention additionally provides a kind of device scan-data in imaging device being carried out to normalization correction.Refer to Fig. 9, its a kind of apparatus structure schematic diagram scan-data in imaging device being carried out to normalization correction disclosed for the invention process five, this device comprises: the first data acquisition unit 901, data combination unit 902, regular correction factor first computing unit 903 and correcting unit 904.Operation principle below in conjunction with this device introduces its internal structure and annexation further.
First data acquisition unit 901, for scanning die body, and correction data is organized in collection more;
Data combination unit 902, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate;
Normalization correction factor first computing unit 903, for calculating the regular correction factor under different counting rate according to the correction data of the different counting rate of described correspondence;
Correcting unit 904, for correcting by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
Preferably, data combination unit 902 comprises: the first combination subelement, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is overlapping region between the correction data of every two adjacent combinations, obtain the correction data of corresponding different counting rate;
Or, second combination subelement, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is not overlapping region between the correction data of every two adjacent combinations, obtain the correction data of corresponding different counting rate.
Preferably, when each calibration cycle arrives, also comprising: the second data scanning unit, for scanning die body, and gathering one group of correction data when previous calibration cycle; Normalization correction factor second computing unit, calculates when the regular correction factor in previous calibration cycle under different counting rate according to the correction data of the correction data of described current period counting rate different from described correspondence; Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Preferably, when according to correct based on composition CBN method calculate regular correction factor time, be cylinder die body by the die body scanned, the correction data of collection is cylinder mold sports school correction data, and the correction data of corresponding different counting rate is the cylinder mold sports school correction data of corresponding different counting rate.
As shown in Figure 10, regular correction factor first computing unit 903 comprises:
Counting rate factor of influence computation subunit 9031, for utilizing the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor that change with counting rate in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor; And,
CBN method operator unit 9032, for according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculates the regular correction factor under different counting rate according to CBN method.
As the preferred mode of one, CBN method operator unit 9032 comprises:
First computation subunit, for utilizing the axial geometrical factor in the described cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence;
Second computation subunit, for scanning rotating rod source die body, gathers one group of rotating rod source die body correction data, and utilizes the crystal interference factor in described rotating rod source die body correction data calculating CBN method and radial geometric factor;
Operator unit, for carrying out computing according to CBN method to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
As the preferred mode of another kind, CBN method operator unit 9032 comprises:
3rd computation subunit, for scanning rotating rod source die body, gathers described rotating rod source die body correction data, and utilizes crystal interference factor, radial geometric factor and the axial geometrical factor in described rotating rod source die body correction data calculating CBN method;
Operator unit, for carrying out computing according to CBN method to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
Preferably, as shown in figure 11, when each calibration cycle arrives, this device also comprises:
Cylinder mold volume data collecting unit 905, for scanning cylinder die body, and gathers one group of cylinder mold sports school correction data when previous calibration cycle;
Time-concerning impact factor first timing updating block 906, calculates when the crystal efficiency factor in previous calibration cycle under different counting rate for utilizing the crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle;
CBN normalization correction factor computing unit 907, for according to Summing Factor cross section block side, the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Then described correcting unit 904, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
Or another kind of preferred scheme is that this device also comprises:
Cylinder mold volume data collecting unit, for scanning cylinder die body, and gathers the cylinder mold sports school correction data in one group of current correction cycle;
Time-concerning impact factor second timing updating block, for utilizing the crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle, calculating when the crystal efficiency factor in previous calibration cycle under different counting rate, and calculate when the cross section block side factor in previous calibration cycle under different counting rate according to the described crystal efficiency factor worked as in previous calibration cycle under different counting rate;
Normalization correction factor the 3rd computing unit, for according to the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate, the cross section block side factor and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
As can be seen from the above-described embodiment, compared with prior art, the invention has the advantages that:
After scanning die body, gather and organize correction data more, to carry out combination in any to each group of correction data in many group correction datas, and then the correction data that can obtain under different counting rate, finally calculate the regular correction factor under different counting rate based on the correction data under different counting rate, avoid the image artifacts problem caused because counting rate does not mate to occur.
Further, only need collection correction data, the correction data under different counting rate can be obtained, and without the need to gathering the correction data under different counting rate, also reduce data acquisition time.
In addition, after imaging device dispatches from the factory, also upgrade the regular correction factor under different counting rate termly, regularly utilize the regular correction factor under different counting rate to correct data, make correction result more accurate.
It should be noted that, one of ordinary skill in the art will appreciate that all or part of flow process realized in above-described embodiment method, that the hardware that can carry out instruction relevant by computer program has come, described program can be stored in a computer read/write memory medium, this program, when performing, can comprise the flow process of the embodiment as above-mentioned each side method.Wherein, described storage medium can be magnetic disc, CD, read-only store-memory body (Read-Only Memory, ROM) or random store-memory body (Random AccessMemory, RAM) etc.
Above to provided by the present invention to the scan-data in imaging device carry out normalization correct method and apparatus be described in detail, apply specific embodiment herein to set forth principle of the present invention and embodiment, the explanation of above embodiment just understands method of the present invention and core concept thereof for helping; Meanwhile, for one of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.

Claims (18)

1. the scan-data in imaging device is carried out to a method for normalization correction, it is characterized in that, comprising:
Scanning die body, and correction data is organized in collection more;
Each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate;
The regular correction factor under different counting rate is calculated according to the correction data of the different counting rate of described correspondence;
Corrected by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
2. method according to claim 1, is characterized in that, described each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate, comprising:
Each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, and there is overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate;
Or,
Each group of correction data in described many group correction datas is carried out combination in any, and the counting rate that the correction data of each combination is corresponding is different, and there is not overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate.
3. method according to claim 1, is characterized in that, when each calibration cycle arrives, also comprises:
Scanning die body, and gather one group of correction data when previous calibration cycle;
Calculate when the regular correction factor in previous calibration cycle under different counting rate according to the correction data of the described correction data counting rate different from described correspondence when previous calibration cycle;
Carry out correction by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device to be then specially:
Corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
4. method according to claim 1, it is characterized in that, when according to correct based on composition CBN method calculate regular correction factor time, be cylinder die body by the die body scanned, the correction data gathered is cylinder mold sports school correction data, and the correction data of corresponding different counting rate is the cylinder mold sports school correction data of corresponding different counting rate.
5. method according to claim 4, is characterized in that, the described correction data according to the different counting rate of described correspondence calculates the regular correction factor under different counting rate, comprising:
Utilize the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor with counting rate change in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor;
According to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method.
6. method according to claim 5, is characterized in that, when each calibration cycle arrives, also comprises:
Scanning cylinder die body, and gather one group of cylinder mold sports school correction data when previous calibration cycle;
The crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle is utilized to calculate when the crystal efficiency factor in previous calibration cycle under different counting rate;
According to Summing Factor cross section block side, the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Carry out correction by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device to be then specially:
Corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
7. method according to claim 5, is characterized in that, when each calibration cycle arrives, also comprises:
Scanning cylinder die body, and gather one group of cylinder mold sports school correction data when previous calibration cycle;
When the crystal efficiency factor of the cylinder mold sports school correction data counting rate different from the correspondence calculated of previous calibration cycle, calculating are when the crystal efficiency factor in previous calibration cycle under different counting rate described in utilizing, and according to described when the crystal efficiency factor calculating in previous calibration cycle under different counting rate is when the cross section block side factor in previous calibration cycle under different counting rate;
According to the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate, the cross section block side factor and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Carry out correction by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device to be then specially:
Corrected by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
8. according to the method in claim 5 to 7 described in any one, it is characterized in that, described according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method, comprising:
Utilize the axial geometrical factor in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence;
Scanning rotating rod source die body, gathers one group of rotating rod source die body correction data, and utilizes the crystal interference factor in described rotating rod source die body correction data calculating CBN method and radial geometric factor;
According to CBN method, computing is carried out to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
9. according to the method in claim 5 to 7 described in any one, it is characterized in that, described according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculate the regular correction factor under different counting rate according to CBN method, comprising:
Scanning rotating rod source die body, gathers rotating rod source die body correction data, and utilizes crystal interference factor, radial geometric factor and the axial geometrical factor in described rotating rod source die body correction data calculating CBN method;
According to CBN method, computing is carried out to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
10. the scan-data in imaging device is carried out to a device for normalization correction, it is characterized in that, comprising:
First data acquisition unit, for scanning die body, and correction data is organized in collection more;
Data combination unit, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, obtains the correction data of corresponding different counting rate;
Normalization correction factor first computing unit, for calculating the regular correction factor under different counting rate according to the correction data of the different counting rate of described correspondence;
Correcting unit, for correcting by the scan-data of the regular correction factor under described different counting rate to the different counting rates of imaging device.
11. devices according to claim 10, is characterized in that, described data combination unit comprises:
First combination subelement, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate;
Or,
Second combination subelement, for each group of correction data in described many group correction datas is carried out combination in any, the counting rate that the correction data of each combination is corresponding is different, and there is not overlapping region between the correction data of every two adjacent combinations, obtains the correction data of corresponding different counting rate.
12. devices according to claim 10, is characterized in that, when each calibration cycle arrives, also comprise:
Second data scanning unit, for scanning die body, and gathers one group of correction data when previous calibration cycle;
Normalization correction factor second computing unit, calculates when the regular correction factor in previous calibration cycle under different counting rate according to the correction data of the correction data of described current period counting rate different from described correspondence;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
13. devices according to claim 10, it is characterized in that, when according to correct based on composition CBN method calculate regular correction factor time, be cylinder die body by the die body scanned, the correction data gathered is cylinder mold sports school correction data, and the correction data of corresponding different counting rate is the cylinder mold sports school correction data of corresponding different counting rate.
14. devices according to claim 13, is characterized in that, described regular correction factor first computing unit comprises:
Counting rate factor of influence computation subunit, for utilizing the crystal efficiency factor, Summing Factor cross section block side, the axial segments side factor that change with counting rate in the cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence, obtain the crystal efficiency factor under different counting rate, Summing Factor cross section block side, the axial segments side factor;
CBN method operator unit, for according to the crystal efficiency factor under described different counting rate, Summing Factor cross section block side, the axial segments side factor, calculates the regular correction factor under different counting rate according to CBN method.
15. devices according to claim 14, is characterized in that, when each calibration cycle arrives, also comprise:
Cylinder mold volume data collecting unit, for scanning cylinder die body, and gathers one group of cylinder mold sports school correction data when previous calibration cycle;
Time-concerning impact factor first timing updating block, calculates when the crystal efficiency factor in previous calibration cycle under different counting rate for utilizing the crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle;
CBN normalization correction factor computing unit, for according to Summing Factor cross section block side, the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
16. devices according to claim 14, is characterized in that, when each calibration cycle arrives, also comprise:
Cylinder mold volume data collecting unit, for scanning cylinder die body, and gathers one group of cylinder mold sports school correction data when previous calibration cycle;
Time-concerning impact factor second timing updating block, for utilizing the crystal efficiency factor of the described cylinder mold sports school correction data counting rate different from the correspondence calculated when previous calibration cycle, calculating when the crystal efficiency factor in previous calibration cycle under different counting rate, and calculate when the cross section block side factor in previous calibration cycle under different counting rate according to the described crystal efficiency factor worked as in previous calibration cycle under different counting rate;
Normalization correction factor the 3rd computing unit, for according to the axial segments side factor under the described crystal efficiency factor when in previous calibration cycle under different counting rate, the cross section block side factor and the different counting rates that calculated, calculate when the regular correction factor in previous calibration cycle under different counting rate according to CBN method;
Then described correcting unit, specifically for correcting by the described scan-data of regular correction factor to the different counting rates of imaging device of working as in previous calibration cycle under different counting rate.
17. according to claim 14 to the device described in any one in 16, and it is characterized in that, described CBN method operator unit comprises:
First computation subunit, for utilizing the axial geometrical factor in the described cylinder mold sports school correction data calculating CBN method of the different counting rate of described correspondence;
Second computation subunit, for scanning rotating rod source die body, gathers one group of rotating rod source die body correction data, and utilizes the crystal interference factor in described rotating rod source die body correction data calculating CBN method and radial geometric factor;
Operator unit, for carrying out computing according to CBN method to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
18. according to claim 14 to the device described in any one in 16, and it is characterized in that, described CBN method operator unit comprises:
3rd computation subunit, for scanning rotating rod source die body, gathers rotating rod source die body correction data, and utilizes crystal interference factor, radial geometric factor and the axial geometrical factor in described rotating rod source die body correction data calculating CBN method;
Operator unit, for carrying out computing according to CBN method to the crystal efficiency factor under the axial geometrical factor calculated, radial geometric factor, crystal interference factor and different counting rate, Summing Factor cross section block side, the axial segments side factor, obtain the regular correction factor under different counting rate.
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